Intersil HS-0507RH Radiation hardened single 16/differential 8 channel cmos analog multiplexer Datasheet

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8 Channel CMOS Analog Multiplexer
con -INTER
8
8
8
1®
Features
Description
• Low On Resistance 400Ω Max
These radiation hardened monolithic CMOS multiplexers
each include an array of sixteen analog switches, a digital
decode circuit for channel selection, voltage reference for
logic thresholds, and an ENABLE input for device selection
when several multiplexers are present.
• Wide Analog Signal Range ±15V
• TTL/CMOS Compatible 2.4V (Logic “1”)
• Access Time 1000ns Max
The Dielectric Isolation (DI) process used in fabrication of
these devices eliminates the problem of latchup. Also, DI
offers much lower substate leakage and parasitic
capacitance than conventional junction isolated CMOS. The
switching threshold for each digital input is established by an
internal +5V reference, providing a guaranteed minimum
2.4V for logic “1” and maximum 0.8V for logic “0”. This allows
direct interface without pullup resistors to signals from most
logic families: CMOS, TTL, DTL and some PMOS. For
protection against transient overvoltage, the digital inputs
include a series 200Ω resistor and diode clamp to each
supply. The HS-0506RH is a sixteen channel single-ended
multiplexer, and the HS-0507RH is an eight channel
differential version. If input overvoltage protection is needed,
the HS-0506RH or HS-0507RH multiplexers are
recommended. For further information see Application Notes
520 and 521.
• 44V Maximum Power Supply
• Break-Before-Make Switching
• No Latch-up
• Gamma Dose 1 x 104 RAD (Si)
Applications
• Data Acquisition Systems
• Precision Instrumentation
• Demultiplexing
• Selector Switch
Ordering Information
PART
NUMBER
TEMPERATURE
RANGE
o
o
PACKAGE
HS1-0506RH-Q
-55 C to 125 C
28 Lead CerDIP
HS1-0507RH-Q
-55oC
28 Lead CerDIP
to
125oC
Pinouts
VSUPPLY 1
28 OUT
HS-0507RH 28 LEAD CERAMIC DUAL-IN-LINE
FRIT SEAL PACKAGE (CerDIP)
MIL-STD-1835 GDIP1-T28
TOP VIEW
+VSUPPLY 1
28 OUT A
27 -VSUPPLY
NC 2
27 -VSUPPLY
NC 3
26 IN 8
NC 3
26 IN 8A
IN 16 4
25 IN 7
IN 8B 4
25 IN 7A
IN 15 5
24 IN 6
IN 7B 5
24 IN 6A
IN 14 6
23 IN 5
IN 6B 6
23 IN 5A
IN 13 7
22 IN 4
IN 5B 7
22 IN 4A
IN 12 8
21 IN 3
IN 4B 8
21 IN 3A
IN 11 9
20 IN 2
IN 3B 9
20 IN 2A
IN 10 10
19 IN 1
IN 2B 10
19 IN 1A
18 ENABLE
IN 1B 11
18 ENABLE
IN 9 11
OUT B 2
GND 12
17 ADDRESS A0
GND 12
17 ADDRESS A0
NC 13
16 ADDRESS A1
NC 13
16 ADDRESS A1
ADDRESS A3 14
15 ADDRESS A2
NC 14
15 ADDRESS A2
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a registered trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2002. All Rights Reserved
1
Spec Number
File Number
518860
4028.1
DB NA
HS-0506RH 28 LEAD CERAMIC DUAL-IN-LINE
FRIT SEAL PACKAGE (CerDIP)
MIL-STD-1835 GDIP1-T28
TOP VIEW
HS-0506RH, HS-0507RH
Functional Diagrams
HS-0506RH
HS-0507RH
IN1
IN1A
OUT
OUT A
IN8A
IN2
DECODER/
DRIVER
IN1B
OUT B
DECODER/
DRIVER
IN8B
IN16
5V
REF
5V
REF
LEVEL
SHIFT
†
†DIGITAL INPUT
PROTECTION
† †
†
†
LEVEL
SHIFT
† † †
†
A0 A1 A2
EN
†DIGITAL INPUT
PROTECTION
A0 A1 A2 A3 EN
HS-0507RH TRUTH TABLE
HS-0506RH TRUTH TABLE
A2
A1
A0
EN
“ON”
CHANNEL
PAIR
A3
A2
A1
A0
EN
“ON”
CHANNEL
X
X
X
X
L
NONE
X
X
X
L
NONE
L
L
L
L
H
1
L
L
L
H
1
L
L
L
H
H
2
L
L
H
H
2
L
L
H
L
H
3
L
H
L
H
3
L
L
H
H
H
4
L
H
H
H
4
L
H
L
L
H
5
H
L
L
H
5
L
H
L
H
H
6
H
L
H
H
6
L
H
H
L
H
7
H
H
L
H
7
L
H
H
H
H
8
H
H
H
H
8
H
L
L
L
H
9
H
L
L
H
H
10
H
L
H
L
H
11
H
L
H
H
H
12
H
H
L
L
H
13
H
H
L
H
H
14
H
H
H
L
H
15
H
H
H
H
H
16
Spec Number
2
518860
Specifications HS-0506RH, HS-0507RH
Absolute Maximum Ratings
Reliability Information
Voltage Between Supply Pins . . . . . . . . . . . . . . . . . . . . . . . . . +44V
+VSUPPLY to Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +22V
-VSUPPLY to Ground. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -25V
Analog Input Overvoltage:
+VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +VSUPPLY +2V
-VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -VSUPPLY -2V
Digital Input Overvoltage:
+VEN, +VA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +VSUPPLY +4V
-VEN, -VA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -VSUPPLY -4V
or 20mA, Whichever Occurs First
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . . 20mA
Peak Current, S or D
(Pulsed at 1ms, 10% Duty Cycle Maximum . . . . . . . . . . . . . 40mA
Storage Temperature Range . . . . . . . . . . . . . . . . . -65oC to +150oC
Lead Temperature (Soldering 10s). . . . . . . . . . . . . . . . . . . . +275oC
Thermal Resistance
θJA
θJC
CerDIP Package . . . . . . . . . . . . . . . . . . .
51oC/W
18oC/W
Maximum Package Power Dissipation at +125oC
CerDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.98W
If device power exceeds package dissipation capability, provide
heat sinking or derate linearly at the following rate:
CerDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19.6mW/oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Operating Conditions
Operating Temperature Range. . . . . . . . . . . . . . . . -55oC to +125oC
Operating Supply Voltage (±VSUPPLY). . . . . . . . . . . . . . . . . . ±15V
Analog Input Voltage (VS) . . . . . . . . . . . . . . . . . . . . . . . . VSUPPLY
Logic Low Level (VAL) . . . . . . . . . . . . . . . . . . . . . . . . . . . 0V to 0.8V
Logic High Level (VAH). . . . . . . . . . . . . . . . . . . . +4V to +VSUPPLY
Max RMS Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8mA
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device tested at +VSUPPLY = +15V. -VSUPPLY = -15V, VEN = 2.4V, Unless Otherwise Specified.
PARAMETERS
Input Leakage
Current
SYMBOL
IIH
GROUP A
SUBGROUPS
CONDITIONS
Measure Inputs Sequentially
GND All Unused Inputs
IIL
Leakage Current into
the Source Terminal of
an ‘‘OFF’’ Switch
+IS(OFF)
-IS(OFF)
Leakage Current into
the Drain Terminal of
an “OFF” Switch
+ID(OFF)
VS = +10V, VD = -10V,
VEN = 0.8V,
All Unused Inputs = -10V
VD = +10V,
VEN = 0.8V
All Unused
Inputs = -10V
VD = -10V,
VEN = 0.8V
All Unused
Inputs = +10V
+ID(ON)
VS = VD = +10V
All Unused
Inputs = 10V
VS = VD = -10V
All Unused
Inputs = +10V
MIN
MAX
UNITS
1.0
µA
1, 2, 3
+25oC, +125oC,
-55oC
-1.0
1.0
µA
1
+25oC
-10
+10
nA
-50
+50
nA
-10
+10
nA
-50
+50
nA
+125oC,
-55oC
+25oC
+125oC,
-55oC
HS-0506RH
HS-0507RH
1
+25oC
-10
+10
nA
HS-0506RH
2, 3
+125oC, -55oC
-300
+300
nA
2, 3
+125oC,
-200
+200
nA
-10
+10
nA
-55oC
+25o
HS-0506RH
HS-0507RH
1
HS-0506RH
2, 3
+125oC, -55oC
-300
+300
nA
2, 3
+125o
-200
+200
nA
-10
+10
nA
-300
+300
nA
C
o
C, -55 C
o
HS-0506RH
HS-0507RH
1
+25 C
HS-0506RH
2, 3
+125oC, -55oC
HS-0507RH
-ID(ON)
o
-1.0
2, 3
HS-0507RH
Leakage Current F
from an “ON” Driver
into the Switch (Drain)
o
+25 C, +125 C,
-55oC
1
HS-0507RH
-ID(OFF)
TEMPERATURE
1, 2, 3
2, 3
VS = -10V, VD = +10V,
VEN = 0.8V
All Unused Inputs = +10V
LIMITS
o
o
2, 3
+125 C, -55 C
-200
+200
nA
HS-0506RH
HS-0507RH
1
+25oC
-10
+10
nA
HS-0506RH
2, 3
+125oC, -55oC
-300
+300
nA
2, 3
+125oC,
-200
+200
nA
HS-0507RH
-55oC
Spec Number
3
518860
Specifications HS-0506RH, HS-0507RH
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device tested at +VSUPPLY = +15V. -VSUPPLY = -15V, VEN = 2.4V, Unless Otherwise Specified.
PARAMETERS
SYMBOL
GROUP A
SUBGROUPS
CONDITIONS
LIMITS
TEMPERATURE
MAX
UNITS
-
3.0
mA
Positive Supply
Current
I(+)
VA = 0V, VEN = 2.4V
1, 2, 3
Negative Supply
Current
I(-)
VA = 0V, VEN = 2.4V
1, 2, 3
+25oC, +125oC, 55oC
-1.0
-
mA
Standby Positive
Supply Current
+ISBY
VA = 0V, VEN = 0V
1, 2, 3
+25oC,+ 125oC, 55oC
-
3.0
mA
Standby Negative
Supply Current
-ISBY
VA = 0V, VEN = 0V
1, 2, 3
+25oC,+125oC, 55oC
-1.0
-
mA
1
+25oC
-
300
Ω
-
400
Ω
-
300
Ω
-
400
Ω
0.8
V
-
V
Switch “ON”
Resistance
+RDS1
VS = +10V, ID = -1mA
2, 3
-RDS1
VS = -10V, ID = +1mA
1
2, 3
Logic Level Voltage
+125oC,
MIN
+25oC,
55oC
+125
oC,
-
-55oC
+25oC
o
o
+125 C, -55 C
VAL
Note 1
1, 2, 3
+25oC,
+125oC,
VAH
Note 1
1, 2, 3
+25oC, +125oC, 55oC
55oC
2.4
NOTE:
1. Use for forcing conditions for all DC tests unless otherwise specified.
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device tested at +VSUPPLY = +15V. -VSUPPLY = -15V, VEN = 2.4V, Unless Otherwise Specified
PARAMETERS
SYMBOL
CONDITIONS
LIMITS
GROUP A
SUBGROUPS
TEMPERATURE
MIN
MAX
UNITS
Break-Before-Make Time
Delay
tD
RL = 200Ω
9
+25oC
25
-
ns
Propogation Delay
Times: Address Inputs to I/O
Channel Times
tA
RL = 10MΩ
9
+25oC
-
500
ns
10, 11
+125oC, -55oC
-
1000
ns
9
+25oC
-
500
ns
10, 11
+125oC, -55oC
-
1000
ns
9
+25oC
-
500
ns
10, 11
+125oC, -55oC
-
1000
ns
Enable to I/O
tON(EN)
tOFF(EN)
RL = 200Ω
RL = 200Ω
Spec Number
4
518860
Specifications HS-0506RH, HS-0507RH
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device tested at +VSUPPLY = +15V, -VSUPPLY = -15V, VEN = 2.4V, Unless Otherwise Specified
LIMITS
PARAMETERS
SYMBOL
CONDITIONS
NOTE
TEMPERATURE
MIN
MAX
UNITS
1
+25oC
-
12
pF
HS-0506RH
1
+25oC
-
90
pF
HS-0507RH
1
+25oC
-
50
pF
V+ = V- = 0V
f = 1MHz
1
+25oC
-
12
pF
1
+25oC
-
10
mV
1, 2
+25oC
-50
-
dB
Capacitance:
Address Input
CA
V+ = V- = 0V
f = 1MHz
Capacitance:
Output Switch
COS
V+ = V- = 0V
f = 1MHz
Capacitance:
Input Switch
CIS
Charge Transfer Error
VCTE
VS = GND
VGEN = 0V to 5V
Off Isolation
VISO
VEN = 0.8V,RL = 1kΩ ,
CL = 15pF,VS = 7 VRMS
f = 100kHz
NOTES:
1. The parameters listed in this table are controlled via design or process parameters and are not directly tested. These parameters are
characterized upon initial design release and upon design changes which would affect these characteristics.
2. Worst case isolation occurs on channel 8B due to proximity of the output pins.
TABLE 4A. POST 10K RAD DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device tested at +VSUPPLY = +15V. -VSUPPLY = -15V, VEN = 2.4V, Unless Otherwise Specified.
LIMITS
PARAMETERS
SYMBOL
Input Leakage Current
IIH
CONDITIONS
Measure Inputs Sequentially
GND All Unused Inputs
IIL
Leakage Current into
the Source Terminal of
an ‘‘OFF’’ Switch
Leakage Current into
the Drain Terminal of an
“OFF” Switch
MAX
UNITS
+25oC
-1.0
1.0
µA
+25oC
-1.0
1.0
µA
VS = +10V, VD = -10V, VEN = 0.8V
All Unused Inputs = -10V
+25oC
-50
+50
nA
-IS(OFF)
VS = -10V, VD = +10V, VEN = 0.8V
All Unused Inputs = +10V
+25oC
-50
+50
nA
+ID(OFF)
VD = +10V, VEN = 0.8V
All Unused Inputs = -10V
HS-0506RH
+25oC
-300
+300
nA
HS-0507RH
+25oC
-200
+200
nA
HS-0506RH
+25oC
-300
+300
nA
HS-0507RH
+25oC
-200
+200
nA
HS-0506RH
+25oC
-300
+300
nA
HS-0507RH
+25oC
-200
+200
nA
HS-0506RH
+25oC
-300
+300
nA
HS-0507RH
+25oC
-200
+200
nA
+25oC
-
3.0
mA
+ID(ON)
-ID(ON)
Positive Supply Current
MIN
+IS(OFF)
-ID(OFF)
Leakage Current from
an “ON” Driver into the
Switch (Drain)
TEMPERATURE
I(+)
VD = -10V, VEN = 0.8V
All Unused Inputs = +10V
VS = VD = +10V
All Unused Inputs = -10V
VS = VD = -10V
All Unused Inputs = +10V
VA = 0V, VEN = 2.4V
Spec Number
5
518860
Specifications HS-0506RH, HS-0507RH
TABLE 4A. POST 10K RAD DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device tested at +VSUPPLY = +15V. -VSUPPLY = -15V, VEN = 2.4V, Unless Otherwise Specified.
LIMITS
PARAMETERS
SYMBOL
Negative Supply Current
I(-)
CONDITIONS
TEMPERATURE
MIN
MAX
UNITS
VA = 0V, VEN = 2.4V
+25oC
-1.0
-
mA
Standby Positive
Supply Current
+ISBY
VA = 0V, VEN = 0V
+25oC
-
3.0
mA
Standby Negative
Supply Current
-ISBY
VA = 0V, VEN = 0V
+25oC
-1.0
-
mA
+RDS1
VS = +10V, ID = +1mA
+25oC
-
400
Ω
-RDS1
VS = -10V, ID = -1mA
+25oC
-
400
Ω
VAL
Note 1
+25oC
-
0.8
V
VAH
Note 1
+25oC
2.4
-
V
Switch “ON” Resistance
Logic Level Voltage
NOTE:
1. Use for forcing conditions for all DC tests unless otherwise specified.
TABLE 4B. POST 10K RAD AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device tested at +VSUPPLY = +15V. -VSUPPLY = -15V, VEN = 2.4V, Unless Otherwise Specified.
LIMITS
PARAMETERS
Propagation Delay Times: Address
Inputs to I/O Channel Times
Enable to I/O
SYMBOL
CONDITIONS
TEMPERATURE
MIN
MAX
UNITS
tA
RL = 10MΩ
+25oC
-
1000
ns
tON(EN)
RL = 200Ω
+25oC
-
1000
ns
tOFF(EN)
RL = 200Ω
+25oC
-
1000
ns
Spec Number
6
518860
Specifications HS-0506RH, HS-0507RH
TABLE 5. BURN-IN DELTA PARAMETERS (TA = +25oC)
Device tested Per Table 1.
PARAMETERS
SYMBOL
DELTA LIMITS
IIH, IIL
±100nA
+IS(OFF)
±10nA
-IS(OFF)
±10nA
+ID(OFF)
±10nA
-ID(OFF)
±10nA
+ID(ON)
±10nA
-ID(ON)
±10nA
R(DS)
±50Ω
R(DS)
±50Ω
Positive Supply Current
I(+)
± 300µA
Negative Supply Current
I(-)
±100µA
Positive Standby Supply Current
+ISBY
± 300µA
Negative Standby Supply Current
-ISBY
±100µA
Input Leakage Current
Leakage Current into the Source Terminal of an ‘‘OFF’’ Switch
Leakage Current into the Drain Terminal of an ‘‘OFF’’ Switch
Leakage Current from an ‘‘ON’’ Driver into the Switch (Drain)
Switch On Resistance
TABLE 6. APPLICABLE SUBGROUPS
GROUP A SUBGROUPS
CONFORMANCE GROUPS
MIL-STD-883 METHOD
TESTED FOR -Q
RECORDED FOR -Q
Initial Test
100% 5004
1, 9
1 (Note 2)
Interim Test
100% 5004
1, 9, ∆
1, ∆ (Note 2)
PDA
100% 5004
1, ∆
−
Final Test
100% 5004
2, 3, 10, 11
-
Group A (Note 1)
Sample 5005
1, 2, 3, 9, 10, 11
-
Subgroup B5
Sample 5005
1, 2, 3, ∆
1, 2, 3, ∆ (Note 2)
Subgroup B6
Sample 5005
1
-
Group D
Sample 5005
1
-
Group E, Subgroup 2
Sample 5005
1
-
NOTES:
1. Alternate Group A testing in accordance with MIL-STD-883 Method 5005 may be exercised.
2. Table 5 parameters only.
Spec Number
7
518860
HS-0506RH, HS-0507RH
Intersil Space Level Product Flow -Q
Wafer Lot Acceptance (All Lots) Method 5007
(Includes SEM) (Note 1)
100% Interim Electrical Test 1 (T1)
GAMMA Radiation Verification (Each Wafer) Method 1019,
4 Samples/Wafer, 0 Rejects
100% PDA 1, Method 5004 (Note 2)
100% Delta Calculation (T0-T1)
100% Nondestructive Bond Pull, Method 2023
100% Dynamic Burn-In, Condition D, 240 hrs., +125oC or
Equivalent, Method 1015
Sample - Wire Bond Pull Monitor, Method 2011
100% Interim Electrical Test 2 (T2)
Sample - Die Shear Monitor, Method 2019 or 2027
100% Delta Calculation (T0-T2)
100% Internal Visual Inspection, Method 2010, Condition A
100% PDA 2, Method 5004 (Note 2)
100% Temperature Cycle, Method 1010, Condition C,
10 Cycles
100% Final Electrical Test
100% Constant Acceleration, Method 2001, Condition per
Method 5004
100% Radiographic (X-Ray), Method 2012 (Note 3)
100% Fine/Gross Leak, Method 1014
100% External Visual, Method 2009
100% PIND, Method 2020, Condition A
Sample - Group A, Method 5005 (Note 4)
100% External Visual
Sample - Group B, Method 5005 (Note 5)
100% Serialization
Sample - Group D, Method 5005 (Notes 5 and 6)
100% Initial Electrical Test (T0)
100% Data Package Generation (Note 7)
100% Static Burn-In, Condition A or B, 72 hrs. min., +125oC
min., Method 1015
NOTES:
1. Modified SEM Inspection, not compliant to MIL-STD-883, Method 2018. This device does not meet the Class S minimum metal step
coverage of 50%. The metal does meet the current density requirement of <2 E5 A/cm2. Data provided upon request.
2. Failures from subgroup 1 and deltas are used for calculating PDA. The maximum allowable PDA = 5%.
3. Radiographic (X-Ray) inspection may be performed at any point after serialization as allowed by Method 5004.
4. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005.
5. Group B and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include
separate line items for Group B test, Group B samples, Group D test and Group D samples.
6. Group D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When required, the
P.O. should include a separate line item for Group D generic data. Generic data is not guaranteed to be available and is therefore not
available in all cases.
7. Data Package Contents:
• Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number,
Quantity).
• Wafer Lot Acceptance Report (Method 5007). Includes reproductions of SEM photos with percent of step coverage.
• GAMMA Radiation Report. Contains Cover page, disposition, Rad Dose, Lot Number, Test Package used, Specification Numbers, Test
equipment, etc. Radiation Read and Record data on file at Intersil.
• X-Ray report and film. Includes penetrometer measurements.
• Screening, Electrical, and Group A attributes (Screening attributes begin after package seal).
• Lot Serial Number Sheet (Good units serial number and lot number).
• Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test.
• Group B and D attributes and/or Generic data is included when required by the P.O.
• The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed
by an authorized Quality Representative.
Spec Number
8
518860
HS-0506RH, HS-0507RH
Test Circuits
INPUT LEAKAGE CURRENT
V+
GND
ID(OFF)
V-
V+
OUT
CH 1
CH 2
CH 3
GND
IS(OFF)
V-
V+
OUT
CH 1
CH 2
CH 3
AN
CH n
EN
A0
AN
EN
A0
VS
IIL
IIH
IIL
IIH
VD
VA = VEN = 0.8V
TRUTH TABLE
VAL = 0.8V; VAH = 2.4V
SUPPLY CURRENTS
V-
V+
OUT
CH 1
CH 2
CH 3
EN
0.8V
IIL
IIH
ID(ON)
GND
AN
VS
VD
VAL = 0.8V; VAH = 2.4V
UNUSED INPUTS TO GND
V+
OUT
IS
(OFF)
CH n
A0
V-
CH 1
CH 2
CH 3
ID
(OFF)
CH n
GND
ID
(ON)
GND
CHARGE TRANSFER ERROR
V-
V+
I(+)
+SBY
I(-)
-SBY
CH 1
CH 2
CH 3
OUT
GND
V-
CH n
TEST
POINT
OUT
CH 1
CH 2
CH 3
0.01µF
CH n
A0
AN
EN
A0
VS
2.4V
A0
TRUTH TABLE
VAL = 0.8V
VAH = 2.4V
AN
EN
GND
VA = 0V VEN = 2.4V
VEN = 0V
VGEN
OFF CHANNEL ISOLATION
V-
V+
OUT
CH 1
CH 2
CH 3
CH n
VOUT
OUT
1KΩ
15µF(1)
CH 4
CH 5
CH 6
CH 7
CH n
ID
AN
GND
CH 1
CH 2
CH 3
VM RDN = VM
ID
A0
EN
5.0V
RDS
V+
AN
CH n
VD
EN
A0
VS
AN
(1) INCLUDES ALL
FACTORS AND SCOPE
OR VOLTMETER
CAPACITANCE
EN
VS
2.4V
0.8V
TRUTH TABLE
VAL = 0.8V; VAH = 2.4V
Spec Number
9
518860
HS-0506RH, HS-0507RH
Switching Waveforms
+15V
3.5V
ADDRESS
DRIVE (VA)
0V
IN 1
A2
IN 2
HS-0506RH † THRU
IN 15
A1
IN 16
A0
VA
50%
OUTPUT
50%
+5V
+V
A3
+3.5V
CH 1 ON
GND
-V
tOPEN
CH 16 ON
VOUT
OUT
EN
VA INPUT
2V/DIV.
OUTPUT
1V/DIV.
200Ω
-15V
100ns/DIV
† SIMILAR CONNECTION FOR HS-0507RH
FIGURE 1. BREAK-BEFORE-MAKE DELAY (tOPEN)
+15V
3.5V
50%
ADDRESS
DRIVE (VA)
90%
OUTPUT
5V/DIV.
OUT
EN
+3.5V
CH 1 ON
±10V PROBE
IN 16
A0
OUTPUT
VA INPUT
2V/DIV.
±10V
IN 1
A2
IN 2
HS-0506RH † THRU
IN
15
A1
0V
+10V
+V
A3
GND
10MΩ
-V
-10V
14pF
tA
CH 16 ON
-15V
200ns/DIV
† SIMILAR CONNECTION FOR HS-0507RH
FIGURE 2. ACCESS TIME vs LOGIC LEVEL (HIGH)
+15V
3.5V
ENABLE DRIVE
+V
A3
50%
A2
0V
OUTPUT A
90%
90%
tON(EN)
tOFF
(EN)
-VA
IN 1
IN 2
THRU
IN
16
A1
A0 HS-0506RH †
OUT
EN
GND
-V
+10V
ENABLE
DRIVE
2V/DIV.
VOUT
200Ω
CH 1 ON
OUTPUT
2V/DIV.
CH 1 OFF
-15V
† SIMILAR CONNECTION FOR HS-0507RH
100ns/DIV
FIGURE 3. ENABLE DELAY tON(EN), tOFF 9EN)
Spec Number
10
518860
HS-0506RH, HS-0507RH
Burn-Circuits
V1
C1 D1
R1
F3
1
28
2
27
3
26
4
5
R2
V2
V2
1
28
2
27
3
26
25
4
25
24
5
24
6
23
6
23
7
22
7
22
8
21
8
21
9
20
9
20
10
19
10
19
11
18
F4
11
18
12
17
F0
12
17
13
16
F1
13
16
14
15
F2
14
15
D2
C1 D1
C2
R1
V1
R2
V3
D2 C2
DYNAMIC
STATIC
V1 = +15V minimum, +16V maximum
V2 = -15V maximum, -16V minimum
R1, R2 = 10kΩ, ± 5%, 1/4 or 1/2W (per socket)
C1, C2 = 0.01µF minimum (per socket) or 0.1µF minimum (per row)
D1, D2 = 1N4002 or equivalent (per board)
F0 = 100kHz, 10%; F1 = F0/2; F2 = F1/2; F3 = F2/2; F4 = F3/2
40% - 60% duty cycle; VIL = 0.8V maximum;
VIH = 4.0V minimum
V1 = +5V minimum, +6V maximum
V2 = +15V minimum, +16V maximum
V3 = -15V maximum, -16V minimum
R1, R2 = 10kΩ, ± 5%, 1/4 or 1/2W (per socket)
C1, C2 =0.01µF minimum (per socket) or 0.1µF minimum (per row)
D1, D2 = 1N4002 or equivalent (per board)
NOTES:
1. The above test circuits are utilized for all package types.
2. The dynamic test circuit is utilized for all life testing.
Irradiation Circuit
+15V
10kΩ
1
28
2
27
NC
3
26
+1V
4
25
5
24
6
23
7
22
8
21
9
20
10
19
11
18
12
17
13
16
14
15
-15V
10kΩ
+5V
Spec Number
11
518860
HS-0506RH, HS-0507RH
Schematic Diagrams
+V
P
P
P
P
A0 OR A0
A1 OR A1
P
P
P
N
N
N
N
N
A2 OR A2
TO P-CHANNEL
DEVICE OF
THE SWITCH
TO N-CHANNEL
DEVICE OF
THE SWITCH
N
A3 OR A3 (HS-0506RH ONLY)
N
ENABLE
V-
FIGURE 4. ADDRESS DECODER
+V
P3
P5
P1
A
+V
P4
N1
P6
P7
P8
P9
P10
N6
N7
N8
N9
N10
D1
VL
D2
VR
P2
200Ω
N4
-V
AIN
A
N5
N2
N3
-V
ALL N-CHANEL BODIES TO VALL P-CHANNEL BODIES TO V+
UNLESS OTHERWISE INDICATED
FIGURE 5. ADDRESS INPUT BUFFER LEVER SHIFTER
Spec Number
12
518860
HS-0506RH, HS-0507RH
Schematic Diagrams (Continued)
V+
P15
Q2P Q3P
Q1P
Q4P
Q5N
Q6N
Q8N
R2
VL
N12
Q7P
Q11P
D3
Q10N
VR
R3
Q9P
P16
N13
N14
Q12N
N15
V-
GND
FIGURE 6. TTL REFERENCE CIRCUIT
FROM DECODE
N18
V+
N17
N19
IN
OUT
P17
V-
P18
FROM DECODE
FIGURE 7. MULTIPLEX SWITCH
Spec Number
13
518860
HS-0506RH, HS-0507RH
Metallization Topology
DIE DIMENSIONS:
82 x 129 x 19 mils
METALLIZATION:
Type: Al
Thickness: 16kÅ ± 2kÅ
GLASSIVATION:
Type: Nitride
Thickness: 7kÅ ± 0.7kÅ
WORST CASE CURRENT DENSITY:
< 2.0 x 105 A/cm2
TRANSISTOR COUNT:
HS-0506RH
421
HS-0507RH
421
PROCESS: CMOS-DI
Metallization Mask Layout
HS-0506RH
HS-0507RH
NOTE: Pad numbers correspond to DIP pin numbers only.
Spec Number
14
518860
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