ALSC AS7C34098A-8TIN Fully static operation Datasheet


AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
REVISION HISTORY
Revision
Rev. 1.0
Rev. 1.1
Rev. 1.2
Description
Initial Issue
“CE# ≧VCC - 0.2V” revised as ”CE# ≦0.2V” for TEST CONDITION
of Average Operating Power supply Current
Icc1 on page3
Revised VIH(max)/VIL(min) in
Issue Date
Jul.12.2012
Jul.19.2012
May.7.2013
DC ELECTRICAL CHARACTERISTICS
Rev. 1.3
Rev. 1.4
Added in tBA/tBHZ*/tBLZ*
in AC ELECTRICAL CHARACTERISTICS
Added WRITE CYCLE 3 in TIMING WAVEFORMS
1. Revise “TEST CONDITION” for VOH, VOL on page 5
IOH = -8mA revised as -4mA
IOL =4mA revised as 8mA
2. Revise VIH(max) & VIL(min) note on page 5
VIH(max) = VCC + 2.0V for pulse width less than 6ns.
VIL(min) = VSS - 2.0V for pulse width less than 6ns.
Revised the address pin sequence of TSOP-II pin configuration on
page 3 in order to be compatible with industry convention. (No
function specifications and applications have been changed and all
the characteristics are kept all the same as Rev 1.3 )
Added tBW in AC ELECTRICAL CHARACTERISTICS
Revised WRITE CYCLE 1,2 in TIMING WAVEFORMS
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Jun.04.2013
Sep.23.2013

AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
FEATURES
GENERAL DESCRIPTION
 Fast access time : 8ns
 Low power consumption:
Operating current:
50mA(TYP.)
Standby current:
2mA(TYP.)
 Single 3.3V power supply
 All inputs and outputs TTL compatible
 Fully static operation
 Industrial temperature -40°~85℃
 Tri-state output
 Data byte control : LB# (DQ0 ~ DQ7)
UB# (DQ8 ~ DQ15)
 Data retention voltage : 1.5V (MIN.)
 Greenpackage/ROHS compliant (N)
 Package : 44-pin 400 mil TSOP-II
The AS7C34098A is a 4,194,304-bit high speed
CMOS static random access memory organized as
262144 words by 16 bits. It is fabricated using very
high performance, high reliability CMOS technology.
Its standby current is stable within the range of
operating temperature.
The AS7C34098A operates from a single power
supply of 3.3V and all inputs and outputs are fully
TTL compatible
PRODUCT FAMILY
Product
Family
AS7C34098A(I)
Operating
Temperature
Vcc Range
Speed
-40°~85℃
3.0 ~ 3.6V
8ns
Power Dissipation
Standby(ISB1,TYP.) Operating(ICC1,TYP.)
2mA
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50mA

AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
PIN DESCRIPTION
FUNCTIONAL BLOCK DIAGRAM
Vcc
Vss
A0-A17
DQ0-DQ7
Lower Byte
DQ8-DQ15
Upper Byte
CE#
WE#
OE#
LB#
UB#
DECODER
I/O DATA
CIRCUIT
256Kx16
MEMORY ARRAY
COLUMN I/O
SYMBOL
DESCRIPTION
A0 - A17
Address Inputs
DQ0 – D15
Data Inputs/Outputs
CE#
Chip Enable Inputs
WE#
Write Enable Input
OE#
Output Enable Input
LB#
Lower Byte Control
UB#
Upper Byte Control
VCC
Power Supply
VSS
Ground
NC
No Connection
CONTROL
CIRCUIT
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
AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
PIN CONFIGURATION
1
44
A17
A1
2
43
A16
A2
3
42
A15
A3
4
41
OE#
A4
5
40
UB#
CE#
6
39
LB#
DQ0
7
38
DQ15
DQ1
8
37
DQ14
DQ2
9
36
DQ13
DQ3
10
35
DQ12
Vcc
11
34
Vss
Vss
12
33
Vcc
DQ4
13
32
DQ11
DQ5
14
31
DQ10
DQ6
15
30
DQ9
DQ7
16
29
DQ8
WE#
17
28
NC
A5
18
27
A14
A6
19
26
A13
A7
20
25
A12
A8
21
24
A11
A9
22
23
A10
AS7C34098A
XXXXX
XXXXX
A0
TSOP II(Top View)
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
AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
ABSOLUTE MAXIMUM RATINGS*
PARAMETER
Voltage on VCC relative to VSS
Voltage on any other pin relative to VSS
Operating Temperature
Storage Temperature
Power Dissipation
DC Output Current
SYMBOL
VT1
VT2
RATING
-0.5 to 4.6
-0.5 to VCC+0.5
UNIT
V
V
TA
-40 to 85(I grade)
℃
TSTG
PD
IOUT
-65 to 150
1
50
℃
W
mA
*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability.
TRUTH TABLE
MODE
Standby
Output Disable
Read
Write
Note:
CE#
OE#
H
L
L
L
L
L
L
L
L
X
H
X
L
L
L
X
X
X
WE# LB#
X
H
X
H
H
H
L
L
L
X
X
H
L
H
L
L
H
L
UB#
X
X
H
H
L
L
H
L
L
I/O OPERATION
DQ0-DQ7
DQ8-DQ15
High – Z
High – Z
High – Z
High – Z
High – Z
High – Z
DOUT
High – Z
High – Z
DOUT
DOUT
DOUT
DIN
High – Z
High – Z
DIN
DIN
DIN
SUPPLY CURRENT
H = VIH, L = VIL, X = Don't care
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ISB,ISB1
ICC,ICC1
ICC,ICC1
ICC,ICC1

AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
DC ELECTRICAL CHARACTERISTICS
SYMBOL
TEST CONDITION
PARAMETER
Supply Voltage
VCC
-8
*1
Input High Voltage
VIH
*2
Input Low Voltage
VIL
Input Leakage Current
ILI
VCC ≧ VIN ≧ VSS
Output Leakage
VCC ≧ VOUT ≧ VSS,
ILO
Current
Output Disabled
Output High Voltage
VOH IOH = -4mA
Output Low Voltage
VOL
IOL = 8mA
Cycle time = Min.
ICC
CE# = VIL, II/O = 0mA,
-8
Others at VIL or VIH
Average Operating
Power supply Current
CE# ≦0.2,
ICC1
Others at 0.2V or Vcc-0.2V -8
II/O = 0mA;f=max
ISB
CE# =VIH, Others at VIL or VIH
Standby Power
CE# ≧VCC - 0.2V,
Supply Current
ISB1
Others at 0.2V or VCC - 0.2V
MIN.
3.0
2.2
- 0.3
-1
TYP.
3.3
-
*4
MAX.
3.6
VCC+0.3
0.8
1
UNIT
V
V
V
µA
-1
-
1
µA
2.4
-
-
0.4
V
V
-
65
80
mA
-
50
60
mA
-
-
30
mA
-
2
10
mA
Notes:
1. VIH(max) = VCC + 2.0V for pulse width less than 6ns.
2. VIL(min) = VSS - 2.0V for pulse width less than 6ns.
3. Over/Undershoot specifications are characterized on engineering evaluation stage, not for mass production test.
4. Typical values are included for reference only and are not guaranteed or tested.
Typical valued are measured at VCC = VCC(TYP.) and TA = 25℃
CAPACITANCE (TA = 25℃, f = 1.0MHz)
PARAMETER
Input Capacitance
Input/Output Capacitance
SYMBOL
CIN
CI/O
MIN.
-
MAX
8
10
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Speed
Input Pulse Levels
Input Rise and Fall Times
Input and Output Timing Reference Levels
Output Load
8ns
0.2V to VCC - 0.2V
3ns
1.5V
CL = 30pF + 1TTL, IOH/IOL = -4mA/8mA
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UNIT
pF
pF

AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
AC ELECTRICAL CHARACTERISTICS
(1) READ CYCLE
PARAMETER
Read Cycle Time
Address Access Time
Chip Enable Access Time
Output Enable Access Time
Chip Enable to Output in Low-Z
Output Enable to Output in Low-Z
Chip Disable to Output in High-Z
Output Disable to Output in High-Z
Output Hold from Address Change
LB#, UB# Access Time
LB#, UB# to High-Z Output
LB#, UB# to Low-Z Output
SYM.
tRC
tAA
tACE
tOE
tCLZ*
tOLZ*
tCHZ*
tOHZ*
tOH
tBA
tBHZ*
tBLZ*
AS7C34098A-8
MIN.
MAX.
8
8
8
4.5
2
0
3
3
2
4.5
3
0
-
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
(2) WRITE CYCLE
PARAMETER
Write Cycle Time
Address Valid to End of Write
Chip Enable to End of Write
Address Set-up Time
Write Pulse Width
Write Recovery Time
Data to Write Time Overlap
Data Hold from End of Write Time
Output Active from End of Write
Write to Output in High-Z
LB#, UB# Valid to End of Write
SYM.
tWC
tAW
tCW
tAS
tWP
tWR
tDW
tDH
tOW *
tWHZ*
tBW
AS7C34098A-8
MIN.
MAX.
8
6.5
6.5
0
6.5
0
5
0
2
3
6.5
-
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
*These parameters are guaranteed by device characterization, but not production tested.
Alliance Memory, Inc reserves the rights to change the specifications and products without notice.
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Tel: +1 650 610 6800 Fax: +1 650 620 9211
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
AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
TIMING WAVEFORMS
READ CYCLE 1 (Address Controlled) (1,2)
tRC
Address
tAA
Dout
tOH
Previous Data Valid
Data Valid
READ CYCLE 2 (CE# and OE# Controlled) (1,3,4,5)
tRC
Address
tAA
CE#
tACE
OE#
tOE
tOH
tOHZ
tCHZ
tOLZ
tCLZ
Dout
High-Z
Data Valid
High-Z
Notes :
1.WE# is high for read cycle.
2.Device is continuously selected OE# = low, CE# = low.
3.Address must be valid prior to or coincident with CE# = low,; otherwise tAA is the limiting parameter.
4.tCLZ, tOLZ, tCHZ and tOHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state.
5.At any given temperature and voltage condition, tCHZ is less than tCLZ , tOHZ is less than tOLZ.
Alliance Memory, Inc reserves the rights to change the specifications and products without notice.
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Tel: +1 650 610 6800 Fax: +1 650 620 9211
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
AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
WRITE CYCLE 1 (WE# Controlled) (1,2,3,5,6)
tWC
Address
tAW
CE#
tCW
tBW
LB#,UB#
tAS
tWP
tWR
WE#
tWHZ
Dout
TOW
High-Z
(4)
tDW
Din
(4)
tDH
Data Valid
WRITE CYCLE 2 (CE# Controlled) (1,2,5,6)
tWC
Address
tAW
CE#
tAS
tWR
tCW
tBW
LB#,UB#
tWP
WE#
tWHZ
Dout
High-Z
(4)
tDW
Din
tDH
Data Valid
Alliance Memory, Inc reserves the rights to change the specifications and products without notice.
551 Taylor Way, Suite #1, San Carlos, CA 94070, USA
Tel: +1 650 610 6800 Fax: +1 650 620 9211
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
AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
WRITE CYCLE 3 (LB#,UB# Controlled) (1,2,5,6)
tWC
Address
tAW
tWR
CE#
tAS
tCW
tBW
LB#,UB#
tWP
WE#
tWHZ
Dout
High-Z
(4)
tDW
Din
tDH
Data Valid
Notes :
1.WE#,CE#, LB#, UB# must be high during all address transitions.
2.A write occurs during the overlap of a low CE#, low WE#, LB# or UB# = low.
3.During a WE# controlled write cycle with OE# low, tWP must be greater than tWHZ + tDW to allow the drivers to turn off and data to be
placed on the bus.
4.During this period, I/O pins are in the output state, and input signals must not be applied.
5.If the CE#, LB#, UB# low transition occurs simultaneously with or after WE# low transition, the outputs remain in a high impedance
state.
6.tOW and tWHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state.
Alliance Memory, Inc reserves the rights to change the specifications and products without notice.
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Tel: +1 650 610 6800 Fax: +1 650 620 9211
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
AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
DATA RETENTION CHARACTERISTICS
PARAMETER
VCC for Data Retention
Data Retention Current
Chip Disable to Data
Retention Time
Recovery Time
tRC* = Read Cycle Time
SYMBOL TEST CONDITION
VDR
CE# ≧ VCC - 0.2V
VCC = 1.5V
IDR
CE# ≧ VCC - 0.2V
Others at 0.2V or Vcc – 0.2V
See Data Retention
tCDR
Waveforms (below)
tR
MIN.
1.5
TYP.
-
MAX.
3.6
UNIT
V
-
2
10
mA
0
-
-
ns
tRC*
-
-
ns
DATA RETENTION WAVEFORM
VDR ≥ 1.5V
Vcc
Vcc(min.)
Vcc(min.)
tCDR
CE#
VIH
tR
CE# ≥ Vcc-0.2V
VIH
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
AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
PACKAGE OUTLINE DIMENSION
44-pin 400mil TSOP-Ⅱ Package Outline Dimension
SYMBOLS
A
A1
A2
b
c
D
E
E1
e
L
ZD
y
Θ
DIMENSIONS IN MILLMETERS
MIN.
NOM.
MAX.
1.20
0.05
0.10
0.15
0.95
1.00
1.05
0.30
0.45
0.12
0.21
18.212
18.415
18.618
11.506
11.760
12.014
9.957
10.160
10.363
0.800
0.40
0.50
0.60
0.805
0.076
o
o
o
0
3
6
DIMENSIONS IN MILS
MIN.
NOM.
MAX.
47.2
2.0
3.9
5.9
37.4
39.4
41.3
11.8
17.7
4.7
8.3
717
725
733
453
463
473
392
400
408
31.5
15.7
19.7
23.6
31.7
3
o
o
o
0
3
6
Alliance Memory, Inc reserves the rights to change the specifications and products without notice.
551 Taylor Way, Suite #1, San Carlos, CA 94070, USA
Tel: +1 650 610 6800 Fax: +1 650 620 9211
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
AS7C34098A-8TIN
256K X 16 BIT HIGH SPEED CMOS SRAM
Rev. 1.4
ORDERING INFORMATION
Package Type
44Pin(400mil)
TSOP-II
Access Time
(Speed/ns)
Temperature
Range(℃)
8
-40℃~85℃
Packing
Type
Alliance Memory
Part No.
Tray
AS7C34098A-8TIN
Tape Reel
AS7C34098A-8TINTR
Copyright © Alliance Memory
All Rights Reserved
Part Number: AS7C34098A
Document Version: v. 1.4
© Copyright 2003 Alliance Memory, Inc. All rights reserved. Our three-point logo, our name and Intelliwatt are
trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks of
their respective companies. Alliance reserves the right to make changes to this document and its products at
any time without notice. Alliance assumes no responsibility for any errors that may appear in this document.
The data contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance
reserves the right to change or correct this data at any time, without notice. If the product described herein is
under development, significant changes to these specifications are possible. The information in this product
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
AS7C34098A-8TIN
Rev. 1.4
256K X 16 BIT HIGH SPEED CMOS SRAM
THIS PAGE IS LEFT BLANK INTENTIONALLY.
Alliance Memory, Inc reserves the rights to change the specifications and products without notice.
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