Eon EN71NS032A0-7DCWP Stacked multi-chip product (mcp) flash memory and ram 32 megabit (2m x 16-bit) cmos 1.8 volt-only burst simultaneous operation, multiplexed flash memory and 16 megabit (1m x 16-bit) pseudo static ram Datasheet

EN71NS032A0
EN71NS032A0
Stacked Multi-Chip Product (MCP) Flash Memory and RAM
32 Megabit (2M x 16-bit) CMOS 1.8 Volt-only Burst Simultaneous
Operation, Multiplexed Flash Memory and
16 Megabit (1M x 16-bit) Pseudo Static RAM
Distinctive Characteristics
MCP Features
■ Power supply voltage of 1.7V to 1.95V
■ High performance
- 70 ns @ random access
- 7 ns @ burst access (108MHz)
■ Operating Temperature
- 25°C to +85°C
■ Package
- 6.2 x 7.7 x 1.0mm 56 ball BGA
General Description
EN71NS032A0 is a product line of stacked Multi-Chip Product (MCP) packages and consists of:
■
■
Burst Simultaneous Operation, Multiplexed NOR Flash Memory.
Burst Mode, Multiplexed Pseudo SRAM.
For detailed specifications, Please refer to the individual datasheets listed in the following table.
Device
Document
NOR Flash Memory
EN29NS032
Pseudo SRAM
ENPSS16
Flash Density
32Mb
pSRAM density
16Mb
Flash Access time
70ns at Async. Mode
7ns at Burst Read
pSRAM Access time
70ns at Async. Mode
7ns at Burst Read
Flash Burst mode
max frequency
108MHz
pSRAM Burst mode
max frequency
108MHz
Package
56-ball BGA
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
1
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
www.eonssi.com
EN71NS032A0
MCP Block Diagram
NOR FLASH + PSRAM DIAGRAM
Note: Amax = A20
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
2
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
www.eonssi.com
EN71NS032A0
Connection Diagram
MCP
Flash-only Addresses
Shared Addresses
Shared ADQ Pins
EN71NS032A0
A20
A19 – A16
ADQ15 – ADQ0
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
3
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
www.eonssi.com
EN71NS032A0
Pin Description
Symbol
A20–A16
ADQ15–ADQ0
OE#
WE#
VSSQ/VSS
VCCQ/VCC
NC
Description
Flash
pSRAM
Address Inputs
Multiplexed Address/Data
Output Enable input. Asynchronous relative to CLK for the
Burst mode.
Write Enable input.
Ground
Device Power Supply (1.7 V–1.95 V).
Not Contact; pin not connected internally
Ready output; indicates the status of the Burst read.
Flash Memory RDY (using default “Active HIGH”
configuration)
VOL = data invalid,
VOH = data valid.
Note: The default polarity for the pSRAM WAIT signal is
opposite the default polarity of the Flash RDY signal.
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
RDYf/WAITp
CLK
AVD#
RESET# f
WP#f
Vppf
CE# p
CE# f
CREp
LB#p
UB#p
RFU
pSRAM WAIT (using default “Active HIGH” configuration)
VOL = data valid,
VOH = data invalid.
To match polarities, change bit 10 of the pSRAM Bus
Configruation Register to 0 (Active LOW WAIT). Alternately,
change bit 10 of the Flash Configuration Register to 0 (Active
LOW RDY)
Clock input. In burst mode, after the initial word is output,
subsequent active edges of CLK increment the internal
address counter. Should be at VOL or VIH while in
asynchronous mode.
Address Valid input. Indicates to device that the valid address
is present on the address inputs.
VIL = for asynchronous mode, indicates valid address; for
burst mode, causes starting address to be latched on rising
edge of CLK.
VIH = device ignores address inputs
Hardware reset input. VIL = device resets and returns to
reading array data
Hardware write protect input. VIL = disables program and
erase functions in the four outermost sectors. Should be at VIH
for all other conditions.
Accelerated input. At Vpp , accelerates programming;
automatically places device in Accelerated Program mode. At
VIL, disables all program and erase functions. Should be at VIH
for all other conditions. (Applying high voltage on MCP
package is prohibited; otherwise, internal RAM may be
damaged easily!)
Chip Enable Input for pSRAM.
Chip Enable Input for Flash. Asynchronous relative to CLK for
the Burst mode.
Control register enable (pSRAM).
Lower byte enable. DQ7~DQ0 (pSRAM)
Upper byte enable. DQ15~DQ8 (pSRAM)
Reserved for Future Use
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
4
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
●
●
●
●
●
●
●
●
www.eonssi.com
EN71NS032A0
Operating Mode (For Asynchronous mode)
Asynchronous Mode
BCR[15]=1
Power
Read
Active
X
L
L
H
L
L
Low-z
Data out
4
Write
Active
X
L
X
L
L
L
High-z
Data in
4
Standby
Standby
H or L
X
H
X
X
L
X
High-z
High-z
5, 6
No operation
Idle
X
X
L
X
X
L
X
Low-z
X
4, 6
Configuration register
write
Active
X
L
H
L
H
X
Low-z
High-z
Configuration register
read
Active
X
L
L
H
H
L
Low-z
Config.
Reg.out
DPD
Deep
Power-down
L
H
X
X
X
X
High-z
High-z
CLK ADV# CE# OE# WE# CRE
X
UB#/
A/DQ[15:0
WAIT2
LB#
]
Note
7
Operating Mode (For Synchronous Burst mode)
Burst Mode
BCR[15]=0
Power
Async read
Active
H or L
L
L
H
L
L
Low-z
Data out
4, 8
Async write
Active
H or L
L
X
L
L
L
High-z
Data in
4
Standby
Standby
H or L
X
H
X
X
L
X
High-z
High-z
5, 6
No operation
Idle
H or L
X
L
X
X
L
X
Low-z
X
4, 6
Initial burst read
Active
L
L
X
H
L
L
Low-z
Address
4, 9
Initial burst write
Active
L
L
H
L
L
X
Low-z
Address
4, 9
Burst continue
Active
H
L
X
X
X
L
Low-z
Data out
or
Data in
4, 9
Configuration register
write
Active
L
L
H
L
H
X
Low-z
High-z
9. 10
Configuration register
read
Active
L
L
L
H
H
L
Low-z
Config.
Reg.out
9, 10
DPD
Deep
Power-down
X
H
X
X
X
X
High-z
High-z
7
CLK ADV# CE# OE# WE# CRE
L
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
5
UB#/
LB#
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
WAIT A/DQ[15:0] Note
www.eonssi.com
EN71NS032A0
Note:
1. With burst mode enabled, CLK must be static(HIGH or LOW) during asynchronous READs and
asynchronous WRITEs and to achieve standby power during standby mode.
2. The WAIT polarity is configured through the bus configuration register (BCR[10]).
3. When LB# and UB# are in select mode (LOW), DQ[15:0] are enabled. When only LB# is in select
mode, DQ[7:0] are enabled. When only UB# is in the select mode, DQ[15:8] are enabled.
4. The device will consume active power in this mode whenever addresses are changed.
5. When the device is in standby mode, address inputs and data inputs/outputs are internally isolated
from any external influence.
6. VIN = VCCQ or 0V; all device pins must be static (unswitched) in order to achieve standby current.
7. DPD is initiated when CE# transitions from LOW to HIGH after writing RCR[4] to 0. DPD is
maintained until CE# transitions from HIGH to LOW.
8. When the BCR is configured for sync mode, sync READ and WRITE, and async READ and WRITE
are supported by ENPSS16
9. Burst mode operation is initialized through the bus configuration register (BCR[15]).
10. Initial cycle. Following cycles are the same as BURST CONTINUE. CE# must stay LOW for the
equivalent of a single-word burst (as indicated by WAIT).
11. X=don’t care. H=logic high. L=logic low.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
6
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
www.eonssi.com
EN71NS032A0
Purpose
Eon Silicon Solution Inc. (hereinafter called “Eon”) is going to provide its products’ top marking on
ICs with < cFeon > from January 1st, 2009, and without any change of the part number and the
compositions of the ICs. Eon is still keeping the promise of quality for all the products with the
same as that of Eon delivered before. Please be advised with the change and appreciate your
kindly cooperation and fully support Eon’s product family.
Eon products’ Top Marking
cFeon Top Marking Example:
cFeon
Part Number: XXXX-XXX
Lot Number: XXXXX
Date Code:
XXXXX
For More Information
Please contact your local sales office for additional information about Eon memory solutions.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
7
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
www.eonssi.com
EN71NS032A0
ORDERING INFORMATION
EN71NS
032
A0 -
7
DC
W
P
PACKAGING CONTENT
P = RoHS compliant
TEMPERATURE RANGE
W = Wireless (-25°C to +85°C)
PACKAGE
DC = 56-Ball BGA
0.50mm pitch, 6.2mm x 7.7mm package
BURST READ ACCESS TIME
7 = 108 MHz
9 = 83 MHz
Pseudo SRAM density
A0 = 16Mb
DENSITY
032 = 32Megabit (2M x 16 Bit)
BASE PART NUMBER
EN = Eon Silicon Solution Inc.
71NS = Multi-chip Product (MCP)
1.8V Simultaneous Read/Write,
Burst-mode Multiplexed Flash and RAM
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
8
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
www.eonssi.com
EN71NS032A0
PACKAGE MECHANICAL
56-ball Ball Grid Array (BGA) 6.2 x 7.7 x 1.0mm Package, pitch: 0.5mm, ball: 0.3mm
SYMBOL
DIMENSION IN MM
MIN.
NOR
MAX
A
---
---
1.00
A1
0.16
---
0.26
0.676
A2
D
6.10
6.20
6.30
E
7.60
7.70
7.80
D1
4.5 BSC
E1
6.5 BSC
e
0.5 BSC
b
0.27
--Note : 1. Coplanarity: 0.1 mm
0.37
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
9
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
www.eonssi.com
EN71NS032A0
Revisions List
Revision No
Description
Date
A
Initial Release
2010/10/13
B
Add BURST READ ACCESS TIME option of 9 = 83 MHz.
2011/07/05
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
10
©2004 Eon Silicon Solution, Inc.,
Rev. B, Issue Date: 2011/07/05
www.eonssi.com
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