ETC GAL22LV10C-7LJ

Ne
Tolew 5V
Inp rant
22Luts on
V10
D
Features
GAL22LV10
Low Voltage E2CMOS PLD
Generic Array Logic™
Functional Block Diagram
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
— 4 ns Maximum Propagation Delay
— Fmax = 250 MHz
— 3 ns Maximum from Clock Input to Data Output
— UltraMOS® Advanced CMOS Technology
RESET
I/CLK
8
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
I
• 3.3V LOW VOLTAGE 22V10 ARCHITECTURE
— JEDEC-Compatible 3.3V Interface Standard
— 5V Compatible Inputs
— I/O Interfaces with Standard 5V TTL Devices
(GAL22LV10C)
10
I
12
I
• E2 CELL TECHNOLOGY
— Reconfigurable Logic
— Reprogrammable Cells
— 100% Tested/100% Yields
— High Speed Electrical Erasure (<100ms)
— 20 Year Data Retention
PROGRAMMABLE
AND-ARRAY
(132X44)
• ACTIVE PULL-UPS ON ALL PINS (GAL22LV10D)
I
I
I
• TEN OUTPUT LOGIC MACROCELLS
— Maximum Flexibility for Complex Logic Designs
— Programmable Output Polarity
I
• PRELOAD AND POWER-ON RESET OF ALL REGISTERS
— 100% Functional Testability
14
16
16
14
I
• APPLICATIONS INCLUDE:
— Glue Logic for 3.3V Systems
— DMA Control
— State Machine Control
— High Speed Graphics Processing
— Standard Logic Speed Upgrade
12
I
10
I
8
• ELECTRONIC SIGNATURE FOR IDENTIFICATION
I
PRESET
Description
Pin Configuration
4
I
I/O/Q
28
I/O/Q
NC
2
Vcc
I
I
I/CLK
PLCC
The GAL22LV10D, at 4 ns maximum propagation delay time, provides the highest speed performance available in the PLD market.
The GAL22LV10C can interface with both 3.3V and 5V signal levels.
The GAL22LV10 is manufactured using Lattice Semiconductor's
advanced 3.3V E2CMOS process, which combines CMOS with
Electrically Erasable (E2) floating gate technology. High speed erase
times (<100ms) allow the devices to be reprogrammed quickly and
efficiently.
26
5
25
7
23
I
I
The generic architecture provides maximum design flexibility by
allowing the Output Logic Macrocell (OLMC) to be configured by
the user.
I/O/Q
GAL22LV10
NC
I
Unique test circuitry and reprogrammable cells allow complete AC,
DC, and functional testing during manufacture. As a result, Lattice
Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and
data retention in excess of 20 years are specified.
I/O/Q
NC
Top View
9
21
I
I/O/Q
I/O/Q
11
I
I/O/Q
I/O/Q
I/O/Q
19
18
16
NC
14
I
I
12
GND
I
I/O/Q
Copyright © 2000 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
22lv10_04
1
November 2000
Specifications GAL22LV10
GAL22LV10 Ordering Information
Commercial Grade Specifications
Tpd (ns)
Tsu (ns)
Tco (ns)
Icc (mA)
Ordering #
Package
4
3
3
130
GAL22LV10D-4LJ
28-Lead PLCC
5
3.5
3.5
130
GAL22LV10D-5LJ
28-Lead PLCC
7.5
6.5
5
75
GAL22LV10C-7LJ
28-Lead PLCC
10
7.5
6.5
75
GAL22LV10C-10LJ
28-Lead PLCC
15
10
10
75
GAL22LV10C-15LJ
28-Lead PLCC
Industrial Grade Specifications
Tpd (ns)
Tsu (ns)
Tco (ns)
Icc (mA)
15
10
10
95
Ordering #
Package
28-Lead PLCC
GAL22LV10C-15LJI
Part Number Description
XXXXXXXX _ XX
X
X X
GAL22LV10D Device Name
GAL22LV10C
Grade
Speed (ns)
L = Low Power
Power
Blank = Commercial
I = Industrial
Package J = PLCC
2
Specifications GAL22LV10
Output Logic Macrocell (OLMC)
The GAL22LV10 has a variable number of product terms per
OLMC. Of the ten available OLMCs, two OLMCs have access to
eight product terms (pins 17 and 27), two have ten product terms
(pins 18 and 26), two have twelve product terms (pins 19 and 25),
two have fourteen product terms (pins 20 and 24), and two OLMCs
have sixteen product terms (pins 21 and 23). In addition to the
product terms available for logic, each OLMC has an additional
product-term dedicated to output enable control.
The GAL22LV10 has a product term for Asynchronous Reset (AR)
and a product term for Synchronous Preset (SP). These two product terms are common to all registered OLMCs. The Asynchronous
Reset sets all registers to zero any time this dedicated product term
is asserted. The Synchronous Preset sets all registers to a logic
one on the rising edge of the next clock pulse after this product term
is asserted.
NOTE: The AR and SP product terms will force the Q output of the
flip-flop into the same state regardless of the polarity of the output.
Therefore, a reset operation, which sets the register output to a zero,
may result in either a high or low at the output pin, depending on
the pin polarity chosen.
The output polarity of each OLMC can be individually programmed
to be true or inverting, in either combinatorial or registered mode.
This allows each output to be individually configured as either active
high or active low.
A R
D
4 TO 1
MUX
Q
CLK
Q
SP
2 TO 1
MUX
GAL22LV10 OUTPUT LOGIC MACROCELL (OLMC)
Output Logic Macrocell Configurations
NOTE: In registered mode, the feedback is from the /Q output of
the register, and not from the pin; therefore, a pin defined as registered is an output only, and cannot be used for dynamic
I/O, as can the combinatorial pins.
Each of the Macrocells of the GAL22LV10 has two primary functional modes: registered, and combinatorial I/O. The modes and
the output polarity are set by two bits (SO and S1), which are normally controlled by the logic compiler. Each of these two primary
modes, and the bit settings required to enable them, are described
below and on the following page.
COMBINATORIAL I/O
In combinatorial mode the pin associated with an individual OLMC
is driven by the output of the sum term gate. Logic polarity of the
output signal at the pin may be selected by specifying that the output
buffer drive either true (active high) or inverted (active low). Output tri-state control is available as an individual product-term for
each output, and may be individually set by the compiler as either
“on” (dedicated output), “off” (dedicated input), or “product-term
driven” (dynamic I/O). Feedback into the AND array is from the pin
side of the output enable buffer. Both polarities (true and inverted)
of the pin are fed back into the AND array.
REGISTERED
In registered mode the output pin associated with an individual
OLMC is driven by the Q output of that OLMC’s D-type flip-flop.
Logic polarity of the output signal at the pin may be selected by
specifying that the output buffer drive either true (active high) or
inverted (active low). Output tri-state control is available as an individual product-term for each OLMC, and can therefore be defined
by a logic equation. The D flip-flop’s /Q output is fed back into the
AND array, with both the true and complement of the feedback
available as inputs to the AND array.
3
Specifications GAL22LV10
Registered Mode
AR
AR
Q
D
CLK
Q
D
Q
CLK
SP
Q
SP
ACTIVE LOW
ACTIVE HIGH
S0 = 0
S1 = 0
S0 = 1
S1 = 0
Combinatorial Mode
ACTIVE LOW
ACTIVE HIGH
S0 = 0
S1 = 1
S0 = 1
S1 = 1
4
Specifications GAL22LV10
GAL22LV10 Logic Diagram/JEDEC Fuse Map
PLCC Package Pinout
2
0
4
8
12
16
20
24
28
32
36
40
ASYNCHRONOUS RESET
(TO ALL REGISTERS)
0000
0044
.
.
.
0396
8
OLMC
S0
5808
S1
5809
0440
.
.
.
.
0880
10
OLMC
S0
5810
S1
5811
3
0924
.
.
.
.
.
1452
12
OLMC
27
26
25
S0
5812
S1
5813
4
1496
.
.
.
.
.
.
2112
14
OLMC
24
S0
5814
S1
5815
5
2156
.
.
.
.
.
.
.
2860
16
OLMC
23
S0
5816
S1
5817
6
2904
.
.
.
.
.
.
.
3608
16
OLMC
21
S0
5818
S1
5819
7
3652
.
.
.
.
.
.
4268
14
OLMC
20
S0
5820
S1
5821
9
4312
.
.
.
.
.
4840
12
OLMC
19
S0
5822
S1
5823
10
4884
.
.
.
.
5324
10
OLMC
S0
5824
S1
5825
11
5368
.
.
.
5720
8
OLMC
S0
5826
S1
5827
12
SYNCHRONOUS PRESET
(TO ALL REGISTERS)
5764
13
5828, 5829 ...
Electronic Signature
... 5890, 5891
Byte 7 Byte 6 Byte 5 Byte 4 Byte 3 Byte 2 Byte 1 Byte 0
M
S
B
L
S
B
5
18
17
16
Specifications
Specifications
GAL22LV10D
GAL22LV10
Absolute Maximum Ratings(1)
Recommended Operating Conditions
Supply voltage VCC .................................... -0.5 to +4.6V
Input voltage applied ................................. -0.5 to +5.6V
I/O voltage applied .................................... -0.5 to +4.6V
Off-state output voltage applied ................ -0.5 to +4.6V
Storage Temperature ................................. -65 to 150°C
Ambient Temperature with
Power Applied ......................................... -55 to 125°C
Commercial Devices:
Ambient Temperature (TA) ............................... 0 to 75°C
Supply voltage (VCC)
with Respect to Ground ......................... +3.0 to +3.6V
1.Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device at
these or at any other conditions above those indicated in the
operational sections of this specification is not implied (while
programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL
VIL
VIH
IIL1
IIH
VOL
VOH
MIN.
TYP.3
MAX.
UNITS
Input Low Voltage
Vss - 0.3
—
0.8
V
Input High Voltage
2.0
—
5.25
V
I/O High Voltage
2.0
—
Vcc+0.5
V
PARAMETER
CONDITION
Input or I/O Low Leakage Current
0V ≤ VIN ≤ VIL (MAX.)
—
—
-100
µA
Input or I/O High Leakage Current
(Vcc-0.2)V ≤ VIN ≤ VCC
—
—
10
µA
Input High Leakage Current
Vcc ≤ VIN ≤ 5.25V
—
—
10
µA
I/O High Leakage Current
Vcc ≤ VIN ≤ 4.6V
—
—
20
mA
Output Low Voltage
IOL = MAX. Vin = VIL or VIH
—
—
0.4
V
IOL = 500µA Vin = VIL or VIH
—
—
0.2
V
IOH = MAX. Vin = VIL or VIH
2.4
—
—
V
Vcc-0.2V
—
—
V
Low Level Output Current
—
—
8
mA
High Level Output Current
—
—
–8
mA
-15
—
-80
mA
—
90
130
mA
Output High Voltage
IOH = -100µA Vin = VIL or VIH
IOL
IOH
IOS2
Output Short Circuit Current
COMMERCIAL
ICC
Operating Power
Supply Current
VCC = 3.3V VOUT = 0.5V TA= 25°C
VIL = 0V VIH = 3.0V
Unused Inputs at VIL
ftoggle = 1MHz Outputs Open
1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information.
2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester
ground degradation. Characterized but not 100% tested.
3) Typical values are at Vcc = 3.3V and TA = 25 °C
6
Specifications
Specifications
GAL22LV10D
GAL22LV10
AC Switching Characteristics
Over Recommended Operating Conditions
PARAMETER
tpd2
tco2
tcf3
tsu
th
fmax4
twh4
twl4
ten
tdis
tar
tarw
tarr
tspr
1)
2)
3)
4)
TEST
COND1.
COM
COM
-4
-5
DESCRIPTION
UNITS
MIN. MAX. MIN. MAX.
A
Input or I/O to Combinational Output
1
4
1
5
ns
A
Clock to Output Delay
1
3
1
3.5
ns
—
Clock to Feedback Delay
—
2.5
—
3
ns
—
Setup Time, Input or Feedback before Clock↑
3
—
3.5
—
ns
—
Hold Time, Input or Feedback after Clock↑
0
—
0
—
ns
A
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
167
—
143
—
MHz
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
182
—
154
—
MHz
A
Maximum Clock Frequency with
No Feedback
250
—
200
—
MHz
—
Clock Pulse Duration, High
2
—
2.5
—
ns
—
Clock Pulse Duration, Low
2
—
2.5
—
ns
B
Input or I/O to Output Enabled
1
5
1
6
ns
C
Input or I/O to Output Disabled
1
5
1
6
ns
A
Input or I/O to Asynchronous Reset of Register
1
4.5
1
5.5
ns
—
Asynchronous Reset Pulse Duration
4.5
—
5.5
—
ns
—
Asynchronous Reset to Clock↑ Recovery Time
3.5
—
4
—
ns
—
Synchronous Preset to Clock↑ Recovery Time
3.5
—
4
—
ns
Refer to Switching Test Conditions section.
Minimum values for tpd and tco are not 100% tested but established by characterization.
Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
Refer to fmax Descriptions section. Characterized but not 100% tested.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
TYPICAL
UNITS
TEST CONDITIONS
CI
Input Capacitance
5
pF
VCC = 3.3V, VI = 0V
CI/O
I/O Capacitance
5
pF
VCC = 3.3V, VI/O = 0V
7
Specifications
SpecificationsGAL22LV10C
GAL22LV10
Absolute Maximum Ratings(1)
Recommended Operating Conditions
Supply voltage VCC .................................... -0.5 to +5.6V
Commercial Devices:
Ambient Temperature (TA) ............................. 0 to +75°C
Supply voltage (VCC)
with Respect to Ground ......................... +3.0 to +3.6V
Input voltage applied ................................. -0.5 to +5.6V
Off-state output voltage applied ................ -0.5 to +5.6V
Storage Temperature ................................. -65 to 150°C
Ambient Temperature with
Power Applied ......................................... -55 to 125°C
Industrial Devices:
Ambient Temperature (TA) .......................... -40 to +85°C
Supply voltage (VCC)
with Respect to Ground ......................... +3.0 to +3.6V
1. Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device
at these or at any other conditions above those indicated in
the operational sections of this specification is not implied
(while programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL
VIL
VIH
IIL
IIH
VOL
VOH
IOL
IOH
IOS1
MIN.
TYP.2
MAX.
UNITS
Input Low Voltage
Vss – 0.5
—
0.8
V
Input High Voltage
2.0
—
5.25
V
PARAMETER
CONDITION
Input or I/O Low Leakage Current
0V ≤ VIN ≤ VIL (MAX.)
—
—
-10
µA
Input or I/O High Leakage Current
(VCC - 0.2)V ≤ VIN ≤ VCC
—
—
10
µA
VCC ≤ VIN ≤ 5.25V
—
—
30
mA
IOL = 8mA Vin = VIL or VIH
—
—
0.4
V
IOL = 16 mA Vin = VIL or VIH
—
—
0.5
V
IOL = 0.5 mA Vin = VIL or VIH
—
—
0.2
V
IOH = MAX. Vin = VIL or VIH
2.4
—
—
V
IOH = -0.5 mA Vin = VIL or VIH
Vcc-0.45
—
—
V
IOH = -100 µA Vin = VIL or VIH
Vcc-0.2
—
—
V
VOL = 0.4 V
—
—
8
mA
VOL = 0.5V
—
—
16
mA
—
—
-4
mA
-15
—
-60
mA
—
45
75
mA
—
65
95
mA
Output Low Voltage
Output High Voltage
Low Level Output Current
High Level Output Current
Output Short Circuit Current
COMMERCIAL
ICC
Operating Power
Supply Current
INDUSTRIAL
ICC
Operating Power
Supply Current
VCC = 3.3V
VOUT = 0.5V TA = 25°C
VIL = 0.0V VIH = 3.0V
ftoggle = 1MHz Outputs Open
VIL = 0.0V VIH = 3.0V
ftoggle = 1MHz Outputs Open
-15
1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems by tester ground
degradation. Characterized but not 100% tested.
2) Typical values are at Vcc = 3.3V and TA = 25 °C
8
Specifications
SpecificationsGAL22LV10C
GAL22LV10
AC Switching Characteristics
Over Recommended Operating Conditions
PARAM
TEST
COND.1
tpd2
tco2
tcf3
tsu
th
fmax4
twh
twl
ten
tdis
tar
tarw
tarr
tspr
COM
COM
COM/IND
-7
-10
-15
DESCRIPTION
MIN. MAX. MIN. MAX. MIN. MAX.
UNITS
A
Input or I/O to Combinatorial Output
2
7.5
2
10
2
15
ns
A
Clock to Output Delay
1
5
1
6.5
1
10
ns
—
Clock to Feedback Delay
—
3
—
5
—
5
ns
—
Setup Time, Input or Fdbk before Clk↑
6
—
7.5
—
10
—
ns
—
Hold Time, Input or Fdbk after Clk↑
0
—
0
—
0
—
ns
A
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
91
—
71
—
50
—
MHz
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
111
—
80
—
66
—
MHz
A
Maximum Clock Frequency with
No Feedback
125
—
111
—
83
—
MHz
—
Clock Pulse Duration, High
3.5
—
4
—
6
—
ns
—
Clock Pulse Duration, Low
3.5
—
4
—
6
—
ns
B
Input or I/O to Output Enabled
2
10
2
12
2
15
ns
C
Input or I/O to Output Disabled
2
10
2
12
2
15
ns
A
Input or I/O to Asynch. Reset of Reg.
2
11
2
13
2
20
ns
—
Asynch. Reset Pulse Duration
6
—
8
—
10
—
ns
—
Asynch. Reset to Clk↑ Recovery Time
6
—
8
—
10
—
ns
—
Synch. Preset to Clk↑ Recovery Time
6
—
8
—
10
—
ns
1) Refer to Switching Test Conditions section.
2) Minimum values for tpd and tco are not 100% tested but established by characterization.
3) Calculated from fmax with internal feedback. Refer to fmax Description section.
4) Refer to fmax Description section.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
TYPICAL
UNITS
TEST CONDITIONS
CI
Input Capacitance
8
pF
VCC = 3.3V, VI = 0V
CI/O
I/O Capacitance
8
pF
VCC = 3.3V, VI/O = 0V
9
Specifications GAL22LV10
Switching Waveforms
INPUT or
I/O FEEDBACK
INPUT or
I/O FEEDBACK
VALID INPUT
VALID INPUT
ts u
t pd
th
CLK
COMBINATORIAL
OUTPUT
tc o
REGISTERED
OUTPUT
Combinatorial Output
1 / fm a x
(external fdbk)
Registered Output
INPUT or
I/O FEEDBACK
t dis
t en
OUTPUT
CLK
1 / fm ax (int ern al fd bk )
Input or I/O to Output Enable/Disable
t su
tc f
REGISTERED
FEEDBACK
fmax with Feedback
tw l
tw h
CLK
1 / fm a x
(w/o fdbk)
Clock Width
INPUT or
I/O FEEDBACK
DRIVING SP
INPUT or
I/O FEEDB ACK
DRIVI NG AR
tsu
th
tspr
CLK
tarw
CLK
tarr
tco
R E G I S T ER E D
OUTPUT
REGISTERED
OUTPUT
tar
Synchronous Preset
Asynchronous Reset
10
Specifications GAL22LV10
fmax Descriptions
CLK
LOGIC
ARRAY
CLK
REGISTER
LOGIC
ARRAY
tsu
tco
REGISTER
fmax with External Feedback 1/(tsu+tco)
Note: fmax with external feedback is calculated from measured
tsu and tco.
CLK
LOGIC
ARRAY
t cf
t pd
fmax with Internal Feedback 1/(tsu+tcf)
REGISTER
Note: tcf is a calculated value, derived by subtracting tsu from
the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The
value of tcf is used primarily when calculating the delay from
clocking a register to a combinatorial output (through registered
feedback), as shown above. For example, the timing from clock
to a combinatorial output is equal to tcf + tpd.
tsu + th
fmax with No Feedback
Note: fmax with no feedback may be less than 1/(twh + twl). This
is to allow for a clock duty cycle of other than 50%.
11
Specifications GAL22LV10
GAL22LV10D: Switching Test Conditions
Input Pulse Levels
GND to 3.0V
Input Rise and Fall Times
1.5ns 10% – 90%
Input Timing Reference Levels
1.5V
Output Timing Reference Levels
1.5V
Output Load
+1.45V
See Figure
TEST POINT
Output Load Conditions (see figure)
R1
CL
50Ω
50Ω
50Ω
50Ω
50Ω
35pF
35pF
35pF
35pF
35pF
Test Condition
A
B
C
High Z to Active High at 1.9V
High Z to Active Low at 1.0V
Active High to High Z at 1.9V
Active Low to High Z at 1.0V
FROM OUTPUT (O/Q)
UNDER TEST
R1
Z0 = 50Ω, CL = 35pF*
*CL includes test fixture and probe capacitance.
GAL22LV10C: Switching Test Conditions
Input Pulse Levels
+3.3V
GND to 3.0V
Input Rise and Fall Times
2.0ns 10% – 90%
Input Timing Reference Levels
1.5V
Output Timing Reference Levels
R1
1.5V
Output Load
See Figure
FROM OUTPUT (O/Q)
UNDER TEST
3-state levels are measured 0.5V from steady-state active
level.
TEST POINT
R2
C L*
Output Load Conditions (see figure)
Test Condition
A
B
C
Active High
Active Low
Active High
Active Low
R1
R2
CL
316Ω
316Ω
316Ω
316Ω
316Ω
348Ω
348Ω
348Ω
348Ω
348Ω
35pF
35pF
35pF
5pF
5pF
*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
12
Specifications GAL22LV10
Electronic Signature
Output Register Preload
An electronic signature (ES) is provided in every GAL22LV10
device. It contains 64 bits of reprogrammable memory that can
contain user-defined data. Some uses include user ID codes,
revision numbers, or inventory control. The signature data is always available to the user independent of the state of the security
cell.
When testing state machine designs, all possible states and state
transitions must be verified in the design, not just those required
in the normal machine operations. This is because certain events
may occur during system operation that throw the logic into an
illegal state (power-up, line voltage glitches, brown-outs, etc.). To
test a design for proper treatment of these conditions, a way must
be provided to break the feedback paths, and force any desired (i.e.,
illegal) state into the registers. Then the machine can be sequenced
and the outputs tested for correct next state conditions.
The electronic signature is an additional feature not present in other
manufacturers' 22V10 devices. To use the extra feature of the userprogrammable electronic signature it is necessary to choose a
Lattice Semiconductor 22V10 device type when compiling a set of
logic equations. In addition, many device programmers have two
separate selections for the device, typically a GAL22LV10 and a
GAL22V10-UES (UES = User Electronic Signature) or GAL22V10ES. This allows users to maintain compatibility with existing 22V10
designs, while still having the option to use the GAL device's extra feature.
The GAL22LV10 device includes circuitry that allows each registered output to be synchronously set either high or low. Thus, any
present state condition can be forced for test sequencing. If necessary, approved GAL programmers capable of executing test
vectors perform output register preload automatically.
Input Buffers
The JEDEC map for the GAL22LV10 contains the 64 extra fuses
for the electronic signature, for a total of 5892 fuses. However, the
GAL22LV10 device can still be programmed with a standard 22V10
JEDEC map (5828 fuses) with any qualified device programmer.
GAL22LV10 devices are designed with TTL level compatible input
buffers. These buffers have a characteristically high impedance,
and present a much lighter load to the driving logic than bipolar TTL
devices.
Security Cell
The input and I/O pins on the GAL22LV10D also have built-in active
pull-ups. As a result, floating inputs will float to a TTL high (logic
1). However, Lattice Semiconductor recommends that all unused
inputs and tri-stated I/O pins be connected to an adjacent active
input, Vcc, or ground. Doing so will tend to improve noise immunity and reduce Icc for the device. (See equivalent input and I/O
schematics on the following page.)
A security cell is provided in every GAL22LV10 device to prevent
unauthorized copying of the array patterns. Once programmed,
this cell prevents further read access to the functional bits in the
device. This cell can only be erased by re-programming the device, so the original configuration can never be examined once this
cell is programmed. The Electronic Signature is always available
to the user, regardless of the state of this control cell.
Typical Input Pull-up Characteristic
Latch-Up Protection
0
-10
Input Current (µA)
GAL22LV10 devices are designed with an on-board charge pump
to negatively bias the substrate. The negative bias is of sufficient
magnitude to prevent input undershoots from causing the circuitry
to latch.
Device Programming
-20
-30
-40
-50
-60
-70
GAL devices are programmed using a Lattice Semiconductorapproved Logic Programmer, available from a number of manufacturers (see the the GAL Development Tools section). Complete
programming of the device takes only a few seconds. Erasing of
the device is transparent to the user, and is done automatically as
part of the programming cycle.
Input Voltage (V)
13
4
3.5
3
2.5
2
1.5
1
0.5
0
-80
Specifications GAL22LV10
Power-Up Reset
Vcc
Vcc (min.)
t su
t wl
CLK
t pr
INTERNAL REGISTER
Q - OUTPUT
Internal Register
Reset to Logic "0"
ACTIVE LOW
OUTPUT REGISTER
Device Pin
Reset to Logic "1"
ACTIVE HIGH
OUTPUT REGISTER
Device Pin
Reset to Logic "0"
Circuitry within the GAL22V10 provides a reset signal to all registers during power-up. All internal registers will have their Q outputs set low after a specified time (tpr, 1µs MAX). As a result, the
state on the registered output pins (if they are enabled) will be
either high or low on power-up, depending on the programmed
polarity of the output pins. This feature can greatly simplify state
machine design by providing a known state on power-up. The
timing diagram for power-up is shown below. Because of the asyn-
chronous nature of system power-up, some conditions must be
met to provide a valid power-up reset of the GAL22V10. First, the
Vcc rise must be monotonic. Second, the clock input must be at
static TTL level as shown in the diagram during power up. The
registers will reset within a maximum of tpr time. As in normal system operation, avoid clocking the device until all input and feedback path setup times have been met. The clock must also meet
the minimum pulse width requirements.
Input/Output Equivalent Schematics
PIN
PIN
Feedback
Vcc
Active Pull-up Circuit
(GAL22LV10D Only)
Active Pull-up Circuit
(GAL22LV10D Only)
Vcc
Vref
Tri-State
Control
Vcc
ESD
Protection
Circuit
Vcc
Vref
Data
Output
PIN
PIN
ESD
Protection
Circuit
Typ. Vref = Vcc
Typ. Vref = Vcc
Typical Input
Feedback
(To Input Buffer)
Typical Output
14
Specifications GAL22LV10
GAL22LV10D: Typical AC and DC Characteristic Diagrams
Normalized Tpd vs Vcc
1.2
1.05
1.1
PT L->H
1
0.9
0.8
3.00
3.15
3.30
3.45
RISE
1.025
FALL
1
0.975
0.95
3.00
3.60
3.15
Supply Voltage (V)
3.30
3.45
1
0.9
0.8
0
25
50
75
100
RISE
1.1
FALL
0.9
0.8
1.3
PT H->L
1.2
-25
0
25
50
PT L->H
1
0.9
0.8
75
100
-55
125
-25
0
Delta Tco (ns)
0
RISE
FALL
-0.3
-0.4
-0.5
-0.1
-0.2
-0.3
RISE
-0.4
FALL
-0.5
1
2
3
4
5
6
7
8
9
10
1
2
3
4
5
6
7
8
9
10
Number of Outputs Switching
Number of Outputs Switching
Delta Tpd vs Output Loading
Delta Tco vs Output Loading
20
16
RISE
12
FALL
Delta Tco (ns)
20
8
4
0
-4
-8
16
RISE
12
FALL
8
4
0
-4
0
50
100
150
200
250
300
0
Output Loading (pF)
50
100
150
200
250
Output Loading (pF)
15
25
50
75
100
Temperature (deg. C)
Delta Tco vs # of Outputs
Switching
0
-0.2
3.60
1.1
Temperature (deg. C)
-0.1
3.45
0.7
0.7
-55
125
3.30
Normalized Tsu vs Temp
1
Delta Tpd vs # of Outputs
Switching
Delta Tpd (ns)
3.15
1.4
1.2
Temperature (deg. C)
Delta Tpd (ns)
0.9
Supply Voltage (V)
Normalized Tsu
Normalized Tco
PT L->H
-25
1
0.8
3.00
3.60
1.3
PT H->L
1.1
PT L->H
Normalized Tco vs Temp
1.3
1.2
PT H->L
1.1
Supply Voltage (V)
Normalized Tpd vs Temp
Normalized Tpd
Normalized Tsu
PT H->L
Normalized Tco
Normalized Tpd
1.2
0.7
-55
Normalized Tsu vs Vcc
Normalized Tco vs Vcc
300
125
Specifications GAL22LV10
GAL22LV10D: Typical AC and DC Characteristic Diagrams
Vol vs Iol
Voh vs Ioh
Voh (V)
Vol (V)
0.8
0.6
0.4
4
3.1
3
3
Voh (V)
1
2
1
0.2
0
5.00
10.00 15.00 20.00
25.00 30.00
2.7
0.00
5.00
Iol (mA)
20.00
1.20
1.00
0.80
3.30
3.45
1.30
1.2
1.25
1.1
1
0.9
0.8
-25
0
25
50
75
100
125
Temperature (deg. C)
0
5
5
10
Iik (mA)
6
4
3
15
20
2
25
1
30
1.00
1.50
2.00
Vin (V)
2.50
3.00
3.50
4.00
1.20
1.15
1.10
1.05
35
-2.00
-1.50
-1.00
Vik (V)
16
-0.50
0
25
50
75
Frequency (MHz)
Input Clamp (Vik)
Delta Icc vs Vin (1 input)
7
3.00
1.00
-55
3.60
2.00
Normalized Icc vs Freq.
1.3
Supply Voltage (V)
0.50
1.00
Ioh(mA)
0.7
3.15
0.00
Normalized Icc
Normalized Icc
Normalized Icc
15.00
Normalized Icc vs Temp
1.40
Delta Icc (mA)
10.00
Ioh(mA)
Normalized Icc vs Vcc
0.60
3.00
2.9
2.8
0
0.00
0
0.00
Voh vs Ioh
0.00
100
Specifications GAL22LV10
GAL22LV10C: Typical AC and DC Characteristic Diagrams
Normalized Tpd vs Vcc
1.2
1.05
1.1
PT L->H
1
0.9
0.8
RISE
1.025
Normalized Tsu
PT H->L
Normalized Tco
FALL
1
0.975
0.95
3.00
3.15
3.30
3.45
3.60
3.15
Supply Voltage (V)
3.30
3.45
Normalized Tco
PT L->H
1
0.9
0.8
0.7
3.00
25
50
75
100
FALL
1
0.9
0.8
-25
0
25
50
75
Delta Tpd (ns)
PT H->L
1.2
PT L->H
1.1
1
0.9
0.8
100
-55
125
-25
0
0
-0.1
-0.1
-0.2
-0.3
RISE
-0.4
FALL
-0.2
-0.3
RISE
-0.4
FALL
-0.5
3
4
5
6
7
8
9
10
1
Number of Outputs Switching
2
3
4
5
6
7
8
9
10
Number of Outputs Switching
Delta Tpd vs Output Loading
Delta Tco vs Output Loading
28
26
24
22
RISE
Delta Tco (ns)
20
FALL
16
12
8
4
0
RISE
18
FALL
14
10
6
2
-2
-4
-8
-6
0
50
100
150
200
250
300
0
Output Loading (pF)
50
100
150
200
250
Output Loading (pF)
17
0
25
50
75
100
Temperature (deg. C)
Delta Tco vs # of Outputs
Switching
-0.5
Delta Tpd (ns)
1.3
Temperature (deg. C)
Delta Tpd vs # of Outputs
Switching
2
3.60
0.7
-55
Temperature (deg. C)
1
3.45
1.4
1.1
125
3.30
Normalized Tsu vs Temp
RISE
1.2
Delta Tco (ns)
0
3.15
Supply Voltage (V)
0.7
-25
0.9
3.60
1.3
PT H->L
-55
1
Normalized Tco vs Temp
1.3
1.1
PT L->H
Supply Voltage (V)
Normalized Tpd vs Temp
1.2
PT H->L
1.1
0.8
3.00
Normalized Tsu
Normalized Tpd
1.2
Normalized Tpd
Normalized Tsu vs Vcc
Normalized Tco vs Vcc
300
125
Specifications GAL22LV10
GAL22LV10C: Typical AC and DC Characteristic Diagrams
Vol vs Iol
Voh vs Ioh
Voh (V)
0.6
0.4
3
3
2
1
0.2
0
0.00
10.00
20.00
30.00
10.00
15.00
2.7
0.00
20.00
1.00
2.00
3.00
Ioh(mA)
Ioh(mA)
Normalized Icc vs Vcc
Normalized Icc vs Temp
Normalized Icc vs Freq.
Normalized Icc
1.00
0.80
1.1
1
0.9
0.8
3.00
3.15
3.30
3.45
3.60
Supply Voltage (V)
-25
0
25
50
75
100
125
Temperature (deg. C)
0
10
Iik (mA)
3
2
1
20
30
40
50
0.50
1.00
1.50
2.00
Vin (V)
2.50
3.00
3.50
1.40
1.20
1.00
60
-2.00
-1.50
-1.00
Vik (V)
18
-0.50
0
25
50
75
Frequency (MHz)
Input Clamp (Vik)
Delta Icc vs Vin (1 input)
4
1.60
0.80
-55
5
4.00
1.80
1.2
0.60
Delta Icc (mA)
5.00
Iol (mA)
1.20
0
0.00
2.9
2.8
0
0.00
40.00
1.40
Normalized Icc
3.1
Normalized Icc
Vol (V)
0.8
4
Voh (V)
1
Voh vs Ioh
0.00
100