Hamamatsu G8909 Ingaas pin photodiode array Datasheet

PHOTODIODE
InGaAs PIN photodiode array
G8909-01
Photodiode array for DWDM monitor
Features
Applications
l 250 µm pitch, 40 ch parallel readout
l Low cross-talk
l Precise chip position tolerance: ±0.05 mm
l DWDM monitor with AWG
■ General ratings
Parameter
Active area
Pixel pitch
Number of elements
■ Absolute maximum ratings
Parameter
Reverse voltage
Allowable input power
Operating temperature
Storage temperature
* In N environment or in vacuum
Value
f0.08
250
40
Symbol
VR Max.
Pin Max.
Topr
Tstg
Remark
Parameter
Spectral response range
Photo sensitivity
Photo response non-uniformity
Dark current
Shunt resistance
Terminal capacitance
Cross-talk
Symbol
l
S
PRNU
ID
Rsh
Ct
-
Value
6
10
-40 to +85
-40 to +85
*
■ Electrical and optical characteristics (Ta=25 °C, per 1 element)
Condition
l=1.31 µm
l=1.55 µm
VR=5 V
VR=10 mV
VR=5 V, f=1 MHz
VR=0.1 V
Unit
mm
µm
ch
Min.
0.8
0.85
-
Typ.
0.9 to 1.7
0.9
0.95
0.02
8
1.4
-33
Unit
V
mV
°C
°C
Max.
±5
0.2
-
Unit
µm
A/W
%
nA
GW
pF
dB
PRELIMINARY DATA
Apr. 2002
1
G8909-01
InGaAs PIN photodiode array
■ Spectral response
■ Dark current vs. reverse voltage
(Typ. Ta=25 ˚C)
0.5
0.6
0.8
1.0
1.2
1.4
1.6
1.8
(Typ. Ta=25 ˚C)
1 nA
DARK CURRENT
PHOTO SENSITIVITY (A/W)
1
100 pA
10 pA
1 pA
0.01
2.0
0.1
1
10
100
REVERSE VOLTAGE (V)
WAVELENGTH (µm)
KIRDB0002EB
■ Terminal capacitance vs. reverse voltage
DARK CURRENT
TERMINAL CAPACITANCE
(Typ. VR=5 V)
100 nA
10 nA
1 pF
1 nA
100 pA
100 fF
0.01
0.1
1
10
100
REVERSE VOLTAGE (V)
■ Cross-talk characteristic
100
(Typ. Ta=25 ˚C, λ=1.55 µm, SPOT= 20 µm, Pin=5 nW, VR=0.1 V)
250 µm
10
1
0.1
0.01
-250
-200
-150
-100
-50
10 pA
20
30
40
50
60
70
80
TEMPERATURE (˚C)
KIRDB0267EA
RELATIVE SENSITIVITY (%)
■ Dark current vs. temperature
(Typ. Ta=25 ˚C, f=1 MHz)
10 pF
0
POSITION X (µm)
KIRDB0269EA
2
KIRDB0266EA
KIRDB0268EA
InGaAs PIN photodiode array
G8909-01
■ Dimensional outline (unit: mm)
ANODE PAD
(PITCH: 400 µm, 40 ch,
150 × 150 µm BOND PADS)
22.0
0.4
(0.1)
0.5
CATHODE PAD
0.8
2.5
2.1
DETAIL a
(0.15)
10.5
0.70 ± 0.05 *
2.0
0.80
a
* The center of the active area
to the bottom of the substrate
KIRDA0158EA
Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies or omissions.
Specifications are subject to change without notice. No patent rights are granted to any of the circuits described herein. ©2003 Hamamatsu Photonics K.K.
HAMAMATSU PHOTONICS K.K., Solid State Division
1126-1 Ichino-cho, Hamamatsu City, 435-8558 Japan, Telephone: (81) 053-434-3311, Fax: (81) 053-434-5184, http://www.hamamatsu.com
U.S.A.: Hamamatsu Corporation: 360 Foothill Road, P.O.Box 6910, Bridgewater, N.J. 08807-0910, U.S.A., Telephone: (1) 908-231-0960, Fax: (1) 908-231-1218
Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-82211 Herrsching am Ammersee, Germany, Telephone: (49) 08152-3750, Fax: (49) 08152-2658
France: Hamamatsu Photonics France S.A.R.L.: 8, Rue du Saule Trapu, Parc du Moulin de Massy, 91882 Massy Cedex, France, Telephone: 33-(1) 69 53 71 00, Fax: 33-(1) 69 53 71 10
United Kingdom: Hamamatsu Photonics UK Limited: 2 Howard Court, 10 Tewin Road, Welwyn Garden City, Hertfordshire AL7 1BW, United Kingdom, Telephone: (44) 1707-294888, Fax: (44) 1707-325777
North Europe: Hamamatsu Photonics Norden AB: Smidesvägen 12, SE-171 41 Solna, Sweden, Telephone: (46) 8-509-031-00, Fax: (46) 8-509-031-01
Italy: Hamamatsu Photonics Italia S.R.L.: Strada della Moia, 1/E, 20020 Arese, (Milano), Italy, Telephone: (39) 02-935-81-733, Fax: (39) 02-935-81-741
Cat. No. KIRD1053E02
Feb. 2003 DN
3
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