Siemens C67078-S1331-A3 Sipmos power transistor (n channel enhancement mode avalanche-rated) Datasheet

BUZ 12 A
Not for new design
SIPMOS ® Power Transistor
• N channel
• Enhancement mode
• Avalanche-rated
Pin 1
Pin 2
G
Pin 3
D
S
Type
VDS
ID
RDS(on)
Package
Ordering Code
BUZ 12 A
50 V
42 A
0.035 Ω
TO-220 AB
C67078-S1331-A3
Maximum Ratings
Parameter
Symbol
Continuous drain current
ID
TC = 44 °C
Values
Unit
A
42
IDpuls
Pulsed drain current
TC = 25 °C
168
Avalanche current,limited by Tjmax
IAR
42
Avalanche energy,periodic limited by Tjmax
Avalanche energy, single pulse
EAR
2.5
mJ
EAS
ID = 42 A, VDD = 25 V, RGS = 25 Ω
L = 23.2 µH, Tj = 25 °C
41
Gate source voltage
VGS
Power dissipation
Ptot
TC = 25 °C
± 20
V
W
125
Operating temperature
Tj
-55 ... + 150
Storage temperature
Tstg
-55 ... + 150
Thermal resistance, chip case
RthJC
≤1
Thermal resistance, chip to ambient
RthJA
≤ 75
DIN humidity category, DIN 40 040
K/W
E
IEC climatic category, DIN IEC 68-1
Semiconductor Group
°C
55 / 150 / 56
1
07/96
BUZ 12 A
Not for new design
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Static Characteristics
Drain- source breakdown voltage
V(BR)DSS
VGS = 0 V, ID = 0.25 mA, Tj = 25 °C
Gate threshold voltage
50
-
-
VGS(th)
VGS=VDS, ID = 1 mA
Zero gate voltage drain current
V
2.1
3
4
IDSS
µA
VDS = 50 V, VGS = 0 V, Tj = 25 °C
-
0.1
1
VDS = 50 V, VGS = 0 V, Tj = 125 °C
-
10
100
Gate-source leakage current
IGSS
VGS = 20 V, VDS = 0 V
Drain-Source on-resistance
-
10
100
Ω
RDS(on)
VGS = 10 V, ID = 32 A
Semiconductor Group
nA
-
2
0.03
0.035
07/96
BUZ 12 A
Not for new design
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Dynamic Characteristics
Transconductance
gfs
VDS≥ 2 * ID * RDS(on)max, ID = 32 A
Input capacitance
12
pF
-
1700
2300
-
800
1200
-
280
420
Crss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Turn-on delay time
-
Coss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Reverse transfer capacitance
23
Ciss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Output capacitance
S
td(on)
ns
VDD = 30 V, VGS = 10 V, ID = 3 A
RGS = 50 Ω
Rise time
-
35
50
-
85
130
-
220
280
-
140
180
tr
VDD = 30 V, VGS = 10 V, ID = 3 A
RGS = 50 Ω
Turn-off delay time
td(off)
VDD = 30 V, VGS = 10 V, ID = 3 A
RGS = 50 Ω
Fall time
tf
VDD = 30 V, VGS = 10 V, ID = 3 A
RGS = 50 Ω
Semiconductor Group
3
07/96
BUZ 12 A
Not for new design
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Reverse Diode
Inverse diode continuous forward current IS
TC = 25 °C
Inverse diode direct current,pulsed
-
-
168
V
1.8
2.2
trr
ns
-
80
-
Qrr
VR = 30 V, IF=lS, diF/dt = 100 A/µs
Semiconductor Group
42
-
VR = 30 V, IF=lS, diF/dt = 100 A/µs
Reverse recovery charge
-
VSD
VGS = 0 V, IF = 84 A
Reverse recovery time
-
ISM
TC = 25 °C
Inverse diode forward voltage
A
µC
-
4
0.14
-
07/96
BUZ 12 A
Not for new design
Drain current
ID = ƒ(TC)
parameter: VGS ≥ 10 V
Power dissipation
Ptot = ƒ(TC)
45
130
W
A
110
Ptot
ID
100
90
35
30
80
25
70
60
20
50
15
40
10
30
20
5
10
0
0
0
20
40
60
80
100
120
°C
0
160
20
40
60
80
100
120
TC
Safe operating area
ID = ƒ(VDS)
parameter: D = 0, TC = 25°C
°C
160
TC
Transient thermal impedance
Zth JC = ƒ(tp)
parameter: D = tp / T
10 3
10 1
K/W
A
10 0
ID
ZthJC
t = 47.0µs
p
/ID
10 2
=
VD
100 µs
S
10 -1
)
on
S(
RD
1 ms
10 -2
D = 0.50
0.20
10
10 ms
1
10
-3
0.10
0.05
10 -4
0.02
single pulse
0.01
DC
10 0
0
10
10
1
V 10
10 -5
-7
10
2
VDS
Semiconductor Group
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
s 10
tp
5
07/96
0
BUZ 12 A
Not for new design
Typ. output characteristics
ID = ƒ(VDS)
parameter: tp = 80 µs
100
0.11
Ptot = 125W
k j
i
VGS [V]
4.0
70
b
4.5
c
5.0
d
5.5
e
6.0
f f
6.5
g
7.0
h
7.5
i
8.0
j
9.0
g
60
50
e
40
b
c
d
e
f
g
0.09
RDS (on)
h a
80
0.08
0.07
0.06
0.05
h
0.04
i
j
d k 10.0
30
0.03
l 20.0
c
20
VGS [V] =
0.01
a
0
1.0
2.0
3.0
4.0
5.0
k
0.02
b
10
0.0
a
Ω
l
A
ID
Typ. drain-source on-resistance
RDS (on) = ƒ(ID)
parameter: VGS
a
4.0
4.5
b
5.0
c
5.5
d
6.0
e
f
6.5 7.0
g
7.5
h
i
j
k
8.0 9.0 10.0 20.0
0.00
V
7.0
0
10
20
30
40
50
60
70
VDS
A
90
ID
Typ. transfer characteristics ID = f (VGS)
Typ. forward transconductance gfs = f (ID)
parameter: tp = 80 µs
VDS≥2 x ID x RDS(on)max
parameter: tp = 80 µs,
VDS≥2 x ID x RDS(on)max
60
30
A
S
50
ID
gfs
45
24
22
40
20
35
18
16
30
14
25
12
20
10
15
8
6
10
4
5
0
0
2
0
1
2
3
Semiconductor Group
4
5
6
7
8
V
VGS
10
6
0
10
20
30
40
50
A
ID
07/96
65
BUZ 12 A
Not for new design
Gate threshold voltage
VGS (th) = ƒ(Tj)
parameter: VGS = VDS, ID = 1 mA
Drain-source on-resistance
RDS (on) = ƒ(Tj )
parameter: ID = 32 A, VGS = 10 V
0.09
4.6
V
Ω
98%
4.0
VGS(th)
RDS (on)0.07
3.6
typ
3.2
0.06
2.8
0.05
2.4
98%
0.04
2%
2.0
typ
1.6
0.03
1.2
0.02
0.8
0.01
0.4
0.00
0.0
-60
-20
20
60
100
°C
-60
160
-20
20
60
100
°C
Tj
Typ. capacitances
160
Tj
Forward characteristics of reverse diode
IF = ƒ(VSD)
parameter: Tj , tp = 80 µs
C = f (VDS)
parameter:VGS = 0V, f = 1MHz
10 1
10 3
nF
A
C
IF
Ciss
10 0
10 2
Coss
Crss
10 -1
10 1
Tj = 25 °C typ
Tj = 150 °C typ
Tj = 25 °C (98%)
Tj = 150 °C (98%)
10 -2
0
5
10
Semiconductor Group
15
20
25
30
V
VDS
40
10 0
0.0
0.4
0.8
1.2
1.6
2.0
2.4
V
VSD
7
07/96
3.0
BUZ 12 A
Not for new design
Avalanche energy EAS = ƒ(Tj )
parameter: ID = 42 A, VDD = 25 V
RGS = 25 Ω, L = 23.2 µH
Typ. gate charge
VGS = ƒ(QGate)
parameter: ID puls = 63 A
45
16
mJ
EAS
V
VGS
35
12
30
0,2 VDS max
10
0,8 VDS max
25
8
20
6
15
4
10
2
5
0
20
0
40
60
80
100
120
°C
160
Tj
0
10
20
30
40
50
60
70
80
nC 100
Q Gate
Drain-source breakdown voltage
V(BR)DSS = ƒ(Tj )
60
V
V(BR)DSS 57
56
55
54
53
52
51
50
49
48
47
46
45
-60
-20
20
60
100
°C
160
Tj
Semiconductor Group
8
07/96
BUZ 12 A
Not for new design
Package Outlines
TO-220 AB
Dimension in mm
Semiconductor Group
9
07/96
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