MILITARY DATA SHEET Original Creation Date: 03/04/96 Last Update Date: 07/30/96 Last Major Revision Date: 03/04/96 MN54F00-X REV 1A0 QUAD 2 INPUT NAND GATE General Description This device contains four independent gates, each of which performs the logic NAND function. Industry Part Number NS Part Numbers 54F00 54F00DMQB 54F00FMQB 54F00LMQB Prime Die M000 Processing Subgrp Description MIL-STD-883, Method 5004 1 2 3 4 5 6 7 8A 8B 9 10 11 Quality Conformance Inspection MIL-STD-883, Method 5005 1 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( oC) +25 +125 -55 +25 +125 -55 +25 +125 -55 +25 +125 -55 MILITARY DATA SHEET MN54F00-X REV 1A0 Features - Guaranteed 4000V minimum ESD protection. 2 MILITARY DATA SHEET MN54F00-X REV 1A0 (Absolute Maximum Ratings) (Note 1) Storage Temperature -65 C to +150 C Ambient Temperature under Bias -55 C to +125 C Junction Temperature under Bias -55 C to +175 C Vcc Pin Potential to Ground Pin -0.5V to +7.0V Input Voltage (Note 2) -0.5V to +7.0V Input Current (Note 2) -30 mA to +5.0mA Voltage Applied to Output in HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied to Output in LOW State (Max) -0.5V to Vcc -0.5V to +5.5V twice the rated Iol(mA) ESD Last Passing VOltage (Min) 4000V Note 1: Note 2: Absolute Maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Either voltage limit or current limit is sufficient to protect inputs. Recommended Operating Conditions Free Air Ambient Temperature Commercial Military Supply Voltage Military Commercial 0 C to +70 C -55 C to +125 C +4.5V to +5.5V +4.5V to +5.5V 3 MILITARY DATA SHEET MN54F00-X REV 1A0 Electrical Characteristics DC PARAMETER (The following conditions apply to all the following parameters, unless otherwise specified.) DC: VCC 4.5V to 5.5V, Temp range: -55C to 125C SYMBOL PARAMETER CONDITIONS NOTES PINNAME MIN MAX UNIT SUBGROUPS IIH Input High Current VCC=5.5V, VM=2.7V, VINH=5.5V, VINL=0.0V 1, 3 INPUTS 20 uA 1, 2, 3 IBVI Input High Current VCC=5.5V, VM=7.0V, VINH=5.5V, VINL=0.0V 1, 3 INPUTS 100 uA 1, 2, 3 IIL Input LOW Current VCC=5.5V, VM=0.5V, VINH=5.5V 1, 3 INPUTS -0.6 mA 1, 2, 3 VOL Output LOW Voltage VCC=4.5V, VIH=2.0V, IOL=20mA, VINH=5.5V 1, 3 OUTPUTS 0.5 V 1, 2, 3 VOH Output HIGH Voltage VCC=4.5V, VIL=0.8V, IOH=-1.0mA, VINH=5.5V 1, 3 OUTPUTS 2.5 V 1, 2, 3 IOS Short-Circuit Current VCC=5.5V, VINL=0.0V, VM=0.0V, VINH=5.5V 1, 3 OUTPUTS -60 -150 mA 1, 2, 3 VCD Input Clamp Diode Voltage VCC=4.5V, IM=-18mA, VINH=5.5V 1, 3 INPUTS -1.2 V 1, 2, 3 ICCH Supply Current VCC=5.5V, VINL=0.0V 1, 3 VCC 2.8 mA 1, 2, 3 ICCL Supply Current VCC=5.5V, VINH=5.5V 1, 3 VCC 10.2 mA 1, 2, 3 ICEX Output High Leakage Current VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=5.5V 1, 3 OUTPUTS 250 uA 1, 2, 3 AC PARAMETER (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns SEE AC FIGS tpLH tpHL Propagation Delay Propagation Delay Note 1: Note 2: Note 3: Note 4: VCC=5.0V @25C, VCC=4.5V & 5.5V @-55/125C VCC=5.0V @25C VCC=4.5V & 5.5V @-55/125C 2, 4 An/Bn to On 2.4 5.0 ns 9 2, 4 An/Bn to On 2.0 7.0 ns 10, 11 2, 4 An/Bn to On 1.5 4.3 ns 9 2, 4 An/Bn to On 1.5 6.5 ns 10, 11 Screen tested 100% on each device at -55C, +25C & +125C temperature, subgroups A1, 2, 3, 7 & 8. Screen tested 100% on each device at +25C temperature only, subgroup A9. Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C & -55C temperature, subgroups A1, 2, 3, 7 & 8. Sample tested (Method 5005, Table 1) on each MFG. lot at +25C subgroup A9, & at +125C & -55C temperatures, subgroups 10 & 11. 4