NJSEMI MTP25N05E Tmos iv power field effect transistor Datasheet

<$£mi-(l on
., Una.
20 STERN AVE.
SPRINGFIELD, NEW JERSEY 07081
TELEPHONE: (973) 376-2922
(212)227-6005
FAX: (973) 376-8960
U.SA
MTP25N05E
TMOS IV
risvvc;i i iv^iui i_ii«7i*b iiciiioioiui
N-Channel Enhancement-Mode Silicon Gate
This advanced "E" series of TMOS power MOSFETs is designed to withstand high
energy in the avalanche and commutation modes. These new energy efficient devices
also offer drain-to-source diodes with fast recovery times. Designed for low voltage,
high speed switching applications in power supplies, converters and PWM motor controls, these devices are particularly well suited for bridge circuits where diode speed and
commutating safe operating area are critical, and offer additional safety margin against
unexpected voltage transients.
• ipto'n"1 ^'''m-to-n'pin riiortf) ripfiqrifiri to pBp|acB
__..„,,
External Zener Transient Suppressor — Absorbs High
iV^k ^SB
Energy in the Avalanche Mode — Undamped
^•Hf""'
Inductive Switching (UIS) Energy Capability Specified
l
l
l
l
at 100'C.
'
l
|
|
|
• Commutating Safe Operating Area (CSOA) Specified for
•JH5it»'
11,9 in Halt pprt Full Rririfji, Circuits
.. ,^™**~ ..
• Source to-Drgin Diode Recovery Time Comparable to a
Discrete Fast Recovery Diode
• Diode is Characterized for Use in Bridge Circuits
TMOS POWER FETs
25 AMPERES
rDS(on) = 0,07 OHM
50 VOLTS
.jj>
TO-220AB
MAXIMUM RATINGS (Tj = 25'C unless otherwise noted)
Rating
Symbol
Value
Unit
Drain-Source Voltage
VDSS
SO
Drain-Gate Voltage (RQS - 1 Mil)
VDGR
60
Vdc
Vdc
Gate-Source Voltage — Continuous
— Non-repetitive dp § 50 us)
VGS
VGSM
±20
±40
Vdc
Vpk
ID
IDM
PD
25
80
Artc
100
0.8
Watts
-6510 150
•c
1.25
62.5
°OW
275
•C
Drain Current —> Continuous
— Pulsed
Total Power Dissipation fi TC - 25°C
Derate above 2S'C
Operating and Storage Temperature Range
Tj, T8(g
THERMAL CHARACTERISTICS
Thermal Resistance — Junction to Case
— Junction to Ambient
Maximum Lead Temperature for Soldering
Purposes, 1/8* from case for 5 seconds
R«JC
TL
LHsIgntr's Data for "Wo»t C«M" Conditions — Tno Designer's Data Sheet permits the design of most circuits entirely from tho ioformvllon pr«**it«d
SQA Limit Curves — representing boundaries on devfca charBCtenstics — era given to facilitate "worst C4»" design.
NJ Semi-Conductors reserves the right to change test conditions, parameter limits and package dimensions without
notice. Inrormat.on furnished b> NJ Semi-Conductors is believed to be both accurate and reliable at the time of going
to press. However, NJ Semi-Conductors assumes no responsibility for any errors or omissions discovered in its use
N.I Semi-Conductors encourages customers to verify that datasheets are current before placing orders
Oiinlltv
MTP2SN05E
ELECTRICAL CHARACTERISTICS (Tc - 2S'C unless otherwise noted)
Symbol
Mln
V(BR)DSS
60
—
-
10'
100
IGSSF
IGSSR
—
—
100
• nAdc
100
nAdc
VGStth)
2
1.6
4
3.5
Vdc
Static Drain-Source On-Reslstance (VQS = 10 Vdc, ID -> 16 Adc)
fDS(on)
—
0.07
Drain-Source On-Voltage (VQS » 10 V)
VDS(on)
-
2
1
Charae;erlstic
OFF CHARACTERISTICS
Drain-Source Breakdown Voltage
P/GS - 0, ID - 0.25 mA)
IDSS
Zero Gate Voltage Drain Current
(VDS - R»ted VDSS- VQS - o)
(Vos = Rated VDSS- VGS - 0, Tj = 12S°C)
Gate-Body Leakage Current, Forward (VGSF
= 20 vdc- VDS
» 0)
Gate-Body Leakage Currant, Reverse (VQSR - 20 Vdc, VDS= 01
Vdc
MA
ON CHARACTERISTICS*
Gate Threshold Voltage
(Vos - VGS. ID - zso <iA, TJ - 100=0
(ID = 25 Adc)
(ID - 12.8 Ade, Tj = 100-C)
OFS
Forward Transconductflnco (VDS = 1'7S v< 'D = '6 A)
Ohm
Vdc
9
—
mhos
DRAIN-TO-SOURCe AVALANCHE CHARACTERISTICS
Undamped Drain-to-Source Avalanche Energy See Figures 14 and 15
do - 80 A, VOQ - 26 V, TC - 25«C, Single Pulse, Non-repetitive)
(ID - 25 A, VDD = 25 V, TC - 26'C, P.W. * 200 MS, Duty Cycle « 1%)
(ID = 10 A, VDD = 26 V,TC = HWC, P.W. s 200 ia, Duty Cycle •; 1%)
mJ
WOSR
-
90
200
90
DYNAMIC CHARACTERISTICS
Input Capacitance
(VDS -
Output Capacitance
25 v' VGS
- o,
f - 1 MHz)
See Figure 16
Reverse Transfer Capacitance
C|35
-
1600
COGS
—
Crss
—
800
200
td(on)
—
_
pF
SWITCHING CHARACTERISTICS' (Tj -- 100'C)
Turn-On Delay Time
(VDD - 26 v, ID - 16 A
Rise Tims
Rgen = 15 ohms)
See Figure 9
Turn-Off Delay Time
Fall Time
Total Gale Charge
Gate-Source Charge
Gate-Drain Charge
(Vos - 0.8 Rated VDSS.
ID - Rated ID, VQS - 10 V)
See Rgures 17 and 18
tr
26
tf
—
—
35
«d(off)
ns
36
45
Ofl
28 (Typ)
30
Ofl8
14 (Typ)
—
°gd
12 (Typ)
-
VSD
1.3 (Typ)
1.6
nC
SOURCE DRAIN DIODE CHARACTERISTICS*
Forward On-Vollage
Forward Turn-On Time
(Is - 26 A
VQS - 0)
Reverse Recovery Time
'on
'rr
Vdc
Limited by stray Inductance
180lTyp)
—
3.5 (Typ)
4.8 (Typ)
-
7.8 (Typ)
—'
ns
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance
(Measured from the contact screw on tab to center of die)
(Measured from the drain lead 0.25* from package to center of die)
Ld
Internal Source Inductance
(Measured from the source lead 0.2E* from package to source bond pad.)
L.
•Pulu T»sl: Pulu Width « 300 /u. Duty Cycle < 2%.
nH
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