Samsung K7I321884C 1mx36 & 2mx18 ddrii cio b4 sram Datasheet

K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
36Mb DDRII SRAM Specification
165 FBGA with Pb & Pb-Free
(RoHS compliant)
INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS,
AND IS SUBJECT TO CHANGE WITHOUT NOTICE.
NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE,
EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE,
TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY.
ALL INFORMATION IN THIS DOCUMENT IS PROVIDED
ON AS "AS IS" BASIS WITHOUT GUARANTEE OR WARRANTY OF ANY KIND.
1. For updates or additional information about Samsung products, contact your nearest Samsung office.
2. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where Product failure could result in loss of life or personal or physical harm, or any military
or defense application, or any governmental procurement to which special terms or provisions may apply.
* Samsung Electronics reserves the right to change products or specification without notice.
-1-
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
Document Title
1Mx36-bit, 2Mx18-bit DDRII CIO b4 SRAM
Revision History
Rev. No.
History
Draft Date
Remark
0.0
1. Initial document.
Jan. 17, 2006
Advance
0.1
1. Put the data in the table of DC Characteristics, Pin Capacitance
and Thermal Resistance.
Apr. 26, 2006
Preliminary
0.2
1. Add 333MHz Bin
2. Change AC Characteristics.
May. 08, 2006
Preliminary
0.3
1. Change Samsung JEDEC Code in ID REGISTER DEFINITION
Jun. 05, 2006
Preliminary
1.0
1. Final
2. Change Vss/SA to NC/SA in Pin Configuration
Jul, 10, 2006
Final
1.1
1. Correct typo
Aug. 23, 2006
Final
-2-
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
1Mx36-bit, 2Mx18-bit DDRII CIO b4 SRAM
FEATURES
• 1.8V+0.1V/-0.1V Power Supply.
• DLL circuitry for wide output data valid window and future frequency scaling.
• I/O Supply Voltage 1.5V+0.1V/-0.1V for 1.5V I/O,
1.8V+0.1V/-0.1V for 1.8V I/O.
• Pipelined, double-data rate operation.
• Common data input/output bus.
• HSTL I/O
• Full data coherency, providing most current data.
• Synchronous pipeline read with self timed late write.
• Registered address, control and data input/output.
• DDR (Double Data Rate) Interface on read and write ports.
• Fixed 4-bit burst for both read and write operation.
• Clock-stop supports to reduce current.
• Two input clocks (K and K) for accurate DDR timing at clock
rising edges only.
• Two input clocks for output data (C and C) to minimize
clock-skew and flight-time mismatches.
• Two echo clocks (CQ and CQ) to enhance output data
traceability.
• Single address bus.
• Byte write (x18, x36) function.
• Simple depth expansion with no data contention.
• Programmable output impedance.
• JTAG 1149.1 compatible test access port.
• 165FBGA(11x15 ball array FBGA) with body size of 15x17mm
& Lead Free
Org.
X36
X18
Cycle Access
RoHS
Unit
Time Time
Avail.
Part Number
K7I323684C-E(F)C(I)33
3.0
0.45
ns
√
K7I323684C-E(F)C(I)30
3.3
0.45
ns
√
K7I323684C-E(F)C(I)25
4.0
0.45
ns
√
K7I321884C-E(F)C(I)33
3.0
0.45
ns
√
K7I321884C-E(F)C(I)30
3.3
0.45
ns
√
K7I321884C-E(F)C(I)25
4.0
0.45
ns
√
* -E(F)C(I)
E(F) [Package type]: E-Pb Free, F-Pb
C(I) [Operating Temperature]: C-Commercial, I-Industrial
FUNCTIONAL BLOCK DIAGRAM
36 (or 18)
DATA
REG
K
K
C
OUTPUT DRIVER
72
(or 36)
OUTPUT SELECT
72
(or 36)
OUTPUT REG
4(or 2)
CTRL
LOGIC
1Mx36
(2Mx18)
MEMORY
ARRAY
SENSE AMPS
LD
R/W
BWX
&
BURST
LOGIC
WRITE DRIVER
18
(or 19)
WRITE/READ DECODE
ADDRESS
A0,A1
18 (or 19) ADD REG
36 (or 18)
36 (or 18)
DQ
CQ, CQ
(Echo Clock out)
CLK
GEN
SELECT OUTPUT CONTROL
C
Notes: 1. Numbers in ( ) are for x18 device
DDRII SRAM and Double Data Rate comprise a new family of products developed by Cypress, Renesas, IDT, NEC and Samsung technology.
-3-
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
PIN CONFIGURATIONS(TOP VIEW) K7I323684C(1Mx36)
1
2
3
4
A
CQ
B
NC
5
6
NC/SA*
SA
DQ27
DQ18
7
8
R/W
BW2
K
BW1
SA
BW3
K
BW0
9
10
11
LD
SA
NC/SA*
CQ
SA
NC
NC
DQ8
C
NC
NC
DQ28
VSS
SA
SA0
SA1
VSS
NC
DQ17
DQ7
D
NC
DQ29
DQ19
VSS
VSS
VSS
VSS
VSS
NC
NC
DQ16
E
NC
NC
DQ20
VDDQ
VSS
VSS
VSS
VDDQ
NC
DQ15
DQ6
F
NC
DQ30
DQ21
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
DQ5
G
NC
DQ31
DQ22
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
DQ14
H
Doff
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
NC
NC
DQ32
VDDQ
VDD
VSS
VDD
VDDQ
NC
DQ13
DQ4
K
NC
NC
DQ23
VDDQ
VDD
VSS
VDD
VDDQ
NC
DQ12
DQ3
L
NC
DQ33
DQ24
VDDQ
VSS
VSS
VSS
VDDQ
NC
NC
DQ2
M
NC
NC
DQ34
VSS
VSS
VSS
VSS
VSS
NC
DQ11
DQ1
N
NC
DQ35
DQ25
VSS
SA
SA
SA
VSS
NC
NC
DQ10
P
NC
NC
DQ26
SA
SA
C
SA
SA
NC
DQ9
DQ0
R
TDO
TCK
SA
SA
SA
C
SA
SA
SA
TMS
TDI
Notes: 1. * Checked No Connect (NC) pins are reserved for higher density address, i.e. 10A for 72Mb, 2A for 144Mb.
2. BW0 controls write to DQ0:DQ8, BW1 controls write to DQ9:DQ17, BW2 controls write to DQ18:DQ26 and BW3 controls write to DQ27:DQ35.
PIN NAME
SYMBOL
PIN NUMBERS
DESCRIPTION
K, K
6B, 6A
Input Clock
C, C
6P, 6R
Input Clock for Output Data
CQ, CQ
11A, 1A
Output Echo Clock
Doff
1H
DLL Disable when low
SA0,SA1
6C,7C
Burst Count Address Inputs
SA
3A,9A,4B,8B,5C,5N-7N,4P,5P,7P,8P,3R-5R,7R-9R
Address Inputs
DQ0-35
2B,3B,11B,3C,10C,11C,2D,3D,11D,3E,10E,11E,2F,3F
11F,2G,3G,11G,3J,10J,11J,3K,10K,11K,2L,3L,11L
3M,10M,11M,2N,3N,11N,3P,10P,11P
Data Inputs Outputs
R/W
4A
Read, Write Control Pin, Read active
when high
LD
8A
Synchronous Load Pin, bus Cycle
sequence is to be defined when low
BW0, BW1,BW2, BW3
7B,7A,5A,5B
Block Write Control Pin, active when low
VREF
2H,10H
Input Reference Voltage
ZQ
11H
Output Driver Impedance Control Input
VDD
5F,7F,5G,7G,5H,7H,5J,7J,5K,7K
Power Supply (1.8 V)
VDDQ
4E,8E,4F,8F,4G,8G,3H,4H,8H,9H,4J,8J,4K,8K,4L,8L
Output Power Supply (1.5V or 1.8V)
VSS
4C,8C,4D-8D,5E-7E,6F,6G,6H,6J,6K,5L-7L,
4M-8M,4N,8N
Ground
TMS
10R
JTAG Test Mode Select
TDI
11R
JTAG Test Data Input
TCK
2R
JTAG Test Clock
TDO
1R
JTAG Test Data Output
NC
2A,10A,1B,9B,10B,1C,2C,9C,1D,9D,10D,1E,2E,9E,
1F,9F,10F,1G,9G,10G,1J,2J,9J,1K,2K,9K
1L,9L,10L,1M,2M,9M,1N,9N,10N,1P,2P,9P
No Connect
NOTE
1
2
3
Notes: 1. C, C, K or K cannot be set to VREF voltage.
2. When ZQ pin is directly connected to VDD output impedance is set to minimum value and it cannot be connected to ground or left unconnected.
3. Not connected to chip pad internally.
-4-
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
PIN CONFIGURATIONS(TOP VIEW) K7I321884C(2Mx18)
A
1
2
3
4
5
6
7
8
9
10
11
CQ
NC/SA*
SA
R/W
BW1
K
NC
LD
SA
SA
CQ
DQ8
B
NC
DQ9
NC
SA
NC
K
BW0
SA
NC
NC
C
NC
NC
NC
VSS
SA
SA0
SA1
VSS
NC
DQ7
NC
D
NC
NC
DQ10
VSS
VSS
VSS
VSS
VSS
NC
NC
NC
E
NC
NC
DQ11
VDDQ
VSS
VSS
VSS
VDDQ
NC
NC
DQ6
F
NC
DQ12
NC
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
DQ5
G
NC
NC
DQ13
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
NC
H
Doff
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
NC
NC
NC
VDDQ
VDD
VSS
VDD
VDDQ
NC
DQ4
NC
K
NC
NC
DQ14
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
DQ3
DQ2
L
NC
DQ15
NC
VDDQ
VSS
VSS
VSS
VDDQ
NC
NC
M
NC
NC
NC
VSS
VSS
VSS
VSS
VSS
NC
DQ1
NC
N
NC
NC
DQ16
VSS
SA
SA
SA
VSS
NC
NC
NC
P
NC
NC
DQ17
SA
SA
C
SA
SA
NC
NC
DQ0
R
TDO
TCK
SA
SA
SA
C
SA
SA
SA
TMS
TDI
Notes: 1. * Checked No Connect (NC) pins are reserved for higher density address, i.e. 2A for 72Mb.
2. BW0 controls write to DQ0:DQ8 and BW1 controls write to DQ9:DQ17.
PIN NAME
SYMBOL
PIN NUMBERS
DESCRIPTION
K, K
6B, 6A
Input Clock
C, C
6P, 6R
Input Clock for Output Data
CQ, CQ
11A, 1A
Output Echo Clock
Doff
1H
DLL Disable when low
SA0,SA1
6C,7C
Burst Count Address Inputs
SA
3A,9A,10A,4B,8B,5C,5N-7N,4P,5P,7P,8P,3R-5R,7R-9R
Address Inputs
DQ0-17
2B,11B,10C,3D,3E,11E,2F,11F,3G,10J,3K,11K,2L,11L
10M,3N,3P,11P
Data Inputs Outputs
R/W
4A
Read, Write Control Pin, Read active
when high
LD
8A
Synchronous Load Pin, bus Cycle
sequence is to be defined when low
BW0, BW1
7B, 5A
Block Write Control Pin, active when low
VREF
2H,10H
Input Reference Voltage
ZQ
11H
Output Driver Impedance Control Input
VDD
5F,7F,5G,7G,5H,7H,5J,7J,5K,7K
Power Supply (1.8 V)
VDDQ
4E,8E,4F,8F,4G,8G,3H,4H,8H,9H,4J,8J,4K,8K,4L,8L
Output Power Supply (1.5V or 1.8V)
VSS
4C,8C,4D-8D,5E-7E,6F,6G,6H,6J,6K,5L-7L,4M-8M,4N,8N
Ground
TMS
10R
JTAG Test Mode Select
TDI
11R
JTAG Test Data Input
TCK
2R
JTAG Test Clock
TDO
1R
JTAG Test Data Output
NC
2A,7A,1B,3B,5B,9B,10B,1C,2C,3C,9C,11C,1D,2D,9D,10D,11D
1E,2E,9E,10E,1F,3F,9F,10F,1G,2G,9G,10G,11G
1J,2J,3J,9J,11J,1K,2K,9K,10K,1L,3L,9L,10L
1M,2M,3M,9M,11M,1N,2N,9N,10N,11N,1P,2P,9P,10P
No Connect
NOTE
1
2
3
Notes: 1. C, C, K or K cannot be set to VREF voltage.
2. When ZQ pin is directly connected to VDD output impedance is set to minimum value and it cannot be connected to ground or left unconnected.
3. Not connected to chip pad internally.
-5-
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
GENERAL DESCRIPTION
The K7I323684C and K7I321884C are 37,748,736-bits DDR Common I/O Synchronous Pipelined Burst SRAMs. They are organized
as 1,048,576 words by 36bits for K7I323684C and 2,097,152 words by 18 bits for K7I321884C.
Address, data inputs, and all control signals are synchronized to the input clock (K or K). Normally data outputs are synchronized to
output clocks (C and C), but when C and C are tied high, the data outputs are synchronized to the input clocks (K and K). Read data
are referenced to echo clock (CQ or CQ) outputs. Read address and write address are registered on rising edges of the input K
clocks.
Common address bus is used to access address both for read and write operations. The internal burst counter is fixed to 4-bit
sequential for both read and write operations. Synchronous pipeline read and late write enable high speed operations. Simple depth
expansion is accomplished by using LD for port selection. Byte write operation is supported with BW0 and BW1 (BW2 and BW3) pins
for x18 (x36) device.
IEEE 1149.1 serial boundary scan (JTAG) simplifies monitoring package pads attachment status with system.
The K7I323684C and K7I321884C are implemented with SAMSUNG's high performance 6T CMOS technology and is available in
165pin FBGA packages. Multiple power and ground pins minimize ground bounce.
Read Operations
Read cycles are initiated by initiating R/W as high at the rising edge of the positive input clock K. Address is presented and stored in
the read address register synchronized with K clock. For 4-bit burst DDR operation, it will access four 36-bit or 18-bit data words with
each read command.
The first pipelined data is transferred out of the device triggered by C clock following next K clock rising edge. Next burst data is triggered by the rising edge of following C clock rising edge. Continuous read operations are initiated with K clock rising edge.
And pipelined data are transferred out of device on every rising edge of both C and C clocks. In case C and C tied to high, output data
are triggered by K and K instead of C and C.
When the LD is disabled after a read operation, the K7I323684C and K7I321884C will first complete burst read operation before
entering into deselect mode at the next K clock rising edge. Then output drivers disabled automatically to high impedance state.
Write Operations
Write cycles are initiated by activating R/W as low at the rising edge of the positive input clock K. Address is presented and stored in
the write address register synchronized with next K clock. For 4-bit burst DDR operation, it will write two 36-bit or 18-bit data words
with each write command.
The first “late write” data is transferred and registered in to the device synchronous with next K clock rising edge. Next burst data is
transferred and registered synchronous with following K clock rising edge. Continuous write operations are initiated with K rising
edge.
And “late write” data is presented to the device on every rising edge of both K and K clocks.
When the LD is disabled, the K7I323684C and K7I321884C will enter into deselect mode. The device disregards input data presented on the same cycle W disabled.
The K7I323684C and K7I321884C support byte write operations. With activating BW0 or BW1 (BW2 or BW3) in write cycle, only one
byte of input data is presented. In K7I321884C, BW0 controls write operation to D0:D8, BW1 controls write operation to D9:D17.
And in K7I323684C BW2 controls write operation to D18:D26, BW3 controls write operation to D27:D35.
-6-
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
Single Clock Mode
K7I323684C and K7I321884C can be operated with the single clock pair K and K, instead of C or C for output clocks.
To operate these devices in single clock mode, C and C must be tied high during power up and must be maintained high during operation. After power up, this device can′t change to or from single clock mode. System flight time and clock skew could not be compensated in this mode.
Depth Expansion
Each port can be selected and deselected independently with R/W be shared among all SRAMs and provide a new LD signal for
each bank. Before chip deselected, all read and write pending operations are completed.
Programmable Impedance Output Buffer Operation
The designer can program the SRAM's output buffer impedance by terminating the ZQ pin to VSS through a precision resistor (RQ).
The value of RQ (within 15%) is five times the output impedance desired. For example, 250Ω resistor will give an output impedance
of 50Ω.
Impedance updates occur early in cycles that do not activate the outputs, such as deselect cycles. In all cases impedance updates
are transparent to the user and do not produce access time "push-outs" or other anomalous behavior in the SRAM.
There are no power up requirements for the SRAM. However, to guarantee optimum output driver impedance after power up, the
SRAM needs 1024 non-read cycles.
Echo clock operation
To assure the output traceability, the SRAM provides the output Echo clock, pair of compliment clock CQ and CQ, which are synchronized with internal data output. Echo clocks run free during normal operation.
The Echo clock is triggered by internal output clock signal, and transferred to external through same structures as output driver.
Clock Consideration
K7I323684C and K7I321884C utilize internal DLL (Delay-Locked Loops) for maximum output data valid window. It can be placed into
a stopped-clock state to minimize power with a modest restart time of 1024 clock cycles.
Circuitry automatically resets the DLL when absence of input clock is detected.
Power-Up/Power-Down Supply Voltage Sequencing
The following power-up supply voltage application is recommended: VSS, VDD, VDDQ, VREF, then VIN. VDD and VDDQ can be applied
simultaneously, as long as VDDQ does not exceed VDD by more than 0.5V during power-up. The following power-down supply voltage
removal sequence is recommended: VIN, VREF, VDDQ, VDD, VSS. VDD and VDDQ can be removed simultaneously, as long as VDDQ
does not exceed VDD by more than 0.5V during power-down.
-7-
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
Detail Specification of Power-Up Sequence in DDRII SRAM
DDRII SRAMs must be powered up and initialized in a predefined manner to prevent undefined operations.
• Power-Up Sequence
1. Apply power and keep Doff at low state (All other inputs may be undefined)
- Apply VDD before VDDQ
- Apply VDDQ before VREF or the same time with VREF
2. Just after the stable power and clock (K, K, C, C), take Doff to be high.
3. The additional 1024cycles of clock input is required to lock the DLL after enabling DLL
* Notes: If you want to tie up the Doff pin to High with unstable clock, then you must stop the clock for a few seconds
(Min. 30ns) to reset the DLL after it become a stable clock status.
• DLL Constraints
1. DLL uses either K or C clock as its synchronizing input, the input should have low phase jitter which is specified as TKC var.
2. The lower end of the frequency at which the DLL can operate is 8.4ns.
3. If the incoming clock is unstable and the DLL is enabled, then the DLL may lock onto a wrong frequency
and this may cause the failure in the initial stage.
K,K
Status
Power-Up
~ ~ ~
~ ~ ~
Power up & Initialization Sequence (Doff pin controlled)
1024 cycle
Unstable
CLKstage
DLL Locking Range
Any
Command
Inputs Clock
must be stable
VDD
VDDQ
VREF
Doff
Power-Up
Unstable
CLKstage
Stop Clock
1024 cycle
~
~
Status
~
Min 30ns
~ ~
K,K
~
~ ~
Power up & Initialization Sequence (Doff pin Fixed high, Clock controlled)
DLL Locking Range
Any
Command
Inputs Clock
must be stable
VDD
VDDQ
VREF
* Notes: When the operating frequency is changed, DLL reset should be required again.
After DLL reset again, the minimum 1024 cycles of clock input is needed to lock the DLL.
-8-
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
LINEAR BURST SEQUENCE TABLE
Case 1
BURST SEQUENCE
SA1
0
0
1
1
First Address
Fourth Address
Case 2
SA0
0
1
0
1
SA1
0
1
1
0
Case 3
SA0
1
0
1
0
SA1
1
1
0
0
SA0
0
1
0
1
Case 4
SA1
SA0
1
1
0
0
1
0
0
1
TRUTH TABLES
SYNCHRONOUS TRUTH TABLE
K
LD
R/W
Stopped
X
↑
Q
OPERATION
Q(A0)
Q(A1)
Q(A2)
Q(A3)
X
Previous
state
Previous
state
Previous
state
Previous
state
Clock Stop
H
X
High-Z
High-Z
High-Z
High-Z
No Operation
↑
L
H
QOUT at
C(t+1)
QOUT at
C(t+2)
QOUT at
C(t+2)
QOUT at
C(t+3)
Read
↑
L
L
Din at K(t+1)
Din at K(t+1)
Din at K(t+2)
Din at K(t+2)
Write
Notes: 1. X means “Don′t Care”.
2. The rising edge of clock is symbolized by (↑).
3. Before enter into clock stop status, all pending read and write operations will be completed.
WRITE TRUTH TABLE(x18)
K
K
BW0
L
L
WRITE ALL BYTEs ( K↑)
↑
L
L
WRITE ALL BYTEs ( K↑)
L
H
WRITE BYTE 0 ( K↑)
L
H
WRITE BYTE 0 ( K↑)
↑
↑
↑
↑
BW1
OPERATION
H
L
WRITE BYTE 1 ( K↑)
↑
H
L
WRITE BYTE 1 ( K↑ )
H
H
WRITE NOTHING ( K↑)
↑
H
H
WRITE NOTHING ( K↑)
↑
Notes: 1. X means “Don′t Care”.
2. All inputs in this table must meet setup and hold time around the rising edge of input clock K or K (↑).
3. Assumes a WRITE cycle was initiated.
4. This table illustrates operation for x18 devices.
WRITE TRUTH TABLE(x36)
K
K
↑
↑
↑
↑
↑
↑
↑
↑
↑
↑
BW0
BW1
BW2
BW3
L
L
L
L
OPERATION
WRITE ALL BYTEs ( K↑)
L
L
L
L
WRITE ALL BYTEs ( K↑)
L
H
H
H
WRITE BYTE 0 ( K↑)
L
H
H
H
WRITE BYTE 0 ( K↑)
H
L
H
H
WRITE BYTE 1 ( K↑)
H
L
H
H
WRITE BYTE 1 ( K↑)
H
H
L
L
WRITE BYTE 2 and BYTE 3 ( K↑)
H
H
L
L
WRITE BYTE 2 and BYTE 3 ( K↑)
H
H
H
H
WRITE NOTHING ( K↑)
H
H
H
H
WRITE NOTHING ( K↑)
Notes: 1. X means "Don′t Care”.
2. All inputs in this table must meet setup and hold time around the rising edge of input clock K or K (↑).
3. Assumes a WRITE cycle was initiated.
-9-
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
ABSOLUTE MAXIMUM RATINGS*
SYMBOL
RATING
UNIT
Voltage on VDD Supply Relative to VSS
PARAMETER
VDD
-0.5 to 2.9
V
Voltage on VDDQ Supply Relative to VSS
VDDQ
-0.5 to VDD
V
VIN
-0.5 to VDD+0.3
V
TSTG
-65 to 150
°C
TOPR
0 to 70 / -40 to 85
°C
TBIAS
-10 to 85
°C
Voltage on Input Pin Relative to VSS
Storage Temperature
Operating Temperature
Commercial / Industrial
Storage Temperature Range Under Bias
*Note: 1. Stresses greater than those listed under "Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. VDDQ must not exceed VDD during normal operation.
OPERATING CONDITIONS
PARAMETER
SYMBOL
Min
MAX
UNIT
VDD
1.7
1.9
V
Supply Voltage
Reference Voltage
VDDQ
1.4
1.9
V
VREF
0.68
0.95
V
DC ELECTRICAL CHARACTERISTICS
PARAMETER
SYMBOL
TEST CONDITIONS
Input Leakage Current
IIL
VDD=Max; VIN=VSS to VDDQ
Output Leakage Current
IOL
Output Disabled,
Operating Current (x36)
Operating Current (x18)
Standby Current (NOP)
ICC
ICC
ISB1
MIN
MAX
-2
+2
µA
+2
µA
-2
-33
VDD=Max, IOUT=0mA
Cycle Time ≥ tKHKH Min
750
-30
-
700
-25
-
650
-33
VDD=Max, IOUT=0mA
Cycle Time ≥ tKHKH Min
Device deselected, IOUT=0mA, f=Max,
All Inputs≤0.2V or ≥ VDD-0.2V
UNIT NOTES
mA
1,5
mA
1,5
mA
1,6
700
-30
-
650
-25
-
600
-33
300
-30
-
280
-25
-
250
Output High Voltage
VOH1
VDDQ/2-0.12 VDDQ/2+0.12
V
2,7
Output Low Voltage
VOL1
VDDQ/2-0.12 VDDQ/2+0.12
V
3,7
Output High Voltage
VOH2
IOH=-1.0mA
VDDQ-0.2
VDDQ
V
4
Output Low Voltage
VOL2
IOL=1.0mA
VSS
0.2
V
4
Input Low Voltage
VIL
-0.3
VREF-0.1
V
8,9
Input High Voltage
VIH
VREF+0.1
VDDQ+0.3
V
8,10
Notes: 1. Minimum cycle. IOUT=0mA.
2. |IOH|=(VDDQ/2)/(RQ/5)±15% for 175Ω ≤ RQ ≤ 350Ω.
3. |IOL|=(VDDQ/2)/(RQ/5)±15% for 175Ω ≤ RQ ≤ 350Ω.
4. Minimum Impedance Mode when ZQ pin is connected to VDD.
5. Operating current is calculated with 50% read cycles and 50% write cycles.
6. Standby Current is only after all pending read and write burst operations are completed.
7. Programmable Impedance Mode.
8. These are DC test criteria. DC design criteria is VREF±50mV. The AC VIH/VIL levels are defined separately for measuring timing parameters.
9. VIL (Min.) DC=-0.3V, VIL (Min)AC=-1.5V(pulse width ≤ 3ns).
10. VIH (Max)DC=VDDQ+0.3, VIH (Max)AC=VDDQ+0.85V(pulse width ≤ 3ns).
- 10 -
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
AC ELECTRICAL CHARACTERISTICS
SYMBOL
MIN
MAX
UNIT
NOTES
Input High Voltage
PARAMETER
VIH (AC)
VREF + 0.2
-
V
1,2
Input Low Voltage
VIL (AC)
-
VREF - 0.2
V
1,2
Notes: 1. This condition is for AC function test only, not for AC parameter test.
2. To maintain a valid level, the transition edge of the input must:
a) Sustain a constant slew rate from the current AC level through the target AC level, VIL(AC) or VIH(AC)
b) Reach at least the target AC level
c) After the AC target level is reached, continue to maintain at least the target DC level, VIL(DC) or VIH(DC)
AC TIMING CHARACTERISTICS
PARAMETER
SYMBOL
-33
-30
-25
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
3.00
8.40
3.30
8.40
4.00
8.40
ns
0.20
ns
NOTE
Clock
Clock Cycle Time (K, K, C, C)
tKHKH
Clock Phase Jitter (K, K, C, C)
tKC var
Clock High Time (K, K, C, C)
tKHKL
0.20
1.2
0.20
1.32
1.60
Clock Low Time (K, K, C, C)
tKLKH
1.2
1.32
1.60
ns
Clock to Clock (K↑ → K↑, C↑ → C↑)
tKHKH
1.35
1.49
1.80
ns
tKHCH
0.00
DLL Lock Time (K, C)
tKC lock
1024
1024
1024
cycle
K Static to DLL reset
tKC reset
30
30
30
ns
Clock to data clock (K↑ → C↑, K↑→ C↑)
1.30
0.00
1.45
0.00
5
ns
1.80
ns
6
Output Times
C, C High to Output Valid
tCHQV
C, C High to Output Hold
tCHQX
C, C High to Echo Clock Valid
tCHCQV
C, C High to Echo Clock Hold
tCHCQX
CQ, CQ High to Output Valid
tCQHQV
CQ, CQ High to Output Hold
tCQHQX
0.45
-0.45
0.45
-0.45
0.45
-0.45
0.45
-0.45
0.25
-0.25
0.45
-0.45
0.45
-0.45
0.27
-0.27
0.45
3
3
ns
ns
0.30
-0.30
0.45
ns
ns
0.45
ns
7
ns
7
C, High to Output High-Z
tCHQZ
ns
3
C, High to Output Low-Z
tCHQX1
-0.45
-0.45
-0.45
ns
3
tAVKH
0.40
0.40
0.50
ns
Control inputs valid to K rising edge
tIVKH
0.40
0.40
0.50
ns
Data-in valid to K, K rising edge
tDVKH
0.28
0.30
0.35
ns
tKHAX
0.40
0.40
0.50
ns
K rising edge to control inputs hold
tKHIX
0.40
0.40
0.50
ns
K, K rising edge to data-in hold
tKHDX
0.28
0.30
0.35
ns
Setup Times
Address valid to K rising edge
2
Hold Times
K rising edge to address hold
Notes: 1. All address inputs must meet the specified setup and hold times for all latching clock edges.
2. Control singles are R, W,BW0,BW1 and (BW2, BW3, also for x36)
3. If C,C are tied high, K,K become the references for C,C timing parameters.
4. To avoid bus contention, at a given voltage and temperature tCHQX1 is bigger than tCHQZ.
The specs as shown do not imply bus contention because tCHQX1 is a MIN parameter that is worst case at totally different test conditions
(0°C, 1.9V) than tCHQZ, which is a MAX parameter (worst case at 70°C, 1.7V)
It is not possible for two SRAMs on the same board to be at such different voltage and temperature.
5. Clock phase jitter is the variance from clock rising edge to the next expected clock rising edge.
6. Vdd slew rate must be less than 0.1V DC per 50 ns for DLL lock retention. DLL lock time begins once Vdd and input clock are stable.
7. Echo clock is very tightly controlled to data valid/data hold. By design, there is a ± 0.1 ns variation from echo clock to data.
The data sheet parameters reflect tester guardbands and test setup variations.
- 11 -
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
THERMAL RESISTANCE
SYMBOL
TYP
Unit
Junction to Ambient
PRMETER
θJA
20.8
°C/W
Junction to Case
θJC
2.3
°C/W
Junction to Pins
θJB
4.3
°C/W
NOTES
Note: Junction temperature is a function of on-chip power dissipation, package thermal impedance, mounting site temperature and mounting site
thermal impedance. TJ=TA + PD x θJA
PIN CAPACITANCE
PRMETER
SYMBOL
TESTCONDITION
TYP
MAX
Unit
CIN
VIN=0V
4
5
pF
Input and Output Capacitance
COUT
VOUT=0V
6
7
pF
Clock Capacitance
CCLK
-
5
6
pF
Address Control Input Capacitance
NOTES
Note: 1. Parameters are tested with RQ=250Ω and VDDQ=1.5V.
2. Periodically sampled and not 100% tested.
AC TEST CONDITIONS
AC TEST OUTPUT LOAD
Symbol
Value
Unit
Core Power Supply Voltage
VDD
1.7~1.9
V
Output Power Supply Voltage
VDDQ
1.4~1.9
V
Input High/Low Level
VIH/VIL
1.25/0.25
V
Input Reference Level
VREF
0.75
V
Input Rise/Fall Time
TR/TF
0.3/0.3
ns
VDDQ/2
V
Parameter
Output Timing Reference Level
VREF 0.75V
VDDQ/2
50Ω
SRAM
Zo=50Ω
ZQ
250Ω
Note: Parameters are tested with RQ=250Ω
Overershoot Timing
Undershoot Timing
20% tKHKH
VIH
VDDQ+0.5V
VDDQ+0.25V
VSS
VDDQ
VSS-0.25V
VSS-0.5V
20% tKHKH(MIN)
VIL
Note: For power-up, VIH ≤ VDDQ+0.3V and VDD ≤ 1.7V and VDDQ ≤ 1.4V t ≤ 200ms
- 12 -
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
APPLICATION INRORMATION
R=250Ω
Vt
R
ZQ
SRAM#1
CQ
CQ
DQ
SA R/W LD0 BW0 BW1 C C K K
R=250Ω
ZQ
SRAM#4
CQ
CQ
DQ
SA R/WLD3BW0 BW1 C C K K
DQ
Address
R/W
LD
BW
R
Vt
MEMORY
CONTROLLER
Return CLK
Source CLK
Return CLK
Source CLK
R=50Ω Vt=VREF
SRAM1 Input CQ
SRAM1 Input CQ
SRAM4 Input CQ
SRAM4 Input CQ
- 13 -
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
TIMING WAVE FORMS OF READ, WRITE AND NOP
NOP
READ
(burst of 4)
1
READ
(burst of 4)
2
3
5
4
NOP
NOP
(Note3)
6
7
WRITE
READ
(burst of 4)
(burst of 4)
9
8
10
12
11
K
tKHKL
tKHKH
tKHKH
K
tIVKH
tKLKH
tKHIX
LD
R/W
SA
tAVKH
A2
A1
A0
A3
tKHDX
tKHAX
tDVKH
DQ
Q01
tCHQV
tKHCH
Q02
Q03
tCHQX
tCHQX1
Q04
Q12
Q13
Q14
tCQHQX
tKHKH
tKHKL
Q11
D21
D22
D23
D24
Q31
Q32
Q33
tCHQZ
tCQHQV
tKHKH
tKLKH
C
C
tCQHQZ
CQ
tCHCQV
tCHCQX
tCHCQV
tCHCQX
CQ
DON′T CARE
UNDEFINED
NOTE
1. Q01 refers to output from address A. Q02 refers to output from the next internal burst address following A, etc.
2. Outputs are disabled (High-Z) one clock cycle after a NOP.
3. The second NOP cycle is not necessary for correct device operation; however, at high clock frequencies, it may be required to prevent
bus contention.
- 14 -
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
IEEE 1149.1 TEST ACCESS PORT AND BOUNDARY SCAN-JTAG
This part contains an IEEE standard 1149.1 Compatible Test Access Port (TAP). The package pads are monitored by the Serial Scan
circuitry when in test mode. This is to support connectivity testing during manufacturing and system diagnostics. Internal data is not
driven out of the SRAM under JTAG control. In conformance with IEEE 1149.1, the SRAM contains a TAP controller, Instruction Register, Bypass Register and ID register. The TAP controller has a standard 16-state machine that resets internally upon power-up,
therefore, TRST signal is not required. It is possible to use this device without utilizing the TAP. To disable the TAP controller without
interfacing with normal operation of the SRAM, TCK must be tied to VSS to preclude mid level input. TMS and TDI are designed so an
undriven input will produce a response identical to the application of a logic 1, and may be left unconnected. But they may also be
tied to VDD through a resistor. TDO should be left unconnected.
JTAG Block Diagram
JTAG Instruction Coding
IR2 IR1 IR0
SRAM
CORE
TDI
BYPASS Reg.
TDO
Identification Reg.
Instruction Reg.
Control Signals
TMS
TCK
TAP Controller
Instruction
TDO Output
Notes
Boundary Scan Register
1
IDCODE
Identification Register
3
SAMPLE-Z
Boundary Scan Register
2
0
0
0
EXTEST
0
0
1
0
1
0
0
1
1
RESERVED
Do Not Use
6
1
0
0
SAMPLE
Boundary Scan Register
5
1
0
1
RESERVED
Do Not Use
6
1
1
0
RESERVED
Do Not Use
6
1
1
1
BYPASS
Bypass Register
4
NOTE:
1. Places DQs in Hi-Z in order to sample all input data regardless of other
SRAM inputs. This instruction is not IEEE 1149.1 compliant.
2. Places DQs in Hi-Z in order to sample all input data regardless of other
SRAM inputs.
3. TDI is sampled as an input to the first ID register to allow for the serial shift
of the external TDI data.
4. Bypass register is initiated to VSS when BYPASS instruction is invoked. The
Bypass Register also holds serially loaded TDI when exiting the Shift DR
states.
5. SAMPLE instruction dose not places DQs in Hi-Z.
6. This instruction is reserved for future use.
TAP Controller State Diagram
1
Test Logic Reset
0
0
Run Test Idle
1
1
1
Select DR
0
1
Capture DR
0
Shift DR
1
Exit2 DR
1
Update DR
0
- 15 -
Select IR
0
1
Capture IR
0
0
1
Exit1 DR
0
Pause DR
1
1
1
0
0
Shift IR
1
0
Exit1 IR
0
Pause IR
1
Exit2 IR
1
Update IR
1
0
0
0
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
SCAN REGISTER DEFINITION
Part
Instruction Register
Bypass Register
ID Register
Boundary Scan
1Mx36
3 bits
1 bit
32 bits
109 bits
2Mx18
3 bits
1 bit
32 bits
109 bits
ID REGISTER DEFINITION
Part
Revision Number
(31:29)
Part Configuration
(28:12)
Samsung JEDEC Code
(11: 1)
Start Bit(0)
1Mx36
000
00def0wx0t0q0b0s0
00011001110
1
2Mx18
000
00def0wx0t0q0b0s0
00011001110
1
Note: Part Configuration
/def=010 for 36Mb, /wx=11 for x36, 10 for x18
/t=1 for DLL Ver., 0 for non-DLL Ver. /q=1 for QDR, 0 for DDR /b=1 for 4Bit Burst, 0 for 2Bit Burst /s=1 for Separate I/O, 0 for Common I/O
BOUNDARY SCAN EXIT ORDER
ORDER
PIN ID
ORDER
PIN ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
6R
6P
6N
7P
7N
7R
8R
8P
9R
11P
10P
10N
9P
10M
11N
9M
9N
11L
11M
9L
10L
11K
10K
9J
9K
10J
11J
11H
10G
9G
11F
11G
9F
10F
11E
10E
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
10D
9E
10C
11D
9C
9D
11B
11C
9B
10B
11A
10A
9A
8B
7C
6C
8A
7A
7B
6B
6A
5B
5A
4A
5C
4B
3A
2A
1A
2B
3B
1C
1B
3D
3C
1D
Note: 1. NC pins are read as "X" (i.e. don′t care.)
- 16 -
ORDER
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
PIN ID
2C
3E
2D
2E
1E
2F
3F
1G
1F
3G
2G
1H
1J
2J
3K
3J
2K
1K
2L
3L
1M
1L
3N
3M
1N
2M
3P
2N
2P
1P
3R
4R
4P
5P
5N
5R
Internal
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
JTAG DC OPERATING CONDITIONS
Symbol
Min
Typ
Max
Unit
Power Supply Voltage
Parameter
VDD
1.7
1.8
1.9
V
Input High Level
VIH
1.3
-
VDD+0.3
V
Input Low Level
VIL
-0.3
-
0.5
V
Output High Voltage (IOH=-2mA)
VOH
1.4
-
VDD
V
Output Low Voltage(IOL=2mA)
VOL
VSS
-
0.4
V
Note
Note: 1. The input level of SRAM pin is to follow the SRAM DC specification.
JTAG AC TEST CONDITIONS
Symbol
Min
Unit
Input High/Low Level
Parameter
VIH/VIL
1.8/0.0
V
Input Rise/Fall Time
TR/TF
1.0/1.0
ns
0.9
V
Input and Output Timing Reference Level
Note
1
Note: 1. See SRAM AC test output load on page 11.
JTAG AC Characteristics
Parameter
Symbol
Min
Max
Unit
tCHCH
50
-
ns
TCK High Pulse Width
tCHCL
20
-
ns
TCK Low Pulse Width
tCLCH
20
-
ns
TMS Input Setup Time
tMVCH
5
-
ns
TMS Input Hold Time
tCHMX
5
-
ns
TDI Input Setup Time
tDVCH
5
-
ns
TDI Input Hold Time
tCHDX
5
-
ns
SRAM Input Setup Time
tSVCH
5
-
ns
SRAM Input Hold Time
tCHSX
5
-
ns
Clock Low to Output Valid
tCLQV
0
10
ns
TCK Cycle Time
Note
JTAG TIMING DIAGRAM
TCK
tCHCH
tCHCL
tMVCH
tCHMX
tDVCH
tCHDX
tSVCH
tCHSX
tCLCH
TMS
TDI
PI
(SRAM)
tCLQV
TDO
- 17 -
Rev. 1.1 August 2006
K7I323684C
K7I321884C
1Mx36 & 2Mx18 DDRII CIO b4 SRAM
165 FBGA PACKAGE DIMENSIONS (Lead & Lead Free)
15mm x 17mm Body, 1.0mm Bump Pitch, 11x15 Ball Array
B
Top View
A
Side View
C
D
A
G
E
B
F
Bottom View
∅H
E
Symbol
Value
Units
Symbol
Value
Units
A
15 ± 0.1
mm
Note
E
1.0
mm
B
17 ± 0.1
mm
F
14.0
mm
C
1.3 ± 0.1
mm
G
10.0
mm
D
0.35 ± 0.05
mm
H
0.5 ± 0.05
mm
- 18 -
Note
Rev. 1.1 August 2006
Similar pages