IDC06S60CE 2nd generation thinQ!TM SiC Schottky Diode Features: Applications: • • • • • • • Revolutionary semiconductor material Silicon Carbide Switching behavior benchmark No reverse recovery No temperature influence on the switching behavior No forward recovery High surge current capability A SMPS, PFC, snubber C Chip Type VBR IF Die Size Package IDC06S60CE 600V 6A 1.45 x 1.354 mm2 sawn on foil Mechanical Parameter Raster size Anode pad size 1.45x 1.354 1.213 x 1.117 mm2 Area total 1.96 Thickness 355 µm Wafer size 100 mm Max. possible chips per wafer 3449 Passivation frontside Photoimide Anode metal 3200 nm Al Cathode metal Ni Ag –system suitable for epoxy and soft solder die bonding Die bond Electrically conductive glue or solder Wire bond Al, ≤ 350µm Reject ink dot size ∅ ≥ 0.3 mm Recommended storage environment Store in original container, in dry nitrogen, in dark environment, < 6 month at an ambient temperature of 23°C Edited by INFINEON Technologies, AIM IMM, Edition 1.1, 27.01.2009 IDC06S60CE Maximum Ratings Parameter Symbol Condition Value Repetitive peak reverse voltage VRRM Tvj = 25 °C 600 DC blocking voltage VDC Continuous forward current limited by 6 IF,SM TC =25°C , tP =10 ms 49 IF,RM TC = 100°C , Tvj = 1 50°C , D=0 . 1 28 Non-repetitive peak forward current IF,max TC =25°C , t p =1 0µs 210 Operating junction and storage temperature Tvj , Tstg Surge non repetitive forward current sine halfwave Repetitive peak forward current limited by Tvjmax V 600 Tvj < 150°C Tvjmax IF Unit A -55...+175 °C Static Characteristics (tested on wafer) Parameter Symbol Conditions Value min. Typ. max. Unit Reverse current IR V R =60 0 V Tvj = 2 5°C 0.7 80 µA Diode forward voltage VF I F =6 A Tvj = 2 5°C 1.5 1.7 V Dynamic Characteristics, at Tvj = 25 °C, unless otherwise specified, tested at component Parameter Total capacitive charge Symbol QC Conditions IF <=IF,max Tvj = 1 50 °C Value min. Typ. max. 15 Unit nC di/dt=200A/µs Switching time 1) Total capacitance tc C VR=400V f=1MHz Tvj = 1 50 °C <10 V R =1 V 280 V R =30 0 V 35 V R =60 0 V 35 1) ns pF tc is the time constant for the capacitive displacement current waveform (independent from Tj, ILOAD and di/dt), different from trr which is dependent on Tvj, ILOAD and di/dt. No reverse recovery time constant trr due to absence of minority carrier injection Edited by INFINEON Technologies, AIM IMM, Edition 1.1, 27.01.2009 IDC06S60CE Chip drawing A A: Anode pad Edited by INFINEON Technologies, AIM IMM, Edition 1.1, 27.01.2009 IDC06S60CE Description AQL 0,65 for visual inspection according to failure catalog Electrostatic Discharge Sensitive Device according to MIL-STD 883 Published by Infineon Technologies AG 81726 Munich, Germany © 2009 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Edited by INFINEON Technologies, AIM IMM, Edition 1.1, 27.01.2009