Keysight N7614B N7614b signal studio for power amplifier Datasheet

Keysight Technologies
N7614B Signal Studio for Power Amplifier
CFR, DPD and ET Test
Technical Overview
–– All-in-one test tool for performing power amplifier (PA) test flow with crest factor
reduction (CFR), envelope tracking (ET), and digital pre-distortion (DPD). Supports
narrow-band, wide-band, and dual-band DPD and ET.
–– User-friendly interface for parameter settings, test flow control and instrument control
–– Import user-defined I/Q waveforms, signal studio waveforms or free-of-charge pre-loaded
waveforms
–– PA measurement displays include CCDF, AM-AM, AM-PM, ACP and EVM vs. Power
–– DPD supports the open-loop model with Look-Up-Table (LUT), the close-loop model
(Volterra and Memory Polynomial), and customer defined DPD algorithms
–– Time alignment between the ET signal and the RF signal can be calibrated manually or
automatically
–– Speed improvement to apply LUT-based DPD and shaping table for ET in real-time
02 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Simplify Signal Creation for PA Test
Keysight Technologies, Inc. Signal Studio software is a flexible test suite of signal-creation and measurement tools that will reduce the time you spend on signal simulation.
With the N7614B power amplifier test software, Signal Studio’s performance-optimized
test flow—validated by Keysight—enhances the characterization and verification of your
devices. Through its application-specific user-interface you’ll create a test flow with CFR,
and/or ET, and/or DPD technologies for power amplifier test.
Modern mobile communications, such as LTE and 802.11ac place new demands on
linearity, bandwidth and power consumption in wireless components and place unprecedented battery requirements on mobile terminals or base stations. One of the most
power-hungry and non-linear components is the PA. The design of the power amplifier
must allow it to:
–– Increase spectral efficiency
–– Increase power added efficiency (PAE)
–– Reduce distortion and non-linearity
Techniques such as crest factor reduction, envelope tracking and digital pre-distortion,
can be implemented to increase PA efficiency. All of these methods are supported by the
N7614B Signal Studio for power amplifier test software.
Crest Factor Reduction Technology
CFR is a technique used to reduce the peak-to-average power ratio (PAPR) of the transmitted signals so that the power amplifier can operate more efficiently. There are two
CFR algorithms supported by N7614B.
–– Clipping and filtering
–– Peak windowing (Kaiser window)
–– Peak cancellation
Digital Pre-Distortion Technology
Power amplifiers with high PAR signals can create non-linearity problems. When a high
power signal is applied to the PA input, the PA can’t linearly amplify the signal, possibly
resulting gain saturation and distortion, and ultimately leading to signal quality degradation, such as worse ACP and EVM. DPD technology can be used to compensate for the
non-linear behavior of the PA. DPD applies “inverse” distortion to the PA input signal
to cancel the distortion generated by the PA. There are several types of DPD methods,
including memoryless and memory, which convey the memory effect on a PA. N7614B
supports the following four methods:
–– Look-up table (extract or user-defined)
–– Volterra series
–– Memory polynomial
–– Customer defined algorithms
Typical measurements
Distortion measurement
–– AM-AM
–– AM-PM
–– CCDF
Spectrum measurement
–– Channel power
–– ACP
Modulation quality
–– Raw EVM
–– Demod EVM
–– Dynamic EVM
–– EVM vs. Power
(X-Series measurement
applications required)
03 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Envelope Tracking Technology
Modern modulated signals have high PAPR. Power amplifiers that must amplify these
high PAPR signals, if using a fixed bias, must be operated at a relatively high output
power back-off, to avoid greatly distorting the signal when the envelope excursion is near
its peak. However, as the amount of back-off increases, the power amplifier becomes
less efficient. Envelope tracking (ET) is the leading solution for this issue in mobile RF
front end design. ET dynamically adjusts the DC supply voltage based on the “envelope”
of the PA input signal and delivers higher voltages only when needed, improving battery
consumption and heat dissipation in the PA. N7614B supports ET technology, which can
be applied on its own, or combined with DPD. When combined with DPD, ET can be applied and optimized before or after DPD is applied. Precise timing adjustment, down to
a nanosecond or a fraction of a nanosecond, is required to optimize ET system performance. N7614B software supports:
–– Automatic time delay adjustments (based on ACP measurement results)
–– Manual time delay adjustments (based on ACP or EVM measurement results or an
external oscilloscope)
Apply your signals in real-world testing
To use N7614B Signal Studio for Power Amplifier Test software, you must have a properly
configured PC and several properly configured instruments, as described here. Signal
Studio software complements these platforms by providing a cost-effective way to tailor
them to your test needs in design, development and production test.
Digital pre-distortion test
–– Signal generators
–– X-Series signal generator - MXG, EXG (ARB or Real-time)
–– ESG
–– PSG
–– M8190A
–– PXIe M9381A
–– Signal analyzers
–– X-Series signal analyzer - UXA, PXA, MXA, EXA with 89600 VSA software
–– PXIe VSA - M9391A/M9393A
Envelope tracking test
–– Signal generators
–– X-Series signal generator - MXG, EXG (ARB or Real-time)
–– PXIe M9381A (PA Reference Solution, support by API method)
–– Signal analyzers
–– X-Series signal analyzer - UXA, PXA, MXA, EXA with 89600 VSA software
–– PXIe VSA - M9391A/M9393A
–– Envelope signal generator
–– 33522B waveform generator
–– 33622A waveform generator
–– X-Series signal generator - MXG, EXG
04 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Crest Factor Reduction Test
CFR is a technique used to reduce the PAPR of the transmitted signals so that the power
amplifier can operate more efficiently.
N7614B Signal Studio supports three kinds of CFR algorithms:
Clipping and filtering
–– Clipping and filtering, the conventional method, includes both hard clipping and lowpass filtering
–– Clipping can cause sharp corners in a clipped signal, which leads to an unwanted outof-band emission (increased ACP)
–– To reduce the unwanted out-of-band emissions, the clipped signal will then go
through a low-pass filter to reduce the high frequency signals which correspond to the
sharp corners in the clipped signal
–– Clipping and filtering methods utilize two main parameters; target PAPR and Max
iteration
Peak windowing
–– Peak windowing aims to smooth the sharp corners which result from hard clipping
–– In the peak windowing algorithm, clipping is implemented by multiplying the original
signal in the region of the peak with a windowing function such as Kaiser, Gaussian
and Hamming
–– The peak window method’s main parameters are target PAPR, max iteration, max
window length, and beta as the Kaiser window adjustment parameter
Peak cancellation
–– Peak cancellation method reduces the PAPR of a signal by subtracting spectrally
shaped pulses from signal peaks that exceed a specified threshold
–– The peak cancellation method’s main parameters are target PAPR, max iteration, and
crest factor
Figure 1. CCDF results traces with CCDF before CFR, CCDF after CFR, and Gaussian as reference
05 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Figure 2. CCDF results before CFR
Figure 3. CCDF results after CFR with a delta EVM result, using peak windowing
You can see that the original 802.11ac waveform with 40 MHz BW and MCS9 (Figure 2)
has a peak PAPR of about 11.65 dB. With the peak windowing CFR technology (Figure
3), the PAPR is successfully reduced to 8.00 dB. However, the delta EVM deteriorated
by 2.20%. CFR technology can be used independently or it can be combined with DPD
technology to reduce the PAPR and compensate for the non-linear behavior of the PA.
06 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Digital Pre-Distortion Test
Figure 4a. Typical power amplifier DPD test configuration using N7614B Signal
Studio with an MXG X-Series signal generator and an X-Series signal analyzer.
Figure 4b. Typical wideband PA test configuration using N7614B with M8190A AWG
and PSG as signal generator and X-Series signal analyzer.
As discussed earlier, the PA is required to have higher linearity to amplify high PAPR
signals. However, due to the limitations of cost, power consumption, and physical space,
it is not easy to find higher linearity components that meet all of a particular system’s
requirements. DPD, one of the most cost-effective linearization techniques, adds an
expanding nonlinearity in the baseband that complements the compressing characteristic of the RF power amplifier (Figure 5). Ideally, the cascade of the pre-distorter and the
power amplifier becomes linear and the original input is amplified by a constant gain.
With the pre-distorter, the power amplifier can be utilized up to its saturation point while
still maintaining good linearity, thereby significantly increasing its efficiency (Figure 6).
Figure 5. DPD for a PA cascade
Figure 6. PA response with DPD
07 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
As shown in Figure 6, the DPD can be seen as an “inverse” of the PA. The DPD algorithm
needs to model the PA behavior accurately and efficiently for successful DPD deployment.
N7614B Signal Studio software supports two kinds of DPD modes:
Extract and apply
–– Three PA model types are supported: Memory polynomial, Volterra series and look-up
table
–– Users can specify the number of iterations
–– For memory polynomial and Volterra series memory model types, users can specify the
memory order and non-linear order
–– The DPD model can be exported for further verification
–– Customer’s proprietary DPD algorithm written in MATLAB
Apply only
–– For Look-Up-Table:
–– User provides the AM In (V) – AM Out (V) shaping and AM (V) - PM Out (deg)
shaping table
–– Support the LUT table edition directly with GUI
–– Support the LUT table open and save
–– For Memory polynomial and Volterra, supports coefficient file import
The required measurement bandwidth for acquiring signals will be determined by the bandwidth to be optimized. For example, to cover the channel adjacent to a 20 MHz LTE signal or
20 MHz 802.11n/ac signal, 60 MHz bandwidth must be available for capture. The PXIe VSAs,
PXA and MXA X-Series signal analyzers support a maximum 160 MHz bandwidth, which provides bandwidth for analyzing DPD-applied waveforms up to 40 MHz LTE or WLAN signals.
Wideband DPD
For LTE 3CC/5CC or WLAN 80/160 MHz signals, the DPD algorithm requires more signal
generator and signal analyzer bandwidth. We recommend a combination of the Keysight
M8190A AWG, E8267D PSG and N9040B UXA as an ideal solution for wideband DPD measurement. Through the 89600 VSA software, the oscilloscope can be connected at the receiver side and wider bandwidth can be supported. Please note that for wideband systems up
to the mmWave frequency band, calibration is usually needed. A tool for automatic calibration
is provided in Signal Studio.
Dual-band DPD and ET
For LTE non-contiguous carrier aggregation (CA) and WLAN non-contiguous 80 MHz +
80 MHz signal creation where the two band signals are separated up to several hundred MHz,
the two signals cannot be created by one signal generator. Additionally, there may be cross
modulation of two signals. In this case a dual-band DPD algorithm should be applied, which
will measure each band separately and build the DPD model of each band considering the
cross modulation.
For dual-band ET, only one signal generator is used and the ET signal is derived from the
dual-band signal according to the different possible algorithms.
Customer provided IP DPD
N7614B also supports the customer’s DPD algorithm code written in MATLAB. The customer
can modify their code in the MATLAB environment and run it directly in N7614B software. All
instrument connection and data processing will be done automatically in N7614B software.
08 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Figure 7. PA AM-AM result for 802.11n 20 MHz MCS7 using DPD memory polynomial
Figure 8. PA AM-PM result for 802.11n 20 MHz MCS7 using DPD memory polynomial
09 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Figure 9. PA ACP result for 802.11n 20 MHz MCS7 using DPD memory polynomial
Figure 10a. WLAN 802.11n 20 MHz EVM versus Power without DPD
Figure 10b. WLAN 802.11n 20 MHz EVM versus Power with DPD
10 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Envelope Tracking Test
Figure 11a. Typical PA ET/ET+DPD test configuration using N7614B Signal Studio
with an MXG X-Series signal generator and an X-Series signal analyzer
Figure 11b: PA ET/DPD test configuration using N7614B with dual MXG X-Series
signal generator and X-Series signal analyzer
Envelope tracking is an adaptive power control scheme for RF power amplifiers in which
the RF PA power supply (VCC_PA) is dynamically adjusted to match the envelope of the
transmit signal.
Envelope tracking provides two key system benefits:
–– Maximum RF PA efficiency for longer battery life and usage time
–– Maximum RF PA heat reduction
Oversampling
The envelope is generated from the IQ sample’s absolute magnitude, typically with 3x
to 6x oversampling applied in order to create a wider bandwidth waveform. The basic
sample rate of a 20 MHz LTE signal is 30.72 MHz and the envelope’s sample rate will be
92.16 MHz for 3x oversampling and 184.32 MHz for 6x oversampling. A high sample rate
waveform generator is required to support these high sample rates.
Shaping table
Raw envelope data generated from the IQ signal will go through the shaping table before
being applied to the ET power supply (ETPS). Typically, the shaping table has a so-called
“de-troughing” function to avoid having the envelope voltage drop down to 0 V. Shaping tables are usually based on maximum efficiency operation. Another commonly used
table is called Iso-Gain, in which the instantaneous supply voltage is chosen to achieve a
particular constant PA gain.
11 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Timing alignment
ETPS dynamically adjusts the power supply voltage to the PA. As defined in the MIPI™
Alliance’s eTrak standard, most ETPS have differential inputs and therefore, the envelope
waveform generator must have differential output. ETPS output is applied to the PA’s
supply line. This voltage has to be applied to the PA with precise timing relative to the
input RF signal. Typically the timing alignment between RF and envelope has to be less
than 1 ns. Rough timing adjustments between RF and envelope can be achieved with an
oscilloscope before connecting to the ETPA and ETPS. However, due to internal delays
in the ETPS and the RF PA, the final tuning has to be done with the ETPA output using
parameters such as EVM or ACLR. Precise timing adjustments, down to a fraction of a
nanosecond, may be required to optimize ET system performance.
Figure 12. Envelope tracking system simplified block diagram
N7614B Signal Studio Envelope Tracking for Power Amplifier test provides:
Envelope tracking key features
–– Envelope generator can use 33522B/33622A AWG or a second MXG or EXG
–– Envelope calculation can be from non-predistorted I/Q signal or pre-distorted I/Q
signal
–– Envelope waveform can be imported from user-defined waveform
–– Oversampling ratio for envelope can be user-defined
–– Shaping input can be normalized I/Q amplitude or absolute RF output voltage
–– Envelope waveform can be exported
–– ETPS characteristic parameters can be user-defined
Shaping table
–– Users provide the RF voltage to envelope voltage shaping table
–– Supports the ET shaping table edition directly in the GUI
–– Supports the ET shaping table open and save function
–– Supports shaping table in real-time with MXG-B or EXG as envelope generator
Timing alignment
–– Supports automatic alignment based on ACP measurement results
–– Delay step can be settable as low as 1 ps
–– Supports manual alignment based on ACP, EVM or time domain
12 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Figure 13. ET ACP measurement when time delay is not adequately adjusted
Figure 14. ET ACP measurement after automatic alignment
Figure 15. ET measurement in time domain when time delay is not adequately
adjusted
Figure 16. ET measurement in time domain after time alignment
Figures 13 and 15 illustrate what happens when the time delay between the PA RF input
and the Vcc input is not adjusted adequately. The ACP measurement results will show
worse, unbalanced results for the lower and upper channels. In time domain, the results
may indicate that the two signals are not aligned. Automatic alignment (Figures 14 and
16) is based on an ACP measurement which is fast and convenient, but you can perform
manual alignment if needed based on ACP, EVM, or time domain measurements.
13 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Combined Use of ET and DPD
Figure 17. ET can be chosen from a non-predistorted waveform or pre-distorted waveform
When applying DPD together with ET, in order to linearize AM-PM characteristics, the
envelope is typically generated based on pre-distorted I/Q waveforms. This means
that for each DPD closed-loop iteration, both the pre-distorted I/Q waveform and the
envelope waveforms need to be re-generated based on the updated DPD model. In order
to understand if performance improvements are due to ET or DPD, ET can be applied
and optimized before DPD, and then a DPD closed-loop iteration can be performed to
compensate for amplitude and phase non-linearity.
N7614B Signal Studio software has integrated GUI support for both ET and DPD. It can
generate an envelope from a pre-distorted waveform or a non-predistorted waveform.
If the envelope source is chosen from a non-predistorted signal, the envelope will be
calculated before DPD is applied. If the envelope source is chosen from a pre-distorted
signal, DPD will be extracted and applied first, after which the envelope is calculated
based on a pre-distorted waveform. The process will be repeated for a specified number
of iterations.
14 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Measurement
Figure 18 shows an example of 5 MHz LTE uplink with QPSK modulation. The original
waveform has an ACP result of –36 dBc and the AM-AM trace shows that the PA 1 dB
compression point happens at +1 dBm PA input. After ET technology is applied, you can
see that the AM-AM and AM-PM traces are linearized and ACP is improved from –36 dBc
to –41 dBc. When DPD technology is applied, together with ET, the AM-AM and AM-PM
curves are further linearized and ACP results will be further improved from –41 dBc to
–64 dBc.
ET only
Figure 18. These graphs show the effect of ET only and ET with DPD with AM-AM, AM-PM and ACP results
ET and DPD
15 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Feature Summary
Power Amplifier Test
Signal Studio
General
Waveform
Power amplifier
Crest factor
reduction
Digital
pre-distortion
Envelope
tracking
Parameter settings
–– Hint for each module
–– Instrument connection by LAN or GPIB
–– Instrument key parameter settings on N7614B GUI
–– Preloaded, Signal Studio or user-defined
–– User defined types:
–– CSV or text files
–– Big Endian 16 bits
–– MATLAB
–– Set the OSR (oversampling rate for waveform)
–– Burst formation mask setting for WLAN
–– Marker source selection
–– None
–– Waveform start
–– From the input WFM file
–– PA enable mask
–– User defined bits
–– Set PA related parameters like loss In, loss Out, PA gain
–– Choose the power control
–– PA input
–– PA output
–– Power sweep setting for dynamic EVM
–– Support two CFR algorithms
–– Peak windowing
–– Clipping and filtering
–– Peak cancellation
–– Support two method:
–– Extract and apply
–– Apply I/Q LUT
–– Extract and apply support four kinds of PA modeling types:
–– Memory polynomial
–– Volterra series
–– Look-up table (memoryless model)
–– User-defined MATLAB script
–– Apply user-defined DPD models
–– Wideband DPD support using M8190A AWG as baseband
generator and E8267D as up-converter or M8190A DUC
mode
–– Dual-band DPD
–– Envelope calculation support three kinds of input:
–– From non-predistorted signal
–– From pre-distorted signal
–– User defined
–– OSR (oversampling rate) for envelope can be set with
default 3x OSR
–– Shaping input support:
–– Normalized I/Q amplitude
–– Absolute RF output voltage
–– Shaping table
–– Open/save
–– Add/remove
–– Edition on GUI
–– Timing alignment:
–– Automatically
–– Manually
–– Shaping table can be applied in real-time if using the MXGB N5182B or EXG N5172B as envelope generator
Outputs or measurements
–– Hint for each measurement
–– Log information for the running results
–– CCDF table (Before CFR)
–– CCDF table (After CFR)
–– Delta EVM
–– CCDF trace (before CFR, after CFR and Gaussian as reference)
–– Export pre-distorted waveform
–– Export DPD model to CSV file
–– AM-AM trace
–– AM-PM trace
–– Delta EVM results (with or without DPD)
–– ACP trace and result metrics
–– EVM vs. Power (Raw EVM, Dynamic EVM, WLAN EVM or LTE
EVM)
–– AM-AM trace
–– AM-PM trace
–– Delta EVM results
–– ACP trace and result metrics
–– EVM vs. Power (Raw EVM, Dynamic EVM, WLAN EVM or LTE
EVM)
–– Dual-band ET
16 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Ordering Information
Software licensing and configuration
Signal Studio offers flexible licensing options, including:
–– Fixed license: Allows you to create unlimited I/Q waveforms with a specific Signal
Studio product and use them with a single, specific platform.
–– Transportable/floating license: Allows you to create unlimited I/Q waveforms with
a specific Signal Studio product and use them with a single platform (or PC in some
cases) at a time. You may transfer the license from one product to another.
The table below lists fixed, perpetual licenses only; additional license types may be available. For detailed licensing information and configuration assistance, please refer to the
Licensing Options web page at www.keysight.com/find/SignalStudio_licensing
N7614B signal studio for power amplifier test
Model-Option
Description
Connectivity
N7614B-1FP
Connect to E4438C ESG signal generator
N7614B-3FP
Connect to N5182B/72B MXG/EXG signal generator
N7614B-9FP
Connect to M9381A PXIe vector signal generator
N7614B-AFP 1
Connect to M8190A arbitrary waveform generator
Capability
N7614B-EFP
Envelope Tracking
N7614B-FFP 2
Digital Pre-Distortion
N7614B-GFP
Real-time envelope tracking and digital pre-distortion
N7614B-HFP
1.
2.
3.
4.
5.
3, 4
Wideband DPD with calibration 5
M8190A support using PSG as up-converter or DUC mode.
For dual-band DPD, both of the signal generators need FFP license.
For real-time DPD, the MXG or EXG RF signal generator requires Option 660.
For real-time ET, both the RF signal generator and envelope generator require the GFP license.
Option HFP requires option FFP.
Try Before You Buy!
Free 30-day trials of Signal Studio
software provide unrestricted use of
the features and functions, including signal generation, with your
compatible platform. Redeem a trial
license online at
www.keysight.com/find/free_trials
Hardware configurations
To learn more about compatible
hardware and required configurations,
please visit: www.keysight.com/find/
SignalStudio_platforms
PC requirements
A PC is required to run Signal Studio.
www.keysight.com/find/
SignalStudio_pc
17 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Additional Information
Websites
Access the comprehensive online documentation, which includes the complete
software HELP, download the software, and request a trial license.
www.keysight.com/find/n7614b
www.keysight.com/find/SignalStudio
Keysight’s ET and DPD test solutions
www.keysight.com/find/ET
www.keysight.com/find/DPD
Keysight’s RF PA/FEM characterization and test reference solution
with ET and DPD
www.keysight.com/find/solution-padvt
Literature
Simulation and Measurement-based X-parameter Models for Power Amplifiers with
Envelope Tracking, 5991-2733EN
Envelope Tracking and Digital Pre-Distortion Power Amplifier Testing for LTE User Terminal Components, 5991-4069EN
Signal Studio Software, Brochure, 5989-6448EN
Signal Studio for LTE/LTE-Advanced FDD and TDD, Technical Overview, 5990-6086EN
Signal Studio for WLAN 802.11a/b/g/n/ac, Technical Overview, 5990-9008EN
RF PA/FEM Characterization & Test, Reference Solution, Brochure,
5992-0071EN
RF PA/FEM Characterization & Test, Reference Solution, Configuration Guide,
5992-0072EN
18 | Keysight | N7614B Signal Studio for Power Amplifier Test - Technical Overview
Evolving
Our unique combination of hardware, software, support, and people can help
you reach your next breakthrough. We are unlocking the future of technology.
From Hewlett-Packard to Agilent to Keysight
myKeysight
www.keysight.com/find/mykeysight
A personalized view into the information most relevant to you.
Keysight Infoline
www.keysight.com/find/Infoline
Keysight’s insight to best in class information management. Free access to
your Keysight equipment company reports and e-library.
KEYSIGHT
SERVICES
Keysight Services
www.keysight.com/find/services
Our deep offering in design, test, and measurement services deploys an
industry-leading array of people, processes, and tools. The result? We help
you implement new technologies and engineer improved processes that
lower costs.
Three-Year Warranty
www.keysight.com/find/ThreeYearWarranty
Keysight’s committed to superior product quality and lower total cost
of ownership. Keysight is the only test and measurement company with
three-year warranty standard on all instruments, worldwide. And, we provide
a one-year warranty on many accessories, calibration devices, systems and
custom products.
For more information on Keysight
Technologies’ products, applications or
services, please contact your local Keysight
office. The complete list is available at:
www.keysight.com/find/contactus
Americas
Canada
Brazil
Mexico
United States
(877) 894 4414
55 11 3351 7010
001 800 254 2440
(800) 829 4444
Asia Pacific
Australia
China
Hong Kong
India
Japan
Korea
Malaysia
Singapore
Taiwan
Other AP Countries
1 800 629 485
800 810 0189
800 938 693
1 800 11 2626
0120 (421) 345
080 769 0800
1 800 888 848
1 800 375 8100
0800 047 866
(65) 6375 8100
Europe & Middle East
Austria
Belgium
Finland
France
Germany
Ireland
Israel
Italy
Luxembourg
Netherlands
Russia
Spain
Sweden
Switzerland
United Kingdom
0800 001122
0800 58580
0800 523252
0805 980333
0800 6270999
1800 832700
1 809 343051
800 599100
+32 800 58580
0800 0233200
8800 5009286
800 000154
0200 882255
0800 805353
Opt. 1 (DE)
Opt. 2 (FR)
Opt. 3 (IT)
0800 0260637
Keysight Assurance Plans
www.keysight.com/find/AssurancePlans
Up to ten years of protection and no budgetary surprises to ensure your
instruments are operating to specification, so you can rely on accurate
measurements.
For other unlisted countries:
www.keysight.com/find/contactus
Keysight Channel Partners
www.keysight.com/find/channelpartners
Get the best of both worlds: Keysight’s measurement expertise and product
breadth, combined with channel partner convenience.
DEKRA Certified
www.keysight.com/find/N7614B
(BP-06-08-16)
ISO9001 Quality Management System
www.keysight.com/go/quality
Keysight Technologies, Inc.
DEKRA Certified ISO 9001:2015
Quality Management System
This information is subject to change without notice.
© Keysight Technologies, 2014 - 2016
Published in USA, August 12, 2016
5991-4959EN
www.keysight.com
Similar pages