TI1 OPA4145 High-precision, low-noise, rail-to-rail output, 5.5-mhz jfet operational amplifier Datasheet

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OPA145, OPA2145, OPA4145
SBOS427 – JUNE 2017
OPAx145 High-Precision, Low-Noise, Rail-to-Rail Output, 5.5-MHz
JFET Operational Amplifiers
1 Features
3 Description
•
The OPA145, OPA2145, and OPA4145 operational
amplifier (op amp) family is a series of low-power
JFET input amplifiers that feature excellent drift, low
current noise, and pico-ampere input bias current,
making these devices a suitable choice for amplifying
small signals from high-impedance sensors. The railto-rail output swing interfaces to modern, singlesupply, precision analog-to-digital converters (ADCs)
and digital-to-analog converters (DACs). In addition,
the input range that includes V– allows designers to
simplify power management and take advantage of
the single-supply, low-noise JFET architecture.
1
•
•
•
•
•
•
Best Bandwidth and Slew-Rate-to-Power Ratio:
– Gain-Bandwidth Product: 5.5 MHz
– Slew Rate: 20 V/μs
– Low Supply Current: 475 µA (maximum)
High Precision:
– Very Low Offset: 150 μV (maximum)
– Very Low Offset Drift: 1 μV/°C (maximum)
Low Input Bias Current: 2 pA
Excellent Noise Performance:
– Very Low Voltage Noise: 7 nV/√Hz
– Very Low Current Noise: 0.8 fA/√Hz
Input-Voltage Range Includes V– Supply
Single-Supply Operation: 4.5 V to 36 V
Dual-Supply Operation: ±2.25 V to ±18 V
Device Information(1)
PART NUMBER
OPA145
2 Applications
•
•
•
•
•
•
•
•
Analog I/O Modules
Battery-Powered Instruments
Industrial Controls
Medical Instrumentation
Photodiode Amplifiers
Active Filters
Data Acquisition Systems
Automatic Test Systems
OPA2145
OPA4145
3.00 mm × 3.00 mm
SOT-23 (5)
2.90 mm × 1.60 mm
WSON (8)
3.00 mm × 3.00 mm
SOIC (8)
4.90 mm × 3.91 mm
VSSOP (8)
3.00 mm × 3.00 mm
WSON (8)
3.00 mm × 3.00 mm
TSSOP (14)
5.00 mm × 4.40 mm
SOIC (14)
8.65 mm × 3.91 mm
QFN (16)
4.00 mm × 4.00 mm
3
+10V
+10V
R5
22
±
±
OPA145
OPA145
+
+
R3
180
GND
C3
432p
2.5 V to 5 V 2.7 V to 3.6 V
C5
200p
GND
REF
ò ‡ 9REF
AVDD
AINP
GND
ADS8867
GND
GND
+
OPA145
+
±
OPA145
+10V
±
+10V
C4
432p
R4
180
C6
200p
AINN
GND
R6
22
Normalized Input Bias Current (pA)
C1
9 pF
C2
9 pF
VSSOP (8)
OPA145 Precision JFET Technology Offers
Excellent Linear Input Impedance
R1
50 k
5 A
3.8 pF
2.5 mW/cm2
Photovoltaic Mode
BODY SIZE (NOM)
4.90 mm × 3.91 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
OPA145 Excels in 16-bit, 100-kSPS Fully
Differential Transimpedance Imaging Application
Fast Silicon
PIN Photodiode
PACKAGE
SOIC (8)
1.5
0
-1.5
-3
±20
±15
±10
±5
0
5
10
Input Common-mode Voltage (V)
15
20
C001
Copyright © 2017, Texas Instruments Incorporated
R2
50 k
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
OPA145, OPA2145, OPA4145
SBOS427 – JUNE 2017
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Device Comparison Table.....................................
Pin Configuration and Functions .........................
Specifications.........................................................
8.4 Device Functional Modes........................................ 25
1
1
1
2
3
3
6
9
9.1 Application Information............................................ 26
9.2 Typical Application ................................................. 26
10 System Examples................................................ 28
10.1 16-bit, 100-kSPS, Fully Differential Transimpedance
Imaging and Measurement ...................................... 28
11 Power Supply Recommendations ..................... 29
12 Layout................................................................... 30
7.1
7.2
7.3
7.4
7.5
7.6
7.7
Absolute Maximum Ratings ...................................... 6
ESD Ratings.............................................................. 6
Recommended Operating Conditions....................... 6
Thermal Information: OPA145 .................................. 6
Thermal Information: OPA2145 ................................ 7
Thermal Information: OPA4145 ................................ 7
Electrical Characteristics: VS = 4.5 V to 36 V; ±2.25 V
to ±18 V...................................................................... 8
7.8 Typical Characteristics ............................................ 10
7.9 Typical Characteristics ............................................ 11
8
Application and Implementation ........................ 26
12.1 Layout Guidelines ................................................. 30
12.2 Layout Example .................................................... 31
13 Device and Documentation Support ................. 32
13.1
13.2
13.3
13.4
13.5
13.6
13.7
13.8
Detailed Description ............................................ 18
8.1 Overview ................................................................. 18
8.2 Functional Block Diagram ....................................... 18
8.3 Feature Description................................................. 19
Device Support......................................................
Documentation Support ........................................
Related Links ........................................................
Receiving Notification of Documentation Updates
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
32
32
33
33
33
33
33
33
14 Mechanical, Packaging, and Orderable
Information ........................................................... 33
4 Revision History
2
DATE
REVISION
NOTES
June 2017
*
Initial release
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5 Device Comparison Table
FEATURES
PRODUCT
Low-power, 10-MHz FET input industrial op amp
OPA140
2.2-nV/√Hz, low-power, 36-V op amp in SOT-23 package
OPA209
Low-noise, high-precision, 22-MHz, 4-nV/√Hz JFET-input op amp
OPA827
Low-noise, low IQ precision CMOS op amp
OPA376
Low-power, precision, CMOS, rail-to-rail input/output, low-offset, low-bias op amp
OPA191
6 Pin Configuration and Functions
OPA145: D and DGK Packages
8-Pin SOIC, 8-Pin VSSOP
Top View
±IN
2
+IN
3
V±
4
8
NC
±
7
V+
+
6
OUT
5
NC
OUT
1
V±
2
+IN
3
Not to scale
5
V+
4
±IN
±
1
+
NC
OPA145: DBV Package
5-Pin SOT-23
Top View
Not to scale
OPA145: DSD Package
8-Pin WSON With Thermal Pad
Top View
NC
1
±IN
2
+IN
3
V±
4
Thermal
Pad
8
NC
7
V+
6
OUT
5
NC
Not to scale
NC = No internal connection.
Pin Functions: OPA145
PIN
OPA145
I/O
DESCRIPTION
D (SOIC),
DGK (VSSOP),
DSD (WSON)
DBV (SOT-23)
–IN
2
4
I
Inverting input
+IN
3
3
I
Noninverting input
NC
NAME
1, 5, 8
—
—
No internal connection (can be left floating)
OUT
6
1
O
Output
V–
4
2
—
Negative (lowest) power supply
V+
7
5
—
Positive (highest) power supply
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OPA2145: D and DGK Packages
8-Pin SOIC, 8-Pin VSSOP
Top View
OPA2145: DSD Package
8-Pin WSON With Thermal Pad
Top View
OUT A
1
8
V+
±IN A
2
7
OUT B
OUT A
1
+IN A
3
6
±IN B
±IN A
2
+IN A
3
V±
4
V±
4
5
+IN B
Thermal
Pad
8
V+
7
OUT B
6
±IN B
5
+IN B
Not to scale
Not to scale
Pin Functions: OPA2145
PIN
OPA2145
I/O
DESCRIPTION
NAME
D (SOIC),
DGK (VSSOP),
DSD (WSON)
–IN A
2
I
Inverting input channel A
+IN A
3
I
Noninverting input channel A
–IN B
6
I
Inverting input channel B
+IN B
5
I
Noninverting input channel B
OUT A
1
O
Output channel A
OUT B
7
O
Output channel B
V–
4
—
Negative supply
V+
8
—
Positive supply
4
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OPA4145: D and PW Packages
14-Pin SOIC, 14-Pin TSSOP
Top View
V±
+IN B
5
10
+IN C
±IN B
6
9
±IN C
OUT B
7
8
OUT C
-IN A
1
+IN A
2
V+
3
+IN B
4
NC
11
13
4
Thermal
Pad
12
-IN D
11
+IN D
10
V±
9
8
V+
-IN C
+IN D
OUT D
12
14
3
7
+IN A
OUT C
±IN D
OUT A
13
15
2
6
±IN A
OUT B
OUT D
NC
14
5
1
-IN B
OUT A
16
OPA4145: RUM Package
16-Pin WQFN With Thermal Pad
Top View
+IN C
Not to scale
Not to scale
NC = No internal connection.
Pin Functions: OPA4145
PIN
OPA4145
I/O
DESCRIPTION
NAME
D (SOIC),
PW (TSSOP)
RUM
(WQFN)
–IN A
2
1
I
Inverting input channel A
+IN A
3
2
I
Noninverting input channel A
–IN B
6
5
I
Inverting input channel B
+IN B
5
4
I
Noninverting input channel B
–IN C
9
8
I
Inverting input channel C
+IN C
10
9
I
Noninverting input channel C
–IN D
13
12
I
Inverting input channel D
+IN D
12
11
I
Noninverting input channel D
OUT A
1
15
O
Output channel A
OUT B
7
6
O
Output channel B
OUT C
8
7
O
Output channel C
OUT D
14
14
O
Output channel D
V–
11
10
—
Negative supply
V+
4
3
—
Positive supply
NC
—
13, 16
—
No internal connection (can be left floating)
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7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
MIN
Supply voltage, [(V+) – (V–)]
Output short-circuit
Single supply
40
(V–) – 0.5
±10
150
150
Storage temperature, Tstg
(3)
mA
Continuous
–55
Junction temperature, TJ
(2)
V
(V+) + 0.5
Current
(3)
Operating temperature, TA
(1)
UNIT
±20
Voltage
Signal input pins (2)
MAX
Dual supply
–65
°C
150
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Input pins are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails must be
current limited to 10 mA or less.
Short circuit to VS / 2 (ground in symmetrical dual-supply setups), one amplifier per package.
7.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1)
2000
Charged-device model (CDM), per JEDEC specification JESD22-C101 (2)
750
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
VS
Supply voltage, [(V+) – (V–)]
TA
Ambient temperature
Dual supply
MIN
NOM
MAX
±2.25
±15
±18
4.5
30
36
–40
25
125
Single supply
UNIT
V
°C
7.4 Thermal Information: OPA145
OPA145
THERMAL METRIC (1)
D (SOIC)
DGK (VSSOP)
DBV (SOT)
DSD (SON)
8 PINS
8 PINS
5 PINS
8 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
136
143
205
47
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
74
47
200
47
°C/W
RθJB
Junction-to-board thermal resistance
62
64
113
22
°C/W
ΨJT
Junction-to-top characterization parameter
19.7
5.3
38.2
0.7
°C/W
ΨJB
Junction-to-board characterization parameter
54.8
62.8
104.9
22.6
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
N/A
9.5
°C/W
(1)
6
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
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7.5 Thermal Information: OPA2145
OPA2145
THERMAL METRIC (1)
D (SOIC)
DGK (VSSOP)
DSD (SON)
8 PINS
8 PINS
8 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
136
143
47
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
74
47
47
°C/W
RθJB
Junction-to-board thermal resistance
62
64
22
°C/W
ΨJT
Junction-to-top characterization parameter
19.7
5.3
0.7
°C/W
ΨJB
Junction-to-board characterization parameter
54.8
62.8
22.6
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
9.5
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
7.6 Thermal Information: OPA4145
OPA4145
THERMAL METRIC
(1)
D (SOIC)
PW (TSSOP)
RUM (QFN)
14 PINS
14 PINS
16 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
86
93
35
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
46
28
33
°C/W
RθJB
Junction-to-board thermal resistance
41
34
13
°C/W
ΨJT
Junction-to-top characterization parameter
11.3
1.9
0.3
°C/W
ΨJB
Junction-to-board characterization parameter
40.7
33.1
13.0
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
3.3
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
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7.7 Electrical Characteristics: VS = 4.5 V to 36 V; ±2.25 V to ±18 V
at TA = 25°C, RL = 2 kΩ connected to midsupply, and VCM = VOUT = midsupply (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
±40
±150
UNIT
OFFSET VOLTAGE
VS = ±18 V
VOS
Offset voltage, RTI
dVOS/dT
Drift
PSRR
Power-supply rejection ratio
VS = ±18 V, TA = 0°C to +85°C
±280
VS = ±18 V, TA = –40°C to +125°C
±350
VS = ±18 V, TA = 0°C to +85°C
±0.4
±1
VS = ±18 V, TA = –40°C to +125°C
±0.5
±1.4
±0.06
±0.3
VS = ±2.25 V to ±18 V
VS = ±2.25 V to ±18 V,
TA = –40°C to +125°C
±2
μV
μV/°C
μV/V
INPUT BIAS CURRENT (1)
±2
IB
Input bias current
TA = 0°C to +85°C
TA = –40°C to +125°C
±10
±2
IOS
Input offset current
±10
±600
TA = 0°C to +85°C
±10
±600
TA = –40°C to +125°C
±10
pA
nA
pA
nA
NOISE
Input voltage noise
f = 0.1 Hz to 10 Hz
320
nVPP
f = 0.1 Hz to 10 Hz
60
nVRMS
f = 10 Hz
en
Input voltage noise density
In
Input current noise density
9
f = 100 Hz
7.2
f = 1 kHz
7
f = 1 kHz
0.8
nV/√Hz
fA/√Hz
INPUT VOLTAGE RANGE
VCM
Common-mode voltage range
CMRR
Common-mode rejection ratio
TA = –40°C to +125°C
(V–) –0.1
VS = ±18 V, VCM = (V–) –0.1 V to
(V+) – 3.5 V
126
VS = ±18 V, VCM = (V–) –0.1 V to
(V+) – 3.5 V,
TA = –40°C to +125°C
118
(V+)–3.5
V
140
dB
INPUT IMPEDANCE
1013 || 5.0
Differential
Common-mode
1013 || 4.3
VCM = (V–) –0.1 V to (V+) –3.5 V
Ω || pF
OPEN-LOOP GAIN
AOL
(1)
8
Open-loop voltage gain
VO = (V–) + 0.35 V to (V+) – 0.35 V,
RL = 10 kΩ
118
123
VO = (V–) + 0.35 V to (V+) – 0.35 V,
RL = 2 kΩ
106
110
VO = (V–) + 0.35 V to (V+) – 0.35 V,
RL = 2 kΩ, TA = –40°C to +125°C
102
dB
High-speed test, TA = TJ.
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Electrical Characteristics: VS = 4.5 V to 36 V; ±2.25 V to ±18 V (continued)
at TA = 25°C, RL = 2 kΩ connected to midsupply, and VCM = VOUT = midsupply (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
FREQUENCY RESPONSE
BW
Gain bandwidth product
G = 100
5.5
MHz
φM
Phase Margin
G = 1, CL = 10 pF
78
°
SR
Slew rate
20
V/μs
12 bits
10-V Step, G = +1
1.6
16 bits
10-V Step, G = +1
6
Settling time
THD+N
Total harmonic distortion and noise
1 kHz, G = +1, VO = 3.5 VRMS
μs
0.0001%
Overload recovery time
600
ns
OUTPUT
Linear output voltage swing range
VO
Voltage output swing from rail
ISC
Short-circuit current
CLOAD
Capacitive load drive
RO
Open-loop output impedance
RL = 10 kΩ, AOL ≥ 108 dB, TA =
–40°C to +125°C
(see Figure 24 and Figure 25)
(V–) + 0.1
RL = 2 kΩ, AOL ≥ 108 dB, TA =
–40°C to +125°C
(see Figure 24 and Figure 25)
(V–) + 0.3
(V+) – 0.1
V
(V+) – 0.3
RL = 10 kΩ
75
RL = 10 kΩ, TA = –40°C to +125°C
90
RL = 2 kΩ
210
RL = 2 kΩ,TA = –40°C to +125°C
mV
250
±20
mA
See Figure 27
f = 1 MHz, IO = 0 mA (see
Figure 26)
150
Ω
POWER SUPPLY
VS
Specified voltage range
±2.25
IO = 0 mA
IQ
Quiescent current (per amplifier)
±18
445
V
475
TA = 0°C to +85°C
590
TA = –40°C to +125°C
655
µA
TEMPERATURE RANGE
Specified
–40
125
°C
Operating
–55
150
°C
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7.8 Typical Characteristics
Table 1. Table of Graphs
DESCRIPTION
FIGURE
Offset Voltage Production Distribution
Figure 1
Offset Voltage Drift Distribution From –40°C to +125°C
Figure 2
Input Bias Current Production Distribution
Figure 3
Input Offset Current Production Distribution
Figure 4
Offset Voltage vs Temperature
Figure 5
Offset Voltage vs Common-Mode Voltage
Figure 6
Offset Voltage vs Power Supply
Figure 7
Open-Loop Gain and Phase vs Frequency
Figure 8
Closed-Loop Gain vs Frequency
Figure 9
Input Bias Current vs Common-Mode Voltage
Figure 10
Input Bias Current and Offset vs Temperature
Figure 11
Output Voltage Swing vs Output Current (Maximum Supply)
Figure 12
CMRR and PSRR vs Frequency
Figure 13
CMRR vs Temperature
Figure 14
PSRR vs Temperature
Figure 15
0.1-Hz to 10-Hz Voltage Noise
Figure 16
Input Voltage Noise Spectral Density vs Frequency
Figure 17
THD+N Ratio vs Frequency
Figure 18
THD+N vs Output Amplitude
Figure 19
Quiescent Current vs Supply Voltage
Figure 20
Quiescent Current vs Temperature
Figure 21
Open-Loop Gain vs Temperature (10-kΩ)
Figure 22
Open-Loop Gain vs Temperature (2-kΩ)
Figure 23
DC Open-Loop Gain vs Output Voltage Swing Relative to Supply
Figure 24, Figure 25
Open-Loop Output Impedance vs Frequency
Figure 26
Small-Signal Overshoot vs Capacitive Load (10-mV Step)
Figure 27
No Phase Reversal
Figure 28
Positive Overload Recovery
Figure 29
Negative Overload Recovery
Figure 30
Small-Signal Step Response (10-mV Step)
Figure 31, Figure 32
Large-Signal Step Response (10-V Step)
Figure 33, Figure 34
Settling Time
Figure 35
Short-Circuit Current vs Temperature
Figure 36
Maximum Output Voltage vs Frequency
Figure 37
EMIRR vs Frequency
Figure 38
10
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7.9 Typical Characteristics
at TA = 25°C, VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF (unless otherwise noted)
20
15
Amplifiers (%)
Amplifiers (%)
15
10
5
10
5
1.4
1.2
1
0.8
0.6
0.4
0
150
120
90
60
30
0
-30
-60
-90
-120
-150
0.2
0
0
Input Offset Voltage Drift (µV/ƒC)
Offset Voltage (µV)
C002
C001
Figure 1. Offset Voltage Production Distribution
Figure 2. Offset Voltage Drift Distribution
From –40°C to +125°C
30
40
35
25
Amplifiers (%)
Amplifiers (%)
30
25
20
15
20
15
10
10
5
5
Input Offset Current (pA)
Input Bias Current (pA)
C013
C013
Figure 3. Input Bias Current Production Distribution
Figure 4. Input Offset Current Production Distribution
150
Input-referred Offset Voltage ( V)
400
Input-referred Offset Voltage ( V)
5
4
3
2
1
0
-1
-2
-3
-5
5
4
3
2
1
0
-1
-2
-3
-4
-5
-4
0
0
300
200
100
0
±100
±200
±300
±400
125
100
75
50
25
0
±25
±50
±75
±100
VCM = 14.5 V
VCM = ± 18.1 V
±125
±150
±75
±50
±25
0
25
50
75
100
125
Temperature (ƒC)
150
C001
±20
±15
±10
±5
0
5
10
15
Input Common-mode Voltage (V)
5 Typical Units
20
C003
5 Typical Units
Figure 5. Offset Voltage vs Temperature
Figure 6. Offset Voltage vs Common-Mode Voltage
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Typical Characteristics (continued)
at TA = 25°C, VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF (unless otherwise noted)
120
180
Open-loop Gain
100
Gain (dB)
50
0
VS = ± 2.25 V
±50
±100
100
150
80
120
60
90
40
60
Phase
20
30
0
0
±20
±150
0
9
18
27
1
36
Supply Voltage (V)
10
100
1k
10k
100k
1M
Phase (ƒ)
Input-referred Offset Voltage ( V)
150
-30
10M
Frequency (Hz)
C001
C001
5 Typical Units
Figure 8. Open-Loop Gain and Phase vs Frequency
Figure 7. Offset Voltage vs Supply Voltage
3
60
Gain (dB)
40
Normalized Input Bias Current (pA)
G = +1
G= -1
G= +10
20
0
-20
0
-1.5
-3
100
1k
10k
100k
1M
10M
Frequency (Hz)
±20
±15
±10
±5
0
5
10
15
Input Common-mode Voltage (V)
C004
Figure 9. Closed-Loop Gain vs Frequency
20
C001
Figure 10. Input Bias Current vs Common-Mode Voltage
1V
Output Saturation Voltage (V)
10000
Input Bias Current (pA)
1.5
1000
IBN
100
IBP
IOS
10
Sourcing
100mV
-40°C
Sinking
10mV
25°C
85°C
125°C
1
1mV
±75
±50
±25
0
25
50
75
Temperature (ƒC)
100
125
150
Figure 11. Input Bias Current and Offset vs Temperature
12
1
10
Output Current (mA)
C001
100
C019
Figure 12. Output Voltage Swing vs Output Current
(Maximum Supply)
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Typical Characteristics (continued)
at TA = 25°C, VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF (unless otherwise noted)
Common-Mode Rejection Ratio (dB)
CMRR
140
Rejection Ratio (dB)
+PSRR
120
±PSRR
100
80
60
40
20
0
0.01
150
140
0.1
130
1
120
110
100
1
10
100
1k
10k
100k
1M
10M
Frequency (Hz)
10
140
0.1
120
1
100
10
25
50
75
100
125
Input-referred Voltage Noise (100 nV/div)
Power Supply Rejection Ratio (dB)
0.01
Power Supply Rejection Ratio (µV/V)
160
0
75
C017
Figure 16. 0.1-Hz to 10-Hz Voltage Noise
10
1
0.1
-60
G = -1, 2k- Load
G = -1, 600- Load
G = -1, 10k- Load
G = +1, 2k- Load
G = +1, 600- Load
G = +1, 10k- Load
0.01
0.001
-80
-100
0.0001
-120
0.00001
10
100
1k
10k
100k
Frequency (Hz)
20
200
2k
-140
20k
Frequency (Hz)
C002
Total Harmonic Distortion + Noise (dB)
Total Harmonic Distortion + Noise (%)
100
1
C001
C001
Figure 15. PSRR vs Temperature
0.1
100 125 150
Time (1 s/div)
150
Temperature (ƒC)
Voltage Noise Spectral Density (nv/¥Hz)
50
Figure 14. CMRR vs Temperature
0.001
±25
25
Temperature (ƒC)
Figure 13. CMRR and PSRR vs Frequency
±50
0
±75 ±50 ±25
C004
180
±75
Common-mode Rejection Ratio (µV/V)
160
160
C004
VOUT = 3.5 VRMS,
BW = 90 kHz
Figure 17. Input Voltage Noise Spectral Density
vs Frequency
Figure 18. THD+N Ratio vs Frequency
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Typical Characteristics (continued)
-60
0.01
-80
0.001
500
-100
0.0001
0.00001
0.001
G = -1, 600- Load
G = -1, 2k- Load
G = -1, 10k- Load
G = +1, 600- Load
G = +1, 2k- Load
G = +1, 10k- Load
0.01
-120
-140
0.1
1
Quiescent Current (µA)
0.1
Total Harmonic Distortion + Noise (dB)
Total Harmonic Distortion + Noise (%)
at TA = 25°C, VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF (unless otherwise noted)
400
300
VS = ± 2.25 V
200
100
0
0
10
Output Amplitude (VRMS)
9
18
27
36
Supply Voltage (V)
C004
C001
f = 1 kHz, BW = 90
kHz
Figure 20. Quiescent Current vs Supply Voltage
Figure 19. THD+N vs Output Amplitude
1000
140
0.1
Open-loop Gain (dB)
800
700
VS = ± 18 V
600
500
400
VS = ± 2.25 V
300
200
VS = ± 18 V
130
120
1
VS = ± 2.25 V
110
Open-loop Gain (µV/V)
Quiescent Current (µA)
900
100
100
0
±75
±50
±25
0
25
50
75
100
125
150
Temperature (ƒC)
10
±50
±25
0
25
50
75
100
125
Temperature (ƒC)
C001
Figure 21. Quiescent Current vs Temperature
C001
Figure 22. Open-Loop Gain vs Temperature
(With 10-kΩ Load)
0.1
140
VS = ± 18 V
120
1
110
10
0
25
50
75
100
80
-40°C
60
RL = 2kŸ
40
-5°C
25°C
85°C
125°C
100
±25
RL = 10kŸ
120
20
VS = ± 2.25 V
±50
DC Open-loop Gain (dB)
130
Open-loop Gain (µV/V)
Open-loop Gain (dB)
140
100
125
Temperature (ƒC)
C001
0
0.01
0.1
Output Voltage Swing from Rail (V)
1
C001
VS = ±18 V
Figure 23. Open-Loop Gain vs Temperature
(With 2-kΩ Load)
14
Figure 24. Open-Loop Gain vs Output Voltage
Swing to Supply
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Typical Characteristics (continued)
at TA = 25°C, VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF (unless otherwise noted)
1k
DC Open-loop Gain (dB)
120
Open-loop Output Impedance (Ÿ)
140
RL = 10kŸ
100
80
-40°C
60
-5°C
40
25°C
RL = 2kŸ
85°C
20
100
125°C
10
0
0.01
0.1
10
1
Output Voltage Swing from Rail (V)
100
1k
10k
100k
1M
10M
Frequency (Hz)
C001
100M
C021
VS = ±2.25 V
Figure 25. Open-Loop Gain vs Output Voltage
Swing to Supply
Figure 26. Open-Loop Output Impedance vs Frequency
50
VIN
45
G = +1
Output Voltage (5 V/div)
Overshoot (%)
40
35
30
25
20
15
10
VOUT
G = -1
5
0
10
100
Time (45 ms/div)
1000
Capacitive Load (pF)
C004
C017
Figure 27. Small-Signal Overshoot vs Capacitive Load
(10-mV Step)
Figure 28. No Phase Reversal
VOUT
VIN
5 V/div
5 V/div
VIN
VOUT
Time (100 ns/div)
Time (100 ns/div)
C017
C017
Figure 29. Positive Overload Recovery
Figure 30. Negative Overload Recovery
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Typical Characteristics (continued)
2.5 mV/div
2.5 mV/div
at TA = 25°C, VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF (unless otherwise noted)
Output
Input
Output
Input
Time (200 ns/div)
Time (200 ns/div)
C017
C017
G = +1
G = –1
Figure 32. Small-Signal Step Response (10-mV Step)
2 V/div
2 V/div
Figure 31. Small-Signal Step Response (10-mV Step)
Output
Output
Input
Input
Time (2 µs/div)
Time (2 µs/div)
C017
C017
G = –1
G = +1
Figure 33. Large-Signal Step Response (10-V Step)
Figure 34. Large-Signal Step Response (10-V Step)
40
12-bit Settling = “2.44 mV
Short Circuit Current (mA)
t=0
2 mV/div
Rising Edge
Falling Edge
30
Sinking
20
Sourcing
10
0
Time (250 ns/div)
±75
±50
±25
0
25
50
75
100
125
150
Temperature (ƒC)
C017
C001
12-bit settling on 10-V step = ±2.44 mV
Figure 35. Settling Time (10-V Step)
16
Figure 36. Short-Circuit Current vs Temperature
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Typical Characteristics (continued)
at TA = 25°C, VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF (unless otherwise noted)
40
VS = ±18V
120
30
EMIRR IN+ (dB)
Output Voltage (VPP)
35
140
Maximum output voltage without
slew-rate induced distortion.
25
20
15
10
VS = ±2.25V
5
10k
80
60
40
20
0
1k
100
100k
Frequency (Hz)
1M
10M
0
10M
100M
1000M
Frequency (Hz)
C001
C004
PRF = –10 dBm
Figure 37. Maximum Output Voltage Amplitude vs
Frequency
Figure 38. EMIRR vs Frequency
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8 Detailed Description
8.1 Overview
The OPAx145 family of operational amplifiers is a series of low-power JFET input amplifiers that feature superior
drift performance and low input bias current. The rail-to-rail output swing and input range that includes V– allow
designers to use the low-noise characteristics of JFET amplifiers while also interfacing to modern, single-supply,
precision analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). The OPAx145 series
achieves 5.5-MHz gain-bandwidth product and 20-V/μs slew rate and consumes only 445 µA (typical) of
quiescent current, making it well suited for low-power applications. These devices operate on a single 4.5-V to
36-V supply or dual ±2.25-V to ±18-V supplies.
All versions are fully specified from –40°C to +125°C for use in the most challenging environments. The singlechannel OPA145 is available in the 5-pin SOT-23, 8-pin VSSOP, 8-pin 3-mm × 3-mm WSON, and 8-pin SOIC
packages; the dual-channel OPA2145 is available in 8-pin VSSOP, 8-pin 3-mm × 3-mm WSON, and 8-pin SOIC
packages; and the quad-channel OPA4145 is available in the 16-pin 3-mm × 3-mm QFN, 14-pin SOIC and 14pin TSSOP packages.
The Functional Block Diagram shows the simplified diagram of the OPAx145.
8.2 Functional Block Diagram
V+
Pre-Output Driver
IN–
OUT
IN+
V–
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8.3 Feature Description
8.3.1 Operating Voltage
The OPA145, OPA2145, and OPA4145 series of op amps can be used with single or dual supplies from an
operating range of VS = 4.5 V (±2.25 V) up to VS = 36 V (±18 V). These devices do not require symmetrical
supplies; they only require a minimum supply voltage of 4.5 V (±2.25 V). For VS less than ±3.5 V, the commonmode input range does not include midsupply. Supply voltages higher than 40 V can permanently damage the
device; see the Absolute Maximum Ratings table. Key parameters are specified over the operating temperature
range, TA = –40°C to +125°C. Key parameters that vary over the supply voltage, temperature range, or
frequency are shown in Typical Characteristics.
8.3.2 Capacitive Load and Stability
The dynamic characteristics of the OPAx145 have been optimized for commonly encountered gains, loads, and
operating conditions. The combination of low closed-loop gain and high capacitive loads decreases the phase
margin of the amplifier and can lead to gain peaking or oscillations. As a result, heavier capacitive loads must be
isolated from the output. The simplest way to achieve this isolation is to add a small resistor (ROUT equal to 50 Ω,
for example) in series with the output.
Figure 27 illustrates the effects on small-signal overshoot for several capacitive loads. Also, see Feedback Plots
Define Op Amp AC Performance, available for download from the TI website, for details of analysis techniques
and application circuits.
8.3.3 Output Current Limit
The output current of the OPAx145 series is limited by internal circuitry to +20 mA/–20 mA (sinking/sourcing), to
protect the device if the output is accidentally shorted. This short-circuit current depends on temperature, as
shown in Figure 36.
8.3.4 Noise Performance
Figure 39 shows the total circuit noise for varying source impedances with the operational amplifier in a unitygain configuration (with no feedback resistor network and therefore no additional noise contributions). The
OPA145 and OPA211 are shown with total circuit noise calculated. The op amp itself contributes both a voltage
noise component and a current noise component. The voltage noise is commonly modeled as a time-varying
component of the offset voltage. The current noise is modeled as the time-varying component of the input bias
current and reacts with the source resistance to create a voltage component of noise. Therefore, the lowest noise
op amp for a given application depends on the source impedance. For low source impedance, current noise is
negligible, and voltage noise generally dominates. The OPA145, OPA2145, and OPA4145 family has both low
voltage noise and extremely low current noise because of the FET input of the op amp. As a result, the current
noise contribution of the OPAx145 series is negligible for any practical source impedance, which makes it the
better choice for applications with high source impedance.
The equation in Figure 39 shows the calculation of the total circuit noise, with these parameters:
• en = voltage noise
• In = current noise
• RS = source impedance
• k = Boltzmann's constant = 1.38 × 10–23 J/K
• T = temperature in degrees Kelvin (K)
For more details on calculating noise, see Basic Noise Calculations.
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Voltage Noise Spectral Density, EO (V/Hz1/2)
Feature Description (continued)
10µ
OPA211
1µ
100n
OPA145
10n
1n
Resistor Noise
0.1n
1
10
100
1k
RS = 3.8 kŸ
10k
100k
1M
Source Resistance, RS (Ÿ)
10M
C003
RS = 3.8 kΩ is indicated in Figure 39.
This is the source impedance above which OPA145 will be a lower noise option than the OPA211.
Figure 39. Noise Performance of the OPA145 and OPA211 in Unity-Gain Buffer Configuration
8.3.5 Basic Noise Calculations
Low-noise circuit design requires careful analysis of all noise sources. External noise sources can dominate in
many cases; consider the effect of source resistance on overall op amp noise performance. Total noise of the
circuit is the root-sum-square combination of all noise components.
The resistive portion of the source impedance produces thermal noise proportional to the square root of the
resistance. This function is plotted in Figure 39. The source impedance is usually fixed; consequently, select the
op amp and the feedback resistors to minimize the respective contributions to the total noise.
Figure 40 illustrates both noninverting (A) and inverting (B) op amp circuit configurations with gain. In circuit
configurations with gain, the feedback network resistors also contribute noise. In general, the current noise of the
op amp reacts with the feedback resistors to create additional noise components. However, the extremely low
current noise of the OPAx145 means that its current noise contribution can be neglected.
The feedback resistor values can generally be chosen to make these noise sources negligible. Low impedance
feedback resistors load the output of the amplifier. The equations for total noise are shown for both
configurations.
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Feature Description (continued)
(A) Noise in Noninverting Gain Configuration
R1
Noise at the output is given as EO, where
R2
GND
±
EO
+
RS
+
±
VS
Source
GND
'1 = l1 +
:2;
A5 = ¥4 „ G$ „ 6(-) „ 45
d
:3;
A41 æ42 = ¨4 „ G$ „ 6(-) „ d
8
41 „ 42
h d
h
41 + 42
¾*V
Thermal noise of R1 || R2
:4;
G$ = 1.38065 „ 10F23
Boltzmann Constant
:5;
,
h
-
6(-) = 237.15 + 6(°%)
(B) Noise in Inverting Gain Configuration
R1
RS
R2
h
>-?
Thermal noise of RS
Temperature in kelvins
:45 + 41 ; „ 42
42
2
p „ ¨:A0 ;2 + kA41 +45 æ42 o + FE0 „ H
IG
45 + 41
45 + 41 + 42
:6;
'1 = l1 +
+
:7;
:45 + 41 ; „ 42
8
I d
A41 +45 æ42 = ¨4 „ G$ „ 6(-) „ H
h
45 + 41 + 42
¾*V Thermal noise of (R1 + RS) || R2
GND
:8;
G$ = 1.38065 „ 10F23
:9;
6(-) = 237.15 + 6(°%)
±
+
±
d
8
¾*V
> 84/5 ?
Noise at the output is given as EO, where
EO
VS
42
41 „ 42 2
2
p „ ¨:A5 ;2 + :A0 ;2 + kA41 æ42 o + :E0 „ 45 ;2 + lE0 „ d
hp
41
41 + 42
:1;
Source
GND
d
,
h
-
2
> 84/5 ?
Boltzmann Constant
>-?
Temperature in kelvins
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(1)
eN is the voltage noise of the amplifier. For the OPAx145 series of operational amplifiers, eN = 7 nV/√Hz at 1 kHz.
(2)
iN is the current noise of the amplifier. For the OPAx145 series of operational amplifiers, iN = 0.8 fA/√Hz at 1 kHz.
(3)
For additional resources on noise calculations visit TI's Precision Labs Series.
Figure 40. Noise Calculation in Gain Configurations
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Feature Description (continued)
8.3.6 Phase-Reversal Protection
The OPA145, OPA2145, and OPA4145 family has internal phase-reversal protection. Many FET- and bipolarinput op amps exhibit a phase reversal when the input is driven beyond its linear common-mode range. This
condition is most often encountered in noninverting circuits when the input is driven beyond the specified
common-mode voltage range, causing the output to reverse into the opposite rail. The input circuitry of the
OPA145, OPA2145, and OPA4145 prevents phase reversal with excessive common-mode voltage; instead, the
output limits into the appropriate rail (see Figure 28).
8.3.7 Electrical Overstress
Designers often ask questions about the capability of an operational amplifier to withstand electrical overstress.
These questions tend to focus on the device inputs, but may involve the supply voltage pins or even the output
pin. Each of these different pin functions have electrical stress limits determined by the voltage breakdown
characteristics of the particular semiconductor fabrication process and specific circuits connected to the pin.
Additionally, internal electrostatic discharge (ESD) protection is built into these circuits to protect them from
accidental ESD events both before and during product assembly.
It is helpful to have a good understanding of this basic ESD circuitry and its relevance to an electrical overstress
event. See Figure 41 for an illustration of the ESD circuits contained in the OPAx145 series (indicated by the
dashed line area). The ESD protection circuitry involves several current-steering diodes connected from the input
and output pins and routed back to the internal power-supply lines, where they meet at an absorption device
internal to the operational amplifier. This protection circuitry is intended to remain inactive during normal circuit
operation.
An ESD event produces a short duration, high-voltage pulse that is transformed into a short duration, highcurrent pulse as it discharges through a semiconductor device. The ESD protection circuits are designed to
provide a current path around the operational amplifier core to prevent it from being damaged. The energy
absorbed by the protection circuitry is then dissipated as heat.
When an ESD voltage develops across two or more of the amplifier device pins, current flows through one or
more of the steering diodes. Depending on the path that the current takes, the absorption device may activate.
The absorption device has a trigger, or threshold voltage, that is above the normal operating voltage of the
OPAx145 but below the device breakdown voltage level. Once this threshold is exceeded, the absorption device
quickly activates and clamps the voltage across the supply rails to a safe level.
When the operational amplifier connects into a circuit such as the one Figure 41 shows, the ESD protection
components are intended to remain inactive and not become involved in the application circuit operation.
However, circumstances may arise where an applied voltage exceeds the operating voltage range of a given pin.
Should this condition occur, there is a risk that some of the internal ESD protection circuits may be biased on,
and conduct current. Any such current flow occurs through steering diode paths and rarely involves the
absorption device.
Figure 41 depicts a specific example where the input voltage, VIN, exceeds the positive supply voltage (+VS) by
500 mV or more. Much of what happens in the circuit depends on the supply characteristics. If +VS can sink the
current, one of the upper input steering diodes conducts and directs current to +VS. Excessively high current
levels can flow with increasingly higher VIN. As a result, the data sheet specifications recommend that
applications limit the input current to 10 mA.
If the supply is not capable of sinking the current, VIN may begin sourcing current to the operational amplifier, and
then take over as the source of positive supply voltage. The danger in this case is that the voltage can rise to
levels that exceed the operational amplifier absolute maximum ratings.
Another common question involves what happens to the amplifier if an input signal is applied to the input while
the power supplies +VS or –VS are at 0 V.
Again, it depends on the supply characteristic while at 0 V, or at a level below the input signal amplitude. If the
supplies appear as high impedance, then the operational amplifier supply current may be supplied by the input
source through the current steering diodes. This state is not a normal bias condition; the amplifier most likely will
not operate normally. If the supplies are low impedance, then the current through the steering diodes can
become quite high. The current level depends on the ability of the input source to deliver current, and any
resistance in the input path.
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Feature Description (continued)
If there is an uncertainty about the ability of the supply to absorb this current, external Zener diodes may be
added to the supply pins as shown in Figure 41. The Zener voltage must be selected such that the diode does
not turn on during normal operation.
However, its Zener voltage must be low enough so that the Zener diode conducts if the supply pin begins to rise
above the safe operating supply voltage level.
(2)
TVS
RF
+VS
+V
RI
ESD CurrentSteering Diodes
-In
(3)
RS
+In
Op Amp
Core
Edge-Triggered ESD
Absorption Circuit
ID
VIN
Out
RL
(1)
-V
-VS
(2)
TVS
(1)
VIN = +VS + 500 mV.
(2)
TVS: +VS(max) > VTVSBR (Min) > +VS
(3)
Suggested value approximately 1 kΩ.
Figure 41. Equivalent Internal ESD Circuitry and Its Relation to a Typical Circuit Application
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Feature Description (continued)
8.3.8 EMI Rejection
The electromagnetic interference (EMI) rejection ratio, or EMIRR, describes the EMI immunity of operational
amplifiers. An adverse effect that is common to many op amps is a change in the offset voltage as a result of RF
signal rectification. An op amp that is more efficient at rejecting this change in offset as a result of EMI has a
higher EMIRR and is quantified by a decibel value. Measuring EMIRR can be performed in many ways, but this
section provides the EMIRR IN+, which specifically describes the EMIRR performance when the RF signal is
applied to the noninverting input pin of the op amp. In general, only the noninverting input is tested for EMIRR for
the following three reasons:
• Op amp input pins are known to be the most sensitive to EMI, and typically rectify RF signals better than the
supply or output pins.
• The noninverting and inverting op amp inputs have symmetrical physical layouts and exhibit nearly matching
EMIRR performance
• EMIRR is easier to measure on noninverting pins than on other pins because the noninverting input terminal
can be isolated on a PCB. This isolation allows the RF signal to be applied directly to the noninverting input
terminal with no complex interactions from other components or connecting PCB traces.
High-frequency signals conducted or radiated to any pin of the operational amplifier result in adverse effects,
as the amplifier would not have sufficient loop gain to correct for signals with spectral content outside its
bandwidth. Conducted or radiated EMI on inputs, power supply, or output may result in unexpected DC
offsets, transient voltages, or other unknown behavior. Be sure to properly shield and isolate sensitive analog
nodes from noisy radio signals and digital clocks and interfaces. Figure 43 shows the effect of conducted
EMI to the power supplies on the input offset voltage of OPA145.
The EMIRR IN+ of the OPA145 is plotted versus frequency as shown in Figure 42. If available, any dual and
quad op amp device versions have nearly similar EMIRR IN+ performance. The OPA145 unity-gain
bandwidth is 5.5 MHz. EMIRR performance below this frequency denotes interfering signals that fall within
the op amp bandwidth.
See EMI Rejection Ratio of Operational Amplifiers, available for download from www.ti.com.
140
EMI-Induced Input Offset Voltage (µV)
50
EMIRR IN+ (dB)
120
100
80
60
40
20
0
10M
100M
1000M
Frequency (Hz)
V± Supply
0
±50
V+ Supply
±100
±150
±200
C004
100
1k
10k
Frequency (Hz)
Figure 42. OPA145 EMIRR IN+
100k
1M
C006
Figure 43. OPA145 EMI-Induced Input Offset
Voltage (Power Supplies)
24
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Table 2 lists the EMIRR IN+ values for the OPA145 at particular frequencies commonly encountered in real-world
applications. Applications listed in Table 2 may be centered on or operated near the particular frequency shown.
This information may be of special interest to designers working with these types of applications, or working in
other fields likely to encounter RF interference from broad sources, such as the industrial, scientific, and medical
(ISM) radio band.
Table 2. OPA145 EMIRR IN+ for Frequencies of Interest
FREQUENCY
APPLICATION OR ALLOCATION
EMIRR IN+
400 MHz
Mobile radio, mobile satellite, space operation, weather, radar, ultra-high frequency (UHF)
applications
54 dB
900 MHz
Global system for mobile communications (GSM) applications, radio communication, navigation,
GPS (to 1.6 GHz), GSM, aeronautical mobile, UHF applications
68 dB
1.8 GHz
GSM applications, mobile personal communications, broadband, satellite, L-band (1 GHz to 2 GHz)
86 dB
2.4 GHz
802.11b, 802.11g, 802.11n, Bluetooth®, mobile personal communications, industrial, scientific and
medical (ISM) radio band, amateur radio and satellite, S-band (2 GHz to 4 GHz)
107 dB
3.6 GHz
Radiolocation, aero communication and navigation, satellite, mobile, S-band
100 dB
802.11a, 802.11n, aero communication and navigation, mobile communication, space and satellite
operation, C-band (4 GHz to 8 GHz)
105 dB
5 GHz
8.3.9 EMIRR +IN Test Configuration
Figure 44 shows the circuit configuration for testing the EMIRR IN+. An RF source is connected to the op amp
noninverting input terminal using a transmission line. The op amp is configured in a unity-gain buffer topology
with the output connected to a low-pass filter (LPF) and a digital multimeter (DMM). A large impedance mismatch
at the op amp input causes a voltage reflection; however, this effect is characterized and accounted for when
determining the EMIRR IN+. The resulting DC offset voltage is sampled and measured by the multimeter. The
LPF isolates the multimeter from residual RF signals that may interfere with multimeter accuracy.
Ambient temperature: 25Û&
+VS
±
50
Low-Pass Filter
+
RF source
DC Bias: 0 V
Modulation: None (CW)
Frequency Sweep: 201 pt. Log
-VS
Not shown: 0.1 µF and 10 µF
supply decoupling
Sample /
Averaging
Digital Multimeter
Figure 44. EMIRR +IN Test Configuration
8.4 Device Functional Modes
The OPAx145 has a single functional mode and is operational when the power-supply voltage is greater than 4.5
V (±2.25 V). The maximum power supply voltage for the OPAx145 is 36 V (±18 V).
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The OPA145, OPA2145, and OPA4145 are unity-gain stable operational amplifiers with low noise, low input bias
current, and low input offset voltage. Applications with noisy or high-impedance power supplies require
decoupling capacitors placed close to the device pins. In most cases, 0.1-μF capacitors are adequate. Designers
can easily use the rail-to-rail output swing and input range that includes V– to take advantage of the low-noise
characteristics of JFET amplifiers while also interfacing to modern, single-supply, precision data converters.
9.2 Typical Application
R4
2.94 k
C5
1 nF
R1
590
R3
499
Input
C2
39 nF
±
Output
+
OPA145
Copyright © 2017, Texas Instruments Incorporated
Figure 45. 25-kHz Low-pass Filter
9.2.1 Design Requirements
Low-pass filters are commonly employed in signal processing applications to reduce noise and prevent aliasing.
The OPAx145 devices are ideally suited to construct high-speed, high-precision active filters. Figure 45 shows a
second-order, low-pass filter commonly encountered in signal processing applications.
Use the following parameters for this design example:
• Gain = 5 V/V (inverting gain)
• Low-pass cutoff frequency = 25 kHz
• Second-order Chebyshev filter response with 3-dB gain peaking in the passband
9.2.2 Detailed Design Procedure
The infinite-gain multiple-feedback circuit for a low-pass network function is shown in Figure 45. Use Equation 1
to calculate the voltage transfer function.
1 R1R3C2C5
Output
s
2
Input
s
s C2 1 R1 1 R3 1 R4 1 R3R4C2C5
(1)
This circuit produces a signal inversion. For this circuit, the gain at DC and the low-pass cutoff frequency are
calculated by Equation 2:
R4
Gain
R1
fC
26
1
2S
1 R3R 4 C2C5
(2)
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Typical Application (continued)
Software tools are readily available to simplify filter design. WEBENCH® Filter Designer is a simple, powerful,
and easy-to-use active filter design program. The WEBENCH® Filter Designer lets you create optimized filter
designs using a selection of TI operational amplifiers and passive components from TI's vendor partners.
Available as a web based tool from the WEBENCH Design Center, WEBENCH Filter Designer allows you to
design, optimize, and simulate complete multistage active filter solutions within minutes.
9.2.3 Application Curve
20
Gain (db)
0
-20
-40
-60
100
1k
10k
Frequency (Hz)
100k
1M
Figure 46. OPAx145 Second-Order, 25-kHz, Chebyshev, Low-pass Filter
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10 System Examples
10.1 16-bit, 100-kSPS, Fully Differential Transimpedance Imaging and Measurement
OPAx145 is used in a differential transimpedance (I-V) measurement application capable of driving the
ADS8867, a 16-bit, microPower, Truly-Differential ADC, at its maximum conversion rate of 100 kSPS with an
acquisition time of 1200 ns and conversion time of 8800 ns. The first stage supports a forward bandwidth of
493.5 kHz with 100 kΩ of transimpedance gain, enabling the photodiode to fully charge and settle to ±38 µV
(±1/2 LSB on 5-V ADC reference voltage) within the conversion time of the ADC. The differential nature of the
system provides several advantages such as double the transimpedance gain compared to a single-ended
system, improved signal-to-noise ratio, easy interfacing to high-precision, fully-differential ADCs, and additional
protection against inductively-coupled noise and interference. Additionally, capacitively-coupled common-mode
transients can be minimized using low-impedance termination resistors RTERM1 and RTERM2.
The second stage provides the reverse bandwidth required for settling to 16-bit accuracy after the internal
sampling capacitor of the successive-approximation-register (SAR) ADC is connected to the second stage. The
two OPAx145 amplifiers in the second stage are configured as buffers for maximum closed-loop bandwidth, and
their stability is optimized using R3, C3 and R4, C4 by creating a snubber that reduces the open-loop output
impedance (see Figure 26). C5 and C6 are provided as a charge reservoir for the internal sampling capacitor of
the ADC, and R5 and R6 are tuned to optimize the phase margin of the second stage to drive the output
capacitance. This two-stage approach enables compatibility with a wide selection of high output-impedance
sensors while still maintaining 16-bit settling performance. Furthermore, the first stage can be designed with
sufficient phase margin to drive twisted-pair transmission lines in remote measurement systems. Proper design
of the transmission line reduces the interference of other signals over long distances. Figure 48 shows the
settling performance of the system described previously and in Figure 47 — the settling time during the
acquisition cycle is shown for settling successfully to 0 µA from 5 µs to 6.2 µs. At 6.3 µs, the photodiode current
is changed to 5 µA (full-scale) and settles during the conversion cycle of the ADC (6.2 µs to 15 µs), and is then
acquired successfully from 15 µs to 16.2 µs.
R1
50 k
GND
C1
9 pF
RTERM1
1k
+10V
+10V
R5
22
±
±
OPA145
OPA145
+
+
R3
180
GND
C3
432p
2.5 V to 5 V 2.7 V to 3.6 V
C5
200p
GND
REF
ò ‡ 9REF
AVDD
AINP
GND
ADS8867
GND
Twisted Pair
+
Fast Silicon
PIN Photodiode
5 A
3.8 pF
2.5 mW/cm2
Photovoltaic Mode
GND
OPA145
+
±
OPA145
±
+10V
C2
9 pF
RTERM2
1k
+10V
C4
432p
C6
200p
AINN
R4
180
GND
R6
22
GND
Copyright © 2017, Texas Instruments Incorporated
R2
50 k
Figure 47. 16-bit, 100-kSPS, Fully Differential Transimpedance Schematic
28
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16-bit, 100-kSPS, Fully Differential Transimpedance Imaging and Measurement (continued)
500
Acquisition Stop
Error Signal
400
Error Voltage (µV)
300
+1/2-LSB
200
100
0
-100
-200
-1/2-LSB
-300
-400
Acquisition Start
-500
0
5
10
15
Time (µs)
20
C005
Figure 48. 16-bit, 100-kSPS, Fully Differential Transimpedance Settling Performance
11 Power Supply Recommendations
The OPAx145 is specified for operation from 4.5 V to 36 V (±2.25 V to ±18 V); many specifications apply from
–40°C to +125°C. Parameters that can exhibit significant variance with regard to operating voltage or
temperature are presented in the Typical Characteristics.
CAUTION
Supply voltages larger than 40 V can permanently damage the device; see the
Absolute Maximum Ratings.
Place 0.1-μF bypass capacitors close to the power-supply pins to reduce errors coupling in from noisy or highimpedance power supplies. For more detailed information on bypass capacitor placement, see the Layout
section.
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12 Layout
12.1 Layout Guidelines
For best operational performance of the device, use good PCB layout practices, including:
• Noise can propagate into analog circuitry through the power pins of the circuit as a whole and the op amp
itself. Bypass capacitors are used to reduce the coupled noise by providing low-impedance power
sources local to the analog circuitry.
– Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as
close as possible to the device. A single bypass capacitor from V+ to ground is applicable for singlesupply applications.
• Separate grounding for analog and digital portions of circuitry is one of the simplest and most effective
methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground
planes. A ground plane helps distribute heat and reduces EMI noise pickup. Make sure to physically
separate digital and analog grounds paying attention to the flow of the ground current. For more detailed
information, see App note: 'The PCB is a component of op amp design''.
• To reduce parasitic coupling, run the input traces as far away as possible from the supply or output
traces. If these traces cannot be kept separate, crossing the sensitive trace perpendicular is much better
as opposed to in parallel with the noisy trace.
• Place the external components as close as possible to the device. As illustrated in Figure 49, keeping RF
and RG close to the inverting input minimizes parasitic capacitance.
• Keep the length of input traces as short as possible. Always remember that the input traces are the most
sensitive part of the circuit.
• Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly
reduce leakage currents from nearby traces that are at different potentials.
• For best performance, TI recommends cleaning the PCB following board assembly.
• Any precision integrated circuit may experience performance shifts due to moisture ingress into the
plastic package. Following any aqueous PCB cleaning process, TI recommends baking the PCB
assembly to remove moisture introduced into the device packaging during the cleaning process. A low
temperature, post cleaning bake at 85°C for 30 minutes is sufficient for most circumstances.
30
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12.2 Layout Example
+V
R3
1
NC
2
±IN
3
+IN
4
V±
C3
NC
8
±
V+
7
+
OUT
6
NC
5
C4
R1
IN±
IN+
OUT
R2
-V
C1
R4
C2
GND
Use ground pours for
shielding the input
signal pairs
Place bypass
capacitors as close to
IC as possible
C3
C4
R3
IN±
1
NC
NC
8
2
±IN
V+
7
3
+IN
OUT
6
4
V±
NC
5
+V
R1
OUT
R2
IN+
GND
R4
Place components
close to device and to
each other to reduce
parasitic errors
C1
-V
Use a lowESR,ceramic bypass
capacitor
C2
Copyright © 2017, Texas Instruments Incorporated
Figure 49. Operational Amplifier Board Layout for Difference Amplifier Configuration
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13 Device and Documentation Support
13.1 Device Support
13.1.1 Development Support
13.1.1.1 TINA-TI™ (Free Software Download)
TINA™ is a simple, powerful, and easy-to-use circuit simulation program based on a SPICE engine. TINA-TI is a
free, fully functional version of the TINA software, preloaded with a library of macro models in addition to a range
of both passive and active models. TINA-TI provides all the conventional dc, transient, and frequency domain
analysis of SPICE, as well as additional design capabilities.
Available as a free download from the Analog eLab Design Center, TINA-TI offers extensive post-processing
capability that allows users to format results in a variety of ways. Virtual instruments offer the ability to select
input waveforms and probe circuit nodes, voltages, and waveforms, creating a dynamic quick-start tool.
NOTE
These files require that either the TINA software (from DesignSoft™) or TINA-TI software
be installed. Download the free TINA-TI software from the TINA-TI folder.
13.1.1.2 WEBENCH Filter Designer Tool
WEBENCH® Filter Designer is a simple, powerful, and easy-to-use active filter design program. The WEBENCH
Filter Designer lets you create optimized filter designs using a selection of TI operational amplifiers and passive
components from TI's vendor partners.
13.1.1.3 TI Precision Designs
TI Precision Designs are available online at http://www.ti.com/ww/en/analog/precision-designs/. TI Precision
Designs are analog solutions created by TI’s precision analog applications experts and offer the theory of
operation, component selection, simulation, complete PCB schematic and layout, bill of materials, and measured
performance of many useful circuits.
13.2 Documentation Support
13.2.1 Related Documentation
For related documentation see the following:
• The PCB is a component of op amp design
• OPA140, OPA2140, OPA4140 EMI Immunity Performance
• Compensate Transimpedance Amplifiers Intuitively
• Operational amplifier gain stability, Part 3: AC gain-error analysis
• Operational amplifier gain stability, Part 2: DC gain-error analysis
• Using infinite-gain, MFB filter topology in fully differential active filters
• Op Amp Performance Analysis
• Single-Supply Operation of Operational Amplifiers
• Tuning in Amplifiers
• Shelf-Life Evaluation of Lead-Free Component Finishes
• Feedback Plots Define Op Amp AC Performance
• EMI Rejection Ratio of Operational Amplifiers
32
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13.3 Related Links
Table 3 lists quick access links. Categories include technical documents, support and community resources,
tools and software, and quick access to sample or buy.
Table 3. Related Links
PARTS
PRODUCT FOLDER
SAMPLE & BUY
TECHNICAL
DOCUMENTS
TOOLS &
SOFTWARE
SUPPORT &
COMMUNITY
OPA145
Click here
Click here
Click here
Click here
Click here
OPA2145
Click here
Click here
Click here
Click here
Click here
OPA4145
Click here
Click here
Click here
Click here
Click here
13.4 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
13.5 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
13.6 Trademarks
E2E is a trademark of Texas Instruments.
TINA-TI is a trademark of Texas Instruments, Inc and DesignSoft, Inc.
WEBENCH is a registered trademark of Texas Instruments.
Bluetooth is a registered trademark of Bluetooth SIG, Inc.
TINA, DesignSoft are trademarks of DesignSoft, Inc.
All other trademarks are the property of their respective owners.
13.7 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
13.8 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
14 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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33
PACKAGE OPTION ADDENDUM
www.ti.com
27-Jun-2017
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
OPA145ID
ACTIVE
SOIC
D
8
75
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-55 to 150
OPA145
OPA145IDR
ACTIVE
SOIC
D
8
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-55 to 150
OPA145
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
27-Jun-2017
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
24-Jun-2017
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
OPA145IDR
Package Package Pins
Type Drawing
SOIC
D
8
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
2500
330.0
12.4
Pack Materials-Page 1
6.4
B0
(mm)
K0
(mm)
P1
(mm)
5.2
2.1
8.0
W
Pin1
(mm) Quadrant
12.0
Q1
PACKAGE MATERIALS INFORMATION
www.ti.com
24-Jun-2017
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
OPA145IDR
SOIC
D
8
2500
367.0
367.0
35.0
Pack Materials-Page 2
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Buyers and others who are developing systems that incorporate TI products (collectively, “Designers”) understand and agree that Designers
remain responsible for using their independent analysis, evaluation and judgment in designing their applications and that Designers have
full and exclusive responsibility to assure the safety of Designers' applications and compliance of their applications (and of all TI products
used in or for Designers’ applications) with all applicable regulations, laws and other applicable requirements. Designer represents that, with
respect to their applications, Designer has all the necessary expertise to create and implement safeguards that (1) anticipate dangerous
consequences of failures, (2) monitor failures and their consequences, and (3) lessen the likelihood of failures that might cause harm and
take appropriate actions. Designer agrees that prior to using or distributing any applications that include TI products, Designer will
thoroughly test such applications and the functionality of such TI products as used in such applications.
TI’s provision of technical, application or other design advice, quality characterization, reliability data or other services or information,
including, but not limited to, reference designs and materials relating to evaluation modules, (collectively, “TI Resources”) are intended to
assist designers who are developing applications that incorporate TI products; by downloading, accessing or using TI Resources in any
way, Designer (individually or, if Designer is acting on behalf of a company, Designer’s company) agrees to use any particular TI Resource
solely for this purpose and subject to the terms of this Notice.
TI’s provision of TI Resources does not expand or otherwise alter TI’s applicable published warranties or warranty disclaimers for TI
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enhancements, improvements and other changes to its TI Resources. TI has not conducted any testing other than that specifically
described in the published documentation for a particular TI Resource.
Designer is authorized to use, copy and modify any individual TI Resource only in connection with the development of applications that
include the TI product(s) identified in such TI Resource. NO OTHER LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE
TO ANY OTHER TI INTELLECTUAL PROPERTY RIGHT, AND NO LICENSE TO ANY TECHNOLOGY OR INTELLECTUAL PROPERTY
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TI RESOURCES ARE PROVIDED “AS IS” AND WITH ALL FAULTS. TI DISCLAIMS ALL OTHER WARRANTIES OR
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PRODUCTS EVEN IF DESCRIBED IN TI RESOURCES OR OTHERWISE. IN NO EVENT SHALL TI BE LIABLE FOR ANY ACTUAL,
DIRECT, SPECIAL, COLLATERAL, INDIRECT, PUNITIVE, INCIDENTAL, CONSEQUENTIAL OR EXEMPLARY DAMAGES IN
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Unless TI has explicitly designated an individual product as meeting the requirements of a particular industry standard (e.g., ISO/TS 16949
and ISO 26262), TI is not responsible for any failure to meet such industry standard requirements.
Where TI specifically promotes products as facilitating functional safety or as compliant with industry functional safety standards, such
products are intended to help enable customers to design and create their own applications that meet applicable functional safety standards
and requirements. Using products in an application does not by itself establish any safety features in the application. Designers must
ensure compliance with safety-related requirements and standards applicable to their applications. Designer may not use any TI products in
life-critical medical equipment unless authorized officers of the parties have executed a special contract specifically governing such use.
Life-critical medical equipment is medical equipment where failure of such equipment would cause serious bodily injury or death (e.g., life
support, pacemakers, defibrillators, heart pumps, neurostimulators, and implantables). Such equipment includes, without limitation, all
medical devices identified by the U.S. Food and Drug Administration as Class III devices and equivalent classifications outside the U.S.
TI may expressly designate certain products as completing a particular qualification (e.g., Q100, Military Grade, or Enhanced Product).
Designers agree that it has the necessary expertise to select the product with the appropriate qualification designation for their applications
and that proper product selection is at Designers’ own risk. Designers are solely responsible for compliance with all legal and regulatory
requirements in connection with such selection.
Designer will fully indemnify TI and its representatives against any damages, costs, losses, and/or liabilities arising out of Designer’s noncompliance with the terms and provisions of this Notice.
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