LP62E16128A-I Series Preliminary 128K X 16 BIT LOW VOLTAGE CMOS SRAM Document Title 128K X 16 BIT LOW VOLTAGE CMOS SRAM Revision History Rev. No. 0.0 PRELIMINARY History Issue Date Remark Initial issue December 11, 2003 Preliminary (December, 2003, Version 0.0) 1 AMIC Technology, Corp. LP62E16128A-I Series Preliminary 128K X 16 BIT LOW VOLTAGE CMOS SRAM Features Operating voltage: 1.65V to 2.2V Access times: 70 ns (max.) Current: Very low power version: Operating: 25mA (max.) Standby: 10µA (max.) Full static operation, no clock or refreshing required All inputs and outputs are directly TTL-compatible Common I/O using three-state output Data retention voltage: 1.2V (min.) Available in 44-pin TSOP and 48-ball CSP (6 x 8mm) packages General Description The chip enable input is provided for POWER-DOWN, device enable. Two byte enable inputs and an output enable input are included for easy interfacing. Data retention is guaranteed at a power supply voltage as low as 1.2V. The LP62E16128A-I is a low operating current 2,097,152bit static random access memory organized as 131,072 words by 16 bits and operates on low power voltage from 1.65V to 2.2V. It is built using AMIC's high performance CMOS process. Inputs and three-state outputs are TTL compatible and allow for direct interfacing with common system bus structures. Pin Configurations TSOP A4 1 44 A5 A3 2 43 A6 A2 3 42 A7 A1 4 41 OE A0 5 CE 6 I/O1 7 I/O2 8 I/O3 9 I/O4 10 VCC 11 GND 12 I/O5 13 I/O6 14 I/O7 15 I/O8 16 LP62E16128AV-T PRELIMINARY CSP (Chip Size Package) 48-pin Top View 40 HB 39 LB 38 I/O16 37 I/O15 36 I/O14 35 I/O13 34 GND 33 VCC 32 I/O12 31 I/O11 30 I/O10 29 I/O9 28 NC WE 17 A16 18 27 A8 A15 19 26 A9 A14 20 25 A10 A13 21 24 A11 A12 22 23 NC (December, 2003, Version 0.0) A 2 1 2 3 4 5 6 LB OE A0 A1 A2 NC B I/O9 HB A3 A4 CE I/O1 C I/O10 I/O11 A5 A6 I/O2 I/O3 D GND I/O12 NC A7 I/O4 VCC E VCC I/O13 NC A16 I/O5 GND F I/O15 I/O14 A14 A15 I/O6 I/O7 G I/O16 NC A12 A13 WE I/O8 H NC A8 A9 A10 A11 NC AMIC Technology, Corp. LP62E16128A-I Series Block Diagram VCC A0 GND 1024 X 2048 DECODER MEMORY ARRAY A15 A16 I/O1 I/O9 COLUMN I/O INPUT INPUT DATA CIRCUIT DATA CIRCUIT I/O16 I/O8 CE LB HB OE WE CONTROL CIRCUIT Pin Descriptions -- TSOP Pin No. Symbol 1 - 5, 18 - 22, 24 – 27, 42 - 44 A0 - A16 6 CE 7 - 10, 13 - 16, 29 - 32, 35 - 38 I/O1 - I/O16 17 WE Write Enable Input 39 LB Lower Byte Enable Input (I/O1 to I/O8) 40 HB Higher Byte Enable Input (I/O9 to I/O16) 41 OE Output Enable Input 11, 33 VCC Power 12, 34 GND Ground 23, 28 NC PRELIMINARY Description Address Inputs Chip Enable Input Data Inputs/Outputs No Connection (December, 2003, Version 0.0) 3 AMIC Technology, Corp. LP62E16128A-I Series Pin Description - CSP Symbol A0 - A16 CE Description Symbol Description Address Inputs HB Higher Byte Enable Input (I/O9 - I/O16) Chip Enable OE Output Enable I/O1 - I/O16 Data Input/Output VCC Power Supply WE Write Enable Input GND Ground LB Lower Byte Enable Input (I/O1 - I/O8) NC No Connection Recommended DC Operating Conditions (TA = -40°C to + 85°C) Symbol Parameter Min. Typ. Max. Unit 1.65 2 2.2 V 0 0 0 V VCC Supply Voltage GND Ground VIH Input High Voltage 1.4 - VCC + 0.2 V VIL Input Low Voltage -0.2 - +0.4 V CL Output Load - - 30 pF TTL Output Load - - 1 - PRELIMINARY (December, 2003, Version 0.0) 4 AMIC Technology, Corp. LP62E16128A-I Series Absolute Maximum Ratings* *Comments VCC to GND ............................................... -0.5V to +3.0V IN, IN/OUT Volt to GND.....................-0.5V to VCC + 0.5V Operating Temperature, Topr .................... -40°C to +85°C Storage Temperature, Tstg...................... -55°C to +125°C Power Dissipation, PT ................................................0.7W Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to this device. These are stress ratings only. Functional operation of this device at these or any other conditions above those indicated in the operational sections of this specification is not implied or intended. Exposure to the absolute maximum rating conditions for extended periods may affect device reliability. DC Electrical Characteristics (TA = -40°C to + 85°C, VCC = 1.65V to 2.2V, GND = 0V) Symbol ⏐ILI⏐ ⏐ILO⏐ ICC Parameter Input Leakage Current LP62E16128A-70LLI Min. Max. - 1 Unit Conditions µA VIN = GND to VCC Output Leakage Current - 1 µA CE = VIH or LB = VIH or HB = VIH or OE = VIH or WE = VIH VI/O = GND to VCC Active Power Supply Current - 5 mA CE = VIL , II/O = 0mA - 25 mA ICC1 CE = VIL, II/O = 0mA Dynamic Operating Current ICC2 Min. Cycle, Duty = 100% - 10 mA CE = VIL, VIH = VCC, VIL = 0V, f = 1MHz, II/O = 0 mA ISB1 Standby Power - 10 µA CE ≥ VCC - 0.2V, VIN ≥ 0V VOL Output Low Voltage - 0.2 V IOL = 0.1 mA VOH Output High Voltage 1.4 - V IOH = -0.1 mA PRELIMINARY (December, 2003, Version 0.0) 5 AMIC Technology, Corp. LP62E16128A-I Series Truth Table I/O1 to I/O8 Mode I/O9 to I/O16 Mode VCC Current CE OE WE LB HB H X X X X Not selected Not selected ISB1, ISB X X X H H High-Z High-Z ISB1, ISB L L Read Read ICC1, ICC2, ICC L H Read High - Z ICC1, ICC2, ICC H L High - Z Read ICC1, ICC2, ICC L L Write Write ICC1, ICC2, ICC L H Write Not Write/Hi - Z ICC1, ICC2, ICC H L No Write/Hi - Z Write ICC1, ICC2, ICC X L High - Z High - Z ICC1, ICC2, ICC L X High - Z High - Z ICC1, ICC2, ICC L L L L X H H L H Note: X = H or L Capacitance (TA = 25°C, f = 1.0MHz) Symbol Parameter Min. Max. Unit Conditions CIN* Input Capacitance 6 pF VIN = 0V CI/O* Input/Output Capacitance 8 pF VI/O = 0V * These parameters are sampled and not 100% tested. PRELIMINARY (December, 2003, Version 0.0) 6 AMIC Technology, Corp. LP62E16128A-I Series AC Characteristics (TA = -40°C to +85°C, VCC = 1.65V to 2.2V) Symbol LP62E16128A-70LLI Parameter Unit Min. Max. 70 - ns Read Cycle tRC Read Cycle Time tAA Address Access Time - 70 ns tACE Chip Enable Access Time - 70 ns tBE Byte Enable Access Time - 70 tOE Output Enable to Output Valid - 35 ns tCLZ Chip Enable to Output in Low Z 10 - ns tBLZ Byte Enable to Outupt in Low Z 10 - ns tOLZ Output Enable to Output in Low Z 5 - ns tCHZ Chip Disable to Output in High Z - 25 ns tBHZ Byte Disable to Output in High Z - 25 ns tOHZ Output Disable to Output in High Z - 25 ns tOH Output Hold from Address Change 5 - ns tWC Write Cycle Time 70 - ns tCW Chip Enable to End of Write 60 - ns tBW Byte Enable to End of Write 60 - ns tAS Address Setup Time 0 - ns tAW Address Valid to End of Write 60 - ns tWP Write Pulse Width 55 - ns tWR Write Recovery Time 0 - ns tWHZ Write to Output in High Z - 25 ns tDW Data to Write Time Overlap 30 - ns tDH Data Hold from Write Time 0 - ns tOW Output Active from End of Write 5 - ns Write Cycle Note: tCHZ, tBHZ and tOHZ and tWHZ are defined as the time at which the outputs achieve the open circuit condition and are not referred to output voltage levels. PRELIMINARY (December, 2003, Version 0.0) 7 AMIC Technology, Corp. LP62E16128A-I Series Timing Waveforms Read Cycle 1(1, 2, 4) tRC Address tAA tOH tOH DOUT Read Cycle 2(1, 2, 3) tRC Address tAA CE tACE tCHZ5 tCLZ5 tBE HB, LB tBLZ5 tBHZ5 OE tOHZ5 tOE tOLZ5 DOUT Notes: 1. WE is high for Read Cycle. 2. Device is continuously enabled CE = VIL , HB = VIL and, or LB = VIL. 3. Address valid prior to or coincident with CE and ( HB and, or LB ) transition low. 4. OE = VIL. 5. Transition is measured ±500mV from steady state. This parameter is sampled and not 100% tested. PRELIMINARY (December, 2003, Version 0.0) 8 AMIC Technology, Corp. LP62E16128A-I Series Timing Waveforms (continued) Write Cycle 1 (Write Enable Controlled) tWC Address tWR3 tAW tCW CE tBW HB, LB tAS1 tWP2 WE tDW tDH DATA IN tWHZ4 tOW DATA OUT PRELIMINARY (December, 2003, Version 0.0) 9 AMIC Technology, Corp. LP62E16128A-I Series Timing Waveforms (continued) Write Cycle 2 (Chip Enable Controlled) tWC Address tAW tAS1 tWR3 tCW2 CE tBW HB, LB tWP WE tDW tDH DATA IN tWHZ4 tOW DATA OUT PRELIMINARY (December, 2003, Version 0.0) 10 AMIC Technology, Corp. LP62E16128A-I Series Timing Waveforms (continued) Write Cycle 3 (Byte Enable Controlled) tWC Address tAW tCW CE tAS1 tWR3 tBW2 HB, LB tWP WE tDH tDW DATA IN tWHZ4 tOW DATA OUT Notes: 1. tAS is measured from the address valid to the beginning of Write. 2. A Write occurs during the overlap (tWP, tBW) of a low CE , WE and ( HB and , or LB ). 3. tWR is measured from the earliest of CE or WE or ( HB and , or LB ) going high to the end of the Write cycle. 4. OE level is high or low. 5. Transition is measured ±500mV from steady state. This parameter is sampled and not 100% tested. PRELIMINARY (December, 2003, Version 0.0) 11 AMIC Technology, Corp. LP62E16128A-I Series AC Test Conditions Input Pulse Levels 0.2V to VCC - 0.2V Input Rise And Fall Time 5 ns Input and Output Timing Reference Levels 0.9V Output Load See Figures 1 and 2 TTL TTL CL CL 30pF 5pF * Including scope and jig. * Including scope and jig. Figure 1. Output Load Figure 2. Output Load for tCLZ, tOLZ, tCHZ, tOHZ, tWHZ, and tOW Data Retention Characteristics (TA = -40°C to 85°C) Symbol Parameter Min. Max. Unit Conditions VDR VCC for Data Retention 1.2 2.2 V CE ≥ VCC - 0.2V ICCDR Data Retention Current - 3* µA VCC = 1.2V, CE ≥ VCC - 0.2V VIN ≥ 0V tCDR Chip Disable to Data Retention Time 0 - ns tRC - ns 5 - ms tR Operation Recovery Time tVR VCC Rising Time from Data Retention Voltage to Operating Voltage * LP62E16128A-70LLI PRELIMINARY ICCDR: max. (December, 2003, Version 0.0) See Retention Waveform 1µA at TA = 0°C to + 40°C 12 AMIC Technology, Corp. LP62E16128A-I Series Low VCC Data Retention Waveform DATA RETENTION MODE VCC 1.8V 1.8V tCDR tR VDR ≥ 1.2V tVR VIH CE VIH CE ≥ VDR - 0.2V Ordering Information Part No. Access Time (ns) LP62E16128AV-70LLI Operating Current Max. (mA) Standby Current Max. (µA) Package 25 10 44L TSOP 25 10 48L CSP 70 LP62E16128AU-70LLI PRELIMINARY (December, 2003, Version 0.0) 13 AMIC Technology, Corp. LP62E16128A-I Series Package Information TSOP 44L TYPE II Outline Dimensions unit: inches/mm HE 0.254 23 E 44 L L1 1 22 B e D S Symbol y Dimension in inch Min. Nom. Max. A L1 L A1 A2 c D Dimension in mm Min. Nom. Max. A - - 0.047 - - 1.20 A1 0.002 - - 0.05 - - A2 0.037 0.039 0.041 0.95 1.00 1.05 B 0.010 0.014 0.018 0.25 0.35 0.45 c - 0.006 - - 0.15 - D 0.721 0.725 0.729 18.31 18.41 18.51 E 0.396 0.400 0.404 10.06 10.16 10.26 e - 0.031 - - 0.80 - HE 0.455 0.463 0.471 11.56 11.76 11.96 L 0.016 0.020 0.024 0.40 0.50 0.60 L1 - 0.031 - - 0.80 - S - - 0.036 - - 0.93 y - - 0.004 - - 0.10 θ 0° - 5° 0° - 5° Notes: 1. Dimension D&E do not include interlead flash. 2. Dimension B does not include dambar protrusion/intrusion. 3. Dimension S includes end flash. PRELIMINARY (December, 2003, Version 0.0) 14 AMIC Technology, Corp. LP62E16128A-I Series Package Information 48LD CSP (6 x 8 mm) Outline Dimensions unit: mm (48TFBGA) TOP VIEW BOTTOM VIEW Ball#A1 CORNER 0.10 S C S 0.25 C A B Ball*A1 CORNER b (48X) 6 5 4 3 2 1 1 2 3 4 5 6 A B C D E F G H A B E1 E e C D E F G H B A 0.10 C SIDE VIEW D 0.20(4X) A2 SEATING PLANE A1 (0.36) C Symbol A A1 A2 D E D1 E1 e b A // 0.25 C e D1 Dimensions in mm MIN. NOM. MAX. 1.00 0.20 0.48 5.90 7.90 ------0.30 1.10 0.25 0.53 6.00 8.00 3.75 5.25 0.75 0.35 1.20 0.30 0.58 6.10 8.10 ------0.40 Note: 1. THE BALL DIAMETER, BALL PITCH, STAND-OFF & PACKAGE THICKNESS ARE DIFFERENT FROM JEDEC SPEC MO192 (LOW PROFILE BGA FAMILY). 2. PRIMARY DATUM C AND SEATING PLANE ARE DEFINED BY THE SPHERICAL CROWNS OF THE SOLDER BALLS. 3. DIMENSION b IS MEASURED AT THE MAXIMUM. THERE SHALL BE A MINIMUM CLEARANCE OF 0.25mm BETWEEN THE EDGE OF THE SOLDER BALL AND THE BODY EDGE. PRELIMINARY (December, 2003, Version 0.0) 15 AMIC Technology, Corp.