IDT F1456NKGK Tx digital vga Datasheet

T
F1456
TX Digital VGA
2100 MHz to 2950 MHz
Datasheet
Description
Features
The F1456 is a High Gain / High Linearity 2100 MHz to 2950 MHz
TX Digital Variable Gain Amplifier used in transmitter applications.
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The F1456 TX DVGA provides 32.1 dB maximum gain
+38 dBm OIP3 and 3.9 dB noise figure. Up to 31.5 dB
control is achieved using the combination of a digital
attenuator (DSA) and a KLINTM RF Digital Gain Amplifier.
device uses a single 5 V supply and 215 mA of ICC.
with
gain
step
This
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This device is packaged in a 6 mm x 6 mm, 28-pin QFN with 50 Ω
single-ended RF input and RF output impedances for ease of
integration into the signal-path.
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Competitive Advantage
In typical Base Stations, RF VGAs are used in the TX traffic paths
to drive the transmit power amplifier. The F1456 TX DVGA offers
very high reliability due to its construction from a monolithic silicon
die in a QFN package. The F1456 is configured to provide an
optimum balance of noise and linearity performance consisting of
a KLINTM RF amplifier, digital step attenuator (DSA) and a PA
driver amplifier. The KLINTM amplifier maintains the OIP3 and
output P1dB performance over an extended attenuation range
when compared to competitive devices.
Broadband 2100 MHz to 2950 MHz
32.1 dB max gain
3.9 dB NF @ max gain (2650 MHz)
31.5 dB total gain control range, 0.5 dB step
< 2 dB overshoot between gain transitions
Maintains flat +21.5 dBm OP1dB for more than 13 dB gain
adjustment range
Maintains flat +38 dBm OIP3 for more than 15 dB gain
adjustment range
SPI interface for DSA control
Single 5 V supply voltage
ICC = 215 mA
Up to +105 °C TCASE operating temperature
50 Ω input and output impedance
Standby mode for power savings
Pin compatible 700 MHz and 2100 MHz versions
6 mm x 6 mm, 28-pin QFN package
Block Diagram
Figure 1. Block Diagram
Typical Applications
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KLIN
Multi-mode, Multi-carrier Transmitters
WiMAX and LTE Base Stations
UMTS/WCDMA 3G Base Stations
PHS/PAS Base Stations
Public Safety Infrastructure
Constant
High LinearityTM
KLINTM DVGA
DSA
PA Driver
RF IN
RF OUT
SPI &
Decoder
6 mm x 6 mm
28-pin
Bias
3
Digital CTL
© 2016 Integrated Device Technology, Inc
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November 9, 2016
F1456 Datasheet
Pin Assignments
VCC
GND
NC
NC
NC
GND
NC
28
27
26
25
24
23
22
Figure 2. Pin Assignments for 6 mm x 6 mm x 0.9 mm QFN Package – Top View
CSb
1
21
GND
DATA
2
20
NC
CLK
3
19
NC
RSET
4
18
NC
GND
5
17
GND
RFIN
6
16
RFOUT
GND
7
15
GND
© 2016 Integrated Device Technology, Inc
F1456
12
13
14
NC
NC
/STBY
10
NC
11
9
NC
NC
8
NC
Exposed Pad
(GND)
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November 9, 2016
F1456 Datasheet
Pin Descriptions
Table 1. Pin Descriptions
Number
Name
1
CSb
Chip Select Input: 1.8 V or 3.3 V logic compatible.
2
DATA
Data Input: 1.8 V or 3.3 V logic compatible.
3
CLK
Clock Input: 1.8 V or 3.3 V logic compatible.
RSET
Connect 2.2 kΩ external resistor to GND to set amplifier bias.
5, 7, 15, 17,
21, 23, 27
GND
Pins internally tied to exposed paddle. Connect to ground on PCB.
6
RFIN
RF input internally matched to 50 Ω. Must use external DC block.
8, 9, 10, 11,
12, 13, 18,
19, 20, 22,
24, 25, 26
NC
No internal connection. These pins can be left unconnected, voltage applied, or connected to ground
(recommended).
14
/STBY
Standby pin. Device will be placed in standby mode when pin 14 is set to a logic low or when pin 14 is
left floating (pulled low via internal high impedance to GND). In standby mode, SPI circuitry is still
active. With a logic high applied to pin 14 the part is set to full operation mode.
16
RFOUT
RF output internally matched to 50 Ω. Must use external DC block.
28
VCC
5 V Power Supply. Connect to Vcc and use bypass capacitors as close to the pin as possible.
— EP
Exposed Pad. Internally connected to GND. Solder this exposed pad to a PCB pad that uses multiple
ground vias to provide heat transfer out of the device into the PCB ground planes. These multiple
ground vias are also required to achieve the noted RF performance.
4
[a]
Description
a. External resistor on pin 4 used to optimize the overall device for DC current and linearity performance across the entire
frequency band.
© 2016 Integrated Device Technology, Inc
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F1456 Datasheet
Absolute Maximum Ratings
Stresses above those listed below may cause permanent damage to the device. Functional operation of the device at these or any other
conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Table 2. Absolute Maximum Ratings
Parameter
Symbol
Minimum
Maximum
Units
Vcc to GND
VCC
-0.5
5.5
V
DATA, CSb, CLK, /STBY
VCntrl
-0.5
VCC
V
RSET
IRSET
+1.5
mA
RFIN externally applied DC voltage
VRFIN
+1.4
+3.6
V
VRFOUT
VCC - 0.15
VCC + 0.15
V
Pmax_in
+12
dBm
Pmax_out
+26
dBm
Pdiss
1.75
W
Junction Temperature
Tj
150
°C
Storage Temperature Range
Tst
150
°C
260
°C
ElectroStatic Discharge – HBM
(JEDEC/ESDA JS-001-2012)
2000
(Class 2)
V
ElectroStatic Discharge – CDM
(JEDEC 22-C101F)
1000
(Class C3)
V
RFOUT externally applied DC voltage
RF Input Power (RFIN) applied for 24 hours max.
RF Output Power (RFOUT) present for 24 hours
maximum [a]
Continuous Power Dissipation
[a]
-65
Lead Temperature (soldering, 10s)
a. Exposure to these maximum RF levels can result in significantly higher Icc current draw due to
overdriving the amplifier stages.
© 2016 Integrated Device Technology, Inc
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F1456 Datasheet
Recommended Operating Conditions
Table 3. Recommended Operating Conditions
Parameter
Symbol
Power Supply Voltage
Operating Temperature Range
RF Frequency Range [a]
Condition
Maximum
Units
4.75
5.25
V
Exposed Paddle
-40
+105
°C
High Linearity Bandwidth
2100
2700
Extended band for DPD
2700
2950
VCC
TCASE
FRF
Maximum Operating Average RF
Output Power
Minimum
Typical
ZS = ZL = 50 
14
MHz
dBm
RFIN Port Impedance
ZRFI
Single Ended
50

RFOUT Port Impedance
ZRFO
Single Ended
50

a.
Device linearity is optimized over the range from 2100 MHz to 2700 MHz. Gain flatness is optimized up to 2950 MHz to account for
systems with extended DPD bandwidth requirements.
© 2016 Integrated Device Technology, Inc
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F1456 Datasheet
Electrical Characteristics - General
See Typical Application Circuit. Unless otherwise stated, specifications apply when operated as a TX VGA, VCC = +5.0 V, FRF = 2.65 GHz,
TCASE = +25 °C, /STBY = High, ZS = ZL = 50 , maximum gain setting. Evaluation Kit trace and connector losses are de-embedded.
Table 4. Electrical Characteristics
Parameter
Symbol
Condition
Minimum
Typical
Maximum
Units
Logic Input High Threshold
VIH
JEDEC 1.8V or 3.3V logic
1.1 [a]
VCC
V
Logic Input Low Threshold
VIL
JEDEC 1.8V or 3.3V logic
-0.3
0.8
V
Logic Current
DC Current
Standby Current
Maximum Step Error (DNL)
[over voltage, temperature and
attenuation states]
Maximum Absolute Error (INL)
Gain Settling Time [c]
SPI [d]
Serial Clock Speed
SPI
-1
+1
ISTBY
/STBY
-10
+10
ICC
ICC_STBY
Standby Switching Time
Gain Step
Maximum Attenuator Glitching
IIH, IIL
TSTBY
GSTEP
ATTNG
ERRORSTEP
/STBY = Low
50% /STBY control to within
0.2 dB of the on state final
gain value
Least Significant Bit
Any state to state transition
FRF = 2.10 GHz
FRF = 2.30 GHz
FRF = 2.50 GHz
FRF = 2.65 GHz
FRF = 2.80 GHz
FRF = 2.95 GHz
215
245
mA
1
2
mA
250
ns
0.5
2
dB
dB
-0.27 [b]
-0.32
-0.36
-0.36
-0.36
-0.37
ERRORABS
GST
50% of CSb to 10% / 90% RF
+0.24
+0.26
+0.29
+0.31
+0.33
+0.36
0.8
200
FCLOCK
µA
dB
dB
ns
25
MHz
CSb to CLK Setup Time
TLS
5
ns
CLK to Data Hold Time
TH
5
ns
CSb Trigger to CLK Setup Time
TLC
5
ns
a.
b.
c.
d.
Items in min/max columns in bold italics are Guaranteed by Test.
Items in min/max columns that are not bold/italics are Guaranteed by Design Characterization.
Excludes SPI write time.
SPI 3 wire bus (refer to serial Control Mode Timing diagram).
© 2016 Integrated Device Technology, Inc
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November 9, 2016
F1456 Datasheet
Electrical Characteristics - RF
See Typical Application Circuit. Unless otherwise stated, specifications apply when operated as a TX VGA, VCC = +5.0 V, FRF = 2.65 GHz,
TCASE = +25 °C, /STBY = High, ZS = ZL = 50 , maximum gain setting. Evaluation Kit trace and connector losses are de-embedded.
Table 5. Electrical Characteristics
Parameter
Symbol
Condition
Minimum
Typical
Maximum
Units
RF Input Return Loss
RLRFIN
12
dB
RF Output Return Loss
RLRFOUT
12
dB
Gain - Max Gain Setting
GMAX
Gain - Min Gain Setting
GMIN
Max attenuation
Gain Flatness [c]
GFLAT
FRF = 2100 MHz to 2700 MHz
any 400 MHz BW
0.5
0 dB attenuation
3.9
10 dB attenuation
5.9
20 dB attenuation
10.9
29.5 dB attenuation
19.5
31.5 dB attenuation
21.5
0 dB attenuation
Pout = +7 dBm / tone
5 MHz tone separation
41.9
6 dB attenuation
Pin = -21 dBm / tone
5 MHz tone separation
45.4
Noise Figure
NF
Output Third Order Intercept Point
Output 1dB Compression Point
OIP3
OP1dB
10 dB attenuation
Pin = -21 dBm / tone
5 MHz tone separation
30.6
32.1
33.6
dB
-1.5
0
1.5
dB
35.5
dB
43.6
dBm
20 dB attenuation
Pin = -21 dBm / tone
5 MHz tone separation
36.1
29.5 dB attenuation
Pin = -21 dBm / tone
5 MHz tone separation
27.4
31.5 dB attenuation
Pin = -21 dBm / tone
5 MHz tone separation
25.7
0 dB attenuation
21.9
0 dB attenuation,
TCASE = +105 °C
21.4
6 dB attenuation
dB
20.9
dBm
21.9
a. Items in min/max columns in bold italics are Guaranteed by Test.
b. Items in min/max columns that are not bold/italics are Guaranteed by Design Characterization.
c. Includes a positive slope feature over the noted RF range to compensate for typical system roll-off.
© 2016 Integrated Device Technology, Inc
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November 9, 2016
F1456 Datasheet
Thermal Characteristics
Table 6. Package Thermal Characteristics
Parameter
Symbol
Value
Units
Junction to Ambient Thermal Resistance.
θJA
40
°C/W
Junction to Case Thermal Resistance.
(Case is defined as the exposed paddle)
θJC
4
°C/W
Moisture Sensitivity Rating (Per J-STD-020)
MSL 1
Typical Operating Conditions (TOC)
Unless otherwise stated the typical operating graphs were measured under the following conditions:
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Vcc = 5.0 V
ZL = ZS = 50 Ohms Single Ended
FRF = 2.65 GHz
TCASE = +25 °C
/STBY = High
5 MHz Tone Spacing
Gain setting = Maximum Gain
All temperatures are referenced to the exposed paddle
ACLR measurements used with a Basic LTE FDD Downlink 20 MHz TM1.2 Test signal
EVM measurements used with a Basic LTE FDD Downlink 20 MHz TM3.1 Test signal
Note TN1: Atten ≤ 4 dB Fixed Pout = 7 dBm per waveform or per tone, Atten > 4 dB Fixed Pin = -21 dBm per waveform or per tone
Note TN2: Atten ≤ 7 dB Fixed Pout = 10.5 dBm per waveform or per tone, Atten > 7 dB Fixed Pin = -14.5 dBm per waveform or per tone
Evaluation Kit traces and connector losses are de-embedded
© 2016 Integrated Device Technology, Inc
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F1456 Datasheet
Typical Performance Characteristics
Figure 3. Maximum Gain vs. Frequency over
Temp and Voltage [Attn = 0.0 dB]
Figure 4. Reverse Isolation vs. Frequency over
Temp and Voltage [Attn = 0.0 dB]
35
0
34
-5
Reverse Isolation (dB)
33
Gain (dB)
32
31
30
29
28
27
26
-10
-40 C / +5.00 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
-20
-25
-30
-35
-40
-45
-40 C / +5.00 V
-40 C / +5.25 V
-50
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
-55
-60
1.0
1.5
2.0
2.5
3.0
3.5
4.0
1.0
1.5
2.0
Frequency (GHz)
3.0
3.5
4.0
Figure 6. Output Return Loss vs. Frequency
over Temp and Voltage [Attn = 0.0 dB]
0
0
-5
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
-40 C / +4.75 V
-40 C / +5.00 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
-5
-10
Match (dB)
Match (dB)
2.5
Frequency (GHz)
Figure 5. Input Return Loss vs. Frequency over
Temp and Voltage [Attn = 0.0 dB]
-15
-20
-25
-40 C / +5.25 V
-10
-15
-20
-25
-30
-30
1.0
1.5
2.0
2.5
3.0
3.5
4.0
1.0
1.5
2.0
Frequency (GHz)
2.5
3.0
3.5
4.0
Frequency (GHz)
Figure 7. Stability vs. Frequency over
Temperature and Voltage [Attn = 0.0 dB]
Figure 8. EvKit Insertion Loss vs. Frequency
over Temperature
10
0.0
9
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
-0.5
Insertion Loss (dB)
8
7
K Factor
-40 C / +5.25 V
-15
-40 C / +4.75 V
25
-40 C / +4.75 V
6
5
4
3
2
-1.0
-1.5
-2.0
-40 C
-2.5
+25 C
1
+105 C
0
-3.0
0
1
2
3
4
5
6
7
8
9
0
Frequency (GHz)
© 2016 Integrated Device Technology, Inc
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5
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7
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9
Frequency (GHz)
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November 9, 2016
F1456 Datasheet
Typical Performance Characteristics
Figure 10. Gain vs. Attenuation over
Temperature and Voltage [2.65 GHz]
35
35
30
30
25
25
20
20
Gain (dB)
Gain (dB)
Figure 9. Gain vs. Frequency [+25 °C, All
States]
15
10
15
10
5
5
0
0
-40 C / +4.75 V
-40 C / +5.00 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
-5
-5
1.0
1.5
2.0
2.5
3.0
3.5
0
4.0
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30 32
Attenuation (dB)
Frequency (GHz)
Figure 11. Worse Case Attenuator Absolute
Accuracy vs. Freq [All parameters]
Figure 12. Attenuator Absolute Accuracy vs.
Atten over Temp and Voltage [2.65 GHz]
2.5
2.0
2.0
1.5
1.5
Error (dB)
Error (dB)
1.0
Min
0.5
Max
0.0
-0.5
-40 C / +4.75 V
-40 C / +5.00 V
+25 C / +4.75 V
+25 C / +5.00 V
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
1.0
0.5
0.0
-1.0
-1.5
-0.5
Statistically Based on 30 Devices
For all Temperatures, Voltages,
and Attenuation States.
Standard Deviation is included.
-2.0
-2.5
1.9
2.0
2.1
2.2
2.3
2.4
-1.0
2.5
2.6
2.7
2.8
2.9
3.0
3.1
0
3.2
2
4
6
8
Figure 13. Worse Case Step Accuracy vs. Freq
[All parameters]
Figure 14. Step Accuracy vs. Attenuation over
Temperature and Voltage [2.65 GHz]
0.4
0.3
0.3
0.2
0.2
0.1
Error (dB)
0.4
Min
Max
0.0
-0.1
Statistically Based on 30 Devices
For all Temperatures, Voltages,
and Attenuation States.
Standard Deviation is included.
-0.2
10 12 14 16 18 20 22 24 26 28 30 32
Attenuation (dB)
Frequency (GHz)
Error (dB)
-40 C / +5.25 V
-40 C / +4.75 V
-40 C / +5.00 V
+25 C / +4.75 V
+25 C / +5.00 V
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
0.1
0.0
-0.1
-0.2
-0.3
-0.3
-0.4
-0.4
1.9
2.0
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
3.0
3.1
0
3.2
© 2016 Integrated Device Technology, Inc
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10 12 14 16 18 20 22 24 26 28 30 32
Attenuation (dB)
Frequency (GHz)
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November 9, 2016
F1456 Datasheet
Typical Performance Characteristics
Figure 15. Input Return Loss vs. Frequency
[+25 °C, All states]
Figure 16. Input Return Loss vs. Attenuation
over Temperature and Voltage [2.65 GHz]
0
-5
-5
-10
-10
Match (dB)
Match (dB)
0
-15
-20
-40 C / +4.75 V
-40 C / +5.00 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
-15
-20
-25
-25
-30
-30
1.0
1.5
2.0
2.5
3.0
3.5
0
4.0
2
4
6
8
Figure 17. Output Return Loss vs. Frequency
[+25 °C, All states]
Figure 18. Output Return Loss vs. Attenuation
over Temperature and Voltage [2.65 GHz]
0
0
-5
-5
-10
-10
Match (dB)
Match (dB)
10 12 14 16 18 20 22 24 26 28 30 32
Attenuation (dB)
Frequency (GHz)
-15
-20
-40 C / +4.75 V
-40 C / +5.00 V
+25 C / +4.75 V
+25 C / +5.00 V
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
-15
-20
-25
-25
-30
-30
1.0
1.5
2.0
2.5
3.0
3.5
0
4.0
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30 32
Attenuation (dB)
Frequency (GHz)
Figure 19. Reverse Isolation vs. Frequency
[+25 °C, All states]
Figure 20. Reverse Isolation vs. Attenuation
over Temperature and Voltage [2.65 GHz]
-20
0
-5
-25
-10
-30
Reverse Isolation (dB)
Reverse Isolation (dB)
-40 C / +5.25 V
-35
-40
-45
-50
-55
-60
-40 C / +4.75 V
-40 C / +5.00 V
+25 C / +4.75 V
+25 C / +5.00 V
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
-15
-20
-25
-30
-35
-40
-45
-50
-55
-60
-65
-65
-70
-70
1.0
1.5
2.0
2.5
3.0
3.5
4.0
0
Frequency (GHz)
© 2016 Integrated Device Technology, Inc
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Attenuation (dB)
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November 9, 2016
F1456 Datasheet
Typical Performance Characteristics
Figure 22. Output IP3 vs. Attn over Temp and
Voltage [2.3 GHz] (Test Note TN2)
50
50
45
45
40
40
OIP3 (dBm)
OIP3 (dBm)
Figure 21. Output IP3 vs. Attn over Temp and
Voltage [2.3 GHz] (Test Note TN1)
35
30
25
35
30
25
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
20
20
0
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30 32
0
2
4
6
8
Attenuator State (dB)
Figure 24. Output IP3 vs. Attn over Temp and
Voltage [2.5 GHz] (Test Note TN2)
50
50
45
45
40
40
OIP3 (dBm)
OIP3 (dBm)
Figure 23. Output IP3 vs. Attn over Temp and
Voltage [2.5 GHz] (Test Note TN1)
35
30
25
35
30
25
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
20
20
0
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30 32
0
2
4
6
8
Attenuator State (dB)
Figure 26. Output IP3 vs. Attn over Temp and
Voltage [2.65 GHz] (Test Note TN2)
50
45
45
40
40
OIP3 (dBm)
50
35
30
25
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
10 12 14 16 18 20 22 24 26 28 30 32
Attenuator State (dB)
Figure 25. Output IP3 vs. Attn over Temp and
Voltage [2.65 GHz] (Test Note TN1)
OIP3 (dBm)
10 12 14 16 18 20 22 24 26 28 30 32
Attenuator State (dB)
35
30
25
20
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
20
0
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30 32
0
Attenuator State (dB)
© 2016 Integrated Device Technology, Inc
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30 32
Attenuator State (dB)
12
November 9, 2016
F1456 Datasheet
Typical Performance Characteristics
Figure 27. Output IP3 vs. Frequency over
Temperature and Voltage [Attn = 0.0 dB]
Figure 28. Output P1dB vs. Attenuation over
Temperature and Voltage [2.3 GHz]
25
48
24
46
23
Output P1dB (dBm)
50
OIP3 (dBm)
44
42
40
38
36
34
32
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
22
21
20
19
18
17
-40 C / +4.75 V /
+25 C / +4.75 V /
+105 C / +4.75 V /
16
30
-40 C / +5.25 V /
+25 C / +5.25 V /
+105 C / +5.25 V /
15
2.0
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
3.0
0
1
2
Frequency (GHz)
24
23
23
Output P1dB (dBm)
25
24
22
21
20
19
18
16
4
5
6
7
8
9
Figure 30. Output P1dB vs. Attenuation over
Temp and Voltage [2.5 GHz]
25
17
3
Attenuation State (dB)
Figure 29. Output P1dB vs. Frequency over
Temp and Voltage [Attn = 0.0 dB]
Output P1dB (dBm)
-40 C / +5.00 V /
+25 C / +5.00 V /
+105 C / +5.00 V /
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
22
21
20
19
18
17
-40 C / +4.75 V /
+25 C / +4.75 V /
+105 C / +4.75 V /
16
-40 C / +5.00 V /
+25 C / +5.00 V /
+105 C / +5.00 V /
-40 C / +5.25 V /
+25 C / +5.25 V /
+105 C / +5.25 V /
15
15
2.0
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
3.0
0
1
2
Frequency (GHz)
3
4
5
6
7
8
9
Attenuation State (dB)
Figure 31. Output P1dB vs. Attenuation over
Temp and Voltage [2.65 GHz]
25
24
Output P1dB (dBm)
23
22
21
20
19
18
17
-40 C / +4.75 V /
+25 C / +4.75 V /
+105 C / +4.75 V /
16
-40 C / +5.00 V /
+25 C / +5.00 V /
+105 C / +5.00 V /
-40 C / +5.25 V /
+25 C / +5.25 V /
+105 C / +5.25 V /
15
0
1
2
3
4
5
6
7
8
9
Attenuation State (dB)
© 2016 Integrated Device Technology, Inc
13
November 9, 2016
F1456 Datasheet
Typical Performance Characteristics
Figure 32. Gain Compression vs. Pout over
Temperature and Voltage [2.3 GHz]
-40 C / +4.75 V
+25 C / +4.75 V
+105 C / +4.75 V
-40 C / +5.00 V
+25 C / +5.00 V
+105 C / +5.00 V
5
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +5.25 V
Phase Compression (degrees)
Power Compression (dB)
0.5
Figure 33. Phase Compression vs. Pout over
Temperature and Voltage [2.3 GHz]
0.0
-0.5
-1.0
-1.5
-2.0
-40 C / +4.75 V
+25 C / +4.75 V
+105 C / +4.75 V
0
-5
-10
-15
-20
13
14
15
16
17
18
19
20
21
22
23
24
25
12
13
14
15
Output Power (dBm)
-40 C / +4.75 V
+25 C / +4.75 V
+105 C / +4.75 V
-40 C / +5.00 V
+25 C / +5.00 V
+105 C / +5.00 V
17
18
19
20
21
22
23
24
25
Figure 35. Phase Compression vs. Pout over
Temperature and Voltage [2.5 GHz]
5
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +5.25 V
Phase Compression (degrees)
0.5
16
Output Power (dBm)
Figure 34. Gain Compression vs. Pout over
Temperature and Voltage [2.5 GHz]
Power Compression (dB)
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +5.25 V
-25
12
0.0
-0.5
-1.0
-1.5
-2.0
-40 C / +4.75 V
+25 C / +4.75 V
+105 C / +4.75 V
0
-40 C / +5.00 V
+25 C / +5.00 V
+105 C / +5.00 V
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +5.25 V
-5
-10
-15
-20
-25
12
13
14
15
16
17
18
19
20
21
22
23
24
25
12
13
14
15
Output Power (dBm)
-40 C / +4.75 V
+25 C / +4.75 V
+105 C / +4.75 V
-40 C / +5.00 V
+25 C / +5.00 V
+105 C / +5.00 V
17
18
19
20
21
22
23
24
25
Figure 37. Phase Compression vs. Pout over
Temperature and Voltage [2.65 GHz]
5
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +5.25 V
Phase Compression (degrees)
0.5
16
Output Power (dBm)
Figure 36. Gain Compression vs. Pout over
Temperature and Voltage [2.65 GHz]
Power Compression (dB)
-40 C / +5.00 V
+25 C / +5.00 V
+105 C / +5.00 V
0.0
-0.5
-1.0
-1.5
-2.0
-40 C / +4.75 V
+25 C / +4.75 V
+105 C / +4.75 V
0
-40 C / +5.00 V
+25 C / +5.00 V
+105 C / +5.00 V
-40 C / +5.25 V
+25 C / +5.25 V
+105 C / +5.25 V
-5
-10
-15
-20
-25
12
13
14
15
16
17
18
19
20
21
22
23
24
25
12
Output Power (dBm)
© 2016 Integrated Device Technology, Inc
13
14
15
16
17
18
19
20
21
22
23
24
25
Output Power (dBm)
14
November 9, 2016
F1456 Datasheet
Typical Performance Characteristics
Figure 38. Noise Figure vs. Frequency over
Temperature and Voltage [Attn = 0.0 dB]
Figure 39. Noise Figure vs. Attenuation over
Temperature and Voltage [2.3 GHz]
6
25
5
Noise Figure (dB)
20
Noise Figure (dB)
4
3
2
1
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
15
10
5
0
0
2.0
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
3.0
0
2
4
6
8
Frequency (GHz)
Figure 40. Noise Figure vs. Attenuation over
Temperature and Voltage [2.5 GHz]
Figure 41. Noise Figure vs. Attenuation over
Temperature and Voltage [2.65 GHz]
25
25
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
-40 C / +4.75 V
-40 C / +5.00 V
-40 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+25 C / +4.75 V
+25 C / +5.00 V
+25 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
+105 C / +4.75 V
+105 C / +5.00 V
+105 C / +5.25 V
20
Noise Figure (dB)
20
Noise Figure (dB)
10 12 14 16 18 20 22 24 26 28 30 32
Attenuation State (dB)
15
10
5
15
10
5
0
0
0
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30 32
0
Attenuation State (dB)
© 2016 Integrated Device Technology, Inc
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30 32
Attenuation State (dB)
15
November 9, 2016
F1456 Datasheet
Typical Performance Characteristics
Figure 43. Switching Speed 31.5 to 0.0 dB
0.6
2.0
0.6
0.5
1.8
0.5
0.4
1.6
0.4
0.3
1.4
0.3
1.4
0.2
1.2
0.2
1.2
0.1
1.0
0.1
1.0
0.0
0.8
0.0
0.8
-0.1
0.6
-0.1
0.6
-0.2
0.4
-0.2
0.4
-0.3
0.2
-0.3
0.2
-0.4
0.0
-0.4
0.0
-0.2
-0.5
-0.2
-0.4
-0.6
-0.2
RF
-0.5
-0.6
-0.2
Trigger
-0.1
0.0
0.1
0.2
0.3
0.4
0.5
0.6
2.0
1.8
RF
Trigger
1.6
-0.4
-0.1
0.0
Time (us)
0.1
0.2
0.3
0.4
0.5
0.6
Time (us)
Figure 44. Switching Speed Standby Mode to
Full Operation Mode
Figure 45. Switching Speed Full Operation
Mode to Standby Mode
3.2
0.6
2.9
0.5
0.4
2.6
0.4
2.6
0.3
2.3
0.3
2.3
0.2
2.0
0.2
2.0
0.1
1.7
0.1
1.7
0.0
1.4
0.0
1.4
-0.1
1.1
-0.1
1.1
-0.2
0.8
-0.2
0.8
-0.3
0.5
-0.3
0.5
-0.4
0.2
-0.4
0.2
-0.5
-0.1
-0.5
-0.1
-0.6
-0.10
-0.05
0.00
0.05
0.10
0.15
0.20
-0.6
-0.10
-0.4
0.25
Trigger
-0.05
0.00
0.05
0.10
0.15
0.20
2.9
-0.4
0.25
Time (us)
Time (us)
© 2016 Integrated Device Technology, Inc
3.2
RF
Trigger Volage (V)
Trigger
RF Voltage (V)
0.5
RF
Trigger Volage (V)
0.6
RF Voltage (V)
Trigger Volage (V)
RF Voltage (V)
Trigger Volage (V)
RF Voltage (V)
Figure 42. Switching Speed 0.0 to 31.5 dB
16
November 9, 2016
F1456 Datasheet
Typical Performance Characteristics
Figure 46. ACLR vs. Attn [2.3 GHz]
-50
-52
Figure 47. EVM (RMS) vs. Attn [2.3 GHz]
ACLR_low [TN1]
ACLR_high [TN1]
ACLR_low [TN2]
ACLR_high [TN2]
System ACLR Low
System ACLR High
0.60
0.55
0.50
-54
0.45
0.40
-58
EVM (%)
ACLR (dB)
-56
-60
-62
0.35
0.30
0.25
0.20
-64
0.15
-66
0.10
-68
0.05
-70
0.00
0
2
4
6
8
10
12
14
16
EVM_rms [TN1]
EVM_rms [TN2]
System EVM
0
2
4
Attenuation Setting (dB)
Figure 48. ACLR vs. Attn [2.5 GHz]
-50
-52
ACLR_low [TN1]
ACLR_high [TN1]
ACLR_low [TN2]
ACLR_high [TN2]
10
12
14
16
System ACLR Low
System ACLR High
14
16
14
16
0.60
0.55
0.50
0.45
-56
0.40
-58
EVM (%)
ACLR (dB)
8
Figure 49. EVM (RMS) vs. Attn [2.5 GHz]
-54
-60
-62
0.35
0.30
0.25
0.20
-64
0.15
-66
0.10
-68
0.05
-70
0.00
0
2
4
6
8
10
12
14
16
EVM_rms [TN1]
EVM_rms [TN2]
System EVM
0
2
4
Attenuation Setting (dB)
-50
-52
6
8
10
12
Attenuation Setting (dB)
Figure 50. ACLR vs. Attn [2.65 GHz]
Figure 51. EVM (RMS) vs. Attn [2.65GHz]
ACLR_low [TN1]
ACLR_high [TN1]
ACLR_low [TN2]
ACLR_high [TN2]
System ACLR Low
System ACLR High
0.60
0.55
0.50
-54
0.45
EVM (%)
-56
ACLR (dB)
6
Attenuation Setting (dB)
-58
-60
-62
0.40
0.35
0.30
0.25
0.20
-64
0.15
-66
0.10
-68
0.05
-70
0.00
0
2
4
6
8
10
12
14
16
EVM_rms [TN2]
System EVM
0
Attenuation Setting (dB)
© 2016 Integrated Device Technology, Inc
EVM_rms [TN1]
2
4
6
8
10
12
F1456 Attenuation Setting (dB)
17
November 9, 2016
F1456 Datasheet
Serial Port Interface
Serial data is formatted as a 6-bit word clocking data in MSB first.
Table 7. Attenuation Word Truth Table
Control Bit
D5
D4
D3
D2
D1
D0
Attenuator
Setting
1
1
1
1
1
1
0.0 dB
1
1
1
1
1
0
0.5 dB
1
1
1
1
0
1
1.0 dB
1
1
1
0
1
1
2.0 dB
1
1
0
1
1
1
4.0 dB
1
0
1
1
1
1
8.0 dB
0
1
1
1
1
1
16.0 dB
0
0
0
0
0
0
31.5 dB
Figure 52. Serial Register Timing Diagram
CLK (pin 3)
DATA (pin 2)
D5
D0
Attenuation
CSb (pin 1)
Clock in MSB first
Increasing time
© 2016 Integrated Device Technology, Inc
18
November 9, 2016
F1456 Datasheet
Figure 53. SPI Timing Diagram
TH
TP
TS
TLC
TCH
TCL
CLK
DATA
TLS
CSb
TL
TL
Table 8. SPI Timing Diagram Values for Figure 53
Parameter
Symbol
CLK Frequency
FC
CLK High Duration Time
TCH
20
ns
CLK Low Duration Time
TCL
20
ns
DATA to CLK Setup Time
TS
5
ns
CLK Period [a]
TP
40
ns
CLK to DATA Hold Time
TH
5
ns
CSb to CLK Setup Time
TLS
5
ns
TL
10
ns
TLC
5
ns
CSb Trigger Pulse Width
CSb Trigger to CLK Setup Time
[b]
Test Condition
Min
Typ
Max
Units
25
MHz
a. (TCH + TCL) ≥ 1/FC
b. Once all desired DATA is clocked in, TLC represents the time a CSb high needs to occur before any
subsequent CLK signals.
Table 9. Standby Truth Table
/STBY (pin 14)
0V
Vcc
© 2016 Integrated Device Technology, Inc
Condition
Amplifier OFF with SPI powered ON
Full operation
19
November 9, 2016
F1456 Datasheet
Application Information
The F1456 has been optimized for use in high performance RF applications from 2100 MHz to 2950 MHz. The device maintains good
performance outside of the optimized band as shown by the Typical Performance Characteristics.
Power Up Attenuation Setting
When the part is initially powered up, the default VGA setting is the 31.5 dB [000000] attenuation state.
Chip Select (CSb)
When CSb is set to logic high, the CLK input is disabled. When CSb is set to logic low, the CLK input is enabled and the DATA word can be
programmed into the shift registers. The programmed word is then latched into the F1456 on the CSb rising edge (refer Figure 53). The
operation of the SPI bus in independent of the /STBY pin setting (see Standby Mode section below).
Standby Mode (/STBY)
The F1456 has a power down feature for power savings which is on Pin 14. For normal operation pin 14 must be set to a logic high. When a
logic low is applied to pin 14 the amplifier is placed in standby mode. The Standby mode is a high isolation state. The level of this isolation is
not specified and is dependent on the device and attenuation state. In Standby mode the SPI bus is operational and the device attenuation
setting can be programmed. Therefore, the device will present the desired attenuation when it is enabled.
Power Supplies
A common VCC power supply should be used for all power supply pins. To minimize noise and fast transients de-coupling capacitors to all
supply pins. Supply noise can degrade noise figure and fast transients can trigger ESD clamps causing them to fail. Supply voltage change
or transients should have a slew rate smaller than 1 V / 20 µs. In addition, all control pins should remain at 0 V (± 0.3 V) while the supply
voltage ramps or while it returns to zero.
Control Pin Interface
If control signal integrity is a concern and clean signals cannot be guaranteed due to overshoot, undershoot, ringing, etc., the following circuit
at the input of each control pin is recommended. This applies to SPI and control pins 1, 2, 3 and 14 as shown below. Note the recommended
resistor and capacitor values do not necessarily match the EV kit BOM for the case of poor control signal integrity. For multiple devices
driven by a single control line, the component values will need to be adjusted accordingly so as not to load down the control line.
CSb
22
23
24
25
26
27
28
Figure 54. Control Pin Interface for Signal Integrity
1 k
2 pF
21
1
DATA
1 k
20
2
F1456
2 pF
19
3
Exposed Pad
(GND)
4
2 pF
18
/STBY
14
15
13
7
12
16
11
6
9
17
8
5
10
CLK
1 k
1 k
2 pF
© 2016 Integrated Device Technology, Inc
20
November 9, 2016
F1456 Datasheet
Evaluation Kit Picture
Figure 55. Top View
Figure 56. Bottom View
© 2016 Integrated Device Technology, Inc
21
November 9, 2016
F1456 Datasheet
Evaluation Kit / Applications Circuit
Figure 57. Electrical Schematic
VCC3
R7
3
GND
R1
B5
4
5
1
VCC
C12
22
GND
NC
23
24
NC
25
NC
26
NC
29
27
NC
GND
GND
19
18
17
J2
GND
GND
B1
C8
C9
B2
B3
R11 R12
RFOUT
C15
C16
VCC2
R3
B4
VCC
R13 R14
C10
VCC
VCC
J4
C11
R16
GND3
2
R15
15
14
13
8
R2
/STBY
RFOUT
NC
RFIN
16
1
2
3
GND2
F1456
RSET
20
1
2
3
J3
NC
NC
7
C14
VCC1
VCC
CLK
21
C2
6
C13
NC
12
RFIN
C1
DATA
NC
J1
GND
11
R10
2
GND4
CSb
NC
DATA
R6
1
10
R9
R5
GND
C5
VCC
NC
CLK
C6
C7
VCC
R8
CSb
9
7
5
3
1
NC
J7
8
6
4
2
EP
U1
R4
C3
28
C4
GND1
J5
J6
Not All Components are used. Please
check the Bill of Material (BOM) table.
© 2016 Integrated Device Technology, Inc
22
November 9, 2016
F1456 Datasheet
Table 10. Bill of Material (BOM)
Part Reference
QTY
Description
Manufacturer Part #
Manufacturer
C1, C2
2
22 pF ±5%, 50V, C0G Ceramic Capacitor (0402)
GRM1555C1H220J
MURATA
C3
1
100 nF ±10%, 16V, X7R Ceramic Capacitor (0402)
GRM155R71C104K
MURATA
C4
1
1000 pF ±5%, 50V, C0G Ceramic Capacitor (0402)
GRM1555C1H102J
MURATA
C5, C6, C7
3
2 pF ±0.1pF, 50V, C0G Ceramic Capacitor (0402)
GRM1555C1H2R0B
MURATA
C12
1
10 uF ±20%, 16V, X6S Ceramic Capacitor (0603)
GRM188C81C106M
MURATA
R1
1
2.2 kΩ ±1%, 1/10W, Resistor (0402)
ERJ-2RKF2201X
PANASONIC
R4 - R7
4
0 Ω Resistor (0402)
ERJ-2GE0R00X
PANASONIC
R8 - R10, R16
4
1 kΩ ±1%, 1/10W, Resistor (0402)
ERJ-2RKF1001X
PANASONIC
J4
1
CONN HEADER VERT SGL 2 X 1 POS GOLD
961102-6404-AR
3M
J6
1
CONN HEADER VERT SGL 3 X 1 POS GOLD
961103-6404-AR
3M
J7
1
CONN HEADER VERT DBL 4 X 2 POS GOLD
67997-108HLF
FCI
J1, J2
2
Edge Launch SMA (0.375 inch pitch ground, tab)
142-0701-851
Emerson Johnson
J3
1
Edge Launch SMA (0.250 inch pitch ground, round)
142-0711-821
Emerson Johnson
U1
1
VGA AMP
F1456NKGK
IDT
C8 - C11, C13 - C16,
R2, R3, R11 - R15, J5
DNP
1
© 2016 Integrated Device Technology, Inc
Printed Circuit Board
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F145X EVKIT REV 02
November 9, 2016
F1456 Datasheet
Evaluation Kit Operation
Standby
Connector J6 allows the F1456 to be put into the standby mode. Connecting J6 pin 2 (the center pin) to Vcc the amplifier will be placed in
normal operating mode. To put the F1456 into standby mode for very low power consumption ground J6 pin 2 (the center pin). If J6 pin 2
(the center pin) is left open, then the F1456 will default to the standby mode.
Figure 58. Image of J6 connector for Standby mode control
Serial Programming Pins
Connector J7 pins 1, 2, 4, 6, 8 are ground. Pin 3 is DATA, pin 5 is Clock (CLK), pin 7 is Chip Select (CSB).
Figure 59. Image of J7 connector for SPI
© 2016 Integrated Device Technology, Inc
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November 9, 2016
F1456 Datasheet
Package Drawings
Figure 60. Package Outline Drawing NKG28 PSC-4606
TOP VIEW
BOTTOM VIEW
SIDE VIEW
© 2016 Integrated Device Technology, Inc
25
November 9, 2016
F1456 Datasheet
Recommended Land Pattern
Figure 61. Recommended Land Pattern
© 2016 Integrated Device Technology, Inc
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November 9, 2016
F1456 Datasheet
Ordering Information
Orderable Part Number
Package
MSL Rating
Shipping Packaging
Temperature
F1456NKGK
6 x 6 x 0.9 mm QFPN
1
Tray
-40° to +105°C
F1456NKGK8
6 x 6 x 0.9 mm QFPN
1
Tape and Reel
-40° to +105°C
F1456EVBK
Evaluation Board
F1456EVSK
Evaluation Solution
Marking Diagram
1. Line 2 and 3 are the part number.
2. Line 4 “ZW” is Assembly Stepping.
3. Line 4 “yyww = 1629 has two digits for the year and week that the part was assembled.
4. Line 4 “L” denotes Assembly Site.
5. Line 5 “Q54E042PY” is the Assembly Lot number
© 2016 Integrated Device Technology, Inc
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November 9, 2016
F1456 Datasheet
Revision History
Revision
O
Revision Date
Description of Change
2016-November 09 Initial Release
Corporate Headquarters
Sales
Tech Support
6024 Silver Creek Valley Road
San Jose, CA 95138
www.IDT.com
1-800-345-7015 or 408-284-8200
Fax: 408-284-2775
www.IDT.com/go/sales
www.IDT.com/go/support
DISCLAIMER Integrated Device Technology, Inc. (IDT) reserves the right to modify the products an d/or specifications described herein at any time, without notice, at IDT's sole discretion. Performance specifications and
operating parameters of the described products are determined in an independent state and are not guaranteed to perform the s ame way when installed in customer products. The information contained herein is provided
without representation or warranty of any kind, whether express or implied, including, but not limited to, the suitability of IDT's products for any particular purpose, an implied warranty of merchantability, or non-infringement of
the intellectual property rights of others. This document is presented only as a guide and does not convey any license under intellectual property rights of IDT or any third parties.
IDT's products are not intended for use in applications involving extreme environmental conditions or in life support systems or similar dev ices where the failure or malfunction of an IDT product can be reasonably expected to
significantly affect the health or safety of users. Anyone using an IDT product in such a manner does so at their own risk, absent an express, written agreement by IDT.
Integrated Device Technology, IDT and the IDT logo are trademarks or registered trademarks of IDT and its subsidiaries in the United States and other countries. Other trademarks used herein are the property of IDT or their
respective third party owners. For datasheet type definitions and a glossary of common terms, visit www.idt.com/go/glossary. All contents of this document are copyright of Integrated Device Technology, Inc. All rights
reserved
© 2016 Integrated Device Technology, Inc
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November 9, 2016
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