ETC HB56UW432D-7

HB56UW232D Series
HB56UW432D Series
2,097,152-word × 32-bit High Density Dynamic RAM Module
4,194,304-word × 32-bit High Density Dynamic RAM Module
ADE-203-784A (Z)
Rev.1.0
May. 20, 1997
Description
The HB56UW232D is a 2M × 32 dynamic RAM Small Outline Dual In-line Memory Module
(S.O.DIMM), mounted 4 pieces of 16-Mbit DRAM (HM51W17805) sealed in TSOP package. The
HB56UW432D is a 4M × 32 dynamic RAM Small Outline Dual In-line Memory Module (S.O.DIMM),
mounted 8 pieces of 16-Mbit DRAM (HM51W17805) sealed in TSOP package. The HB56UW232D,
HB56UW432D offer Extended Data Out (EDO) page mode as a high speed access mode. An outline of the
HB56UW232D, HB56UW432D is 72-pin Zig Zag Dual tabs socket type compact and thin package.
Therefore, the HB56UW232D, HB56UW432D make high density mounting possible without surface
mount technology. The HB56UW232D, HB56UW432D provide common data inputs and outputs.
Decoupling capacitors are mounted on the module board.
Features
• 72-pin Zig Zag Dual tabs socket type
 Outline: 59.69 mm (Length) × 25.40 mm (Height) × 2.42/3.80 mm (Thickness)
 Lead pitch: 1.27 mm
• Single 3.3 V (±0.3 V) supply
• High speed
 Access time: tRAC = 50/60/70 ns (max)
tCAC = 13/15/18 ns (max)
• Low power dissipation
 Active mode: 1.59/1.44/1.30 W (max) (HB56UW232D Series)
1.66/1.51/1.36 W (max) (HB56UW432D Series)
 Standby mode (TTL): 28.8/57.6 mW (max)
(CMOS): 2.16/4.32 mW (max) (L-version)
• EDO page mode capability
• Refresh period
 2048 refresh cycles: 32 ms
128 ms (L-version)
• 4 variations of refresh
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series




RAS-only refresh
CAS-before-RAS refresh
Hidden refresh
Self refresh (L-version)
Ordering Information
Type No.
Access time
Package
Contact pad
HB56UW232D-5
HB56UW232D -6
HB56UW232D -7
50 ns
60 ns
70 ns
72-pin small outline DIMM
Gold
HB56UW232D -5L
HB56UW232D -6L
HB56UW232D -7L
50 ns
60 ns
70 ns
HB56UW432D -5
HB56UW432D -6
HB56UW432D -7
50 ns
60 ns
70 ns
HB56UW432D -5L
HB56UW432D -6L
HB56UW432D -7L
50 ns
60 ns
70 ns
2
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Pin Arrangement
1 pin
71 pin
Front side
Back side
2 pin
Front side
72 pin
Back side
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
1
VSS
37
DQ18
2
DQ0
38
DQ19
3
DQ1
39
VSS
4
DQ2
40
CE0
5
DQ3
41
CE2
6
DQ4
42
CE3
7
DQ5
43
CE1
8
DQ6
44
RE0
10
VCC
46
NC
9
DQ7
45
RE1(NC)*
11
PD1
47
WE
12
A0
48
NC
13
A1
49
DQ20
14
A2
50
DQ21
15
A3
51
DQ22
16
A4
52
DQ23
17
A5
53
DQ24
18
A6
54
DQ25
19
A10
55
NC
20
NC
56
DQ27
21
DQ9
57
DQ28
22
DQ10
58
DQ29
23
DQ11
59
DQ31
24
DQ12
60
DQ30
25
DQ13
61
VCC
26
DQ14
62
DQ32
27
DQ15
63
DQ33
28
A7
64
DQ34
29
NC
65
NC
30
VCC
66
PD2
31
A8
67
PD3
32
A9
68
PD4
33
RE3(NC)*
69
PD5
34
RE2
70
PD6
35
DQ16
71
PD7
36
NC
72
VSS
1
2
Notes: 1. RE3: HB56UW432D, NC: HB56UW232D
2. RE1: HB56UW432D, NC: HB56UW232D
3
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Pin Description
Pin name
Function
A0 to A10
Address inputs:
• Row address: A0 to A10
• Column address:
A0 to A9
• Refresh address:
A0 to A10
DQ0 to DQ7, DQ9 to DQ16,
DQ18 to DQ25, DQ27 to DQ34
Data-in/Data-out
RE0 to RE3
Row address strobe (RAS)
CE0 to CE3
Column address strobe (CAS)
WE
Read/Write enable
VCC
Power supply
VSS
Ground
PD1 to PD7
Presence detect
NC
No connection
Presence Detect Pin Arrangement
Function
Pin No.
Pin name
50 ns
60 ns
70 ns
11
PD1
VSS
VSS
VSS
66
PD2
NC
NC
NC
67
PD3
VSS
VSS
VSS
68
PD4 (HB56UW232D) NC
NC
NC
PD4 (HB56UW432D) VSS
VSS
VSS
69
PD5
VSS
NC
VSS
70
PD6
VSS
NC
NC
71
PD7
NC
NC
NC
PD7 (L-version)
VSS
VSS
VSS
4
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Block Diagram (HB56UW232D)
RE0
CE0
WE
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
RAS
WE
D0
OE
CE1
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQ16
RAS
WE
D1
OE
RE2
CE2
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ24
DQ25
RAS
WE
D2
OE
CE3
DQ27
DQ28
DQ29
DQ30
DQ31
DQ32
DQ33
DQ34
RAS
D3
A0 to A10
VCC
VSS
WE
OE
D0 to D3
0.22 µF × 4 pcs
D0 to D3
D0 to D3
* D0 to D3: HM51W17805
5
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Block Diagram (HB56UW432D)
WE
RE1
RE0
CE0
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
RAS
WE
D0
OE
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
RAS
WE
D4
OE
CE1
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQ16
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
RAS
WE
D1
OE
RAS
WE
D5
OE
RE3
RE2
CE2
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ24
DQ25
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
RAS
WE
D2
OE
RAS
WE
D6
OE
CE3
DQ27
DQ28
DQ29
DQ30
DQ31
DQ32
DQ33
DQ34
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CAS
RAS
D3
A0 to A10
VCC
VSS
* D0 to D7
WE
OE
D0 to D7
0.22 µF × 8 pcs
: HM51W17805
6
This Material Copyrighted by Its Respective Manufacturer
D0 to D7
D0 to D7
RAS
WE
D7
OE
HB56UW232D Series, HB56UW432D Series
Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
Voltage on any pin relative to V SS
VT
–0.5 to +4.6
V
Supply voltage relative to VSS
VCC
–0.5 to +4.6
V
Short circuit output current
Iout
50
mA
Power dissipation
Pt
4
W
Operating temperature
Topr
0 to +70
°C
Storage temperature
Tstg
–55 to +125
°C
Recommended DC Operating Conditions (Ta = 0 to 70°C)
Parameter
Symbol
Min
Typ
Max
Unit
Supply voltage
VSS
0
0
0
V
VCC
3.0
3.3
3.6
V
1
Input high voltage
VIH
2.0
—
VCC +0.3
V
1
Input low voltage
VIL
–0.3
—
0.8
V
1
Note:
Note
1. All voltage referred to VSS .
7
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
DC Characteristics (Ta = 0 to 70°C, VCC = 3.3 V ± 0.3V, VSS = 0 V) (HB56UW232D)
50 ns
60 ns
70 ns
Parameter
Symbol Min Max Min Max Min Max Unit
Test conditions
Notes
Operating current
I CC1
—
440 —
400 —
360 mA
t RC = min
1, 2
Standby current
I CC2
—
8
—
8
—
8
mA
TTL interface
RAS, CAS = VIH
Dout = High-Z
—
4
—
4
—
4
mA
CMOS interface
RAS, CAS ≥ VCC – 0.2 V
Dout = High-Z
—
0.6
—
0.6
mA
CMOS interface
RAS, CAS ≥ VCC – 0.2 V
Dout = High-Z
Standby current (Lversion)
I CC2
—
0.6
RAS-only refresh
current
I CC3
—
440 —
400 —
360 mA
t RC = min
2
Standby current
I CC5
—
20
20
20
RAS = VIH, CAS = VIL
Dout = enable
1
CAS-before-RAS
refresh current
I CC6
—
440 —
400 —
360 mA
t RC = min
EDO page mode
current
I CC7
—
400 —
360 —
340 mA
t HPC = min
1, 3
Battery backup current I CC10
(Standby with CBR
refresh) (L-version)
—
1.6
—
1.6
—
1.6
mA
CMOS interface
Dout = High-Z
CBR refresh:
t RC = 62.5 µs
t RAS ≤ 0.3 µs
4
Self refresh mode
current
(L-version)
I CC11
—
1
—
1
—
1
mA
CMOS interface
RAS, CAS ≤ 0.2 V
Dout = High-Z
Input leakage current
I LI
–10 10
–10 10
–10 10
µA
0 V ≤ Vin ≤ 4.6 V
Output leakage current I LO
–10 10
–10 10
–10 10
µA
0 V ≤ Vout ≤ 4.6 V
Dout = disable
Output high voltage
VOH
2.4
VCC
2.4
VCC
2.4
VCC
V
High Iout = –2 mA
Output low voltage
VOL
0
0.4
0
0.4
0
0.4
V
Low Iout = 2 mA
—
—
mA
Notes: 1. I CC depends on output load condition when the device is selected, ICC max is specified at the
output open condition.
2. Address can be changed once or less while RAS = VIL.
3. Address can be changed once or less while CAS = VIH.
4. CAS = L (≤ 0.2 V) while RAS = L (≤ 0.2 V).
8
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
DC Characteristics (Ta = 0 to 70°C, VCC = 3.3 V ± 0.3V, VSS = 0 V) (HB56UW432D)
50 ns
60 ns
70 ns
Parameter
Symbol Min Max Min Max Min Max Unit
Test conditions
Notes
Operating current
I CC1
—
460 —
420 —
380 mA
t RC = min
1, 2
Standby current
I CC2
—
16
—
16
—
16
mA
TTL interface
RAS, CAS = VIH
Dout = High-Z
—
8
—
8
—
8
mA
CMOS interface
RAS, CAS ≥ VCC – 0.2 V
Dout = High-Z
—
1.2
—
1.2
mA
CMOS interface
RAS, CAS ≥ VCC – 0.2 V
Dout = High-Z
Standby current (Lversion)
I CC2
—
1.2
RAS-only refresh
current
I CC3
—
460 —
420 —
380 mA
t RC = min
2
Standby current
I CC5
—
40
40
40
RAS = VIH, CAS = VIL
Dout = enable
1
CAS-before-RAS
refresh current
I CC6
—
460 —
420 —
380 mA
t RC = min
EDO page mode
current
I CC7
—
420 —
380 —
360 mA
t HPC = min
1, 3
Battery backup current I CC10
(Standby with CBR
refresh) (L-version)
—
3.2
—
3.2
—
3.2
mA
CMOS interface
Dout = High-Z
CBR refresh:
t RC = 62.5 µs
t RAS ≤ 0.3 µs
4
Self refresh mode
current
(L-version)
I CC11
—
2
—
2
—
2
mA
CMOS interface
RAS, CAS ≤ 0.2 V
Dout = High-Z
Input leakage current
I LI
–10 10
–10 10
–10 10
µA
0 V ≤ Vin ≤ 4.6 V
Output leakage current I LO
–10 10
–10 10
–10 10
µA
0 V ≤ Vout ≤ 4.6 V
Dout = disable
Output high voltage
VOH
2.4
VCC
2.4
VCC
2.4
VCC
V
High Iout = –2 mA
Output low voltage
VOL
0
0.4
0
0.4
0
0.4
V
Low Iout = 2 mA
—
—
mA
Notes: 1. I CC depends on output load condition when the device is selected, ICC max is specified at the
output open condition.
2. Address can be changed once or less while RAS = VIL.
3. Address can be changed once or less while CAS = VIH.
4. CAS = L (≤ 0.2 V) while RAS = L (≤ 0.2 V).
9
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Capacitance (Ta = 25°C, VCC = 3.3 V ± 0.3 V) (HB56UW232D)
Parameter
Symbol
Typ
Max
Unit
Notes
Input capacitance (Address)
CI!
—
40
pF
1
Input capacitance (WE)
CI2
—
48
pF
1
Input capacitance (RAS)
CI3
—
30
pF
1
Input capacitance (CAS)
CI4
—
23
pF
1
I/O capacitance (DQ)
CI/O
—
23
pF
1, 2
Notes: 1. Capacitance measured with Boonton Meter or effective capacitance measuring method.
2. CAS = VIH to disable Dout.
Capacitance (Ta = 25°C, VCC = 3.3 V ± 0.3 V) (HB56UW432D)
Parameter
Symbol
Typ
Max
Unit
Notes
Input capacitance (Address)
CI!
—
60
pF
1
Input capacitance (WE)
CI2
—
76
pF
1
Input capacitance (RAS)
CI3
—
30
pF
1
Input capacitance (CAS)
CI4
—
30
pF
1
I/O capacitance (DQ)
CI/O
—
30
pF
1, 2
Notes: 1. Capacitance measured with Boonton Meter or effective capacitance measuring method.
2. CAS = VIH to disable Dout.
AC Characteristics (Ta = 0 to 70°C, VCC = 3.3 V ± 0.3 V, VSS = 0 V) *1, *2 , *18
Test Conditions
•
•
•
•
•
Input rise and fall times: 2 ns
Input level: 0 V, 3.0V
Input timing reference levels: 0.8 V, 2.0 V
Output timing reference levels: 0.8 V, 2.0 V
Output load: 1 TTL gate + C L (100 pF) (Including scope and jig)
10
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Read, Write, and Refresh Cycles (Common parameters)
50 ns
60 ns
70 ns
Parameter
Symbol Min
Max
Min
Max
Min
Max
Unit
Random read or write cycle
time
t RC
84
—
104
—
124
—
ns
RAS precharge time
t RP
30
—
40
—
50
—
ns
CAS precharge time
t CP
8
—
10
—
13
—
ns
RAS pulse width
t RAS
50
10000 60
10000 70
10000 ns
CAS pulse width
t CAS
8
10000 10
10000 13
10000 ns
Row address setup time
t ASR
0
—
0
—
0
—
ns
Row address hold time
t RAH
8
—
10
—
10
—
ns
Column address setup time
t ASC
0
—
0
—
0
—
ns
Column address hold time
t CAH
8
—
10
—
13
—
ns
RAS to CAS delay time
t RCD
12
37
14
45
14
52
ns
3
RAS to column address
delay time
t RAD
10
25
12
30
12
35
ns
4
RAS hold time
t RSH
10
—
13
—
13
—
ns
CAS hold time
t CSH
35
—
40
—
45
—
ns
CAS to RAS precharge time t CRP
5
—
5
—
5
—
ns
CAS delay time from Din
0
—
0
—
0
—
ns
Transition time (rise and fall) t T
2
50
2
50
2
50
ns
Refresh period
(2,048 cycles)
t REF
—
32
—
32
—
32
ms
Refresh period
(2,048 cycles) (L-version)
t REF
—
128
—
128
—
128
ms
t DZC
Notes
5
11
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Read Cycle
50 ns
60 ns
70 ns
Parameter
Symbol Min
Max
Min
Max
Min
Max
Unit
Notes
Access time from RAS
t RAC
—
50
—
60
—
70
ns
6, 7
Access time from CAS
t CAC
—
13
—
15
—
18
ns
7, 8, 15
Access time from address
t AA
—
25
—
30
—
35
ns
7, 9, 15
Read command setup time
t RCS
0
—
0
—
0
—
ns
Read command hold time to t RCH
CAS
0
—
0
—
0
—
ns
Read command hold time
from RAS
50
—
60
—
70
—
ns
Read command hold time to t RRH
RAS
5
—
5
—
5
—
ns
Column address to RAS
lead time
t RAL
25
—
30
—
35
—
ns
Column address to CAS
lead time
t CAL
15
—
18
—
23
—
ns
CAS to output in low-Z
t CLZ
0
—
0
—
0
—
ns
Output data hold time
t OH
3
—
3
—
3
—
ns
19
Output buffer turn-off time
t OFF
—
13
—
15
—
15
ns
11, 19
CAS to Din delay time
t CDD
13
—
15
—
18
—
ns
Output data hold time from
RAS
t OHR
3
—
3
—
3
—
ns
19
Output buffer turn-off time to t OFR
RAS
—
13
—
15
—
15
ns
19
Output buffer turn-off to WE
t WEZ
—
13
—
15
—
15
ns
WE to Din delay time
t WED
13
—
15
—
18
—
ns
RAS to Din delay time
t RDD
13
—
15
—
18
—
ns
50
—
60
—
70
—
ns
t RCHR
RAS to next CAS delay time t RNCD
10
10
Write Cycle
50 ns
60 ns
70 ns
Parameter
Symbol Min
Max
Min
Max
Min
Max
Unit
Notes
Write command setup time
t WCS
0
—
0
—
0
—
ns
12
Write command hold time
t WCH
8
—
10
—
13
—
ns
Write command pulse width
t WP
8
—
10
—
10
—
ns
Data-in setup time
t DS
0
—
0
—
0
—
ns
13
Data-in hold time
t DH
8
—
10
—
13
—
ns
13
12
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Refresh Cycle
50 ns
60 ns
70 ns
Parameter
Symbol Min
Max
Min
Max
Min
Max
Unit
CAS setup time
(CBR refresh cycle)
t CSR
5
—
5
—
5
—
ns
CAS hold time
(CBR refresh cycle)
t CHR
8
—
10
—
10
—
ns
WE setup time
(CBR refresh cycle)
t WRP
0
—
0
—
0
—
ns
WE hold time
(CBR refresh cycle)
t WRH
8
—
10
—
10
—
ns
RAS precharge to CAS hold t RPC
time
5
—
5
—
5
—
ns
Notes
EDO Page Mode Cycle
50 ns
60 ns
70 ns
Parameter
Symbol Min
Max
Min
Max
Min
Max
Unit
Notes
EDO page mode cycle time
t HPC
20
—
25
—
30
—
ns
16
EDO page mode RAS pulse t RASP
width
—
100000 —
100000 —
100000 ns
14
Access time from CAS
precharge
t CPA
—
30
—
35
—
40
ns
7, 15
RAS hold time from CAS
precharge
t CPRH
30
—
35
—
40
—
ns
Output data hold time from
CAS low
t DOH
3
—
3
—
3
—
ns
Read command hold time
from CAS precharge
t RCHC
30
—
35
—
40
—
ns
7, 15
Self Refresh Mode (L-version)
50 ns
60 ns
70 ns
Parameter
Symbol Min
Max
Min
Max
Min
Max
Unit
RAS pulse width
(Self refresh)
t RASS
100
—
100
—
100
—
µs
RAS precharge time
(Self refresh)
t RPS
90
—
110
—
130
—
ns
–50
—
–50
—
–50
—
ns
CAS hold time (Self refresh) t CHS
Notes
13
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Notes: 1. AC measurements assume t T = 2 ns.
2. An initial pause of 200 µs is required after power up followed by a minimum of eight initialization
cycles (any combination of cycles containing RAS-only refresh cycle or CAS-before-RAS
refresh). If the internal refresh counter is used, a minimum of eight CAS-before-RAS refresh
cycles are required.
3. Operation with the tRCD (max) limit insures that tRAC (max) can be met, tRCD (max) is specified as a
reference point only; if t RCD ≥ tRCD (max) + tAA (max) - tCAC (max), then access time is controlled
exclusively by t CAC .
4. Operation with the tRAD (max) limit insures that tRAC (max) can be met, tRAD (max) is specified as a
reference point only; if t RAD is greater than the specified tRAD (max) limit, then access time is
controlled exclusively by tAA .
5. VIH (min) and VIL (max) are reference levels for measuring timing of input signals. Also, transition
times are measured between V IH (min) and VIL (max).
6. Assumes that t RCD ≤ tRCD (max) and tRAD ≤ tRAD (max). If tRCD or tRAD is greater than the maximum
recommended value shown in this table, t RAC exceeds the value shown.
7. Measured with a load circuit equivalent to 1 TTL loads and 100 pF.
8. Assumes that t RCD ≥ tRCD (max) and tRCD + tCAC (max) ≥ tRAD + tAA (max).
9. Assumes that t RAD ≥ tRAD (max) and tRCD + tCAC (max) ≤ tRAD + tAA (max).
10. Either t RCH or tRRH must be satisfied for a read cycles.
11. t OFF (max) defines the time at which the outputs achieve the open circuit condition and are not
referred to output voltage levels.
12. Early write cycle only (tWCS ≥ tWCS (min)).
13. These parameters are referred to CAS leading edge in early write cycles.
14. t RASP defines RAS pulse width in EDO page mode cycles.
15. Access time is determined by the longest among t AA , t CAC and t CPA.
16. t HPC (min) can be achieved during a series of EDO page mode write cycles or EDO page mode
read cycles.
17. When output buffers are enabled once, sustain the low impedance state until valid data is
obtained. When output buffer is turned on and off within a very short time, generally it causes
large V CC / VSS line noise, which causes to degrade V IH min./ V IL max level.
18. All the V CC and VSS pins shall be supplied with the same voltages.
19. Data output turns off and becomes high impedance from later rising edge of RAS and CAS.
Hold time and turn off time are specified by the timing specifications of later rising edge of RAS
and CAS between t OHR and t OH , and between t OFR and t OFF.
20. Please do not use tRASS timing, 10 µs ≤ tRASS ≤ 100 µs. During this period, the device is in
transition state from normal operation mode to self refresh mode. If t RASS ≥ 100 µs, then RAS
precharge time should use tRPS instead of tRP.
21. If you use distributed CBR refresh mode with 15.6 µs interval in normal read/write cycle, CBR
refresh should be executed within 15.6 µs immediately after exiting from and before entering
into self refresh mode.
22. If you use RAS only refresh or CBR burst refresh mode in normal read/write cycle, 2048 cycles
of distributed CBR refresh with 15.6 µs interval should be executed within 32 ms immediately
after exiting from and before entering into the self refresh mode.
23. Repetitive self refresh mode without refreshing all memory is not allowed. Once you exit from
self fresh mode, all memory cells need to be refreshed before re-entering the self refresh mode
again.
24. XXX: H or L (H: VIH (min) ≤ VIN ≤ VIH (max), L: VIL (min) ≤ VIN ≤ VIL (max))
///////: Invalid Dout
When the address, clock and input pins are not described on timing waveforms, their pins must
be applied VIH or VIL.
14
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Timing Waveforms*24
Read Cycle
t RC
t RAS
t RP
RAS
t CSH
t CRP
t RCD
t RSH
t CAS
tT
CAS
t RAD
t ASR
Address
t RAH
t RAL
t ASC
t CAL
t CAH
Column
Row
t RRH
t RCHR
t RCH
t RCS
WE
t WED
t DZC
t CDD
t RDD
High-Z
Din
t CAC
t OFF
t OH
t OFR
t OHR
t AA
t RAC
t CLZ
t WEZ
Dout
Dout
15
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Early Write Cycle
t RC
t RP
t RAS
RAS
t CSH
t CRP
t RCD
t RSH
t CAS
tT
CAS
t ASR
Address
t RAH
Row
t ASC
t CAH
Column
t WP
t WCS
t WCH
WE
t DS
Din
Dout
t DH
Din
High-Z*
* t WCS
16
This Material Copyrighted by Its Respective Manufacturer
t WCS (min)
HB56UW232D Series, HB56UW432D Series
RAS-Only Refresh Cycle
t RC
t RAS
t RP
RAS
tT
t CRP
t RPC
t CRP
CAS
t ASR
Address
t RAH
Row
t OFR
t OFF
High-Z
Dout
17
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
CAS-Before-RAS Refresh Cycle
t RC
t RP
t RAS
t RP
RAS
t RPC
t CSR
t CHR
t RPC
tT
CAS
t CP
t WRP
t WRH
t CP
WE
Address
t OFR
t OFF
Dout
18
This Material Copyrighted by Its Respective Manufacturer
High-Z
t CRP
HB56UW232D Series, HB56UW432D Series
Hidden Refresh Cycle
t RC
t RC
t RP
t RAS
t RAS
t RC
t RP
t RAS
t RP
RAS
tT
t RSH
t CHR
t CRP
t RCD
CAS
t RAD
t ASR t RAH
Address
t RAL
t ASC
Row
t CAH
Column
t WRH
t WRP
t WRP
tWRH
t RRH
t RCH
t RCS
t RRH
WE
t WED
t DZC
t CDD
t RDD
High-Z
Din
t CAC
t AA
t WEZ
t RAC
t OFF
t OH
t CLZ
Dout
Dout
t OFR
t OHR
19
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
EDO Page Mode Read Cycle
t RP
t RNCD
t HPC
t RASP
RAS
tT
t CSH
t CP
t HPC
t CAS
CAS
t HPC
t CPRH
t CP
t
t CRP
RSH
t CAS
t RCHR
t RCS
t CP
tCAS
tCAS
t RCHC
t RCH t RCS
t RRH
t RCH
WE
tASR
Address
tRAH tASC
Row
tCAH
Column 1
t ASC t CAH
t ASC t CAH
Column 2
Column 3
t CAL
t CAL
tASC
t RAL
t CAH
t WED
Column 4
t CAL
t CAL
tRDD
tCDD
tDZC
High-Z
Din
tOFR
tOHR
tCPA
tCPA
tCPA
tAA
tCAC
tAA
tCAC
tCAC
tAA
tWEZ
tRAC
Dout
20
This Material Copyrighted by Its Respective Manufacturer
t AA
t CAC
tDOH
Dout 1
Dout 2
tOFF
tOH
tDOH
Dout 3
Dout 4
HB56UW232D Series, HB56UW432D Series
EDO Page Mode Early Write Cycle
t RP
t RASP
RAS
tT
t CSH
t RCD
t CAS
t CP
t HPC
t CAS
t RSH
t CAS
t CP
t CRP
CAS
t ASR t RAH
Address
Row
t ASC
t CAH
t ASC
tCAH
t ASC t CAH
Column 1
Column 2
Column N
t WP
t WP
t WP
t WCS
t WCH
t WCS
t WCH
t WCS
t WCH
WE
t DS
Din
Dout
t DH
Din 1
t DS
t DH
Din 2
t DS
t DH
Din N
High-Z*
* t WCS
t WCS (min)
21
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Self Refresh Cycle (L-version)* 20, 21, 22, 23
t RASS
t RP
t RPS
RAS
tT
t RPC
t CP
t CRP
t CSR
t CHS
CAS
t WRP
t WRH
WE
t OFR
t OFF
Dout
22
This Material Copyrighted by Its Respective Manufacturer
High-Z
HB56UW232D Series, HB56UW432D Series
Physical Outline
HB56UW232D Series
Unit :
51.66
2.034
Component area
1
7.62
0.300
71
44.45
1.750
A
3.00 min
0.118 min
44.45
1.750
72
2
Back side
8.25
0.325
1.80
0.071
2.00
0.079
2 – Ø1.80
2 – Ø0.071
1.00 ± 0.10
0.039 ± 0.004
17.78
0.700
25.40
1.000
3.18
0.125
2.42 max
0.095 max
3.18 min
0.125 min
5.00
0.197
2 – R3.00 min
2 – R0.118 min
R2.00
R0.079
3.00 min
0.118 min
59.69
2.350
Front side
mm
inch
2 – R2.00 ± 0.10
2 – R0.079 ± 0.004
1.00±0.05
0.039±0.002
0.25 max
0.010 max
2.54 min
0.100 min
Detail A
1.27 typ
0.050 typ
23
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Physical Outline
HB56UW432D Series
Unit :
Component area
(front)
1
7.62
0.300
71
44.45
1.750
A
3.00 min
0.118 min
8.25
0.325
44.45
1.750
2
2 – Ø1.80
2 – Ø0.071
72
Back side
1.80
0.071
2.00
0.079
Component area
(back)
2 – R2.00 ± 0.10
2 – R0.079 ± 0.004
1.00±0.05
0.039±0.002
0.25 max
0.010 max
2.54 min
0.100 min
Detail A
1.27 typ
0.050 typ
24
This Material Copyrighted by Its Respective Manufacturer
17.78
0.700
25.40
1.000
3.18
0.125
3.80 max
0.150 max
3.18 min
0.125 min
51.66
2.034
3.18 min
0.125 min
5.00
0.197
2 – R3.00 min
2 – R0.118 min
R2.00
R0.079
3.00 min
0.118 min
59.69
2.350
Front side
mm
inch
1.00 ± 0.10
0.039 ± 0.004
HB56UW232D Series, HB56UW432D Series
When using this document, keep the following in mind:
1. This document may, wholly or partially, be subject to change without notice.
2. All rights are reserved: No one is permitted to reproduce or duplicate, in any form, the whole or part of
this document without Hitachi’s permission.
3. Hitachi will not be held responsible for any damage to the user that may result from accidents or any
other reasons during operation of the user’s unit according to this document.
4. Circuitry and other examples described herein are meant merely to indicate the characteristics and
performance of Hitachi’s semiconductor products. Hitachi assumes no responsibility for any intellectual
property claims or other problems that may result from applications based on the examples described
herein.
5. No license is granted by implication or otherwise under any patents or other rights of any third party or
Hitachi, Ltd.
6. MEDICAL APPLICATIONS: Hitachi’s products are not authorized for use in MEDICAL
APPLICATIONS without the written consent of the appropriate officer of Hitachi’s sales company.
Such use includes, but is not limited to, use in life support systems. Buyers of Hitachi’s products are
requested to notify the relevant Hitachi sales offices when planning to use the products in MEDICAL
APPLICATIONS.
Hitachi, Ltd.
Semiconductor & IC Div.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100, Japan
Tel: Tokyo (03) 3270-2111
Fax: (03) 3270-5109
For further information write to:
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Semiconductor & IC Div.
2000 Sierra Point Parkway
Brisbane, CA. 94005-1835
USA
Tel: 415-589-8300
Fax: 415-583-4207
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Electronic Components Group
Continental Europe
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D-85622 Feldkirchen
München
Tel: 089-9 91 80-0
Fax: 089-9 29 30 00
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Northern Europe Headquarters
Whitebrook Park
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Tel: 0628-585000
Fax: 0628-778322
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Unit 706, North Tower,
World Finance Centre,
Harbour City, Canton Road
Tsim Sha Tsui, Kowloon
Hong Kong
Tel: 27359218
Fax: 27306071
25
This Material Copyrighted by Its Respective Manufacturer
HB56UW232D Series, HB56UW432D Series
Revision Record
Rev. Date
1.0
Contents of Modification
May. 20, 1997 (referred to HM51W17805 rev 3.0)
Initial issue
26
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