Keysight Technologies
M9080B & M9082B LTE
& LTE-Advanced FDD/TDD
X-Series Measurement Applications
for PXIe Vector Signal Analyzers
Technical Overview
–– Perform LTE plus LTE-Advanced FDD and TDD
base station (eNB) and user equipment (UE)
transmitter tests
–– Accelerate measurements with one-button
RF conformance tests as defined by 3GPP TS
36.141 and 36.521 specification
–– Analyze carrier-aggregated signal of up to 5
contiguous/non-contiguous component carriers
–– PC-based SCPI remote interface and manual
user interface
–– Leverage built-in, context-sensitive help with
SCPI command reference
–– Transportable license supports up to four PXI
VSA channels in one mainframe
LTE/LTE-Advanced FDD and TDD Measurement Applications
Expand the capabilities of your M9391A and M9393A PXIe
vector signal analyzers (PXI VSAs) with Keysight Technologies' library of measurement applications - the same applications used to increase the capability and functionality
of its X-Series signal analyzers. Eleven of the most popular
applications are now available for use with Keysight's
new M9393A PXIe performance VSA and the M9391A PXI
VSA. When you combine the raw hardware speeds of the
PXI VSAs and the X-Series measurement applications for
modular instruments, you can test more products in less
time, while ensuring measurement continuity from design
to manufacturing.
The LTE/LTE-Advanced FDD and TDD measurement
applications transform the PXI VSAs into 3GPP LTE/LTEAdvanced standard-based RF transmitter testers. The
applications provide fast, one-button RF conformance
measurements to help you design, evaluate, and manufacture your LTE and LTE-Advanced base stations (eNB)
and user equipment (UE). The measurement applications
closely follow the 3GPP standard, allowing you to stay on
the leading edge of your design and manufacturing challenges.
Figure 1. LTE downlink modulation analysis measurement showing constellation, detected allocation, frame summary, and error
summary information. Measurements are color-coded based on
channel type for ease of troubleshooting.
Proven algorithms and a common user interface across
the X-Series analyzers and modular PXI VSAs create a
consistent measurement framework for signal analysis
that ensures repeatable results and measurement integrity
so you can leverage your test system software through all
phases of product development. The LTE/LTE-Advanced
measurement applications are two in a common library of
several measurement applications. You can further extend
your test assets by utilizing up to four PXI VSAs with one
software license.
Keysight's X-Series applications for modular instruments
also include a unique "Resource Manager" that provides
direct access to PXI VSA hardware drivers for the fastest
power and spectrum-based measurements, while simultaneously using the X-Series applications for fast modulation quality measurements and the 89600 VSA software
for fast spectrum measurements.
Figure 2. Resource manager included with all X-Series measurement
applications for modular instruments.
2
LTE/LTE-Advanced FDD and TDD Overview
LTE is the long term evolution of 3GPP’s universal mobile
telephone system (UMTS). The aim of LTE is to provide a
new radio access technology focused on packet-switched
data only. Multiple requirements are set to achieve
increased downlink and uplink peak data rates, scalable
channel bandwidths, spectral efficiency improvements,
control/user-plane latency, and co-existence with legacy
standards while evolving towards an all-IP network. LTE
accommodates both paired spectrum for frequency division duplex (FDD) and unpaired spectrum for time division
duplex (TDD) operation. There is a high degree of commonality between FDD and TDD modes. These two modes
are coordinated in the sense that they both share the same
underlying framework including radio access schemes
orthogonal frequency division multiple access (OFDMA) for
the downlink, and single-carrier frequency division multiple access (SC-FDMA) for the uplink. Both modes share
a single radio-access specification, equally applicable to
paired and unpaired spectrum. There are some significant
differences in specifications between FDD and TDD, most
notably on the physical layer in the frame structure. There
are few differences on the higher layers.
LTE-Advanced is not a new technology, instead it is an
evolution step in the continuing development of LTE. It
was initially specified as part of Release 10 of the 3GPP
standard with continued evolution with additional features
in Release 11 and more upcoming features in Release 12
and beyond. The three key LTE-Advanced technologies
that are essential for meeting the ITU 4G requirements
are: carrier aggregation, enhanced uplink multiple access,
and enhanced multiple antenna transmission. Carrier
aggregation is one of the key features of LTE-Advanced
and the earliest deployed technologies of LTE-Advanced.
It allows two or more (up to 5) component carriers to be
aggregated in both contiguous and non-contiguous configurations in order to support up to 100 MHz transmission
bandwidth.
Table 1. Physical layer comparisons of LTE and LTE-Advanced FDD/TDD
LTE FDD
(3GPP Rel 8/9)
LTE TDD
(3GPP Rel 8/9)
LTE-Advanced FDD
(3GPP Rel 10/11)
LTE-Advanced TDD
(3GPP Rel 10/11)
Radio access mode
FDD
TDD
FDD
TDD
Radio frame length
10 ms (20 slots, 10 sub-frames)
Transmission
scheme
Downlink: OFDMA
Uplink: SC-FDMA
Downlink: OFDMA
Uplink: SC-FDMA, clustered SC-FDMA
Channel bandwidth
(BW)
Maximum: 20 MHz
1.4 MHz, 3 MHz, 5 MHz, 10 MHz, 15 MHz, 20 MHz
Maximum: 100 MHz with carrier aggregation;
BW per component carrier (CC): 1.4 MHz, 3 MHz,
5 MHz, 10 MHz, 15 MHz, 20 MHz
Data type
Packet switched for both voice and data, no circuit switched
Data modulation
Downlink: QPSK, 16QAM, 64 QAM
Uplink: QPSK, 16 QAM; 64 QAM for UE category 5 only
Downlink: QPSK, 16QAM, 64 QAM
Uplink: QPSK, 16 QAM; 64 QAM for UE categories 5, 7,
and 8 only
Peak data rate
Downlink – 300 Mbps
Uplink – 75 Mbps
Downlink – 1 Gbps
Uplink – 500 Mbps
MIMO technology
Downlink: Up to 4x4 spatial multiplexing; transmit
diversity; multi-user (MU) MIMO; beamforming
Uplink: MU-MIMO - more than one UE transmit in the
same time-frequency resource
Downlink: Up to 8x8 spatial multiplexing; transmit
diversity; MU-MIMO; beamforming
Uplink: Up to 4x4 spatial multiplexing for data (PUSCH);
transmit diversity for control (PUCCH); MU-MIMO
3
RF Transmitter Tests
With the LTE/LTE-Advanced FDD and TDD measurement
applications, you can perform RF transmitter measurements on eNB and UE devices in time, frequency, and
modulation domains. Measurement setups are simplified with automatic detection of downlink channels and
signals. For eNB conformance testing, measurement is
simplified by recalling E-TM presets according to 3GPP TS
36.141 specification.
In addition, the measurement applications allow you to
test beyond physical layer by using the transport layer
decoding functionality. Troubleshoot transport layer problems and verify the channel encoding is correct by accessing data at different points in the receiver chain such as
demapped, deinterleaved, descrambled, deratematched,
and decoded data.
For unwanted emissions, 3GPP Release 11 adds LTEAdvanced RF conformance requirements for intra-band,
non-contiguous carrier aggregation because the spectrum
in the sub-block gap can be deployed by another service
provider, perhaps using a different technology. These new
RF requirements are cumulative adjacent channel leakage
power (CACLR), to measure the contributions from carriers on both sides of the sub-block gap, and cumulative
spectrum emissions mask (SEM) measurement where a
new special limit mask is defined for unwanted emissions
within a sub-block gap calculated as the cumulative sum
of contribution from each sub-block. The LTE-Advanced
embedded measurement application provides limits for
both CACLR and SEM in non-contiguous carrier aggregation.
For LTE-Advanced demodulation measurements, such as
EVM and frequency error, the measurement application
uses an automatic sequencing function, instead of a single
wideband capture of the multi-carrier signal, eliminating the need for the wide analysis bandwidth option on
the signal analyzer and thereby reducing the overall test
equipment cost. The measured results of up to 5 CCs for
LTE-Advanced can be viewed side-by-side and represented in multiple domains such as resource block, sub-carrier, slot, or symbol. Graphical displays with color coding
and marker coupling allows you to search for problems
faster and troubleshoot the found problems quicker. For
manufacturing, “conformance EVM” measurement provides significant speed improvement over the traditional
EVM measurement.
Choosing between X-Series embedded applications and 89600 VSA software
X-Series measurement applications provide format-specific, one-button measurements for X-Series analyzers
and modular PXI VSAs. With fast measurement speed, SCPI programmability, pass/fail testing and simplicity of
operation, these applications are ideally suited for design verification and manufacturing. The 89600 VSA is the
industry-leading measurement software for evaluating and troubleshooting signals for R&D and design validation.
Supporting numerous measurement platforms and multiple measurement channels, the 89600 VSA provides flexibility and sophisticated measurements tools essential to find and fix signal problems. Recent enhancements for
the modular PXI VSA platforms (89601B-SSA) provide fast spectrum measurements with benchtop analyzer SCPI
programming compatibility.
www.keysight.com/find/89600_vsa
4
Standard-Based RF Transmitter Tests
The RF transmitter conformance test requirements for LTE/LTE-Advanced FDD and TDD are defined in 3GPP 36.141 (eNB)
and 36.521-1 (UE) of the 3GPP standard. Table 2 shows the required eNB RF transmitter tests along with the corresponding measurements available in the X-Series and 89600 LTE/LTE-Advanced applications. Table 3 shows similar information
for UE transmitter tests.
Table 2. Required base station (eNB) RF transmitter measurements and the corresponding measurements
in M9080B/M9082B and 89600 VSA
3GPP
TS36.141
paragraph #
Transmitter test
E-TM required
M9080B (FDD)
M9082B (TDD)
measurement applications 1
89601B
Option BHD/BHG (FDD) Option
BHE/BHH (TDD) 1
6.2
Base station output power
E-TM1.1
Channel power 2
Channel power using band
power marker 2
6.3.2
Total power dynamic range
E-TM 2
E-TM 3.1
OFDM symbol Tx. power (OSTP) 3
OFDM symbol Tx. power 3
6.4
Transmit ON/OFF power
(TDD only)
E-TM1.1
Transmit ON/OFF power
(M9082B only) 4
Not available
6.5.1
Frequency error
E-TM 2
E-TM 3.1
Frequency error 3
Frequency error 3
6.5.2
Error vector magnitude
E-TM 3.2
E-TM3.3
EVM 3
EVM 3
6.5.3
Time alignment error (TAE)
E-TM 1.1
MIMO summary or time offset 5
MIMO info table or cross-carrier
summary 5
6.5.4
DL RS power
E-TM 1.1
RS Tx power (RSTP) 3
RS Tx power 3
6.6.1
Occupied bandwidth
E-TM 1.1
Occupied BW
6.6.2
Adjacent channel leakage
power ratio (ACLR)
E-TM 1.1
E-TM 1.2
ACP
6.6.2.6
Cumulative ACLR
(LTE-Advanced only)
E-TM 1.1
E-TM 1.2
ACP
6.6.3
Operating band unwanted
emissions (SEM)
E-TM 1.1
E-TM 1.2
Spectrum emission mask
89600-based solutions offer
modulation-quality measurements; for one-button, nondemodulation measurements
such as ACLR and spectrum
emission mask, the embedded
application should be used
6.6.3
Cumulative mask for SEM
(LTE-Advanced only)
E-TM 1.1
E-TM 1.2
Spectrum emission mask
6.6.4
Transmitter spurious emission
E-TM 1.1
Spurious emissions
6.7
Transmitter intermodulation
E-TM 1.1
ACP, SEM, spurious emissions
1.
2.
3.
4.
5.
All of the measurements are available for single carrier (LTE) or multiple-carrier LTE-Advanced with up to 5 component carriers. M9080B/
M9082B option 1FP is LTE, option 2FP is LTE-Advanced.
These are pre-demodulation channel power measurements. Channel power reading is also available after demodulation under “Error Summary” trace.
For M9080B/M9082B, these measurements are available under “Error Summary” trace in Mod Analysis as well as under “Conformance
EVM” measurement. For 89600, they are available under “Error Summary” trace.
For LTE-Advanced, this measurement is supported for contiguous carrier aggregation and requires analysis bandwidth on PXI VSA wide
enough to cover the aggregated bandwidth.
“MIMO Summary”/”MIMO Info Table” traces are used to measure TAE for MIMO and Tx diversity signals. For carrier aggregation, time offset
reading under “Error Summary” trace is used for M9080B/M9082B and “Cross-carrier Summary” trace is used for 89600 VSA Version 18 or
higher.
For uplink, LTE-Advanced added transmitter RF conformance test for carrier aggregation (CA) and uplink MIMO (UL-MIMO) as shown in Table 3. Even though demodulation of UL-MIMO spatial multiplexing is not supported in the M9080B and
M9082B embedded applications, the transmitter conformance test for UL-MIMO only requires testing the DUT at each
antenna port using UL RMC (same as LTE), so the applications can also be used for UL-MIMO RF conformance test.
5
Table 3. Required user equipment (UE) RF transmitter measurements and the corresponding measurements
in M9080B/M9082B and 89600 VSA
3GPP TS 36.521-1 paragraph #
Transmitter test
M9080B(FDD) M9082B(TDD)
measurement applications
89601B Option BHD/
BHG(FDD) Option BHE/BHH
(TDD)
Channel power
Channel power using band
power marker
LTE Rel 8
& up
LTEAdvanced
CA
LTEAdvanced
UL-MIMO
6.2.2
6.2.2A
6.2.2B
UE maximum output power
(MOP)
6.2.3
6.2.3A
6.2.3B
Maximum power reduction
(MPR)
6.2.4
6.2.4A
6.2.4B
Additional maximum power
reduction (A-MPR)
6.2.5
6.2.5A
6.2.5B
Configured UE transmitted
output power
6.3.2
6.3.2A
6.3.2B
Minimum output power
6.3.3
6.3.3A
6.3.3B
Transmit off power
Channel power or transmit on/
off power
6.3.4
6.3.4A
6.3.4B
On/off time mask
Transmit on/off power
Not available
6.3.5
6.3.5A
6.3.5B
Power control
Not available
Not available
6.5.1
6.5.1A
6.5.1B
Frequency error
Frequency error and frequency error per slot 2
Frequency error & frequency
error per slot trace
6.5.2.1
6.5.2A.1
6.5.2B.1
Error vector magnitude (EVM)
EVM1
EVM
6.5.2.1A
N/A
N/A
PUSCH-EVM with exclusion
period
EVM1
EVM
6.5.2.2
6.5.2A.2
6.5.2B.2
Carrier leakage
IQ offset1 & IQ offset per slot 2
IQ offset & IQ offset per slot
6.5.2.3
6.5.2A.3
6.5.2B.3
In-band emissions for nonallocated RB
In-band emissions
(not available for CA)
In-band emissions
(not available for CA)
6.5.2.4
N/A
6.5.2B.4
EVM equalizer spectrum
flatness
Equalizer channel frequency
response per slot 3
Per slot equalizer channel
frequency response
6.6.1
6.6.1A
6.6.1B
Occupied bandwidth
Occupied BW
6.6.2.1
6.6.2.1A
6.6.2.1B
Spectrum emission mask
(SEM)
SEM
6.6.2.2
6.6.2.2A
6.6.2.2B
Additional SEM
SEM
6.6.2.3
6.6.2.3A
6.6.2.3B
Adjacent channel leakage
power ratio (ACLR)
ACP
6.6.3.1
6.6.3.1A
6.6.3B.1
Transmitter spurious emission
Spurious emissions
89600-based solutions offer
modulation-quality measurements. For one-button, nondemodulation, measurements
such as ACLR and spectrum
emission mask, the embedded
application should be used.
6.6.3.2
6.6.3.2A
6.6.3B.2
Spurious emission band UE
co-existence
Spurious emissions
6.6.3.3
6.6.3.3A
6.6.3B.3
Additional spurious emissions
Spurious emissions
6.7
6.7A
6.7B
Transmit intermodualtion
ACP
N/A
N/A
6.8B
Time alignment
Time offset1
1
2
1.
Time offset
These values are found in “Error Summary” table under Mod Analysis measurement or under Conformance EVM measurement for M9080B
and M9082B.
2. These measurements are part of the Mod Analysis measurement. Once in Mod Analysis, they are found under [Trace/Detector] -> {Data} >
{Demod Error}.
3. This measurement is part of the Mod Analysis measurement. Once in Mod Analysis, it is found under [Trace/Detector] -> {Data} > {Response}.
6
Measurement Details
It is important to note that the measurements shown in Tables 4-5
for LTE FDD and TDD are available for a single carrier, while the
measurements for LTE-Advanced FDD and TDD columns are available for multiple carriers with up to 5 component carriers.
All of the RF transmitter measurements as defined by the
3GPP standard, as well as a wide range of additional measurements and analysis tools are available with a press of
a button (Table 4 and 5). These measurements are fully
remote controllable via the IEC/IEEE bus or LAN, using
SCPI commands.
eNB Transmitter Test
Table 4. List of eNB measurements provided by M9080B and M9082B measurement applications
Technology
X-Series measurement application
LTE FDD
LTE-Advanced
FDD
LTE TDD
LTE-Advanced
TDD
M9080B-1FP
M9080B-2FP
M9082B-1FP
M9082B-2FP
PXI VSA
M9391A, M9393A
Modulation quality (error summary table):
EVM (RMS, peak, data, RS)
--
--
--
--
Channel power
--
--
--
--
RS Tx. power (RSTP)
--
--
--
--
OFDM symbol Tx. power (OSTP)
--
--
--
--
RS Rx. power (RSRP)
--
--
--
--
RSSI
--
--
--
--
RS Rx. quality (RSRQ)
--
--
--
--
Frequency error
--
--
--
--
Common tracking error
--
--
--
--
Symbol clock error
--
--
--
--
Time offset
--
--
--
--
IQ (Offset, gain imbalance, quad error, timing skew)
--
--
--
--
--
--
--
--
EVM vs. frequency (sub-carrier)
--
--
--
--
EVM vs. time (symbol)
--
--
--
--
EVM vs. resource block
--
--
--
--
EVM vs. slot
--
--
--
--
Frequency error per slot
--
--
--
--
Power vs. resource block
--
--
--
--
Power vs. slot
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
Conformance EVM
Demodulated error traces:
Symbols table:
Numerical values of demodulated symbols (encoded)
Decoded symbol table:
Numerical values of demodulated data include
demapped, deinterleaved, descrambled,
deratematched, and decoded data
Downlink decode table:
Decode information from PBCH, PDCCH, PHICH,
and PCFICH
Frame summary table:
EVM, power, modulation format, and number of allocated
RB and RNTI for all active channels and signals
7
Table 4. List of eNB measurements provided by M9080B and M9082B measurement applications (continued)
Technology
X-Series measurement application
LTE FDD
LTE-Advanced
FDD
LTE TDD
LTE-Advanced
TDD
M9080B-1FP
M9080B-2FP
M9082B-1FP
M9082B-2FP
PXI VSA
M9391A, M9393A
TX diversity MIMO (up to 4 Tx antenna) traces:
Info table
RS power
--
--
--
--
RS EVM
--
--
--
--
RS CTE
--
--
--
--
RS timing
--
--
--
--
RS phase
--
--
--
--
--
--
--
--
RS frequency
RS symbol clock
--
--
--
--
IQ gain imbalance
--
--
--
--
IQ quadrature error
--
--
--
--
IQ time skew
--
--
--
--
Channel frequency response
--
--
--
--
Channel frequency response difference
--
--
--
--
Equalizer impulse response
--
--
--
--
Common tracking error
--
--
--
--
--
--
--
--
Equalizer channel frequency response
--
--
--
--
Instantaneous equalizer channel frequency response
Equalizer channel frequency response difference
--
--
--
--
Instantaneous equalizer channel frequency response
--
--
--
--
Equalizer impulse response
--
--
--
--
Channel power
--
--
--
--
ACP
--
--
--
--
Detected allocations trace (resource block vs. symbol)
Response:
difference
Cumulative ACLR (CACLR)
--
Transmit on/off power
Spectrum emission mask (SEM)
--
Cumulative SEM
--
---
--
--
--
--
--
Spurious emissions
--
--
--
--
Occupied bandwidth
--
--
--
--
CCDF
--
--
--
--
Monitor spectrum
--
--
--
--
I/Q waveform
--
--
--
--
8
Table 5. List of UE measurements provided by M9080B and M9082B measurement applications
Technology
X-Series measurement application
LTE FDD
LTE-Advanced
FDD
LTE TDD
LTE-Advanced
TDD
M9080B-1FP
M9080B-2FP
M9082B-1FP
M9082B-2FP
PXI VSA
M9391A, M9393A
Modulation quality (error summary trace):
EVM (RMS, peak, data, RS)
--
--
--
--
Frequency error
--
--
--
--
Common tracking error
--
--
--
--
Symbol clock error
--
--
--
--
Time offset
--
--
--
--
IQ (offset, gain imbalance, quad error, timing skew)
--
--
--
--
Channel power
--
--
--
--
In-band emissions result
--
-Not available
for CA
--
-Not available
for CA
Spectral flatness result
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
Conformance EVM
--
--
--
--
In-band emissions
--
-Not available
for CA
--
-Not available
for CA
Spectrum flatness (eq. ch freq response per slot)
--
--
--
--
EVM vs. frequency (sub-carrier)
--
--
--
--
EVM vs. time (symbol)
--
--
--
--
EVM vs. resource block
--
--
--
--
EVM vs. slot
--
--
--
--
IQ offset per slot
--
--
--
--
Frequency error per slot
--
--
--
--
Power vs. resource block
--
--
--
--
Power vs. slot
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
Demodulated error traces:
Symbols table:
Numerical values of demodulated symbols (encoded)
Decoded symbol table:
Numerical values of demodulated data and descrambled data
for PUSCH
Frame summary table:
EVM, power, modulation format and number
of allocated RB for all active channels and signals
Detected allocations trace (resource block vs. symbol)
Table continued on next page
9
Table 5 continued. List of UE measurements provided by M9080B and M9082B measurement applications
Response:
Equalizer channel frequency response
Instantaneous equalizer channel frequency response
Equalizer channel frequency response difference
Instantaneous equalizer channel frequency response difference
Equalizer impulse response
Equalizer channel frequency response per slot
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
Channel power
--
--
--
--
ACP
--
--
--
--
Transmit on/off power
--
--
--
--
Spectrum emission mask (SEM)
--
--
--
--
Spurious emissions
--
--
--
--
Occupied bandwidth
--
--
--
--
CCDF
--
--
--
--
Monitor spectrum
--
--
--
--
I/Q waveform
--
--
--
--
10
Figure 3. LTE-Advanced downlink modulation analysis showing
constellation of five component carriers side-by-side.
Figure 4. Uplink modulation analysis measurement showing constellation, EVM vs. subcarrier, detected allocation, and EVM vs.
symbol information for two component carriers. Measurements
are color-coded based on channel type and up to 12 markers with
marker coupling between measurements are available for easier
troubleshooting.
Figure 5. Conformance EVM measurement showing all required
modulation quality metrics. This measurement is optimized for
manufacturing because of its fast measurement speed.
Figure 6. Downlink transport layer channel decoding measurement showing decoded information for PBCH, PDCCH, PCFICH,
and PHICH channels. Similar capability is also available for
uplink.
11
Figure 7. LTE-Advanced ACLR measurement with 5 contiguous
component carriers.
Figure 8. LTE-Advanced cumulative ACLR (CACLR) for non-contiguous carrier aggregation.
Figure 9. Transmit ON/OFF power measurement of an LTE-Advanced TDD downlink signal with two component carriers.
Figure 10. SEM measurement can be made on single carrier LTE
or up to 5 component carrier LTE-Advanced signal.
Figure 11. LTE-Advanced non-contiguous carrier aggregation
SEM measurement with special cumulative mask inside the subblock gap.
12
Key Specifications
Definitions
–– Specifications describe the performance of parameters covered
by the product warranty.
–– The specifications apply to single
carrier case only, unless otherwise stated.
–– 95th percentile values indicate
the breadth of the population
(≈2σ) of performance tolerances
expected to be met in 95% of
cases with a 95% confidence.
These values are not covered by
the product warranty.
–– Typical values are designated
with the abbreviation "typ."
These are performance beyond
specification that 80% of the
units exhibit with a 95% confidence. These values are not
covered by the product warranty.
–– Nominal values are designated
with the abbreviation "nom."
These values indicate expected
performance, or describe product performance that is useful in
the application of the product,
but is not covered by the product
warranty.
Note: Data subject to change
Supported devices and standards
Device type
LTE FDD/TDD
M9080B-1FP/ M9082B-1FP
LTE-Advanced FDD/TDD
M9080B-2FP/ M9082B-2FP
3GPP standards
supported
36.211 V9.1.0 (March 2010)
36.212 V9.4.0 (September 2011)
36.213 V9.3.0 (September 2010)
36.214 V9.2.0 (June 2010)
36.141 V9.10.0 (July 2012)
36.521-1 V9.8.0 (March 2012)
36.211 V10.7.0 (March 2013)
36.212 V10.7.0 (December 2012)
36.213 V10.9.0 (March 2013)
36.214 V10.12.0 (March 2013)
36.141 V11.4.0 (March 2013)
36.521-1 V10.5.0 (March 2013)
Signal structure
FDD Frame Structure Type 1
TDD Frame Structure Type 2
Special subframe configurations
0-8
FDD Frame Structure Type 1
TDD Frame Structure Type 2
Special subframe configurations
0-8
Signal direction
Uplink and downlink
UL/DL configurations 0-6
Uplink and Downlink
UL/DL configurations 0-6
Signal bandwidth
1.4 MHz (6 RB), 3 MHz (15 RB),
5 MHz (25 RB), 10 MHz (50 RB),
15 MHz (75 RB), 20 MHz
(100 RB)
Bandwidth per component
carrier: 1.4 MHz (6 RB), 3 MHz
(15 RB),
5 MHz (25 RB), 10 MHz (50 RB),
15 MHz (75 RB), 20 MHz (100
RB)
Number of component carriers
1
1, 2, 3, 4, or 5
Physical signals
Downlink
PBCH, PCFICH, PHICH, PDCCH, PDSCH, PMCH
Uplink
PUCCH, PUSCH, PRACH
Physical channels
Downlink
P-SS, S-SS, C-RS, UE-RS, P-PS
(positioning), MBSFN-RS
P-SS, S-SS, C-RS, UE-RS,
P-PS (positioning), MBSFN-RS,
CSI-RS
Uplink
PUCCH-DMRS, PUSCH-DMRS,
S-RS (sounding)
PUCCH-DMRS, PUSCH-DMRS,
S-RS (sounding)
For a complete list of specifications, please refer to the M9391A data sheet, literature number 59912603EN.
Performance specifications
Description
M9391A PXI VSA, nominal
Demodulation
LTE FDD E-TM, 10 MHz BW, 2 GHz
-52 dB
LTE FDD E-TM, 10 MHz BW, <1 GHz
-51 dB
LTE TDD E-TM, 10 MHz BW, 2 GHz
-49 dB
LTE TDD E-TM, 10 MHz BW, <1 GHz
-50 dB
Adjacent Channel Power
Adjacent channel
-64.9 dB
Alternate channel
-66.4 dB
13
Ordering Information
Software licensing
and configuration
Try before you buy!
Transportable, perpetual license
This allows you to run the application
using an embedded PXI PC controller or
external PC, plus it may be transferred
from one controller or PC to another.
One software license supports up to four
modular PXI VSA channels in one PXI
mainframe.
You can upgrade!
Free 30-day trials of X-Series
measurement applications provide
unrestricted use of each application’s
features and functionality on your
modular PXI VSA. See
www.keysight.com/find/M90XA
for more information.
Options can be added
after your initial purchase.
All of our X-Series application options are
license-key upgradeable.
M9080B LTE/LTE-Advanced FDD measurement application
Model-Option
Description
Additional information
M9080B-1TP
LTE FDD measurement application, transportable perpetual license
M9080B-2TP
LTE-Advanced FDD measurement application, transportable perpetual license Requires 1TP
Note: M9080B application requires Windows 7 operating system.
M9082B LTE/LTE-Advanced TDD measurement application
Model-Option
Description
M9082B-1TP
LTE TDD measurement application, transportable perpetual license
Additional information
M9082B-2TP
LTE-Advanced TDD measurement application, transportable perpetual license Requires 1TP
Note: M9082B application requires Windows 7 operating system.
Hardware Configuration
M9391A PXIe vector signal analyzer configuration
Model-Option
Description
Notes
M9391A-F03, -F06
3 GHz or 6 GHz frequency range
One required
M9391A-B04, -B10, or -B16
40 MHz, 100 MHz or 160 MHz analysis bandwidth
One required. -B16 recommended for fastest spectrum measurements with 89600 VSA
software Option SSA.
M9391A-300
PXIe frequency reference
Recommended.
M9391A-UNZ
Fast tuning
Recommended. Highly recommended for fastest
spectrum measurements with 89600 VSA software Option SSA.
M9391A-M01, -M05, or -M10
Memory options (512 MB, 2 GB, or 4 GB)
Recommend 1 Gsa/4 GB memory
14
M9393A PXIe performance vector signal analyzer configuration
Model-Option
Description
Notes
M9393A-F08, -F14, -F18, or
-F27
8 GHz, 14 GHz, 18 GHz, or 27 GHz frequency range
One required
M9393A-B04, -B10, or -B16
40 MHz, 100 MHz or 160 MHz analysis bandwidth
One required. -B16 recommended for fastest spectrum measurements with 89600 VSA
software Option SSA.
M9393A-300
PXIe frequency reference
Recommended
M9393A-UNZ
Fast tuning
Recommended. Highly recommended for fastest
spectrum measurements with 89600 VSA software Option SSA.
M9393A-M01, -M05, or -M10
Memory options (512 MB, 2 GB, or 4 GB)
Recommend 1 Gsa/4 GB memory
Related Literature
Web
–– Product pages:
www.keysight.com/find/M9080B
www.keysight.com/find/M9082B
–– N9080B LTE/LTE-Advanced FDD Measurement Application
Measurement Guide, Part Number N9080-90008
–– N9082B LTE/LTE-Advanced TDD Measurement Application
Measurement Guide, Part Number N9082-90004
–– 3GPP Long Term Evolution: System Overview, Product Development, and Test Challenges, Application Note, Literature
Number 5989-8139EN
–– Introducing LTE-Advanced, Application Note, Literature
Number 5990-6706EN
–– Stimulus-Response Testing for LTE Components, Application
Note, Literature Number 5990-5149EN
–– Measuring ACLR Performance in LTE Transmitters, Application
Note, Literature Number 5990-5089EN
–– TD-LTE E-UTRA Base Station Transmit ON/OFF Power Measurement Using a Keysight X-Series Signal Analyzer, Application Note, Literature Number 5990-5989EN
–– User’s and Programmer’s Reference Guide is available in the library section of the N9080A, W9080A,
N9082A and W9082A product pages.
–– M9391A Data Sheet, Literature Number 5991-2603EN
–– X-Series Measurement Applications for Modular Instruments
Brochure, Literature Number 5991-2604EN
–– X-Series measurement applications:
www.keysight.com/find/M90XA
–– M9391A PXIe vector signal analyzer
www.keysight.com/find/M9391A
–– M9393A PXIe performance vector signal analyzer
www.keysight.com/find/M9393A
–– X-Series signal analyzers:
www.keysight.com/find/X-Series
–– Application pages:
www.keysight.com/find/lte
www.keysight.com/find/lteadvanced
15
16 | Keysight | M9080B & M9082B LTE & LTE-Advanced FDD/TDD - Technical Overview
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© Keysight Technologies, 2014
Published in USA, August 4, 2014
5991-4610EN
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