ETC 5962-8858603YA

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Changes to reflect MIL-H-38534 processing. Correction to table I.
Editorial changes throughout.
92-03-05
Alan Barone
B
Changes in accordance with NOR 5962-R015-96.
95-12-08
Kendall A. Cottongim
C
Added device types 02 and 03 with cage code 88379. Made changes
to table I, figure 1, and figure 20. Renumbered figures 5 through 21
to figures 4 through 20. Changes to reflect MIL-PRF-38534
processing. -sld
02-03-01
Raymond Monnin
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PMIC N/A
PREPARED BY
Robert M. Heber
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
CHECKED BY
Ray Monnin
APPROVED BY
Michael Frye
http://www.dscc.dla.mil
MICROCIRCUIT, HYBRID, LINEAR, MIL-STD1553, BUS TO MICROPROCESSOR
INTERFACE UNIT
DRAWING APPROVAL DATE
88-12-20
REVISION LEVEL
C
SIZE
A
SHEET
CAGE CODE
5962-88586
67268
1 OF
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
33
5962-E240-02
1. SCOPE
1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits to processed in accordance with
MIL-PRF-38534.
1.2 PIN. The PIN shall be as shown in the following example:
01



Device type
(see 1.2.1)
5962-88586



Drawing number
X



Case outline
(see 1.2.2)
X



Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
01
02
03
Circuit function
BUS-66300II
CT2566-001
CT2566-002
MIL-STD-1553, BUS to microprocessor interface unit
MIL-STD-1553, BUS to microprocessor interface unit
MIL-STD-1553, BUS to microprocessor interface unit
1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
X
Y
Descriptive designator
See figure 1
See figure 1
Terminals
Package style
78
82
Dual-in-line
Flat pack
1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Supply voltage range (VCC) .................................................
Input voltage range (VIN) .....................................................
Supply current (ICC) .............................................................
Power dissipation (PD) ........................................................
Storage temperature range.................................................
Lead temperature (soldering, 10 seconds) .........................
Thermal resistance, junction-to-case (ΘJC) .........................
-0.5 V dc to +7.0 V dc
-0.5 V dc to +7.0 V dc
150 mA
250 mW 2/
-65°C to +150°C
+300°C
4.11°C/W
1.4 Recommended operating conditions.
Supply voltage range (VCC) .................................................
Minimum logic high input voltage (VIH)................................
Maximum logic low input voltage (VIL).................................
Case operating temperature range (TC)..............................
Operating frequency (FOP) ..................................................
1/
2/
4.5 V dc to 5.5 V dc
2.0 V dc
0.8 V dc
-55°C to +125°C
12.0 MHz
Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
Applies up to TC = +125°C.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
2
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in
the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1553 - Aircraft Internal Time Division Command/Response Multiplex Data Bus.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
HANDBOOKS
DEPARTMENT OF DEFENSE
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class.
Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534).
Furthermore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not
perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device
class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Block diagram. The block diagram shall be as specified on figure 3.
3.2.4 Timing diagram(s). The timing diagram(s) shall be as specified on figures 4 through 20.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
3
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked
with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot
sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for
those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer
and be made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as described herein.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
4
TABLE I. Electrical performance characteristics.
Test
Symbol
Group A
subgroups
1/
Conditions
-55°C ≤ TC ≤+125°C
unless otherwise specified
Device
types
Limits
Min
Supply current
ICC
VCC = 5.5 V, IOH = -0.4 mA,
IOL = 4.0 mA, fIN = 12 MHz,
measured at pin 20
1,2,3
All
High level output voltage
2/
VOH
VCC = 4.5 V, IOH = -4.0 mA,
VIH = 2.5 V, VIL = 0.4 V
1,2,3
All
Low level output voltage
2/
VOL
VCC = 4.5 V, IOL = 4.0 mA,
VIH = 2.5 V, VIL = 0.4 V
1,2,3
All
High level input current
3/
IIH1
VCC = 5.5 V, VIN = 2.5 V
1,2,3
All
High level input current 4/ 5/
IIH2
VCC = 5.5 V, VIH = 2.5 V
1,2,3
Low level input current
3/
IIL1
VCC = 5.5 V, VIN = 0.0V
Low level input current
4/ 5/
IIL2
VCC = 5.5 V, IIN = 0.0 V
Functional tests 6/
Unit
Max
150
3.7
mA
V
0.4
V
-10
+10
µA
All
-107
-630
µA
1,2,3
All
-10
+10
µA
1,2,3
All
-134
-700
µA
VCC = 4.5 V, VIH = 2.5 V,
VIL = 0.4 V, IOH = -4.0 mA,
IOL = 4.0 mA, f = 12 MHz
7,8
All
VCC = 4.5 V, VIH = 2.5 V,
VIL = 0.4 V, IOH = -4.0 mA,
IOL = 4.0 mA, fIN = 12 MHz,
See figures 4 through 20
9,10,11
All
200
ns
9,10,11
All
20
ns
Pass/Fail
Delay timing:
READY low delay
(CPU handshake)
tD1
IOEN high delay
(CPU handshake)
tD2
CPU MEMWR low delay
tD3
9,10,11
All
120
ns
CPU MEMOE low delay
tD4
9,10,11
All
115
ns
EXTLD low delay
tD5
9,10,11
All
130
ns
RESET low delay
tD6
9,10,11
All
30
ns
Internal Register delay (read)
tD7
9,10,11
All
60
ns
Internal Register delay (write)
tD8
9,10,11
All
60
ns
Register Data/Address setup
time
tD9
9,10,11
All
40
ns
Register Data/Address hold
time
tD10
9,10,11
All
0
ns
BC , SOM cycle DMA mode
tD11
9,10,11
All
120
ns
INT low delay
tD12
9,10,11
All
50
ns
7/ 8/
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
5
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Group A
subgroups
1/
Conditions
-55°C ≤ TC ≤+125°C
unless otherwise specified
Device
types
Limits
Min
Unit
Max
Delay Timing - Continued:
RTU, SOM cycle DMA delay
tD13
VCC = 4.5 V, VIH = 2.5 V,
VIL = 0.4 V, IOH = -4.0 mA,
IOL = 4.0 mA, fIN = 12 MHz,
See figures 4 through 20
9,10,11
All
200
ns
7/ 8/
1553 Command Word setup
time
tD14
9,10,11
All
60
ns
1553 Command Word hold
time
tD15
9,10,11
All
60
ns
MT , SOM cycle DMA delay
tD16 9/
9,10,11
All
200
ns
CS low to MEMCS low delay
tD17
9,10,11
All
30
ns
OE low to MEMOE low delay
tD18
9,10,11
All
30
ns
WR low to MEMWR low
delay
tD19
9,10,11
All
30
ns
BUSGRNT high delay
tD20
9,10,11
All
25
ns
BUSACK low address delay
tD21
9,10,11
All
45
ns
BUSACK high address delay
tD22
9,10,11
All
25
ns
Address increment delay
tD23
9,10,11
All
200
ns
9,10,11
All
70
ns
Pulse Width Timing:
READYD pulse width
(CPU handshake)
tPW1
VCC = 4.5 V, VIH = 2.5 V,
VIL = 0.4 V, IOH = -4.0 mA,
IOL = 4.0 mA, fIN = 12 MHz,
See figures 4 through 20
8/
CPU MEMWR low pulse
width
tPW2
9,10,11
All
70
ns
CPU MEMCS low pulse
width
tPW3
9,10,11
All
70
ns
EXTLD low pulse width
tPW4
9,10,11
All
70
ns
RESET low pulse width
tPW5
9,10,11
All
70
ns
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
6
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Group A
subgroups
1/
Conditions
-55°C ≤ TC ≤+125°C
unless otherwise specified
Device
types
Limits
Min
Unit
Max
Pulse Width Timing - Continued:
DMA MEMWR low pulse
width
tPW6
VCC = 4.5 V, VIH = 2.5 V,
VIL = 0.4 V, IOH = -4.0 mA,
IOL = 4.0 mA, fIN = 12 MHz,
See figures 4 through 20
9,10,11
All
70
ns
8/
DMA MEMCS low pulse width
tPW7
9,10,11
All
70
ns
BCSTART low pulse width
tPW8
9,10,11
All
70
ns
EOM low pulse width
tPW9
9,10,11
All
50
200
ns
INT low pulse width
tPW10
9,10,11
All
20
200
ns
INT low ( BC EOM ) pulse
width
tPW11
9,10,11
All
60
SOM low pulse width
tPW12
9,10,11
All
50
200
ns
NBGRNT low pulse width
tPW13
9,10,11
All
50
200
ns
ADRINC low pulse width
tPW14
9,10,11
All
50
200
ns
MSTRCLR low pulse width
tPW15
9,10,11
All
150
ns
9,10,11
All
40
ns
83
ns
ns
DMA Cycle Data/Address set-up and hold timing:
DMA address setup time
tAS1
VCC = 4.5 V, VIH = 2.5 V,
VIL = 0.4 V, IOH = -4.0 mA,
IOL = 4.0 mA, fIN = 12 MHz,
See figures 4 through 20
7/ 8/
DMA data setup time
tDS1
9,10,11
All
DMA address setup time
tAS2
9,10,11
All
45
ns
DMA data setup time
tDS2
9,10,11
All
83
ns
DMA address hold time
tAH1
9,10,11
All
60
ns
DMA data hold time
tDH1
9,10,11
All
30
ns
DMA address hold time
tAH2
9,10,11
All
0
ns
DMA data hold time
tDH2
9,10,11
All
0
ns
Maximum clock frequency
fMAX
9,10,11
All
50 percent duty cycle 7/
16.0
MHz
See footnotes on next page.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
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A
REVISION LEVEL
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SHEET
7
TABLE I. Electrical performance characteristics -Continued.
1/
All group A subgroup testing may be performed concurrently.
2/
Measured at the following pins:
Case X: Pins 3 through 5, 14, 16, 21 through 39, 42, 43, 45 through 47, 50, 56, 57, and 59 through 77.
Case Y: Pins 5 through 8, 10, 11, 13, 15, 21, 28, 32, 33, 35, 39, and 45 through 81.
3/
Measured at the following pins:
Case X: Pins 7 through 9, 11 through 13, 17, 19, 21 through 28, 38, 39, 44, 48, 49, 51, 53 through 55, 60 through
67 and 77.
Case Y: Pins 9, 14, 16 through 19, 22 through 24, 26, 27,29, 31,34, 38, 45 through 47, and 66 through 81.
4/
Measured at the following pins:
Case X: Pins 1, 2, 6, 10, 41, and 52.
Case Y: Pins 2 through 4, 12, 20, and 25.
5/
For device type 03, case X, pin 52 and case Y, pin 25 have a 0.001 µf capacitor to ground.
6/
Functional tests performed to verify functionality of device as a handshake intermediary between MIL- STD-1750 Central
Processing Units (CPU) and MIL-STD-1553 Bus Controller (BC), Remote Terminal Unit (RTU) and Bus Monitor (MT).
7/
Parameter shall be tested as part of device intial characterization and after design and process changes. Parameter
shall be guaranteed to the limits specified in table I for all lots not specifically tested.
8/
All timing characterisitics measured at 50 percent of waveform, unless otherwise specified.
9/
For device types 02 and 03, tD16 is referenced from the rising edge of READYD as shown in figure 19.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
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REVISION LEVEL
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8
Case outline X
Symbol
A
Φb
D
D1
D2
E
E1
E2
e
e1
e2
L
S
S1
Millimeters
Min
Max
6.35
0.33
0.58
47.50
41.78
42.04
37.97
38.23
53.34
48.13
48.39
45.59
45.85
2.54 TYP
2.41
2.67
1.14
1.40
0.61
0.66
1.78
2.03
1.91 TYP
Inches
Min
Max
.250
.013
.023
1.870
1.645
1.655
1.495
1.505
2.100
1.895
1.905
1.795
1.805
.100 TYP
.095
.105
.045
.055
.240
.260
.070
.080
.075 TYP
NOTES:
1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of
measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound
units shall rule.
FIGURE 1. Case outline(s).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
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REVISION LEVEL
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Case outline Y
Symbol
Millimeters
Min
A
Inches
Max
Min
4.72
A1
.186
2.03 REF
Φb
0.30
Max
.080 REF
0.46
.012
.018
Φc
0.20
0.30
D
40.51
40.77
1.595
1.605
E
55.50
55.75
2.185
2.195
e
L
.008
1.27 TYP
.050 TYP
10.16
S1
.012
.400
2.41 REF
.095 REF
NOTES:
1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of
measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound
units shall rule.
FIGURE 1. Case outline(s) - Continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
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REVISION LEVEL
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Device
types
All
Case
outline
X
Device
types
All
Case
outline
X
Terminal
number
Terminal symbol
Terminal
number
Terminal symbol
Terminal
number
Terminal symbol
1
SELECT
27
D03
53
BUSACK
2
RD/ WR
28
D01
54
WR
3
READYD
29
SSFLAG
55
CS
4
EXTEN
30
SSBUSY
56
MEMOE
5
TAGEN
31
RTU/ BC
57
MEMWR
6
EOM
32
A14
58
No connection
7
SOM
33
A12
59
MT
8
STATERR
34
A10
60
D14
9
ADR INC
35
A08
61
D12
10
MEM/ REG
36
A06
62
D10
11
CLOCKIN
37
A04
63
D08
12
LOOPERR
38
A02
64
D06
13
BUSREQ
39
A00 (LSB)
65
D04
14
BUSGRNT
40
Ground
66
D02
15
No connection
41
STRBD
67
D00 (LSB)
16
MEMCS
42
IOEN
68
SVCREQ
17
OE
43
EXTLD
69
DBAC
18
No connection
44
CHB/ CHA
70
A15 (MSB)
19
NBGRNT
45
INT
71
A13
20
VCC
46
BCSTART
72
A11
21
D15 (MSB)
47
RESET
73
A09
22
D13
48
MSGERR
74
A07
23
D11
49
CTLIN B/ A
75
A05
24
D09
50
CTLOUT B/ A
76
A03
25
D07
51
TIMEOUT
77
A01
26
D05
52
MSTRCLR
78
Chassis ground
FIGURE 2. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
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COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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REVISION LEVEL
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Device
types
All
Case
outline
Y
Device
types
All
Case
outline
Y
Terminal
number
Terminal symbol
Terminal
number
Terminal symbol
Terminal
number
Terminal symbol
1
No connection
29
WR
57
A12
2
SELECT
30
No connection
58
A13
3
STRBD
31
CS
59
A14
4
RD/ WR
32
MEMCS
60
A15 (MSB)
5
IOEN
33
MEMOE
61
RTU/ BC
6
READYD
34
OE
62
DBAC
7
EXTLD
35
MEMWR
63
SSBUSY
8
EXTEN
36
No connection
64
SVCREQ
9
CHB/ CHA
37
No connection
65
SSFLAG
10
TAGEN
38
NBGRNT
66
D00 (LSB)
11
INT
39
MT
67
D01
12
EOM
40
VCC
68
D02
13
BCSTART
41
No connection
69
D03
14
SOM
42
No connection
70
D04
15
RESET
43
Ground
71
D05
16
STATERR
44
Chassis ground
72
D06
17
MSGERR
45
A00 (LSB)
73
D07
18
ADR INC
46
A01
74
D08
19
CTLIN B/ A
47
A02
75
D09
20
MEM/ REG
48
A03
76
D10
21
CTLOUT B/ A
49
A04
77
D11
22
CLOCKIN
50
A05
78
D12
23
TIMEOUT
51
A06
79
D13
24
LOOPERR
52
A07
80
D14
25
MSTRCLR
53
A08
81
D15 (MSB)
26
BUSREQ
54
A09
82
No connection
27
BUSACK
55
A10
28
BUSGRNT
56
A11
FIGURE 2. Terminal connections - Continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
12
FIGURE 3. Block diagram.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
13
NOTE:
STRBD to IOEN (low) delay is two clock cycles. If contention occurs, delay is two cycles following release of bus.
FIGURE 4. Timing diagram - CPU reads from internal register.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
14
NOTE:
STRBD to IOEN (low) delay is two clock cycles. If contention occurs, delay is two cycles following release of bus.
FIGURE 5. Timing diagram - CPU writes to internal register.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
15
NOTE:
STRBD to IOEN (low) delay is two clock cycles. If contention occurs, delay is two cycles following release of bus.
FIGURE 6. Timing diagram - CPU reads from external register.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
16
NOTE:
STRBD to IOEN (low) delay is two clock cycles. If contention occurs, delay is two cycles following release of bus.
FIGURE 7. Timing diagram - CPU writes to external register.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
17
NOTE:
STRBD to IOEN (low) delay is two clock cycles. If contention occurs, delay is two cycles following release of bus.
FIGURE 8. Timing diagram - CPU read from RAM.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
18
NOTE:
STRBD to IOEN (low) delay is two clock cycles. If contention occurs, delay is two cycles following release of bus.
FIGURE 9. Timing diagram - CPU writes to RAM.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
19
FIGURE 10. Timing diagram - 1553 terminal to interface unit handshaking.
FIGURE 11. Timing diagram - 1553 terminal I/O delay.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
20
FIGURE 12. Timing diagram - interface unit address increment.
NOTE:
RESET (low) pulse width will be approximately equal to that of MSTRCLR (low).
FIGURE 13. Timing diagram - interface unit direct reset.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
21
NOTE:
STRBD to IOEN (low) delay is two clock cycles. If contention occurs, delay is two cycles following release of bus.
FIGURE 14. Timing diagram - programmed interface unit reset.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
22
FIGURE 15. Timing diagram - RTU SOM (no connection).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
23
FIGURE 16. Timing diagram - RTU EOM (no connection).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
24
FIGURE 17. Timing diagram - BC SOM (no connection).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
25
FIGURE 18. Timing diagram - BC EOM (no connection).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
26
NOTE: For device types 02 and 03, tD16 is referenced from the rising edge of READYD.
FIGURE 19. Timing diagram - MT SOM (no connection).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
27
FIGURE 20. Timing diagram - DMA read/write (SOM/EOM cycles).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
28
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A
test table)
Interim electrical parameters
1, 7, 9
Final electrical parameters
1*, 2, 3, 7*, 8, 9*, 10, 11
Group A test requirements
1, 2, 3, 7, 8, 9, 10, 11
Group C end-point electrical
parameters
1, 2, 3, 7, 8, 9, 10, 11
Not applicable
End-point electrical parameters
for Radiation Hardness Assurance
(RHA) devices
* PDA applies to subgroup 1, 7, and 9.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
b.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1015 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1015 of MIL-STD-883.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 4, 5, and 6 shall be omitted.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
29
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
End-point electrical parameters shall be as specified in table II herein.
b.
Steady-state life test, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1005 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1005 of MIL-STD-883.
(3)
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF38534.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962)
should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone
(614) 692-0514.
6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103
and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing.
6.7 Pin functions. Microcircuits conforming to this drawing shall have the pin functions as specified in table III herein.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
30
TABLE III. Pin functions.
Pin name
I/O
Description
SELECT
I
Select. When active, selects interface unit for operation.
RD/ WR
I
Read/Write. Controls CPU bus data direction.
READYD
O
Ready Data. When active indicates data has been received from, or is available to
the CPU.
EXTEN
O
External Enable. Output from interface unit to enable output from external devices.
Same timing as MEMEO .
TAGEN
O
Tag Enable. Enables an external time tag counter for transfering the time tag word
into memory.
EOM
I
End of Message. Input from 1553 device indicating end of message.
SOM
I
Start of message. Input from 1553 device indicating start of message.
STATERR
I
Status Error. Input from 1553 device when status word has either a bit set or
unexpected RTU address (in BC mode only).
ADRINC
I
Address Increment. Send from 1553 device to increment address counter following
word transfer.
MEM/ REG
I
Memory/Register. Input from CPU to select memory or register data transfer.
CLOCKIN
I
Clock input; 50 percent duty cycle, 16 MHz, maximum.
LOOPERR
I
Loop Error. Input from 1553 device if short loop BIT fails.
BUSREQ
I
Bus Request. When active, indicates 1553 device requires use of the address/data
bus.
BUSGRNT
O
Bus Grant. Handshake output to 1553 device in response to Bus Request indicating
address/data bus available to 1553 device.
MEMCS
O
Memory Chip Select. Low from interface unit enable external RAM. Used with 4K x
4 RAM type device to read RAM or used in conjunction with MEMWR to write data
into RAM.
OE
I
Output Enable. Input from 1553 device used to enable memory on the parallel bus.
NBGRNT
I
Low pulse from 1553 device preceding start of receiving new protocol sequence.
Used with superseding command to reset DMA in progress.
VCC
I
Logic power supply (+5.0 V).
D15
I/O
Data Bus Bit 15 (MSB).
D13
I/O
Data Bus Bit 13.
D11
I/O
Data Bus Bit 11.
D09
I/O
Data Bus Bit 9.
D07
I/O
Data Bus Bit 7.
D05
I/O
Data Bus Bit 5.
D03
I/O
Data Bus Bit 3.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
31
TABLE III. Pin functions - Continued.
Pin name
I/O
Description
D01
I/O
Data Bus Bit 1.
SSFLAG
O
Subsystem Flag. Output to 1553 device to set RTU subsystem flag status bit.
SSBUSY
O
Subsystem Busy. Output to 1553 device to set RTU subsystem busy flag.
RTU/ BC
O
Output to 1553 device used in conjunction with MT to set operating mode.
A14
O
Address Bit 14.
A12
O
Address Bit 12.
A10
O
Address Bit 10
A08
O
Address Bit 8.
A06
O
Address Bit 6.
A04
O
Address Bit 4.
A02
I/O
Address Bit 2.
A00
I/O
Address Bit 0 (LSB).
Ground
-
Signal return.
STRBD
I
Strobe Data. Used in conjunction with SELECT to indicate a data transfer cycle
to/from the CPU.
IOEN
O
Input/Output Enable. Output from interface unit to enable external buffers/latches
connecting the hybrid to the address/data bus.
EXTLD
O
External load. Used to load data into external device via the interface unit data bus.
Same timing as MEMWR .
Input from 1553 in RTU mode used to indicate received 1553 message came in
either channel A or B.
CHB/ CHA
INT
O
Interrupt. Interrupt pulse line to CPU
BCSTART
O
Bus Controller Start. Output to 1553 to initiate BC cycle.
RESET
O
Reset. Output to external device from interface unit consisting of the OR condition
of CPU reset and CPU Master Clear.
MSGERR
I
Message error. Input from 1553 device when an error occurs in message
sequence.
CTLIN B /A
O
Input to change memory map area (0 = area A).
CTLOUT B/ A
O
Output from interface unit selecting which area is to be active (0 = area A).
TIMEOUT
I
Input from 1553 device indicating no response time-out.
MSTRCLR
I
Master Clear. Power-on reset from CPU. Resets DMA in progress and internal
registers to logic "0".
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
32
TABLE III. Pin functions - Continued.
Pin name
I/O
Description
BUSACK
I
Bus Acknowledge. Input from 1553 device acknowledge receipt of BUSGRNT .
WR
I
Write. Input from 1553 device for writing data into memory.
CS
I
Chip Select. Input from 1553 device that is routed to MEMCS .
MEMOE
O
Memory Output Enable. Output from interface unit to enable memory output data.
MEMWR
O
Memory Write. Output pulse from interface unit to write data bus into memory.
MT
O
Bus Monitor. Used in conjunction with RTU/ BC to set operating mode.
D14
I/O
Data Bus Bit 14.
D12
I/O
Data Bus Bit 12.
D10
I/O
Data Bus Bit 10.
D08
I/O
Data Bus Bit 8.
D06
I/O
Data Bus Bit 6.
D04
I/O
Data Bus Bit 4.
D02
I/O
Data Bus Bit 2.
D00
I/O
Data Bus Bit 0 (LSB).
SVCREQ
O
Service Request. Used to set service request bit in RTU Block Status Word.
DBAC
O
Dynamic Bus Acceptance. Used to set status bit in RTU Block Status Word.
A15
O
Data Bus Bit 15 (MSB).
A13
O
Data Bus Bit 13.
A11
O
Data Bus Bit 11.
A09
O
Data Bus Bit 9.
A07
O
Data Bus Bit 7.
A05
O
Data Bus Bit 5.
A03
O
Data Bus Bit 3.
A01
I/O
Data Bus Bit 1.
--
Chassis Ground
Chassis Ground
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-88586
A
REVISION LEVEL
C
SHEET
33
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 02-03-01
Approved sources of supply for SMD 5962-88586 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next
dated revisions of MIL-HDBK-103 and QML-38534.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8858601XA
5962-8858601XC
19645
19645
BUS-66300II-140
BUS-66300II-883B
5962-8858601YA
5962-8858601YC
19645
19645
BUS-66301II-140
BUS-66301II-883B
5962-8858602XA
5962-8858602XC
5962-8858602YA
5962-8858602YC
88379
88379
88379
88379
CT2566-001-2
CT2566-001-1
CT2566-201-2
CT2566-201-1
5962-8858603XA
5962-8858603XC
5962-8858603YA
5962-8858603YC
88379
88379
88379
88379
CT2566-002-2
CT2566-002-1
CT2566-202-2
CT2566-202-1
1/ The lead finish shown for each PIN representing a hermetic
package is the most readily available from the manufacturer
listed for that part. If the desired lead finish is not listed
contact the Vendor to determine its availability.
2/ Caution. Do not use this number for item acquisition. Items
acquired to this number may not satisfy the performance
requirements of this drawing.
Vendor CAGE
number
Vendor name
and address
19645
ILC Data Device Corporation
105 Wilbur Place
Bohemia, NY 11716
88379
Aeroflex Circuit Technology Corporation
35 South Service Road
Plainview, NY 11803-4101
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.