CY7C1333 64Kx32 Flow-Thru SRAM with NoBL™ Architecture Features Functional Description • Pin compatible and functionally equivalent to ZBT™ device MT55L64L32F • Supports 66-MHz bus operations with zero wait states — Data is transferred on every clock • Internally self-timed output buffer control to eliminate the need to use OE • Registered inputs for Flow-Through operation • Byte Write capability • 64K x 32 common I/O architecture • Single 3.3V power supply • Fast clock-to-output times — 12.0 ns (for 66-MHz device) • • • • • • — 14.0 ns (for 50-MHz device) Clock Enable (CEN) pin to suspend operation Synchronous self-timed writes Asynchronous output enable JEDEC-standard 100-pin TQFP package Burst Capability—linear or interleaved burst order Low (16.5 mW) standby power The CY7C1333 is a 3.3V, 64K by 32 Synchronous Flow-Through Burst SRAM designed specifically to support unlimited true back-to-back Read/Write operations without the insertion of wait states. The CY7C1333 is equipped with the advanced No Bus Latency™ (NoBL™) logic required to enable consecutive Read/Write operations with data being transferred on every clock cycle. This feature dramatically improves the throughput of data through the SRAM, especially in systems that require frequent Write-Read transitions. The CY7C1333 is pin/functionally compatible to ZBT SRAM MT55L64L32F. All synchronous inputs pass through input registers controlled by the rising edge of the clock. The clock input is qualified by the Clock Enable (CEN) signal, which, when deasserted, suspends operation and extends the previous clock cycle. Maximum access delay from the clock rise is 12.0 ns (66-MHz device). Write operations are controlled by the four Byte Write Select (BWS[0:3]) and a Write Enable (WE) input. All writes are conducted with on-chip synchronous self-timed write circuitry. Three synchronous Chip Enables (CE1, CE2, CE3) and an asynchronous Output Enable (OE) provide for easy bank selection and output three-state control. In order to avoid bus contention, the output drivers are synchronously three-stated during the data portion of a write sequence. Logic Block Diagram 32 ADV/LD A[15:0] 32 D REG. CE Data-In Q CLK 16 CEN CE1 CE2 CE3 CONTROL and WRITE LOGIC 16 64KX32 MEMORY ARRAY 32 32 DQ[31:0] WE BWS[3:0] Mode OE Selection Guide Maximum Access Time (ns) 7C1333-66 7C1333-50 12.0 14.0 Maximum Operating Current (mA) Commercial 310 260 Maximum CMOS Standby Current (mA) Commercial 5.0 5.0 No Bus Latency and NoBL are trademarks of Cypress Semiconductor Corporation. ZBT is a trademark of Integrated Device Technology. Cypress Semiconductor Corporation • 3901 North First Street • San Jose • CA 95134 • 408-943-2600 August 4, 1999 CY7C1333 Pin Configuration A9 A8 81 NC 83 82 ADV/LD NC 84 OE CEN WE CLK VSS VDD CE3 BWS 0 BWS 1 BWS 2 BWS 3 CE2 CE1 A7 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 A6 100-Pin TQFP NC 1 80 NC DQ16 2 79 DQ15 DQ17 3 78 DQ14 VDDQ 4 77 VDDQ VSSQ 5 76 VSSQ DQ18 6 75 DQ13 DQ19 7 74 DQ12 DQ20 8 73 DQ11 DQ21 9 72 DQ10 VSSQ 10 71 VSSQ VDDQ 11 70 VDDQ DQ22 12 69 DQ9 DQ23 13 68 DQ8 VSSQ 14 67 VSS VDD 15 66 VSS VDD 16 65 VSS 17 64 VDD NC DQ24 18 63 DQ7 DQ25 19 62 DQ6 VDDQ 20 61 VDDQ VSSQ 21 60 VSSQ DQ26 22 59 DQ5 DQ27 23 58 DQ4 DQ28 24 57 DQ3 DQ29 25 56 DQ2 VSSQ 26 55 VSSQ VDDQ 27 54 VDDQ DQ30 28 53 DQ1 DQ31 29 52 DQ0 NC 30 51 NC 2 44 45 46 47 48 49 50 A11 A12 A13 A14 A15 NC DNU A10 39 DNU 43 38 A0 DNU 37 A1 DNU 36 A2 42 35 A3 41 34 A4 VDD 33 A5 40 32 VSS 31 MODE CY7C1333 CY7C1333 Pin Definitions Pin Number 49−44, 81–82, 99, 100, 32–37 96–93 Name A[15:0] I/O InputSynchronous Description Address Inputs used to select one of the 65,536 address locations. Sampled at the rising edge of the CLK. BWS[3:0] InputSynchronous 88 WE 85 ADV/LD InputSynchronous InputSynchronous 89 CLK Input-Clock 98 CE1 97 CE2 92 CE3 86 OE InputSynchronous InputSynchronous InputSynchronous InputAsynchronous 87 CEN Byte Write Select Inputs, active LOW. Qualified with WE to conduct writes to the SRAM. Sampled on the rising edge of CLK. BWS0 controls DQ[7:0], BWS1 controls DQ[15:8], BWS2 controls DQ[23:16], BWS0 controls DQ[31:24]. Write Enable Input, active LOW. Sampled on the rising edge of CLK if CEN is active LOW. This signal must be asserted LOW to initiate a write sequence. Advance/Load Input used to advance the on-chip address counter or load a new address. When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a new address can be loaded into the device for an access. After being deselected, ADV/LD should be driven LOW in order to load a new address. Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN. CLK is only recognized if CEN is active LOW. Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 and CE3 to select/deselect the device. Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE3 to select/deselect the device. Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE2 to select/deselect the device. Output Enable, active LOW. Combined with the synchronous logic block inside the device to control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs. When deasserted HIGH, I/O pins are three-stated, and act as input data pins. OE is masked during the data portion of a write sequence, during the first clock when emerging from a deselected state, when the device has been deselected. Clock Enable Input, active LOW. When asserted LOW the clock signal is recognized by the SRAM. When deasserted HIGH the Clock signal is masked. Since the deasserting CEN does not deselect the device, CEN can be used to extend the previous cycle when required. Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A [15:0] during the previous clock rise of the read cycle. The direction of the pins is controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave as outputs. When HIGH, DQ[31:0] are placed in a three-state condition. The outputs are automatically three-stated during the data portion of a write sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of OE. Mode Input. Selects the burst order of the device. Tied HIGH selects the interleaved burst order. Pulled LOW selects the linear burst order. MODE should not change states during operation. When left floating Mode will default HIGH, to an interleaved burst order. Power supply inputs to the core of the device. Should be connected to 3.3V power supply. Ground for the core of the device. Should be connected to ground of the system. Power supply for the I/O circuitry. Should be connected to a 3.3V power supply. InputSynchronous 29–28,25–22, DQ[31:0] 19–18,13–12, 9–6, 3–2, 79–78,75–72, 69–68,63–62 59–56,53–52 I/OSynchronous 31 Mode Input Strap pin 15, 16, 41, 65, 91 17, 40, 67, 90 4, 11, 20, 27, 54, 61, 70, 77 5, 10, 14, 21, 26, 55, 60, 66, 71, 76 64 VDD Power Supply VSS VDDQ VSSQ Ground I/O Power Supply I/O Ground NC - Ground for the I/O circuitry. Should be connected to ground of the system. No Connect. Reserved for drive strength control input. 3 CY7C1333 Pin Definitions (continued) Pin Number 50, 83, 84 Name NC - 1, 30, 51, 80 NC - 38, 39, 42, 43 DNU I/O - Description No connects. Reserved for address inputs for depth expansion. Pins 50, 83, and 84 will be used for 128K, 256K, and 512K depths respectively. No connects. Reserved for parity I/O signals on x36 devices. These inputs are not connected to the device. Do Not Use pins. These pins should be left floating or tied to VSS. input signal. A LOW input on MODE selects a linear burst mode, a HIGH selects an interleaved burst sequence. Both burst counters use A0 and A1 in the burst sequence, and will wrap-around when incremented sufficiently. A HIGH input on ADV/LD will increment the internal burst counter regardless of the state of chip enable inputs or WE. WE is latched at the beginning of a burst cycle. Therefore, the type of access (Read or Write) is maintained throughout the burst sequence. Introduction Functional Overview The CY7C1333 is a Synchronous Flow-Through Burst SRAM designed specifically to eliminate wait states during Write-Read transitions. All synchronous inputs pass through input registers controlled by the rising edge of the clock. The clock signal is qualified with the Clock Enable input signal (CEN). If CEN is HIGH, the clock signal is not recognized and all internal states are maintained. All synchronous operations are qualified with CEN. Maximum access delay from the clock rise (tCDV) is 12.0 ns (66-MHz device). Single Write Accesses A write access is initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are ALL asserted active, and (3) the write signal WE is asserted LOW. The address presented to A0–A 15 is loaded into the Address Register. The write signals are latched into the Control Logic block. The data lines are automatically three-stated regardless of the state of the OE input signal. This allows the external logic to present the data on DQ 0–DQ31. Accesses can be initiated by asserting all three chip enables (CE1, CE2, CE3) active at the rising edge of the clock. If Clock Enable (CEN) is active LOW and ADV/LD is asserted LOW, the address presented to the device will be latched. The access can either be a read or write operation, depending on the status of the Write Enable (WE). BWS[3:0] can be used to conduct byte write operations. On the next clock rise the data presented to DQ0–DQ31 inputs (or a subset for byte write operations, see Write Cycle Description table for details) is latched into the device and the write is complete. Additional accesses (Read/Write/Deselect) can be initiated on this cycle. Write operations are qualified by the Write Enable (WE). All writes are simplified with on-chip synchronous self-timed write circuitry. Three synchronous Chip enables (CE1, CE2, CE3) and an asynchronous output enable (OE) simplify depth expansion. ADV/LD should be driven LOW once the device has been deselected in order to load a new address for the next operation. The data written during the Write operation is controlled by BWS[3:0] signals. The CY7C1333 provides byte write capability that is described in the Write Cycle Description table. Asserting the Write Enable input (WE) with the selected Byte Write Select (BWS[3:0]) input will selectively write to only the desired bytes. Bytes not selected during a byte write operation will remain unaltered. A Synchronous self-timed write mechanism has been provided to simplify the write operations. Byte write capability has been included in order to greatly simplify Read/Modify/Write sequences, which can be reduced to simple byte write operations. Single Read Accesses A read access is initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are ALL asserted active, (3) the Write Enable input signal WE is deasserted HIGH, and 4) ADV/LD is asserted LOW. The address presented to the address inputs (A0–A15) is latched into the Address Register and presented to the memory core and control logic. The control logic determines that a read access is in progress and allows the requested data to propagate to the output buffers. The data is available within 12.0 ns (66-MHz device) provided OE is active LOW. After the first clock of the read access the output buffers are controlled by OE and the internal control logic. OE must be driven LOW in order for the device to drive out the requested data. On the subsequent clock, another operation (Read/Write/Deselect) can be initiated. When the SRAM is deselected at clock rise by one of the chip enable signals, its output will be three-stated immediately. Because the CY7C1333 is a common I/O device, data should not be driven into the device while the outputs are active. The Output Enable (OE) can be deasserted HIGH before presenting data to the DQ0–DQ 31 inputs. Doing so will three-state the output drivers. As a safety precaution, DQ 0–DQ31 are automatically three-stated during the data portion of a write cycle, regardless of the state of OE. Burst Write Accesses The CY7C1333 has an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four Write operations without reasserting the address inputs. ADV/LD must be driven LOW in order to load the initial address, as described in the Single Write Accesses section above. When ADV/LD is driven HIGH on the subsequent clock rise, the Chip Enables (CE1, CE2, and CE3) and WE inputs are ignored and the burst counter is incremented. The correct BWS[3:0] inputs must be driven in each cycle of the burst write in order to write the correct bytes of data. Burst Read Accesses The CY7C1333 has an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four Reads without reasserting the address inputs. ADV/LD must be driven LOW in order to load a new address into the SRAM, as described in the Single Read Access section above. The sequence of the burst counter is determined by the MODE 4 CY7C1333 . Cycle Description Truth Table[1, 2, 3, 4, 5, 6] Address Used Operation CE CEN ADV/ LD WE BWSx CLK Comments Deselected External 1 0 L X X L-H I/Os three-stated Suspend - X 1 X X X L-H Clock ignored, all operations suspended Begin Read External 0 0 0 1 X L-H Address latched Begin Write External 0 0 0 0 Valid L-H Address latched, data presented one valid clock later Burst Read Operation Internal X 0 1 X X L-H Burst Read operation. Previous access was a Read operation. Addresses incremented internally in conjunction with the state of Mode. Burst Write Operation Internal X 0 1 X Valid L-H Burst Write operation. Previous access was a Write operation. Addresses incremented internally in conjunction with the state of Mode. Bytes written are determined by BWS[3:0] Interleaved Burst Sequence First Address Second Address Third Address Linear Burst Sequence Fourth Address First Address Second Address Third Address Fourth Address Ax+1, Ax Ax+1, Ax Ax+1, Ax Ax+1, Ax Ax+1, Ax Ax+1, Ax Ax+1, Ax Ax+1, Ax 00 01 10 11 00 01 10 11 01 00 11 10 01 10 11 00 10 11 00 01 10 11 00 01 11 10 01 00 11 00 01 10 Notes: 1. X=”Don’t Care”, 1=Logic HIGH, 0=Logic LOW, CE stands for ALL Chip Enables active. BWSx = 0 signifies at least one Byte Write Select is active, BWSx = Valid signifies that the desired byte write selects are asserted, see Write Cycle Description table for details. 2. Write is defined by WE and BWS[3:0]. See Write Cycle Description table for details. 3. The DQ pins are controlled by the current cycle and the OE signal. 4. CEN=1 inserts wait states. 5. Device will power-up deselected and the I/Os in a three-state condition, regardless of OE. 6. OE assumed LOW. 5 CY7C1333 Write Cycle Description[7, 8] Function WE BWS3 BWS2 BWS1 BWS0 Read 1 X X X X Write - No bytes written 0 1 1 1 1 Write Byte 0 - DQ[7:0] 0 1 1 1 0 Write Byte 1 - DQ[15:8] 0 1 1 0 1 Write Bytes 1, 0 0 1 1 0 0 Write Byte 2 - DQ[23:16] 0 1 0 1 1 Write Bytes 2, 0 0 1 0 1 0 Write Bytes 2, 1 0 1 0 0 1 Write Bytes 2, 1, 0 0 1 0 0 0 Write Byte 3 - DQ[31:24] 0 0 1 1 1 Write Bytes 3, 0 0 0 1 1 0 Write Bytes 3, 1 0 0 1 0 1 Write Bytes 3, 1, 0 0 0 1 0 0 Write Bytes 3, 2 0 0 0 1 1 Write Bytes 3, 2, 0 0 0 0 1 0 Write Bytes 3, 2, 1 0 0 0 0 1 Write All Bytes 0 0 0 0 0 Notes: 7. X=”Don’t Care”, 1=Logic HIGH, 0=Logic LOW. 8. Write is initiated by the combination of WE and BWSx. Bytes written are determined by BWS[3:0]. Bytes not selected during byte writes remain unaltered. All I/Os are three-stated during byte writes. 6 CY7C1333 Current into Outputs (LOW)......................................... 20 mA Maximum Ratings Static Discharge Voltage .......................................... >2001V (per MIL-STD-883, Method 3015) (Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature ..................................... −65°C to +150°C Latch-Up Current .................................................... >200 mA Ambient Temperature with Power Applied .................................................. −55°C to +125°C Operating Range Supply Voltage on VDD Relative to GND .........−0.5V to +4.6V Range DC Voltage Applied to Outputs in High Z State[9] .....................................−0.5V to VDDQ + 0.5V Com’l Ambient Temperature[10] VDD/VDDQ 0°C to +70°C 3.3V ± 5% DC Input Voltage[9] ..................................−0.5V to VDDQ + 0.5V Electrical Characteristics Over the Operating Range Parameter Description Test Conditions Min. Max. Unit VDD Power Supply Voltage 3.135 3.465 V VDDQ I/O Supply Voltage 3.135 3.465 V VOH Output HIGH Voltage VOL Output LOW Voltage VIH Input HIGH Voltage VDD = Min., IOH = −4.0 mA[11] VDD = Min., IOL = 8.0 mA 2.4 [11] [9] VIL Input LOW Voltage IX Input Load Current V 0.4 V 2.0 VDD + 0.3V V −0.3 0.8 V −5 5 µA –30 30 µA −5 5 µA GND ≤ V I ≤ VDDQ Input Current of MODE IOZ Output Leakage Current GND ≤ V I ≤ VDDQ, Output Disabled ICC VDD Operating Supply VDD = Max., IOUT = 0 mA, f = fMAX = 1/tCYC 15-ns cycle, 66 MHz 310 mA 20-ns cycle, 50 MHz 260 mA Max. V DD, Device Deselected, VIN ≥ VIH or VIN ≤ V IL f = fMAX = 1/tCYC 15-ns cycle, 66 MHz 40 mA 20-ns cycle, 50 MHz 35 mA ISB1 Automatic CE Power-Down Current—TTL Inputs ISB2 Automatic CE Max. VDD, Device Deselected, V IN Power-Down ≤ 0.3V or VIN > VDDQ – 0.3V, Current—CMOS Inputs f = 0 All speed grades 5.0 mA ISB3 Automatic CE Max. VDD, Device Deselected, or Power-Down VIN ≤ 0.3V or VIN > VDDQ – 0.3V Current—CMOS Inputs f = fMAX = 1/tCYC 15-ns cycle, 66 MHz 30 mA 20-ns cycle, 50 MHz 25 mA Capacitance[12] Parameter Description CIN Input Capacitance CCLK Clock Input Capacitance CI/O Input/Output Capacitance Test Conditions TA = 25°C, f = 1 MHz, VDD = 3.3V. VDDQ = 3.3V Notes: 9. Minimum voltage equals –2.0V for pulse duration less than 20 ns. 10. TA is the case temperature. 11. The load used for VOH and VOL testing is shown in figure (b) of the AC test conditions. 12. Tested initially and after any design or process change that may affect these parameters. 7 Max. Unit 4 pF 4 pF 6 pF CY7C1333 AC Test Loads and Waveforms R=317Ω 3.3V OUTPUT [13] OUTPUT Z0 =50Ω ALL INPUT PULSES 3.0V RL =50Ω 5 pF R=351Ω GND VL = 1.5V INCLUDING JIG AND SCOPE (a) (b) 1333-2 Thermal Resistance Description Thermal Resistance (Junction to Ambient) Test Conditions Still Air, soldered on a 4.25 x 1.125 inch, 4-layer printed circuit board Thermal Resistance (Junction to Case) Symbol TQFP Typ. Units Notes ΘJA 28 °C/W 12 ΘJC 4 °C/W 12 Switching Characteristics Over the Operating Range[13, 14, 15] Parameter Description CY7C1333-66 CY7C1333-50 Min. Min. Max. Max. Unit tCYC Clock Cycle Time 15.0 20.0 ns tCH Clock HIGH 5.0 6.0 ns tCL Clock LOW 5.0 6.0 ns tCDV Data Output Valid After CLK Rise tDOH Data Output Hold After CLK Rise 2.0 2.0 ns tAS Address Set-Up Before CLK Rise 2.0 2.5 ns tAH Address Hold After CLK Rise 0.5 1.0 ns tCENS CEN Set-Up Before CLK Rise 2.0 2.5 ns tCENH CEN Hold After CLK Rise 0.5 1.0 ns tWES WE, BWS[3:0] Set-Up Before CLK Rise 2.0 2.5 ns tWEH WE, BW[3:0] Hold After CLK Rise 0.5 1.0 ns tDS Data Input Set-Up Before CLK Rise 2.0 2.5 ns tDH Data Input Hold After CLK Rise 0.5 1.0 ns tCES Chip Select Set-Up 2.0 2.5 ns tCEH Chip Select Hold After CLK Rise 0.5 1.0 ns tCHZ tCLZ [12, 14, 15, 16] 2.0 [12, 14, 15, 16] 3.0 Clock to High-Z Clock to Low-Z [12, 14, 15, 16] tEOHZ OE HIGH to Output High-Z tEOLZ OE LOW to Output Low-Z[12, 14, 15, 16] tEOV 12.0 OE LOW to Output Valid 5.0 14.0 2.0 3.0 6.0 1.0 [14] 5.0 ns ns 7.0 1.0 6.0 ns ns ns 7.0 ns Notes: 13. Unless otherwise noted, test conditions assume signal transition time of 2 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading shown in (a) of AC test loads. 14. t CHZ, tCLZ, t EOV, tEOLZ , and tEOHZ are specified with A/C test conditions shown in part (a) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage. 15. At any given voltage and temperature, tEOHZ is less than tEOLZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve High-Z prior to Low-Z under the same system conditions. 16. This parameter is sampled and not 100% tested. 8 CY7C1333 Switching Waveforms DESELECT DESELECT Suspend Read Read Write Read DESELECT Read Read Write Read/Write/Deselect Timing CLK tCENH tCENS tCH tCL tCENH tCENS tCYC CEN tAS ADDRESS WA2 RA1 RA3 WA5 RA4 RA6 RA7 tAH WE tWS tWH tCES tCEH CE tCLZ tDOH DataIn/Out Q11a Out tDOH tCHZ tCHZ D2 In Q4 Out Q31a Out D5 In Q6 Out Q7 Out Device tCDV originally deselected WE is the combination of WE & BWSx to define a write cycle (see Write Cycle Description table). CE is the combination of CE1, CE2, and CE3. All chip selects need to be active in order to select the device. Any chip select can deselect the device. RAx stands for Read Address X, WAx stands for Write Address X, Dx stands for Data-in X, Qx stands for Data-out X. = UNDEFINED = DON’T CARE 9 CY7C1333 Switching Waveforms (continued) Burst Read Burst Read Begin Read Burst Write Burst Write Burst Write Burst Read Begin Write Burst Sequences Burst Read Burst Read Begin Read Read/Write/Deselect Timing CLK tALH tALS tCH tCL tCYC ADV/LD tAS tAH ADDRESS RA1 WA2 RA3 WE tWS tWH tWS tWH BWS[3:0] tCES tCEH CE tCLZ DataIn/Out tCHZ tDOH Q11a Out Q1+1 Out Q1+2 Out Q1+3 Out D2 In tCDV t DeviceCDV originally deselected tCLZ tDH D2+1 In D2+2 In D2+3 In Q3 Out Q1+1 Out tDS The combination of WE & BWS [3:0] define a write cycle (see Write Cycle Description table). CE is the combination of CE1, CE2, and CE3. All chip enables need to be active in order to select the device. Any chip enable can deselect the device. RAx stands for Read Address X, WAx stands for Write Address X, Dx stands for Data-in for location X, Qx stands for Data-out for location X. CEN held LOW. During burst writes, byte writes can be conducted by asserting the appropriate BWS[3:0] input signals. Burst order determined by the state of the Mode input. CEN held LOW. OE held LOW. = UNDEFINED = DON’T CARE 10 CY7C1333 Switching Waveforms (continued) OE Timing OE tEOV tEOHZ Three-state I/Os tEOLZ Ordering Information Speed (MHz) Ordering Code Package Name Package Type Operating Range 66 CY7C1333-66AC A101 100-Lead 14 x 20 x 1.4 mm Thin Quad Flat Pack Commercial 50 CY7C1333-50AC A101 100-Lead 14 x 20 x 1.4 mm Thin Quad Flat Pack Commercial Document #: 38-00642-C 11 CY7C1333 Package Diagram 100-Pin Thin Plastic Quad Flatpack (14 x 20 x 1.4 mm) A101 51-85050-A © Cypress Semiconductor Corporation, 1999. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.