Seme LAB IRFM350 N-channel power mosfet Datasheet

IRFM350
MECHANICAL DATA
Dimensions in mm (inches)
13.59 (0.535)
13.84 (0.545)
N–CHANNEL
POWER MOSFET
6.32 (0.249)
6.60 (0.260)
VDSS
ID(cont)
RDS(on)
1.02 (0.040)
1.27 (0.050)
30.35 (1.195)
31.40 (1.235)
16.89 (0.665)
17.40 (0.685)
13.59 (0.535)
13.84 (0.545)
20.07 (0.790)
20.32 (0.800)
3.53 (0.139)
Dia.
3.78 (0.149)
1
2
400V
14A
0.315W
FEATURES
• N–CHANNEL MOSFET
3
• HIGH VOLTAGE
• INTEGRAL PROTECTION DIODE
• HERMETIC ISOLATED TO-254 PACKAGE
0.89 (0.035)
1.14 (0.045)
3.81 (0.150)
BSC
3.81 (0.150)
BSC
• CERAMIC SURFACE MOUNT PACKAGE
OPTION
TO–254AA – Isolated Metal Package
Pin 1 – Drain
Pin 2 – Source
Pin 3 – Gate
ABSOLUTE MAXIMUM RATINGS (TC = 25°C unless otherwise stated)
VGS
Gate – Source Voltage
ID
Continuous Drain Current
@ VGS = 10V , TC = 25°C
@ VGS = 10V , TC = 100°C
IDM
Pulsed Drain Current
PD
Max. Power Dissipation
@ TC = 25°C
Linear Derating Factor
IL
Avalanche Current , Clamped 1
dv / dt
Peak Diode Recovery 2
RqJC
RqJA
Thermal Resistance Junction – Case
RqCS
TJ , TSTG
Thermal Resistance Case – Sink
TL
Lead Temperature (1.6mm from case for 10s)
1)
2)
Thermal Resistance Junction – Ambient
Operating Junction and Storage Temperature Range
±20V
14A
9.0A
56A
150W
1.2W / °C
14A
4V / ns
0.83°C / W
48°C / W
0.21°C / W typ.
–55 to 150°C
300°C
VDD = 50V , Starting TJ = 25°C , L ³ 1mH , RG = 25W , Peak IL = 27.4A
ISD £ 27.4A , di/dt £ 190A / mS , VDD £ BVDSS , TJ £ 150°C , Suggested RG = 2.35W
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: [email protected]
Website: http://www.semelab.co.uk
Prelim. 05/00
IRFM350
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise stated)
Parameter
BVDSS
Test Conditions
STATIC ELECTRICAL RATINGS
Drain – Source Breakdown Voltage
DBVDSS Temperature Coefficient of
DTJ Breakdown Voltage
RDS(on)
ID = 1mA
VGS(th) Gate Threshold Voltage
2
Max.
V / °C
VGS = 10V
ID = 9A
0.315
VGS = 10V
ID = 14A
0.415
VDS = VGS
ID = 250mA
2
VDS ³ 15V
IDS = 9A
6
VGS = 0
V
(W)
S(W
VDS = 0.8BVDSS
25
TJ = 125°C
250
mA
Forward Transconductance
IDSS
Zero Gate Voltage Drain Current
IGSS
Forward Gate – Source Leakage
VGS = 20V
100
IGSS
Reverse Gate – Source Leakage
VGS = –20V
–100
Ciss
DYNAMIC CHARACTERISTICS
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
CDC
Drain – Case Capacitance
Qg
Total Gate Charge
VGS = 10V
52
110
Qgs
Gate – Source Charge
ID = 14A
5
18
Qgd
Gate – Drain (“Miller”) Charge
VDS = 0.5BVDSS
25
65
td(on)
Turn– On Delay Time
tr
Rise Time
td(off)
Turn–Off Delay Time
tf
Fall Time
IS
SOURCE – DRAIN DIODE CHARACTERISTICS
Continuous Source Current
660
VDS = 25V
f = 1MHz
12
190
170
trr
Reverse Recovery Time 2
14
56
TJ = 25°C
VGS = 0
IF = 14A
2
ns
130
1
IS = 14A
nC
35
RG = 2.35W
Diode Forward Voltage 2
pF
250
ID = 14A
VSD
nA
2600
VGS = 0
VDD = 200V
Pulse Source Current
W
4
gfs
ISM
Unit
V
0.46
ID = 1mA
2
Typ.
400
Reference to 25°C
Static Drain – Source On–State
Resistance
VGS = 0
Min.
TJ = 25°C
di / dt £ 100A/ms VDD £ 50V
Qrr
Reverse Recovery Charge
ton
Forward Turn–On Time
LD
PACKAGE CHARACTERISTICS
Internal Drain Inductance Measured from 6mm down drain lead to centre of die
8.7
LS
Internal Source Inductance
8.7
A
1.7
V
1200
ns
11
mC
Negligible
Measured from 6mm down source lead to source bond pad
nH
Notes
1) Repetitive Rating – Pulse width limited by Maximum Junction Temperature
2) Pulse Test: Pulse Width £ 300ms, d £ 2%.
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: [email protected]
Website: http://www.semelab.co.uk
Prelim. 05/00
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