Siemens BUZ255 Sipmos power transistor (n channel enhancement mode avalanche-rated) Datasheet

BUZ 255
Not for new design
SIPMOS ® Power Transistor
• N channel
• Enhancement mode
• Avalanche-rated
Pin 1
Pin 2
G
Pin 3
D
S
Type
VDS
ID
RDS(on)
Package
Ordering Code
BUZ 255
200 V
13 A
0.24 Ω
TO-220 AB
C67078-S1406-A2
Maximum Ratings
Parameter
Symbol
Continuous drain current
ID
TC = 31 °C
Values
Unit
A
13
IDpuls
Pulsed drain current
TC = 25 °C
52
Avalanche current,limited by Tjmax
IAR
13
Avalanche energy,periodic limited by Tjmax
Avalanche energy, single pulse
EAR
9
mJ
EAS
ID = 13 A, VDD = 50 V, RGS = 25 Ω
L = 1.89 mH, Tj = 25 °C
200
Gate source voltage
VGS
Power dissipation
Ptot
TC = 25 °C
± 20
V
W
95
Operating temperature
Tj
-55 ... + 150
Storage temperature
Tstg
-55 ... + 150
Thermal resistance, chip case
RthJC
≤ 1.32
Thermal resistance, chip to ambient
RthJA
75
DIN humidity category, DIN 40 040
K/W
E
IEC climatic category, DIN IEC 68-1
Semiconductor Group
°C
55 / 150 / 56
1
07/96
BUZ 255
Not for new design
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Static Characteristics
Drain- source breakdown voltage
V(BR)DSS
VGS = 0 V, ID = 0.25 mA, Tj = 25 °C
Gate threshold voltage
250
-
-
VGS(th)
VGS=VDS, ID = 1 mA
Zero gate voltage drain current
V
2.1
3
4
IDSS
µA
VDS = 250 V, VGS = 0 V, Tj = 25 °C
-
0.1
1
VDS = 250 V, VGS = 0 V, Tj = 125 °C
-
10
100
Gate-source leakage current
IGSS
VGS = 20 V, VDS = 0 V
Drain-Source on-resistance
-
10
100
Ω
RDS(on)
VGS = 10 V, ID = 8.5 A
Semiconductor Group
nA
-
2
0.22
0.24
07/96
BUZ 255
Not for new design
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Dynamic Characteristics
Transconductance
gfs
VDS≥ 2 * ID * RDS(on)max, ID = 8.5 A
Input capacitance
5
pF
-
970
1300
-
165
250
-
85
130
Crss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Turn-on delay time
-
Coss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Reverse transfer capacitance
9.4
Ciss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Output capacitance
S
td(on)
ns
VDD = 30 V, VGS = 10 V, ID = 3 A
RGS = 50 Ω
Rise time
-
15
25
-
60
90
-
160
250
-
60
80
tr
VDD = 30 V, VGS = 10 V, ID = 3 A
RGS = 50 Ω
Turn-off delay time
td(off)
VDD = 30 V, VGS = 10 V, ID = 3 A
RGS = 50 Ω
Fall time
tf
VDD = 30 V, VGS = 10 V, ID = 3 A
RGS = 50 Ω
Semiconductor Group
3
07/96
BUZ 255
Not for new design
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Reverse Diode
Inverse diode continuous forward current IS
TC = 25 °C
Inverse diode direct current,pulsed
-
-
52
V
1.3
1.6
trr
ns
-
200
-
Qrr
VR = 100 V, IF=lS, diF/dt = 100 A/µs
Semiconductor Group
13
-
VR = 100 V, IF=lS, diF/dt = 100 A/µs
Reverse recovery charge
-
VSD
VGS = 0 V, IF = 26 A
Reverse recovery time
-
ISM
TC = 25 °C
Inverse diode forward voltage
A
µC
-
4
1.7
-
07/96
BUZ 255
Not for new design
Drain current
ID = ƒ(TC)
parameter: VGS ≥ 10 V
Power dissipation
Ptot = ƒ(TC)
14
100
A
W
12
Ptot
ID
80
11
10
70
9
60
8
7
50
6
40
5
30
4
3
20
2
10
1
0
0
0
20
40
60
80
100
120
°C
0
160
20
40
60
80
100
120
TC
Safe operating area
ID = ƒ(VDS)
parameter: D = 0.01, TC = 25°C
°C
160
TC
Transient thermal impedance
Zth JC = ƒ(tp)
parameter: D = tp / T
10 1
10 2
t = 16.0µs
p
K/W
/I
D
A
DS
ID
=V
DS
(o
n)
10 1
ZthJC
100 µs
10 0
R
1 ms
10 -1
D = 0.50
10 ms
10
0.20
0
0.10
0.05
10 -2
0.02
DC
0.01
single pulse
10
-1
10
0
10
1
10
10
2
V
10
VDS
Semiconductor Group
-3
-7
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
s 10
tp
5
07/96
0
BUZ 255
Not for new design
Typ. output characteristics
ID = ƒ(VDS)
Typ. drain-source on-resistance
RDS (on) = ƒ(ID)
parameter: VGS
parameter: tp = 80 µs
30
Ptot = 95W
0.75
l
A
kj
i h
Ω
g
26
ID
a
4.0
RDS (on)0.60
b
4.5
0.55
c
5.0
d
5.5
e
6.0
0.45
f
6.5
0.40
g
7.0
d h
7.5
f
22
20
e
18
16
14
12
c
8
6
d
e
0.50
f
8.0
0.30
h
j
9.0
0.25
j
k
10.0
l
20.0
g
i
k
0.20
0.15
b
0.10 VGS [V] =
4
2
0
0
c
0.35
i
10
b
0.65
VGS [V]
24
a
a
2
4
6
8
10
12
14
V
0.05
0.00
0
17
a
4.0
4.5
b
5.0
c
5.5
4
d
6.0
e
f
6.5 7.0
8
12
g
7.5
h
i
j
k
8.0 9.0 10.0 20.0
16
20
VDS
A
26
ID
Typ. transfer characteristics ID = f (VGS)
Typ. forward transconductance gfs = f (ID)
parameter: tp = 80 µs
VDS≥2 x ID x RDS(on)max
parameter: tp = 80 µs,
VDS≥2 x ID x RDS(on)max
32
14
S
A
ID
12
gfs
24
11
10
9
20
8
16
7
6
12
5
4
8
3
2
4
0
0
1
0
1
2
3
Semiconductor Group
4
5
6
7
8
V
VGS
10
6
0
4
8
12
16
20
24
A
ID
07/96
30
BUZ 255
Not for new design
Gate threshold voltage
VGS (th) = ƒ(Tj)
parameter: VGS = VDS, ID = 1 mA
Drain-source on-resistance
RDS (on) = ƒ(Tj )
parameter: ID = 8.5 A, VGS = 10 V
1.0
4.6
V
Ω
98%
4.0
VGS(th)
RDS (on) 0.8
3.6
0.7
3.2
0.6
2.8
typ
2.4
0.5
2%
2.0
0.4
98%
typ
1.6
0.3
1.2
0.2
0.8
0.1
0.4
0.0
-60
0.0
-60
-20
20
60
100
°C
160
-20
20
60
100
°C
Tj
Typ. capacitances
160
Tj
Forward characteristics of reverse diode
IF = ƒ(VSD)
parameter: Tj , tp = 80 µs
C = f (VDS)
parameter:VGS = 0V, f = 1MHz
10 1
10 2
nF
A
IF
C
10 0
10 1
Ciss
Coss
10 -1
10 0
Tj = 25 °C typ
Crss
Tj = 150 °C typ
Tj = 25 °C (98%)
Tj = 150 °C (98%)
10 -2
0
5
10
Semiconductor Group
15
20
25
30
V
VDS
40
10 -1
0.0
0.4
0.8
1.2
1.6
2.0
2.4
V
VSD
7
07/96
3.0
BUZ 255
Not for new design
Avalanche energy EAS = ƒ(Tj )
parameter: ID = 13 A, VDD = 50 V
RGS = 25 Ω, L = 1.89 mH
Typ. gate charge
VGS = ƒ(QGate)
parameter: ID puls = 20 A
16
220
mJ
V
EAS
180
VGS
160
140
12
10
0,2 VDS max
0,8 VDS max
120
8
100
6
80
60
4
40
2
20
0
20
0
40
60
80
100
120
°C
160
Tj
0
20
40
60
80
100
nC
Q Gate
Drain-source breakdown voltage
V(BR)DSS = ƒ(Tj )
240
V
230
V(BR)DSS
225
220
215
210
205
200
195
190
185
180
-60
-20
20
60
100
°C
160
Tj
Semiconductor Group
8
07/96
140
BUZ 255
Not for new design
Package Outlines
TO-220 AB
Dimension in mm
Semiconductor Group
9
07/96
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