DATA SHEET MOS INTEGRATED CIRCUIT MC-4532CD647 32M-WORD BY 64-BIT SYNCHRONOUS DYNAMIC RAM MODULE UNBUFFERED TYPE ★ Description The MC-4532CD647EF and MC-4532CD647PF are 33,554,432 words by 64 bits synchronous dynamic RAM module on which 16 pieces of 128M SDRAM: µPD45128841 are assembled. This module provides high density and large quantities of memory in a small space without utilizing the surfacemounting technology on the printed circuit board. Decoupling capacitors are mounted on power supply line for noise reduction. Features • 33,554,432 words by 64 bits organization • Clock frequency and access time from CLK. Part number /CAS latency MC-4532CD647EF-A75 ★ ★ MC-4532CD647PF-A75 ★ Clock frequency Access time from CLK (MAX.) (MAX.) CL = 3 133 MHz 5.4 ns CL = 2 100 MHz 6.0 ns CL = 3 133 MHz 5.4 ns CL = 2 100 MHz 6.0 ns • Fully Synchronous Dynamic RAM, with all signals referenced to a positive clock edge • Pulsed interface • Possible to assert random column address in every cycle • Quad internal banks controlled by BA0 and BA1 (Bank Select) • Programmable burst-length (1, 2, 4, 8 and full page) • Programmable wrap sequence (Sequential / Interleave) ★ • Programmable /CAS latency (2, 3) • Automatic precharge and controlled precharge • CBR (Auto) refresh and self refresh • All DQs have 10 Ω ±10 % of series resistor • Single 3.3 V ± 0.3 V power supply • LVTTL compatible • 4,096 refresh cycles/64 ms • Burst termination by Burst Stop command and Precharge command • 168-pin dual in-line memory module (Pin pitch = 1.27 mm) • Unbuffered type • Serial PD The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. Not all devices/types available in every country. Please check with local NEC representative for availability and additional information. Document No. M14276EJ2V0DS00 (2nd edition) Date Published January 2000 NS CP(K) Printed in Japan The mark • shows major revised points. © 1999 MC-4532CD647 Ordering Information Part number Clock frequency Package Mounted devices (MAX.) MC-4532CD647EF-A75 ★ MC-4532CD647PF-A75 2 133 MHz 168-pin Dual In-line Memory Module 16 pieces of µPD45128841G5 (Rev. E) (Socket Type) (10.16 mm (400) TSOP (II)) Edge connector: Gold plated 16 pieces of µPD45128841G5 (Rev. P) 34.93 mm height (10.16 mm (400) TSOP (II)) Data Sheet M14276EJ2V0DS00 MC-4532CD647 ★ Pin Configuration 168-pin Dual In-line Memory Module Socket Type (Edge connector: Gold plated) /xxx indicates active low signal. 85 86 87 88 89 90 91 92 93 94 VSS DQ0 DQ1 DQ2 DQ3 Vcc DQ4 DQ5 DQ6 DQ7 1 2 3 4 5 6 7 8 9 10 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 DQ40 DQ8 VSS VSS DQ41 DQ9 DQ42 DQ10 DQ43 DQ11 DQ44 DQ12 DQ45 DQ13 Vcc Vcc DQ46 DQ14 DQ47 DQ15 NC NC NC NC VSS VSS NC NC NC NC Vcc Vcc /WE /CAS DQMB0 DQMB4 DQMB1 DQMB5 /CS0 /CS1 NC /RAS VSS VSS A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 BA0 (A13) BA1 (A12) A11 Vcc Vcc 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 CLK1 NC VSS CKE0 /CS3 DQMB6 DQMB7 NC Vcc NC NC NC NC VSS DQ48 DQ49 DQ50 DQ51 Vcc DQ52 NC NC NC VSS DQ53 DQ54 DQ55 VSS DQ56 DQ57 DQ58 DQ59 Vcc DQ60 DQ61 DQ62 DQ63 VSS CLK3 NC SA0 SA1 SA2 Vcc 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 VSS DQ32 DQ33 DQ34 DQ35 Vcc DQ36 DQ37 DQ38 DQ39 Vcc CLK0 VSS NC /CS2 DQMB2 DQMB3 NC Vcc NC NC NC NC VSS DQ16 DQ17 DQ18 DQ19 Vcc DQ20 NC NC CKE1 VSS DQ21 DQ22 DQ23 VSS DQ24 DQ25 DQ26 DQ27 Vcc DQ28 DQ29 DQ30 DQ31 VSS CLK2 NC WP SDA SCL Vcc Data Sheet M14276EJ2V0DS00 A0 - A11 : Address Inputs [Row: A0 - A11, Column: A0 - A9] BA0 (A13), BA1 (A12) : SDRAM Bank Select DQ0 - DQ63 : Data Inputs/Outputs CLK0 - CLK3 : Clock Input CKE0, CKE1 : Clock Enable Input /CS0 - /CS3 : Chip Select Input /RAS : Row Address Strobe /CAS : Column Address Strobe /WE : Write Enable DQMB0 - DQMB7 : DQ Mask Enable SA0 - SA2 : Address Input for EEPR O M SDA : Serial Data I/O for PD SCL : Clock Input for PD VCC : Power Supply VSS : Ground WP : Write Protect NC : No Connection 3 MC-4532CD647 Block Diagram /WE /CS0 /CS1 /CS2 DQMB0 DQ 0 DQ 1 DQ 2 DQ 3 DQ 4 DQ 5 DQ 6 DQ 7 DQ 7 DQM /CS DQ 6 DQ 5 DQ 4 D0 DQ 3 DQ 2 DQ 1 DQ 0 DQ 0 DQM /CS DQ 1 DQ 2 DQ 3 D8 DQ 4 DQ 5 DQ 6 DQ 7 /WE /WE DQ 16 DQ 17 DQ 18 DQ 19 DQ 20 DQ 21 DQ 22 DQ 23 DQ 7 DQM /CS DQ 6 DQ 5 DQ 4 D2 DQ 3 DQ 2 DQ 1 DQ 0 /WE DQ 0 DQM /CS DQ 1 DQ 2 DQ 3 D10 DQ 4 DQ 5 DQ 6 DQ 7 /WE DQ 4 DQM /CS DQ 7 DQ 6 DQ 5 D3 DQ 3 DQ 2 DQ 1 DQ 0 /WE DQ 3 DQM /CS DQ 0 DQ 1 DQ 2 D11 DQ 4 DQ 5 DQ 6 DQ 7 /WE DQ 7DQM /CS DQ 6 DQ 5 DQ 4 D6 DQ 3 DQ 2 DQ 1 DQ 0 /WE DQ 0 DQM /CS DQ 1 DQ 2 DQ 3 D14 DQ 4 DQ 5 DQ 6 DQ 7 /WE DQ 7 DQM /CS DQ 6 DQ 5 DQ 4 D7 DQ 3 DQ 2 DQ 1 DQ 0 /WE DQ 0 DQM /CS DQ 1 DQ 2 DQ 3 D15 DQ 4 DQ 5 DQ 6 DQ 7 /WE DQMB3 DQMB1 DQ 8 DQ 9 DQ 10 DQ 11 DQ 12 DQ 13 DQ 14 DQ 15 /CS3 DQMB2 DQ 7 DQM /CS DQ 6 DQ 5 DQ 4 D1 DQ 3 DQ 2 DQ 1 DQ 0 /WE DQ 0 DQM /CS DQ 1 DQ 2 DQ 3 D9 DQ 4 DQ 5 DQ 6 DQ 7 /WE DQ 4 DQM /WE DQ 3 DQM /WE DQ 24 DQ 25 DQ 26 DQ 27 DQ 28 DQ 29 DQ 30 DQ 31 DQMB6 DQMB4 DQ 32 DQ 33 DQ 34 DQ 35 DQ 36 DQ 37 DQ 38 DQ 39 DQ 7 DQ 6 DQ 5 DQ 3 DQ 2 DQ 1 DQ 0 /CS DQ 0 DQ 1 DQ 2 DQ 4 DQ 5 DQ 6 DQ 7 D4 /CS D12 DQMB7 DQMB5 DQ 40 DQ 41 DQ 42 DQ 43 DQ 44 DQ 45 DQ 46 DQ 47 DQ 48 DQ 49 DQ 50 DQ 51 DQ 52 DQ 53 DQ 54 DQ 55 /CS DQ 5 DQM DQ 7 DQ 6 DQ 4 DQ 3 DQ 2 DQ 1 DQ 0 /WE DQ 2 DQM /CS DQ 0 DQ 1 DQ 3 D13 DQ 4 DQ 5 DQ 6 DQ 7 D5 /WE CLK0 SERIAL PD DQ 56 DQ 57 DQ 58 DQ 59 DQ 60 DQ 61 DQ 62 DQ 63 CLK: D0, D1, D4, D5 CLK2 CLK: D2, D3, D6, D7 3.3 pF 3.3 pF SDA SCL A0 A1 WP A2 CLK1 47 kΩ CLK: D8, D9, D12, D13 CLK3 CLK: D10, D11, D14, D15 3.3 pF 3.3 pF SA0 SA1 SA2 A0 - A11 A0 - A11: D0 - D15 BA0, BA1 A13, A12: D0 - D15 VCC CKE1 /CAS /CAS: D0 - D15 CKE0 CKE: D0 - D7 D0 - D15 Remarks 1. The value of all resistors is 10 Ω except CKE1 and WP. 2. D0 - D15: µPD45128841 (4M words × 8 bits × 4 banks) 4 10 kΩ /RAS: D0 - D15 D0 - D15 C V SS /RAS Data Sheet M14276EJ2V0DS00 CKE: D8-D15 MC-4532CD647 Electrical Specifications • All voltages are referenced to VSS (GND). • After power up, wait more than 100 µs and then, execute power on sequence and CBR (Auto) refresh before proper device operation is achieved. Absolute Maximum Ratings Parameter Symbol Voltage on power supply pin relative to GND Voltage on input pin relative to GND Rating Unit VCC –0.5 to +4.6 V VT –0.5 to +4.6 V Short circuit output current IO 50 mA Power dissipation PD 16 W Operating ambient temperature TA 0 to 70 °C Storage temperature Tstg –55 to +125 °C Caution Condition Exposing the device to stress above those listed in Absolute Maximum Ratings could cause permanent damage. The device is not meant to be operated under conditions outside the limits described in the operational section of this specification. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Recommended Operating Conditions Parameter Symbol Condition MIN. TYP. MAX. Unit 3.3 3.6 V V Supply voltage VCC 3.0 High level input voltage VIH 2.0 VCC + 0.3 Low level input voltage VIL −0.3 +0.8 V Operating ambient temperature TA 0 70 °C MAX. Unit pF Capacitance (TA = 25 °C, f = 1 MHz) Parameter Input capacitance Data input/output capacitance Symbol Test condition MIN. TYP. CI1 A0 - A11, BA0 (A13), BA1 (A12), /RAS, /CAS, /WE 58 94 CI2 CLK0 - CLK3 24 40 CI3 CKE0, CKE1 32 52 CI4 /CS0 - /CS3 17 29 CI5 DQMB0 - DQMB7 10 17 CI/O DQ0 - DQ63 11 19 Data Sheet M14276EJ2V0DS00 pF 5 MC-4532CD647 DC Characteristics (Recommended Operating Conditions Unless Otherwise Noted) Parameter ★ Operating current Precharge standby current in ★ power down mode Precharge standby current in non power down mode Symbol ICC1 ICC2P Test condition MIN. MAX. Burst length = 1 /CAS latency = 2 1,040 tRC ≥ tRC(MIN.), IO = 0 mA /CAS latency = 3 1,080 CKE ≤ VIL(MAX.), tCK = 15 ns 16 ICC2PS CKE ≤ VIL(MAX.), tCK = ∞ ICC2N power down mode Active standby current in ICC3P CKE ≥ VIH(MIN.), tCK = 15 ns, /CS ≥ VIH(MIN.), Input signals are changed one time during 30 ns. 320 ICC3N 80 Operating current ★ mA mA CKE ≥ VIH(MIN.), tCK = 15 ns, /CS ≥ VIH(MIN.), 480 mA Input signals are changed one time during 30 ns. 320 ICC4 tCK ≥ tCK(MIN.) /CAS latency = 2 1,200 IO = 0 mA /CAS latency = 3 1,480 ICC5 tRC ≥ tRC(MIN.) /CAS latency = 2 2,080 /CAS latency = 3 2,160 (Burst mode) CBR (Auto) refresh current mA 64 ICC3NS CKE ≥ VIH(MIN.), tCK = ∞, Input signals are stable. ★ 1 128 CKE ≤ VIL(MAX.), tCK = 15 ns ICC3PS CKE ≤ VIL(MAX.), tCK = ∞ non power down mode mA 16 ICC2NS CKE ≥ VIH(MIN.), tCK = ∞ Input signals are stable. Active standby current in Unit Notes ★ Self refresh current ICC6 CKE ≤ 0.2 V Input leakage current II(L) VI = 0 to 3.6 V, All other pins not under test = 0 V – 16 mA 2 mA 3 32 mA + 16 µA CKE1 – 500 +500 Output leakage current IO(L) DOUT is disabled, VO = 0 to 3.6 V –3 High level output voltage VOH IO = – 4.0 mA 2.4 Low level output voltage VOL IO = + 4.0 mA +3 µA V 0.4 V Notes 1. ICC1 depends on output loading and cycle rates. Specified values are obtained with the output open. In addition to this, ICC1 is measured on condition that addresses are changed only one time during tCK (MIN.). 2. ICC4 depends on output loading and cycle rates. Specified values are obtained with the output open. In addition to this, ICC4 is measured on condition that addresses are changed only one time during tCK (MIN.). 3. ICC5 is measured on condition that addresses are changed only one time during tCK (MIN.). 6 Data Sheet M14276EJ2V0DS00 MC-4532CD647 AC Characteristics (Recommended Operating Conditions Unless Otherwise Noted) ★ Test Conditions Parameter AC high level input voltage / low level input voltage Value Unit 2.4 / 0.4 V 1.4 V 1 ns 1.4 V Input timing measurement reference level Transition time (Input rise and fall time) Output timing measurement reference level tCK tCH CLK tCL 2.4 V 1.4 V 0.4 V tSETUP tHOLD Input 2.4 V 1.4 V 0.4 V tAC tOH Output Data Sheet M14276EJ2V0DS00 7 MC-4532CD647 ★ Synchronous Characteristics Parameter Symbol -A75 Unit MIN. MAX. tCK3 7.5 (133 MHz) ns 10 Note Clock cycle time /CAS latency = 3 /CAS latency = 2 tCK2 (100 MHz) ns Access time from CLK /CAS latency = 3 tAC3 5.4 ns 1 /CAS latency = 2 tAC2 6.0 ns 1 CLK high level width tCH 2.5 ns CLK low level width tCL 2.5 ns Data-out hold time tOH 3.0 ns Data-out low-impedance time tLZ 0 ns /CAS latency = 3 tHZ3 3.0 5.4 /CAS latency = 2 6.0 Data-out high-impedance time ns tHZ2 3.0 Data-in setup time tDS 1.5 ns ns Data-in hold time tDH 0.8 ns Address setup time tAS 1.5 ns Address hold time tAH 0.8 ns CKE setup time tCKS 1.5 ns CKE hold time tCKH 0.8 ns CKE setup time (Power down exit) tCKSP 1.5 ns Command (/CS0 - /CS3, /RAS, /CAS, /WE, tCMS 1.5 ns tCMH 0.8 ns DQMB0 - DQMB7) setup time Command (/CS0 - /CS3, /RAS, /CAS, /WE, DQMB0 - DQMB7) hold time Note 1. Output load Z = 50 Ω Output 50 pF Remark These specifications are applied to the monolithic device. 8 Data Sheet M14276EJ2V0DS00 1 MC-4532CD647 ★ Asynchronous Characteristics Parameter Symbol -A75 MIN. ACT to REF/ACT command period (operation) Unit Note MAX. tRC 67.5 ns REF to REF/ACT command period (refresh) tRC1 67.5 ACT to PRE command period tRAS 45 PRE to ACT command period tRP 20 ns Delay time ACT to READ/WRITE command tRCD 20 ns ACT(one) to ACT(another) command period tRRD 15 ns Data-in to PRE command period tDPL 8 ns ns 120,000 ns Data-in to ACT(REF) command /CAS latency = 3 tDAL3 1CLK+22.5 ns 1 period (Auto precharge) /CAS latency = 2 tDAL2 1CLK+20 ns 1 Mode register set cycle time Transition time Refresh time (4,096 refresh cycles) tRSC 2 tT 0.5 tREF CLK 30 ns 64 ms Note This device can satisfy the tDAL3 spec of 1CLK+20 ns for up to and including 125 MHz operation. Data Sheet M14276EJ2V0DS00 9 MC-4532CD647 Serial PD (1/2) Byte No. Function Described Hex Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 0 Defines the number of bytes written into serial PD memory 80H 1 0 0 0 0 0 0 0 1 Total number of bytes of serial PD memory 08H 0 0 0 0 1 0 0 0 256 bytes 2 Fundamental memory type 04H 0 0 0 0 0 1 0 0 SDRAM 3 Number of rows 0CH 0 0 0 0 1 1 0 0 12 rows 4 Number of columns 0AH 0 0 0 0 1 0 1 0 10 columns 5 Number of banks 02H 0 0 0 0 0 0 1 0 2 banks 6 Data width 40H 0 1 0 0 0 0 0 0 64 bits 7 Data width (continued) 00H 0 0 0 0 0 0 0 0 0 8 Voltage interface 01H 0 0 0 0 0 0 0 1 LVTTL 9 CL = 3 Cycle time 75H 0 1 1 1 0 1 0 1 7.5 ns 10 CL = 3 Access time 54H 0 1 0 1 0 1 0 0 5.4 ns 11 DIMM configuration type 00H 0 0 0 0 0 0 0 0 None 12 Refresh rate/type 80H 1 0 0 0 0 0 0 0 Normal 13 SDRAM width 08H 0 0 0 0 1 0 0 0 ×8 14 Error checking SDRAM width 00H 0 0 0 0 0 0 0 0 None 15 Minimum clock delay 01H 0 0 0 0 0 0 0 1 1 clock 16 Burst length supported 8FH 1 0 0 0 1 1 1 1 1, 2, 4, 8, F 17 Number of banks on each SDRAM 04H 0 0 0 0 0 1 0 0 4 banks 18 /CAS latency supported 06H 0 0 0 0 0 1 1 0 2, 3 19 /CS latency supported 01H 0 0 0 0 0 0 0 1 0 20 /WE latency supported 01H 0 0 0 0 0 0 0 1 0 21 SDRAM module attributes 00H 0 0 0 0 0 0 0 0 22 SDRAM device attributes : General 0EH 0 0 0 0 1 1 1 0 23 CL = 2 Cycle time A0H 1 0 1 0 0 0 0 0 10 ns 24 CL = 2 Access time 60H 0 1 1 0 0 0 0 0 6 ns 00H 0 0 0 0 0 0 0 0 ★ ★ ★ 25-26 ★ ★ 10 Notes 128 bytes 27 tRP(MIN.) 14H 0 0 0 1 0 1 0 0 20 ns 28 tRRD(MIN.) 0FH 0 0 0 0 1 1 1 1 15 ns 29 tRCD(MIN.) 14H 0 0 0 1 0 1 0 0 20 ns 30 tRAS(MIN.) 2DH 0 0 1 0 1 1 0 1 45 ns 31 Module bank density 20H 0 0 1 0 0 0 0 0 128M bytes Data Sheet M14276EJ2V0DS00 MC-4532CD647 (2/2) Byte No. 32 33 Function Described Hex Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Notes Command and address signal input setup time 15H 0 0 0 1 0 1 0 1 1.5 ns Command and address signal input 08H 0 0 0 0 1 0 0 0 0.8 ns 15H 0 0 0 1 0 1 0 1 1.5 ns 0.8 ns hold time 34 Data signal input setup time 35 Data signal input hold time 08H 0 0 0 0 1 0 0 0 00H 0 0 0 0 0 0 0 0 SPD revision 12H 0 0 0 1 0 0 1 0 Checksum for bytes 0 - 62 B0H 1 0 1 1 0 0 0 0 36-61 ★ ★ 62 63 64-71 72 1.2 Manufacture’s JEDEC ID code Manufacturing location 73-90 Manufacture’s P/N 91-92 Revision code 93-94 Manufacturing date 95-98 Assembly serial number 99-125 Mfg specific 126 Intel specification frequency 64H 0 1 1 0 0 1 0 0 127 Intel specification /CAS latency support FDH 1 1 1 1 1 1 0 1 Timing Chart Refer to the SYNCHORONOUS DRAM MODULE TIMING CHART Information (M13348E). Data Sheet M14276EJ2V0DS00 11 MC-4532CD647 ★ Package Drawing 168 PIN DUAL IN-LINE MODULE (SOCKET TYPE) A (AREA B) Z1 Z2 Y1 Y2 R2 N F2 F1 Q R1 M L A J S (OPTIONAL HOLES) K C B I B H G U1 U2 T E D A1 (AREA A) M2 (AREA A) M1 (AREA B) detail of A part detail of B part D2 W V P X D1 ITEM A A1 B C D D1 D2 E F1 F2 G H I J K L M M1 M2 N P Q R1 R2 S T U1 U2 V W MILLIMETERS 133.35 133.35±0.13 11.43 36.83 6.35 2.0 3.125 54.61 2.44 3.18 6.35 1.27 (T.P.) 8.89 24.495 42.18 17.78 34.93±0.13 15.15 19.78 4.0 MAX. 1.0 R2.0 4.0±0.10 9.53 φ 3.0 X Y1 1.27±0.1 4.0 MIN. 4.0 MIN. 0.2±0.15 1.0±0.05 2.54±0.10 3.0 MIN. Y2 Z1 Z2 2.26 3.0 MIN. 2.26 M168S-50A78 12 Data Sheet M14276EJ2V0DS00 MC-4532CD647 [MEMO] Data Sheet M14276EJ2V0DS00 13 MC-4532CD647 [MEMO] 14 Data Sheet M14276EJ2V0DS00 MC-4532CD647 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor devices on it. 2 HANDLING OF UNUSED INPUT PINS FOR CMOS Note: No connection for CMOS device inputs can be cause of malfunction. If no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected to V DD or GND with a resistor, if it is considered to have a possibility of being an output pin. All handling related to the unused pins must be judged device by device and related specifications governing the devices. 3 STATUS BEFORE INITIALIZATION OF MOS DEVICES Note: Power-on does not necessarily define initial status of MOS device. Production process of MOS does not define the initial operation status of the device. Immediately after the power source is turned ON, the devices with reset function have not yet been initialized. Hence, power-on does not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the reset signal is received. Reset operation must be executed immediately after power-on for devices having reset function. Data Sheet M14276EJ2V0DS00 15 MC-4532CD647 CAUTION FOR HANDLING MEMORY MODULES When handling or inserting memory modules, be sure not to touch any components on the modules, such as the memory IC, chip capacitors and chip resistors. It is necessary to avoid undue mechanical stress on these components to prevent damaging them. When re-packing memory modules, be sure the modules are NOT touching each other. Modules in contact with other modules may cause excessive mechanical stress, which may damage the modules. • The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. • No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. • NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. • Descriptions of circuits, software, and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software, and information in the design of the customer's equipment shall be done under the full responsibility of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third parties arising from the use of these circuits, software, and information. • While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. • NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. M7 98. 8