MOTOROLA MTB15N06E

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SEMICONDUCTOR TECHNICAL DATA
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Motorola Preferred Device
TMOS POWER FET
15 AMPERES
RDS(on) = 0.12 OHM
60 VOLTS
N–Channel Enhancement–Mode Silicon Gate
The D2PAK package has the capability of housing a larger die
than any existing surface mount package which allows it to be used
in applications that require the use of surface mount components
with higher power and lower RDS(on) capabilities. This advanced
TMOS E–FET is designed to withstand high energy in the
avalanche and commutation modes. The new energy efficient
design also offers a drain–to–source diode with a fast recovery
time. Designed for low voltage, high speed switching applications in
power supplies, converters and PWM motor controls, these
devices are particularly well suited for bridge circuits where diode
speed and commutating safe operating areas are critical and offer
additional safety margin against unexpected voltage transients.
• Avalanche Energy Specified
• Source–to–Drain Diode Recovery Time Comparable to a
Discrete Fast Recovery Diode
• Diode is Characterized for Use in Bridge Circuits
• IDSS and VDS(on) Specified at Elevated Temperature
• Short Heatsink Tab Manufactured — Not Sheared
• Specially Designed Leadframe for Maximum Power Dissipation
• Available in 24 mm 13–inch/800 Unit Tape & Reel, Add T4
Suffix to Part Number

D
G
CASE 418B–02, Style 2
D2PAK
S
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Symbol
Value
Unit
VDSS
VDGR
VGS
60
Vdc
60
Vdc
± 20
Vdc
Drain Current — Continuous
Drain Current — Continuous @ 100°C
Drain Current — Single Pulse (tp ≤ 10 µs)
ID
ID
IDM
15
10
40
Adc
Total Power Dissipation
Derate above 25°C
Total Power Dissipation @ TA = 25°C, when mounted with the minimum recommended pad size
PD
75
0.6
2.5
Watts
W/°C
Watts
TJ, Tstg
EAS
– 55 to 150
°C
110
mJ
RθJC
RθJA
RθJA
1.67
62.5
50
°C/W
TL
260
°C
Rating
Drain–Source Voltage
Drain–Gate Voltage (RGS = 1.0 MΩ)
Gate–Source Voltage — Continuous
Operating and Storage Temperature Range
Single Pulse Drain–to–Source Avalanche Energy — Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vpk, IL = 15 Apk, L = 0.98 mH, RG = 25 Ω )
Thermal Resistance — Junction to Case
Thermal Resistance — Junction to Ambient
Thermal Resistance — Junction to Ambient, when mounted with the minimum recommended pad size
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds
Apk
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit
curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
E–FET and Designer’s are trademarks of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc.
Thermal Clad is a trademark of the Bergquist Company
Preferred devices are Motorola recommended choices for future use and best overall value.
REV 1
TMOS
Motorola
Motorola, Inc.
1994 Power MOSFET Transistor Device Data
1
MTB15N06E
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Symbol
Min
Typ
Max
Unit
60
—
—
64
—
—
Vdc
mV/°C
—
—
—
—
10
100
—
—
100
nAdc
2.0
—
2.9
6.0
4.0
—
Vdc
mV/°C
—
0.1
0.12
Ohm
—
—
—
—
2.16
1.8
gFS
4.0
6.5
—
mhos
Ciss
—
500
700
pF
Coss
—
240
340
Crss
—
60
120
td(on)
—
8.0
16
tr
—
70
140
td(off)
—
16
32
tf
—
40
80
QT
—
15
35
Q1
—
3.0
—
Q2
—
8.0
—
Q3
—
6.0
—
(IS = 15 Adc, VGS = 0)
(IS = 15 Adc, VGS = 0, TJ = 125°C)
VSD
—
—
1.1
0.97
1.6
—
Vdc
(IS = 15 Adc, VGS = 0,
dIS/dt = 100 A/µs)
trr
—
70
—
ns
Internal Drain Inductance
(Measured from the tab to center of die)
LD
—
3.5
—
nH
Internal Source Inductance
(Measured from the source lead 0.1″ from package to source bond pad)
LS
—
7.5
—
nH
Characteristic
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage
(VGS = 0 V, ID = 250 µAdc)
Temperature Coefficient (Positive)
V(BR)DSS
Zero Gate Voltage Drain Current
(VDS = 60 Vdc, VGS = 0)
(VDS = 60 Vdc, VGS = 0, TJ = 125°C)
IDSS
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0)
IGSS
µAdc
ON CHARACTERISTICS (1)
Gate Threshold Voltage
(VDS = VGS, ID = 250 µAdc)
Temperature Coefficient (Negative)
VGS(th)
Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 7.5 Adc)
RDS(on)
Drain–Source On–Voltage (VGS = 10 Vdc)
(ID = 15 Adc)
(ID = 7.5 Adc, TJ = 125°C)
VDS(on)
Forward Transconductance (VDS ≥ 8.0 Vdc, ID = 7.5 Adc)
Vdc
DYNAMIC CHARACTERISTICS
Input Capacitance
(VDS = 25 Vdc, VGS = 0,
f = 1.0 MHz)
Output Capacitance
Reverse Transfer Capacitance
SWITCHING CHARACTERISTICS (2)
Turn–On Delay Time
(VDD = 30 Vdc, ID = 15 Adc,
VGS = 10 Vdc,
RG = 9.0 Ω)
Rise Time
Turn–Off Delay Time
Fall Time
Gate Charge
(VDS = 48 Vdc, ID = 15 Adc,
VGS = 10 Vdc)
ns
nC
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage
Reverse Recovery Time
INTERNAL PACKAGE INDUCTANCE
(1) Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
(2) Switching characteristics are independent of operating junction temperature.
2
Motorola TMOS Power MOSFET Transistor Device Data
MTB15N06E
TYPICAL ELECTRICAL CHARACTERISTICS
7V
12
6V
8
VGS = 5 V
4
2
0
4
6
8
12
8
4
0
2
4
6
8
10
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 1. On–Region Characteristics
Figure 2. Transfer Characteristics
R DS(on) , DRAIN–TO–SOURCE RESISTANCE
(NORMALIZED)
0.16
100°C
0.12
TJ = 25°C
0.08
– 55°C
0.04
3
6
9
15
12
2.2
VGS = 10 V
ID = 15 A
1.8
1.4
1
0.6
– 50
– 25
0
25
50
75
100
125
150
TJ, JUNCTION TEMPERATURE (°C)
Figure 3. On–Resistance versus Drain Current
and Temperature
Figure 4. On–Resistance Variation With
Temperature
47 k
15 V
VDD
1 mA
10 V
0.1 µF
2N3904
2N3904
100 k
47 k
100 k
100
FERRITE
BEAD
SAME
DEVICE
TYPE
AS DUT
DUT
Vin = 15 Vpk; PULSE WIDTH ≤ 100 µs, DUTY CYCLE ≤ 10%.
Figure 5. Gate Charge Test Circuit
Motorola TMOS Power MOSFET Transistor Device Data
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
ID, DRAIN CURRENT (AMPS)
+18 V
Vin
100°C
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
VGS = 10 V
0
TJ = – 55°C
16
0
10
0.2
0
25°C
VDS ≥ 8 V
I D, DRAIN CURRENT (AMPS)
I D, DRAIN CURRENT (AMPS)
20
TJ = 25°C
8V
16
0
RDS(on) , DRAIN–TO–SOURCE RESISTANCE (OHMS)
9V
10 V
175
70
14
60
12
VGS
QT
10
50
Q2
8
40
Q1
30
6
VDS
4
2
0
ID = 15 A
VDS = 48 V
TJ = 25°C
20
10
Q3
0
4
8
12
QT, TOTAL CHARGE (nC)
16
VDS , DRAIN–TO–SOURCE VOLTAGE (VOLTS)
20
20
Figure 6. Gate–to–Source and Drain–to–Source
Voltage versus Total Charge
3
MTB15N06E
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted
by recognizing that the power MOSFET is charge controlled.
The lengths of various switching intervals (∆t) are determined by how fast the FET input capacitance can be charged
by current from the generator.
The capacitance (Ciss) is read from the capacitance curve at
a voltage corresponding to the off–state condition when calculating td(on) and is read at a voltage corresponding to the
on–state when calculating td(off).
The published capacitance data is difficult to use for calculating rise and fall because drain–gate capacitance varies
greatly with applied voltage. Accordingly, gate charge data is
used. In most cases, a satisfactory estimate of average input
current (IG(AV)) can be made from a rudimentary analysis of
the drive circuit so that
At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source
lead, inside the package and in the circuit wiring which is
common to both the drain and gate current paths, produces a
voltage at the source which reduces the gate drive current.
The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex.
The MOSFET output capacitance also complicates the
mathematics. And finally, MOSFETs have finite internal gate
resistance which effectively adds to the resistance of the
driving source, but the internal resistance is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate resistance (Figure 8) shows how typical switching performance is
affected by the parasitic circuit elements. If the parasitics
were not present, the slope of the curves would maintain a
value of unity regardless of the switching speed. The circuit
used to obtain the data is constructed to minimize common
inductance in the drain and gate circuit loops and is believed
readily achievable with board mounted components. Most
power electronic loads are inductive; the data in the figure is
taken with a resistive load, which approximates an optimally
snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces
switching losses.
t = Q/IG(AV)
During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as
the plateau voltage, VSGP. Therefore, rise and fall times may
be approximated by the following:
tr = Q2 x RG/(VGG – VGSP)
tf = Q2 x RG/VGSP
where
VGG = the gate drive voltage, which varies from zero to VGG
RG = the gate drive resistance
and Q2 and VGSP are read from the gate charge curve.
During the turn–on and turn–off delay times, gate current is
not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for
voltage change in an RC network. The equations are:
td(on) = RG Ciss In [VGG/(VGG – VGSP)]
td(off) = RG Ciss In (VGG/VGSP)
4
Motorola TMOS Power MOSFET Transistor Device Data
MTB15N06E
1000
1250
VGS = 0
1000
200
t, TIME (ns)
C, CAPACITANCE (pF)
VDD = 30 V
ID = 15 A
VGS = 10 V
TJ = 25°C
TJ = 25°C
VDS = 0
750
Ciss
500
100
tf
td(off)
20
td(on)
10
Coss
250
2
Crss
0
20
10
10
0
20
1
30
1
Figure 8. Resistive Switching Time
Variation versus Gate Resistance
VGS = 20 V
SINGLE PULSE
TC = 25°C
10 µs
100 µs
20
10
1 ms
10 ms
dc
2
1
0.2
0.1
0.1
THERMAL LIMIT
PACKAGE LIMIT
RDS(on) LIMIT
1
0.2
10
2
100
20
EAS, SINGLE PULSE DRAIN–TO–SOURCE
AVALANCHE ENERGY (mJ)
1000
OPERATION LIMITED IN THIS
AREA BY RDS(on)
100
20
RG, GATE RESISTANCE (OHMS)
Figure 7. Capacitance Variation
200
100
10
2
VGS
VDS
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS)
I D, DRAIN CURRENT (AMPS)
tr
110
100
90
PEAK IL = 15 A
VDD = 25 V
80
70
60
50
40
30
20
10
0
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
25
50
75
100
125
TJ, STARTING JUNCTION TEMPERATURE (°C)
150
Figure 9. Maximum Rated Forward Biased
Safe Operating Area
Figure 10. Maximum Avalanche Energy versus
Starting Junction Temperature
BVDSS
L
VDS
IL
VDD
t
IL(t)
RG
VDD
tP
Figure 11. Unclamped Inductive Switching
Test Circuit
Motorola TMOS Power MOSFET Transistor Device Data
t, (TIME)
Figure 12. Unclamped Inductive Switching Waveforms
5
MTB15N06E
SAFE OPERATING AREA INFORMATION
FORWARD BIASED SAFE OPERATING AREA
curves are based on a case temperature of 25°C and a maximum junction temperature of 150°C. Limitations for repetitive
pulses at various case temperatures can be determined by
using the thermal response curves. Motorola Application
Note, AN569, “Transient Thermal Resistance–General Data
and Its Use” provides detailed instructions.
The FBSOA curves define the maximum drain–to–source
voltage and drain current that a device can safely handle
when it is forward biased, or when it is on, or being turned on.
Because these curves include the limitations of simultaneous
high voltage and high current, up to the rating of the device,
they are especially useful to designers of linear systems. The
PD, POWER DISSIPATION (WATTS)
3
RθJA = 50°C/W
Board material = 0.065 mil FR–4
Mounted on the minimum recommended footprint
Collector/Drain Pad Size ≈ 450 mils x 350 mils
2.5
2.0
1.5
1
0.5
0
25
50
75
100
125
150
TA, AMBIENT TEMPERATURE (°C)
Figure 13. D2PAK Power Derating Curve
r(t), TRANSIENT THERMAL RESISTANCE
(NORMALIZED)
1
0.7
0.5
D = 0.5
0.3
0.2
0.2
0.1
0.07
0.05
0.03
0.1
0.05
P(pk)
t1
SINGLE PULSE
t2
DUTY CYCLE, D = t1/t2
0.02
0.01
0.01
RθJC(t) = r(t) RθJC
RθJC = 1.67°C/W MAX
D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t1
TJ(pk) – TC = P(pk) RθJC(t)
0.01
0.02 0.03 0.05
0.1
0.2 0.3
0.5
1
2
3
5
10
20
30
50
100
200
300 500 1000
t, TIME (ms)
Figure 14. Thermal Response
6
Motorola TMOS Power MOSFET Transistor Device Data
MTB15N06E
INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE
RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total
design. The footprint for the semiconductor packages must be
the correct size to ensure proper solder connection interface
between the board and the package. With the correct pad
geometry, the packages will self align when subjected to a
solder reflow process.
0.33
8.38
0.08
2.032
0.42
10.66
0.24
6.096
0.04
1.016
0.12
3.05
0.63
17.02
inches
mm
POWER DISSIPATION FOR A SURFACE MOUNT DEVICE
PD =
TJ(max) – TA
RθJA
The values for the equation are found in the maximum
ratings table on the data sheet. Substituting these values into
the equation for an ambient temperature TA of 25°C, one can
calculate the power dissipation of the device. For a D2PAK
device, PD is calculated as follows.
PD = 150°C – 25°C = 2.5 Watts
50°C/W
The 50°C/W for the D2PAK package assumes the use of the
recommended footprint on a glass epoxy printed circuit board
to achieve a power dissipation of 2.5 Watts. There are other
alternatives to achieving higher power dissipation from the
surface mount packages. One is to increase the area of the
drain pad. By increasing the area of the drain pad, the power
Motorola TMOS Power MOSFET Transistor Device Data
dissipation can be increased. Although one can almost double
the power dissipation with this method, one will be giving up
area on the printed circuit board which can defeat the purpose
of using surface mount technology. For example, a graph of
RθJA versus drain pad area is shown in Figure 15.
RθJA , THERMAL RESISTANCE, JUNCTION
TO AMBIENT (°C/W)
The power dissipation for a surface mount device is a
function of the drain pad size. These can vary from the
minimum pad size for soldering to a pad size given for
maximum power dissipation. Power dissipation for a surface
mount device is determined by TJ(max), the maximum rated
junction temperature of the die, RθJA, the thermal resistance
from the device junction to ambient, and the operating
temperature, TA. Using the values provided on the data sheet,
PD can be calculated as follows:
70
Board Material = 0.0625″
G–10/FR–4, 2 oz Copper
60
TA = 25°C
2.5 Watts
50
3.5 Watts
40
5 Watts
30
20
0
2
4
6
8
10
A, AREA (SQUARE INCHES)
12
14
16
Figure 15. Thermal Resistance versus Drain Pad
Area for the D2PAK Package (Typical)
Another alternative would be to use a ceramic substrate or
an aluminum core board such as Thermal Clad. Using a
board material such as Thermal Clad, an aluminum core
board, the power dissipation can be doubled using the same
footprint.
7
MTB15N06E
SOLDER STENCIL GUIDELINES
Prior to placing surface mount components onto a printed
circuit board, solder paste must be applied to the pads. Solder
stencils are used to screen the optimum amount. These
stencils are typically 0.008 inches thick and may be made of
brass or stainless steel. For packages such as the SC–59,
SC–70/SOT–323, SOD–123, SOT–23, SOT–143, SOT–223,
SO–8, SO–14, SO–16, and SMB/SMC diode packages, the
stencil opening should be the same as the pad size or a 1:1
registration. This is not the case with the DPAK and D2PAK
packages. If one uses a 1:1 opening to screen solder onto the
drain pad, misalignment and/or “tombstoning” may occur due
to an excess of solder. For these two packages, the opening
in the stencil for the paste should be approximately 50% of the
tab area. The opening for the leads is still a 1:1 registration.
Figure 16 shows a typical stencil for the DPAK and D2PAK
packages. The pattern of the opening in the stencil for the
drain pad is not critical as long as it allows approximately 50%
of the pad to be covered with paste.
ÇÇÇÇÇÇ
ÇÇÇÇÇÇÇÇ
ÇÇÇÇÇÇÇÇ
ÇÇÇÇÇÇÇÇ
ÇÇÇÇÇÇÇÇ
ÇÇÇÇÇÇÇÇ
ÇÇÇÇÇÇÇÇ
ÇÇ
ÇÇ
ÇÇ
ÇÇ
SOLDER PASTE
OPENINGS
STENCIL
Figure 16. Typical Stencil for DPAK and
D2PAK Packages
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated
temperature of the device. When the entire device is heated
to a high temperature, failure to complete soldering within a
short time could result in device failure. Therefore, the
following items should always be observed in order to
minimize the thermal stress to which the devices are
subjected.
• Always preheat the device.
• The delta temperature between the preheat and soldering
should be 100°C or less.*
• When preheating and soldering, the temperature of the
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering method,
the difference shall be a maximum of 10°C.
• The soldering temperature and time shall not exceed
260°C for more than 10 seconds.
8
• When shifting from preheating to soldering, the maximum
temperature gradient shall be 5°C or less.
• After soldering has been completed, the device should be
allowed to cool naturally for at least three minutes.
Gradual cooling should be used as the use of forced
cooling will increase the temperature gradient and result
in latent failure due to mechanical stress.
• Mechanical stress or shock should not be applied during
cooling.
* Soldering a device without preheating can cause excessive
thermal shock and stress which can result in damage to the
device.
* Due to shadowing and the inability to set the wave height to
incorporate other surface mount components, the D2PAK is
not recommended for wave soldering.
Motorola TMOS Power MOSFET Transistor Device Data
MTB15N06E
TYPICAL SOLDER HEATING PROFILE
For any given circuit board, there will be a group of control
settings that will give the desired heat pattern. The operator
must set temperatures for several heating zones, and a figure
for belt speed. Taken together, these control settings make up
a heating “profile” for that particular circuit board. On
machines controlled by a computer, the computer remembers
these profiles from one operating session to the next. Figure
17 shows a typical heating profile for use when soldering a
surface mount device to a printed circuit board. This profile will
vary among soldering systems but it is a good starting point.
Factors that can affect the profile include the type of soldering
system in use, density and types of components on the board,
type of solder used, and the type of board or substrate material
being used. This profile shows temperature versus time. The
STEP 1
PREHEAT
ZONE 1
“RAMP”
200°C
STEP 2
STEP 3
VENT
HEATING
“SOAK” ZONES 2 & 5
“RAMP”
DESIRED CURVE FOR HIGH
MASS ASSEMBLIES
line on the graph shows the actual temperature that might be
experienced on the surface of a test board at or near a central
solder joint. The two profiles are based on a high density and
a low density board. The Vitronics SMD310 convection/infrared reflow soldering system was used to generate this
profile. The type of solder used was 62/36/2 Tin Lead Silver
with a melting point between 177 –189°C. When this type of
furnace is used for solder reflow work, the circuit boards and
solder joints tend to heat first. The components on the board
are then heated by conduction. The circuit board, because it
has a large surface area, absorbs the thermal energy more
efficiently, then distributes this energy to the components.
Because of this effect, the main body of a component may be
up to 30 degrees cooler than the adjacent solder joints.
STEP 5
STEP 4
HEATING
HEATING
ZONES 3 & 6 ZONES 4 & 7
“SPIKE”
“SOAK”
170°C
STEP 6
VENT
STEP 7
COOLING
205° TO 219°C
PEAK AT
SOLDER JOINT
160°C
150°C
150°C
100°C
140°C
100°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
(DEPENDING ON
MASS OF ASSEMBLY)
DESIRED CURVE FOR LOW
MASS ASSEMBLIES
50°C
TIME (3 TO 7 MINUTES TOTAL)
TMAX
Figure 17. Typical Solder Heating Profile
Motorola TMOS Power MOSFET Transistor Device Data
9
MTB15N06E
PACKAGE DIMENSIONS
C
E
V
B
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
4
A
S
1
2
3
-TSEATING
PLANE
STYLE 2:
PIN 1.
2.
3.
4.
K
J
G
H
D 3 PL
0.13 (0.005)
M
T
GATE
DRAIN
SOURCE
DRAIN
DIM
A
B
C
D
E
G
H
J
K
S
V
INCHES
MIN
MAX
0.340 0.380
0.380 0.405
0.160 0.190
0.020 0.035
0.045 0.055
0.100 BSC
0.080 0.110
0.018 0.025
0.090 0.110
0.575 0.625
0.045 0.055
MILLIMETERS
MIN
MAX
8.64
9.65
9.65 10.29
4.06
4.83
0.51
0.89
1.14
1.40
2.54 BSC
2.03
2.79
0.46
0.64
2.29
2.79
14.60 15.88
1.14
1.40
CASE 418B–02
ISSUE B
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the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit,
and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters can and do vary in different
applications. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. Motorola does
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the Motorola product could create a situation where personal injury or death may occur. Should Buyer purchase or use Motorola products for any such
unintended or unauthorized application, Buyer shall indemnify and hold Motorola and its officers, employees, subsidiaries, affiliates, and distributors harmless
against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that Motorola was negligent regarding the design or manufacture of the part.
Motorola and
are registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal Opportunity/Affirmative Action Employer.
Literature Distribution Centers:
USA: Motorola Literature Distribution; P.O. Box 20912; Phoenix, Arizona 85036.
EUROPE: Motorola Ltd.; European Literature Centre; 88 Tanners Drive, Blakelands, Milton Keynes, MK14 5BP, England.
JAPAN: Nippon Motorola Ltd.; 4–32–1, Nishi–Gotanda, Shinagawa–ku, Tokyo 141, Japan.
ASIA PACIFIC: Motorola Semiconductors H.K. Ltd.; Silicon Harbour Center, No. 2 Dai King Street, Tai Po Industrial Estate, Tai Po, N.T., Hong Kong.
10
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*MTB15N06E/D*
Motorola TMOS Power MOSFET Transistor
Device Data
MTB15N06E/D