Panasonic MN103SFD3R Transfer mode: word transfer. burst transfer. intermittent transfer Datasheet

MN103SD3 Series
MN103SD3P
MN103SFD3R
Mask ROM
FLASH
ROM (byte)
640K
1024K
RAM (byte)
40K
64K
Type
Internal ROM type
LQFP100-P-1414
Package (Lead-free)
Minimum Instruction
Execution Time
16.7 ns (at 2.7 V to 3.6 V, 60 MHz)
 Interrupts
RESET. IRQ × 8. NMI. Timer × 32. I2C × 3. SIF × 16. DMA × 12. WDT. A/D. Time base timer × 2. System error. Key input. Remote
control × 4
 Timer Counter
8-bit timer A × 10
Reload-down count. Cascade connection possible (usable as a 16-bit to 32-bit timer)
8-bit timer B × 3
Interval timer. Event count. Square-wave output. Simple pulse width measurement. PWM output
16-bit timer × 6
Up-down count. Input capture. PWM output. Compare/capture register 2 channnels
Time base timer × 1
Watchdog timer × 1
 Serial interface
UART/Synchronous/Multi-master I2C interface selective × 3
UART/Synchronous interface selective × 5
 Remote Contorol Interface
Remote control reception: Correspondence with AEHA (Association for Electric Home Appliances) format. Queued reception by low
speed clock
 DMA controller
Number of channels: 4 channels
Unit of transfer: 8/16/32 bits
Maximum transfer cycles: 65535
Starting factor: External interrupt. Timer. Serial transmission/reception. A/D conversion finish. I2C transmission/reception. Software.
Remote control data reception
Transfer method: 2-bus cycle transfer
Adressing modes: Fixed. Increment. Decrement
Transfer mode: Word transfer. Burst transfer. Intermittent transfer
 I/O Pins
I/O
Input
81 : Common use
1 : Common use
 A/D converter
10-bit × 8 channels
 ROM Correction
8 channels
 Electrical Charactreistics (A/D converter characteristics)
Parameter
Symbol
Condition
Resolution
Non-linear error
Differential non-linearity error
VDD33 = VREFH = 3.3 V. VSS = 0 V
min
Limit
typ
max
10
Unit
Bits
±4
LSB
±4
LSB
MAF00027FEM
MN103SD3P, MN103SFD3R
 Pin Assignment
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
VDD18
P42, SBT4, SCL4, IRQ7, NMIRQ
P41, SBO4, SDA4, IRQ6
P40, SBI4, TM13IOB, D15
P87, TM13IOA, D14
P86, TM12IOB, D13
P85, TM12IOA, D12
P84, TM11IOB, D11
P83, TM11IOA, D10
P82, TM10IOB, D9
P81, TM10IOA, D8
P80
VSS
P77
VDD33
P75, D7
P74, D6
P73, D5
P72, D4
P71, D3
P70, D2
P67, KEY7, D1
P66, KEY6, D0
P65, KEY5, A0
P64, KEY4, A1
LQFP100-P-1414
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
P00, SBO0A, NWE0
P01, SBI0A, NWE1
P02, SBT0A, NRE
P03, SBO2A, SDA2A, SBT5A
P04, SBI2A, SBI5A
P05, SBT2A, SCL2A, SBO5A
P06, IRQ5B, TM20IOB
P10, TM4IO, (OCD_SDA)
P11, TM5IO, (OCD_SCL)
P12, TM6IO, SYSCLK, TM22IOB
MMOD
OSCO
OSCI
VSS
XI, P07
XO
VDD33
VDD18
NRST
LON
P14, SBT1B, TM14IOA, SBT6A
P15, SBO1B, TM14IOB, SBI6A
P16, SBI1B, TM7IO, SBO6A
OCDMOD
P20, IRQ0A, DK, (VPP)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
P90, SBO0B
P91, SBI0B, SBO5C
P92, SBT0B
P93, SBO3B, SDA3B
P94, SBI3B, SBO6C
P95, SBT3B, SCL3B, SBO7C
PD0, SBO2B, SDA2B
PD1, SBI2B
PD2, SBT2B, SCL2B
PD3, IRQ0B
PD4, IRQ1B
PD5, IRQ2B
PD6, IRQ3B, TM15IOA
VDD33
PD7, IRQ4B, TM15IOB
VSS
PA0, AN0, SBO7A
PA1, AN1, SBI7A
PA2, AN2, SBT7A
PA3, AN3, TM22IOA
PA4, AN4, TM21BKA
PA5, AN5, TM21GCPA
PA6, AN6, TM21IOA
PA7, AN7, TM20IOA
VREFH
MAF00027FEM
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
P63, KEY3, A2
P62, KEY2, A3
P61, KEY1, A4
P60, KEY0, A5
P57, KEY15, A6
P56, KEY14, A7
P55, KEY13, A8
P54, KEY12, A9
P53, KEY11, A10
P52, KEY10, A11
P51, KEY9, A12
VSS
P50, KEY8, A13
VDD18
P35, SBT3A, SCL3A, A14
P34, SBI3A, A15
P33, SBO3A, SDA3A, A16
P32, SBT1A, A17
P31, SBI1A, A18
P30, SBO1A, A19
P25, IRQ5A, A20
P24, IRQ4A, NSC3
P23, IRQ3A, NSC2
P22, IRQ2A, NSC1
P21, IRQ1A, RMIN, NSC0
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semiconductors described in this book
(1) If any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and
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Consult our sales staff in advance for information on the following applications:
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systems and safety devices) in which exceptional quality and reliability are required, or if the failure or malfunction of the products may directly jeopardize life or harm the human body.
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defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure
mode, possible to occur to semiconductor products. Measures on the systems such as redundant design, arresting the spread of fire
or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products.
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