Renesas NP30N06QDK-E2-AY 60 v â 30 a â dual n-channel power mos fet Datasheet

Data Sheet
NP30N06QDK
R07DS1332EJ0100
Rev.1.00
Mar 28, 2016
60 V – 30 A – Dual N-channel Power MOS FET
Application: Automotive
Description
NP29N06QDK is a dual N-channel MOS Field Effect Transistor designed for high current switching applications.
Features
• Super low on-state resistance
⎯ RDS(on)1 = 14 mΩ MAX. (VGS = 10 V, ID = 15 A)
⎯ RDS(on)2 = 21 mΩ MAX. (VGS = 4.5 V, ID = 7.5 A)
• Low Ciss: Ciss = 1500 pF TYP. (VDS = 25 V)
• Designed for automotive application and AEC-Q101 qualified
• Small size package 8-pin HSON dual
Outline
Drain 1
Drain 2
Body
Diode
Gate 1
Source 1
8-pin HSON dual
Body
Diode
Gate 2
Source 2
Equivalent circuit
Remark: Strong electric field, when exposed to this device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred.
Ordering Information
Part No.
NP30N06QDK-E1-AY *1
NP30N06QDK-E2-AY *1
Note:
Lead Plating
Pure Sn (Tin)
Tape 2500 p/reel
Packing
Taping (E1 type)
Taping (E2 type)
Package
8-pin HSON dual
*1. Pb-free (This product does not contain Pb in the external electrode)
R07DS1332EJ0100 Rev.1.00
Mar 28, 2016
Page 1 of 7
NP30N06QDK
Absolute Maximum Ratings (TA = 25°C)
Item
Drain to Source Voltage (VGS = 0 V)
Gate to Source Voltage (VDS = 0 V)
Drain Current (DC) (TC = 25°C) ∗4
Drain Current (pulse) ∗1, 4
Total Power Dissipation (TC = 25°C) ∗4
Total Power Dissipation (TA = 25°C) ∗2, 4
Channel Temperature
Storage Temperature
Repetitive Avalanche Current ∗3
Repetitive Avalanche Energy ∗3
Symbol
VDSS
VGSS
ID(DC)
ID(pulse)
PT1
PT2
Tch
Tstg
IAR
EAR
Ratings
60
±20
±30
±120
59
1.0
175
−55 to +175
19
35
Unit
V
V
A
A
W
W
°C
°C
A
mJ
Thermal Resistance
Channel to Case Thermal Resistance
Channel to Ambient Thermal Resistance ∗2
Rth(ch-C)
Rth(ch-A)
2.54
150
°C/W
°C/W
Notes: *1. TC = 25°C, PW ≤ 10 μs, Duty Cycle ≤ 1%
*2. Mounted on glass epoxy substrate of 40 mm × 40 mm × 1.6 mmt with 4% copper area (35 μm)
*3. RG = 25 Ω, VGS = 20 V → 0 V
*4. One channel operation
R07DS1332EJ0100 Rev.1.00
Mar 28, 2016
Page 2 of 7
NP30N06QDK
Electrical Characteristics (TA = 25°C)
Item
Zero Gate Voltage Drain Current
Gate Leakage Current
Gate to Source Threshold Voltage
Forward Transfer Admittance ∗1
Symbol
IDSS
IGSS
VGS(th)
| yfs |
Drain to Source On-state
Resistance ∗1
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Total Gate Charge
Gate to Source Charge
Gate to Drain Charge
Body Diode Forward Voltage ∗1
Reverse Recovery Time
RDS(on)1
RDS(on)2
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
QG
QGS
QGD
VF(S-D)
trr
Reverse Recovery Charge
Qrr
Note:
Min
Typ
1.5
13
2.1
25
11.5
16.5
1500
160
50
15
5
50
3
25
5
4
0.9
25
Max
1
±100
2.5
Unit
μA
nA
V
S
mΩ
mΩ
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
V
ns
14
21
2250
240
90
30
13
100
8
38
1.5
26
nC
Test Conditions
VDS = 60 V, VGS = 0 V
VGS = ±20 V, VDS = 0 V
VDS = VGS, ID = 250 μA
VDS = 5 V, ID = 15 A
VGS = 10 V, ID = 15 A
VGS = 4.5 V, ID = 7.5 A
VDS = 25 V,
VGS = 0 V,
f = 1 MHz
VDD = 30 V, ID = 15 A,
VGS = 10 V,
RG = 0 Ω
VDD = 48 V,
VGS = 10 V,
ID = 30 A
IF = 30 A, VGS = 0 V
IF = 30 A, VGS = 0 V,
di/dt = 100 A/μs
*1. Pulsed test
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
RG = 25 Ω
PG.
VGS = 20 → 0 V
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
L
50 Ω
RL
Wave Form
RG
PG.
VDD
VGS
VGS
VDD
0
VGS
10%
90%
VDS
90%
ID
IAS
90%
VDS
VGS
0
BVDSS
VDS
10%
0
10%
Wave Form
VDS
VDD
Starting Tch
τ
τ = 1 μs
Duty Cycle ≤ 1%
td(on)
tr
ton
td(off)
tf
toff
TEST CIRCUIT 3 GATE CHARGE
PG.
D.U.T.
IG = 2 mA
RL
50 Ω
VDD
R07DS1332EJ0100 Rev.1.00
Mar 28, 2016
Page 3 of 7
NP30N06QDK
Typical Characteristics (TA = 25°C)
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
DERATING FACTOR OF FORWARD BIAS SAFE
120
70
100
60
Pt – Total Power Dissipation - W
dT - Percentage of Rated Power - %
OPERATING AREA
80
60
40
20
50
40
30
20
10
0
0
50
100
150
0
200
0
TC - Case Temperature - °C
50
100
150
200
TC - Case Temperature - °C
FORWARD BIAS SAFE OPERATING AREA
1000
ID(pulse)=120A
ID - Drain Current - A
100
ID(DC)=30A
10
Power Dissipation Limited
1
Secondary Breakdown Limited
0.1
TC=25℃
Single Pulse
0.01
0.1
1
10
100
VDS - Drain to Source Voltage – V
Rth(t) - Transient Thermal Resistance - °C/W
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
1000
Rth(ch-A) = 150°C/W
100
10
Rth(ch-C) = 2.54°C/W
1
0.1
0.01
One channel operation
Single pulse
Mounted on glass epoxy substrate of 40 mm x 40 mm x 1.6 mmt with 4% copper area(35μm)
100 μ
1m
10 m
100 m
1
10
100
1000
PW - Pulse Width - s
R07DS1332EJ0100 Rev.1.00
Mar 28, 2016
Page 4 of 7
NP30N06QDK
FORWARD TRANSFER CHARACTERISTICS
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
140
100
120
TA=175°C
125°C
75°C
25°C
-55°C
10
ID - Drain Current - A
ID - Drain Current - A
100
80
60
40
VGS=10V
20
1
0.1
0.01
VDS = 10V
Pulsed
Pulsed
0
0.001
0
0.5
1
1.5
2
2.5
3
0
VDS - Drain to Source Voltage - V
3
4
FORWARD TRANSFER ADMITTANCE vs.
CURRENT
5
DRAIN
100
3
2
1
VDS = VGS
ID=250μA
0
-100
-50
0
50
100
150
200
| yfs | - Forward Transfer Admittance - S
4
VGS(th) – Gate to Source Threshold Voltage - V
2
VGS - Gate to Source Voltage - V
GATE TO SOURCE THRESHOLD VOLTAGE vs.
CHANNEL TEMPERATURE
TA=175°C
150°C
75°C
25°C
-55°C
10
VDS = 5V
Pulsed
1
0.1
Tch - Channel Temperature - °C
20
10
VGS=10V
Pulsed
0
1
ID - Drain Current - A
R07DS1332EJ0100 Rev.1.00
Mar 28, 2016
10
10
100
100
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
RDS(on) - Drain to Source On-state Resistance - mΩ
30
0.1
1
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
RDS(on) - Drain to Source On-state Resistance - mΩ
1
30
Pulsed
ID= 6A
15A
30A
20
10
ID=15A
0
0
5
10
15
20
VGS - Gate to Source Voltage - V
Page 5 of 7
NP30N06QDK
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
10000
30
Pulsed
VGS=10V
ID=15A
-50
0
50
100
150
100
Coss
10
0.01
200
0.1
SWITCHING CHARACTERISTICS
10
100
DYNAMIC INPUT CHARACTERISTICS
10
50
1000
VDD = 30V
VGS=10V
RG=0Ω
VDS - Drain to Source Voltage - V
td(on),tr,td(off),tr – Switching Time - ns
1
VDS - Drain to Source Voltage - V
Tch - Channel Temperature - °C
100
td(off)
td(on)
10
tr
tf
VDD= 48V
30V
12V
40
8
6
30
VGS
20
4
2
10
VDS
ID=30A
0
0
1
0.1
1
10
0
100
5
10
15
20
25
QG - Gate Charge - nC
ID - Drain Current - A
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
100
100
trr – Reverse Recovery Time - ns
IF - Diode Forward Current - A
Crss
VGS = 0V
f = 1.0MHz
VGS - Gate to Source Voltage - V
0
-100
S
10
1000
f Ad i
20
Ciss
T
Ciss, Coss, Crss - Capacitance - pF
RDS(on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
VGS=10V
10
VGS=0V
1
Pulsed
0.1
0
0.2
0.4
0.6
0.8
1
VF(S-D) - Source to Drain Voltage - V
R07DS1332EJ0100 Rev.1.00
Mar 28, 2016
1.2
10
di/dt = 100A/μs
VGS = 0V
1
0.1
1
10
100
IF - Drain Current - A
Page 6 of 7
NP30N06QDK
Package Drawings (Unit: mm)
8-pin HSON Dual (Mass: 0.12 g TYP.)
Renesas package code: PLSN0008DA-A
A
A
S
1: Source 1
2: Gate 1
7, 8: Drain 1
3: Source 2
4: Gate 2
5, 6: Drain 2
R07DS1332EJ0100 Rev.1.00
Mar 28, 2016
Page 7 of 7
Revision History
NP30N06QDK Data Sheet
Description
Rev.
1.00
Date
Mar 28, 2016
Page
—
Summary
First Edition Issued
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