C2012X8R1H683K125AA TDK Item Description : C2012X8R1H683KT**** DC Bias Characteristic 10 Application & Main Feature 0 Cap. Change/% Commercial Grade ( High Temperature Application ) Series C2012 [EIA CC0805] -10 -20 -30 -40 -50 -60 0 10 20 30 40 50 60 DC Bias/V 2.00mm 1.25mm 1.25mm 0.20mm 0.50mm +/-0.2mm +/-0.2mm +/-0.2mm Min. Min. Temperature Characteristic Temperature Characteristics 20 10 10000 0 1000 100 10 1 0.1 Rated Voltage 1H (50Vdc) 0.001 -30 -40 -50 -60 -70 0.1 1 10 100 1000 -80 -60 -40 |Z| Capacitance Tolerance ESR 40 60 80 100 120 140 160 180 TCBias(1/2Rated) Ripple Temperature Rise Characteristics Temperature Rise/degC Dissipation Factor 100 10 AEC-Q200 Not Applicable 20 15 10 5 0 1 0.001 20 25 1000 3% Max. 0 Temp.Chara. Cap. vs. Freq. Characteristic K (+/-10%) -20 Temperature/degC Frequency/MHz 68nF 7.35Gohm Min. -20 -90 0.01 Capacitance Insulation Resistance -10 -80 0.01 Cap./nF Characterization Sheet ( Multilayer Ceramic Chip Capacitors ) X8R (-55 to 150 degC +/-15%) |Z|, ESR vs. Freq. Characteristics 100000 Cap. Change/% L W T B G |Z|, ESR/ohm Dimensions 0.01 0.1 1 10 100 1000 0 0.2 0.4 100kHz All specifications are subject to change without notice. 0.6 0.8 1 1.2 Current/Arms Frequency/MHz 500kHz 1MHz January 3, 2016