Cypress CY7C1061GN30-10ZXIT 16-mbit (1m words ã 16 bit) static ram Datasheet

CY7C1061GN/CY7C10612GN
16-Mbit (1M words × 16 bit) Static RAM
16-Mbit (1M words × 16 bit) Static RAM
Features
Functional Description
■
High speed
❐ tAA = 10 ns/15 ns
The CY7C1061GN/CY7C10612GN is a high performance
CMOS Static RAM organized as 1,048,576 words by 16 bits.
■
Low active power
❐ ICC = 90 mA at 100 MHz
■
Low CMOS standby current
❐ ISB2 = 20 mA (typ)
■
Operating voltages of 2.2 V to 3.6 V
To write to the device, take Chip Enables (CE1 LOW and CE2
HIGH) and Write Enable (WE) input LOW. If Byte Low Enable
(BLE) is LOW, then data from I/O pins (I/O0 through I/O7), is
written into the location specified on the address pins (A0 through
A19). If Byte High Enable (BHE) is LOW, then data from I/O pins
(I/O8 through I/O15) is written into the location specified on the
address pins (A0 through A19).
■
1.0 V data retention
■
Automatic power down when deselected
■
TTL compatible inputs and outputs
■
Easy memory expansion with CE1 and CE2 features
■
Available in Pb-free 48-pin TSOP I, 54-pin TSOP II, and 48-ball
VFBGA packages
■
Offered in dual Chip Enable options
To read from the device, take Chip Enables (CE1 LOW and CE2
HIGH) and Output Enable (OE) LOW while forcing the Write
Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data
from the memory location specified by the address pins appears
on I/O0 to I/O7. If Byte High Enable (BHE) is LOW, then data from
memory appears on I/O8 to I/O15. See Truth Table on page 13
for a complete description of Read and Write modes.
The input or output pins (I/O0 through I/O15) are placed in a high
impedance state when the device is deselected (CE1 HIGH/CE2
LOW), the outputs are disabled (OE HIGH), the BHE and BLE
are disabled (BHE, BLE HIGH), or during a write operation (CE1
LOW, CE2 HIGH, and WE LOW).
Logic Block Diagram
SENSE AMPS
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
ROW DECODER
INPUT BUFFER
1M x 16
ARRAY
I/O0 – I/O7
I/O8 – I/O15
A10
A11
A 12
A 13
A 14
A15
A16
A17
A18
A19
COLUMN
DECODER
BHE
WE
OE
BLE
Cypress Semiconductor Corporation
Document Number: 001-93680 Rev. *C
•
198 Champion Court
•
CE2
CE1
San Jose, CA 95134-1709
•
408-943-2600
Revised September 29, 2016
CY7C1061GN/CY7C10612GN
Contents
Selection Guide ................................................................ 3
Pin Configurations ........................................................... 3
Maximum Ratings ............................................................. 6
Operating Range ............................................................... 6
DC Electrical Characteristics .......................................... 6
Capacitance ...................................................................... 7
Thermal Resistance .......................................................... 7
AC Test Loads and Waveforms ....................................... 7
Data Retention Characteristics ....................................... 8
Over the Operating Range ............................................... 8
Data Retention Waveform ................................................ 8
AC Switching Characteristics ......................................... 9
Switching Waveforms .................................................... 10
Truth Table ...................................................................... 13
Document Number: 001-93680 Rev. *C
Ordering Information ...................................................... 14
Ordering Code Definitions ......................................... 14
Package Diagrams .......................................................... 15
Acronyms ........................................................................ 18
Document Conventions ................................................. 18
Units of Measure ....................................................... 18
Document History Page ................................................. 19
Sales, Solutions, and Legal Information ...................... 21
Worldwide Sales and Design Support ....................... 21
Products .................................................................... 21
PSoC®Solutions ....................................................... 21
Cypress Developer Community ................................. 21
Technical Support ..................................................... 21
Page 2 of 21
CY7C1061GN/CY7C10612GN
Selection Guide
-10
-15
Unit
Maximum access time
Description
10
15
ns
Maximum operating current
110
80
mA
Maximum CMOS standby current
30
30
mA
Pin Configurations
Figure 1. 48-ball VFBGA (8 × 9.5 × 1 mm) Dual Chip Enable pinout, Package/Grade ID: BVXI [1]
1
2
3
4
5
6
BLE
OE
A0
A1
A2
CE2
A
I/O8
BHE
A3
A4
CE1
I/O0
B
I/O9
I/O10
A5
A6
I/O1
I/O2
C
VSS I/O11
A17
A7
I/O3
VCC
D
VCC
I/O12
NC
A16
I/O4
VSS
E
I/O14
I/O13
A14
A15
I/O5
I/O6
F
I/O15
NC
A12
A13
WE
I/O7
G
A18
A8
A9
A10
A11
A19
H
Note
1. NC pins are not connected internally to the die.
Document Number: 001-93680 Rev. *C
Page 3 of 21
CY7C1061GN/CY7C10612GN
Pin Configurations (continued)
Figure 2. 48-ball VFBGA (6 × 8 × 1.0 mm)
Single Chip Enable pinout, Package/Grade ID: BV1XI [2]
1
2
3
4
5
6
BLE
OE
A0
A1
A2
NC
I/O8
BHE
A3
A4
CE
I/O9
I/O10
A5
A6
VSS I/O11
A17
Figure 3. 48-ball VFBGA (6 × 8 × 1.0 mm)
Dual Chip Enable pinout, Package/Grade ID: BVJXI [2]
1
2
3
4
5
6
A
BLE
OE
A0
A1
A2
CE2
A
I/O0
B
I/O8
BHE
A3
A4
CE1
I/O0
B
I/O1
I/O2
C
I/O9
I/O10
A5
A6
I/O1
I/O2
C
A7
I/O3
VCC
D
VSS I/O11
A17
A7
VCC
D
ERR
A16
I/O4
VSS
E
I/O3
VCC
I/O12
NC
A16
I/O4
VSS
E
VCC
I/O14
I/O13
A14
A15
I/O5
I/O6
F
I/O14 I/O13
A14
A15
I/O5
I/O6
F
I/O15
A19
A12
A13
WE
I/O7
G
I/O15
A19
A12
A13
WE
I/O7
G
A18
A8
A9
A10
A11
NC
H
A18
A8
A9
A10
A11
NC
H
Figure 4. 54-pin TSOP II (22.4 × 11.84 × 1.0 mm)
Dual Chip Enable pinout (Top View) [2]
I/O12
VCC
I/O13
I/O14
VSS
I/O15
A4
A3
A2
A1
A0
BHE
CE1
VCC
WE
CE2
A19
A18
A17
A16
A15
I/O0
VCC
I/O1
I/O2
VSS
I/O3
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
I/O11
VSS
I/O10
I/O9
VCC
I/O8
A5
A6
A7
A8
A9
NC
OE
VSS
NC
BLE
A10
A11
A12
A13
A14
I/O7
VSS
I/O6
I/O5
VCC
I/O4
I/O12
Figure 5. 54-pin TSOP II (22.4 × 11.84 × 1.0 mm)
Single Chip Enable pinout (Top View) [2]
I/O12
VCC
I/O13
I/O14
VSS
I/O15
A4
A3
A2
A1
A0
BHE
CE
VCC
WE
NC
A19
A18
A17
A16
A15
I/O0
VCC
I/O1
I/O2
VSS
I/O3
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
45
44
I/O11
VSS
I/O10
I/O9
VCC
I/O8
A5
A6
A7
A8
A9
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
NC
OE
VSS
NC
BLE
A10
A11
A12
A13
A14
I/O7
VSS
I/O6
I/O5
VCC
I/O4
54
53
52
51
50
49
48
47
46
Note
2. NC pins are not connected internally to the die.
Document Number: 001-93680 Rev. *C
Page 4 of 21
CY7C1061GN/CY7C10612GN
Pin Configurations (continued)
Figure 6. 48-pin TSOP I (12 × 18.4 × 1 mm) pinout (Top View) [3]
A4
A3
A2
A1
A0
NC
CE
I/O0
I/O1
I/O2
I/O3
VDD
GND
I/O4
I/O5
I/O6
I/O7
WE
NC
A19
A18
A17
A16
A15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
A5
A6
A7
A8
OE
BHE
BLE
I/O15
I/O14
I/O13
I/O12
GND
VDD
I/O11
I/O10
I/O9
I/O8
NC
A9
A10
A11
A12
A13
A14
Note
3. NC pins are not connected internally to the die.
Document Number: 001-93680 Rev. *C
Page 5 of 21
CY7C1061GN/CY7C10612GN
DC Input Voltage [4] ............................ –0.5 V to VCC + 0.5 V
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ............................... –65 C to +150 C
Ambient Temperature
with Power Applied .................................. –55 C to +125 C
Current into Outputs (LOW) ........................................ 20 mA
Static Discharge Voltage
(MIL-STD-883, Method 3015) .................................. >2001 V
Latch Up Current .................................................... >200 mA
Operating Range
Supply Voltage
on VCC relative to GND [4] .................. –0.5 V to VCC + 0.5 V
DC Voltage Applied to Outputs
in High Z State [4] ................................ –0.5 V to VCC + 0.5 V
Range
Ambient Temperature
VCC
Industrial
–40 C to +85 C
1.65 V to 2.2 V,
2.2 V to 3.6 V
DC Electrical Characteristics
Over the Operating Range
Parameter
VOH
VOL
VIH
VIL
Description
Output HIGH
voltage
Output LOW
voltage
Input HIGH
voltage [4]
Input LOW
voltage [4]
Test Conditions
10 ns/15 ns
Unit
Min
Typ [5]
Max
1.65 V to 2.2 V VCC = Min, IOH = –0.1 mA
1.4
–
–
2.2 V to 2.7 V VCC = Min, IOH = –0.1 mA
2.0
–
–
2.7 V to 3.0 V VCC = Min, IOH = –4.0 mA
2.2
–
–
3.0 V to 3.6 V VCC = Min, IOH = –4.0 mA
2.4
–
–
1.65 V to 2.2 V VCC = Min, IOL = 0.1 mA
–
–
0.2
2.2 V to 2.7 V VCC = Min, IOL = 2 mA
–
–
0.4
2.7 V to 3.6 V VCC = Min, IOL = 8 mA
–
–
0.4
1.65 V to 2.2 V –
1.4
–
VCC + 0.2
2.2 V to 2.7 V –
2.0
–
VCC + 0.3
V
V
2.7 V to 3.6 V –
2.0
–
VCC + 0.3
1.65 V to 2.2 V –
–0.2
–
0.4
2.2 V to 2.7 V –
–0.3
–
0.6
2.7 V to 3.6 V –
–0.3
–
0.8
V
V
IIX
Input leakage current
GND < VI < VCC
–1
–
+1
A
IOZ
Output leakage current
GND < VOUT < VCC, Output disabled
–1
–
+1
A
ICC
VCC operating supply current
VCC = Max,
IOUT = 0 mA,
f = 100 MHz
–
90
110
mA
f = 66.7 MHz
–
70
80
–
–
40
mA
–
20
30
mA
CMOS levels
ISB1
Automatic CE power down
current – TTL inputs[6]
Max VCC,
CE1 > VIH, CE2 < VIL,
VIN > VIH or VIN < VIL, f = fMAX
ISB2
Automatic CE power down
current – CMOS inputs[6]
Max VCC,
CE1 > VCC – 0.3 V, CE2 < 0.3 V,
VIN > VCC – 0.3 V or VIN < 0.3 V, f = 0
Notes
4. VIL(min) = –2.0 V and VIH(max) = VCC + 2 V for pulse durations of less than 20 ns.
5. Typical values are included only for reference and are not guaranteed or tested. Typical values are measured at VCC = 1.8 V (for a VCC range of 1.65 V–2.2 V),
VCC = 3 V (for a VCC range of 2.2 V–3.6 V) at TA = 25 °C.
6. For all dual chip enable devices, CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW,
CE is HIGH.
Document Number: 001-93680 Rev. *C
Page 6 of 21
CY7C1061GN/CY7C10612GN
Capacitance
Parameter [7]
Description
CIN
Input capacitance
COUT
I/O capacitance
Test Conditions
TA = 25 C, f = 1 MHz,
VCC = 3.3 V
48-pin TSOP I 54-pin TSOP II 48-ball VFBGA Unit
10
10
10
pF
10
10
10
pF
Thermal Resistance
Parameter [7]
Description
JA
Thermal resistance
(junction to ambient)
JC
Thermal resistance
(junction to case)
Test Conditions
Still air, soldered on a
3 × 4.5 inch, four layer
printed circuit board
48-pin TSOP I 54-pin TSOP II 48-ball VFBGA Unit
57.99
93.63
31.50
C/W
13.42
21.58
15.75
C/W
AC Test Loads and Waveforms
Figure 7. AC Test Loads and Waveforms [8]
High-Z Characteristics:
VCC
50 
Output
VTH
Z0 = 50 
Output
30 pF*
Including
JIG and
Scope
(b)
All Input Pulses
VHIGH
GND
R2

5 pF*
(a)
* Capacitive Load Consists
of all Components of the
Test Environment
R1
90%
90%
10%
Rise Time:
> 1 V/ns
10%
(c)
Fall Time:
> 1 V/ns
Parameters
1.8 V
3.0 V
Unit
R1
1667
317

R2
1538
351

VTH
0.9
1.5
V
VHIGH
1.8
3
V
Notes
7. Tested initially and after any design or process changes that may affect these parameters.
8. Full-device AC operation assumes a 100-µs ramp time from 0 to VCC (min) and 100-µs wait time after VCC stabilizes to its operational value.
Document Number: 001-93680 Rev. *C
Page 7 of 21
CY7C1061GN/CY7C10612GN
Data Retention Characteristics
Over the Operating Range
Parameter
Description
Conditions
Min
Max
Unit
VDR
VCC for data retention
–
1
–
V
ICCDR
Data retention current
VCC = 1.2 V,
–
30
mA
CE1 > VCC – 0.2 V, CE2 < 0.2 V,
VIN > VCC – 0.2 V or VIN < 0.2 V
tCDR
[9]
tR[10]
Chip deselect to data retention
time
–
0
–
ns
Operation recovery time
VCC > 2.2 V
10
–
ns
VCC < 2.2 V
15
–
Data Retention Waveform
Figure 8. Data Retention Waveform [11]
Data Retention Mode
VCC
VCC (min)
VDR > 1 V
tCDR
VCC (min)
tR
CE
Notes
9. Tested initially and after any design or process changes that may affect these parameters.
10. Full device operation requires linear VCC ramp from VDR to VCC(min.) > 100 s or stable at VCC(min.) > 100 s.
11. CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW, CE is HIGH.
Document Number: 001-93680 Rev. *C
Page 8 of 21
CY7C1061GN/CY7C10612GN
AC Switching Characteristics
Over the Operating Range
Parameter [12]
-10
Description
-15
Min
Max
Min
Max
Unit
Read Cycle
tpower
VCC(typical) to the first access [13]
100
–
100
–
s
tRC
Read cycle time
10
–
15
–
ns
tAA
Address to data valid
–
10
–
15
ns
tOHA
Data hold from address change
3
–
3
–
ns
tACE
CE1 LOW/CE2 HIGH to data valid
–
10
–
15
ns
tDOE
OE LOW to data valid
–
5
–
8
ns
0
–
1
–
ns
–
5
–
8
ns
3
–
3
–
ns
–
5
–
8
ns
0
–
0
–
ns
tLZOE
OE LOW to low Z
[14]
[14, 15]
tHZOE
OE HIGH to high Z
tLZCE
CE1 LOW/CE2 HIGH to low Z [14]
tHZCE
tPU
CE1 HIGH/CE2 LOW to high Z
[14, 15]
CE1 LOW/CE2 HIGH to power-up
[16]
[16]
tPD
CE1 HIGH/CE2 LOW to power-down
–
10
–
15
ns
tDBE
Byte enable to data valid
–
5
–
8
ns
tLZBE
Byte enable to low Z
0
–
1
–
ns
Byte disable to high Z
–
6
–
8
ns
10
–
15
–
ns
7
–
12
–
ns
7
–
12
–
ns
tHZBE
Write Cycle
tWC
[17, 18]
Write cycle time
end[19]
tSCE
CE1 LOW/CE2 HIGH to write
tAW
Address setup to write end
tHA
Address hold from write end
0
–
0
–
ns
tSA
Address setup to write start
0
–
0
–
ns
tPWE
WE pulse width
7
–
12
–
ns
tSD
Data setup to write end
5
–
8
–
ns
tHD
Data hold from write end
0
–
0
–
ns
tLZWE
WE HIGH to low Z [14]
3
–
3
–
ns
–
5
–
8
ns
7
–
12
–
ns
[14, 15]
tHZWE
WE LOW to high Z
tBW
Byte Enable to End of Write
Notes
12. Test conditions assume signal transition time (rise/fall) of 3 ns or less, timing reference levels of 1.5 V (for VCC > 3 V) and VCC/2 (for VCC < 3 V), and input pulse levels
of 0 to 3 V (for VCC > 3 V) and 0 to VCC (for VCC < 3V). Test conditions for the read cycle use the output loading, shown in part (a) of Figure 7 on page 7, unless specified otherwise.
13. tPOWER gives the minimum amount of time that the power supply is at typical VCC values until the first memory access is performed.
14. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device.
15. tHZOE, tHZCE, tHZWE, and tHZBE are specified with a load capacitance of 5 pF, as shown in part (b) of Figure 7 on page 7. Hi-Z, Lo-Z transition is measured 200 mV from steady state
voltage.
16. These parameters are guaranteed by design and are not tested.
17. The internal write time of the memory is defined by the overlap of WE, CE1 = VIL, and CE2 = VIH. Chip enables must be active and WE and byte enables must be
LOW to initiate a write, and the transition of any of these signals can terminate. The input data setup and hold timing should be referenced to the edge of the signal
that terminates the write.
18. The minimum write cycle time for Write Cycle No. 2 (WE Controlled, OE LOW) is the sum of tHZWE and tSD.
19. For all dual chip enable devices, CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW,
CE is HIGH.
Document Number: 001-93680 Rev. *C
Page 9 of 21
CY7C1061GN/CY7C10612GN
Switching Waveforms
Figure 9. Read Cycle No. 1 (Address Transition Controlled) [20, 21]
tRC
RC
Address
tAA
tOHA
Data Out
Previous Data Valid
Data Valid
Figure 10. Read Cycle No. 2 (OE Controlled) [21, 22, 23]
Address
tRC
CE
tACE
OE
tHZOE
tDOE
BHE, BLE
tLZOE
tHZCE
tDBE
tLZBE
Data Out
High Impedance
Data Valid
tLZCE
VCC
Supply
Current
tHZBE
High
Impedance
tPD
tPU
50%
50%
IICC
CC
IISB
SB
Notes
20. The device is continuously selected. OE, CE = VIL, BHE, BLE or both = VIL.
21. WE is HIGH for read cycle.
22. CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW, CE is HIGH.
23. Address valid before or similar to CE transition LOW.
Document Number: 001-93680 Rev. *C
Page 10 of 21
CY7C1061GN/CY7C10612GN
Switching Waveforms (continued)
Figure 11. Write Cycle No. 1 (CE Controlled) [24, 25, 26]
tWC
Address
tSA
CE
tSCE
tAW
tHA
tPWE
WE
tBW
BHE, BLE
tSD
tHD
Data I/O
Figure 12. Write Cycle No. 2 (WE Controlled, OE LOW) [24, 25, 26]
tWC
Address
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tBW
BHE, BLE
tHZWE
tSD
tHD
Data I/O
tLZWE
Notes
24. CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW, CE is HIGH.
25. Data I/O is high impedance if OE, BHE, and/or BLE = VIH.
26. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
Document Number: 001-93680 Rev. *C
Page 11 of 21
CY7C1061GN/CY7C10612GN
Switching Waveforms (continued)
Figure 13. Write Cycle No. 3 (BLE or BHE Controlled) [27]
tWC
Address
tSA
tBW
BHE, BLE
tAW
tHA
tPWE
WE
tSCE
CE
tSD
tHD
Data I/O
Note
27. CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW, CE is HIGH.
Document Number: 001-93680 Rev. *C
Page 12 of 21
CY7C1061GN/CY7C10612GN
Truth Table
CE1 CE2
OE
WE
BLE
BHE
I/O0–I/O7
I/O8–I/O15
Mode
Power
H
X
X
X
X
X
High Z
High Z
Power down
Standby (ISB)
X
L
X
X
X
X
High Z
High Z
Power down
Standby (ISB)
L
H
L
H
L
L
Data out
Data out
Read all bits
Active (ICC)
L
H
L
H
L
H
Data out
High Z
Read lower bits only
Active (ICC)
L
H
L
H
H
L
High Z
Data out
Read upper bits only
Active (ICC)
L
H
X
L
L
L
Data in
Data in
Write all bits
Active (ICC)
L
H
X
L
L
H
Data in
High Z
Write lower bits only
Active (ICC)
L
H
X
L
H
L
High Z
Data in
Write upper bits only
Active (ICC)
L
H
H
H
X
X
High Z
High Z
Selected, outputs disabled
Active (ICC)
Document Number: 001-93680 Rev. *C
Page 13 of 21
CY7C1061GN/CY7C10612GN
Ordering Information
Speed
(ns)
10
15
Ordering Code
Package
Diagram
Package Type
(Pb-free)
CY7C1061GN30-10ZSXI
51-85160 54-pin TSOP II, Dual Chip Enable
CY7C1061GN30-10ZSXIT
51-85160 54-pin TSOP II, Dual Chip Enable, Tape and Reel
CY7C10612GN30-10ZSXI
51-85160 54-pin TSOP II, Single Chip Enable
CY7C10612GN30-10ZSXIT
51-85160 54-pin TSOP II, Single Chip Enable, Tape and Reel
CY7C1061GN30-10ZXI
51-85183 48-pin TSOP I, Single Chip Enable
CY7C1061GN30-10ZXIT
51-85183 48-pin TSOP I, Single Chip Enable, Tape and Reel
CY7C1061GN30-10BV1XI
51-85150 48-ball VFBGA, Single Chip Enable, Address MSB A19 at ball G2
CY7C1061GN30-10BV1XIT
51-85150 48-ball VFBGA, Single Chip Enable, Address MSB A19 at ball G2,
Tape and Reel
CY7C1061GN30-10BVJXI
51-85150 48-ball VFBGA, Dual Chip Enable, Address MSB A19 at ball G2
CY7C1061GN30-10BVJXIT
51-85150 48-ball VFBGA, Dual Chip Enable, Address MSB A19 at ball G2,
Tape and Reel
CY7C1061GN30-10BVXI
51-85150 48-ball VFBGA, Dual Chip Enable, Address MSB A19 at ball H6
CY7C1061GN30-10BVXIT
51-85150 48-ball VFBGA, Dual Chip Enable, Address MSB A19 at ball H6,
Tape and Reel
CY7C1061GN18-15ZSXI
51-85160 54-pin TSOP II
CY7C1061GN18-15ZSXIT
51-85160 54-pin TSOP II, Tape and Reel
Operating
Range
Industrial
Ordering Code Definitions
CY 7 C 1 06 1 X G
N XX - X XX X
I
X
X = blank or T
blank = Bulk; T = Tape and Reel
Temperature Range:
I = Industrial
Pb-free
Package Type: XX = ZS or ZX or BV1 or BVJ or BV
ZS = 54-pin TSOP II;
ZX = 48-pin TSOP I;
BV1 = 48-ball VFBGA, Single Chip Enable, Address MSB A19 at ball G2;
BVJ = 48-ball VFBGA, Dual Chip Enable, Address MSB A19 at ball G2;
BV = 48-ball VFBGA, Dual Chip Enable, Address MSB A19 at ball H6
Speed: X = 10 or 15
10 = 10 ns; 15 = 15 ns
Voltage Range: XX = 30 or 18
30 = 2.2 V to 3.6 V; 18 = 1.65 V to 2.2 V
N = No ECC
Process Technology: G = 65 nm Technology
Chip Enable: X = blank or 2
Data Width: 1 = × 16-bits
Density: 06 = 16-Mbit density
Family Code: 1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
Document Number: 001-93680 Rev. *C
Page 14 of 21
CY7C1061GN/CY7C10612GN
Package Diagrams
Figure 14. 54-pin TSOP II (22.4 × 11.84 × 1.0 mm) Z54-II Package Outline, 51-85160
51-85160 *E
Document Number: 001-93680 Rev. *C
Page 15 of 21
CY7C1061GN/CY7C10612GN
Package Diagrams (continued)
Figure 15. 48-pin TSOP I (12 × 18.4 × 1.0 mm) Z48A Package Outline, 51-85183
51-85183 *D
Document Number: 001-93680 Rev. *C
Page 16 of 21
CY7C1061GN/CY7C10612GN
Package Diagrams (continued)
Figure 16. 48-ball VFBGA (6 × 8 × 1.0 mm) BV48/BZ48 Package Outline, 51-85150
51-85150 *H
Document Number: 001-93680 Rev. *C
Page 17 of 21
CY7C1061GN/CY7C10612GN
Acronyms
Acronym
Document Conventions
Description
Units of Measure
BHE
Byte High Enable
BLE
Byte Low Enable
°C
degree Celsius
CE
Chip Enable
MHz
megahertz
CMOS
Complementary Metal Oxide Semiconductor
A
microampere
I/O
Input/Output
s
microsecond
OE
Output Enable
mA
milliampere
SRAM
Static Random Access Memory
mm
millimeter
TSOP
Thin Small Outline Package
ns
nanosecond
TTL
Transistor-Transistor Logic

ohm
VFBGA
Very Fine-Pitch Ball Grid Array
%
percent
WE
Write Enable
pF
picofarad
V
volt
W
watt
Document Number: 001-93680 Rev. *C
Symbol
Unit of Measure
Page 18 of 21
CY7C1061GN/CY7C10612GN
Document History Page
Document Title: CY7C1061GN/CY7C10612GN, 16-Mbit (1M words × 16 bit) Static RAM
Document Number: 001-93680
Rev.
ECN No.
Orig. of
Change
Submission
Date
**
4505531
VINI
01/02/2015
New data sheet.
*A
4900408
NILE
09/11/2015
Updated DC Electrical Characteristics:
Updated details in “Test Conditions” column of VOH and VOL parameters.
Updated Ordering Information:
No change in part numbers.
Replaced “51-85178” with “51-85150” in “Package Diagram” column.
Replaced “8 × 9.5 × 1 mm” with “6 × 8 × 1.0 mm” in “Package Type” column.
Updated Package Diagrams:
Removed spec 51-85178 *C.
Added spec 51-85150 *H.
Updated to new template.
*B
5415385
NILE
09/07/2016
Updated Document Title to read as “CY7C1061GN/CY7C10612GN, 16-Mbit
(1M words × 16 bit) Static RAM”.
Added CY7C10612GN part related information in all instances across the
document.
Added “1.65 V to 2.2 V” voltage range related information in all instances
across the document.
Added 48-pin TSOP I package related information in all instances across the
document.
Added 15 ns speed bin related information in all instances across the
document.
Updated Pin Configurations:
Added Figure 2.
Added Figure 3.
Added Figure 4.
Added Figure 5.
Added Figure 6.
Removed figure “54-pin TSOP II (22.4 × 11.84 × 1.0 mm) pinout (Top View)”.
Updated DC Electrical Characteristics:
Updated details in “Test Conditions” column of ICC parameter (Added condition
“f = 66.7 MHz” and added corresponding values).
Added Note 6 and referred the same note in description of ISB1 and ISB2
parameters.
Updated AC Test Loads and Waveforms:
Updated Note 8 referred in Figure 7.
Updated AC Switching Characteristics:
Updated Note 12.
Added Note 14 and referred the same note in description of tLZOE, tHZOE, tLZCE,
tHZCE parameters.
Updated Note 15.
Added Note 19 and referred the same note in description of tSCE parameter.
Updated Ordering Information:
Updated part numbers.
Updated Package Diagrams:
Added spec 51-85183 *D.
Updated to new template.
Document Number: 001-93680 Rev. *C
Description of Change
Page 19 of 21
CY7C1061GN/CY7C10612GN
Document History Page (continued)
Document Title: CY7C1061GN/CY7C10612GN, 16-Mbit (1M words × 16 bit) Static RAM
Document Number: 001-93680
Rev.
ECN No.
Orig. of
Change
Submission
Date
Description of Change
*C
5454555
NILE
09/29/2016
Updated Maximum Ratings:
Updated Note 4 (Replaced “2 ns” with “20 ns”).
Updated DC Electrical Characteristics:
Removed Operating Range “2.7 V to 3.6 V” and all values corresponding to
VOH parameter.
Included Operating Ranges “2.7 V to 3.0 V” and “3.0 V to 3.6 V” and all values
corresponding to VOH parameter.
Updated Ordering Information:
Updated part numbers.
Updated Ordering Code Definitions.
Document Number: 001-93680 Rev. *C
Page 20 of 21
CY7C1061GN/CY7C10612GN
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
PSoC®Solutions
Products
ARM® Cortex® Microcontrollers
Automotive
cypress.com/arm
cypress.com/automotive
Clocks & Buffers
Interface
Lighting & Power Control
Memory
cypress.com/clocks
cypress.com/interface
cypress.com/powerpsoc
cypress.com/memory
PSoC
Cypress Developer Community
Forums | Projects | Video | Blogs | Training | Components
Technical Support
cypress.com/support
cypress.com/psoc
Touch Sensing
cypress.com/touch
USB Controllers
Wireless/RF
PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP
cypress.com/usb
cypress.com/wireless
© Cypress Semiconductor Corporation, 2015–2016. This document is the property of Cypress Semiconductor Corporation and its subsidiaries, including Spansion LLC ("Cypress"). This document,
including any software or firmware included or referenced in this document ("Software"), is owned by Cypress under the intellectual property laws and treaties of the United States and other countries
worldwide. Cypress reserves all rights under such laws and treaties and does not, except as specifically stated in this paragraph, grant any license under its patents, copyrights, trademarks, or other
intellectual property rights. If the Software is not accompanied by a license agreement and you do not otherwise have a written agreement with Cypress governing the use of the Software, then Cypress
hereby grants you a personal, non-exclusive, nontransferable license (without the right to sublicense) (1) under its copyright rights in the Software (a) for Software provided in source code form, to
modify and reproduce the Software solely for use with Cypress hardware products, only internally within your organization, and (b) to distribute the Software in binary code form externally to end users
(either directly or indirectly through resellers and distributors), solely for use on Cypress hardware product units, and (2) under those claims of Cypress's patents that are infringed by the Software (as
provided by Cypress, unmodified) to make, use, distribute, and import the Software solely for use with Cypress hardware products. Any other use, reproduction, modification, translation, or compilation
of the Software is prohibited.
TO THE EXTENT PERMITTED BY APPLICABLE LAW, CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS DOCUMENT OR ANY SOFTWARE
OR ACCOMPANYING HARDWARE, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. To the extent
permitted by applicable law, Cypress reserves the right to make changes to this document without further notice. Cypress does not assume any liability arising out of the application or use of any
product or circuit described in this document. Any information provided in this document, including any sample design information or programming code, is provided only for reference purposes. It is
the responsibility of the user of this document to properly design, program, and test the functionality and safety of any application made of this information and any resulting product. Cypress products
are not designed, intended, or authorized for use as critical components in systems designed or intended for the operation of weapons, weapons systems, nuclear installations, life-support devices or
systems, other medical devices or systems (including resuscitation equipment and surgical implants), pollution control or hazardous substances management, or other uses where the failure of the
device or system could cause personal injury, death, or property damage ("Unintended Uses"). A critical component is any component of a device or system whose failure to perform can be reasonably
expected to cause the failure of the device or system, or to affect its safety or effectiveness. Cypress is not liable, in whole or in part, and you shall and hereby do release Cypress from any claim,
damage, or other liability arising from or related to all Unintended Uses of Cypress products. You shall indemnify and hold Cypress harmless from and against all claims, costs, damages, and other
liabilities, including claims for personal injury or death, arising from or related to any Unintended Uses of Cypress products.
Cypress, the Cypress logo, Spansion, the Spansion logo, and combinations thereof, PSoC, CapSense, EZ-USB, F-RAM, and Traveo are trademarks or registered trademarks of Cypress in the United
States and other countries. For a more complete list of Cypress trademarks, visit cypress.com. Other names and brands may be claimed as property of their respective owners.
Document Number: 001-93680 Rev. *C
Revised September 29, 2016
Page 21 of 21
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