FAIRCHILD SI6923DQ

Si6923DQ
P-Channel 2.5V Specified PowerTrench MOSFET with Schottky Diode
General Description
Features
This P-Channel 2.5V specified MOSFET is a rugged
gate version of Fairchild Semiconductor’s advanced
PowerTrench process. It is combined with a low
forward drop Schottky diode which is isolated from the
MOSFET, providing a compact power solution for
asynchronous DC/DC converter applications.
• –3.5 A, –20 V. RDS(ON) = 0.045 Ω @ VGS = –4.5 V
RDS(ON) = 0.075 Ω @ VGS = –2.5 V
• VF < 0.55 V @ 1 A
Applications
• High performance trench technology for extremely
low RDS(ON)
• DC/DC conversion
• Low profile TSSOP-8 package
A
A
A
C
G
S
S
D
TSSOP-8
5
4
6
3
7
2
8
1
Pin 1
MOSFET Absolute Maximum Ratings
Symbol
TA=25oC unless otherwise noted
Drain-Source Voltage
Ratings
–20
Units
VDSS
VGSS
Gate-Source Voltage
± 12
V
ID
Drain Current
–3.5
–30
A
PD
– Pulsed
MOSFET Power Dissipation (minimum pad) (Note 1)
Schottky Power Dissipation (minimum pad)
(Note 1)
Operating and Storage Junction Temperature Range
TJ, TSTG
Parameter
– Continuous
(Note 1)
1.2
1.0
-55 to +150
V
W
°C
Schottky Maximum Ratings
VRRM
Repetitive Peak Reverse Voltage
20
V
IF
Average Forward Current
1.5
A
IFM
Peak Forward Current
30
A
MOSFET: 115
Schottky: 130
°C/W
Thermal Characteristics
RθJA
Thermal Resistance, Junction-to-Ambient
(minimum pad)
(Note 1)
Package Marking and Ordering Information
Device Marking
Device
Reel Size
Tape width
Quantity
6923
Si6923DQ
13’’
16mm
3000 units
2001 Fairchild Semiconductor Corporation
Si6923DQ Rev. A(W)
Si6923DQ
April 2001
Symbol
Parameter
TA = 25°C unless otherwise noted
Test Conditions
Min
Typ
Max Units
Off Characteristics
BVDSS
Drain–Source Breakdown Voltage
VGS = 0 V, ID = –250 µA
∆BVDSS
∆TJ
IDSS
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
ID = –250 µA, Referenced to25°C
VDS = –16 V,
VGS = 0 V
–1
IGSSF
Gate–Body Leakage, Forward
VGS = –12 V,
VDS = 0 V
–100
nA
IGSSR
Gate–Body Leakage, Reverse
VGS = 12 V,
VDS = 0 V
100
nA
–1.5
V
On Characteristics
–20
V
–16
mV/°C
µA
(Note 2)
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = –250 µA
∆VGS(th)
∆TJ
RDS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
ID = –250 µA, Referenced to25°C
ID(on)
On–State Drain Current
VGS = –4.5 V, ID = –3.5 A
VGS = –2.5 V, ID = –2.7 A
VGS=–4.5 V, ID =–3.5A, TJ=125°C
VGS = –4.5 V,
VDS = –5 V
gFS
Forward Transconductance
VDS = –5 V,
ID = –3.5A
13.2
VDS = –10 V,
f = 1.0 MHz
V GS = 0 V,
1015
pF
446
pF
118
pF
–0.6
–1.0
3
36
56
49
mV/°C
45
75
72
–15
mΩ
A
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Switching Characteristics
td(on)
Turn–On Delay Time
tr
Turn–On Rise Time
(Note 2)
VDD = –5 V,
VGS = –4.5 V,
ID = –1 A,
RGEN = 6 Ω
11
20
ns
18
32
ns
td(off)
Turn–Off Delay Time
34
55
ns
tf
Turn–Off Fall Time
34
55
ns
Qg
Total Gate Charge
9.7
16
nC
Qgs
Gate–Source Charge
Qgd
Gate–Drain Charge
VDS = –5V,
VGS = –4.5 V
ID = –3.5 A,
2.2
nC
2.4
nC
Drain–Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain–Source Diode Forward Current
VSD
Drain–Source Diode Forward
Voltage
Gate–Body Leakage, Reverse
IGSSR
VGS = 0 V,
VGS = 12 V,
IS = –1.25 A
(Note 2)
–0.6
VDS = 0 V
–1.25
A
–1.2
V
100
nA
Schottky Diode Characteristics
IR
VF
CT
Reverse Leakage
Forward Voltage
Junction Capacitance
VR = 20V
IF = 1A
TJ=25°C
0.6
50
µA
TJ=125°C
1
8
mA
TJ=25°C
0.48
0.55
V
TJ=125°C
0.42
0.50
VR = 10V
50
V
pF
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.
RθJA is 115 °C/W for the MOSFET and 130°C/W for the Schottky Diode when mounted on a minimum pad.
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%
Si6923DQ Rev. A (W)
Si6923DQ
Electrical Characteristics
Si6923DQ
Typical Characteristics
30
1.6
VGS = -4.5V
-4.0V
24
-3.5V
-3.0V
VGS = -2.5V
1.4
18
-3.0V
1.2
-2.5V
12
-3.5V
-2.0V
6
-4.0V
1
0
-4.5V
0.8
0
1
2
3
4
5
0
5
10
-VDS, DRAIN-SOURCE VOLTAGE (V)
15
20
25
30
- ID, DRAIN CURRENT (A)
Figure 1. On-Region Characteristics.
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.6
0.15
ID = -3.5A
VGS = -4.5V
ID = -1.7A
1.4
0.12
1.2
0.09
1
0.06
0.8
0.03
o
TA = 125 C
o
TA = 25 C
0
0.6
-50
-25
0
25
50
75
100
125
150
1.5
2
2.5
o
3
3.5
4
4.5
5
-VGS, GATE TO SOURCE VOLTAGE (V)
TJ, JUNCTION TEMPERATURE ( C)
Figure 3. On-Resistance Variation with
Temperature.
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
100
30
VGS = 0V
o
TA = -55 C
VDS = -5V
o
25 C
10
24
o
o
125 C
TA = 125 C
1
18
o
25 C
0.1
o
-55 C
12
0.01
6
0.001
0.0001
0
0.4
1.3
2.2
3.1
-VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
4
0
0.2
0.4
0.6
0.8
1
1.2
1.4
-VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature.
Si6923DQ Rev. A (W)
Si6923DQ
Typical Characteristics
5
1800
ID = -3.5A
VDS = -5V
f = 1MHz
VGS = 0 V
1500
-10V
4
-15V
1200
CISS
3
900
2
600
COSS
1
300
CRSS
0
0
0
3
6
9
12
0
5
Qg, GATE CHARGE (nC)
10
Figure 7. Gate Charge Characteristics.
20
Figure 8. Capacitance Characteristics.
10
0.01
TJ = 125o C
0.001
1
IR , REVERSE CURRENT (A
IF, FORWARD CURRENT (A)
15
-VDS, DRAIN TO SOURCE VOLTAGE (V)
o
TJ = 100 C
0 .1
o
TJ = 25 C
0 .0 1
0.0001
0.00001
TJ = 25 o C
0.000001
0.0000001
0.00000001
0 .0 0 1
0
0 .2
0 .4
0 .6
0 .8
1
0
1 .2
5
10
15
20
V F, F O R W AR D V O LT AG E (V )
V R , REV ERSE V OLTA GE (V )
Figure 9. Schottky Diode Forward Voltage.
Figure 10. Schottky Diode Reverse Current.
1
D = 0.5
R θJA(t) = r(t) + R θ JA
R θ JA = 135 °C/W
0.2
0.1
0.1
0.05
P(pk)
0.02
t1
0.01
t2
T J - T A = P * R θ JA(t)
Duty Cycle, D = t1 / t2
0.01
SINGLE PULSE
0.001
0.0001
0.001
0.01
0.1
1
10
100
1000
t1, TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1.
Transient thermal response will change depending on the circuit board design.
Si6923DQ Rev. A (W)
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx™
Bottomless™
CoolFET™
CROSSVOLT™
DenseTrench™
DOME™
EcoSPARK™
E2CMOSTM
EnSignaTM
FACT™
FACT Quiet Series™
FAST 
FASTr™
FRFET™
GlobalOptoisolator™
GTO™
HiSeC™
ISOPLANAR™
LittleFET™
MicroFET™
MicroPak™
MICROWIRE™
OPTOLOGIC™
OPTOPLANAR™
PACMAN™
POP™
Power247™
PowerTrench 
QFET™
QS™
QT Optoelectronics™
Quiet Series™
SILENT SWITCHER 
SMART START™
STAR*POWER™
Stealth™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
SyncFET™
TinyLogic™
TruTranslation™
UHC™
UltraFET 
VCX™
STAR*POWER is used under license
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
2. A critical component is any component of a life
systems which, (a) are intended for surgical implant into
support device or system whose failure to perform can
the body, or (b) support or sustain life, or (c) whose
be reasonably expected to cause the failure of the life
failure to perform when properly used in accordance
support device or system, or to affect its safety or
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. H4