LIGITEK LWK3333-OD Round type led lamp Datasheet

LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
ROUND TYPE LED LAMPS
Pb
Lead-Free Parts
LWK3333-OD
DATA SHEET
DOC. NO :
REV.
:
DATE
:
QW0905-LWK3333-OD
A
18 - Apr. - 2006
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LWK3333-OD
Page 1/6
Package Dimensions
5.0
5.9
7.6
8.6
1.5MAX
25.0MIN
□0.5
TYP
1.0MIN
2.54TYP
+
-
Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted.
2.Specifications are subject to change without notice.
Directivity Radiation
0°
-30°
30°
-60°
100% 75% 50%
60°
25%
0
25% 50% 75% 100%
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PART NO. LWK3333-OD
Absolute Maximum Ratings at Ta=25 ℃
Ratings
Symbol
Parameter
UNIT
WK
Forward Current
IF
30
mA
Peak Forward Current
Duty 1/10@10KHz
IFP
100
mA
Power Dissipation
PD
120
mW
Ir
50
μA
Electrostatic Discharge( * )
ESD
150
V
Operating Temperature
Topr
-20~ +80
℃
Storage Temperature
Tstg
-30~ +100
℃
Reverse Current @5V
Static Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic
* glove
is recommended when handing these LED. All devices, equipment and machinery must be properly
grounded.
Typical Electrical & Optical Characteristics (Ta=25 ℃)
PART NO
COLOR
MATERIAL
LWK3333-OD InGaN/GaN
Chromaticity
Coordinates
(Typ.)
Luminous
Forward
Viewing
voltage
intensity
angle
@20mA(V) @20mA(mcd) 2θ 1/2
(deg)
Typ. Max. Min. Typ.
Emitted
Lens
X
Y
White
Water Clear
0.28
0.28
3.5
Note : 1.The forward voltage data did not including ± 0.1V testing tolerance.
2. The luminous intensity data did not including ±15% testing tolerance.
4.0 7700 14000
16
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PART NO. LWK3333-OD
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. Chromaticity Coordinates Specifications for Bin Grading
BIN
A1
A2
A3
A4
A5
X
Y
0.21
0.190
0.21
0.150
0.22
0.165
0.22
0.205
0.22
0.205
0.22
0.165
0.23
0.180
0.23
X
Y
X
Y
0.26
0.265
0.31
0.340
0.26
0.225
0.31
0.300
0.27
0.240
0.27
0.280
0.32
0.315
0.32
0.355
0.27
0.280
0.32
0.355
0.27
0.240
0.28
0.255
0.32
0.315
0.33
0.330
0.220
0.28
0.295
0.33
0.370
0.23
0.220
0.23
0.180
0.28
0.295
0.33
0.370
0.28
0.255
0.33
0.330
0.24
0.195
0.29
0.270
0.34
0.345
0.24
0.24
0.235
0.29
0.310
0.34
0.385
0.235
0.29
0.310
0.34
0.385
0.24
0.195
0.29
0.270
0.34
0.345
0.25
0.210
0.25
0.250
0.30
0.285
0.35
0.360
0.30
0.325
0.35
0.400
0.25
0.250
0.30
0.325
0.25
0.210
0.26
0.225
0.30
0.285
0.31
0.300
0.26
0.265
0.31
0.340
. CIE Chromaticity Diagram
BIN
B1
B2
B3
B4
B5
BIN
C1
C2
C3
C4
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PART NO. LWK3333-OD
Typical Electro-Optical Characteristics Curve
WK CHIP
Fig.1 Forward current vs. Forward Voltage
Fig.2 Relative Intensity vs. Forward Current
3.0
Relative Intensity
Normalize @20mA
Forward Current(mA)
1000
100
10
1
01
2.5
2.0
1.5
1.0
0.5
0.0
1.0
3.0
2.0
4.0
5.0
1
10
Fig.4 Relative Intensity vs. Temperature
1.2
Relative Intensity@20mA
Normalize @25℃
Forward Voltage@20mA
Normalize @25℃
Fig.3 Forward Voltage vs. Temperature
1.1
1.0
0.9
0.8
-20
0
20
40
60
80
100
SPECTRAL RADIANCE
100
Intensity
80
60
40
20
0
600
Wavelength (nm)
700
2.5
2.0
1.5
1.0
0.5
0.0
-20
0
20
40
60
80
Ambient Temperature( ℃)
Fig.5 Luminous Spectrum(Ta=25 ℃)
500
3.0
-40
Ambient Temperature( ℃)
400
1000
Forward Current(mA)
Forward Voltage(V)
-40
100
800
100
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PART NO. LWK3333-OD
Page 5/6
Soldering Condition(Pb-Free)
1.Iron:
Soldering Iron:30W Max
Temperature 350° C Max
Soldering Time:3 Seconds Max(One Time)
Distance:2mm Min(From solder joint to body)
2.Wave Soldering Profile
Dip Soldering
Preheat: 120° C Max
Preheat time: 60seconds Max
Ramp-up
2°C/sec(max)
Ramp-Down:-5°C/sec(max)
Solder Bath:260° C Max
Dipping Time:3 seconds Max
Distance:2mm Min(From solder joint to body)
Temp(° C)
260° C3sec Max
260°
5° /sec
max
120°
25°
0°
2° /sec
max
0
Preheat
60 Seconds Max
50
100
150
Time(sec)
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PART NO. LWK3333-OD
Reliability Test:
Test Item
Test Condition
Description
Reference
Standard
Operating Life Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
High Temperature
Storage Test
1.Ta=105 ℃±5 ℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
MIL-STD-883:1008
JIS C 7021: B-10
Low Temperature
Storage Test
1.Ta=-40 ℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
High Temperature
High Humidity Test
1.Ta=65 ℃±5℃
2.RH=90 %~95 %
3.t=240hrs ±2hrs
The purpose of this test is the resistance
of the device under tropical for hours.
1.Ta=105 ℃±5℃&-40 ℃±5℃
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
Solder Resistance
Test
1.T.Sol=260 ℃±5℃
2.Dwell time= 10 ±1sec.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
Solderability Test
1.T.Sol=230 ℃±5℃
2.Dwell time=5 ±1sec
This test intended to see soldering well
performed or not.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
Thermal Shock Test
JIS C 7021: B-12
MIL-STD-202:103B
JIS C 7021: B-11
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