Siemens BUZ74A Sipmos power transistor (n channel enhancement mode avalanche-rated) Datasheet

BUZ 74 A
SIPMOS ® Power Transistor
• N channel
• Enhancement mode
• Avalanche-rated
Pin 1
Pin 2
G
Pin 3
D
S
Type
VDS
ID
RDS(on)
Package
Ordering Code
BUZ 74 A
500 V
2.1 A
4Ω
TO-220 AB
C67078-S1314-A3
Maximum Ratings
Parameter
Symbol
Continuous drain current
ID
TC = 27 °C
Values
Unit
A
2.1
IDpuls
Pulsed drain current
TC = 25 °C
8.5
Avalanche current,limited by Tjmax
IAR
2.4
Avalanche energy,periodic limited by Tjmax
Avalanche energy, single pulse
EAR
5
mJ
EAS
ID = 2.4 A, VDD = 50 V, RGS = 25 Ω
L = 56.3 mH, Tj = 25 °C
180
Gate source voltage
VGS
Power dissipation
Ptot
TC = 25 °C
± 20
V
W
40
Operating temperature
Tj
-55 ... + 150
Storage temperature
Tstg
-55 ... + 150
Thermal resistance, chip case
RthJC
≤ 3.1
Thermal resistance, chip to ambient
RthJA
75
DIN humidity category, DIN 40 040
K/W
E
IEC climatic category, DIN IEC 68-1
Semiconductor Group
°C
55 / 150 / 56
1
07/96
BUZ 74 A
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Static Characteristics
Drain- source breakdown voltage
V(BR)DSS
VGS = 0 V, ID = 0.25 mA, Tj = 25 °C
Gate threshold voltage
500
-
-
VGS(th)
VGS=VDS, ID = 1 mA
Zero gate voltage drain current
V
2.1
3
4
IDSS
µA
VDS = 500 V, VGS = 0 V, Tj = 25 °C
-
0.1
1
VDS = 500 V, VGS = 0 V, Tj = 125 °C
-
10
100
Gate-source leakage current
IGSS
VGS = 20 V, VDS = 0 V
Drain-Source on-resistance
-
10
100
Ω
RDS(on)
VGS = 10 V, ID = 1.5 A
Semiconductor Group
nA
-
2
3.5
4
07/96
BUZ 74 A
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Dynamic Characteristics
Transconductance
gfs
VDS≥ 2 * ID * RDS(on)max, ID = 1.5 A
Input capacitance
1.8
pF
-
450
675
-
50
75
-
20
30
Crss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Turn-on delay time
-
Coss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Reverse transfer capacitance
2.1
Ciss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Output capacitance
S
td(on)
ns
VDD = 30 V, VGS = 10 V, ID = 2.1 A
RGS = 50 Ω
Rise time
-
8
12
-
40
60
-
50
65
-
30
40
tr
VDD = 30 V, VGS = 10 V, ID = 2.1 A
RGS = 50 Ω
Turn-off delay time
td(off)
VDD = 30 V, VGS = 10 V, ID = 2.1 A
RGS = 50 Ω
Fall time
tf
VDD = 30 V, VGS = 10 V, ID = 2.1 A
RGS = 50 Ω
Semiconductor Group
3
07/96
BUZ 74 A
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Reverse Diode
Inverse diode continuous forward current IS
TC = 25 °C
Inverse diode direct current,pulsed
-
-
8.5
V
1
1.3
trr
ns
-
300
-
Qrr
VR = 100 V, IF=lS, diF/dt = 100 A/µs
Semiconductor Group
2.1
-
VR = 100 V, IF=lS, diF/dt = 100 A/µs
Reverse recovery charge
-
VSD
VGS = 0 V, IF = 4.8 A
Reverse recovery time
-
ISM
TC = 25 °C
Inverse diode forward voltage
A
µC
-
4
2.5
-
07/96
BUZ 74 A
Drain current
ID = ƒ(TC)
parameter: VGS ≥ 10 V
Power dissipation
Ptot = ƒ(TC)
2.2
45
A
W
Ptot
ID
35
1.8
1.6
30
1.4
25
1.2
1.0
20
0.8
15
0.6
10
0.4
5
0.2
0
0
0.0
20
40
60
80
100
120
°C
0
160
20
40
60
80
100
120
TC
Safe operating area
ID = ƒ(VDS)
parameter: D = 0.01, TC = 25°C
160
Transient thermal impedance
Zth JC = ƒ(tp)
parameter: D = tp / T
10 2
10 1
A
ID
°C
TC
K/W
ZthJC
t = 26.0µs
p
10 1
10 0
100 µs
D
V
S
/
D
I
1 ms
10 -1
DS
(o
n)
=
10 0
D = 0.50
R
0.20
10 ms
0.10
10 -1
0.05
10 -2
0.02
DC
0.01
single pulse
10 -2
0
10
10
1
10
2
V 10
10 -3
-7
10
3
VDS
Semiconductor Group
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
s 10
tp
5
07/96
0
BUZ 74 A
Typ. output characteristics
ID = ƒ(VDS)
Typ. drain-source on-resistance
RDS (on) = ƒ(ID)
parameter: VGS
parameter: tp = 80 µs
5.0
13
Ptot = 40W
l
A
ID
Ω
kj i h g
f
a
b
e
11
VGS [V]
a
4.0
4.0
3.5
d
3.0
2.5
2.0
c
1.5
b
4.5
c
5.0
d
5.5
e
6.0
f
6.5
g
7.0
h
7.5
i
8.0
j
9.0
k
10.0
l
20.0
RDS (on)
10
9
8
7
c
6
d
5
e
g
ih
j
4
3
1.0
b
2
0.5
0.0
0
10
20
30
VGS [V] =
1
a
40
V
0
0.0
55
f
a
4.0
4.5
5.0
b
5.5
0.4
c
6.0
0.8
d
6.5
e
f
7.0 7.5
1.2
1.6
g
8.0
2.0
h
i
j
9.0 10.0 20.0
2.4
2.8
VDS
A
Typ. transfer characteristics ID = f (VGS)
Typ. forward transconductance gfs = f (ID)
parameter: tp = 80 µs
VDS≥2 x ID x RDS(on)max
parameter: tp = 80 µs,
VDS≥2 x ID x RDS(on)max
ID
3.6
ID
4.5
4.0
A
S
gfs
3.5
3.0
3.0
2.5
2.5
2.0
2.0
1.5
1.5
1.0
1.0
0.5
0.5
0.0
0
1
2
3
4
5
6
7
8
V
10
VGS
Semiconductor Group
6
0.0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
A
ID
07/96
4.0
BUZ 74 A
Gate threshold voltage
VGS (th) = ƒ(Tj)
parameter: VGS = VDS, ID = 1 mA
Drain-source on-resistance
RDS (on) = ƒ(Tj )
parameter: ID = 1.5 A, VGS = 10 V
16
4.6
Ω
4.0
V
RDS (on)
VGS(th)
98%
3.6
12
typ
3.2
10
2.8
2.4
8
2%
2.0
98%
typ
6
1.6
1.2
4
0.8
2
0.4
0
-60
-20
20
60
100
°C
0.0
-60
160
-20
20
60
100
°C
Tj
Typ. capacitances
160
Tj
Forward characteristics of reverse diode
IF = ƒ(VSD)
parameter: Tj , tp = 80 µs
C = f (VDS)
parameter:VGS = 0V, f = 1MHz
10 1
10 1
nF
A
IF
C
10 0
10 0
Ciss
10 -1
10 -1
Tj = 25 °C typ
Tj = 150 °C typ
Coss
Tj = 25 °C (98%)
Tj = 150 °C (98%)
Crss
10 -2
0
5
10
Semiconductor Group
15
20
25
30
V
VDS
40
10 -2
0.0
0.4
0.8
1.2
1.6
2.0
2.4
V
VSD
7
07/96
3.0
BUZ 74 A
Avalanche energy EAS = ƒ(Tj )
parameter: ID = 2.4 A, VDD = 50 V
RGS = 25 Ω, L = 56.3 mH
Typ. gate charge
VGS = ƒ(QGate)
parameter: ID puls = 4 A
190
16
mJ
V
160
EAS
VGS
140
12
120
10
0,2 VDS max
100
0,8 VDS max
8
80
6
60
4
40
2
20
0
20
0
40
60
80
100
120
°C
160
Tj
0
4
8
12
16
20
24
28
nC
Q Gate
Drain-source breakdown voltage
V(BR)DSS = ƒ(Tj )
600
V
580
V(BR)DSS570
560
550
540
530
520
510
500
490
480
470
460
450
-60
-20
20
60
100
°C
160
Tj
Semiconductor Group
8
07/96
36
BUZ 74 A
Package Outlines
TO-220 AB
Dimension in mm
Semiconductor Group
9
07/96
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