NSC 100351F

100351
Low Power Hex D Flip-Flop
General Description
Features
The 100351 contains six D-type edge-triggered, master/
slave flip-flops with true and complement outputs, a pair of
common Clock inputs (CPa and CPb) and common Master
Reset (MR) input. Data enters a master when both CPa and
CPb are LOW and transfers to the slave when CPa and CPb
(or both) go HIGH. The MR input overrides all other inputs
and makes the Q outputs LOW. All inputs have 50 kΩ
pull-down resistors.
n
n
n
n
Logic Symbol
40% power reduction of the 100151
2000V ESD protection
Pin/function compatible with 100151
Voltage compensated operating range:
−4.2V to −5.7V
n Standard Microcircuit Drawing
(SMD) 5962-9457901
Pin Names
Description
D0–D5
Data Inputs
CPa, CPb
Common Clock Inputs
MR
Asynchronous Master Reset Input
Q0–Q5
Data Outputs
Q0–Q5
Complementary Data Outputs
DS100318-11
© 1998 National Semiconductor Corporation
DS100318
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100351 Low Power Hex D Flip-Flop
August 1998
Connection Diagrams
24-Pin DIP
24-Pin Quad Cerpak
DS100318-2
DS100318-1
Logic Diagram
DS100318-4
Truth Tables
Asynchronous Operation
(Each Flip-flop)
Inputs
Synchronous Operation
Inputs
Outputs
Dn
CPa
CPb
MR
L
N
L
L
L
H
N
L
L
H
L
L
N
L
L
H
L
N
L
H
Qn(t)
X
H
N
L
N
H
L
Qn(t)
X
L
L
L
Qn(t)
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CPa
CPb
MR
Qn(t+1)
X
X
X
H
L
H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
t = Time before CP positive transition
t+1 = Time after CP positive transition
N = LOW-to-HIGH transition
Qn(t+1)
X
Outputs
Dn
2
Absolute Maximum Ratings (Note 1)
≥2000V
ESD (Note 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Recommended Operating
Conditions
Above which the useful life may be impaired
−65˚C to +150˚C
Storage Temperature (TSTG)
Maximum Junction Temperature (TJ)
Ceramic
+175˚C
−7.0V to +0.5V
VEE Pin Potential to Ground Pin
Input Voltage (DC)
VEE to +0.5V
Output Current (DC Output HIGH)
−50 mA
Case Temperature (TC)
Military
Supply Voltage (VEE)
−55˚C to +125˚C
−5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C
Symbol
VOH
Parameter
Min
Max
Units
TC
Output HIGH Voltage
−1025
−870
mV
0˚C to
−1085
−870
mV
−55˚C
−1830
−1620
mV
0˚C to
−1830
−1555
mV
−55˚C
mV
0˚C to
+125˚C
VOL
Output LOW Voltage
Conditions
Notes
VIN = VIH (Max)
or VIL (Min)
Loading with
50Ω to −2.0V
(Notes 3, 4, 5)
VIN = VIH (Min)
or VIL (Max)
Loading with
50Ω to −2.0V
(Notes 3, 4, 5)
+125˚C
VOHC
Output HIGH Voltage
−1035
+125˚C
−1085
VOLC
Output LOW Voltage
mV
−55˚C
−1610
mV
0˚C to
−1555
mV
−55˚C
−870
mV
−55˚C to
+125˚C
VIH
Input HIGH Voltage
−1165
+125˚C
VIL
Input LOW Voltage
−1830
−1475
mV
−55˚C to
+125˚C
IIL
Input LOW Current
0.50
µA
−55˚C to
+125˚C
IIH
IEE
Input HIGH Current
CP, MR
350
D0–D5
240
CP, MR
500
D0–D5
340
Power Supply Current
−135
−50
µA
0˚C to
Guaranteed HIGH Signal
(Notes 3, 4, 5, 6)
for All Inputs
Guaranteed LOW Signal
for All Inputs
VEE = −4.2V
(Notes 3, 4, 5, 6)
(Notes 3, 4, 5)
VIN = VIL (Min)
VEE = −5.7V
VIN = VIH (Max)
(Notes 3, 4, 5)
Inputs Open
(Notes 3, 4, 5)
+125˚C
µA
−55˚C
mA
−55˚C to
+125˚C
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.
3
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AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
TC = −55˚C
TC = +25˚C
Min
Max
Min
TC = +125˚C
Max
Min
Units
Conditions
Notes
(Note 10)
Max
fmax
Toggle Frequency
375
MHz
Figures 2, 3
tPLH
Propagation Delay
0.40
2.40
0.50
2.20
0.50
2.60
ns
Figures 1, 3
0.60
2.70
0.70
2.60
0.80
2.90
ns
Figures 1, 4
0.20
1.60
0.20
1.60
0.20
1.60
ns
Figures 1, 3
ns
Figure 5
tPHL
CPa, CPb to Output
tPLH
Propagation Delay
tPHL
MR to Output
tTLH
Transition Time
tTHL
20% to 80%, 80% to 20%
ts
Setup Time
th
375
375
(Notes 7, 8, 9)
D0–D5
0.90
0.80
0.90
MR (Release Time)
1.60
1.80
2.60
Hold Time
1.50
1.40
1.60
ns
Figure 5
2.00
2.00
2.00
ns
Figures 3, 4
(Note 10)
Figure 4
D0–D5
tpw(H)
Pulse Width HIGH
CPa, CPb, MR
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C, Temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each Mfg. lot at +25˚C, Subgroup A9, and at +125˚C, and −55˚C Temperature, Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C and −55˚C Temperature (design characterization data).
Test Circuitry
DS100318-5
Notes:
VCC, VCCA = +2V, VEE = −2.5V
L1 and L2 = equal length 50Ω impedance lines
RT = 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to VCC and VEE
All unused outputs are loaded with 50Ω to GND
CL = Fixture and stray capacitance ≤ 3 pF
FIGURE 1. AC Test Circuit
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4
Test Circuitry
(Continued)
DS100318-6
Notes:
VCC, VCCA = +2V, VEE = −2.5V
L1 and L2 = equal length 50Ω impedance lines
RT = 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to VCC and VEE
All unused outputs are loaded with 50Ω to GND
CL = Jig and stray capacitance ≤ 3 pF
FIGURE 2. Toggle Frequency Test Circuit
Switching Waveforms
DS100318-7
FIGURE 3. Propagation Delay (Clock) and Transition Times
5
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Switching Waveforms
(Continued)
DS100318-8
FIGURE 4. Propagation Delay (Reset)
DS100318-9
Notes:
ts is the minimum time before the transition of the clock that information must be present at the data input.
th is the minimum time after the transition of the clock that information must remain unchanged at the data input.
FIGURE 5. Setup and Hold Time
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6
Physical Dimensions
inches (millimeters) unless otherwise noted
24-Lead Ceramic Dual-In-Line Package (0.400" Wide) (D)
NS Package Number J24E
24-Lead Quad Cerpak (F)
NS Package Number W24B
7
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100351 Low Power Hex D Flip-Flop
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ure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
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