ETC UPD442000LGU-B10X-9JH

DATA SHEET
MOS INTEGRATED CIRCUIT
µPD442000L-X
2M-BIT CMOS STATIC RAM
256K-WORD BY 8-BIT
EXTENDED TEMPERATURE OPERATION
Description
The µPD442000L-X is a high speed, low power, 2,097,152 bits (262,144 words by 8 bits) CMOS static RAM.
The µPD442000L-X has two chip enable pins (/CE1, CE2) to extend the capacity. And battery backup is available.
B, C and D versions are low voltage versions.
★
The µPD442000L-X is packed in 32-pin plastic TSOP (I) (8×13.4 mm) and (8×20 mm).
Features
• 262,144 words by 8 bits organization
★
• Fast access time : 70, 85, 100, 120, 150, 180 ns (MAX.)
• Low voltage operation
(B version : VCC = 2.7 to 3.6 V, C version : VCC = 2.2 to 3.6 V, D version : VCC = 1.8 to 3.6 V)
• Low VCC data retention : 1.5 V (MIN.)
• Operating ambient temperature : TA = –25 to +85 °C
• Output Enable input for easy application
• Two Chip Enable inputs : /CE1, CE2
Part number
Access time
ns (MAX.)
★
Operating supply Operating ambient
Supply current
voltage
temperature
At operating
At standby
At data retention
V
°C
mA (MAX.)
µA (MAX.)
µA (MAX.)
−25 to +85
35
2
2
µPD442000L-BxxX
70
, 85, 100
2.7 to 3.6
µPD442000L-CxxX
100, 120, 150
2.2 to 3.6
30
µPD442000L-DxxX
150, 180
1.8 to 3.6
25
Note
Note Under development
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. M12509EJ7V0DSJ1 (7th edition)
Date Published December 2000 NS CP (K)
Printed in Japan
The mark • shows major revised points.
©
1997
µPD442000L-X
★
Ordering Information
Part number
µPD442000LGU-B70X-9JH
Package
Note
µPD442000LGU-B85X-9JH
Operating
Operating
ns (MAX.)
supply voltage
temperature
V
°C
2.7 to 3.6
−25 to +85
32-pin Plastic TSOP (I)
70
(8×13.4) (Normal bent)
85
µPD442000LGU-B10X-9JH
Note
µPD442000LGU-B85X-9KH
32-pin Plastic TSOP (I)
70
(8×13.4) (Reverse bent)
85
µPD442000LGU-B10X-9KH
B version
100
Note
µPD442000LGZ-B85X-KJH
32-pin Plastic TSOP (I)
70
(8×20) (Normal bent)
85
µPD442000LGZ-B10X-KJH
µPD442000LGZ-B70X-KKH
µPD442000LGZ-B85X-KKH
100
Note
32-pin Plastic TSOP (I)
(8×20) (Reverse bent)
µPD442000LGZ-B10X-KKH
70
85
100
µPD442000LGU-C10X-9JH
32-pin Plastic TSOP (I)
100
µPD442000LGU-C12X-9JH
(8×13.4) (Normal bent)
120
µPD442000LGU-C10X-9KH
32-pin Plastic TSOP (I)
100
µPD442000LGU-C12X-9KH
(8×13.4) (Reverse bent)
120
µPD442000LGZ-C10X-KJH
32-pin Plastic TSOP (I)
100
µPD442000LGZ-C12X-KJH
(8×20) (Normal bent)
120
µPD442000LGU-C15X-9JH
2.2 to 3.6
C version
1.8 to 3.6
D version
150
µPD442000LGU-C15X-9KH
150
µPD442000LGZ-C15X-KJH
150
µPD442000LGZ-C10X-KKH
32-pin Plastic TSOP (I)
100
µPD442000LGZ-C12X-KKH
(8×20) (Reverse bent)
120
µPD442000LGZ-C15X-KKH
150
µPD442000LGU-D15X-9JH
32-pin Plastic TSOP (I)
150
µPD442000LGU-D18X-9JH
(8×13.4) (Normal bent)
180
µPD442000LGU-D15X-9KH
32-pin Plastic TSOP (I)
150
µPD442000LGU-D18X-9KH
(8×13.4) (Reverse bent)
180
µPD442000LGZ-D15X-KJH
32-pin Plastic TSOP (I)
150
µPD442000LGZ-D18X-KJH
(8×20) (Normal bent)
180
µPD442000LGZ-D15X-KKH
32-pin Plastic TSOP (I)
150
µPD442000LGZ-D18X-KKH
(8×20) (Reverse bent)
180
Note Under development
2
Remark
100
µPD442000LGU-B70X-9KH
µPD442000LGZ-B70X-KJH
Access time
Data Sheet M12509EJ7V0DS
µPD442000L-X
Pin Configurations (Marking Side)
/xxx indicates active low signal.
32-pin Plastic TSOP (I) (8×
×13.4) (Normal bent)
[ µPD442000LGU-BxxX-9JH ]
[ µPD442000LGU-CxxX-9JH ]
[ µPD442000LGU-DxxX-9JH ]
32-pin Plastic TSOP (I) (8×
×20) (Normal bent)
[ µPD442000LGZ-BxxX-KJH ]
[ µPD442000LGZ-CxxX-KJH ]
[ µPD442000LGZ-DxxX-KJH ]
★
A11
A9
A8
A13
/WE
CE2
A15
VCC
A17
A16
A14
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A0 - A17
: Address inputs
I/O1 - I/O8
: Data inputs / outputs
/CE1, CE2
: Chip Enable 1, 2
/WE
: Write Enable
/OE
: Output Enable
VCC
: Power supply
GND
: Ground
/OE
A10
/CE1
I/O8
I/O7
I/O6
I/O5
I/O4
GND
I/O3
I/O2
I/O1
A0
A1
A2
A3
Remark Refer to Package Drawings for the 1-pin index mark.
Data Sheet M12509EJ7V0DS
3
µPD442000L-X
32-pin Plastic TSOP (I) (8×
×13.4) (Reverse bent)
[ µPD442000LGU-BxxX-9KH ]
[ µPD442000LGU-CxxX-9KH ]
[ µPD442000LGU-DxxX-9KH ]
32-pin Plastic TSOP (I) (8×
×20) (Reverse bent)
[ µPD442000LGZ-BxxX-KKH ]
[ µPD442000LGZ-CxxX-KKH ]
[ µPD442000LGZ-DxxX-KKH ]
/OE
A10
/CE1
I/O8
I/O7
I/O6
I/O5
I/O4
GND
I/O3
I/O2
I/O1
A0
A1
A2
A3
★
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A0 - A17
: Address inputs
I/O1 - I/O8
: Data inputs / outputs
/CE1, CE2
: Chip Enable 1, 2
/WE
: Write Enable
/OE
: Output Enable
VCC
: Power supply
GND
: Ground
Remark Refer to Package Drawings for the 1-pin index mark.
4
Data Sheet M12509EJ7V0DS
A11
A9
A8
A13
/WE
CE2
A15
VCC
A17
A16
A14
A12
A7
A6
A5
A4
µPD442000L-X
Block Diagram
A0
Address
buffer
A17
Row
decoder
I/O1
Input data
controller
I/O8
Memory cell array
2,097,152 bits
Sense amplifier /
Switching circuit
Column decoder
Output data
controller
Address buffer
/CE1
CE2
/OE
/WE
VCC
GND
Truth Table
/CE1
CE2
/OE
/WE
Mode
I/O
Supply current
H
×
×
×
Not selected
High impedance
ISB
×
L
×
×
Not selected
High impedance
L
H
H
H
Output disable
High impedance
L
H
L
H
Read
DOUT
L
H
×
L
Write
DIN
ICCA
Remark × : VIH or VIL
Data Sheet M12509EJ7V0DS
5
µPD442000L-X
Electrical Specifications
Absolute Maximum Ratings
Parameter
Symbol
Supply voltage
Condition
Rating
VCC
–0.5
–0.5
Note
Note
Unit
to +4.6
V
to VCC+0.5
V
Input / Output voltage
VT
Operating ambient temperature
TA
–25 to +85
°C
Storage temperature
Tstg
–55 to +125
°C
Note –3.0 V (MIN.) (Pulse width : 30 ns)
Caution Exposing the device to stress above those listed in Absolute Maximum Rating could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Recommended Operating Conditions
Parameter
Symbol
Supply voltage
VCC
High level input voltage
VIH
Low level input voltage
VIL
Operating ambient
temperature
TA
µPD442000L-BxxX
Condition
µPD442000L-CxxX
µPD442000L-DxxX
Unit
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
2.7
3.6
2.2
3.6
1.8
3.6
V
2.7 V ≤ VCC ≤ 3.6 V
2.4
VCC+0.5
2.4
VCC+0.5
2.4
VCC+0.5
V
2.2 V ≤ VCC < 2.7 V
–
–
2.0
VCC+0.5
2.0
VCC+0.5
1.8 V ≤ VCC < 2.2 V
–
–
–
–
1.6
VCC+0.5
–0.3
Note
–25
+0.5
+85
–0.3
Note
–25
+0.3
–0.3
+85
Note
–25
+0.2
V
+85
°C
Note –1.5 V (MIN.) (Pulse width : 30 ns)
Capacitance (TA = 25 °C, f = 1 MHz)
Parameter
Symbol
Test condition
MIN.
TYP.
MAX.
Unit
Input capacitance
CIN
VIN = 0 V
8
pF
Input / Output capacitance
CI/O
VI/O = 0 V
10
pF
Remarks 1. VIN : Input voltage
VI/O : Input / Output voltage
2. These parameters are periodically sampled and not 100% tested.
6
Data Sheet M12509EJ7V0DS
µPD442000L-X
DC Characteristics (Recommended Operating Conditions Unless Otherwise Noted)
Parameter
Symbol
Test condition
µPD442000L-BxxX µPD442000L-CxxX µPD442000L-DxxX Unit
MIN. TYP. MAX. MIN. TYP. MAX. MIN. TYP. MAX.
Input leakage
ILI
VIN = 0 V to VCC
–1.0
+1.0
–1.0
+1.0
–1.0
+1.0
µA
ILO
VI/O = 0 V to VCC, /CE1 = VIH or
–1.0
+1.0
–1.0
+1.0
–1.0
+1.0
µA
mA
current
I/O leakage
current
CE2 = VIL or /WE = VIL or /OE = VIH
Operating
ICCA1
supply current
/CE1 = VIL, CE2 = VIH,
30
35
25
30
20
25
Minimum cycle time, VCC ≤ 2.7 V
–
–
20
25
15
20
VCC ≤ 2.2 V
–
–
–
–
10
15
II/O = 0 mA
ICCA2
/CE1 = VIL, CE2 = VIH,
II/O = 0 mA
ICCA3
10
10
10
VCC ≤ 2.7 V
–
8
8
VCC ≤ 2.2 V
–
–
5
8
8
8
/CE1 ≤ 0.2 V, CE2 ≥ VCC – 0.2 V,
Cycle = 1 MHz, II/O = 0 mA,
VIL ≤ 0.2 V,
VCC ≤ 2.7 V
–
6
6
VIH ≥ VCC – 0.2 V
VCC ≤ 2.2 V
–
–
5
0.3
0.3
0.3
mA
µA
Standby
ISB
/CE1 = VIH or CE2 = VIL
supply current
ISB1
/CE1 ≥ VCC – 0.2 V,
CE2 ≥ VCC – 0.2 V
ISB2
High level
VOH
VOL
2
0.1
2
0.1
2
VCC ≤ 2.7 V
–
–
0.08
2
0.08
2
VCC ≤ 2.2 V
–
–
–
–
0.05
1.5
0.1
2
0.1
2
0.1
2
VCC ≤ 2.7 V
–
–
0.08
2
0.08
2
VCC ≤ 2.2 V
–
–
–
–
0.05
1.5
CE2 ≤ 0.2 V
IOH = –0.5 mA
output voltage
Low level
0.1
2.4
2.4
2.4
VCC ≤ 2.7 V
–
1.8
1.8
VCC ≤ 2.2 V
–
–
1.5
IOL = 1.0 mA
0.4
0.4
V
0.4
V
output voltage
Remarks 1. VIN : Input voltage
VI/O : Input / Output voltage
2. These DC characteristics are in common regardless of package types and access time.
Data Sheet M12509EJ7V0DS
7
µPD442000L-X
AC Characteristics (Recommended Operating Conditions Unless Otherwise Noted)
AC Test Conditions
[ µPD442000L-B70X, µPD442000L-B85X, µPD442000L-B10X ]
Input Waveform (Rise and Fall Time ≤ 5 ns)
2.4 V
1.5 V
Test Points
1.5 V
Test Points
1.5 V
0.5 V
Output Waveform
1.5 V
Output Load
1TTL + 50 pF
[ µPD442000L-C10X, µPD442000L-C12X, µPD442000L-C15X ]
Input Waveform (Rise and Fall Time ≤ 5 ns)
2.0 V
1.1 V
Test Points
1.1 V
1.1 V
Test Points
1.1 V
0.9 V
Test Points
0.9 V
0.9 V
Test Points
0.9 V
0.3 V
Output Waveform
Output Load
1TTL + 50 pF
★
[ µPD442000L-D15X, µPD442000L-D18X ]
Input Waveform (Rise and Fall Time ≤ 5 ns)
1.6 V
0.2 V
Output Waveform
Output Load
1TTL + 50 pF
8
Data Sheet M12509EJ7V0DS
µPD442000L-X
Read Cycle (1/3) (B version)
Parameter
Symbol
µPD442000L-B70X µPD442000L-B85X µPD442000L-B10X
MIN.
MAX.
70
MIN.
MAX.
85
MIN.
Unit
Condition
MAX.
Read cycle time
tRC
100
ns
Address access time
tAA
70
85
100
ns
/CE1 access time
tCO1
70
85
100
ns
CE2 access time
tCO2
70
85
100
ns
/OE to output valid
tOE
35
40
50
ns
Output hold from address change
tOH
10
10
10
ns
/CE1 to output in low impedance
tLZ1
10
10
10
ns
CE2 to output in low impedance
tLZ2
10
10
10
ns
/OE to output in low impedance
tOLZ
5
5
5
ns
/CE1 to output in high impedance
tHZ1
25
30
35
ns
CE2 to output in high impedance
tHZ2
25
30
35
ns
/OE to output in high impedance
tOHZ
25
30
35
ns
Note 1
Note 2
Notes 1. The output load is 1TTL + 50 pF.
2. The output load is 1TTL + 5 pF.
Remark These AC characteristics are in common regardless of package types.
Read Cycle (2/3) (C version)
Parameter
Symbol
µPD442000L-C10X µPD442000L-C12X µPD442000L-C15X
MIN.
MAX.
100
MIN.
MAX.
120
MIN.
Unit
Condition
MAX.
Read cycle time
tRC
150
ns
Address access time
tAA
100
120
150
ns
/CE1 access time
tCO1
100
120
150
ns
CE2 access time
tCO2
100
120
150
ns
/OE to output valid
tOE
50
60
70
ns
Output hold from address change
tOH
10
10
10
ns
/CE1 to output in low impedance
tLZ1
10
10
10
ns
CE2 to output in low impedance
tLZ2
10
10
10
ns
/OE to output in low impedance
tOLZ
5
5
5
ns
/CE1 to output in high impedance
tHZ1
35
40
45
ns
CE2 to output in high impedance
tHZ2
35
40
45
ns
/OE to output in high impedance
tOHZ
35
40
45
ns
Note 1
Note 2
Notes 1. The output load is 1TTL + 50 pF.
2. The output load is 1TTL + 5 pF.
Remark These AC characteristics are in common regardless of package types.
Data Sheet M12509EJ7V0DS
9
µPD442000L-X
★
Read Cycle (3/3) (D version)
Parameter
Symbol
µPD442000L-D15X
MIN.
MAX.
150
µPD442000L-D18X
MIN.
Unit
Read cycle time
tRC
180
Address access time
tAA
150
180
ns
/CE1 access time
tCO1
150
180
ns
CE2 access time
tCO2
150
180
ns
/OE to output valid
tOE
70
80
ns
Output hold from address change
tOH
10
10
ns
/CE1 to output in low impedance
tLZ1
10
10
ns
CE2 to output in low impedance
tLZ2
10
10
ns
/OE to output in low impedance
tOLZ
5
5
ns
/CE1 to output in high impedance
tHZ1
45
50
ns
CE2 to output in high impedance
tHZ2
45
50
ns
/OE to output in high impedance
tOHZ
45
50
ns
ns
Notes 1. The output load is 1TTL + 50 pF.
2. The output load is 1TTL + 5 pF.
Remark These AC characteristics are in common regardless of package types.
Read Cycle Timing Chart
tRC
Address (Input)
tAA
tOH
/CE1 (Input)
tHZ1
tCO1
tLZ1
CE2 (Input)
tCO2
tHZ2
tLZ2
/OE (Input)
tOE
tOHZ
tOLZ
I/O (Output)
Remark
10
High impedance
In read cycle, /WE should be fixed to high level.
Data Sheet M12509EJ7V0DS
Condition
MAX.
Data out
Note 1
Note 2
µPD442000L-X
Write Cycle (1/3) (B version)
Parameter
Symbol
µPD442000L-B70X µPD442000L-B85X µPD442000L-B10X
MIN.
MAX.
MIN.
MAX.
MIN.
Unit
Write cycle time
tWC
70
85
100
ns
/CE1 to end of write
tCW1
55
70
80
ns
CE2 to end of write
tCW2
55
70
80
ns
Address valid to end of write
tAW
55
70
80
ns
Address setup time
tAS
0
0
0
ns
Write pulse width
tWP
50
60
60
ns
Write recovery time
tWR
0
0
0
ns
Data valid to end of write
tDW
30
35
40
ns
Data hold time
tDH
0
0
0
ns
/WE to output in high impedance
tWHZ
Output active from end of write
tOW
25
5
30
5
Condition
MAX.
35
5
ns
Note
ns
Note The output load is 1TTL + 5 pF.
Remark These AC characteristics are in common regardless of package types.
Write Cycle (2/3) (C version)
Parameter
Symbol
µPD442000L-C10X µPD442000L-C12X µPD442000L-C15X
MIN.
MAX.
MIN.
MAX.
MIN.
Unit
MAX.
Write cycle time
tWC
100
120
150
ns
/CE1 to end of write
tCW1
80
100
120
ns
CE2 to end of write
tCW2
80
100
120
ns
Address valid to end of write
tAW
80
100
120
ns
Address setup time
tAS
0
0
0
ns
Write pulse width
tWP
60
80
100
ns
Write recovery time
tWR
0
0
0
ns
Data valid to end of write
tDW
40
50
60
ns
Data hold time
tDH
0
0
0
ns
/WE to output in high impedance
tWHZ
Output active from end of write
tOW
35
5
40
5
50
5
Condition
ns
Note
ns
Note The output load is 1TTL + 5 pF.
Remark These AC characteristics are in common regardless of package types.
Data Sheet M12509EJ7V0DS
11
µPD442000L-X
★
Write Cycle (3/3) (D version)
Parameter
Symbol
µPD442000L-D15X
MIN.
MAX.
µPD442000L-D18X
MIN.
Unit
Write cycle time
tWC
150
180
ns
/CE1 to end of write
tCW1
120
150
ns
CE2 to end of write
tCW2
120
150
ns
Address valid to end of write
tAW
120
150
ns
Address setup time
tAS
0
0
ns
Write pulse width
tWP
100
120
ns
Write recovery time
tWR
0
0
ns
Data valid to end of write
tDW
60
75
ns
Data hold time
tDH
0
0
ns
/WE to output in high impedance
tWHZ
Output active from end of write
tOW
50
5
60
5
Note The output load is 1TTL + 5 pF.
Remark These AC characteristics are in common regardless of package types.
12
Data Sheet M12509EJ7V0DS
Condition
MAX.
ns
ns
Note
µPD442000L-X
Write Cycle Timing Chart 1 (/WE Controlled)
tWC
Address (Input)
tCW1
/CE1 (Input)
tCW2
CE2 (Input)
tAW
tAS
tWP
tWR
/WE (Input)
tOW
tWHZ
I/O (Input / Output)
Indefinite data out
tDW
High
impedance
Data in
tDH
High
impedance
Indefinite data out
Cautions 1. During address transition, at least one of pins /CE1, CE2, /WE should be inactivated.
2. When I/O pins are in the output state, do not apply to the I/O pins signals that are
opposite in phase with output signals.
Remarks 1. Write operation is done during the overlap time of a low level /CE1, /WE, and a high level CE2.
2. If /CE1 changes to low level at the same time or after the change of /WE to low level, or if CE2
changes to high level at the same time or after the change of /WE to low level, the I/O pins will
remain high impedance state.
3. When /WE is at low level, the I/O pins are always high impedance. When /WE is at high level,
read operation is executed. Therefore /OE should be at high level to make the I/O pins high
impedance.
Data Sheet M12509EJ7V0DS
13
µPD442000L-X
Write Cycle Timing Chart 2 (/CE1 Controlled)
tWC
Address (Input)
tAS
tCW1
/CE1 (Input)
tCW2
CE2 (Input)
tAW
tWP
tWR
/WE (Input)
tDW
High impedance
Data in
I/O (Input)
tDH
High
impedance
Cautions 1. During address transition, at least one of pins /CE1, CE2, /WE should be inactivated.
2. When I/O pins are in the output state, do not apply to the I/O pins signals that are
opposite in phase with output signals.
Remark Write operation is done during the overlap time of a low level /CE1, /WE, and a high level CE2.
14
Data Sheet M12509EJ7V0DS
µPD442000L-X
Write Cycle Timing Chart 3 (CE2 Controlled)
tWC
Address (Input)
tCW1
/CE1 (Input)
tAS
tCW2
CE2 (Input)
tAW
tWP
tWR
/WE (Input)
tDW
High impedance
I/O (Input)
Data in
tDH
High
impedance
Cautions 1. During address transition, at least one of pins /CE1, CE2, /WE should be inactivated.
2. When I/O pins are in the output state, do not apply to the I/O pins signals that are
opposite in phase with output signals.
Remark Write operation is done during the overlap time of a low level /CE1, /WE, and a high level CE2.
Data Sheet M12509EJ7V0DS
15
µPD442000L-X
Low VCC Data Retention Characteristics (TA = –25 to +85 °C)
Parameter
Data retention supply voltage
Data retention supply current
Symbol
Test Condition
MIN.
TYP.
MAX.
Unit
V
VCCDR1
/CE1 ≥ VCC − 0.2 V, CE2 ≥ VCC − 0.2 V
1.5
3.6
VCCDR2
CE2 ≤ 0.2 V
1.5
3.6
ICCDR1
VCC = 3.0 V, /CE1 ≥ VCC − 0.2 V,
0.1
2
0.1
2
µA
CE2 ≥ VCC − 0.2 V or CE2 ≤ 0.2 V
ICCDR2
Chip deselection to data retention mode
Operation recovery time
VCC = 3.0 V, CE2 ≤ 0.2 V
tCDR
0
tRC
tR
Note tRC : Read cycle time.
16
Data Sheet M12509EJ7V0DS
Note
ns
ns
µPD442000L-X
Data Retention Timing Chart
(1) /CE1 Controlled
tCDR
★
Data retention mode
tR
VCC
VCC (MIN.)
Note
/CE1
VIH (MIN.)
VCCDR (MIN.)
/CE1 ≥ VCC – 0.2 V
VIL (MAX.)
GND
Note B version : 2.7 V, C version : 2.2 V, D version : 1.8 V
Remark
On the data retention mode by controlling /CE1, the input level of CE2 must be ≥ VCC − 0.2 V or ≤ 0.2 V.
The other pins (Address, I/O, /WE, /OE) can be in high impedance state.
(2) CE2 Controlled
tCDR
★
Data retention mode
tR
VCC
VCC (MIN.)
Note
VIH (MIN.)
VCCDR (MIN.)
CE2
VIL (MAX.)
CE2 ≤ 0.2 V
GND
Note B version : 2.7 V, C version : 2.2 V, D version : 1.8 V
Remark On the data retention mode by controlling CE2, the other pins (/CE1, Address, I/O, /WE, /OE) can be in
high impedance state.
Data Sheet M12509EJ7V0DS
17
µPD442000L-X
Package Drawings
★
32-PIN PLASTIC TSOP(I) (8x13.4)
detail of lead end
1
32
S
T
R
L
16
17
U
Q
P
I
J
A
G
S
H
K
B
C
N
S
NOTES
D
M
M
ITEM
1. Each lead centerline is located within 0.08 mm of
its true position (T.P.) at maximum material condition.
2. "A" excludes mold flash. (Includes mold flash : 8.3 mm MAX.)
A
MILLIMETERS
8.0±0.1
B
0.45 MAX.
C
D
0.5 (T.P.)
0.22±0.05
G
1.0±0.05
H
12.4±0.2
I
11.8±0.1
J
0.8±0.2
K
0.145 +0.025
−0.015
L
M
0.5
0.08
N
0.08
P
13.4±0.2
Q
0.1±0.05
R
+5°
3° −3°
S
1.2 MAX.
T
0.25
U
0.6±0.15
P32GU-50-9JH-2
18
Data Sheet M12509EJ7V0DS
µPD442000L-X
★
32-PIN PLASTIC TSOP(I) (8x13.4)
detail of lead end
1
32
U
Q
L
R
T
16
17
N
K
S
D
S
M
M
C
H
B
S
G
I
J
A
P
NOTES
ITEM
1. Each lead centerline is located within 0.08 mm of
its true position (T.P.) at maximum material condition.
2. "A" excludes mold flash. (Includes mold flash : 8.3 mm MAX.)
A
MILLIMETERS
8.0±0.1
B
0.45 MAX.
C
0.5 (T.P.)
D
0.22±0.05
G
1.0±0.05
H
12.4±0.2
I
11.8±0.1
J
0.8±0.2
K
0.145 +0.025
−0.015
L
M
0.5
0.08
N
0.08
P
13.4±0.2
Q
0.1±0.05
R
3° +5°
−3°
S
1.2 MAX.
T
0.25
U
0.6±0.15
P32GU-50-9KH-2
Data Sheet M12509EJ7V0DS
19
µPD442000L-X
★
32-PIN PLASTIC TSOP(I) (8x20)
detail of lead end
1
32
F
G
R
Q
16
L
17
S
E
P
I
J
A
S
B
C
D
K
N
M M
S
NOTES
ITEM
MILLIMETERS
1. Each lead centerline is located within 0.10 mm of
its true position (T.P.) at maximum material condition.
A
8.0±0.1
B
0.45 MAX.
2. "A" excludes mold flash. (Includes mold flash : 8.3 mm MAX.)
C
0.5 (T.P.)
D
0.22±0.05
E
0.1±0.05
F
1.2 MAX.
G
0.97±0.08
I
18.4±0.1
J
0.8±0.2
K
0.145±0.05
L
0.5
M
0.10
N
0.10
P
20.0±0.2
Q
+5°
3°−3°
R
S
0.25
0.60±0.15
S32GZ-50-KJH1-2
20
Data Sheet M12509EJ7V0DS
µPD442000L-X
★
32-PIN PLASTIC TSOP(I) (8x20)
detail of lead end
E
1
32
S
L
Q
R
16
G
17
F
M M
D
K
N
S
C
B
S
I
J
A
P
NOTES
1. Each lead centerline is located within 0.10 mm of
its true position (T.P.) at maximum material condition.
2. "A" excludes mold flash. (Includes mold flash : 8.3 mm MAX.)
ITEM
MILLIMETERS
A
8.0±0.1
B
0.45 MAX.
C
0.5 (T.P.)
D
0.22±0.05
E
0.1±0.05
F
1.2 MAX.
G
0.97±0.08
I
18.4±0.1
J
0.8±0.2
K
0.145±0.05
L
0.5
M
0.10
N
0.10
P
20.0±0.2
Q
+5°
3° −3°
R
S
0.25
0.60±0.15
S32GZ-50-KKH1-2
Data Sheet M12509EJ7V0DS
21
µPD442000L-X
Recommended Soldering Conditions
Please consult with our sales offices for soldering conditions of the µPD442000L-X.
★
Types of Surface Mount Device
µPD442000LGU-BxxX-9JH
: 32-pin Plastic TSOP (I) (8×13.4) (Normal bent)
µPD442000LGU-CxxX-9JH
: 32-pin Plastic TSOP (I) (8×13.4) (Normal bent)
µPD442000LGU-DxxX-9JH
: 32-pin Plastic TSOP (I) (8×13.4) (Normal bent)
µPD442000LGU-BxxX-9KH
: 32-pin Plastic TSOP (I) (8×13.4) (Reverse bent)
µPD442000LGU-CxxX-9KH
: 32-pin Plastic TSOP (I) (8×13.4) (Reverse bent)
µPD442000LGU-DxxX-9KH
: 32-pin Plastic TSOP (I) (8×13.4) (Reverse bent)
µPD442000LGZ-BxxX-KJH
: 32-pin Plastic TSOP (I) (8×20) (Normal bent)
µPD442000LGZ-CxxX-KJH
: 32-pin Plastic TSOP (I) (8×20) (Normal bent)
µPD442000LGZ-DxxX-KJH
: 32-pin Plastic TSOP (I) (8×20) (Normal bent)
µPD442000LGZ-BxxX-KKH
: 32-pin Plastic TSOP (I) (8×20) (Reverse bent)
µPD442000LGZ-CxxX-KKH
: 32-pin Plastic TSOP (I) (8×20) (Reverse bent)
µPD442000LGZ-DxxX-KKH
: 32-pin Plastic TSOP (I) (8×20) (Reverse bent)
22
Data Sheet M12509EJ7V0DS
µPD442000L-X
NOTES FOR CMOS DEVICES
1
PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2
HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to V DD or GND with a resistor, if it is considered to have a possibility of
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
Data Sheet M12509EJ7V0DS
23
µPD442000L-X
• The information in this document is current as of December, 2000. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all
products and/or types are available in every country. Please check with an NEC sales representative
for availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
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patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
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agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
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semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
• NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
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"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
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The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
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(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4