IDT IDT74FCT841BEB High-performance cmos bus interface latch Datasheet


IDT54/74FCT841A/B/C
HIGH-PERFORMANCE
CMOS BUS INTERFACE
LATCHES
Integrated Device Technology, Inc.
FEATURES:
DESCRIPTION:
• Equivalent to AMD’s Am29841-46 bipolar registers in
pinout/function, speed and output drive over full temperature and voltage supply extremes
• IDT54/74FCT841A equivalent to FAST speed
• IDT54/74FCT841B 25% faster than FAST
• IDT54/74FCT841C 40% faster than FAST
• Buffered common latch enable, clear and preset inputs
• IOL = 48mA (commercial) and 32mA (military)
• Clamp diodes on all inputs for ringing suppression
• CMOS power levels (1mW typ. static)
• TTL input and output level compatible
• CMOS output level compatible
• Substantially lower input current levels than AMD’s
bipolar Am29800 series (5µA max.)
• Product available in Radiation Tolerant and Radiation
Enhanced versions
• Military product compliant to MIL-STD-883, Class B
The IDT54/74FCT800 series is built using an advanced
dual metal CMOS technology.
The IDT54/74FCT840 series bus interface latches are
designed to eliminate the extra packages required to buffer
existing latches and provide extra data width for wider address/
data paths or buses carrying parity. The IDT54/74FCT841 is
a buffered, 10-bit wide version of the popular ‘373 function.
All of the IDT54/74FCT800 high-performance interface
family are designed for high-capacitance load drive capability,
while providing low-capacitance bus loading at both inputs
and outputs. All inputs have clamp diodes and all outputs are
designed for low-capacitance bus loading in the high-impedance state.
FUNCTIONAL BLOCK DIAGRAM
D0
DN
PRE
D P
LE Q
D P
LE Q
CLR
CLR
CLR
LE
OE
Y0
YN
2607 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FAST is a trademark of National Semiconductor Co.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
1994 Integrated Device Technology, Inc.
7.22
APRIL 1994
DSC-4603/2
1
IDT54/74FCT841A/B/C
HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES
MILITARY AND COMMERCIAL TEMPERATURE RANGES
1
24
2
23
22
3
4
5
6
7
8
P24-1
D24-1
E24-1
&
SO24-2
21
20
19
18
17
9
16
10
15
11
14
12
13
INDEX
VCC
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
Y9
LE
4
D2
D3
D4
NC
D5
D6
D7
3
5
2
1
28 27 26
25
24
6
7
23
8
22
L28-1
9
21
10
20
19
11
Y2
Y3
Y4
NC
Y5
Y6
Y7
12 13 14 15 16 17 18
D8
D9
GND
NC
LE
Y9
Y8
OE
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
GND
D1
D0
OE
NC
VCC
Y0
Y1
PIN CONFIGURATIONS
LCC
TOP VIEW
DIP/CERPACK/SOIC
TOP VIEW
2607 drw 02
FUNCTION TABLE(1)
PIN DESCRIPTION
Name
CLR
I/O
I
DI
I
LE
I
YI
O
OE
I
PRE
I
2607 drw 03
Description
When CLR is LOW, the outputs are
LOW if OE is LOW. When CLR is HIGH,
data can be entered into the latch.
The latch data inputs.
Inputs
CLR PRE OE
The latch enable input. The latches are
transparent when LE is HIGH. Input
data is latched on the HIGH-to-LOW
transition.
The 3-state latch outputs.
The output enable control. When OE is
LOW, the outputs are enabled. When
OE is HIGH, the outputs (Y I) are in the
high-impedance (off) state.
Preset line. When PRE is LOW, the
outputs are HIGH if OE is LOW. Preset
overrides CLR.
2607 tbl 01
LE
DI
Inter-
Out-
nal
QI
puts
YI
Function
H
H
H
X
X
X
Z
High Z
H
H
H
H
L
L
Z
High Z
H
H
H
H
H
H
Z
High Z
H
H
H
L
X
NC
Z
Latched (High Z)
H
H
L
H
L
L
L
Transparent
H
H
L
H
H
H
H
Transparent
H
H
L
L
X
NC
NC
H
L
L
X
X
H
H
Preset
L
H
L
X
X
L
L
Clear
Latched
L
L
L
X
X
H
H
Preset
L
H
H
L
X
L
Z
Latched (High Z)
H
L
H
L
X
H
Z
Latched (High Z)
NOTE:
1. H = HIGH, L = LOW, X = Don’t Care, NC = No Change,
Z = High Impedance
7.22
2607 tbl 02
2
IDT54/74FCT841A/B/C
HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Rating
(2)
VTERM
Terminal Voltage
with Respect to
GND
VTERM(3) Terminal Voltage
with Respect to
GND
TA
Operating
Temperature
TBIAS
Temperature
Under Bias
TSTG
Storage
Temperature
PT
Power Dissipation
I OUT
Commercial
–0.5 to +7.0
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Military
Unit
–0.5 to +7.0
V
Symbol
CIN
COUT
–0.5 to VCC
–0.5 to VCC
V
0 to +70
–55 to +125
°C
–55 to +125
–65 to +135
°C
–55 to +125
–65 to +150
°C
0.5
0.5
W
120
120
mA
DC Output
Current
Parameter
Input
Capacitance
Output
Capacitance
(1)
Conditions
VIN = 0V
Typ.
6
Max.
10
Unit
pF
8
12
pF
VOUT = 0V
NOTE:
1. This parameter is measured at characterization but not tested.
2607 tbl 04
NOTE:
2607 tbl 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage
may exceed VCC by +0.5V unless otherwise noted.
2. Input and VCC terminals only.
3. Outputs and I/O terminals only.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Parameter
Input HIGH Level
Test Conditions(1)
Guaranteed Logic HIGH Level
VIL
Input LOW Level
II H
Input HIGH Current
Symbol
VIH
II L
IOZH
Min.
2.0
Typ.(2)
—
Max.
—
Unit
V
Guaranteed Logic LOW Level
—
—
0.8
V
VCC = Max.
—
—
5
µA
VI = VCC
Input LOW Current
Off State (High Impedance)
VCC = Max.
Output Current
IOZL
VI = 2.7V
—
—
5(4)
VI = 0.5V
—
—
–5(4)
VI = GND
—
—
–5
VO = VCC
—
—
10
VO = 2.7V
—
—
10(4)
VO = 0.5V
—
—
–10(4)
VO = GND
VIK
Clamp Diode Voltage
VCC = Min., IN = –18mA
Max.(3) ,
IOS
Short Circuit Current
VCC =
VOH
Output HIGH Voltage
VCC = 3V, VIN = VLC or VHC, IOH = –32µA
VOL
Output LOW Voltage
VO = GND
—
—
–10
—
–0.7
–1.2
V
–75
–120
—
mA
V
VHC
VCC
—
VCC = Min.
IOH = –300µA
VHC
VCC
—
VIN = VIH or VIL
IOH = –15mA MIL.
2.4
4.3
—
IOH = –24mA COM'L.
2.4
4.3
—
—
GND
VLC
VCC = 3V, VIN = VLC or VHC, IOL = 300µA
VCC = Min.
IOL = 300µA
—
GND
VLC(4)
VIN = VIH or VIL
IOL = 32mA MIL.
—
0.3
0.5
IOL = 48mA COM'L.
—
0.3
0.5
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
7.22
µA
V
2607 tbl 05
3
IDT54/74FCT841A/B/C
HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
VLC = 0.2V; VHC = VCC – 0.2V
Symbol
ICC
∆ICC
ICCD
IC
Parameter
Quiescent Power Supply Current
Quiescent Power Supply Current
TTL Inputs HIGH
Dynamic Power Supply
Current(4)
Total Power Supply Current (6)
Test Conditions(1)
VCC = Max.
VIN ≥ VHC; V IN ≤ V LC
VCC = Max.
VIN = 3.4V(3)
VCC = Max.
Outputs Open
OE = GND
LE = VCC
One Input Toggling
50% Duty Cycle
VCC = Max.
Outputs Open
fi = 10MHz
50% Duty Cycle
OE = GND
LE = VCC
One Bit Toggling
VCC = Max.
Outputs Open
fi = 2.5MHz
50% Duty Cycle
OE = GND
LE = VCC
Eight Bits Toggling
Min.
Typ.(2)
Max.
Unit
—
0.2
1.5
mA
—
0.5
2.0
mA
VIN ≥ VHC
VIN ≤ VLC
—
0.15
0.25
mA/
MHz
VIN ≥ VHC
VIN ≤ VLC
(FCT)
—
1.7
4.0
mA
VIN = 3.4V
VIN = GND
—
2.0
5.0
VIN ≥ VHC
VIN ≤ VLC
(FCT)
—
3.2
6.5 (5)
VIN = 3.4V
VIN = GND
—
5.2
14.5 (5)
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V); all other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2 + fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Input Frequency
Ni = Number of Inputs at fi
All currents are in milliamps and all frequencies are in megahertz.
7.22
2607 tbl 06
4
IDT54/74FCT841A/B/C
HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES
MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT841A
Com'l.
Symbol
tPLH
tPHL
tPLH
tPHL
tPLH
Parameter
CL = 50pF
Propagation Delay
DI to YI (LE = HIGH)
RL = 500Ω
CL = 300pF(4)
RL = 500Ω
CL = 50pF
Propagation Delay
LE to YI
RL = 500Ω
CL = 300pF(4)
tPHZ
tPLZ
Propagation Delay, PRE to YI
Output Enable Time OE to YI
Output Disable Time OE to Y I
Data to LE Set-up Time
tH
Data to LE Hold Time
tW
LE Pulse Width (3)
tW
tW
tREM
tREM
Com'l.
Mil.
HIGH
1.5
9.0
1.5 10.0 1.5
6.5
1.5
7.5
1.5
5.5
1.5
6.3
Unit
ns
1.5 13.0 1.5 15.0 1.5 13.0 1.5 15.0 1.5 13.0 1.5 15.0
1.5 12.0 1.5 13.0 1.5
8.0
1.5 10.5 1.5
6.4
1.5
6.8
ns
1.5 16.0 1.5 20.0 1.5 15.5 1.5 18.0 1.5 15.0 1.5 16.0
1.5 10.0 1.5
7.0
1.5
RL = 500Ω
1.5 14.0 1.5 17.0 1.5 10.0 1.5 13.0 1.5
9.0
1.5 12.0
1.5 13.0 1.5 14.0 1.5 10.0 1.5 11.0 1.5
9.0
1.5 10.0
1.5 14.0 1.5 17.0 1.5 10.0 1.5 10.0 1.5
9.0
1.5
8.0
9.0
ns
ns
9.0
CL = 50pF
1.5 11.5 1.5 13.0 1.5 8.0 1.5 8.5 1.5 6.5 1.5 7.3
RL = 500Ω
CL = 300pF(4) 1.5 23.0 1.5 25.0 1.5 14.0 1.5 15.0 1.5 12.0 1.5 13.0
RL = 500Ω
CL = 5pF(4) 1.5 7.0 1.5 9.0 1.5 6.0 1.5 6.5 1.5 5.7 1.5 6.0
RL = 500Ω
CL = 50pF
1.5 8.0 1.5 10.0 1.5 7.0 1.5 7.5 1.5 6.0 1.5 6.3
RL = 500Ω
CL = 50pF
2.5 — 2.5 — 2.5 — 2.5 — 2.5 — 2.5 —
RL = 500Ω
PRE
LOW
CLR Pulse Width(3)
LOW
Recovery Time PRE to LE
Recovery Time CLR to LE
Pulse Width(3)
Mil.
1.5 12.0 1.5 14.0 1.5
Propagation Delay, CLR to YI
tSU
Com'l.
RL = 500Ω
CL = 50pF
tPLH
tPZH
tPZL
Mil.
FCT841C
Conditions(1) Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max.
tPHL
tPHL
FCT841B
ns
ns
ns
2.5
—
3.0
—
2.5
—
2.5
—
2.5
—
2.5
—
ns
4.0
—
5.0
—
4.0
—
4.0
—
4.0
—
4.0
—
ns
5.0
—
7.0
—
4.0
—
4.0
—
4.0
—
4.0
—
ns
4.0
—
5.0
—
4.0
—
4.0
—
4.0
—
4.0
—
ns
4.0
—
4.0
—
4.0
—
4.0
—
4.0
—
4.0
—
ns
3.0
—
3.0
—
3.0
—
3.0
—
3.0
—
3.0
—
ns
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. These parameters are guaranteed but not tested.
4. These conditions are guaranteed but not tested.
2607 tbl 07
7.22
5
IDT54/74FCT841A/B/C
HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
SWITCH POSITION
TEST CIRCUITS FOR ALL OUTPUTS
V CC
500Ω
VOUT
VIN
Pulse
Generator
D.U.T.
50pF
RT
Switch
Open Drain
Disable Low
Enable Low
Closed
All Other Tests
Open
DEFINITIONS:
2607 tbl 08
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse
Generator.
500Ω
CL
SET-UP, HOLD AND RELEASE TIMES
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
Test
7.0V
tH
tSU
tREM
tSU
PULSE WIDTH
3V
1.5V
0V
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
1.5V
tW
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
3V
1.5V
0V
tH
PROPAGATION DELAY
ENABLE AND DISABLE TIMES
ENABLE
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
OPPOSITE PHASE
INPUT TRANSITION
tPHL
3V
1.5V
0V
VOH
1.5V
VOL
DISABLE
3V
CONTROL
INPUT
tPZL
OUTPUT
NORMALLY
LOW
3V
1.5V
0V
SWITCH
CLOSED
tPLZ
3.5V
1.5V
tPZH
OUTPUT
NORMALLY
HIGH
SWITCH
OPEN
1.5V
0V
3.5V
0.3V
VOL
tPHZ
0.3V
1.5V
0V
VOH
0V
2607 drw 04
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control DisableHIGH
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns
7.22
6
IDT54/74FCT841A/B/C
HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
XXXX
IDT
XX
FCT
Temp. Range
Device Type
X
Package
X
Process
Blank
B
Commercial
MIL-STD-883, Class B
P
D
E
L
SO
Plastic DIP
CERDIP
CERPACK
Leadless Chip Carrier
Small Outline IC
841A
841B
841C
10-Bit Non-Inverting Latch
54
74
–55°C to +125°C
0°C to +70°C
2607 drw 05
7.22
7
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