LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only OVAL ROUND TYPE LED LAMPS LWK43733 DATA SHEET DOC. NO : QW0905-LWK43733 REV. : A DATE : 07 - Oct. - 2005 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LWK43733 Page 1/5 Package Dimensions 5.2 3.8 7.0 1.5 MAX 25.0MIN □0.5 TYP 1.0MIN 2.54TYP + Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Directivity Radiation Horizontal Axis 78 ° Vertical Axis 30 ° 0° -30° 30° -60° 60° 100% 75% 50% 25% 0 25% 50% 75% 100% Radiation Angle(0.5):H 78 Degree/V 30 Degree LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 2/5 PART NO. LWK43733 Absolute Maximum Ratings at Ta=25 ℃ Ratings Symbol Parameter UNIT WK Forward Current IF 30 mA Peak Forward Current Duty 1/10@10KHz IFP 100 mA Power Dissipation PD 120 mW Ir 50 μA Electrostatic Discharge( * ) ESD 150 V Operating Temperature Topr -20~ +80 ℃ Storage Temperature Tstg -30~ +100 ℃ Soldering Temperature Tsol Reverse Current @5V Max 260 ℃ for 5 sec Max (2mm from body) Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic * Static glove is recommended when handing these LED. All devices, equipment and machinery must be properly grounded. Typical Electrical & Optical Characteristics (Ta=25 ℃) PART NO COLOR MATERIAL Emitted LWK43733 InGaN/GaN White Lens Water Clear Chromaticity Coordinates Forward Luminous voltage intensity @20mA(V) @20mA(mcd) Y Typ. Max. Min. Typ. X 0.28 0.28 3.5 4.0 Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. Viewing angle 2θ 1/2 (deg) Vertical Axis 30° 1500 2700 Horizontal Axis 78° LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 3/5 PART NO. LWK43733 . Chromaticity Coordinates Specifications for Bin Grading Rank Chromaticity Coordinates Rank Chromaticity Coordinates Rank Chromaticity Coordinates A X=0.245 ±0.015 Y=0.216 ±0.024 B X=0.285 ±0.025 Y=0.286 ±0.046 C X=0.325 ±0.015 Y=0.345 ±0.025 A-3 X=0.235 ±0.005 Y=0.2085 ±0.0165 B-1 X=0.265 ±0.005 Y=0.225 ±0.015 C-1 X=0.315 ±0.005 Y=0.3325±0.0125 A-4 X=0.245 ±0.005 Y=0.225 ±0.015 B-2 X=0.275 ±0.005 Y=0.27 ±0.015 C-2 X=0.325 ±0.005 Y=0.346 ±0.014 A-5 X=0.255 ±0.005 B-3 X=0.285 ±0.005 Y=0.285 ±0.015 C-3 X=0.335 ±0.005 B-4 X=0.295 ±0.005 Y=0.3025 ±0.0175 B-5 X=0.305 ±0.005 Y=0.316 ±0.016 Y=0.24 ±0.015 . CIE Chromaticity Diagram C B A Y=0.36±0.01 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LWK43733 Page 4/5 Typical Electro-Optical Characteristics Curve WK CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 3.0 Relative Intensity Normalize @20mA Forward Current(mA) 1000 100 10 1 01 2.5 2.0 1.5 1.0 0.5 0.0 1.0 3.0 2.0 4.0 5.0 1 10 Fig.4 Relative Intensity vs. Temperature 1.2 Relative Intensity@20mA Normalize @25℃ Forward Voltage@20mA Normalize @25℃ Fig.3 Forward Voltage vs. Temperature 1.1 1.0 0.9 0.8 -20 0 20 40 60 80 100 SPECTRAL RADIANCE 100 Intensity 80 60 40 20 0 600 Wavelength (nm) 700 2.5 2.0 1.5 1.0 0.5 0.0 -20 0 20 40 60 80 Ambient Temperature( ℃) Fig.5 Luminous Spectrum(Ta=25 ℃) 500 3.0 -40 Ambient Temperature( ℃) 400 1000 Forward Current(mA) Forward Voltage(V) -40 100 800 100 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 5/5 PART NO. LWK43733 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ℃±5 ℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ℃±5℃ 2.RH=90 %~95 % 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hous. 1.Ta=105 ℃±5 ℃&-40 ℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202:103B JIS C 7021: B-11