Sanyo JCH3201 Npn epitaxial planar silicon transistor for automotive audio Datasheet

JCH3201
Ordering number : ENA0711
JCH3201
NPN Epitaxial Planar Silicon Transistors
For Automotive Audios
Features
•
•
•
•
Adoption of MBIT processes.
High breakdown voltage and large current capacity.
High-speed switching.
High reliability. / Reliability test 2000 hours guarantee.
Specifications
Absolute Maximum Ratings at Ta=25°C
Parameter
Collector-to-Base Voltage
Symbol
Conditions
Ratings
Unit
100
V
Collector-to-Emitter Voltage
VCBO
VCEO
100
V
Emitter-to-Base Voltage
VEBO
6
V
IC
1
A
Collector Current (Pulse)
ICP
2
A
Collector Dissipation
PC
0.9
W
150
°C
--55 to +150
°C
Collector Current
Junction Temperature
Tj
Storage Temperature
Tstg
When mounted on ceramic substrate (600mm2✕0.8mm)
Electrical Characteristics at Ta=25°C
Parameter
Symbol
Conditions
Ratings
min
typ
max
Unit
Collector Cutoff Current
ICBO
VCB=100V, IE=0A
100
nA
Emitter Cutoff Current
IEBO
hFE
VEB=4V, IC=0A
100
nA
DC Current Gain
Gain-Bandwidth Product
Output Capacitance
Marking : 5B
fT
Cob
VCE=5V, IC=100mA
VCE=10V, IC=100mA
VCB=10V, f=1MHz
140
400
120
MHz
8.5
pF
Continued on next page.
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"standard application", intended for the use as general electronics equipment (home appliances, AV equipment,
communication device, office equipment, industrial equipment etc.). The products mentioned herein shall not be
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instrument, nuclear control device, burning appliances, transportation machine, traffic signal system, safety
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Specifications of any and all SANYO Semiconductor Co.,Ltd. products described or contained herein stipulate
the performance, characteristics, and functions of the described products in the independent state, and are not
guarantees of the performance, characteristics, and functions of the described products as mounted in the
customer' s products or equipment. To verify symptoms and states that cannot be evaluated in an independent
device, the customer should always evaluate and test devices mounted in the customer' s products or
equipment.
TOKYO OFFICE Tokyo Bldg., 1-10, 1 Chome, Ueno, Taito-ku, TOKYO, 110-8534 JAPAN
22008EA TI IM TC-00001205 No. A0711-1/4
JCH3201
Continued from preceding page.
Parameter
Symbol
Collector-to-Emitter Saturation Voltage
VCE(sat)
VBE(sat)
Base-to-Emitter Saturation Voltage
Collector-to-Base Breakdown Voltage
Collector-to-Emitter Breakdown Voltage
Emitter-to-Base Breakdown Voltage
Turn-ON Time
Storage Time
min
typ
IC=400mA, IB=40mA
IC=400mA, IB=40mA
V(BR)CBO
V(BR)CEO
IC=10μA, IE=0A
IC=1mA, RBE=∞
V(BR)EBO
ton
tstg
IE=10μA, IC=0A
See specified Test Circuit.
tf
Fall Time
Ratings
Conditions
Unit
max
0.1
0.4
V
0.85
1.2
V
100
V
100
V
6
V
80
ns
See specified Test Circuit.
850
ns
See specified Test Circuit.
50
ns
Package Dimensions
Switching Time Test Circuit
unit : mm (typ)
7015A-003
0.6
2.9
0.15
OUTPUT
IB2
3
INPUT
RB
0.2
VR
RL
0.05
1.6
2.8
IB1
PW=20μs
D.C.≤1%
1
+
470μF
+
100μF
2
0.95
1 : Base
2 : Emitter
3 : Collector
0.4
--5V
50V
IC=10IB1= --10IB2=400mA
0.9
0.2
0.6
50Ω
SANYO : CPH3
IC -- VCE
0.8
0.7
10mA
VCE=5V
0.4
1mA
0.3
0.4
--40°C
0.5
0.6
25°C
5mA
3mA
2mA
0.6
0.8
Ta=8
5°C
Collector Current, IC -- A
0.9
IC -- VBE
1.0
25mA
20mA
15mA
Collector Current, IC -- A
1.0
0.2
0.2
0.1
IB=0mA
0
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
Collector-to-Emitter Voltage, VCE -- V
0.2
0.1
0.3
0.4
0.5
0.7
0.6
VCE=10V
Gain-Bandwidth Product, fT -- MHz
3
25°C
2
--40°C
100
7
5
3
2
3
5
7
0.1
2
3
Collector Current, IC -- A
5
7
1.0
IT13168
1.0
IT13167
f T -- IC
3
Ta=85°C
0.9
0.8
Base-to-Emitter Voltage, VBE -- V
VCE=5V
5
DC Current Gain, hFE
0
IT07233
hFE -- IC
7
2
0.01
0
5.0
2
100
7
5
3
2
0.01
2
3
5
7
0.1
2
3
Collector Current, IC -- A
5
7 1.0
IT07239
No. A0711-2/4
JCH3201
Cob -- VCB
5
IC / IB=10
3
Collector-to-Emitter
Saturation Voltage, VCE(sat) -- V
Output Capacitance, Cob -- pF
3
2
10
7
5
3
2
2
1.0
3
5
7
2
10
3
5
Collector-to-Base Voltage, VCB -- V
100
IT07241
0.1
°C
85
7
Ta=
5
3
C
25°
2
3
5
7
Collector Current, IC -- A
2
0.1
3
5
Collector Current, IC -- A
ICP=2A
IC=1A
ssi
pa
10
0m
op
s
era
tio
10
ms
tio
nL
n
ite
d
im
0.1
7
5
S
/B
3
2
Li
m
3
2
0.01
7
5
3
2
ite
d
Ta=85°C
Single pulse
When mounted on ceramic substrate (600mm2✕0.8mm)
0.001
0.1
2
3
5 7 1.0
2
3
5 7 10
2
3
5 7 100
Collector-to-Emitter Voltage, VCE -- V
pa
tio
DC
nL
10
era
im
n
d
s
S
/B
Li
m
3
2
0.01
7
5
7 1.0
IT13169
0m
tio
ite
0.1
7
5
ms
10
op
ite
d
Ta=25°C
Single pulse
When mounted on ceramic substrate (600mm2✕0.8mm)
2
3
5 7 1.0
2
3
5 7 10
2
3
5 7 100
Collector-to-Emitter Voltage, VCE -- V
Collector Dissipation, PC -- W
DC
s
ssi
2
IT07246
PC -- Ta
When mounted on ceramic substrate
(600mm2✕0.8mm)
0.9
s
0μ
Di
3
2
0μ
s
s
5
<10μs
Di
0.001
0.1
<10μs
50
1m
3
1m
IC=1A
1.0
10
1.0
7
5
1.0
IT13170
ASO
5
3
2
7
2
0.1
ICP=2A
1.0
7
5
3
2
2
7
μs
s
0μ
50
85°C
3
2
0.01
5
100
7
5
3
ASO
3
2
Ta= --40°C
25°C
2
5
2
1.0
0°C
--4
Collector Current, IC -- A
IC / IB=10
Base-to-Emitter
Saturation Voltage, VBE(sat) -- V
2
0.01
0.01
7
VBE(sat) -- IC
3
Collector Current, IC -- A
VCE(sat) -- IC
5
f=1MHz
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
2
IT13378
0
20
40
60
80
100
120
Ambient Temperature, Ta -- °C
140
160
IT07247
No. A0711-3/4
JCH3201
JCH3201 Reliability Assurance
Test
Test Conditions
Test Time
LTPD
Environmental Test
Temperature Cycle
--55°C to 150°C (30 min each)
500 cycles
10%
Thermal Shock
100°C to 0°C (5 min each)
250 cycles
10%
Pressure Cooker Test (Autoclave)
Ta=121°C, 100%RH, 203kPa
200 hrs
10%
Steady State Operating Life
Ta=25°C, Tj=150°C
2000 hrs
10%
Intermittent Operating Life
Ta=25°C, ΔTj=90°C
20000 cycles
10%
High Temperature Reverse Bias
Ta=150°C, VCES=100V
2000 hrs
10%
Temperature Humidity Storage
Ta=85°C, 85%RH
2000 hrs
10%
High Temperature Storage
Ta=150°C
2000 hrs
10%
Low Temperature Storage
Ta=--55°C
2000 hrs
10%
Temperature Humidity Reverse Bias
Ta=85°C, 85%RH, VCES=100V
2000 hrs
10%
C=200pF, R=0Ω, 3 times
200V
Endurance Test
Electrostatic Discharges
Machine Model
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to change without notice.
PS No. A0711-4/4
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