AN4494
Application note
Bringing up the BlueNRG and BlueNRG-MS devices
Introduction
The BlueNRG, BlueNRG-MS devices are high performance, ultra-low power wireless network
processors which support, respectively, Bluetooth specification v4.0 and v4.1.
In order to achieve maximum performance, some procedures must be carried out before finalizing the
application.
This document summarizes these fundamental steps:
•
•
•
•
•
•
•
•
•
Application PCB test points
Power supply and current consumption tests
SPI interface
IFR configuration
XTAL and LSOSC centering tests
Output power test
Packet exchange test
Sensitivity test
Power consumption in advertising mode
Note:
The document content is valid for both BlueNRG and BlueNRG_MS devices. Any reference to BlueNRG
device is also valid for the BlueNRG-MS device. Any specific difference is highlighted whenever it is
needed.
March 2015
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www.st.com
Contents
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Contents
1
Application PCB test points ........................................................... 8
2
Power supply and current consumption tests ............................ 10
3
4
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2.1
Test case specification identifier ..................................................... 10
2.2
Test prerequisite ............................................................................. 10
2.3
Test description ............................................................................... 10
2.4
Test setup ....................................................................................... 10
2.4.1
Hardware .......................................................................................... 10
2.4.2
Software ........................................................................................... 10
2.5
Test procedure ................................................................................ 10
2.6
Expected results.............................................................................. 10
2.7
Note ................................................................................................ 11
2.8
Other ............................................................................................... 11
SPI interface................................................................................... 12
3.1
Test case specification identifier ..................................................... 12
3.2
Test prerequisite ............................................................................. 12
3.3
Test description ............................................................................... 12
3.4
Test setup ....................................................................................... 12
3.4.1
Hardware .......................................................................................... 12
3.4.2
Software ........................................................................................... 12
3.5
Test procedure ................................................................................ 12
3.6
Expected results.............................................................................. 13
3.7
Note ................................................................................................ 14
3.8
Other ............................................................................................... 14
IFR configuration ........................................................................... 15
4.1
HS_Startup_Time: Test case specification identifier ....................... 16
4.2
Test prerequisite ............................................................................. 16
4.3
Test description ............................................................................... 16
4.4
Test setup ....................................................................................... 17
4.4.1
Hardware .......................................................................................... 17
4.4.2
Software ........................................................................................... 17
4.5
Test procedure ................................................................................ 17
4.6
Expected results.............................................................................. 18
4.7
Note ................................................................................................ 18
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Contents
4.8
5
6
7
Other ............................................................................................... 18
XTAL centering test....................................................................... 19
5.1
Test case specification identifier ..................................................... 19
5.2
Test prerequisite ............................................................................. 19
5.3
Test description ............................................................................... 19
5.4
Test setup ....................................................................................... 19
5.4.1
Hardware .......................................................................................... 19
5.4.2
Software ........................................................................................... 19
5.5
Test procedure ................................................................................ 19
5.6
Expected results.............................................................................. 20
5.7
Note ................................................................................................ 20
5.8
Other ............................................................................................... 20
LSOSC centering test.................................................................... 21
6.1
Test case specification identifier ..................................................... 21
6.2
Test prerequisite ............................................................................. 21
6.3
Test description ............................................................................... 21
6.4
Test setup ....................................................................................... 21
6.4.1
Hardware .......................................................................................... 21
6.4.2
Software ........................................................................................... 21
6.5
Test procedure ................................................................................ 21
6.6
Expected results.............................................................................. 21
6.7
Note ................................................................................................ 22
6.8
Other ............................................................................................... 22
Output power test .......................................................................... 23
7.1
Test case specification identifier ..................................................... 23
7.2
Test prerequisite ............................................................................. 23
7.3
Test description ............................................................................... 23
7.4
Test setup ....................................................................................... 23
7.4.1
Hardware .......................................................................................... 23
7.4.2
Software ........................................................................................... 23
7.5
Test procedure ................................................................................ 23
7.6
Expected results.............................................................................. 23
7.7
Note ................................................................................................ 24
7.8
Other ............................................................................................... 24
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Contents
8
9
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Packet exchange test .................................................................... 26
8.1
Test case specification identifier ..................................................... 26
8.2
Test prerequisite ............................................................................. 26
8.3
Test description ............................................................................... 26
8.4
Test setup ....................................................................................... 26
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Hardware .......................................................................................... 26
8.4.2
Software ........................................................................................... 26
8.5
Test procedure ................................................................................ 26
8.6
Expected results.............................................................................. 26
8.7
Note ................................................................................................ 26
8.8
Other ............................................................................................... 27
Sensitivity test ............................................................................... 28
9.1
Test case specification identifier ..................................................... 28
9.2
Test prerequisite ............................................................................. 28
9.3
Test description ............................................................................... 28
9.4
Test setup ....................................................................................... 28
9.5
10
8.4.1
9.4.1
Hardware .......................................................................................... 28
9.4.2
Software ........................................................................................... 28
Test procedure ................................................................................ 28
9.5.1
Signal generator & BlueNRG ........................................................... 28
9.5.2
Two BlueNRG boards....................................................................... 29
9.6
Expected results.............................................................................. 29
9.7
Note ................................................................................................ 29
9.8
Other ............................................................................................... 29
Power consumption in advertising mode .................................... 30
10.1
Test case specification identifier ..................................................... 30
10.2
Test prerequisite ............................................................................. 30
10.3
Test description ............................................................................... 30
10.4
Test setup ....................................................................................... 30
10.4.1
Hardware .......................................................................................... 30
10.4.2
Software ........................................................................................... 30
10.5
Test procedure ................................................................................ 30
10.6
Expected results.............................................................................. 30
10.7
Note ................................................................................................ 31
10.8
Other ............................................................................................... 31
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Contents
11
Reference ....................................................................................... 32
12
Revision history ............................................................................ 33
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List of tables
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List of tables
Table 1: Test points .................................................................................................................................... 8
Table 2: Supply test results ...................................................................................................................... 10
Table 3: Blue_Initialized_Event ................................................................................................................ 13
Table 4: Document revision history .......................................................................................................... 33
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List of figures
List of figures
Figure 1: UFL connector ............................................................................................................................. 9
Figure 2: SPI connection .......................................................................................................................... 12
Figure 3: BlueNRG SPI transaction on HW reset ..................................................................................... 13
Figure 4: BlueNRG GUI IFR tool .............................................................................................................. 16
Figure 5: XTAL_startup measure.............................................................................................................. 17
Figure 6: Frequency tone at Ch0 for the XTAL center test ....................................................................... 20
Figure 7: Output power measurement in High power mode with PA_level 7 ........................................... 24
Figure 8: Output power measurement in High power mode with PA_level 6 ........................................... 25
Figure 9: Typical current profile during an advertising event .................................................................... 31
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Application PCB test points
1
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Application PCB test points
ST recommends making available a set of test points in order to measure the performance
of the device on the customer PCB. Depending on customer PCB constraints, it may not
always be possible to add all test points, in which case some tests cannot be performed.
Table 1: Test points
Test point
Details of the test point
Should be added in the PCB to
measure BlueNRG current
consumption.
In series with the VBAT1,2,3
pins.
Voltage supply
Should be added to measure BlueNRG
supply voltages.
To pins:
VDD1V8, VDD1V2
SMPSFILT1, SMPSFILT2
RF
If the PCB uses an embedded antenna,
like a PCB or a chip antenna, it is
recommended to add a UFL connector
to allow measurement of the RF
performance with a spectrum analyzer.
Between the matching network
(or balun) and the embedded
antenna (see Figure 1: "UFL
connector").
SPI
Customer PCB should allow exclusion
of its own microcontroller and allow
connection of the BlueNRG SPI lines to
the STEVAL-IDB002V1 motherboard.
If the SPI test point is not available,
ST can provide the GUI firmware
required to port it on the customer
microcontroller.
This assumes that the customer PCB
has a USB or RS232 I/O port available
for PC connection.
Between the microcontroller and
the BlueNRG.
Pins used for the XTAL_startup
measure
Pins: TEST8, TEST9
Current
consumption
TEST8, TEST9
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Function
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Application PCB test points
Figure 1: UFL connector
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Power supply and current consumption tests
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2
Power supply and current consumption tests
2.1
Test case specification identifier
SUPPLY_TESTS
No specific firmware is needed for this test.
2.2
Test prerequisite
In order to perform these tests, you need to add some test points to the platform.
Refer to Section 1: "Application PCB test points" for test pin description.
2.3
Test description
The aim of this test is to ensure that the BlueNRG is correctly powered, and its power
consumption does not show anomalies.
2.4
Test setup
2.4.1
Hardware
A multimeter is required for this test.
2.4.2
Software
N/A.
2.5
Test procedure
Power up the BlueNRG platform. The application microcontroller does not have to access
the SPI interface while performing this test.
Measure the voltage in: VBAT1,2,3, VDD1V8, VDD1V2, SMPSFILT1, SMPSFILT2.
Measure the current in series with the VBAT1, 2, 3 pins.
2.6
Expected results
The measured pin voltage and current should be aligned with the following values.
Table 2: Supply test results
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Pin
Expected value
VBAT1,2,3
2.0 – 3.6 V
VDD1V8
1.8 V
VDD1V2
1.2 V
SMPSFILT1
Square wave around 1.4 V
SMPSFILT2
1.4 V
IBAT (VBAT = 3.0 V)
2 mA
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2.7
Power supply and current consumption tests
Note
If some of the measured values are not aligned with the expected values, it is
recommended to double-check the integrity of the board's connection.
2.8
Other
N/A.
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SPI interface
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3
SPI interface
3.1
Test case specification identifier
SPI_TEST
3.2
Test prerequisite
The customer's platform should have the SPI test points (see Table 1: "Test points" and
Figure 2: "SPI connection": SPI connection below).
3.3
Test description
How to verify that SPI access from an external microcontroller is functional.
3.4
Test setup
3.4.1
Hardware
STEVAL-IDB002V1 motherboard, to be connected to the BlueNRG board as showed
below:
Figure 2: SPI connection
3.4.2
Software
ST BlueNRG GUI, to send SPI commands to the BlueNRG.
3.5
Test procedure
A BlueNRG hardware reset, performed by the microcontroller, generates an ACI event with
a sequence described below and shown in Figure 3: "BlueNRG SPI transaction on HW
reset":
1.
2.
3.
4.
5.
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Release of hardware reset
IRQ goes high to signal an event from BlueNRG (if this signal is not present, it means
that the BlueNRG firmware for some reason is not running)
The external microcontroller lowers CS to access the BlueNRG and read the event
The microcontroller reads 5 bytes from SPI; they should be [02,7F,00,00,00]
The external microcontroller, after raising the CS, lowers it again to access the
BlueNRG and read the event
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6.
7.
8.
SPI interface
The microcontroller reads 5 bytes from SPI and [02,7F,00,06,00] is expected, meaning
6 bytes to read
The microcontroller reads 6 bytes from SPI and [04, FF, 03, 01, 00, 01] is expected
The microcontroller raises the CS again
Figure 3: BlueNRG SPI transaction on HW reset
The bytes in step 7 should be interpreted as an HCI vendor specific (VS) event packet
(refer to Section 2.3: "Test description").
When the BlueNRG firmware is started normally, it gives a Blue_Initialized_Event to the
user to indicate the system has started.
The following is a detailed interpretation about this specific HCI VS event packet:
Table 3: Blue_Initialized_Event
3.6
Bytes
Description
04
It indicates an HCI Event Packet
FF
It is a vendor specific HCI event (Event code 0xFF)
03
HCI VS event parameter total length
01 00
BLUE_INITIALIZED event code
01
Reason code x BLUE_INITIALIZED event: Application started properly
Expected results
The bytes sent by the BlueNRG are described in Section 3.5: "Test procedure".
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SPI interface
3.7
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Note
If the application board does not have SPI test points, ST can provide the firmware to be
ported on the microcontroller used in the customer PCB so that the system can work with
the ST GUI.
3.8
Other
If the basic test above is working, we suggest using the ST BlueNRG GUI to run a few
commands (for example the HCI_READ_LOCAL_VERSION_INFORMATION, or Get
version under the tab Tools) to check that the SPI access with the ST BlueNRG GUI is ok.
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4
IFR configuration
IFR configuration
There are some parameters of the BlueNRG device that must be set up in a dedicated
portion of the BlueNRG Flash, called information register (IFR), before the application
board is finalized (see Reference section, item 4).
Specifically, they are:
•
•
•
•
•
•
•
High speed (HS) crystal (16 or 32 MHz)
Low speed oscillator source (32 KHz or the internal Ring Oscillator)
Power Management options (SMPS inductor or SMPS off configuration)
Stack mode:
−
Mode 1: slave/master, 1 connection only, small GATT database (RAM2 off during
sleep)
−
Mode 2: slave/master, 1 connection only, large GATT database (RAM2 on during
sleep)
−
Mode 3: only master (BlueNRG), slave/master (BlueNRG-MS), 8 connections,
small GATT database (RAM2 on during sleep)
Change HS startup time parameter. from 512 µs to 1953 µs.
Sleep clock accuracy.
LS crystal period and frequency
Currently, the crystal configuration implies the possibility to choose a set of preconfigured
IFR configuration files (*.dat).
In order to match the user's specific crystal oscillator, the *.dat IFR files can be written in
the device through the BlueNRG GUI, under:
Tools / BlueNRG IFR / Load & Write buttons (see Figure 4: "BlueNRG GUI IFR tool").
The BlueNRG kit modules are delivered with 16 MHz external high-speed crystal and
32 kHz low-speed crystal, and the related stack image is already tailored to use this
configuration (bluenrg_x_x_Mode_2-16MHz-XO32K.img).
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IFR configuration
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Figure 4: BlueNRG GUI IFR tool
4.1
HS_Startup_Time: Test case specification identifier
XTAL_startup_TEST
4.2
Test prerequisite
The user’s platform should have the test points for the pins TEST8 and TEST9 (see Table
1: "Test points").
4.3
Test description
The HS_Startup_Time parameter is important because it permits minimization of the
current consumption, but to do this a measurement of the startup time of the adopted
crystal must be performed (XTAL_startup). A value that is too short prevents the BlueNRG
from correctly sending/receiving packets.
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IFR configuration
4.4
Test setup
4.4.1
Hardware
An oscilloscope is required for this test.
4.4.2
Software
ST BlueNRG GUI, to enable a dedicated test mode.
4.5
Test procedure
Tick the checkbox present in the BlueNRG IFR tool in the BlueNRG GUI to enable the
startup time test signals.
Put two scope probes on test points TEST8 and TEST9.
Set the BlueNRG in advertising mode, using these commands with the BlueNRG GUI:
BLUEHCI_GATT_INIT
BLUEHCI_GAP_INIT
BLUEHCI_GAP_SET_DISCOVERABLE (leave the default settings)
Measure the time between the rising edge of the two signals (see Figure 5: "XTAL_startup
measure").
Figure 5: XTAL_startup measure
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IFR configuration
4.6
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Expected results
The measured value must be compensated in order to consider the variations of the power
supply, temperature and the crystal tolerance:
XTAL_startup = XTAL_startup(measured)*1.2*1.1*1.2 = 1.584* XTAL_startup (measured)
The first coefficient (1.2) can be omitted if the test is performed at the minimum operative
voltage.
Finally, to find the HS_STARTUP_TIME value that must be set up in the IFR, use this
formula:
HS_STARTUP_TIME = 110 µs + MAX {XTAL_startup, (0.56*XTAL_startup+304)}
4.7
Note
Examples:
XTAL_startup = 300 µs → HS_STARTUP_TIME = 680 µs
XTAL_startup = 700 µs → HS_STARTUP_TIME = 1219 µs
4.8
Other
N/A.
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5
XTAL centering test
XTAL centering test
The BlueNRG integrates a low-speed frequency oscillator (LSOSC) and a high-speed (16
MHz or 32 MHz) frequency oscillator (HSOSC).
The low frequency clock is used in low power mode and can be supplied either by a 32.7
kHz oscillator that uses an external crystal or by a ring oscillator with maximum ±500 ppm
frequency tolerance, which does not require any external components.
The primary high frequency clock is a 16 MHz or 32 MHz crystal oscillator.
The frequency tolerance of the high-speed crystal oscillator must be below ±50 ppm.
The BlueNRG device, as with all RF systems, is highly dependent on accurate clocks for
correct operation. A deviation in clock frequency is directly reflected as a deviation in radio
frequency, and this can degrade RF performance, violate legal requirements or in the worst
case lead to a non-functioning system.
For these reasons the crystal frequency must be centered, and the easiest way to find the
optimum load capacitor values for a given circuit and layout is through experimentation.
5.1
Test case specification identifier
XTAL_center_TEST
5.2
Test prerequisite
For this test, the UFL connector (see Table 1: "Test points") is not mandatory.
5.3
Test description
For the reasons previously explained, the crystal frequency must be centered, and the
easiest way to find the optimum load capacitor values for a given circuit and layout is
through experimentation. The radio can be set to put out a constant carrier at a given
frequency.
By measuring the output frequency with a spectrum analyzer, the offset can easily be
found.
5.4
Test setup
5.4.1
Hardware
A spectrum analyzer is required for this test.
5.4.2
Software
ST BlueNRG GUI, to emit a frequency tone.
5.5
Test procedure
The following procedure is valid for the high-speed oscillator (16 MHz or 32 MHz):
Connect the BlueNRG board to the spectrum analyzer through an RF cable if it is equipped
with an UFL connector, otherwise plug a 2.4 GHz antenna into the input port of the
instrument.
Power up the BlueNRG platform.
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XTAL centering test
Set the spectrum analyzer to: Res BW = 1 KHz, SPAN = 500 KHz (see Figure 6:
"Frequency tone at Ch0 for the XTAL center test").
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Generate a carrier wave tone at Ch0 (freq. 2.401750 GHz) using the ACI command:
HAL_TONE_START (a tone can be emitted at f = 2402 + k*2 - 0.250 MHz, with k = 0 to
39).
The difference between the desired tone and the measured tone is the frequency offset.
Figure 6: Frequency tone at Ch0 for the XTAL center test
5.6
Expected results
The offset limit is (as reported in the Reference section point ):
|Offset| < 50 KHz
If DUT freq > 2.4018 GHz → increase XTAL caps
If DUT freq < 2.4017 GHz → decrease XTAL caps
5.7
Note
N/A.
5.8
Other
N/A.
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6
LSOSC centering test
LSOSC centering test
The LSOSC is used to have a reference time clock. The advantage of using the external
32.768 kHz clock is that it consumes less power than internal RO and it is more accurate
(50 ppm). This test permits to center its oscillator frequency, changing the crystal
capacitance.
6.1
Test case specification identifier
LSOSC_center_TEST
6.2
Test prerequisite
For this test, a test point in the pin 14 (TEST9) is required.
6.3
Test description
There is a way, using the IFR tool of the BlueNRG GUI, to put out the LSOSC signal in the
pin 14.
By measuring its frequency with an oscilloscope, the frequency offset can easily be
measured.
6.4
Test setup
6.4.1
Hardware
An oscilloscope is required for this test.
6.4.2
Software
ST BlueNRG GUI.
6.5
Test procedure
Connect an oscilloscope’s probe in the pin 14 (TEST9) test point.
Power up the BlueNRG platform.
Set the scope to capture a consistent number of 32 KHz waveform periods (for example 64
cycles, so set the time base at 200us). In this way, the influence of the jitter in the measure
is minimized.
In the IFR tool of the GUI make a “Read” of the current IFR configuration, then tick the
check-box “LS crystal measure” and then make a “Write” operation.
Now a power cycle is required to let the new IFR be operative.
At this point, the 32.768 KHz waveform will be visible on the oscilloscope screen.
Perform the measurement of the frequency: the difference between the target value
(f=32.768 KHz) and the measured one is the frequency offset Δf.
6.6
Expected results
If DUT freq > 32.768 KHz → increase XTAL caps
If DUT freq < 32.768 KHz → decrease XTAL caps
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LSOSC centering test
To find the oscillator ppm use the formula:
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Where:
Δf = offset
f = 32.768 KHz
Add to the found ppm value the one declared in the adopted crystal datasheet.
This final value must be set in the IFR with the GUI, in the Slave SCA and Master SCA
fields.
6.7
Note
N/A.
6.8
Other
N/A.
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Output power test
7
Output power test
7.1
Test case specification identifier
OUTPUT_TESTS
7.2
Test prerequisite
For this test the UFL or SMA connector is mandatory.
7.3
Test description
The aim of this test is verification of the Tx output power level and the step linearity.
7.4
Test setup
7.4.1
Hardware
A spectrum analyzer is required for this test.
7.4.2
Software
ST BlueNRG GUI, to emit a frequency tone.
7.5
Test procedure
Connect the BlueNRG board to the spectrum analyzer through an RF cable.
Set the spectrum analyzer to: Res BW = 100 KHz, SPAN = 500 KHz.
Power up the BlueNRG platform.
The default configuration of the command BLUEHCI_HAL_SET_TX_POWER_LEVEL is
with the parameter En_High_Power=0x01 (High power mode) and PA_level=0x07
(+8dBm).
To use the BlueNRG in TX Standard mode, use this command with the parameter
En_High_Power=0x00.
Generate a carrier wave tone at Ch0 (freq. 2.401750 GHz) using the ACI command:
HAL_TONE_START (a tone can be emitted at f=2402 + k*2 - 0.250 MHz, with k=0 to 39).
For the step linearity of the Tx output power use the command:
BLUEHCI_HAL_SET_TX_POWER_LEVEL (PA_Level: 0x06).
7.6
Expected results
With PA_level=0x07:
High power mode: around 8 dBm
Standard power mode: around 5 dBm
With PA_level = 0x06:
High power mode: around 4 dBm
Standard power mode: around 0 dBm
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Output power test
7.7
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Note
The results are significantly influenced by the matching network performances. The user
may need to tune it to obtain maximum performance.
7.8
Other
N/A
Figure 7: Output power measurement in High power mode with PA_level 7
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Output power test
Figure 8: Output power measurement in High power mode with PA_level 6
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Packet exchange test
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8
Packet exchange test
8.1
Test case specification identifier
PACKET_TEST
8.2
Test prerequisite
In order to perform these tests, you need a BlueNRG development platform (STEVALIDB002V1) or a BlueNRG USB dongle (STEVAL-IDB003V1) as a master and the DUT
board as a slave.
8.3
Test description
The aim of this test is to verify that the BlueNRG board is able to send and receive packets
correctly.
8.4
Test setup
8.4.1
Hardware
No instruments required.
8.4.2
Software
BlueNRG software GUI.
8.5
Test procedure
Power up the BlueNRG platform (Rx) and the board that acts as Tx.
Ensure that antennas are plugged in.
Start Rx on DUT: HCI_LE_RECEIVER_TEST
Make the Tx board send packets: HCI_LE_TRASMITTER_TEST, with the length of test
data: 0x25
Stop test on Tx board: HCI_LE_TEST_END
Send this command in order to determine the number of packets sent by the Tx:
HAL_LE_TX_TEST_PACKET_NUMBER
Stop test on DUT: HCI_LE_TEST_END
This will return Y as the number of received packets.
8.6
Expected results
The number of packets received over-the-air should be equal to the number of packets
sent by the Tx board.
8.7
Note
N/A.
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8.8
Packet exchange test
Other
N/A.
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Sensitivity test
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9
Sensitivity test
9.1
Test case specification identifier
SENSITIVITY_TEST
9.2
Test prerequisite
It is possible to adopt two different hardware configurations for this test:
1.
2.
9.3
A signal generator (ex. the Agilent E4438C, controlled through a GPIB interface) as Tx
and the STEVAL-IDB002V1 motherboard connected to the DUT (device under test) as
shown in Figure 1: "UFL connector".
STEVAL-IDB002V1 complete kit as Tx device and STEVAL-IDB002V1 motherboard
connected to the BlueNRG DUT
Test description
The aim of this test is to verify the sensitivity level of the BlueNRG board.
9.4
Test setup
9.4.1
Hardware
Tx: Agilent E4438C signal generator or STEVAL-IDB002V1 kit
Rx: STEVAL motherboard connected to the BlueNRG DUT board (see Figure 1: "UFL
connector").
9.4.2
Software
ST BlueNRG GUI.
9.5
Test procedure
Two procedures can be used.
9.5.1
Signal generator & BlueNRG
The sensitivity can be evaluated by performing the following steps:
1.
2.
3.
4.
Connect the instrument and the DUT with an RF cable (with no significant loss).
Start Rx on DUT: HCI_LE_RECEIVER_TEST
Make the generator send X packets (well formatted as described in “Direct Test
Mode”, Vol. 6, Part F, and “Host Controller Interface Functional Specification”, VOL. 2,
Part E, in point Section 11: "Reference")
Stop test on DUT: HCI_LE_TEST_END
This will return Y as the number of received packets. PER is 1-Y/X.
If PER is below 0.308 (30.8%), go back to step b and decrease the power of the transmitter
by one step. If PER goes above 0.308, then the level of power emitted by the equipment in
the previous test is the sensitivity of the receiver.
The algorithm can be made more accurate by reducing the power level step when it is
close to the sensitivity level.
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9.5.2
Sensitivity test
Two BlueNRG boards
In this case, the previous procedure changes in the following way:
1.
2.
3.
4.
5.
6.
Connect the RF input/output of both boards, DUT and tester, by using a variable
attenuator.
Start Rx on DUT: HCI_LE_RECEIVER_TEST
Make the Tx board send packets: HCI_LE_TRANSMITTER_TEST, with the length of
test data: 0x25
Stop test on Tx board: HCI_LE_TEST_END
Send a further command to determine the number of packets sent by the Tx board:
HAL_LE_TX_TEST_PACKET_NUMBER
Stop test on DUT: HCI_LE_TEST_END
This will return Y as the number of received packets. PER is 1-Y/X.
If PER is below 0.308 (30.8%), go back to step b and increase the value of the attenuation.
If PER goes above 0.308, then the level of power received by the DUT in the previous test
is the sensitivity of the receiver. It is very important to measure correctly or estimate the
power received by the DUT (e.g. by the use of a tone instead of a modulated signal).
Moreover, in order to reduce the level of the signal received over-the-air by the DUT, the
BlueNRG Tester should use the minimum output power. Performing the measurements
inside an anechoic chamber will also give more accurate results.
9.6
Expected results
The expected value should be a few dBm from the value reported in the datasheet. If it is
not, the reason could be related to the matching network.
9.7
Note
Since the sensitivity test is very time-consuming, ST can provide specific software for both
hardware configurations in order to implement an automatic procedure.
9.8
Other
N/A.
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Power consumption in advertising mode
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10
Power consumption in advertising mode
10.1
Test case specification identifier
CURRENT_TEST
10.2
Test prerequisite
In order to perform this test the platform must be provided with the test points in series with
the Vbat1, 2, 3 pins (see Table 1: "Test points").
10.3
Test description
The aim of this test is to verify that the BlueNRG current consumption profile during the
advertising is aligned with the simulated value (using the BlueNRG Current Consumption
Estimation Tool available on ST BlueNRG website www.st.com/bluenrg).
10.4
Test setup
10.4.1
Hardware
Agilent N6705B power analyzer or an oscilloscope.
10.4.2
Software
ST BlueNRG GUI.
10.5
Test procedure
Connect the power analyzer in series to the Vbat pins in the BlueNRG. If it is not available,
use a 10 Ohm resistor to sense the current, connecting two probes to it.
Power up the BlueNRG platform.
Set the BlueNRG in advertising mode, using these commands with the BlueNRG GUI:
BLUEHCI_GATT_INIT
HCI_LE_SET_ADVERTISING_PARAMETERS(interval_min=interval_max=0x0640)
HCI_LE_ADVERTISING_DATA (Data_length 0, Advertising_Data=0x101010…)
HCI_LE_SET_ADVERTISE_ENABLE (Avertising_Enable=0x01)
BLUEHCI_HAL_SET_TX_POWER_LEVEL (PA_Level = 5/4)
Capture the current waveform.
10.6
Expected results
The average current should be as reported here (see Figure 9: "Typical current profile
during an advertising event"):
Avg. current = approx. 6 mA
Sleep current = approx. 2 µA (see Section 11: "Reference" point )
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Power consumption in advertising mode
These values are significantly influenced by the IFR parameters, such as the
HS_Startup_Time, the Stack Mode and the 32 KHz crystal (external or internal ring
oscillator)
Figure 9: Typical current profile during an advertising event
10.7
Note
N/A.
10.8
Other
N/A.
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Reference
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Reference
1.
2.
3.
4.
5.
6.
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BlueNRG, BlueNRG-MS datasheets
BlueNRG Bluetooth LE stack application command interface (ACI) UM1755
Bluetooth specification version v4.0 and v4.1
BlueNRG, BlueNRG-MS IFR user manual UM1868
BlueNRG development kits user manual UM1686
BlueNRG-MS Bluetooth LE stack application command interface (ACI) UM1865
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Revision history
Revision history
Table 4: Document revision history
Date
Revision
30-May-2014
1
Initial release.
2
Added Section 6: "LSOSC centering test" and a few
minor text corrections.
3
The document has been adapted to refer to both
BlueNRG and BlueNRG-MS devices.
Modified: Section 4: "IFR configuration" and Section
9.5.2: "Two BlueNRG boards"
18-Sept-2014
11-Mar-2015
Changes
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