STMICROELECTRONICS M95040

M95040
M95020 M95010
4 Kbit, 2 Kbit and 1 Kbit serial SPI bus EEPROM
with high-speed clock
Features
■
Compatible with SPI bus serial interface
(Positive clock SPI modes)
■
Single supply voltage:
– 4.5 V to 5.5 V for M950x0
– 2.5 V to 5.5 V for M950x0-W
– 1.8 V to 5.5 V for M950x0-R
■
High speed
– 10 MHz Clock rate, 5 ms write time
■
Status Register
■
Byte and Page Write (up to 16 bytes)
■
Self-timed programming cycle
■
Adjustable size read-only EEPROM area
■
Enhanced ESD protection
■
More than 1 Million write cycles
■
More than 40-year data retention
■
Packages
– ECOPACK® (RoHS compliant)
Table 1.
SO8 (MN)
150 mil width
UFDFPN8 (MB)
2 × 3 mm
Device summary
Reference
TSSOP8 (DW)
169 mil width
Part number
M95040
M95040
M95040-W
M95040-R
M95020
M95020
M95020-W
M95020-R
M95010
M95010
M95010-W
M95010-R
September 2009
Doc ID 6512 Rev 8
1/43
www.st.com
1
Contents
M95040, M95020, M95010
Contents
1
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2
Signal description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.1
Serial Data output (Q) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.2
Serial Data input (D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.3
Serial Clock (C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.4
Chip Select (S) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.5
Hold (HOLD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.6
Write Protect (W) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.7
VSS ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.8
Supply voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.9
Supply voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.9.1
3
2.9.3
Power-up conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.9.4
Power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Connecting to the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.1
4
2.9.2
Operating supply voltage VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Device reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
SPI modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Operating features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4.1
Hold condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4.2
Status register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4.3
Data protection and protocol control . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
5
Memory organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
6
Instructions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2/43
6.1
Write Enable (WREN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
6.2
Write Disable (WRDI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
6.3
Read Status Register (RDSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
6.3.1
WIP bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
6.3.2
WEL bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Doc ID 6512 Rev 8
M95040, M95020, M95010
6.3.3
7
Contents
BP1, BP0 bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
6.4
Write Status Register (WRSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
6.5
Read from Memory Array (READ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
6.6
Write to Memory Array (WRITE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Power-up and delivery states . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
7.1
Power-up state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
7.2
Initial delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
8
Maximum rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
9
DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
10
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
11
Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
12
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Doc ID 6512 Rev 8
3/43
List of tables
M95040, M95020, M95010
List of tables
Table 1.
Table 2.
Table 3.
Table 4.
Table 5.
Table 6.
Table 7.
Table 8.
Table 9.
Table 10.
Table 11.
Table 12.
Table 13.
Table 14.
Table 15.
Table 16.
Table 17.
Table 18.
Table 19.
Table 20.
Table 21.
Table 22.
Table 23.
Table 24.
Table 25.
Table 26.
Table 27.
Table 28.
4/43
Device summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Write-protected block size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Instruction set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Status register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Address range bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Operating conditions (M950x0). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Operating conditions (M950x0-W) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Operating conditions (M950x0-R) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
AC test measurement conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
DC characteristics (M950x0, device grade 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
DC characteristics (M950x0-W, device grade 6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
DC characteristics (M950x0-W, device grade 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
DC characteristics (M950x0-R, device grade 6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
AC characteristics (M950x0, device grade 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
AC characteristics (M950x0-W, device grade 6). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
AC characteristics (M950x0-W, Device Grade 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
AC characteristics (M950x0-R, device grade 6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
SO8N — 8-lead plastic small outline, 150 mils body width, package
mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
TSSOP8 — 8-lead thin shrink small outline, package mechanical data . . . . . . . . . . . . . . . 37
UFDFPN8 (MLP8) — 8-lead ultra thin fine pitch dual flat package no lead
2 × 3mm, package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Available M95010 products (package, voltage range, temperature grade) . . . . . . . . . . . . 40
Available M95020 products (package, voltage range, temperature grade) . . . . . . . . . . . . 40
Available M95040 products (package, voltage range, temperature grade) . . . . . . . . . . . . 40
Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Doc ID 6512 Rev 8
M95040, M95020, M95010
List of figures
List of figures
Figure 1.
Figure 2.
Figure 3.
Figure 4.
Figure 5.
Figure 6.
Figure 7.
Figure 8.
Figure 9.
Figure 10.
Figure 11.
Figure 12.
Figure 13.
Figure 14.
Figure 15.
Figure 16.
Figure 17.
Figure 18.
Figure 19.
Figure 20.
Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
8-pin package connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Bus master and memory devices on the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
SPI modes supported . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Hold condition activation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Write Enable (WREN) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Write Disable (WRDI) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Read Status Register (RDSR) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Write Status Register (WRSR) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Read from Memory Array (READ) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Byte Write (WRITE) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Page Write (WRITE) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
AC test measurement I/O waveform. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Serial input timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Hold timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Serial output timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
SO8N — 8-lead plastic small outline 150 mils body width, package outline. . . . . . . . . . . . 36
TSSOP8 — 8-lead thin shrink small outline, package outline. . . . . . . . . . . . . . . . . . . . . . . 37
UFDFPN8 (MLP8) — 8-lead ultra thin fine pitch dual flat package no lead
2 × 3mm, package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Doc ID 6512 Rev 8
5/43
Description
1
M95040, M95020, M95010
Description
The M95040 is a 4 Kbit (512 x 8) electrically erasable programmable memory (EEPROM),
accessed by a high speed SPI-compatible bus. The other members of the family (M95020
and M95010) are identical, though proportionally smaller (2 and 1 Kbit, respectively).
Each device is accessed by a simple serial interface that is SPI-compatible. The bus signals
are C, D and Q, as shown in Table 2 and Figure 1.
The device is selected when Chip Select (S) is taken low. Communications with the device
can be interrupted using Hold (HOLD). WRITE instructions are disabled by Write Protect
(W).
Figure 1.
Logic diagram
VCC
D
Q
C
S
M95xxx
W
HOLD
VSS
AI01789C
Figure 2.
8-pin package connections
M95xxx
S
Q
W
VSS
1
2
3
4
8
7
6
5
VCC
HOLD
C
D
AI01790D
1. See Section 10: Package mechanical data for package dimensions, and how to identify pin-1.
6/43
Doc ID 6512 Rev 8
M95040, M95020, M95010
Table 2.
Description
Signal names
Signal name
Function
C
Serial Clock
D
Serial Data input
Q
Serial Data output
S
Chip Select
W
Write Protect
HOLD
Hold
VCC
Supply voltage
VSS
Ground
Doc ID 6512 Rev 8
7/43
Signal description
2
M95040, M95020, M95010
Signal description
During all operations, VCC must be held stable and within the specified valid range:
VCC(min) to VCC(max).
All of the input and output signals can be held high or low (according to voltages of VIH, VOH,
VIL or VOL, as specified in Table 13 to Table 16). These signals are described next.
2.1
Serial Data output (Q)
This output signal is used to transfer data serially out of the device. Data is shifted out on the
falling edge of Serial Clock (C).
2.2
Serial Data input (D)
This input signal is used to transfer data serially into the device. It receives instructions,
addresses, and the data to be written. Values are latched on the rising edge of Serial Clock
(C).
2.3
Serial Clock (C)
This input signal provides the timing of the serial interface. Instructions, addresses, or data
present at Serial Data Input (D) are latched on the rising edge of Serial Clock (C). Data on
Serial Data Output (Q) changes after the falling edge of Serial Clock (C).
2.4
Chip Select (S)
When this input signal is high, the device is deselected and Serial Data Output (Q) is at high
impedance. Unless an internal Write cycle is in progress, the device will be in the Standby
Power mode. Driving Chip Select (S) low selects the device, placing it in the Active Power
mode.
After Power-up, a falling edge on Chip Select (S) is required prior to the start of any
instruction.
2.5
Hold (HOLD)
The Hold (HOLD) signal is used to pause any serial communications with the device without
deselecting the device.
During the Hold condition, the Serial Data Output (Q) is high impedance, and Serial Data
Input (D) and Serial Clock (C) are Don’t Care.
To start the Hold condition, the device must be selected, with Chip Select (S) driven low.
8/43
Doc ID 6512 Rev 8
M95040, M95020, M95010
2.6
Signal description
Write Protect (W)
This input signal is used to control whether the memory is write protected. When Write
Protect (W) is held low, writes to the memory are disabled, but other operations remain
enabled. Write Protect (W) must either be driven high or low, but must not be left floating.
2.7
VSS ground
VSS is the reference for the VCC supply voltage.
2.8
Supply voltage (VCC)
2.9
Supply voltage (VCC)
2.9.1
Operating supply voltage VCC
Prior to selecting the memory and issuing instructions to it, a valid and stable VCC voltage
within the specified [VCC(min), VCC(max)] range must be applied (see Table 8, Table 9 and
Table 10). This voltage must remain stable and valid until the end of the transmission of the
instruction and, for a Write instruction, until the completion of the internal write cycle (tW). In
order to secure a stable DC supply voltage, it is recommended to decouple the VCC line with
a suitable capacitor (usually of the order of 10 nF to 100 nF) close to the VCC/VSS package
pins.
2.9.2
Device reset
In order to prevent inadvertent write operations during power-up, a power-on-reset (POR)
circuit is included. At power-up, the device does not respond to any instruction until VCC
reaches the internal reset threshold voltage (this threshold is defined in Table 8, Table 9 and
Table 10 as VRES).
When VCC passes over the POR threshold, the device is reset and is in the following state:
●
in Standby Power mode
●
deselected (note that, to be executed, an instruction must be preceded by a falling
edge on Chip Select (S))
●
Status register value:
–
the Write Enable Latch (WEL) is reset to 0
–
Write In Progress (WIP) is reset to 0
–
The SRWD, BP1 and BP0 bits remain unchanged (non-volatile bits)
When VCC passes over the POR threshold, the device is reset and enters the Standby
Power mode. The device must not be accessed until VCC reaches a valid and stable VCC
voltage within the specified [VCC(min), VCC(max)] range defined in Table 8, Table 9 and
Table 10.
Doc ID 6512 Rev 8
9/43
Signal description
2.9.3
M95040, M95020, M95010
Power-up conditions
When the power supply is turned on, VCC rises continuously from VSS to VCC. During this
time, the Chip Select (S) line is not allowed to float but should follow the VCC voltage. It is
therefore recommended to connect the S line to VCC via a suitable pull-up resistor (see
Figure 3).
In addition, the Chip Select (S) input offers a built-in safety feature, as the S input is edge
sensitive as well as level sensitive: after power-up, the device does not become selected
until a falling edge has first been detected on Chip Select (S). This ensures that Chip Select
(S) must have been high, prior to going low to start the first operation.
The VCC voltage has to rise continuously from 0 V up to the minimum VCC operating voltage
defined in Table 8, Table 9 and Table 10 and the rise time must not vary faster than 1 V/µs.
2.9.4
Power-down
During power-down (continuous decrease in the VCC supply voltage below the minimum
VCC operating voltage defined in Table 8, Table 9 and Table 10), the device must be:
10/43
●
deselected (Chip Select S should be allowed to follow the voltage applied on VCC)
●
in Standby Power mode (there should not be any internal write cycle in progress).
Doc ID 6512 Rev 8
M95040, M95020, M95010
3
Connecting to the SPI bus
Connecting to the SPI bus
These devices are fully compatible with the SPI protocol.
All instructions, addresses and input data bytes are shifted in to the device, most significant
bit first. The Serial Data Input (D) is sampled on the first rising edge of the Serial Clock (C)
after Chip Select (S) goes low.
All output data bytes are shifted out of the device, most significant bit first. The Serial Data
Output (Q) is latched on the first falling edge of the Serial Clock (C) after the instruction
(such as the Read from Memory Array and Read Status Register instructions) have been
clocked into the device.
Figure 3 shows an example of three memory devices connected to an MCU, on an SPI bus.
Only one memory device is selected at a time, so only one memory device drives the Serial
Data output (Q) line at a time, the other memory devices are high impedance.
The pull-up resistor R (represented in Figure 3) ensures that a device is not selected if the
bus master leaves the S line in the high impedance state.
In applications where the bus master might enter a state where all SPI bus inputs/outputs
would be in high impedance at the same time (for example, if the bus master is reset during
the transmission of an Instruction), the clock line (C) must be connected to an external pulldown resistor so that, if all inputs/outputs become high impedance, the C line is pulled low
(while the S line is pulled high): this ensures that S and C do not become high at the same
time, and so, that the tSHCH requirement is met. The typical value of R is 100 k.
Figure 3.
Bus master and memory devices on the SPI bus
VSS
VCC
R
SDO
SPI Interface with
(CPOL, CPHA) =
(0, 0) or (1, 1)
SDI
SCK
VCC
C Q D
Bus master
SPI mmory
device
R
CS3
VCC
C Q D
VSS
VCC
C Q D
VSS
SPI memory
device
R
VSS
SPI memory
device
R
CS2 CS1
S
W
HOLD
S
W
HOLD
S
W
HOLD
AI12304b
1. The Write Protect (W) and Hold (HOLD) signals should be driven, high or low as appropriate.
Doc ID 6512 Rev 8
11/43
Connecting to the SPI bus
3.1
M95040, M95020, M95010
SPI modes
These devices can be driven by a microcontroller with its SPI peripheral running in either of
the two following modes:
●
CPOL=0, CPHA=0
●
CPOL=1, CPHA=1
For these two modes, input data is latched in on the rising edge of Serial Clock (C), and
output data is available from the falling edge of Serial Clock (C).
The difference between the two modes, as shown in Figure 4, is the clock polarity when the
bus master is in Stand-by mode and not transferring data:
●
C remains at 0 for (CPOL=0, CPHA=0)
●
C remains at 1 for (CPOL=1, CPHA=1)
Figure 4.
SPI modes supported
CPOL CPHA
0
0
C
1
1
C
D
MSB
Q
MSB
AI01438B
12/43
Doc ID 6512 Rev 8
M95040, M95020, M95010
Operating features
4
Operating features
4.1
Hold condition
The Hold (HOLD) signal is used to pause any serial communications with the device without
resetting the clocking sequence.
During the Hold condition, the Serial Data Output (Q) is high impedance, and Serial Data
Input (D) and Serial Clock (C) are Don’t Care.
To enter the Hold condition, the device must be selected, with Chip Select (S) low.
Normally, the device is kept selected, for the whole duration of the Hold condition.
Deselecting the device while it is in the Hold condition, has the effect of resetting the state of
the device, and this mechanism can be used if it is required to reset any processes that had
been in progress.
The Hold condition starts when the Hold (HOLD) signal is driven low at the same time as
Serial Clock (C) already being low (as shown in Figure 5).
The Hold condition ends when the Hold (HOLD) signal is driven high at the same time as
Serial Clock (C) already being low.
Figure 5 also shows what happens if the rising and falling edges are not timed to coincide
with Serial Clock (C) being low.
Figure 5.
Hold condition activation
C
HOLD
Hold
Condition
Hold
Condition
AI02029D
4.2
Status register
Figure 6 shows the position of the Status register in the control logic of the device. This
register contains a number of control bits and status bits, as shown in Table 5. For a detailed
description of the Status register bits, see Section 6.3: Read Status Register (RDSR).
Doc ID 6512 Rev 8
13/43
Operating features
4.3
M95040, M95020, M95010
Data protection and protocol control
To help protect the device from data corruption in noisy or poorly controlled environments, a
number of safety features have been built in to the device. The main security measures can
be summarized as follows:
●
The WEL bit is reset at power-up.
●
Chip Select (S) must rise after the eighth clock count (or multiple thereof) in order to
start a non-volatile Write cycle (in the memory array or in the Status register).
●
Accesses to the memory array are ignored during the non-volatile programming cycle,
and the programming cycle continues unaffected.
●
Invalid Chip Select (S) and Hold (HOLD) transitions are ignored.
For any instruction to be accepted and executed, Chip Select (S) must be driven high after
the rising edge of Serial Clock (C) that latches the last bit of the instruction, and before the
next rising edge of Serial Clock (C).
For this, “the last bit of the instruction” can be the eighth bit of the instruction code, or the
eighth bit of a data byte, depending on the instruction (except in the case of RDSR and
READ instructions). Moreover, the "next rising edge of CLOCK" might (or might not) be the
next bus transaction for some other device on the bus.
When a Write cycle is in progress, the device protects it against external interruption by
ignoring any subsequent READ, WRITE or WRSR instruction until the present cycle is
complete.
Table 3.
Write-protected block size
Status register bits
Protected array addresses
Protected block
14/43
BP1
BP0
M95040
M95020
M95010
0
0
none
none
none
none
0
1
Upper quarter
180h - 1FFh
C0h - FFh
60h - 7Fh
1
0
Upper half
100h - 1FFh
80h - FFh
40h - 7Fh
1
1
Whole memory
000h - 1FFh
00h - FFh
00h - 7Fh
Doc ID 6512 Rev 8
M95040, M95020, M95010
Memory organization
The memory is organized as shown in Figure 6.
Figure 6.
Block diagram
HOLD
W
High Voltage
Generator
Control Logic
S
C
D
I/O Shift Register
Q
Address Register
and Counter
Data
Register
Status
Register
Size of the
Read only
EEPROM
area
Y Decoder
5
Memory organization
1 Page
X Decoder
AI01272C
Doc ID 6512 Rev 8
15/43
Instructions
6
M95040, M95020, M95010
Instructions
Each instruction starts with a single-byte code, as summarized in Table 4.
If an invalid instruction is sent (one not contained in Table 4), the device automatically
deselects itself.
Table 4.
Instruction set
Instruction
Description
Instruction Format
WREN
Write Enable
0000 X110(1)
WRDI
Write Disable
0000 X100(1)
RDSR
Read Status Register
0000 X101(1)
WRSR
Write Status Register
0000 X001(1)
READ
Read from Memory Array
0000 A8011(2)
WRITE
Write to Memory Array
0000 A8010(2)
1. X = Don’t Care.
2. A8 = 1 for the upper half of the memory array of the M95040, and 0 for the lower half, and is Don’t Care for
other devices.
6.1
Write Enable (WREN)
The Write Enable Latch (WEL) bit must be set prior to each WRITE and WRSR instruction.
The only way to do this is to send a Write Enable instruction to the device.
As shown in Figure 7, to send this instruction to the device, Chip Select (S) is driven low,
and the bits of the instruction byte are shifted in, on Serial Data Input (D). The device then
enters a wait state. It waits for a the device to be deselected, by Chip Select (S) being driven
high.
Figure 7.
Write Enable (WREN) sequence
S
0
1
2
3
4
5
6
7
C
Instruction
D
High Impedance
Q
AI01441D
16/43
Doc ID 6512 Rev 8
M95040, M95020, M95010
6.2
Instructions
Write Disable (WRDI)
One way of resetting the Write Enable Latch (WEL) bit is to send a Write Disable instruction
to the device.
As shown in Figure 8, to send this instruction to the device, Chip Select (S) is driven low,
and the bits of the instruction byte are shifted in, on Serial Data Input (D).
The device then enters a wait state. It waits for a the device to be deselected, by Chip Select
(S) being driven high.
The Write Enable Latch (WEL) bit, in fact, becomes reset by any of the following events:
●
Power-up
●
WRDI instruction execution
●
WRSR instruction completion
●
WRITE instruction completion
●
Write Protect (W) line being held low.
Figure 8.
Write Disable (WRDI) sequence
S
0
1
2
3
4
5
6
7
C
Instruction
D
High Impedance
Q
AI03790D
Doc ID 6512 Rev 8
17/43
Instructions
6.3
M95040, M95020, M95010
Read Status Register (RDSR)
One of the major uses of this instruction is to allow the MCU to poll the state of the Write In
Progress (WIP) bit. This is needed because the device will not accept further WRITE or
WRSR instructions when the previous Write cycle is not yet finished.
As shown in Figure 9, to send this instruction to the device, Chip Select (S) is first driven low.
The bits of the instruction byte are then shifted in, on Serial Data Input (D). The current state
of the bits in the Status register is shifted out, on Serial Data Out (Q). The Read Cycle is
terminated by driving Chip Select (S) high.
The Status register may be read at any time, even during a Write cycle (whether it be to the
memory area or to the Status register). All bits of the Status register remain valid, and can
be read using the RDSR instruction. However, during the current Write cycle, the values of
the non-volatile bits (BP0, BP1) become frozen at a constant value. The updated value of
these bits becomes available when a new RDSR instruction is executed, after completion of
the Write cycle. On the other hand, the two read-only bits (Write Enable Latch (WEL), Write
In Progress (WIP)) are dynamically updated during the on-going Write cycle.
Bits b7, b6, b5 and b4 are always read as 1. The status and control bits of the Status
register are as follows:
6.3.1
WIP bit
The Write In Progress (WIP) bit indicates whether the memory is busy with a Write or Write
Status register cycle. When set to 1, such a cycle is in progress, when reset to 0 no such
cycle is in progress.
6.3.2
WEL bit
The Write Enable Latch (WEL) bit indicates the status of the internal Write Enable Latch.
When set to 1 the internal Write Enable Latch is set, when set to 0 the internal Write Enable
Latch is reset and no Write or Write Status Register instruction is accepted.
6.3.3
BP1, BP0 bits
The Block Protect (BP1, BP0) bits are non-volatile. They define the size of the area to be
software protected against Write instructions. These bits are written with the Write Status
Register (WRSR) instruction. When one or both of the Block Protect (BP1, BP0) bits is set to
1, the relevant memory area (as defined in Table 3) becomes protected against Write
(WRITE) instructions. The Block Protect (BP1, BP0) bits can be written provided that the
Hardware Protected mode has not been set.
Table 5.
Status register format
b7
1
b0
1
1
1
BP1
BP0
WEL
WIP
Block Protect bits
Write Enable Latch bit
Write In Progress bit
18/43
Doc ID 6512 Rev 8
M95040, M95020, M95010
Figure 9.
Instructions
Read Status Register (RDSR) sequence
S
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15
C
Instruction
D
Status Register Out
Status Register Out
High Impedance
Q
7
6
5
4
3
MSB
2
1
0
7
6
5
4
3
2
1
0
7
MSB
AI01444D
Doc ID 6512 Rev 8
19/43
Instructions
6.4
M95040, M95020, M95010
Write Status Register (WRSR)
The Write Status Register (WRSR) instruction allows new values to be written to the Status
register. Before it can be accepted, a Write Enable (WREN) instruction must previously have
been executed.
The Write Status Register (WRSR) instruction is entered by driving Chip Select (S) low,
sending the instruction code followed by the data byte on Serial Data input (D), and driving
the Chip Select (S) signal high. Chip Select (S) must be driven high after the rising edge of
Serial Clock (C) that latches in the eighth bit of the data byte, and before the next rising edge
of Serial Clock (C). Otherwise, the Write Status Register (WRSR) instruction is not
executed.
Driving the Chip Select (S) signal high at a byte boundary of the input data triggers the selftimed write cycle that takes tW to complete (as specified in Table 13 to Table 20). The
instruction sequence is shown in Figure 10.
While the Write Status Register cycle is in progress, the Status register may still be read to
check the value of the Write in progress (WIP) bit: the WIP bit is 1 during the self-timed write
cycle tW, and, 0 when the write cycle is complete. The WEL bit (Write enable latch) is also
reset at the end of the write cycle tW.
The Write Status Register (WRSR) instruction allows the user to change the values of the
BP1, BP0 bits which define the size of the area that is to be treated as read only, as defined
in Table 3.
The contents of the BP1, BP0 bits are updated after the completion of the WRSR
instruction, including the tW write cycle.
The Write Status Register (WRSR) instruction has no effect on the b7, b6, b5, b4, b1 and b0
bits in the Status register. Bits b7, b6, b5, b4 are always read as 0.
Figure 10. Write Status Register (WRSR) sequence
S
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15
C
Instruction
Status
Register In
7
D
High Impedance
6
5
4
3
2
1
0
MSB
Q
AI01445B
The instruction is not accepted, and is not executed, under the following conditions:
20/43
●
if the Write Enable Latch (WEL) bit has not been set to 1 (by executing a Write Enable
instruction just before)
●
if a write cycle is already in progress
●
if the device has not been deselected, by Chip Select (S) being driven high, after the
eighth bit, b0, of the data byte has been latched in
●
if Write Protect (W) is low during the WRSR command (instruction, address and data)
Doc ID 6512 Rev 8
M95040, M95020, M95010
6.5
Instructions
Read from Memory Array (READ)
As shown in Figure 11, to send this instruction to the device, Chip Select (S) is first driven
low. The bits of the instruction byte and address byte are then shifted in, on Serial Data Input
(D). For the M95040, the most significant address bit, A8, is incorporated as bit b3 of the
instruction byte, as shown in Table 4. The address is loaded into an internal address
register, and the byte of data at that address is shifted out, on Serial Data Output (Q).
If Chip Select (S) continues to be driven low, an internal bit-pointer is automatically
incremented at each clock cycle, and the corresponding data bit is shifted out.
When the highest address is reached, the address counter rolls over to zero, allowing the
Read cycle to be continued indefinitely. The whole memory can, therefore, be read with a
single READ instruction.
The Read cycle is terminated by driving Chip Select (S) high. The rising edge of the Chip
Select (S) signal can occur at any time during the cycle.
The first byte addressed can be any byte within any page.
The instruction is not accepted, and is not executed, if a Write cycle is currently in progress.
Table 6.
Address range bits
Device
Address Bits
M95040
M95020
M95010
A8-A0
A7-A0
A6-A0
Figure 11. Read from Memory Array (READ) sequence
S
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15 16 17 18 19 20 21 22
C
Instruction
D
A8
Byte Address
A7 A6 A5 A4 A3 A2 A1 A0
Data Out
High Impedance
7
Q
6
5
4
3
2
1
0
AI01440E
1. Depending on the memory size, as shown in Table 6, the most significant address bits are Don’t Care.
Doc ID 6512 Rev 8
21/43
Instructions
6.6
M95040, M95020, M95010
Write to Memory Array (WRITE)
As shown in Figure 12, to send this instruction to the device, Chip Select (S) is first driven
low. The bits of the instruction byte, address byte, and at least one data byte are then shifted
in, on Serial Data input (D). The instruction is terminated by driving Chip Select (S) high at a
byte boundary of the input data. The self-timed Write cycle, triggered by the rising edge of
Chip Select (S), continues for a period tW (as specified in Table 13 to Table 20). After this
time, the Write in Progress (WIP) bit is reset to 0.
In the case of Figure 12, Chip Select (S) is driven high after the eighth bit of the data byte
has been latched in, indicating that the instruction is being used to write a single byte. If,
though, Chip Select (S) continues to be driven low, as shown in Figure 13, the next byte of
input data is shifted in, so that more than a single byte, starting from the given address
towards the end of the same page, can be written in a single internal Write cycle. If Chip
Select (S) still continues to be driven low, the next byte of input data is shifted in, and used to
overwrite the byte at the start of the current page.
The instruction is not accepted, and is not executed, under the following conditions:
Note:
●
if the Write Enable Latch (WEL) bit has not been set to 1 (by executing a Write Enable
instruction just before)
●
if a Write cycle is already in progress
●
if the device has not been deselected, by Chip Select (S) being driven high, at a byte
boundary (after the rising edge of Serial Clock (C) that latches the last data bit, and
before the next rising edge of Serial Clock (C) occurs anywhere on the bus)
●
if Write Protect (W) is low or if the addressed page is in the area protected by the Block
Protect (BP1 and BP0) bits
The self-timed write cycle tW is internally executed as a sequence of two consecutive
events: [Erase addressed byte(s)], followed by [Program addressed byte(s)]. An erased bit is
read as “0” and a programmed bit is read as “1”.
Figure 12. Byte Write (WRITE) sequence
S
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
C
Instruction
D
A8
Byte Address
A7 A6 A5 A4 A3 A2 A1 A0 7
Data Byte
6
5
4
3
2
1
0
High Impedance
Q
AI01442D
1. Depending on the memory size, as shown in Table 6, the most significant address bits are Don’t Care.
22/43
Doc ID 6512 Rev 8
M95040, M95020, M95010
Instructions
Figure 13. Page Write (WRITE) sequence
S
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
C
Instruction
Byte Address
A8
D
Data Byte 1
A7 A6 A5 A4 A3 A2 A1 A0 7
6
5
4
3
2
1
0
7
143
142
141
140
139
138
137
136
15+8N
14+8N
13+8N
12+8N
11+8N
10+8N
9+8N
24 25 26 27 28 29 30 31
8+8N
S
C
Data Byte 2
D
7
6
5
4
3
2
Data Byte N
1
0
7
6
5
4
3
2
Data Byte 16
1
0
7
6
5
4
3
2
1
0
AI01443D
1. Depending on the memory size, as shown in Table 6, the most significant address bits are Don’t Care.
Doc ID 6512 Rev 8
23/43
Power-up and delivery states
M95040, M95020, M95010
7
Power-up and delivery states
7.1
Power-up state
After Power-up, the device is in the following state:
●
low power Standby Power mode
●
deselected (after Power-up, a falling edge is required on Chip Select (S) before any
instructions can be started).
●
not in the Hold Condition
●
the Write Enable Latch (WEL) is reset to 0
●
Write In Progress (WIP) is reset to 0
The BP1 and BP0 bits of the Status register are unchanged from the previous power-down
(they are non-volatile bits).
7.2
Initial delivery state
The device is delivered with the memory array set at all 1s (FFh). The Block Protect (BP1
and BP0) bits are initialized to 0.
24/43
Doc ID 6512 Rev 8
M95040, M95020, M95010
8
Maximum rating
Maximum rating
Stressing the device outside the ratings listed in Table 7 may cause permanent damage to
the device. These are stress ratings only, and operation of the device at these, or any other
conditions outside those indicated in the operating sections of this specification, is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability. Refer also to the STMicroelectronics SURE Program and other relevant
quality documents.
Table 7.
Absolute maximum ratings
Symbol
TA
TSTG
TLEAD
Parameter
Min.
Max.
Unit
Ambient operating temperature
–40
130
°C
Storage temperature
–65
150
°C
(1)
°C
Lead temperature during soldering
see note
VO
Output voltage
–0.50
VCC+0.6
V
VI
Input voltage
–0.50
6.5
V
IOL
DC output current (Q = 0)
5
mA
IIH
DC output current (Q = 1)
–5
mA
–0.50
6.5
V
–4000
4000
V
VCC
VESD
Supply voltage
Electrostatic discharge voltage (human body
model)(2)
1. Compliant with JEDEC Std J-STD-020C (for small body, Sn-Pb or Pb assembly), the ST ECOPACK®
7191395 specification, and the European directive on Restrictions on Hazardous Substances (RoHS)
2002/95/EU.
2. AEC-Q100-002 (compliant with JEDEC Std JESD22-A114, C1=100pF, R1=1500, R2=500)
Doc ID 6512 Rev 8
25/43
DC and AC parameters
9
M95040, M95020, M95010
DC and AC parameters
This section summarizes the operating and measurement conditions, and the DC and AC
characteristics of the device. The parameters in the DC and AC characteristic tables that
follow are derived from tests performed under the measurement conditions summarized in
the relevant tables. Designers should check that the operating conditions in their circuit
match the measurement conditions when relying on the quoted parameters.
Table 8.
Operating conditions (M950x0)
Symbol
VCC
TA
Table 9.
Parameter
Min.
Max.
Unit
Supply voltage
4.5
5.5
V
Ambient operating temperature (device grade 3)
–40
125
°C
Min.
Max.
Unit
Supply voltage
2.5
5.5
V
Ambient operating temperature (device grade 6)
–40
85
°C
Ambient operating temperature (device grade 3)
–40
125
°C
Operating conditions (M950x0-W)
Symbol
VCC
TA
Table 10.
Parameter
Operating conditions (M950x0-R)
Symbol
VCC
TA
Table 11.
Parameter
Min.
Max.
Unit
Supply voltage
1.8
5.5
V
Ambient operating temperature
–40
85
°C
Min.
Max.
Unit
AC test measurement conditions
Symbol
CL
Parameter
Load capacitance
30
Input rise and fall times
50
ns
Input pulse voltages
0.2VCC to 0.8VCC
V
Input and output timing reference voltages
0.3VCC to 0.7VCC
V
1. Output Hi-Z is defined as the point where data out is no longer driven.
26/43
pF
Doc ID 6512 Rev 8
M95040, M95020, M95010
DC and AC parameters
Figure 14. AC test measurement I/O waveform
Input Levels
Input and Output
Timing Reference Levels
0.8VCC
0.7VCC
0.3VCC
0.2VCC
AI00825B
Table 12.
Symbol
COUT
CIN
Capacitance
Parameter
Test condition
Max.
Unit
VOUT = 0 V
8
pF
Input capacitance (D)
VIN = 0 V
8
pF
Input capacitance (other pins)
VIN = 0 V
6
pF
Max.
Unit
VIN = VSS or VCC
±2
µA
S = VCC, VOUT = VSS or VCC
±2
µA
C = 0.1VCC/0.9VCC at 5 MHz,
VCC = 5 V, Q = open
3
mA
S = VCC, VIN = VSS or VCC
VCC = 5 V
5
µA
Output capacitance (Q)
Min.
1. Sampled only, not 100% tested, at TA=25°C and a frequency of 5MHz.
Table 13.
Symbol
DC characteristics (M950x0, device grade 3)
Parameter
Test condition
Min.
ILI
Input leakage current
ILO
Output leakage current
ICC
Supply current
ICC1
Supply current
(Standby Power mode)
VIL
Input low voltage
–0.45
0.3 VCC
V
VIH
Input high voltage
0.7 VCC
VCC+1
V
VOL
Output low voltage
IOL = 2 mA, VCC = 5 V
0.4
V
VOH
Output high voltage
IOH = –2 mA, VCC = 5 V
VRES(1)
Internal reset threshold
voltage
0.8 VCC
2.5
V
4.0
V
1. Characterized only, not 100% tested.
Doc ID 6512 Rev 8
27/43
DC and AC parameters
Table 14.
Symbol
M95040, M95020, M95010
DC characteristics (M950x0-W, device grade 6)
Parameter
Test condition
Max.
Unit
VIN = VSS or VCC
±2
µA
S = VCC, VOUT = VSS or VCC
±2
µA
C = 0.1VCC/0.9VCC at 5 MHz,
VCC = 2.5 V, Q = open
2
mA
S = VCC, VIN = VSS or VCC
VCC = 2.5 V
1
µA
ILI
Input leakage current
ILO
Output leakage current
ICC
Supply current
ICC1
Supply current
(Standby Power mode)
VIL
Input low voltage
–0.45
0.3 VCC
V
VIH
Input high voltage
0.7 VCC
VCC+1
V
VOL
Output low voltage
IOL = 1.5 mA, VCC = 2.5 V
0.4
V
VOH
Output high voltage
IOH = –0.4 mA, VCC = 2.5 V
VRES(1)
Internal reset threshold
voltage
1. Characterized only, not 100% tested.
28/43
Min.
Doc ID 6512 Rev 8
0.8 VCC
1.0
V
1.65
V
M95040, M95020, M95010
Table 15.
Symbol
DC and AC parameters
DC characteristics (M950x0-W, device grade 3)
Parameter
Test condition
Min.
Max.
Unit
VIN = VSS or VCC
±2
µA
ILI
Input leakage current
ILO
Output leakage current
S = VCC, VOUT = VSS or VCC
±2
µA
ICC
Supply current
C = 0.1VCC/0.9VCC at 5 MHz,
VCC = 2.5 V, Q = open
2
mA
ICC1
Supply current
(Standby Power mode)
S = VCC, VIN = VSS or VCC
VCC = 2.5 V
2
µA
VIL
Input low voltage
–0.45
0.3 VCC
V
VIH
Input high voltage
0.7 VCC
VCC+1
V
VOL
Output low voltage
IOL = 1.5 mA, VCC = 2.5 V
0.4
V
VOH
Output high voltage
IOH = –0.4 mA, VCC = 2.5 V
VRES
(1)
Internal reset threshold voltage
0.8 VCC
V
1.0
1.65
V
Min.
Max.
Unit
1. Characterized only, not 100% tested.
Table 16.
Symbol
DC characteristics (M950x0-R, device grade 6)
Parameter
Test condition
ILI
Input leakage current VIN = VSS or VCC
±2
µA
ILO
Output leakage
current
±2
µA
VCC = 2.5 V, C = 0.1 VCC or 0.9VCC,
fC = 5 MHz, Q = open
3
mA
VCC = 1.8 V, C = 0.1VCC or 0.9VCC at
max clock frequency, Q = open
2
mA
VCC = 5.0 V, S = VCC, VIN = VSS or VCC
2
µA
VCC = 2.5 V, S = VCC, VIN = VSS or VCC
1
µA
VCC = 1.8 V, S = VCC, VIN = VSS or VCC
1
µA
ICCR
ICC1
Supply current
(Read)
Supply current
(Standby)
VIL
Input low voltage
VIH
Input high voltage
VOL
VOH
VRES(1)
Output low voltage
Output high voltage
S = VCC, voltage applied on Q = VSS or
VCC
2.5 V < VCC < 5.5 V
–0.45
0.3VCC
V
1.8 V < VCC < 2.5 V
–0.45
0.25VCC
V
2.5 V < VCC < 5.5 V
0.7VCC
VCC+1
V
1.8 V < VCC < 2.5 V
0.75VCC
VCC+1
V
VCC = 2.5 V, IOL = 1.5 mA,
or VCC = 5.5 V, IOL = 2 mA
0.2VCC
V
VCC = 1.8 V, IOL = 0.15 mA
0.3
V
VCC = 2.5 V, IOH = –0.4 mA,
or VCC = 5.5 V, IOH = –2 mA,
or VCC = 1.8 V, IOH = –0.1 mA
Internal reset
threshold voltage
0.8VCC
1.0
V
1.65
V
1. Characterized only, not 100% tested.
Doc ID 6512 Rev 8
29/43
DC and AC parameters
Table 17.
M95040, M95020, M95010
AC characteristics (M950x0, device grade 3)
Test conditions specified in Table 11 and Table 8
Symbol
Alt.
fC
fSCK
Clock frequency
tSLCH
tCSS1
S active setup time
90
ns
tSHCH
tCSS2
S not active setup time
90
ns
tSHSL
tCS
S deselect time
100
ns
tCHSH
tCSH
S active hold time
90
ns
S not active hold time
90
ns
tCHSL
Parameter
Max.
Unit
D.C.
5
MHz
tCH(1)
tCLH
Clock high time
90
ns
tCL(1)
90
ns
tCLL
Clock low time
tCLCH
(2)
tRC
Clock rise time
1
µs
tCHCL
(2)
tFC
Clock fall time
1
µs
tDVCH
tDSU
Data in setup time
20
ns
tCHDX
tDH
Data in hold time
30
ns
tHHCH
Clock low hold time after HOLD not active
70
ns
tHLCH
Clock low hold time after HOLD active
40
ns
tCLHL
Clock low setup time before HOLD active
0
ns
tCLHH
Clock low setup time before HOLD not active
0
ns
tSHQZ
(2)
tDIS
Output disable time
100
ns
Clock low to output valid
60
ns
tCLQV
tV
tCLQX
tHO
Output hold time
tQLQH(2)
tRO
Output rise time
50
ns
tQHQL(2)
tFO
Output fall time
50
ns
tHHQV
tLZ
HOLD high to output valid
50
ns
tHLQZ(2)
tHZ
HOLD low to output high-Z
100
ns
tW
tWC
Write time
5
ms
1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max)
2. Value guaranteed by characterization, not 100% tested in production.
30/43
Min.
Doc ID 6512 Rev 8
0
ns
M95040, M95020, M95010
Table 18.
DC and AC parameters
AC characteristics (M950x0-W, device grade 6)
Test conditions specified in Table 11 and Table 9
Symbol
Alt.
fC
fSCK
Clock frequency
tSLCH
tCSS1
S active setup time
15
ns
tSHCH
tCSS2
S not active setup time
15
ns
tSHSL
tCS
S deselect time
40
ns
tCHSH
tCSH
S active hold time
25
ns
S not active hold time
15
ns
tCHSL
Parameter
Min.
Max.
Unit
D.C.
10
MHz
tCH(1)
tCLH
Clock high time
40
ns
(1)
40
ns
tCLL
Clock low time
tCLCH
(2)
tRC
Clock rise time
1
µs
tCHCL
(2)
tFC
Clock fall time
1
µs
tCL
tDVCH
tDSU
Data in setup time
15
ns
tCHDX
tDH
Data in hold time
15
ns
tHHCH
Clock low hold time after HOLD not active
15
ns
tHLCH
Clock low hold time after HOLD active
20
ns
tCLHL
Clock low setup time before HOLD active
0
ns
tCLHH
Clock low setup time before HOLD not active
0
ns
tSHQZ(2)
tDIS
tCLQV
tV
tCLQX
Output disable time
25
ns
Clock low to output valid
35
ns
tHO
Output hold time
tQLQH
(2)
0
ns
tRO
Output rise time
20
ns
tQHQL
(2)
tFO
Output fall time
20
ns
tHHQV
tLZ
HOLD high to output valid
25
ns
tHLQZ(2)
tHZ
HOLD low to output high-Z
35
ns
tW
tWC
Write time
5
ms
1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max)
2. Value guaranteed by characterization, not 100% tested in production.
Doc ID 6512 Rev 8
31/43
DC and AC parameters
Table 19.
M95040, M95020, M95010
AC characteristics (M950x0-W, Device Grade 3)
Test conditions specified in Table 11 and Table 9
Symbol
Alt.
fC
fSCK
Clock frequency
tSLCH
tCSS1
S active setup time
90
ns
tSHCH
tCSS2
S not active setup time
90
ns
tSHSL
tCS
S deselect time
100
ns
tCHSH
tCSH
S active hold time
90
ns
S not active hold time
90
ns
tCHSL
Parameter
Max.
Unit
D.C.
5
MHz
tCH(1)
tCLH
Clock high time
90
ns
(1)
90
ns
tCLL
Clock low time
tCLCH(2)
tRC
Clock rise time
1
µs
tCHCL(2)
tFC
Clock fall time
1
µs
tDVCH
tDSU
Data in setup time
20
ns
tCHDX
tDH
Data in hold time
30
ns
tHHCH
Clock low hold time after HOLD not active
70
ns
tHLCH
Clock low hold time after HOLD active
40
ns
tCLHL
Clock low setup time before HOLD active
0
ns
tCLHH
Clock low setup time before HOLD not active
0
ns
tCL
tSHQZ(2)
tDIS
tCLQV
tV
tCLQX
tHO
Output hold time
tQLQH(2)
tRO
Output rise time
50
ns
(2)
tFO
Output fall time
50
ns
tHHQV
tLZ
HOLD high to output valid
50
ns
tHLQZ(2)
tHZ
HOLD low to output high-Z
100
ns
tW
tWC
Write time
5
ms
tQHQL
Output disable time
100
ns
Clock low to output valid
60
ns
1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max)
2. Value guaranteed by characterization, not 100% tested in production.
32/43
Min.
Doc ID 6512 Rev 8
0
ns
M95040, M95020, M95010
Table 20.
DC and AC parameters
AC characteristics (M950x0-R, device grade 6)
Test conditions specified in Table 11 and Table 10(1)
Symbol
Alt.
fC
fSCK
Clock frequency
tSLCH
tCSS1
S active setup time
90
ns
tSHCH
tCSS2
S not active setup time
90
ns
tSHSL
tCS
S deselect time
100
ns
tCHSH
tCSH
S active hold time
90
ns
S not active hold time
90
ns
tCHSL
Parameter
Min.
Max.
Unit
D.C.
5
MHz
tCH(2)
tCLH
Clock high time
90
ns
tCL(1)
90
ns
tCLL
Clock low time
tCLCH
(3)
tRC
Clock rise time
1
µs
tCHCL
(2)
tFC
Clock fall time
1
µs
tDVCH
tDSU
Data in setup time
20
ns
tCHDX
tDH
Data in hold time
30
ns
tHHCH
Clock low hold time after HOLD not active
70
ns
tHLCH
Clock low hold time after HOLD active
40
ns
tCLHL
Clock low setup time before HOLD active
0
ns
tCLHH
Clock low setup time before HOLD not active
0
ns
tSHQZ(2)
tDIS
tCLQV
tV
tCLQX
Output disable time
100
ns
Clock low to output valid
80
ns
tHO
Output hold time
tQLQH
(2)
0
ns
tRO
Output rise time
50
ns
tQHQL
(2)
tFO
Output fall time
50
ns
tHHQV
tLZ
HOLD high to output valid
50
ns
tHLQZ(2)
tHZ
HOLD low to output high-Z
100
ns
tW
tWC
Write time
5
ms
1. The test flow guarantees the AC parameter values defined in this table (when VCC = 1.8 V) and the AC
parameter values defined in Table 18: AC characteristics (M950x0-W, device grade 6) (when VCC = 2.5 or
when VCC = 5.0 V).
2. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max)
3. Value guaranteed by characterization, not 100% tested in production.
Doc ID 6512 Rev 8
33/43
DC and AC parameters
M95040, M95020, M95010
Figure 15. Serial input timing
tSHSL
S
tCHSL
tCH
tSLCH
tCHSH
tSHCH
C
tDVCH
tCHCL
tCL
tCLCH
tCHDX
D
Q
LSB IN
MSB IN
High impedance
AI01447d
Figure 16. Hold timing
S
tHLCH
tCLHL
tHHCH
C
tCLHH
tHLQZ
tHHQV
Q
HOLD
AI01448c
34/43
Doc ID 6512 Rev 8
M95040, M95020, M95010
DC and AC parameters
Figure 17. Serial output timing
S
tCH
tSHSL
C
tCLQV
tCLCH
tCHCL
tCL
tSHQZ
tCLQX
Q
tQLQH
tQHQL
ADDR
D LSB IN
AI01449f
Doc ID 6512 Rev 8
35/43
Package mechanical data
10
M95040, M95020, M95010
Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
Figure 18. SO8N — 8-lead plastic small outline 150 mils body width, package outline
h x 45˚
A2
A
c
ccc
b
e
0.25 mm
GAUGE PLANE
D
k
8
E1
E
1
A1
L
L1
SO-A
1. Drawing is not to scale.
Table 21.
SO8N — 8-lead plastic small outline, 150 mils body width, package
mechanical data
inches(1)
millimeters
Symbol
Typ
Min
A
Max
Typ
1.75
Max
0.0689
A1
0.1
A2
1.25
b
0.28
0.48
0.011
0.0189
c
0.17
0.23
0.0067
0.0091
ccc
0.25
0.0039
0.0098
0.0492
0.1
0.0039
D
4.9
4.8
5
0.1929
0.189
0.1969
E
6
5.8
6.2
0.2362
0.2283
0.2441
E1
3.9
3.8
4
0.1535
0.1496
0.1575
e
1.27
-
-
0.05
-
-
h
0.25
0.5
0.0098
0.0197
k
0°
8°
0°
8°
L
0.4
1.27
0.0157
0.05
L1
1.04
0.0409
1. Values in inches are converted from mm and rounded to 4 decimal digits.
36/43
Min
Doc ID 6512 Rev 8
M95040, M95020, M95010
Package mechanical data
Figure 19. TSSOP8 — 8-lead thin shrink small outline, package outline
D
8
5
c
E1
1
E
4
α
A1
A
L
A2
L1
CP
b
e
TSSOP8AM
1. Drawing is not to scale.
Table 22.
TSSOP8 — 8-lead thin shrink small outline, package mechanical data
inches(1)
millimeters
Symbol
Typ
Min
Max
A
Min
1.2
A1
0.05
0.15
0.8
1.05
b
0.19
c
0.09
A2
Typ
1
CP
Max
0.0472
0.002
0.0059
0.0315
0.0413
0.3
0.0075
0.0118
0.2
0.0035
0.0079
0.0394
0.1
0.0039
D
3
2.9
3.1
0.1181
0.1142
0.122
e
0.65
-
-
0.0256
-
-
E
6.4
6.2
6.6
0.252
0.2441
0.2598
E1
4.4
4.3
4.5
0.1732
0.1693
0.1772
L
0.6
0.45
0.75
0.0236
0.0177
0.0295
L1
1
0°
8°
0.0394

0°
N (number of leads)
8
8°
8
1. Values in inches are converted from mm and rounded to 4 decimal digits.
Doc ID 6512 Rev 8
37/43
Package mechanical data
M95040, M95020, M95010
Figure 20. UFDFPN8 (MLP8) — 8-lead ultra thin fine pitch dual flat package no lead
2 × 3mm, package outline
e
D
b
L1
L3
E
E2
L
A
D2
ddd
A1
UFDFPN-01
1. Drawing is not to scale.
2. The central pad (the area delimited by E2 and D2 in the above illustration) is internally pulled to VSS. It
should not be connected to any other voltage or signal line on the PCB, for example during the soldering
process.
Table 23.
UFDFPN8 (MLP8) — 8-lead ultra thin fine pitch dual flat package no lead
2 × 3mm, package mechanical data
inches(1)
millimeters
Symbol
Typ
Min
Max
Typ
Min
Max
A
0.55
0.45
0.6
0.0217
0.0177
0.0236
A1
0.02
0
0.05
0.0008
0
0.002
b
0.25
0.2
0.3
0.0098
0.0079
0.0118
D
2
1.9
2.1
0.0787
0.0748
0.0827
D2
1.6
1.5
1.7
0.063
0.0591
0.0669
E
3
2.9
3.1
0.1181
0.1142
0.122
E2
0.2
0.1
0.3
0.0079
0.0039
0.0118
e
0.5
-
-
0.0197
-
-
L
0.45
0.4
0.5
0.0177
0.0157
0.0197
L1
L3
(2)
ddd
0.15
0.0059
0.3
0.0118
0.08
0.08
1. Values in inches are converted from mm and rounded to 4 decimal digits.
2. Applied for exposed die paddle and terminals. Exclude embedding part of exposed die paddle from
measuring.
38/43
Doc ID 6512 Rev 8
M95040, M95020, M95010
11
Part numbering
Part numbering
Table 24.
Ordering information scheme
Example:
M95040
–
W MN 6
T P /G
Device type
M95 = SPI serial access EEPROM
Device function
040 = 4 Kbit (512 x 8)
020 = 2 Kbit (256 x 8)
010 = 1 Kbit (128 x 8)
Operating voltage
blank = VCC = 4.5 to 5.5V
W = VCC = 2.5 to 5.5V
R = VCC = 1.8 to 5.5V
Package
MN = SO8 (150 mil width)
DW = TSSOP8 (169 mil width)
MB = UFDFPN8 (MLP8) 2 × 3mm
Device grade
6 = Industrial temperature range, –40 to 85 °C.
Device tested with standard test flow
3 = Device tested with high reliability certified flow(1).
Automotive temperature range (–40 to 125 °C)
Option
blank = Standard packing
T = Tape and reel packing
Plating technology
P or G = ECOPACK® (RoHS compliant)
Process(2)
/G or /S = F6SP36%
1. ST strongly recommends the use of the Automotive Grade devices for use in an automotive environment.
The high reliability certified flow (HRCF) is described in the quality note QNEE9801. Please ask your
nearest ST sales office for a copy.
2. Used only for device grade 3
For a list of available options (speed, package, etc.) or for further information on any aspect
of this device, please contact your nearest ST sales office.
Doc ID 6512 Rev 8
39/43
Part numbering
M95040, M95020, M95010
Table 25.
Package
M95010-R
1.8 V to 5.5 V
M95010-W
2.5 V to 5.5 V
M95010
4.5 V to 5.5 V
SO8N (MN)
Range6
Range6
Range3
TSSOP8 (DW)
Range6
Range6
-
MLP8 (MB)
-
-
-
Table 26.
Available M95020 products (package, voltage range, temperature grade)
Package
M95020-R
1.8 V to 5.5 V
M95020-W
2.5 V to 5.5 V
M95020
4.5 V to 5.5 V
SO8N (MN)
Range6
Range6, Range3
Range3
TSSOP8 (DW)
Range6
Range6
-
MLP8 (MB)
Range6
-
-
Table 27.
40/43
Available M95010 products (package, voltage range, temperature grade)
Available M95040 products (package, voltage range, temperature grade)
Package
M95040-R
1.8 V to 5.5 V
M95040-W
2.5 V to 5.5 V
M95040
4.5 V to 5.5 V
SO8N (MN)
Range6
Range6, Range3
Range3
TSSOP8 (DW)
Range6
Range6, Range3
-
MLP8 (MB)
Range6
-
-
Doc ID 6512 Rev 8
M95040, M95020, M95010
12
Revision history
Revision history
Table 28.
Document revision history
Date
Version
10-May-2000
2.2
s/issuing three bytes/issuing two bytes/ in the 2nd sentence of the Byte
Write Operation
16-Mar-2001
2.3
Human Body Model meets JEDEC std (Table 2). Minor adjustments to
Figs 7,9,10,11 & Tab 9. Wording changes, according to the standard
glossary
Illustrations and Package Mechanical data updated
19-Jul-2001
2.4
Temperature range ‘3’ added to the -W supply voltage range in DC and
AC characteristics
11-Oct-2001
3.0
Document reformatted using the new template
26-Feb-2002
3.1
Description of chip deselect after 8th clock pulse made more explicit
27-Sep-2002
3.2
Position of A8 in Read Instruction Sequence Figure corrected. Load
Capacitance CL changed
24-Oct-2002
3.3
Minimum values for tCHHL and tCHHH changed.
24-Feb-2003
3.4
Description of Read from Memory Array (READ) instruction corrected,
and clarified
28-May-2003
3.5
New products, identified by the process letter W, added
25-Jun-2003
3.6
Correction to current products, identified by the process letter K not L.
ICC changed in DC characteristics, and tCHHL, tCHHH substituted in AC
characteristics
Voltage range -S upgraded by removing it, and adding the -R voltage
range in its place
Temperature range 5 removed.
21-Nov-2003
4.0
Table of contents, and Pb-free options added. VIL(min) improved to -0.45V
02-Feb-2004
4.1
VIL(max) and tCLQV(max) changed
5.0
Absolute Maximum Ratings for VIO(min) and VCC(min) improved.
Soldering temperature information clarified for RoHS compliant devices.
New 5V and 2.5V devices, with process letter W, promoted from
preliminary data to full data. Device Grade 3 clarified, with reference to
HRCF and automotive environments
6.0
Product List summary table added. Process identification letter “G”
information added. Order information for Tape and Reel changed to T.
AEC-Q100-002 compliance. Device Grade information clarified. tHHQX
corrected to tHHQV. Signal Description updated.
10MHz, 5ms Write is now the present product. tCH+tCL<1/fC constraint
clarified
01-Mar-2004
05-Oct-2004
Changes
Doc ID 6512 Rev 8
41/43
Revision history
M95040, M95020, M95010
Table 28.
Document revision history (continued)
Date
06-Nov-2006
20-Mar-2008
24-Sep-2009
42/43
Version
Changes
7
Document converted to new template, Table 5: Status register format
moved to below Section 6.3: Read Status Register (RDSR).
PDIP package removed. UFDFPN8 (MB) package added (see Figure 20
and Table 23) and SO8N package specifications updated (see Figure 18
and Table 21). Packages are ECOPACK® compliant.
Section 6.7: Cycling added. Section 2.8: Supply voltage (VCC) added and
information removed below Section 4: Operating features.
Figure 3: Bus master and memory devices on the SPI bus modified.
TLEAD parameter modified, Note 1 changed, and TA added to Table 7:
Absolute maximum ratings.
Characteristics of previous product identified by process letter K removed.
CL modified in Table 11: AC test measurement conditions. Note removed
below Table 13 and Table 13.
Information in Table 16 is no longer Preliminary data, ICC, ICC1 and VIL
modified. End timing line of tSHQZ moved in Figure 17.
tCHHL and tCHHH changed to tCLHL and tCLHH, respectively in Figure 16,
Table 18, Table 17, Table 18, Table 19 and Table 20.
Plating technology and Process updated in Table 24: Ordering information
scheme.
8
Section 2.8: Supply voltage (VCC) updated.
Section 3: Connecting to the SPI bus modified.
Section 6.6: Write to Memory Array (WRITE) modified.
Device grade 6 removed in the 4.5 to 5.5 V VCC range (seeTable 8).
Table 16: DC characteristics (M950x0-R, device grade 6) modified.
Table 18: AC characteristics (M950x0-W, device grade 6) modified:
frequency changed from 5 MHz to 10 MHz.
Table 20: AC characteristics (M950x0-R, device grade 6) modified:
frequency changed from 2 MHz to 5 MHz.
Section 10: Package mechanical data:
– Inches are calculated from millimeters and rounded to the third decimal
digit.
– UFDFPN8 package specifications modified.
Blank option removed below Plating technology in Table 24: Ordering
information scheme. Table 25, Table 26 and Table 27 added.
9
Section 2.8: Supply voltage (VCC) and Section 6.4: Write Status Register
(WRSR) updated.
Section 6.6: Write to Memory Array (WRITE) clarified.
IOL and IOH added to Table 7: Absolute maximum ratings.
VRES added to DC characteristics tables 13, 14, 15 and 16. tCLQV
modified in Figure 20: AC characteristics (M950x0-R, device grade 6).
Note added to Table 20: AC characteristics (M950x0-R, device grade 6).
Figure 15: Serial input timing, Figure 16: Hold timing and Figure 17: Serial
output timing updated.
Note added below Figure 20: UFDFPN8 (MLP8) — 8-lead ultra thin fine
pitch dual flat package no lead 2 × 3mm, package outline.
/W process option removed from Table 24: Ordering information scheme.
ECOPACK text updated. Small text changes.
Doc ID 6512 Rev 8
M95040, M95020, M95010
Please Read Carefully:
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