ETC WE556K8

WE512K8, WE256K8,
WE128K8-XCX
512Kx8 CMOS EEPROM, WE512K8-XCX, SMD 5962-93091
512KX8 BIT CMOS EEPROM
MODULE
FIG. 1
PIN CONFIGURATION
TOP VIEW
FEATURES
■ Read Access Times of 150, 200, 250, 300ns
■ JEDEC Standard 32 Pin, Hermetic Ceramic DIP
(Package 300)
■ Commercial, Industrial and Military Temperature
Ranges
■ MIL-STD-883 Compliant Devices Available
■ Write Endurance 10,000 Cycles
■ Data Retention at 25°C, 10 Years
■ Low Power CMOS Operation:
3mA Standby Typical/100mA Operating Maximum
■ Automatic Page Write Operation
Internal Address and Data Latches for
512 Bytes, 1 to 128 Bytes/Row, Four Pages
PIN DESCRIPTION
■ Page Write Cycle Time 10mS Max.
A0-18
Address Inputs
I/O0- 7
Data Input/Output
■ Data Polling for End of Write Detection
CS
Chip Select
■ Hardware and Software Data Protection
OE
Output Enable
WE
Write Enable
VCC
+5.0V Power
VSS
Ground
■ TTL Compatible Inputs and Outputs
BLOCK DIAGRAM
May 2000 Rev.1
1
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WE512K8, WE256K8,
WE128K8-XCX
256Kx8 CMOS EEPROM, WE256K8-XCX, SMD 5962-93155
256KX8 BIT CMOS EEPROM
MODULE
FIG.2
PIN CONFIGURATION
TOP VIEW
FEATURES
■ Read Access Times of 150, 200ns
■ JEDEC Standard 32 Pin, Hermetic Ceramic DIP
(Package 302)
■ Commercial, Industrial and Military Temperature
Ranges
■ MIL-STD-883 Compliant Devices Available
■ Write Endurance 10,000 Cycles
■ Data Retention at 25°C, 10 Years
■ Low Power CMOS Operation:
2mA Standby Typical/90mA Operating Maximum
■ Automatic Page Write Operation
Internal Address and Data Latches for
512 Bytes, 1 to 64 Bytes/Row, Eight Pages
PIN DESCRIPTION
■ Page Write Cycle Time 10mS Max.
A0-17
Address Inputs
I/O0-7
Data Input/Output
■ Data Polling for End of Write Detection
CS
Chip Select
■ Hardware and Software Data Protection
OE
Output Enable
WE
Write Enable
VCC
+5.0V Power
VSS
Ground
■ TTL Compatible Inputs and Outputs
BLOCK DIAGRAM
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
2
WE512K8, WE256K8,
WE128K8-XCX
128Kx8 CMOS EEPROM, WE128K8-XCX, SMD 5962-93154
128KX8 BIT CMOS EEPROM
MODULE
FIG. 3
PIN CONFIGURATION
TOP VIEW
FEATURES
■ Read Access Times of 150, 200ns
■ JEDEC Standard 32 Pin, Hermetic Ceramic DIP
(Package 300)
■ Commercial, Industrial and Military Temperature
Ranges
■ MIL-STD-883 Compliant Devices Available
■ Write Endurance 10,000 Cycles
■ Data Retention at 25°C, 10 Years
■ Low Power CMOS Operation:
1mA Standby Typical/70mA Operating
■ Automatic Page Write Operation
Internal Address and Data Latches for
256 Bytes, 1 to 64 Bytes/Row, Four Pages
PIN DESCRIPTION
■ Page Write Cycle Time 10mS Max.
A0-16
Address Inputs
I/O0-7
Data Input/Output
■ Data Polling for End of Write Detection
CS
Chip Select
■ Hardware and Software Data Protection
OE
Output Enable
WE
Write Enable
VCC
+5.0V Power
VSS
Ground
■ TTL Compatible Inputs and Outputs
BLOCK DIAGRAM
3
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WE512K8, WE256K8,
WE128K8-XCX
A BSOLUTE MAXIMUM RATINGS
Parameter
Operating Temperature
Storage Temperature
Signal Voltage Any Pin
Voltage on OE and A9
Thermal Resistance
junction to case
Lead Temperature
(soldering -10 secs)
Symbol
TA
TSTG
VG
qJC
TRUTH TABLE
-55 to +125
-65 to +150
-0.6 to + 6.25
-0.6 to +13.5
28
Unit
°C
°C
V
V
°C/W
+300
°C
OE
WE
Mode
Data I/O
H
L
L
X
X
X
X
L
H
H
X
L
X
H
L
X
H
X
Standby
Read
Write
Out Disable
Write
Inhibit
High Z
Data Out
Data In
High Z/Data Out
CAPACITANCE
(TA = +25°C)
NOTE:
Stresses above those listed under "Absolute Maximum Ratings" may
cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Parameter
Sym
Condition
512Kx8 256Kx8 128Kx8 Unit
Max
Max
Max
Input Capacitance
CIN
VIN = 0V, f = 1MHz
45
80
45
pF
Output Capacitance COUT VI/O = 0V, f = 1MHz
60
80
60
pF
This parameter is guaranteed by design but not tested.
RECOMMENDED OPERATING CONDITIONS
Parameter
CS
Symbol
Min
Max
Supply Voltage
VCC
4.5
5.5
Unit
V
Input High Voltage
VIH
2.0
VCC + 0.3
V
Input Low Voltage
VIL
-0.3
+0.8
V
Operating Temp. (Mil.)
TA
-55
+125
°C
Operating Temp. (Ind.)
TA
-40
+85
°C
DC CHARACTERISTICS
(VCC = 5.0V, VSS = 0V, TA = -55°C TO +125°C)
Parameter
Symbol
Conditions
512K x 8
Min Typ Max
256K x 8
Min Typ Max
128K x 8
Unit
Min Typ Max
Input Leakage Current
ILI
VCC = 5.5, VIN = GND to VCC
10
10
10
Output Leakage Current
I LO
CS = VIH, OE = VIH, VOUT = GND to V CC
10
10
10
µA
Dynamic Supply Current
I CC
CS = VIL, OE = VIH, f = 5MHz, VCC = 5.5
80
70
mA
Standby Current
ISB
CS = VIL, OE = VIH, f = 5MHz, VCC = 5.5
3
4
mA
Output Low Voltage
VOL
I OL = 2.1mA, VCC = 4.5V
Output High Voltage
VOH
I OH = -400µA, VCC = 4.5V
100
60
8
2
0.45
2.4
90
50
6
1
0.45
2.4
µA
0.45
2.4
V
V
NOTE: DC test conditions: VIH = VCC -0.3V, VIL = 0.3V
AC TEST CONDITIONS
FIG. 4
AC TEST CIRCUIT
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
1.5
1.5
V
V
Input and Output Reference Level
Output Timing Reference Level
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 ý.
VZ is typically the midpoint of VOH and VOL .
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
4
WE512K8, WE256K8,
WE128K8-XCX
READ
Figure 5 shows Read cycle waveforms. A read cycle begins with selection address, chip select and output enable. Chip select is accomplished by placing the CS line
low. Output enable is done by placing the OE line low.
The memory places the selected data byte on I/O0
through I/O7 after the access time. The output of the
memory is placed in a high impedance state shortly after
either the OE line or CS line is returned to a high level.
FIG. 5
READ WAVEFORMS
NOTE:
OE may be delayed up to tACS-tOE after
the falling edge of CS without impact
on tOE or by tACC -tOE after an address
change without impact on tACC.
AC READ CHARACTERISTICS (SEE FIGURE 5)
FOR WE512K8-XCX
(VCC= 5.0V, VSS = 0V, TA = -55°C TO +125°C)
Parameter
Symbol
-150
Min
-200
Max
150
Min
-250
Max
200
Min
-300
Max
Unit
Max
Read Cycle Time
tRC
Address Access Time
tACC
150
200
250
300
Chip Select Access Time
tACS
150
200
250
300
Output Hold from Address Change, OE or CS
tOH
Output Enable to Output Valid
tOE
85
85
100
125
ns
Chip Select or Output Enable to High Z Output
tDF
70
70
70
70
ns
0
250
Min
0
300
0
ns
0
ns
ns
ns
FOR WE256K8-XCX AND WE128K8-XCX
Parameter
Symbol
-150
Min
-200
Max
150
Min
Unit
Max
Read Cycle Time
tRC
Address Access Time
tACC
200
Chip Select Access Time
tACS
Output Hold from Address Change, OE or CS
tOH
Output Enable to Output Valid
tOE
85
100
ns
Chip Select or Output Enable to High Z Output
tDF
70
70
ns
150
150
10
5
ns
200
200
10
ns
ns
ns
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WE512K8, WE256K8,
WE128K8-XCX
WRITE CYCLE TIMING
WRITE
Figures 6 and 7 show the write cycle timing relationships. A write cycle begins with address application,
write enable and chip select. Chip select is accomplished by placing the CS line low. Write enable consists of setting the WE line low. The write cycle begins
when the last of either CS or WE goes low.
Write operations are initiated when both CS and WE
are low and OE is high. The EEPROM devices support
both a CS and WE controlled write cycle. The address
is latched by the falling edge of either CS or WE, whichever occurs last.
The data is latched internally by the rising edge of either CS or WE, whichever occurs first. A byte write
operation will automatically continue to completion.
The WE line transition from high to low also initiates an
internal 150µsec delay timer to permit page mode operation. Each subsequent WE transition from high to
low that occurs before the completion of the 150µsec
time out will restart the timer from zero. The operation
of the timer is the same as a retriggerable one-shot.
AC WRITE CHARACTERISTICS
(VCC = 5.0V, VSS = 0V, TA = -55°C TO +125°C)
Parameter
Write Cycle Time, TYP = 6mS
Address Set-up Time
Write Pulse Width (WE or CS)
Chip Select Set-up Time
Address Hold Time (1)
Data Hold Time
Chip Select Hold Time
Data Set-up Time
Output Enable Set-up Time
Output Enable Hold Time
Write Pulse Width High
Symbol
tWC
tAS
tWP
tCS
tAH
tDH
tCH
tDS
tOES
tOEH
tWPH
512K x 8
Min
Max
10
10
150
0
125
10
0
100
10
10
50
256K x 8
Min
Max
10
30
150
0
50
0
0
100
30
0
50
NOTES:
1. A17 and A18 must remain valid through WE and CS low pulse, for 512K x 8.
A15 , A16, and A17 must remain valid through WE and CS low pulse, for 256K x 8.
A15 and A16 must remain valid through WE and CS low pulse, for 128K x 8.
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
6
128K x 8
Min
Max
10
30
150
0
50
0
0
100
30
0
50
Unit
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
WE512K8, WE256K8,
WE128K8-XCX
FIG. 6
WRITE WAVEFORMS
WE CONTROLLED
NOTE:
1. Decoded Address Lines must be valid for the duration of the write.
FIG. 7
WRITE WAVEFORMS
CS CONTROLLED
NOTE:
1. Decoded Address Lines must be valid for the duration of the write.
7
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WE512K8, WE256K8,
WE128K8-XCX
DATA POLLING
Data polling allows a simple bit test operation to determine the status of the EEPROM. During the internal
programming cycle, a read of the last byte written will
produce the complement of the data on I/O7. For example, if the data written consisted of I/O7 = HIGH, then
the data read back would consist of I/O7 = LOW.
Operation with data polling permits a faster method of
writing to the EEPROM. The actual time to complete
the memory programming cycle is faster than the guaranteed maximum.
The EEPROM features a method to determine when
the internal programming cycle is completed. After a
write cycle is initiated, the EEPROM will respond to read
cycles to provide the microprocessor with the status of
the programming cycle. The status consists of the last
data byte written being returned with data bit I/O 7
complemented during the programming cycle, and I/O7
true after completion.
A polled byte write sequence would consist of the following steps:
1. write byte to EEPROM
2. store last byte and last address written
3. release a time slice to other tasks
4. read byte from EEPROM - last address
5. compare I/O7 to stored value
a) If different, write cycle is not completed, go to
step 3.
b) If same, write cycle is completed, go to step 1
or step 3.
DATA POLLING AC CHARACTERISTICS
(VCC = 5.0V, VCC = 0V, TA = -55°C TO +125°C)
Parameter
Symbol
512Kx8
256Kx8
128Kx8
Unit
Min
Max
Min
Max
Min
Data Hold Time
tDH
10
0
0
Output Enable Hold Time
tOEH
10
0
0
Output Enable To Output Delay
tOE
Write Recovery Time
tWR
100
100
0
0
FIG. 8
DATA POLLING
WAVEFORMS
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
8
Max
ns
ns
100
0
ns
ns
WE512K8, WE256K8,
WE128K8-XCX
PAGE WRITE OPERATION
The page address must be the same for each byte load
and must be valid during each high to low transition of
WE (or CS). The block address also must be the same
for each byte load and must remain valid throughout
the WE (or CS) low pulse. The page and block address
lines are summarized below:
These devices have a page write operation that allows
one to 64 bytes of data (one to 128 bytes for the
WE512K8) to be written into the device and then simultaneously written during the internal programming period. Successive bytes may be loaded in the same manner after the first data byte has been loaded. An internal
timer begins a time out operation at each write cycle. If
another write cycle is completed within 150µs or less, a
new time out period begins. Each write cycle restarts
the delay period. The write cycles can be continued as
long as the interval is less than the time out period.
PAGE MODE CHARACTERISTICS
(VCC = 5.0V, VSS = 0V, TA = -55°C TO +125°C)
Parameter
The usual procedure is to increment the least significant address lines from A0 through A5 (A0 through A6 for
the WE512K8) at each write cycle. In this manner a page
of up to 64 bytes (128 bytes for the WE512K8) can be
loaded into the EEPROM in a burst mode before beginning the relatively long interval programming cycle.
Min
Max Unit
tWC
Data Set-up Time
tDS
100
ns
Data Hold Time
tDH
10
ns
Write Pulse Width
tWP
150
Byte Load Cycle Time
tBLC
Write Pulse Width High
tWPH
Device
After the 150µs time out is completed, the EEPROM
begins an internal write cycle. During this cycle the entire page of bytes will be written at the same time. The
internal programming cycle is the same regardless of
the number of bytes accessed.
Symbol
Write Cycle Time, TYP = 6mS
10
ms
ns
150
50
µs
ns
Block Address
Page Address
WE512K8-XCX
A17-A18
A7 -A16
WE256K8-XCX
A15-A17
A6 -A14
WE128K8-XCX
A15-A16
A6 -A14
FIG. 9
PAGE WRITE WAVEFORMS
NOTE:
1. Decoded Address Lines must be valid for the duration of the write.
9
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WE512K8, WE256K8,
WE128K8-XCX
FIG. 10
SOFTWARE BLOCK DATA
PROTECTION ENABLE A LGORITHM
LOAD DATA AA
TO
ADDRESS 5555
(1)
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA A0
TO
ADDRESS 5555
WRITES
ENABLED(2)
LOAD DATA XX
TO
ANY ADDRESS(4)
LOAD LAST BYTE ENTER DATA
TO
LAST ADDRESS PROTECT STATE
NOTES:
1. Data Format: I/O7-0 (Hex);
Address Format: A14 -A0 (Hex).
A17 and A18 control selection of one of four blocks in the 512Kx8.
A15 , A16, and A17 control selection of one of 8 pages in the
256Kx8.
A15 and A16 control one of the four blocks in the 128Kx8.
2. Write Protect state will be activated at end of write even if no
other data is loaded.
3. Write Protect state will be deactivated at end of write period
even if no other data is loaded.
4. 1 to 128 bytes of data at each of 4 blocks may be loaded in the
512Kx8. 1 to 64 bytes of data at each of 8 blocks may be
loaded in the 256Kx8 and 1 to 64 bytes on 4 blocks in the
128Kx8.
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
10
WE512K8, WE256K8,
WE128K8-XCX
SOFTWARE DATA PROTECTION
FIG. 11
SOFTWARE BLOCK DATA
PROTECTION DISABLE A LGORITHM
LOAD DATA AA
TO
ADDRESS 5555
A software write protection feature may be enabled or
disabled by the user. When shipped by White Microelectronics, the devices have the feature disabled. Write
access to the device is unrestricted.
To enable software write protection, the user writes three
access code bytes to three special internal locations.
Once write protection has been enabled, each write to
the EEPROM must use the same three byte write sequence to permit writing. After setting software data
protection, any attempt to write to the device without
the three-byte command sequence will start the internal write timers. No data will be written to the device,
however, for the duration of tWC. The write protection
feature can be disabled by a six byte write sequence of
specific data to specific locations. Power transitions
will not reset the software write protection.
(1)
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 80
TO
ADDRESS 5555
LOAD DATA AA
TO
ADDRESS 5555
Each 32K byte block (128K bytes for the WE512K8) of
EEPROM has independent write protection. One or
more blocks may be enabled and the rest disabled in
any combination. The software write protection guards
against inadvertent writes during power transitions or
unauthorized modification using a PROM programmer.
The block selection is controlled by the upper most address lines (A17 through A18 for the WE512K8, A15
through A17 for the WE256K8, or A15 and A16 for the
WE128K8).
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 20
TO
ADDRESS 5555
LOAD DATA XX
TO
ANY ADDRESS(4)
EXIT DATA
PROTECT STATE(3)
HARDWARE DATA PROTECTION
LOAD LAST BYTE
TO
LAST ADDRESS
Several methods of hardware data protection have been
implemented in the White Microelectronics EEPROM.
These are included to improve reliability during normal
operations.
a) VCC power on delay
As VCC climbs past 3.8V typical the device will wait
5mSec typical before allowing write cycles.
NOTES:
1. Data Format: I/O7-0 (Hex);
Address Format: A14 -A0 (Hex).
A17 and A18 control selection of one of four blocks in the
512Kx8.
A15, A16 , and A17 control selection of one of 8 pages in the
256Kx8.
A15 and A16 control one of the four blocks in the 128Kx8.
2. Write Protect state will be activated at end of write even if no
other data is loaded.
3. Write Protect state will be deactivated at end of write period even
if no other data is loaded.
4. 1 to 128 bytes of data at each of 4 blocks may be loaded in the
512Kx8. 1 to 64 bytes of data at each of 8 blocks may be loaded
in the 256Kx8 and 1 to 64 bytes on 4 blocks in the 128Kx8.
b) VCC sense
While below 3.8V typical write cycles are inhibited.
c) Write inhibiting
Holding OE low and either CS or WE high inhibits
write cycles.
d) Noise filter
Pulses of <8ns (typ) on WE or CS will not initiate a
write cycle.
11
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WE512K8, WE256K8,
WE128K8-XCX
PACKAGE 300: 32 PIN, CERAMIC DIP, SINGLE CAVITY SIDE BRAZED
ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES
PACKAGE 302: 32 PIN, CERAMIC DIP, DUAL CAVITY BOTTOM BRAZED
ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
12
WE512K8, WE256K8,
WE128K8-XCX
ORDERING INFORMATION
W E XXXK8 - XXX C X X
LEAD FINISH:
Blank = Gold plated leads
A = Solder dip leads
PROCESSING:
Q = MIL-STD-883 Compliant
M = Military Screened
-55°C to +125°C
I = Industrial
-40°C to +85°C
C = Commercial
0°C to +70°C
PACKAGE:
C = Ceramic DIP
(Package 300 for 128Kx8)
(Package 302 for 256Kx8)
(Package 300 for 512Kx8)
ACCESS TIME (ns)
ORGANIZATION, 512Kx8, 256Kx8 or 128Kx8
EEPROM
WHITE ELECTRONIC DESIGNS
DEVICE TYPE
SPEED
PACKAGE
WM PART NO.
SMD NO.
512K x 8 EEPROM
150ns
32 pin DIP (C)
WE512K8-150CQ
5962-93091 01HYX
512K x 8 EEPROM
300ns
32 pin DIP (C)
WE512K8-300CQ
5962-93091 02HYX
512K x 8 EEPROM
250ns
32 pin DIP (C)
WE512K8-250CQ
5962-93091 03HYX
512K x 8 EEPROM
200ns
32 pin DIP (C)
WE512K8-200CQ
5962-93091 04HYX
256K x 8 EEPROM
200ns
32 pin DIP (C)
WE256K8-200CQ
5962-93155 01HYX
256K x 8 EEPROM
150ns
32 pin DIP (C)
WE256K8-150CQ
5962-93155 02HYX
128K x 8 EEPROM
200ns
32 pin DIP (C)
WE128K8-200CQ
5962-93154 01HXX
128K x 8 EEPROM
150ns
32 pin DIP (C)
WE128K8-150CQ
5962-93154 02HXX
DEVICE TYPE
WM PART NO.
SPEED
PACKAGE
SMD NO.
13
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com