Intel CH80566EE014DT Intelâ® atomâ ¢ processor z5xxî sery Datasheet

Intel® Atom™ Processor Z5xx∆
Series
Datasheet
— For the Intel® Atom™ Processor Z560∆, Z550∆, Z540∆, Z530∆,
Z520∆, Z515∆, Z510∆, and Z500∆ on 45 nm Process Technology
June 2010
Document Number: 319535-003US
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∆
Intel processor numbers are not a measure of performance. Processor numbers differentiate features within each processor
family, not across different processor families. See http://www.intel.com/products/processor_number for details.
Intel® Virtualization Technology (Intel® VT) requires a computer system with an enabled Intel® processor, BIOS, virtual machine
monitor (VMM) and, for some uses, certain platform software enabled for it. Functionality, performance or other benefits will vary
depending on hardware and software configurations and may require a BIOS update. Software applications may not be compatible
with all operating systems. Please check with your application vendor.
Hyper-Threading Technology requires a computer system with a processor supporting Hyper-Threading Technology and HT
Technology enabled chipset, BIOS and operating system. Performance will vary depending on the specific hardware and software
you see. See http://www.intel.com/technology/hypertheading/ for more information including details on which processor supports
HT Technology.
Intel®, Intel® AtomTM, Intel® Centrino®, Enhanced Intel SpeedStep® Technology, Intel® Virtualization Technology (Intel® VT),
Intel® Thermal Monitor, Intel® Streaming SIMD Extensions 2 and 3 (Intel® SSE2 and Intel® SSE3), Intel® Burst Performance
Technology (Intel® BPT), Intel® Hyper-Threading Technology (Intel® HT Technology), and the Intel logo are trademarks of Intel
Corporation in the U.S. and other countries.
*Other names and brands may be claimed as the property of others.
Copyright © 2007–2010 Intel Corporation. All rights reserved.
2
Datasheet
Contents
1
Introduction ...................................................................................................... 7
1.1
1.2
1.3
1.4
2
Low Power Features .......................................................................................... 13
2.1
2.2
2.3
2.4
2.5
2.6
3
3.4
3.5
3.6
3.7
3.8
3.9
3.10
3.11
3.12
3.13
4.2
4.3
Package Mechanical Specifications ........................................................... 47
4.1.1
Processor Package Weight ......................................................... 47
Processor Pinout Assignment ................................................................... 49
Signal Description .................................................................................. 56
Thermal Specifications and Design Considerations ................................................ 65
5.1
Datasheet
FSB, GTLREF, and CMREF........................................................................ 27
Power and Ground Pins ........................................................................... 27
Decoupling Guidelines ............................................................................ 28
3.3.1
VCC Decoupling ......................................................................... 28
3.3.2
FSB AGTL+ Decoupling .............................................................. 28
FSB Clock (BCLK[1:0]) and Processor Clocking .......................................... 28
Voltage Identification and Power Sequencing ............................................. 28
Catastrophic Thermal Protection .............................................................. 31
Reserved and Unused Pins ...................................................................... 31
FSB Frequency Select Signals (BSEL[2:0]) ................................................ 31
FSB Signal Groups ................................................................................. 31
CMOS Asynchronous Signals ................................................................... 33
Maximum Ratings .................................................................................. 33
Processor DC Specifications..................................................................... 34
AGTL+ FSB Specifications ....................................................................... 45
Package Mechanical Specifications and Pin Information.......................................... 47
4.1
5
Clock Control and Low-Power States ........................................................ 13
2.1.1
Package/Core Low-Power State Descriptions ................................ 15
Dynamic Cache Sizing ............................................................................ 22
Enhanced Intel SpeedStep® Technology ................................................... 23
Enhanced Low-Power States .................................................................... 24
FSB Low Power Enhancements................................................................. 25
2.5.1
CMOS Front Side Bus ................................................................ 25
Intel® Burst Performance Technology (Intel® BPT) .................................. 26
Electrical Specifications ..................................................................................... 27
3.1
3.2
3.3
4
Abstract ................................................................................................. 7
Major Features ....................................................................................... 7
Terminology ........................................................................................... 9
References ............................................................................................ 11
Thermal
5.1.1
5.1.2
5.1.3
Specifications ............................................................................ 68
Thermal Diode ......................................................................... 68
Intel® Thermal Monitor ............................................................. 70
Digital Thermal Sensor .............................................................. 72
3
5.1.4
5.1.5
Out of Specification Detection .................................................... 72
PROCHOT# Signal Pin ............................................................... 72
Figures
Figure
Figure
Figure
Figure
Figure
Figure
Figure
Figure
Figure
Figure
1. Thread Low-Power States ..................................................................... 14
2. Package Low-Power States ................................................................... 14
3. Deep Power Down Technology Entry Sequence ....................................... 20
4. Deep Power Down Technology Exit Sequence.......................................... 20
5. Exit Latency Table ............................................................................... 21
6. Active Vcc and Icc Loadline..................................................................... 40
7. Deeper Sleep VCC and ICC Loadline ......................................................... 41
8. Package Mechanical Drawing ................................................................ 48
9. Pinout Diagram (Top View, Left Side)..................................................... 49
10. Pinout Diagram (Top View, Right Side) ................................................. 50
Tables
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
Table
4
1.
2.
3.
4.
5.
6.
7.
References .......................................................................................... 11
Coordination of Thread Low-Power States at the Package/Core Level .......... 15
Voltage Identification Definition ............................................................. 29
BSEL[2:0] Encoding for BCLK Frequency ................................................. 31
FSB Pin Groups .................................................................................... 32
Processor Absolute Maximum Ratings ..................................................... 34
Voltage and Current Specifications for the Intel® Atom™ Processor Z560,
Z550, Z540, Z530, Z520, and Z510 ....................................................... 35
8. Voltage and Current Specifications for the Intel® Atom™ Processor Z500 ... 37
9. Voltage and Current Specifications for the Intel® Atom™ Processor Z515 ... 38
10. FSB Differential BCLK Specifications ...................................................... 42
11. AGTL+/CMOS Signal Group DC Specifications ......................................... 43
12. Legacy CMOS Signal Group DC Specifications ......................................... 44
13. Open Drain Signal Group DC Specifications ............................................ 44
14. Pinout Arranged by Signal Name .......................................................... 51
15. Signal Description ............................................................................... 56
16. Power Specifications for Intel® Atom™ Processors Z560, Z550, Z540,
Z530, Z520, and Z510 ........................................................................ 66
17. Power Specifications for Intel® Atom™ Processors Z515 and Z500 ............ 67
18. Thermal Diode Interface ...................................................................... 69
19. Thermal Diode Parameters Using Transistor Model .................................. 69
Datasheet
Revision History
Document
Number
Revision
Number
319535
001
319535
002
Description
Revision Date
• Initial release
April 2008
®
• Updated information about Intel
Z515 and Z550.
Atom processors
March 2009
• Added Intel® Atom processor Z550 specifications to
Table 7
• Changed VccBoot value to VccLFM in Table 7 and
Table 8.
• Added new Table 9, Voltage and Current
Specifications for Intel® Atom processor Z515.
• Removed EMTTM references as it is not a supported
feature.
319535
003
• Added Z560 information
June 2010
• Defeatured and removed mention of C6 Split VTT
§
Datasheet
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6
Datasheet
Introduction
1
Introduction
The Intel® Atom™ processor Z5xx series is built on a new 45-nanometer Hi-k low
power micro-architecture and 45 nm process technology—the first generation of lowpower IA-32 micro-architecture specially designed for the new class of Mobile Internet
Devices (MIDs). The Intel Atom processor Z5xx series supports the Intel® System
Controller Hub (Intel® SCH), a single-chip component designed for low-power
operation.
1.1
Abstract
This document contains electrical, mechanical, and thermal specifications for Intel
Atom processors Z560, Z550, Z540, Z530, Z520, Z515, Z510, and Z500.
Note: In this document, Intel Atom processor Z5xx series refers to the Intel Atom
processors Z560, Z550, Z540, Z530, Z520, Z515, Z510, and Z500.
Note: In this document, the Intel Atom processor Z5xx series is referred to as “processor”.
The Intel® System Controller Hub (Intel® SCH) is referred to as the “Intel® SCH”.
1.2
Major Features
The following list provides some of the key features on this processor:
• New single-core processor for mobile devices offering enhanced performance
• On die, primary 32-kB instructions cache and 24-kB write-back data cache
• 100-MHz and 133-MHz Source-Synchronous front side bus (FSB)
 100 MHz: Intel Atom processor Z515, Z510, and Z500
 133 MHz: Intel Atom processor Z560, Z550, Z540, Z530, and Z520.
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Datasheet
Supports Hyper-Threading Technology 2-threads
On die 512-kB, 8-way L2 cache
Support for IA 32-bit architecture
Intel® Virtualization Technology (Intel® VT)
Intel® Streaming SIMD Extensions 2 and 3 (Intel® SSE2 and Intel® SSE3) and
Supplemental Streaming SIMD Extensions 3 (SSSE3) support
Supports new CMOS FSB signaling for reduced power
Micro-FCBGA8 packaging technologies
Thermal management support using TM1 and TM2
On die Digital Thermal Sensor (DTS) for thermal management support using
Thermal Monitor (TM1 and TM2)
FSB Lane Reversal for flexible routing
Supports C0/C1(e)/C2(e)/C4(e) power states
Intel Deep Power Down Technology (C6)
L2 Dynamic Cache Sizing
Advanced power management features including Enhanced Intel SpeedStep®
Technology
7
Introduction
• Execute Disable Bit support for enhanced security
• Intel® Burst Performance Technology (Intel® BPT) (Intel Atom processor Z515
only)
8
Datasheet
Introduction
1.3
Terminology
Term
Datasheet
Definition
#
A “#” symbol after a signal name refers to an active low signal, indicating
a signal is in the active state when driven to a low level. For example,
when RESET# is low, a reset has been requested. Conversely, when NMI
is high, a non-maskable interrupt has occurred. In the case of signals
where the name does not imply an active state but describes part of a
binary sequence (such as address or data), the “#” symbol implies that
the signal is inverted. For example, D[3:0] = “HLHL” refers to a hex ‘A’,
and D[3:0]# = “LHLH” also refers to a hex “A” (H= High logic level,
L= Low logic level).
Front Side Bus
(FSB)
Refers to the interface between the processor and system core logic (also
known as the Intel® SCH chipset components).
AGTL+
Advanced Gunning Transceiver Logic is used to refer to Assisted GTL+
signaling technology on some Intel processors.
Intel® Burst
Performance
Technology
(Intel® BPT)
Enables on-demand performance, without impacting or raising MID
thermal design point.
BFM
Burst Frequency Mode
CMOS
Complementary Metal-Oxide Semiconductor
Storage
Conditions
Refers to a non-operational state—the processor may be installed in a
platform, in a tray, or loose. Processors may be sealed in packaging or
exposed to free air. Under these conditions, processor landings should
not be connected to any supply voltages, or have any I/Os biased, or
receive any clocks. Upon exposure to “free air” (that is, unsealed
packaging or a device removed from packaging material) the processor
must be handled in accordance with moisture sensitivity labeling (MSL)
as indicated on the packaging material.
Enhanced Intel
SpeedStep®
Technology
Technology that provides power management capabilities to low power
devices.
Processor Core
Processor core die with integrated L1 and L2 cache. All AC timing and
signal integrity specifications are at the pads of the processor core.
Intel
Virtualization
Technology
Processor virtualization which when used in conjunction with Virtual
Machine Monitor software enables multiple, robust independent software
environments inside a single platform.
TDP
Thermal Design Power
VCC
The processor core power supply.
VR
Voltage Regulator
VSS
The processor ground
VCCHFM
VCC at Highest Frequency Mode (HFM)
VCCLFM
VCC at Lowest Frequency Mode (LFM)
9
Introduction
Term
10
Definition
VCC,BOOT
Default VCC Voltage for Initial Power Up
VCCP
AGTL+ Termination Voltage
VCCPC6
AGTL+ Termination Voltage
VCCA
PLL Supply voltage
VCCDPPWDN
VCC at Deep Power Down Technology (C6)
VCCDPRSLP
VCC at Deeper Sleep (C4)
VCCF
Fuse Power Supply
ICCDES
ICCDES for Intel Atom processors Z5xx Series Recommended Design
Target power delivery (Estimated)
ICC
ICC for Intel Atom processors Z5xx Series is the number that can be use
as a reflection on a battery life estimates
IAH,
ICC Auto-Halt
ISGNT
ICC Stop-Grant
IDSLP
ICC Deep Sleep
dICC/dt
VCC Power Supply Current Slew Rate at Processor Package Pin
(Estimated)
ICCA
ICC for VCCA Supply
PAH
Auto Halt Power
PSGNT
Stop Grant Power
PDPRSLP
Deeper Sleep Power
PDC6
Deep Power Down Technology (C6).
TJ
Junction Temperature
Datasheet
Introduction
1.4
References
Material and concepts available in the following documents may be beneficial when
reading this document.
Table 1. References
Document
Document Number
Intel® System Controller Hub (Intel® SCH) Datasheet
http://www.intel.com/desi
gn/chipsets/embedded/S
CHUS15W/techdocs.htm
Intel® Atom™ Processor Z5xx Series Specification Update
http://www.intel.com/desi
gn/chipsets/embedded/S
CHUS15W/techdocs.htm
Intel® 64 and IA-32 Architectures Software Developer's
Manuals
Volume 1: Basic Architecture
http://www.intel.com/pro
ducts/processor/
manuals/index.htm
Volume 2A: Instruction Set Reference, A-M
Volume 2B: Instruction Set Reference, N-Z
Volume 3A: System Programming Guide
Volume 3B: System Programming Guide
AP-485, Intel® Processor Identification and CPUID Instruction
Application Note
http://www.intel.com/desi
gn/processor/applnots/24
1618.htm
§
Datasheet
11
Introduction
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12
Datasheet
Low Power Features
2
Low Power Features
2.1
Clock Control and Low-Power States
The processor supports low power states at the thread level and the core/package
level. Thread states (TCx) loosely correspond to ACPI processor power states (Cx). A
thread may independently enter the TC1/AutoHALT, TC1/MWAIT, TC2, TC4, or TC6
low power states, but this does not always cause a power state transition. Only when
both threads request a low-power state (TCx) greater than the current processor state
will a transition occur. The central power management logic ensures the entire
processor enters the new common processor power state. For processor power states
higher than C1, this would be done by initiating a P_LVLx (P_LVL2 and P_LVL3) I/O
read to the chipset by both threads. Package states are states that require external
intervention and typically map back to processor power states. Package states for the
processor include Normal (C0, C1), Stop Grant and Stop Grant Snoop (C2), Deeper
Sleep (C4), and Deep Power Down Technology (C6).
The processor implements two software interfaces for requesting low power states:
MWAIT instruction extensions with sub-state hints and P_LVLx reads to the ACPI
P_BLK register block mapped in the processor’s I/O address space. The P_LVLx I/O
reads are converted to equivalent MWAIT C-state requests inside the processor and do
not directly result in I/O reads on the processor FSB. The monitor address does not
need to be setup before using the P_LVLx I/O read interface. The sub-state hints used
for each P_LVLx read can be configured in a software programmable MSR by BIOS. If
a thread encounters a chipset break event while STPCLK# is asserted, then it asserts
the PBE# output signal. Assertion of PBE# when STPCLK# is asserted indicates to
system logic that individual threads should return to the C0 state and the processor
should return to the Normal state.
Figure 1 shows the thread low-power states. Figure 2 shows the package low-power
states. Table 2 provides a mapping of thread low-power states to package low power
states.
Datasheet
13
Low Power Features
Figure 1. Thread Low-Power States
Stop
Grant
STPCLK#
de-asserted
STPCLK#
asserted
STPCLK#
de-asserted
C1/
MWAIT
STPCLK#
STPCLK# asserted
de-asserted
STPCLK#
asserted
Core state
break
HLT instruction
MWAIT(C1)
Halt break
C0
P_LVL2 or
MWAIT(C2)
Core State
break
Core state
break
P_LVL4 or
ø
P_LVL6
MWAIT(C4/C6)
†
C1/Auto
Halt
C2
†
C4 /C6
halt break = A20M# transition, INIT#, INTR, NMI, PREQ#, RESET#, SMI#, or APIC interrupt
core state break = (halt break OR Monitor event) AND STPCLK# high (not asserted)
† — STPCLK# assertion and de-assertion have no effect if a core is in C2 or C4.
Ø — P_LVL6 read is issued once the L2 cache is reduced to zero.
Figure 2. Package Low-Power States
SLP# asserted
STPCLK# asserted
Stop
Grant
Normal
STPCLK# de-asserted
Sleep
SLP# de-asserted
Snoop
serviced
DPRSTP# asserted
DPSLP# asserted
Deep
††
Sleep
††
DPSLP# de-asserted
Deeper
†
Sleep
DPRSTP# de-asserted
Snoop
occurs
Stop
Grant
Snoop
† — Deeper Sleep includes the C4 and C6 states
†† — Sleep and Deep Sleep are not states directly supported by the processor, but rather sub-states of Silverthorne’s C4/C6
14
Datasheet
Low Power Features
Table 2. Coordination of Thread Low-Power States at the Package/Core Level
Thread 0
TC0
TC11
TC2
TC4/TC6
TC0
Normal (C0)
Normal (C0)
Normal (C0)
Normal (C0)
TC11
Normal (C0)
AutoHalt (C1)
AutoHalt (C1)
AutoHalt (C1)
TC2
Normal (C0)
AutoHalt (C1)
Stop-Grant (C2)
Stop-Grant (C2)
TC4/TC6
Normal (C0)
AutoHalt (C1)
Stop-Grant (C2)
Deeper Sleep
(C4)/Deep Power
Down (C6)
Thread 1
NOTE:
AutoHalt or MWAIT/C1
To enter a package/core state, both threads must share a common low power state. If
the threads are not in a common low power state, the package state will resolve to
the highest common power C-state.
2.1.1
Package/Core Low-Power State Descriptions
The following state descriptions assume that both threads are in a common low power
state. For cases when only one thread is in a low power state no change in power
state will occur.
2.1.1.1
Normal States (C0, C1)
These are the normal operating states for the processor. The processor remains in the
Normal state when the processor/core is in the C0, C1/AutoHALT, or C1/MWAIT
states. C0 is the active execution state.
2.1.1.1.1
C1/AutoHalt Powerdown State
C1/AutoHALT is a low-power state entered when one thread executes the HALT
instruction while the other is in the TC1 or greater thread state. The processor will
transition to the C0 state upon occurrence of SMI#, INIT#, LINT[1:0] (NMI, INTR), or
FSB interrupt messages. RESET# will cause the processor to immediately initialize
itself.
A System Management Interrupt (SMI) handler will return execution to either Normal
state or the AutoHALT Powerdown state. See the Intel® 64 and IA-32 Architectures
Software Developer's Manuals, Volume 3A/3B: System Programmer's Guide for more
information.
The system can generate a STPCLK# while the processor is in the AutoHALT
Powerdown state. When the system de-asserts the STPCLK# interrupt, the processor
will return to the HALT state.
While in AutoHALT Powerdown state, the processor will process bus snoops. The
processor will enter an internal snoopable sub-state (not shown in Figure 1) to process
the snoop and then return to the AutoHALT Powerdown state.
Datasheet
15
Low Power Features
2.1.1.1.2
C1/MWAIT Powerdown State
C1/MWAIT is a low-power state entered when one thread executes the MWAIT(C1)
instruction while the other thread is in the TC1 or greater thread state. Processor
behavior in the MWAIT state is identical to the AutoHALT state except that Monitor
events can cause the processor to return to the C0 state. See the Intel® 64 and IA-32
Architectures Software Developer's Manuals, Volume 2A: Instruction Set Reference, AM and Volume 2B: Instruction Set Reference, N-Z, for more information.
2.1.1.2
C2 State
Individual threads of the dual-threaded processor can enter the TC2 state by initiating
a P_LVL2 I/O read to the P_BLK or an MWAIT(C2) instruction. Once both threads have
C2 as a common state, the processor will transition to the C2 state—however, the
processor will not issue a Stop-Grant Acknowledge special bus cycle unless the
STPCLK# pin is also asserted by the chipset.
While in the C2 state, the processor will process bus snoops. The processor will enter
a snoopable sub-state described the following section (and shown in Figure 1), to
process the snoop and then return to the C2 state.
2.1.1.2.1
Stop-Grant State
When the STPCLK# pin is asserted, each thread of the processors enters the StopGrant state within 1384 bus clocks after the response phase of the processor-issued
Stop-Grant Acknowledge special bus cycle. When the STPCLK# pin is de-asserted, the
core returns to its previous low-power state.
Since the AGTL+ signal pins receive power from the FSB, these pins should not be
driven (allowing the level to return to VCCP) for minimum power drawn by the
termination resistors in this state. In addition, all other input pins on the FSB should
be driven to the inactive state.
RESET# causes the processor to immediately initialize itself, but the processor will
stay in Stop-Grant state. When RESET# is asserted by the system, the STPCLK#,
SLP#, DPSLP#, and DPRSTP# pins must be de-asserted prior to RESET# de-assertion.
When re-entering the Stop-Grant state from the Sleep state, STPCLK# should be deasserted after the de-assertion of SLP#.
While in Stop-Grant state, the processor will service snoops and latch interrupts
delivered on the FSB. The processor will latch SMI#, INIT#, and LINT[1:0] interrupts
and will service only one of each upon return to the Normal state.
The PBE# signal may be driven when the processor is in Stop-Grant state. The PBE#
signal will be asserted if there is any pending interrupt or Monitor event latched within
the processor. Pending interrupts that are blocked by the EFLAGS.IF bit being clear
will still cause assertion of PBE#. Assertion of PBE# indicates to system logic that the
entire processor should return to the Normal state.
A transition to the Stop-Grant Snoop state occurs when the processor detects a snoop
on the FSB (see Section 2.1.1.2.2). A transition to the Sleep state (see
Section 2.1.1.3.1) occurs with the assertion of the SLP# signal.
16
Datasheet
Low Power Features
2.1.1.2.2
Stop-Grant Snoop State
The processor responds to snoop or interrupt transactions on the FSB while in StopGrant state by entering the Stop-Grant Snoop state. The processor will stay in this
state until the snoop on the FSB has been serviced (whether by the processor or
another agent on the FSB) or the interrupt has been latched. The processor returns to
the Stop-Grant state once the snoop has been serviced or the interrupt has been
latched.
2.1.1.3
C4 State
Individual threads of the processor can enter the C4 state by initiating a P_LVL4 I/O
read to the P_BLK or an MWAIT(C4) instruction. Attempts to request C3 will also
covert to C4 requests. If both processor threads are in C4, the central power
management logic will request that the entire processor enter the Deeper Sleep
package low-power state using the sequence through the Sleep and Deep Sleep states
all described in the following sections.
To enable the package level Intel Enhanced Deeper Sleep state, Dynamic Cache Sizing
and Intel Enhanced Deeper Sleep state fields must be configured in the
PMG_CST_CONFIG_CONTROL MSR. Refer to Section 2.1.1.3.3 for further details on
Intel Enhanced Deeper Sleep state.
2.1.1.3.1
Sleep State
The Sleep state is a low-power state in which the processor maintains its context,
maintains the phase-locked loop (PLL), and stops all internal clocks. The Sleep state is
entered through assertion of the SLP# signal while in the Stop-Grant state and is only
a transition state for Intel Atom processor Z5xx series. The SLP# pin should only be
asserted when the processor is in the Stop-Grant state. SLP# assertion while the
processor is not in the Stop-Grant state is out of specification and may result in
unapproved operation.
In the Sleep state, the processor is incapable of responding to snoop transactions or
latching interrupt signals. No transitions or assertions of signals (with the exception of
SLP#, DPSLP#, or RESET#) are allowed on the FSB while the processor is in Sleep
state. Snoop events that occur while in Sleep state or during a transition into or out of
Sleep state will cause unpredictable behavior. Any transition on an input signal before
the processor has returned to the Stop-Grant state will result in unpredictable
behavior.
If RESET# is driven active while the processor is in the Sleep state, and held active as
specified in the RESET# pin specification, then the processor will reset itself, ignoring
the transition through Stop-Grant state. If RESET# is driven active while the processor
is in the Sleep state, the SLP# and STPCLK# signals should be de-asserted
immediately after RESET# is asserted to ensure the processor correctly executes the
Reset sequence.
While in the Sleep state, the processor is capable of entering an even lower power
state, the Deep Sleep state, by asserting the DPSLP# pin (see Section 2.1.1.3.2).
While the processor is in the Sleep state, the SLP# pin must be de-asserted if another
asynchronous FSB event occurs.
Datasheet
17
Low Power Features
2.1.1.3.2
Deep Sleep State
The Deep Sleep state is entered through assertion of the DPSLP# pin while in the
Sleep state and is also only a transition state for the Intel Atom processor Z5xx series.
BCLK may be stopped during the Deep Sleep state for additional platform level power
savings. As an example, BCLK stop/restart timings on appropriate chipset-based
platforms with the CK540 clock chip are as follows:
• Deep Sleep entry: the system clock chip may stop/tristate BCLK within 2 BCLKs
of DPSLP# assertion. It is permissible to leave BCLK running during Deep Sleep.
• Deep Sleep exit: the system clock chip must start toggling BCLK within 10 BCLK
periods within DPSLP# de-assertion.
To re-enter the Sleep state, the DPSLP# pin must be de-asserted. BCLK can be restarted after DPSLP# de-assertion as described above. A period of 15 microseconds
(to allow for PLL stabilization) must occur before the processor can be considered to
be in the Sleep state. Once in the Sleep state, the SLP# pin must be de-asserted to
re-enter the Stop-Grant state.
While in Deep Sleep state, the processor is incapable of responding to snoop
transactions or latching interrupt signals. No transitions of signals are allowed on the
FSB while the processor is in Deep Sleep state. When the processor is in Deep Sleep
state, it will not respond to interrupts or snoop transactions. Any transition on an
input signal before the processor has returned to Stop-Grant state will result in
unpredictable behavior.
2.1.1.3.3
Deeper Sleep State
The Deeper Sleep state is similar to the Deep Sleep state, but further reduces core
voltage levels. One of the potential lower core voltage levels is achieved by entering
the base Deeper Sleep state. The Deeper Sleep state is entered through assertion of
the DPRSTP# pin while in the Deep Sleep state. The following lower core voltage level
is achieved by entering the Intel Enhanced Deeper Sleep state which is a sub-state of
Deeper Sleep state. Intel Enhanced Deeper Sleep state is entered through assertion of
the DPRSTP# pin while in the Deep Sleep only when the L2 cache has been completely
shut down. Refer to Section 2.1.1.3.4 for further details on reducing the L2 cache and
entering Intel Enhanced Deeper Sleep state.
In response to entering Deeper Sleep, the processor drives the VID code
corresponding to the Deeper Sleep core voltage on the VID[6:0] pins.
Exit from Deeper Sleep or Intel Enhanced Deeper Sleep state is initiated by DPRSTP#
de-assertion when the core requests a package state other than C4 or the core
requests a processor performance state other than the lowest operating point.
18
Datasheet
Low Power Features
2.1.1.3.4
Intel® Atom™ Processor Z5xx Series C5
As mentioned previously in this document, each C-state has latency and transitory
power costs associated with entering/exiting idle states. When the processor is
interrupted, it must awake to service requests. If these requests occur at a high
frequency, it is possible that more power will be consumed entering/exiting the states
than will be saved. To alleviate this concern, the Intel Atom processor Z5xx series
implements a new state called “Intel Atom processor Z5xx series C5”. The Intel Atom
processor Z5xx series C5 is not exposed to software. The only way to enter the C5
state is using a hardware promotion of C4 (with the cache ways shrunk to zero).
When the processor is in C4, the chipset assumes the processor has data in its cache.
Often, the processor has fully flushed its cache. To avoid waking up the processor to
service snoops when there is no data in its caches, the processor will automatically
promote C4 requests to C5 (when the cache is flushed). The chipset treats C5 as a
non-snoopable state. Therefore, all snoops will be completed from the I/O DMA
masters without waking up the processor.
While similar, the Intel Atom processor Z5xx series C5 differs from the Core 2 Duo
T5000/T7000 C5 implementation. In the Intel Atom processor Z5xx series C5, the VCC
will not be powered below the retention of caches voltage— there is no need to
initialize the processor’s caches on a C5 exit, and C5 is not architecturally enumerated
to software. This state is the same as the Intel Atom processor Z5xx series C5 state.
2.1.1.4
C6 State
C6 is a new low power state being introduced on the Intel Atom processor Z5xx
series. C6 behavior is the same as Intel Enhanced Deeper Sleep with the addition of
an on-die SRAM. This memory saves the processor state allowing the processor to
lower its main core voltage closer to 0 V. It is important to note that VCC cannot be
lower while only 1 (one) thread is in C6 state.
The processor threads can enter the C6 state by initiating a P_LVL6 I/O read to the
P_BLK or an MWAIT(C6) instruction. To enter C6, the processor’s caches must be
flushed. The primary method to enter C6 used by newer operating systems (that
support MWAIT) will be through the MWAIT instruction.
When the thread enters C6, it saves the processor state that is relevant to the
processor context in an on-die SRAM that resides on a separate power plane VCCP (I/O
power supply). This allows the core VCC to be lowered to any arbitrary voltage
including 0 V. The microcode performs the save and restore of the processor state on
entry and exit from C6 respectively.
Datasheet
19
Low Power Features
2.1.1.4.1
Intel® Deep Power Down Technology State (Package C6 State)
When both threads have entered the C6 state and the L2 cache has been shrunk down
to zero ways, the processor will enter the Package Deep Power Down Technology
state. To do so, the processor saves its architectural states in the on-die SRAM that
resides in the VCCP domain. At this point, the core VCC will be dropped to the lowest
core voltage (closer to 0.3 V). The processor is now in an extremely low-power state.
While in this state, the processor does not need to be snooped as all the caches were
flushed before entering the C6 state.
The Deep Power Down Technology exit sequence is triggered by the chipset when it
detects a break event. It de-asserts the DPRSTP#, DPSLP#, SLP#, and STPCLK# pins
to return to C0. At DPSLP# de-assertion, the core VCC ramps up to the LFM value and
the processor starts up its internal PLLs. At SLP# de-assertion the processor is reset
and the architectural state is read back into the threads from an on-die SRAM.
Refer to Figure 3 and Figure 4 for Deep Power Down Technology entry sequence and
exit sequences.
Figure 3. Deep Power Down Technology Entry Sequence
Thread 1
TC1
MWAIT C6
or Level 6
I/O Read
State
Save
TC6
Level 6
I/O Read
Thread 0
TC0
MWAIT C6
or Level 6
I/O Read
NOTE:
L2
Shrink
State
Save
STPCLK#
assert
SLP#
assert
DPSLP#
assert
DPRSTP#
assert
Package
C6
TC6
Deep Power Down Technology is referred to as C6 in the above figure.
Figure 4. Deep Power Down Technology Exit Sequence
Ucode reset
and state
restore
(TC1)
Package
C6
DPRST#
deassert
DPSL#
deassert
H/W
Reset
SLP#
deassert
Ucode reset
and state
restore
(TC0)
20
TC0
STPCLK#
deassert
TC0
Datasheet
Low Power Features
Figure 5 shows the relative exit latencies of the package sleep states discussed above.
Note: Figure 5 uses pre-silicon estimates. Silicon based data will be provided in a future
revision of this document.
Figure 5. Exit Latency Table
C0 (HFM)
Power (W)
TDP
C2
C1
Similar to C1 but Intel®
SCH blocks interrupts
Both threads halted
Most clocks off
C0 (LFM)
C1E
C1 plus frequency and
VID at LFM
C4
C2 plus PLLs off; VID =
cache retention Vcc
Some L2 cache off
C6
C2 plus PLLs off; VID =
C6 powerdown Vcc
L2 cache off
0
0
0.1
1
10
100
Latency (µs)
Datasheet
21
Low Power Features
2.2
Dynamic Cache Sizing
Dynamic Cache Sizing allows the processor to flush and disable a programmable
number of L2 cache ways upon each Deeper Sleep entry under the following
conditions:
• The C0 timer that tracks continuous residency in the Normal package state has
not expired. This timer is cleared during the first entry into Deeper Sleep to allow
consecutive Deeper Sleep entries to shrink the L2 cache as needed.
• The FSB speed to processor core speed ratio is below the predefined L2 shrink
threshold.
The number of L2 cache ways disabled upon each Deeper Sleep entry is configured in
the BBL_CR_CTL3 MSR. The C0 timer is referenced through the
CLOCK_CORE_CST_CONTROL_STT MSR. The shrink threshold under which the L2
cache size is reduced is configured in the PMG_CST_CONFIG_CONTROL MSR. If the
FSB speed to processor core speed ratio is above the predefined L2 shrink threshold,
then L2 cache expansion will be requested. If the ratio is zero, then the ratio will not
be taken into account for Dynamic Cache Sizing decisions.
Upon STPCLK# de-assertion, the core exiting Intel Enhanced Deeper Sleep state or C6
will expand the L2 cache to two ways and invalidate previously disabled cache ways. If
the L2 cache reduction conditions stated above still exist when the core returns to C4
then package enters Intel Enhanced Deeper Sleep state or C6, then the L2 will be
shrunk to zero again. If the core requests a processor performance state resulting in a
higher ratio than the predefined L2 shrink threshold, the C0 timer expires, and then
the whole L2 will be expanded upon the next interrupt event.
In addition, the processor supports Full Shrink on L2 cache. When the MWAIT C6
instruction is executed with a hint=0x2 in ECX[3:0], the micro code will shrink all the
active ways of the L2 cache in one step. This ensures that the package enters C6
immediately when it is in TC6 instead of iterating until the cache is reduced to zero.
The operating system (OS) is expected to use this hint when it wants to enter the
lowest power state and can tolerate the longer entry latency.
L2 cache shrink prevention may be enabled as needed on occasion through an
MWAIT(C4) sub-state field. If shrink prevention is enabled, the processor does not
enter Intel Deeper Sleep state or C6 since the L2 cache remains valid and in full size.
22
Datasheet
Low Power Features
2.3
Enhanced Intel SpeedStep® Technology
The processor features Enhanced Intel SpeedStep® Technology. The following are the
key features of Enhanced Intel SpeedStep® Technology:
• Multiple voltage and frequency operating points providing optimal performance at
the lowest power.
• Voltage and frequency selection is software controlled by writing to processor
MSRs:
 If the target frequency is higher than the current frequency, VCC is ramped up
in steps by placing new values on the VID pins and the PLL then locks to the
new frequency.
 If the target frequency is lower than the current frequency, the PLL locks to
the new frequency and the VCC is changed through the VID pin mechanism.
 Software transitions are accepted at any time. If a previous transition is in
progress, the new transition is deferred until the previous transition
completes.
• The processor controls voltage ramp rates internally to ensure glitch free
transitions.
• Low transition latency and a large number of transitions are possible per second:
 Processor core (including L2 cache) is unavailable for up to 10 µs during the
frequency transition.
— The bus protocol (BNR# mechanism) is used to block snooping.
• Improved Intel Thermal Monitor mode:
 When the on-die thermal sensor indicates that the die temperature is too high,
the processor can automatically perform a transition to a lower frequency and
voltage specified in a software programmable MSR.
 The processor waits for a fixed time period. If the die temperature is down to
acceptable levels, an up transition to the previous frequency and voltage point
occurs.
 An interrupt is generated for the up and down Intel Thermal Monitor
transitions enabling better system level thermal management.
• Enhanced thermal management features:
 Digital Thermal Sensor and Out of Specification detection
 Intel Thermal Monitor 1 (TM1) in addition to Intel Thermal Monitor 2 (TM2) in
case of unsuccessful TM2 transition.
Datasheet
23
Low Power Features
2.4
Enhanced Low-Power States
Enhanced low-power states (C1E, C2E, and C4E) optimize for power by forcibly
reducing the performance state of the processor when it enters a package low-power
state. Instead of directly transitioning into the package low-power state, the enhanced
package low-power state first reduces the performance state of the processor by
performing an Enhanced Intel SpeedStep Technology transition down to the lowest
operating point. Upon receiving a break event from the package low-power state,
control will be returned to software while an Enhanced Intel SpeedStep Technology
transition up to the initial operating point occurs. The advantage of this feature is that
it significantly reduces leakage while in the Stop-Grant and Deeper Sleep states.
Note: Long-term reliability cannot be assured unless all the Enhanced Low-Power States are
enabled.
The processor implements two software interfaces for requesting enhanced package
low-power states: MWAIT instruction extensions with sub-state hints and using BIOS
by configuring IA32_MISC_ENABLES MSR bits to automatically promote package lowpower states to enhanced package low-power states.
Caution: Enhanced Stop-Grant and Enhanced Deeper Sleep must be enabled using the
BIOS for the processor to remain within specification. Not complying with this
guideline may affect the long-term reliability of the processor.
Enhanced Intel SpeedStep® Technology transitions are multi-step processes that
require clocked control. These transitions cannot occur when the processor is in the
Sleep or Deep Sleep package low-power states since processor clocks are not active in
these states. Enhanced Deeper Sleep is an exception to this rule when the Hard C4E
configuration is enabled in the IA32_MISC_ENABLES MSR. This Enhanced Deeper
Sleep state configuration will lower core voltage to the Deeper Sleep level while in
Deeper Sleep and, upon exit, will automatically transition to the lowest operating
voltage and frequency to reduce snoop service latency. The transition to the lowest
operating point or back to the original software requested point may not be
instantaneous. Furthermore, upon very frequent transitions between active and idle
states, the transitions may lag behind the idle state entry resulting in the processor
either executing for a longer time at the lowest operating point or running idle at a
high operating point. Observations and analyses show this behavior should not
significantly impact total power savings or performance score while providing power
benefits in most other cases.
24
Datasheet
Low Power Features
2.5
FSB Low Power Enhancements
The processor incorporates FSB low power enhancements:
• BPRI# control for address and control input buffers
• Dynamic Bus Parking
• Dynamic On Die Termination disabling
• Low VCCP (I/O termination voltage)
• CMOS Front Side Bus
The processor incorporates the DPWR# signal that controls the data bus input buffers
on the processor. The DPWR# signal disables the buffers when not used and activates
them only when data bus activity occurs, resulting in significant power savings with no
performance impact. BPRI# control also allows the processor address and control
input buffers to be turned off when the BPRI# signal is inactive. Dynamic Bus Parking
allows a reciprocal power reduction in chipset address and control input buffers when
the processor de-asserts its BR0# pin. The On-Die Termination on the processor FSB
buffers is disabled when the signals are driven low, resulting in additional power
savings. The low I/O termination voltage is on a dedicated voltage plane independent
of the core voltage, enabling low I/O switching power at all times.
2.5.1
CMOS Front Side Bus
The processor has a hybrid signaling mode—where data and address busses run in
CMOS mode and strobe signals operate in GTL mode. The reason to use GTL on strobe
signals is to improve signal integrity. The implementation of a CMOS bus offers
substantial power savings when compared with the traditional AGTL+ bus.
Datasheet
25
Low Power Features
2.6
Intel® Burst Performance Technology
(Intel® BPT)
The processor supports ACPI Performance States (P-States). The P-state referred to
as P0 will be a request for Intel® Burst Performance Technology (Intel® BPT). Intel
BPT opportunistically, and automatically, allows the processor to run faster than the
marked frequency if the part is operating within the thermal design limits of the
platform. Intel BPT mode provides more performance on demand without impacting or
raising MID thermals. Intel BPT can be enabled or disabled by BIOS.
§
26
Datasheet
Electrical Specifications
3
Electrical Specifications
This chapter contains signal group descriptions, absolute maximum ratings, voltage
identification, and power sequencing. The chapter also includes DC specifications.
3.1
FSB, GTLREF, and CMREF
The processor supports two kinds of signalling protocol: Complementary Metal Oxide
Semiconductor (CMOS), and Advanced Gunning Transceiver Logic (AGTL+).
The “CMOS FSB” terminology used in this document refers to a hybrid signaling mode,
where data and address busses run in CMOS mode and strobe signals operate in GTL
mode. The reason to use GTL on strobe signals is to improve signal integrity.
The termination voltage level for the processor CMOS and AGTL+ signals is
VCCP = 1.05 V (nominal). Due to speed improvements to data and address bus, signal
integrity and platform design methods have become more critical than with previous
processor families.
The CMOS data and address busses require a reference voltage (CMREF) that is used
by the receivers to determine if a signal is a logical 0 or a logical 1. CMREF is only
applicable to data and address signals—not to the sideband signals listed in Table 5.
CMREF must be generated on the system board. In CMOS mode, there is no receiverside termination to I/O voltage (VCCP).
The AGTL+ inputs, including the sideband signals listed in Table 5, require a reference
voltage (GTLREF) that is used by the receivers to determine if a signal is a logical 0 or
a logical 1. GTLREF must be generated on the system board. Termination resistors are
provided on the processor silicon and are terminated to its I/O voltage (VCCP). The
appropriate chipset will also provide on-die termination, thus eliminating the need to
terminate the bus on the system board for most AGTL+ signals.
The CMOS bus depends on reflected wave switching and the AGTL+ bus depends on
incident wave switching. Timing calculations for CMOS and AGTL+ signals are based
on flight time as opposed to capacitive deratings. Analog signal simulation of the FSB,
including trace lengths, is highly recommended when designing a system.
3.2
Power and Ground Pins
For clean, on-chip power distribution, the processor will have a large number of VCC
(power) and VSS (ground) inputs. All power pins must be connected to VCC power
planes while all VSS pins must be connected to system ground planes. Use of multiple
power and ground planes is recommended to reduce I*R drop. The processor VCC pins
must be supplied by the voltage determined by the VID (Voltage ID) pins.
Datasheet
27
Electrical Specifications
3.3
Decoupling Guidelines
Due to its large number of transistors and high internal clock speeds, the processor is
capable of generating large average current swings between low and full power states.
This may cause voltages on power planes to sag below their minimum values if bulk
decoupling is not adequate. Larger bulk storage, such as electrolytic capacitors,
supplies current during longer lasting changes in current demand by the component
(such as, coming out of an idle condition). Similarly, they act as storage well for
current when entering an idle condition from a running condition. Care must be taken
in the board design to ensure that the voltage provided to the processor remains
within the specifications listed in Table 7, Table 7, and Table 7. Failure to do so can
result in timing violations or reduced lifetime of the component.
3.3.1
VCC Decoupling
VCC regulator solutions need to provide bulk capacitance with a low Effective Series
Resistance (ESR) and keep a low interconnect resistance from the regulator to the
socket. Bulk decoupling for the large current swings when the part is powering on or
entering/exiting low-power states must be provided by the voltage regulator solution.
3.3.2
FSB AGTL+ Decoupling
The processor integrates signal termination on the die. Decoupling must also be
provided by the system motherboard for proper AGTL+ bus operation.
3.4
FSB Clock (BCLK[1:0]) and Processor Clocking
BCLK[1:0] directly controls the FSB interface speed as well as the core frequency of
the processor. As in previous generation processors, the processor core frequency is a
multiple of the BCLK[1:0] frequency. The processor bus ratio multiplier will be set at
its default ratio at manufacturing. The processor uses a differential clocking
implementation.
3.5
Voltage Identification and Power Sequencing
The processor uses seven voltage identification pins (VID[6:0]) to support automatic
selection of power supply voltages. The VID pins for the processor are CMOS outputs
driven by the processor VID circuitry. Table 3 specifies the voltage level corresponding
to the state of VID[6:0]. A “1” (one) in this refers to a high-voltage level and a “0”
(zero) refers to low-voltage level.
Power source characteristics must be stable whenever the supply to the voltage
regulator is stable.
28
Datasheet
Electrical Specifications
Table 3. Voltage Identification Definition
Datasheet
VID6
VID5
VID4
VID3
VID2
VID1
VID0
VCC (V)
0
0
1
1
0
0
0
1.2000
0
0
1
1
0
0
1
1.1875
0
0
1
1
0
1
0
1.1750
0
0
1
1
0
1
1
1.1625
0
0
1
1
1
0
0
1.1500
0
0
1
1
1
0
1
1.1375
0
0
1
1
1
1
0
1.1250
0
0
1
1
1
1
1
1.1125
0
1
0
0
0
0
0
1.1000
0
1
0
0
0
0
1
1.0875
0
1
0
0
0
1
0
1.0750
0
1
0
0
0
1
1
1.0625
0
1
0
0
1
0
0
1.0500
0
1
0
0
1
0
1
1.0375
0
1
0
0
1
1
0
1.0250
0
1
0
0
1
1
1
1.0125
0
1
0
1
0
0
0
1.0000
0
1
0
1
0
0
1
0.9875
0
1
0
1
0
1
0
0.9750
0
1
0
1
0
1
1
0.9625
0
1
0
1
1
0
0
0.9500
0
1
0
1
1
0
1
0.9375
0
1
0
1
1
1
0
0.9250
0
1
0
1
1
1
1
0.9125
0
1
1
0
0
0
0
0.9000
0
1
1
0
0
0
1
0.8875
0
1
1
0
0
1
0
0.8750
0
1
1
0
0
1
1
0.8625
0
1
1
0
1
0
0
0.8500
0
1
1
0
1
0
1
0.8375
0
1
1
0
1
1
0
0.8250
0
1
1
0
1
1
1
0.8125
0
1
1
1
0
0
0
0.8000
0
1
1
1
0
0
1
0.7875
0
1
1
1
0
1
0
0.7750
0
1
1
1
0
1
1
0.7625
0
1
1
1
1
0
0
0.7500
0
1
1
1
1
0
1
0.7375
29
Electrical Specifications
30
VID6
VID5
VID4
VID3
VID2
VID1
VID0
VCC (V)
0
1
1
1
1
1
0
0.7250
0
1
1
1
1
1
1
0.7125
1
0
0
0
0
0
0
0.7000
1
0
0
0
0
0
1
0.6875
1
0
0
0
0
1
0
0.6750
1
0
0
0
0
1
1
0.6625
1
0
0
0
1
0
0
0.6500
1
0
0
0
1
0
1
0.6375
1
0
0
0
1
1
0
0.6250
1
0
0
0
1
1
1
0.6125
1
0
0
1
0
0
0
0.6000
1
0
0
1
0
0
1
0.5875
1
0
0
1
0
1
0
0.5750
1
0
0
1
0
1
1
0.5625
1
0
0
1
1
0
0
0.5500
1
0
0
1
1
0
1
0.5375
1
0
0
1
1
1
0
0.5250
1
0
0
1
1
1
1
0.5125
1
0
1
0
0
0
0
0.5000
1
0
1
0
0
0
1
0.4875
1
0
1
0
0
1
0
0.4750
1
0
1
0
0
1
1
0.4625
1
0
1
0
1
0
0
0.4500
1
0
1
0
1
0
1
0.4375
1
0
1
0
1
1
0
0.4250
1
0
1
0
1
1
1
0.4125
1
0
1
1
0
0
0
0.4000
1
0
1
1
0
0
1
0.3875
1
0
1
1
0
1
0
0.3750
1
0
1
1
0
1
1
0.3625
1
0
1
1
1
0
0
0.3500
1
0
1
1
1
0
1
0.3375
1
0
1
1
1
1
0
0.3250
1
0
1
1
1
1
1
0.3125
1
1
0
0
0
0
0
0.3000
Datasheet
Electrical Specifications
3.6
Catastrophic Thermal Protection
The processor supports the THERMTRIP# signal for catastrophic thermal protection.
An external thermal sensor should also be used to protect the processor and the
system against excessive temperatures. Even with the activation of THERMTRIP#,
which halts all processor internal clocks and activity, leakage current can be high
enough such that the processor cannot be protected in all conditions without the
removal of power to the processor. If the external thermal sensor detects a
catastrophic processor temperature of 120°C (maximum), or if the THERMTRIP#
signal is asserted, the VCC supply to the processor must be turned off within 500 ms to
prevent permanent silicon damage due to thermal runaway of the processor.
THERMTRIP# functionality is not ensured if the PWRGOOD signal is not asserted.
3.7
Reserved and Unused Pins
RSVD[3:0] must be tied directly to VCCP (1.05 V)—non C6 rail to ensure proper
operation of the processor. All other RSVD signals can be left as No Connect.
Connection of these pins to VCC, VSS, or to any other signal (including each other) can
result in component malfunction or incompatibility with future processors. See
Section 4.2 for a pin listing of the processor and the location of all RSVD pins.
For reliable operation, always connect unused inputs or bidirectional signals to an
appropriate signal level. Unused active low AGTL+ inputs may be left as no connects if
AGTL+ termination is provided on the processor silicon. Unused active high inputs
should be connected through a resistor to ground (VSS). Unused outputs can be left
unconnected.
3.8
FSB Frequency Select Signals (BSEL[2:0])
The BSEL[2:0] signals are used to select the frequency of the processor input clock
(BCLK[1:0]). These signals should be connected to the clock chip and the appropriate
chipset on the platform. The BSEL encoding for BCLK[1:0] is shown in Table 4.
Table 4. BSEL[2:0] Encoding for BCLK Frequency
BSEL[2]
BSEL[1]
BSEL[0]
BCLK Frequency
L
L
H
133 MHz
H
L
H
100 MHz
NOTE:
3.9
All other bus selections reserved.
FSB Signal Groups
To simplify the following discussion, the FSB signals have been combined into groups
by buffer type. AGTL+ input signals have differential input buffers, which use GTLREF
as a reference level. In this document, the term “AGTL+ Input” refers to the AGTL+
input group as well as the AGTL+ I/O group when receiving. Similarly, “AGTL+
Output” refers to the AGTL+ output group as well as the AGTL+ I/O group when
driving.
Datasheet
31
Electrical Specifications
Implementation of a source synchronous data bus determines the need to specify two
sets of timing parameters. One set is for common clock signals which are dependent
upon the rising edge of BCLK0 (ADS#, HIT#, HITM#, and so on.) and the second set
is for the source synchronous signals which are relative to their respective strobe lines
(data and address) as well as the rising edge of BCLK0. Asynchronous signals are still
present (A20M#, IGNNE#, and so on.) and can become active at any time during the
clock cycle. Table 5 identifies which signals are common clock, source synchronous,
and asynchronous.
Table 5. FSB Pin Groups
Signal Group
Type
Signals1
AGTL+ Common
Clock Input
Synchronous
to BCLK[1:0]
BPRI#, DEFER#, PREQ#4, RESET#, RS[2:0]#,
TRDY#, DPWR#
AGTL+ Common
Clock I/O
Synchronous
to BCLK[1:0]
ADS#, BNR#, BPM[3:0]#, BR0#, DBSY#, DRDY#,
HIT#, HITM#, LOCK#, PRDY#
CMOS Source
Synchronous I/O
Synchronous
to assoc.
strobe
Signals
Associated Strobe
REQ[4:0]#, A[16:3]#
ADSTB0#
A[31:17]#
ADSTB1#
D[15:0]#
DSTBP0#, DSTBN0#
D[31:16]#
DSTBP1#, DSTBN1#
D[47:32]#
DSTBP2#, DSTBN2#
D[63:48]#
DSTBP3#, DSTBN3#
Strobes always use AGTL signaling—data pins are
CMOS only.
AGTL+ Strobes
Synchronous
to BCLK[1:0]
ADSTB[1:0]#, DSTBP[3:0]#, DSTBN[3:0]#
CMOS Input
Asynchronous
DPRSTP#, DPSLP#, IGNNE#, INIT#, LINT0/INTR,
LINT1/ NMI, PWRGOOD, SMI#, SLP#, STPCLK#
Open Drain Output
Asynchronous
FERR#, THERMTRIP#, IERR#
Open Drain I/O
Asynchronous
PROCHOT#3
CMOS Output
Asynchronous
VID[6:0], BSEL[2:0]
CMOS Input
Synchronous
to TCK
TCK, TDI, TMS, TRST#
Open Drain Output
Synchronous
to TCK
FSB Clock
Clock
Power/Other
TDO
BCLK[1:0]
COMP[3:0], HFPLL, CMREF, GTLREF, /DCLK, /ADK,
THERMDA, THERMDC, VCC, VCCA, VCCP,
VCC_SENSE, VSS, VSS_SENSE, VCCFUSE, VCCPC6
NOTES:
1.
Refer to Chapter 4 for signal descriptions and termination requirements.
2.
In processor systems where there is no debug port implemented on the system board,
these signals are used to support a debug port interposer. In systems with the debug
port implemented on the system board, these signals are no connects.
3.
PROCHOT# signal type is open drain output and CMOS input.
4.
On die termination differs from other AGTL+ signals.
32
Datasheet
Electrical Specifications
3.10
CMOS Asynchronous Signals
CMOS input signals are shown in Table 5. Legacy output FERR#, IERR#, and other
non- AGTL+ signals (THERMTRIP# and PROCHOT#) use Open Drain output buffers.
These signals do not have setup or hold time specifications in relation to BCLK[1:0].
However, all of the CMOS signals are required to be asserted for more than 5 BCLKs
for the processor to recognize them. See Section 3.12 for the DC specifications for the
CMOS signal groups.
3.11
Maximum Ratings
Table 6 specifies absolute maximum and minimum ratings. Within functional operation
limits, functionality and long-term reliability can be expected.
At conditions outside functional operation condition limits, but within absolute
maximum and minimum ratings, neither functionality nor long term reliability can be
expected. If a device is returned to conditions within functional operation limits after
having been subjected to conditions outside these limits, but within the absolute
maximum and minimum ratings, the device may be functional, but with its lifetime
degraded depending on exposure to conditions exceeding the functional operation
condition limits.
At conditions exceeding absolute maximum and minimum ratings, neither functionality
nor long term reliability can be expected. Moreover, if a device is subjected to these
conditions for any length of time then, when returned to conditions within the
functional operating condition limits, it will either not function or its reliability will be
severely degraded.
Although the processor contains protective circuitry to resist damage from static
electric discharge, precautions should always be taken to avoid high static voltages or
electric fields.
Datasheet
33
Electrical Specifications
Table 6. Processor Absolute Maximum Ratings
Symbol
Parameter
Min.
Max.
Unit
Notes1
TSTORAGE
Processor Storage Temperature
-40
85
°C
2, 3, 4
VCC, VCCP, VCCPC6
Any Processor Supply Voltage
with Respect to VSS
-0.3
1.10
V
5
VCCA
PLL power supply
-0.3
1.575
V
VinAGTL+
AGTL+ Buffer DC Input Voltage
with Respect to VSS
-0.1
1.10
V
VinAsynch_CMOS
CMOS Buffer DC Input Voltage
with Respect to VSS
-0.1
1.10
V
NOTES:
1.
For functional operation, all processor electrical, signal quality, mechanical and thermal
specifications must be satisfied.
2.
Storage temperature is applicable to storage conditions only. In this scenario, the
processor must not receive a clock, and no lands can be connected to a voltage bias.
Storage within these limits will not affect the long term reliability of the device. For
functional operation, refer to the processor case temperature specifications.
3.
This rating applies to the processor and does not include any tray or packaging.
4.
Failure to adhere to this specification can affect the long term reliability of the
processor.
5.
The VCC maximum supported by the process is 1.2 V but the parameter can change
(burn in voltage is higher).
3.12
Processor DC Specifications
The processor DC specifications in this section are defined at the processor core
(pads) unless noted otherwise. See Chapter 4 for the pin signal definitions and signal
pin assignments. Most of the signals on the FSB are in the AGTL+ signal group. The
DC specifications for these signals are listed in Table 11. DC specifications for the
CMOS group are listed in Table 12.
Table 11 through Table 13 list the DC specifications for the processor and are valid
only while meeting specifications for junction temperature, clock frequency, and input
voltages. The Highest Frequency Mode (HFM) and Lowest Frequency Mode (LFM) refer
to the highest and lowest core operating frequencies supported on the processor.
Active mode load line specifications apply in all states except in the Deep Sleep and
Deeper Sleep states. VCC,BOOT is the default voltage driven by the voltage regulator at
power up in order to set the VID values. Unless specified otherwise, all specifications
for the processor are at TJ = 90 °C. Care should be taken to read all notes associated
with each parameter.
34
Datasheet
Electrical Specifications
Table 7. Voltage and Current Specifications for the Intel® Atom™ Processor Z560,
Z550, Z540, Z530, Z520, and Z510
Symbol
Parameter
Min.
Typ.
Max.
Unit
100.00
—
133.35
MHz
Notes11
FSB
Frequency
BCLK Frequency
VCCHFM
VCC @ Highest Frequency Mode (HFM)
AVID
—
1.10
V
1, 2, 10
VCCLFM
VCC @ Lowest Frequency Mode (LFM)
0.8
—
AVID
V
1, 2
VCC,BOOT
Default VCC Voltage for Initial Power Up
—
VCCLFM
—
V
2, 6
VCCP
AGTL+ Termination Voltage
1.00
1.05
1.15
V
12, 14
VCCPC6
AGTL+ Termination Voltage
1.00
1.05
1.15
V
12, 14
VCCA
PLL Supply voltage
1.425
1.5
1.575
V
VCCDPPWDN
VCC @ Deep Power Down Technology (C6)
0.30
0.35
0.40
V
13
VCCDPRSLP
VCC @ Deeper Sleep (C4)
0.75
—
1.0
V
1, 2
VCCF
Fuse Power Supply
1.00
1.05
1.10
V
ICCDES
ICC for Processors Recommended Design
Target (Estimated) for Z540, Z550, Z560
—
—
4.0
A
ICCDES
ICC for Processors Recommended Design
Target (Estimated) for Z530, Z520, Z510
—
—
3.5
A
Processor
Number
—
—
—
—
—
—
—
A
3, 4
—
—
A
3, 4
—
—
A
3, 4
A
3, 4
A
3, 4
Z560
Z550
ICC
Z540
Z530
Z520
Core Frequency/Voltage
HFM: 2.13 GHz
LFM: 0.80 GHz
HFM: 2.0 GHz
LFM: 0.80 GHz
HFM: 1.86 GHz
LFM: 0.80 GHz
IAH,
1.5
3.5
1.5
3.2
1.5
HFM: 1.60 GHz
2.50
LFM: 0.80 GHz
1.25
HFM: 1.33 GHz
LFM: 0.80 GHz
Z510
3.5
—
—
2.50
1.25
HFM: 1.10 GHz
2.50
LFM: 0.60 GHz
1.25
ICC Auto-Halt and Stop-Grant
HFM: 1.1 – 2.0 GHz @ 1.10 Volts
—
—
2.0
LFM: 0.6 – 0.8 GHz @ 0.85 Volts
—
—
1.3
IDPRSLP
ICC Deeper Sleep (C4)
—
—
0.2
A
At 50° C
3, 4
dICC/dt
VCC Power Supply Current Slew Rate at
Processor Package Pin (Estimated)
—
—
2.5
A/µs
5, 7
ISGNT
Datasheet
35
Electrical Specifications
Symbol
Parameter
Min.
Typ.
Max.
Unit
Notes11
ICCA
ICC for VCCA Supply
—
—
130
mA
ICCP+ ICCPC6
ICCP + ICCPC6 before VCC Stable
—
—
2.5
A
8
ICCP+ ICCPC6
ICCP + ICCPC6 after VCC Stable
—
—
1.5
A
9
NOTES:
1.
Each processor is programmed with a maximum valid voltage identification value
(VID), which is set at manufacturing and cannot be altered. Individual maximum VID
values are calibrated during manufacturing such that two processors at the same
frequency may have different settings within the VID range. Note that this differs from
the VID employed by the processor during a power management event (Thermal
Monitor 2, Enhanced Intel SpeedStep technology, or Enhanced Halt State). Typical
AVID range is 0.75 V to 1.1 V.
2.
The voltage specifications are assumed to be measured across VCC_SENSE and
VSS_SENSE pins at the socket with a 100-MHz bandwidth oscilloscope, 1.5-pF
maximum probe capacitance, and 1-MΩ minimum impedance. The maximum length of
ground wire on the probe should be less than 5 mm. Ensure external noise from the
system is not coupled in the scope probe.
3.
Specified at 90°C TJ.
4.
Specified at the nominal VCC.
5.
Measured at the bulk capacitors on the motherboard.
6.
VCC,BOOT tolerance is shown in Figure 6 and Figure 7.
7.
Based on simulations and averaged over the duration of any change in current.
Specified by design/characterization at nominal VCC. Not 100% tested.
8.
This is a power-up peak current specification, which is applicable when VCCP is high and
VCC_CORE is low.
9.
This is a steady-state ICC current specification, which is applicable when both VCCP and
VCC_CORE are high.
10. The VCC maximum supported by the process is 1.1 V but the parameter can change
(burn in voltage is higher).
11. Unless otherwise noted, all specifications in this table are based on estimates and
simulations or empirical data. These specifications will be updated with characterized
data from silicon measurements at a later date.
12. VCCP may be turned off during C6 power state— VCCPC6 must always be powered on to
1.05 V -5/+10% on all power states.
13. The VCC power supply needs to be set to 0.3V during C6 power state.
14. VCCP (voltage rail which is turned off in C6, with SPLIT VTT Enabled) should ramp to
1.05 V while exiting C6 (Deep Power Down Technology State) at least 5µs before
VCC_CORE ramps to LFM VID. In addition, VCCPC6 rail should remain at 1.05 -5/+10%
during VCCP ramp coming out of C6.
36
Datasheet
Electrical Specifications
Table 8. Voltage and Current Specifications for the Intel® Atom™ Processor
Z500
Symbol
Parameter
Min.
Typ.
Max.
Unit
—
100.0
-—
MHz
Notes11
FSB
Frequency
BCLK Frequency
VCCHFM
VCC @ Highest Frequency Mode (HFM)
AVID
—
0.85
V
1, 2, 10
VCCLFM
VCC @ Lowest Frequency Mode (LFM)
0.75
—
AVID
V
1, 2
VCC,BOOT
Default VCC Voltage for Initial Power Up
—
VCCLFM
—
V
2, 6
VCCP
AGTL+ Termination Voltage
1.00
1.05
1.15
V
12, 14
VCCPC6
AGTL+ Termination Voltage
1.00
1.05
1.15
V
12, 14
VCCA
PLL Supply Voltage
1.425
1.5
1.575
V
VCCDPPWDN
VCC at Deep Power Down Technology (C6)
0.30
0.35
0.40
V
13
VCCDPRSLP
VCC at Deeper Sleep (C4)
0.75
—
0.85
V
1, 2
ICCDES
ICC for Processors Recommended Design Target
(Estimated)
—
—
2.0
A
Processor
Number
Core Frequency/Voltage
—
—
—
—
—
Z500
HFM: 0.8 GHz
—
—
A
3, 4
—
—
A
3, 4
ICC
LFM: 0.6 GHz
0.8
0.6
0.7
IAH,
HFM: 0.8 GHz @ 0.85 Volts
ISGNT
LFM: 0.6 GHz @ 0.75 Volts
IDPRSLP
ICC Deeper Sleep (C4)
—
—
0.11
A
At 50°C
3, 4
dICC/dt
VCC Power Supply Current Slew Rate at
Processor Package Pin (Estimated)
—
—
2.5
A/µs
5, 7
ICCA
ICC for VCCA Supply
—
—
130
mA
ICCP+ ICCPC6
ICCP + ICCPC6 before VCC Stable
—
—
2.5
A
8
ICCP+ ICCPC6
ICCP + ICCPC6 after VCC Stable
—
—
1.5
A
9
0.5
NOTES:
1.
Each processor is programmed with a maximum valid voltage identification value
(VID), which is set at manufacturing and cannot be altered. Individual maximum VID
values are calibrated during manufacturing such that two processors at the same
frequency may have different settings within the VID range. Note that this differs from
the VID employed by the processor during a power management event (Thermal
Monitor 2, Enhanced Intel SpeedStep technology, or Enhanced Halt State). Typical
AVID range is 0.75 V to 0.85 V.
2.
The voltage specifications are assumed to be measured across VCC_SENSE and
VSS_SENSE pins at socket with a 100-MHz bandwidth oscilloscope, 1.5-pF maximum
probe capacitance, and 1-MΩ minimum impedance. The maximum length of ground
wire on the probe should be less than 5 mm. Ensure external noise from the system is
not coupled in the scope probe.
3.
Specified at 90°C TJ.
4.
Specified at the nominal VCC.
5.
Measured at the bulk capacitors on the motherboard.
Datasheet
37
Electrical Specifications
6.
7.
8.
9.
10.
11.
12.
13.
14.
VCC,BOOT tolerance is shown in Figure 6 and Figure 7.
Based on simulations and averaged over the duration of any change in current.
Specified by design/characterization at nominal VCC. Not 100% tested.
This is a power-up peak current specification, which is applicable when VCCP is high and
VCC_CORE is low.
This is a steady-state ICC current specification, which is applicable when both VCCP and
VCC_CORE are high.
The VCC maximum supported by the process is 1.1 V but the parameter can change
(burn in voltage is higher).
Unless otherwise noted, all specifications in this table are based on estimates and
simulations or empirical data. These specifications will be updated with characterized
data from silicon measurements at a later date.
VCCP may be turned off during C6 power state—VCCPC6 must always be powered on to
1.05 V ±5% on all power states.
The VCC power supply needs to be set to 0.3 — 0.4 V during C6 power state.
VCCP (voltage rail which is turned off in C6, with SPLIT VTT Enabled) should ramp to
1.05 V while exiting C6 (Deep Power Down Technology State) at least 5 µs before
VCC_CORE ramps to LFM VID. In addition, VCCPC6 rail should remain at 1.05 (-5/+10%)
during VCCP ramp coming out of C6.
Table 9. Voltage and Current Specifications for the Intel® Atom™ Processor Z515
Symbol
FSB
Frequency
VCCBFM
Parameter
BCLK Frequency
V @ Burst Frequency Mode (BFM)
Notes11
Min.
Typ.
Max.
Unit
—
100.0
—
MHz
AVID
—
1.1
V
1, 2, 10
VCCHFM
V @ Highest Frequency Mode (HFM)
AVID
—
1.1
V
1, 2, 10
VCCLFM
V @ Lowest Frequency Mode (LFM)
0.75
—
AVID
V
1, 2
VCCBOOT
Default VCC Voltage for Initial Power Up
—
VCC LFM
—
V
2, 6
VCCP
AGTL+ Termination Voltage
1.00
1.05
1.15
V
12, 14
VCCPC6
AGTL+ Termination Voltage
1.00
1.05
1.15
V
12, 14
VCCA
PLL Supply Voltage
1.425
1.5
1.575
V
VCCDPPWDN
V @ Deep Power Down Technology (C6)
0.30
0.35
0.40
V
13
VCCPRSLP
V @ Deeper Sleep (C4)
0.75
—
0.85
V
1, 2
ICCDES
I for Processors Recommended Design Target
(Estimated)
—
—
2.0
A
Processor
Number
Core Frequency/Voltage
—
—
—
—
—
Z515
BFM: 1.2 GHz
—
—
A
3, 4, 15
A
3, 4
A
@ 50°C
3, 4
ICC
HFM: 0.8 GHz
2.5
LFM: 0.6 GHz
IAH,
ISGNT
IDPRSLP
38
0.6
BFM: 1.2 GHz @ AVID Volts
HFM: 0.8 GHz @ AVID Volts
0.9
—
—
LFM: 0.6 GHz @ AVID Volts
ICC Deeper Sleep (C4)
0.8
0.7
0.5
—
—
0.11
Datasheet
Electrical Specifications
Parameter
Min.
Typ.
Max.
Unit
Notes11
dICC/dt
V Power Supply Current Slew Rate @ Processor
Package Pin (Estimated)
—
—
2.5
A/µs
5, 7
ICCA
ICCA for V Supply
—
—
130
mA
ICCP+ ICCPC6
ICCP+ ICCPC6 before V Stable
—
—
2.5
A
8
ICCP+ ICCPC6
ICCP+ ICCPC6 after V Stable
—
—
1.5
A
9
Symbol
NOTES:
1.
Each processor is programmed with a maximum valid voltage identification value
(VID), which is set at manufacturing and cannot be altered. Individual maximum VID
values are calibrated during manufacturing such that two processors at the same
frequency may have different settings within the VID range. Note that this differs from
the VID employed by the processor during a power management event (Thermal
Monitor 2, Enhanced Intel SpeedStep technology, or Enhanced Halt State). Typical
AVID range is 0.75 V to 0.85 V.
2.
The voltage specifications are assumed to be measured across VCC_SENSE and
VSS_SENSE pins at socket with a 100-MHz bandwidth oscilloscope, 1.5-pF maximum
probe capacitance, and 1-MΩ minimum impedance. The maximum length of ground
wire on the probe should be less than 5 mm. Ensure external noise from the system is
not coupled in the scope probe.
3.
Specified at 90°C TJ.
4.
Specified at the nominal VCC.
5.
Measured at the bulk capacitors on the motherboard.
6.
VCC,BOOT tolerance is shown in Figure 6 and Figure 7.
7.
Based on simulations and averaged over the duration of any change in current.
Specified by design/characterization at nominal VCC. Not 100% tested.
8.
This is a power-up peak current specification, which is applicable when VCCP is high and
VCC_CORE is low.
9.
This is a steady-state ICC current specification, which is applicable when both VCCP and
VCC_CORE are high.
10. The VCC maximum supported by the process is 1.1 V but the parameter can change
(burn in voltage is higher).
11. Unless otherwise noted, all specifications in this table are based on estimates and
simulations or empirical data. These specifications will be updated with characterized
data from silicon measurements at a later date.
12. VCCP and VCCPC6 must always be powered on to 1.05 V ±5% on all power states.
13. The VCC power supply needs to be set to 0.3 to 0.4 V during C6 power state.
14. The Intel Atom processor Z515 enables Intel® Burst Performance Technology (Intel®
BPT).
Datasheet
39
Electrical Specifications
Figure 6. Active Vcc and Icc Loadline
VCC (V)
Slope = -5.7 mV/A at package
VCC_SENSE, VSS_SENSE pins.
Differential Remote Sense required.
10 mV = Ripple
VCC Max[HFM][LFM]
VCC, DC Max[HFM][LFM]
VCC Nom[HFM][LFM]
VCC, DC Min[HFM][LFM]
VCC Min[HFM][LFM]
±VCC nom*1.5 %
= VR ST Pt Error 1/
ICC (A)
0
ICC max[HFM][LFM]
Note 1/ VCC Set Point Error Tolerance is per below:
Tolerance
-------------------------------±1.5%
±11.5 mV
40
VCC Active Mode VID Code Range
---------------------------------------VCC > 0.7500 V (VID 0111100)
VCC ≤ 0.7500 V (VID 0111100)
Datasheet
Electrical Specifications
Figure 7. Deeper Sleep VCC and ICC Loadline
VCC_CORE (V)
Slope = -5.7 mV/A at package
VCC_SENSE, VSS_SENSE pins.
Differential Remote Sense required.
10 mV = Ripple for
PSI# Asserted
VCC_CORE Max
(Deeper Sleep)
VCC_CORE, DC Max
(Deeper Sleep)
VCC_CORE Nom
(Deeper Sleep)
VCC_CORE, DC Min
(Deeper Sleep)
VCC_CORE Min
(Deeper Sleep)
±VCC_CORE Tolerance
= VR ST Pt Error 1/
ICC_CORE (A)
0
ICC_CORE Max
(Deeper Sleep)
Note 1/ Deeper Sleep VCC_CORE Set Point Error Tolerance is per below:
Tolerance – PSI# Ripple
-------------------------------± [(VID*1.5%) – 3 mV]
± (11.5 mV) – 3 mV]
± (25 mV) – 3 mV]
Datasheet
VCC_CORE VID Voltage Range
---------------------------------------VCC_CORE > 0.7500 V
0.7500 V ≤ VCC_CORE ≤ 0.5000 V
0.5000 V < VCC_CORE ≤ 0.4125 V
41
Electrical Specifications
Table 10. FSB Differential BCLK Specifications
Symbol
Parameter
Min.
Typ.
Max.
Unit
Figure
Notes1
VIH
Input High Voltage
—
—
1.15
V
7, 8
VIL
Input Low Voltage
—
—
-0.3
V
7, 8
0.3
—
0.55
V
2, 7, 9
VCROSS
Crossing Voltage
∆VCROSS
Range of Crossing Points
—
—
140
mV
2, 7, 5
VSWING
Differential Output Swing
300
—
—
mV
6
Input Leakage Current
-5
—
+5
µA
3
Pad Capacitance
1.2
1.45
2.0
pF
4
ILI
Cpad
NOTES:
1.
Unless otherwise noted, all specifications in this table apply to all processor
frequencies.
2.
Crossing Voltage is defined as absolute voltage where rising edge of BCLK0 is equal to
the falling edge of BCLK1.
3.
For Vin between 0 V and VIH.
4.
Cpad includes die capacitance only. No package parasitics are included.
5.
∆VCROSS is defined as the total variation of all crossing voltages as defined in note 2.
6.
Measurement taken from differential waveform.
7.
Measurement taken from single-ended waveform.
8.
“Steady state” voltage, not including Overshoots or Undershoots.
9.
Only applies to the differential rising edge (BCLK0 rising and BCLK1 falling).
42
Datasheet
Electrical Specifications
Table 11. AGTL+/CMOS Signal Group DC Specifications
Symbol
VCCP
VCCPC6
Min.
Typ.
Max.
Unit
Notes1
I/O Voltage
1.00
1.05
1.10
V
12
I/O Voltage for C6
1.00
1.05
1.10
V
12
Parameter
GTLREF
GTL Reference Voltage
—
2/3 VCCP
—
V
6
CMREF
CMOS Reference Voltage
—
1/2 VCCP
—
V
6
27.23
27.5
27.78
Ω
10
—
55
—
Ω
11
RCOMP
Compensation Resistor
RODT
Termination Resistor
VIH
Input High Voltage
GTLREF+0.10
or
CMREF+0.10
VCCP
VCCP+0.10
V
3, 6
VIL
Input Low Voltage
-0.10
0
GTLREF–0.10
or
V
2, 4
V
6
Ω
7, 13
Ω
5
Ω
5, 13
CMREF–0.10
VOH
Output High Voltage
RTT
Termination Resistance
RON (GTL
mode)
RON (CMOS
mode)
ILI
Cpad
GTL Buffer on Resistance
CMOS Buffer on Resistance
Input Leakage Current
Pad Capacitance
VCCP–0.10
46 [SS]
46 [CC]
21
42 [SS]
42 [CC]
VCCP
55
25
50
VCCP
61 [SS]
64 [CC]
29
55 [SS]
58 [CC]
—
—
±100
µA
8
1.8
2.1
2.75
pF
9
NOTES:
1.
Unless otherwise noted, all specifications in this table apply to all processor
frequencies.
2.
VIL is defined as the maximum voltage level at a receiving agent that will be
interpreted as a logical low value.
3.
VIH is defined as the minimum voltage level at a receiving agent that will be interpreted
as a logical high value.
4.
VIH and VOH may experience excursions above VCCP. However, input signal drivers must
comply with the signal quality specifications.
5.
This is the pull-down driver resistance. Measured at 0.31*VCCP. RON (minimum) =
0.4*RTT, RON (typical) = 0.455*RTT, RON (maximum) = 0.51*RTT. RTT typical value of
55 Ω is used for RON typical/minimum/maximum calculations.
6.
GTLREF and CMREF should be generated from VCCP with a 1% tolerance resistor
divider. The VCCP referred to in these specifications is the instantaneous VCCP.
7.
RTT is the on-die termination resistance measured at VOL of the AGTL+ output driver.
Measured at 0.31*VCCP. RTT is connected to VCCP on die.
8.
Specified with on die RTT and RON are turned off. Vin between 0 and VCCP.
9.
Cpad includes die capacitance only. No package parasitics are included.
10. There is an external resistor on the comp0 and comp2 pins.
11. On die termination resistance, measured at 0.33*VCCP.
12. VCCP=VCCPC6 during normal operation. When in C6 state, VCCP=0 V while
VCCPC6=1.05 V.
13. SS: source synchronous pins such as quad-pumped data bus and double-pumped
address bus which require a clock strobe. CC: Common clock pins.
Datasheet
43
Electrical Specifications
Table 12. Legacy CMOS Signal Group DC Specifications
Min.
Typ.
Max.
Unit
Notes1
I/O Voltage
1.00
1.05
1.10
V
8
VCCPC6
I/O Voltage for C6
1.00
1.05
1.10
V
8
VIH
Input High Voltage
0.7*VCCP
VCCP
VCCP+0.1
V
2
VIL
Input Low Voltage CMOS
-0.10
0.00
0.3*VCCP
V
2
VOH
Output High Voltage
0.9*VCCP
VCCP
VCCP+0.1
V
2
VOL
Output Low Voltage
-0.10
0
0.1*VCCP
V
2
IOH
Output High Current
1.5
—
4.1
mA
4
IOL
Output Low Current
1.5
—
4.1
mA
3
ILI
Input Leakage Current
—
—
± 100
µA
5
1.6
2.1
2.55
pF
6
0.95
1.2
1.45
Symbol
VCCP
Parameter
Cpad1
Pad Capacitance
Cpad2
Pad Capacitance for CMOS
Input
7
NOTES:
1.
Unless otherwise noted, all specifications in this table apply to all processor
frequencies.
2.
The VCCP referred to in these specifications refers to instantaneous VCCP.
3.
Measured at 0.1*VCCP.
4.
Measured at 0.9*VCCP.
5.
For Vin between 0V and VCCP. Measured when the driver is tri-stated.
6.
Cpad1 includes die capacitance only for DPRSTP#, DPSLP#, PWRGOOD. No package
parasitics are included.
7.
Cpad2 includes die capacitance for all other CMOS input signals. No package parasitics
are included.
8.
VCCPC6 = VCCP during normal operation and a specific tolerance may be added for this
later.
Table 13. Open Drain Signal Group DC Specifications
Symbol
Parameter
Min.
Typ.
Max.
Unit
Notes1
3
VOH
Output High Voltage
VCCP-–5%
VCCP
VCCP+5%
V
VOL
Output Low Voltage
0
—
0.20
V
IOL
Output Low Current
16
—
50
mA
2
ILO
Output Leakage Current
—
—
±200
µA
4
1.9
2.2
2.45
pF
5
Cpad
Pad Capacitance
NOTES:
1.
Unless otherwise noted, all specifications in this table apply to all processor
frequencies.
2.
Measured at 0.2 V.
3.
VOH is determined by value of the external pull-up resistor to VCCP.
4.
For Vin between 0 V and VOH.
5.
Cpad includes die capacitance only. No package parasitics are included.
44
Datasheet
Electrical Specifications
3.13
AGTL+ FSB Specifications
Termination resistors are not required for most AGTL+ signals, as these are integrated
into the processor silicon.
Valid high and low levels are determined by the input buffers which compare a signal’s
voltage with a reference voltage called GTLREF (known as VREF in previous
documentation).
Table 11 lists the GTLREF and CMREF specifications. The AGTL+ and CMOS reference
voltages (GTLREF and CMREF) should be generated on the system board using high
precision voltage divider circuits. It is important that the system board impedance is
held to the specified tolerance, and that the intrinsic trace capacitance for the AGTL+
signal group traces is known and well- controlled.
§
Datasheet
45
Electrical Specifications
This page intentionally left blank.
46
Datasheet
Package Mechanical Specifications and Pin Information
4
Package Mechanical
Specifications and Pin
Information
This chapter describes the package specifications, pinout assignments, and signal
descriptions.
4.1
Package Mechanical Specifications
The processor will be available in 512 KB, 441 pins in FCBGA8 package. The package
dimensions are shown in Figure 8.
4.1.1
Processor Package Weight
The Intel Atom processor Z5xx series package weight is 0.475 g.
Datasheet
47
Package Mechanical Specifications and Pin Information
Figure 8. Package Mechanical Drawing
48
Datasheet
Package Mechanical Specifications and Pin Information
4.2
Processor Pinout Assignment
Figure 9 and Figure 10 are graphic representations of the processor pinout
assignments. Table 14 lists the pinout by signal name.
Figure 9. Pinout Diagram (Top View, Left Side)
AJ
AH
AG
1
2
VSS/NCTF
3
4
VSS/NCTF
VSS/NCTF
5
6
D[50]#
D[36]#
D[47]#
D[44]#
13
14
D[34]#
18
19
20
D[18]#
21
22
24
D[20]#
27
D[1]#
29
30
D[12]#
AJ
Datasheet
AH
AG
D[4]#
AF
VSS
AE
D[3]#
AD
D[0]#
VSS
D[10]#
DSTBP[0]#
AB
AA
VSS
22
24
V
VSS
27
VSS
29
28
30
TEST2
U
25
26
TEST4
DPWR#
W
23
BSEL[2]
D[8]#
Y
VSS
VSS
TEST3
D[2]#
21
VCCP
DRDY#
VSS
D[7]#
AC
VCCP
DSTBN[0]#
20
VCC
VSS
19
VSS
VCC
VCC
VSS
D[6]#
D[9]#
VSS
VSS/NCTF
VSS
VSS
VSS
17
18
VCC
VCC
VSS
D[14]#
D[15]#
DINV[0]#
VSS/NCTF
31
D[17]#
CMREF
D[5]#
VCCP
VSS
VSS
15
16
VCC
VCC
13
14
VSS
VSS
11
12
VCC
VSS
VSS
VCCP
VSS
D[11]#
VSS/NCTF
VSS
D[16]#
D[13]#
VCCP
VCCP
VSS
D[21]#
VSS
28 VSS/NCTF
VSS
9
10
VCC
VCC
VSS
7
8
VSS
VSS
VSS
6
VCC
VCC
VCCP
VCCP
VSS
DINV[1]#
VSS
GTLREF
D[28]#
D[25]#
D[22]#
VCCP
4
VSS
VSS
VSS
5
VCC
VCC
VCCP
VSS
D[19]#
VSS
D[29]#
RSVD
DSTBN[1]
#
D[23]#
25
26
VSS
VCCP
THRMDA
VSS
VSS
VCC
VCCP
3
VSS
VSS
VSS
VSS
VCC
VCC
VCCP
VSS
D[26]#
D[31]#
DSTBP[1]#
23
RSVD
VSS
VSS
VCCP
VSS
RSVD
RSVD
D[24]#
VSS
COMP[0]
VSS
VCCP
2
VCC
VCC
VSS
VCCP
COMP[1]
D[41]#
D[27]#
D[30]#
VSS
DINV[2]#
VSS
VCCP
VSS
D[39]#
VSS
D[38]#
17
D[37]#
VSS
D[43]#
VSS
DSTBP[2]
#
D[42]#
15
16
VSS
DSTBN[2]
#
11
12
D[35]#
1
THRMDC
VSS
VSS
T
THERMTRIP#
VSS
VSS
VCCP
U
VID[6]
D[58]#
DINV[3]#
VCCP
V
VSS
VSS
VSS
VSS
W
VCC
DSTBP[3]#
D[49]#
D[33]#
Y
D[51]#
VSS
D[55]#
D[32]#
AA
D[62]#
D[63]#
VSS
D[40]#
AB
DSTBN[3]#
VSS
D[56]#
VSS
AC
D[59]#
D[57]#
D[52]#
D[45]#
AD
D[61]#
D[54]#
VSS
D[46]#
9
10
AE
D[60]#
D[53]#
D[48]#
7
8
AF
VSS/NCTF
31
T
49
Package Mechanical Specifications and Pin Information
Figure 10. Pinout Diagram (Top View, Right Side)
R
1
2
VID[5]
3
4
VSS
10
VSS
VCC
11
12
VSS
13
14
18
21
22
VSS
VCC
25
26
VCCP
27
28
29
30
VSS
BSEL[0]
P
M
RSVD
RSVD
K
RS[1]#
A20M#
H
VSS/NCTF
D
28
29
30
VSS/NCTF
E
26
27
VSS/NCTF
VSS/NCT
F
HIT#
F
RSVD
BR0#
24
25
DEFER#
DBSY#
INIT#
G
ADS#
22
23
REQ[3]#
REQ[0]#
RS[0]#
HITM#
LINT0
J
RS[2]#
20
21
A[4]#
A[9]#
LOCK#
VSS
VSS
VSS
L
RSVD
FERR#
RSVD
TRDY#
IGNNE#
RSVD
BSEL[1]
N
BNR#
18
19
A[14]#
VSS
16
17
REQ[4]#
REQ[1]#
14
15
A[8]#
VSS
A[6]#
13
A[13]#
A[5]#
VSS
11
A[7]#
VSS
A[3]#
BPRI#
SMI#
LINT1
VCCA
VSS
12
A[10]#
VSS
REQ[2]#
A[18]#
A[16]#
ADSTB[0]#
VSS
VCCP
RSVD
VSS
TEST1
R
VCCP
VCCPC6
BCLK[0]
31
50
VCCP
VSS
VSS
VSS
A[11]#
10
A[30]#
VSS
A[15]#
VSS
VCCP
VSS
A[12]#
VSS
A[25]#
A[23]#
VSS
COMP[2]
VSS
VCCP
VCC
VSS
VSS
BCLK[1]
VSS
VSS
COMP[3]
VCCP
VCCP
VCC
VCC
VSS
VCCP
A[27]#
A[24]#
VSS
VCCP
VSS
VSS
VCC
VCCP
VSS
VCC
VSS
8
9
A[31]#
VSS
6
7
A[28]#
A[21]#
ADSTB[1]#
A[20]#
VSS
VCCP
VCC
VCC
VCC
VSS
VSS
VSS
23
24
VCC
VCCP
A[26]#
VSS
4
5
A[22]#
VSS
RSVD
VSS
VSS
VCCP
VCC
VSS
VSS
VCC
VSS
VSS
VSS
VCCP
VSS/NCTF
VSS
RSVD
3
A[17]#
RSVD
VSS
2
A[29]#
RSVD
VSS
VCCP
VCC
VCC
VCC
VSS
VSS
VSS
VCCP
VCC
VCC
VCC
19
20
VCC
VCC
17
VCC
PREQ#
VCCPC6
A
VSS/NCTF
A[19]#
RSVD
VSS
B
VSS/NCT
F
PRDY#
DPSLP#
C
BPM[3]#
BPM[2]#
VCCPC6
D
VSS/NCTF
BPM[1]#
PWRGOOD
VCCPC6
VSS
VSS
VSS
15
16
VSS
VCC
VCC
VSS
E
VSS
PROCHOT#
VSS
VCC
F
BPM[0]#
DPRSTP#
TRST#
VSS
G
VSS
VID[3]
VSS
H
IERR#
SLP#
VID[4]
VCC
J
VSS
RESET#
VCC
VCC
K
STPCLK#
TCK
VID[2]
VCC
L
VSS
VID[0]
9
M
TDO
TDI
VID[1]
7
8
N
VSS
5
6
P
TMS
31
C
B
A
Datasheet
Package Mechanical Specifications and Pin Information
Table 14. Pinout Arranged by Signal Name
Datasheet
Signal Name
Ball #
Signal Name
Ball #
Signal Name
Ball #
A[3]#
E22
A20M#
G30
D[7]#
AB31
A[4]#
A22
ADS#
C26
D[8]#
W30
A[5]#
D21
ADSTB[0]#
D19
D[9]#
AC28
A[6]#
E24
ADSTB[1]#
D11
D[10]#
AD31
A[7]#
B17
BCLK[0]
P29
D[11]#
AF27
A[8]#
A18
BCLK[1]
R28
D[12]#
AD27
A[9]#
B23
BNR#
H25
D[13]#
AG28
A[10]#
A16
BPM[0]#
F1
D[14]#
AB25
A[11]#
E18
BPM[1]#
E2
D[15]#
AC26
A[12]#
D15
BPM[2]#
F5
D[16]#
AE24
A[13]#
B19
BPM[3]#
D3
D[17]#
AC24
A[14]#
A20
BPRI#
G24
D[18]#
AJ20
A[15]#
D17
BR0#
C28
D[19]#
AE20
A[16]#
B15
RSVD
G26
D[20]#
AJ22
A[17]#
B5
BSEL[0]
R30
D[21]#
AF25
A[18]#
A12
BSEL[1]
M31
D[22]#
AH25
A[19]#
D5
BSEL[2]
U28
D[23]#
AH23
A[20]#
E12
CMREF[1]
AE26
D[24]#
AH19
A[21]#
B9
COMP[0]
AE14
D[25]#
AF23
A[22]#
A6
COMP[1]
AD13
D[26]#
AE18
A[23]#
B13
COMP[2]
E16
D[27]#
AH17
A[24]#
E14
COMP[3]
F15
D[28]#
AD19
A[25]#
A10
D[0]#
Y27
D[29]#
AJ24
A[26]#
B7
D[1]#
AH27
D[30]#
AJ18
A[27]#
D13
D[2]#
Y31
D[31]#
AF19
A[28]#
A8
D[3]#
AC30
D[32]#
AE8
A[29]#
C4
D[4]#
AE30
D[33]#
AD7
A[30]#
A14
D[5]#
AF29
D[34]#
AH15
A[31]#
B11
D[6]#
AA26
D[35]#
AF9
51
Package Mechanical Specifications and Pin Information
52
Signal Name
Ball #
Signal Name
Ball #
Signal Name
Ball #
D[36]#
AH9
DINV[1]#
AE22
REQ[1]#
D23
D[37]#
AE10
DINV[2]#
AE12
REQ[2]#
E20
D[38]#
AJ16
DINV[3]#
Y5
REQ[3]#
A24
D[39]#
AF13
DPRSTP#
G2
REQ[4]#
B21
D[40]#
AF7
DPSLP#
G6
RESET#
M5
D[41]#
AF15
DPWR#
V31
RS[0]#
D27
D[42]#
AH13
DRDY#
W28
RS[1]#
E28
D[43]#
AJ14
DSTBN[0]#
AA28
RS[2]#
E26
D[44]#
AJ12
DSTBN[1]#
AF21
RSVD
K29
D[45]#
AH7
DSTBN[2]#
AH11
RSVD
D9
D[46]#
AJ8
DSTBN[3]#
AB1
RSVD
D7
D[47]#
AJ10
DSTBP[0]#
AA30
RSVD
E8
D[48]#
AH5
DSTBP[1]#
AH21
RSVD
E10
D[49]#
AB5
DSTBP[2]#
AF11
RSVD
L30
D[50]#
AJ6
DSTBP[3]#
AA4
RSVD
J30
D[51]#
Y1
FERR#
J28
RSVD
E6
D[52]#
AF5
RSVD
G28
RSVD
AE16
D[53]#
AG4
GTLREF
AJ26
RSVD
AF17
D[54]#
AF3
HIT#
E30
RSVD
AD15
D[55]#
AC6
HITM#
F29
RSVD
AD17
D[56]#
AE6
IERR#
H1
RSVD
A26
D[57]#
AE4
IGNNE#
H27
RSVD
K27
D[58]#
W4
INIT#
F31
SLP#
J2
D[59]#
AC2
LINT0
H31
SMI#
J26
D[60]#
AE2
LINT1
L28
STPCLK#
K1
D[61]#
AD1
LOCK#
D25
TCK
L2
D[62]#
AA2
PRDY#
E4
TDI
N2
D[63]#
AC4
PREQ#
F7
TDO
M1
DBSY#
D29
PROCHOT#
H5
TEST1
P31
DEFER#
B27
PWRGOOD
G4
TEST2
T31
DINV[0]#
AE28
REQ[0]#
B25
TEST3
V27
Datasheet
Package Mechanical Specifications and Pin Information
Datasheet
Signal Name
Ball #
Signal Name
Ball #
Signal Name
Ball #
TEST4
U30
VCC
R16
VCCP
AA22
THERMTRIP#
T1
VCC
R18
VCCP
AB7
THRMDA
T5
VCC
R20
VCCP
AB9
THRMDC
U4
VCC
R22
VCCP
AB11
TMS
P1
VCC
R24
VCCP
AB13
TRDY#
F25
VCC
U6
VCCP
AB15
TRST#
J4
VCC
U8
VCCP
AB17
VCC
L8
VCC
U10
VCCP
AB19
VCC
L10
VCC
U12
VCCP
AB21
VCC
L12
VCC
U14
VCCP
AB23
VCC
L14
VCC
U16
VCCP
H11
VCC
L16
VCC
U18
VCCP
H13
VCC
L18
VCC
U20
VCCP
H15
VCC
L20
VCC
U22
VCCP
H17
VCC
L22
VCC
U24
VCCP
H19
VCC
L24
VCC
W8
VCCP
H21
VCC
N6
VCC
W10
VCCP
H23
VCC
N8
VCC
W12
VCCP
J10
VCC
N10
VCC
W14
VCCP
J12
VCC
N12
VCC
W16
VCCP
J14
VCC
N14
VCC
W18
VCCP
J18
VCC
N16
VCC
W20
VCCP
J20
VCC
N18
VCC
W22
VCCP
J22
VCC
N20
VCC
W24
VCCP
L26
VCC
N22
VCCA
N30
VCCP
N26
VCC
N24
VCCP
AA8
VCCP
R26
VCC
R6
VCCP
AA10
VCCP
U26
VCC
R8
VCCP
AA12
VCCP
W26
VCC
R10
VCCP
AA16
VCCP
AA14
VCC
R12
VCCP
AA18
VCCP
J16
VCC
R14
VCCP
AA20
VCCPC6
H7
53
Package Mechanical Specifications and Pin Information
54
Signal Name
Ball #
Signal Name
Ball #
Signal Name
Ball #
VCCPC6
H9
VSS
AD21
VSS
C16
VCCPC6
J8
VSS
AD23
VSS
C18
VCCPC6
M27
VSS
AD25
VSS
C20
VCC_SENSE
W2
VSS
AD29
VSS
C22
VID[0]
P5
VSS/NCTF
AF1
VSS
C24
VID[1]
R4
VSS/NCTF
AF31
VSS/NCTF
C30
VID[2]
N4
VSS/NCTF
AG2
VSS/NCTF
D1
VID[3]
K5
VSS
AG6
VSS/NCTF
D31
VID[4]
L4
VSS
AG8
VSS
F3
VID[5]
R2
VSS
AG10
VSS
F9
VID[6]
U2
VSS
AG12
VSS
F11
VSS
K31
VSS
AG14
VSS
F13
VSS/NCTF
A4
VSS
AG16
VSS
F17
VSS/NCTF
A28
VSS
AG18
VSS
F19
VSS
AA6
VSS
AG20
VSS
F21
VSS
AA24
VSS
AG22
VSS
F23
VSS
AB3
VSS
AG24
VSS
F27
VSS
AB27
VSS
AG26
VSS
G8
VSS
AB29
VSS/NCTF
AG30
VSS
G10
VSS
AC8
VSS/NCTF
AH3
VSS
G12
VSS
AC10
VSS/NCTF
AH29
VSS
G14
VSS
AC12
VSS/NCTF
AJ4
VSS
G16
VSS
AC14
VSS/NCTF
AJ28
VSS
G18
VSS
AC16
VSS/NCTF
B3
VSS
G20
VSS
AC18
VSS/NCTF
B29
VSS
G22
VSS
AC20
VSS/NCTF
C2
VSS
H3
VSS
AC22
VSS
C6
VSS
H29
VSS
AD3
VSS
C8
VSS
J6
VSS
AD5
VSS
C10
VSS
J24
VSS
AD9
VSS
C12
VSS
K3
VSS
AD11
VSS
C14
VSS
K7
Datasheet
Package Mechanical Specifications and Pin Information
Datasheet
Signal Name
Ball #
Signal Name
Ball #
Signal Name
Ball #
VSS
K9
VSS
P11
VSS
V11
VSS
K11
VSS
P13
VSS
V13
VSS
K13
VSS
P15
VSS
V15
VSS
K15
VSS
P17
VSS
V17
VSS
K17
VSS
P19
VSS
V19
VSS
K19
VSS
P21
VSS
V21
VSS
K21
VSS
P23
VSS
V23
VSS
K23
VSS
P25
VSS
V25
VSS
K25
VSS
P27
VSS
V29
VSS
L6
VSS
T3
VSS
W6
VSS
M3
VSS
T7
VSS
Y3
VSS
M7
VSS
T9
VSS
Y7
VSS
M9
VSS
T11
VSS
Y9
VSS
M11
VSS
T13
VSS
Y11
VSS
M13
VSS
T15
VSS
Y13
VSS
M15
VSS
T17
VSS
Y15
VSS
M17
VSS
T19
VSS
Y17
VSS
M19
VSS
T21
VSS
Y19
VSS
M21
VSS
T23
VSS
Y21
VSS
M23
VSS
T25
VSS
Y23
VSS
M25
VSS
T27
VSS
Y25
VSS
M29
VSS
T29
VSS
Y29
VSS
N28
VSS
V3
VSS_SENSE
V1
VSS
P3
VSS
V5
VSS
P7
VSS
V7
VSS
P9
VSS
V9
55
4.3
Signal Description
Table 15. Signal Description
Signal Name
Type
Description
A[31:3]# (Address) defines a 232-byte physical memory address
space. In subphase 1 (one) of the address phase, these pins
transmit the address of a transaction.
A[31:3]#
A20M#
I/O
I
In sub-phase 2, these pins transmit transaction type information.
These signals must connect the appropriate pins of both agents
on the processor FSB. A[31:3]# are source synchronous signals
and are latched into the receiving buffers by ADSTB[1:0]#.
Address signals are used as straps which are sampled before
RESET# is de-asserted.
If A20M# (Address-20 Mask) is asserted, the processor masks
physical address bit 20 (A20#) before looking up a line in any
internal cache and before driving a read/write transaction on the
bus. Asserting A20M# emulates the 8086 processor's address
wrap-around at the 1-MB boundary. Assertion of A20M# is only
supported in real mode.
A20M# is an asynchronous signal. However, to ensure
recognition of this signal following an input/output write
instruction, it must be valid along with the TRDY# assertion of
the corresponding input/output Write bus transaction.
ADS#
ADSTB[1:0]#
BCLK[1:0]
I/O
I/O
I
ADS# (Address Strobe) is asserted to indicate the validity of the
transaction address on the A[31:3]# and REQ[4:0]# pins. All bus
agents observe the ADS# activation to begin parity checking,
protocol checking, address decode, internal loop, or deferred
reply ID match operations associated with the new transaction.
Address strobes are used to latch A[31:3]# and REQ[4:0]# on
their rising and falling edges. Strobes are associated with signals
as shown below.
Signals
REQ[4:0]#, A[16:3]#
A[31:17]#
Associated Strobe
ADSTB[0]#
ADSTB[1]#
The differential pair BCLK (Bus Clock) determines the FSB
frequency. All FSB agents must receive these signals to drive
their outputs and latch their inputs.
All external timing parameters are specified with respect to the
rising edge of BCLK0 crossing VCROSS.
BNR#
56
I/O
BNR# (Block Next Request) is used to assert a bus stall by any
bus agent who is unable to accept new bus transactions. During
a bus stall, the current bus owner cannot issue any new
transactions.
Datasheet
Package Mechanical Specifications and Pin Information
Signal Name
Type
Description
BPM[0]#
O
BPM[1]#
I/O
BPM[2]#
O
BPM[3]#
I/O
BPM[3:0]# (Breakpoint Monitor) are breakpoint and performance
monitor signals. They are outputs from the processor which
indicate the status of breakpoints and programmable counters
used for monitoring processor performance. BPM[3:0]# should
connect the appropriate pins of all FSB agents. This includes
debug or performance monitoring tools.
BPRI#
I
BPRI# (Bus Priority Request) is used to arbitrate for ownership of
the FSB. It must connect the appropriate pins of both FSB
agents. Observing BPRI# active (as asserted by the priority
agent) causes the other agent to stop issuing new requests,
unless such requests are part of an ongoing locked operation.
The priority agent keeps BPRI# asserted until all of its requests
are completed then releases the bus by de-asserting BPRI#.
BR0#
I/O
BR0# is used by the processor to request the bus. The
arbitration is done between the processor (Symmetric Agent) and
Intel® SCH (High Priority Agent).
BSEL[2:0]
O
BSEL[2:0] (Bus Select) are used to select the processor input
clock frequency. Table 4 defines the possible combinations of the
signals and the frequency associated with each combination. The
required frequency is determined by the processor, chipset and
clock synthesizer. All agents must operate at the same
frequency. The processor operates at 400-MHz or 533-MHz
system bus frequency100-MHz or 133-MHz BCLK frequency,
respectively).
COMP[3:0]
PWR
COMP[3:0] must be terminated on the system board using
precision (1% tolerance) resistors.
D[63:0]# (Data) are the data signals. These signals provide a
64-bit data path between the FSB agents, and must connect the
appropriate pins on both agents. The data driver asserts DRDY#
to indicate a valid data transfer.
D[63:0]# are quad-pumped signals and will thus be driven four
times in a common clock period. D[63:0]# are latched off the
falling edge of both DSTBP[3:0]# and DSTBN[3:0]#. Each group
of 16 data signals correspond to a pair of one DSTBP# and one
DSTBN#. The following table shows the grouping of data signals
to data strobes and DINV#.
D[63:0]#
I/O
Quad-Pumped Signal Groups
Data Group
DSTBN#/DSTBP#
D[15:0]#
D[31:16]#
D[47:32]#
D[63:48]#
0
1
2
3
DINV#
0
1
2
3
Furthermore, the DINV# pins determine the polarity of the data
signals. Each group of 16 data signals corresponds to one DINV#
signal. When the DINV# signal is active, the corresponding data
group is inverted and therefore sampled active high.
Datasheet
57
Signal Name
DBSY#
DEFER#
DINV[3:0]#
Type
Description
I/O
DBSY# (Data Bus Busy) is asserted by the agent responsible for
driving data on the FSB to indicate that the data bus is in use.
The data bus is released after DBSY# is de-asserted. This signal
must connect the appropriate pins on both FSB agents.
I
DEFER# is asserted by an agent to indicate that a transaction
cannot be guaranteed in-order completion. Assertion of DEFER#
is normally the responsibility of the addressed memory or
Input/Output agent. This signal must connect the appropriate
pins of both FSB agents.
I
DINV[3:0]# (Data Bus Inversion) are source synchronous and
indicates the polarity of the D[63:0]# signals. The DINV[3:0]#
signals are activated when the data on the data bus is inverted.
The bus agent will invert the data bus signals if more than half
the bits, within the covered group, would change level in the next
cycle. DINV[3:0]# assignment to data bus signals is shown
below.
Bus Signal
Data Bus Signals
DINV[3]#
DINV[2]#
DINV[1]#
DINV[0]#
D[63:48]#
D[47:32]#
D[31:16]#
D[15:0]#
DPRSTP#
I
DPRSTP# when asserted on the platform causes the processor to
transition from the Deep Sleep State to the Deeper Sleep state.
In order to return to the Deep Sleep State, DPRSTP# must be
de-asserted. DPRSTP# is driven by the SCH chipset.
DPSLP#
I
DPSLP# when asserted on the platform causes the processor to
transition from the Sleep State to the Deep Sleep state. In order
to return to the Sleep State, DPSLP# must be de-asserted.
DPSLP# is driven by the SCH chipset.
DPWR#
I
DPWR# is a control signal from the Intel® SCH used to reduce
power on the processor data bus input buffers.
DRDY#
I/O
DRDY# (Data Ready) is asserted by the data driver on each data
transfer, indicating valid data on the data bus. In a multicommon clock data transfer, DRDY# may be de-asserted to
insert idle clocks. This signal must connect the appropriate pins
of both FSB agents.
Data strobe used to latch in D[63:0]#.
DSTBN[3:0]#
I/O
Signals
D[15:0]#
D[31:16]#
D[47:32]#
D[63:48]#
Associated Strobe
DINV[0]#, DSTBN[0]#
DINV[1]#, DSTBN[1]#
DINV[2]#, DSTBN[2]#
DINV[3]#, DSTBN[3]#
Data strobe used to latch in D[63:0]#.
DSTBP[3:0]#
58
I/O
Signals
D[15:0]#
D[31:16]#
D[47:32]#
D[63:48]#
Associated Strobe
DINV[0]#, DSTBP[0]#
DINV[1]#, DSTBP[1]#
DINV[2]#, DSTBP[2]#
DINV[3]#, DSTBP[3]#
Datasheet
Package Mechanical Specifications and Pin Information
Signal Name
FERR#/PBE#
Type
O
Description
FERR# (Floating-point Error) PBE# (Pending Break Event) is a
multiplexed signal and its meaning is qualified with STPCLK#.
When STPCLK# is not asserted, FERR#/PBE# indicates a floating
point when the processor detects an unmasked floating-point
error. FERR# is similar to the ERROR# signal on the Intel 387
coprocessor, and is included for compatibility with systems using
MSDOS*- type floating-point error reporting. When STPCLK# is
asserted, an assertion of FERR#/PBE# indicates that the
processor has a pending break event waiting for service. The
assertion of FERR#/PBE# indicates that the processor should be
returned to the Normal state. When FERR#/PBE# is asserted,
indicating a break event, it will remain asserted until STPCLK# is
de-asserted. Assertion of PREQ# when STPCLK# is active will
also cause an FERR# break event.
For additional information on the pending break event
functionality, including identification of support of the feature and
enable/disable information, refer to Volume 3 of the Intel® 64
and IA-32 Architectures Software Developer's Manuals and the
Intel® Processor Identification and CPUID Instruction Application
Note.
CMREF
PWR
CMREF determines the signal reference level for CMOS input
pins. CMREF should be set at 1/2 VCCP. CMREF is used by the
CMOS receivers to determine if a signal is a logical 0 or logical 1.
If not using CMOS, then all CMREF and GTLREF should be
provided with 2/3 VCCP.
GTLREF
HIT#
HITM#
IERR#
IGNNE#
PWR
GTLREF determines the signal reference level for AGTL+ input
pins. GTLREF should be set at 2/3 VCCP. GTLREF is used by the
AGTL+ receivers to determine if a signal is a logical 0 or logical
I/O
HIT# (Snoop Hit) and HITM# (Hit Modified) convey transaction
snoop operation results. Either FSB agent may assert both HIT#
and HITM# together to indicate that it requires a snoop stall,
which can be continued by reasserting HIT# and HITM#
together.
O
IERR# (Internal Error) is asserted by a processor as the result of
an internal error. Assertion of IERR# is usually accompanied by a
SHUTDOWN transaction on the FSB. This transaction may
optionally be converted to an external error signal (for example,
NMI) by system core logic. The processor will keep IERR#
asserted until the assertion of RESET# or INIT#.
I
IGNNE# (Ignore Numeric Error) is asserted to force the
processor to ignore a numeric error and continue to execute noncontrol floating-point instructions. If IGNNE# is de-asserted, the
processor generates an exception on a non-control floating-point
instruction if a previous floating-point instruction caused an
error. IGNNE# has no effect when the NE bit in control register 0
(CR0) is set.
IGNNE# is an asynchronous signal. However, to ensure
recognition of this signal following an Input/Output write
instruction, it must be valid along with the TRDY# assertion of
the corresponding Input/Output Write bus transaction.
Datasheet
59
Signal Name
INIT#
Type
I
Description
INIT# (Initialization), when asserted, resets integer registers
inside the processor without affecting its internal caches or
floating-point registers. The processor then begins execution at
the power-on Reset vector configured during power-on
configuration. The processor continues to handle snoop requests
during INIT# assertion. INIT# is an asynchronous signal.
However, to ensure recognition of this signal following an
Input/Output Write instruction, it must be valid along with the
TRDY# assertion of the corresponding Input/Output Write bus
transaction. INIT# must connect the appropriate pins of both
FSB agents.
If INIT# is sampled active on the active to inactive transition of
RESET#, the processor reverses its FSB data and address signals
internally to ease mother board layout for systems where the
chipset is on the other side of the mother board.
D[63:0] => D[0:63]
A[31:3] => A[3:31]
DINV[3:0]# is also reversed.
LINT[1:0]
I
LINT[1:0] (Local APIC Interrupt) must connect the appropriate
pins of all APIC Bus agents. When the APIC is disabled, the LINT0
signal becomes INTR, a maskable interrupt request signal, and
LINT1 becomes NMI, a non-maskable interrupt. INTR and NMI
are backward compatible with the signals of those names on the
Pentium processor. Both signals are asynchronous.
Both of these signals must be software configured using BIOS
programming of the APIC register space to be used either as
NMI/INTR or LINT[1:0]. Because the APIC is enabled by default
after Reset, operation of these pins as LINT[1:0] is the default
configuration.
LOCK#
I/O
PRDY#
O
The Probe Ready Signal used by debug tools to request debug
operation of the processor.
PREQ#
I
Probe Request Signal used by debug tools to request debug
operation of the processor.
PROCHOT#
60
LOCK# indicates to the system that a transaction must occur
automatically. This signal must connect the appropriate pins of
both FSB agents. For a locked sequence of transactions, LOCK#
is asserted from the beginning of the first transaction to the end
of the last transaction.
I/O,
When the priority agent asserts BPRI# to arbitrate for ownership
of the FSB, it will wait until it observes LOCK# deasserted. This
enables symmetric agents to retain ownership of the FSB
throughout the bus locked operation and ensure the automatic
operation of the lock.
As an output, PROCHOT# (Processor Hot) will go active when the
processor temperature monitoring sensor detects that the
processor has reached its maximum safe operating temperature.
This indicates that the processor Thermal Control Circuit (TCC)
has been activated, if enabled. As an input, assertion of
PROCHOT# by the system will activate the TCC, if enabled. The
TCC will remain active until the system de-asserts PROCHOT#.
Datasheet
Package Mechanical Specifications and Pin Information
Signal Name
PWRGOOD
Type
I
Description
PWRGOOD (Power Good) is a processor input. The processor
requires this signal to be a clean indication that the clocks and
power supplies are stable and within their specifications. “Clean”
implies that the signal will remain low (capable of sinking leakage
current), without glitches, from the time that the power supplies
are turned on until they come within specification. The signal
must then transition monotonically to a high state. PWRGOOD
can be driven inactive at any time, but clocks and power must
again be stable before a subsequent rising edge of PWRGOOD.
The PWRGOOD signal must be supplied to the processor—it is
used to protect internal circuits against voltage sequencing
issues. It should be driven high throughout boundary scan
operation.
REQ[4:0]#
RESET#
I
Asserting the RESET# signal resets the processor to a known
state and invalidates its internal caches without writing back any
of their contents. For a power-on Reset, RESET# must stay
active for at least two milliseconds after VCC and BCLK have
reached their proper specifications. On observing active RESET#,
both FSB agents will de-assert their outputs within two clocks. All
processor straps must be valid within the specified setup time
before RESET# is de-asserted.
RS[2:0]#
I
RS[2:0]# (Response Status) are driven by the response agent
(the agent responsible for completion of the current transaction),
and must connect the appropriate pins of both FSB agents.
Reserved
RSVD[3:0] pins E10, E8, D7 and D9 must be tied directly to VCCP
to ensure proper operation of the processor. All other RSVD
signals can be left as No Connects.
I
SLP# (Sleep), when asserted in Stop-Grant state, causes the
processor to enter the Sleep state. During Sleep state, the
processor stops providing internal clock signals to all units,
leaving only the Phase-Locked Loop (PLL) still operating.
Processors in this state will not recognize snoops or interrupts.
The processor will recognize only assertion of the RESET# signal,
de-assertion of SLP#, and removal of the BCLK input while in
Sleep state. If SLP# is de-asserted, the processor exits Sleep
state and returns to Stop-Grant state, restarting its internal clock
signals to the bus and processor core units. If DPSLP# is
asserted while in the Sleep state, the processor will exit the
Sleep state and transition to the Deep Sleep state.
I
SMI# (System Management Interrupt) is asserted
asynchronously by system logic. On accepting a System
Management Interrupt, the processor saves the current state and
enters System Management Mode (SMM). An SMI Acknowledge
transaction is issued, and the processor begins program
execution from the SMM handler. If SMI# is asserted during the
de-assertion of RESET# the processor will tri-state its outputs.
RSVD
SLP#
SMI#
Datasheet
I/O
REQ[4:0]# (Request Command) must connect the appropriate
pins of both FSB agents. They are asserted by the current bus
owner to define the currently active transaction type. These
signals are source synchronous to ADSTB[0]#.
61
Signal Name
62
Type
Description
STPCLK#
I
STPCLK# (Stop Clock), when asserted, causes the processor to
enter a low power Stop-Grant state. The processor issues a StopGrant Acknowledge transaction, and stops providing internal
clock signals to all processor core units except the FSB and APIC
units. The processor continues to snoop bus transactions and
service interrupts while in Stop-Grant state. When STPCLK# is
de-asserted, the processor restarts its internal clock to all units
and resumes execution. The assertion of STPCLK# has no effect
on the bus clock—STPCLK# is an asynchronous input.
TCK
I
TCK (Test Clock) provides the clock input for the processor Test
Bus (also known as the Test Access Port).
TDI
I
TDI (Test Data In) transfers serial test data into the processor.
TDI provides the serial input needed for JTAG specification
support.
TDO
O
TDO (Test Data Out) transfers serial test data out of the
processor. TDO provides the serial output needed for JTAG
specification support.
TEST[1:4]
Test Signals. All TEST signals can be left as No Connects.
THRMTRIP#
The processor protects itself from catastrophic overheating by
use of an internal thermal sensor. This sensor is set well above
the normal operating temperature to ensure that there are no
false trips. The processor will stop all execution when the
junction temperature exceeds approximately 120°C. This
condition is signaled to the system by the THERMTRIP# (Thermal
Trip) pin.
O
THRMDA
PWR
Thermal Diode — Anode
THRMDC
PWR
Thermal Diode — Cathode
TMS
I
TMS (Test Mode Select) is a JTAG specification support signal
used by debug tools.
TRDY#
I
TRDY# (Target Ready) is asserted by the target to indicate that
it is ready to receive a write or implicit writeback data transfer.
TRDY# must connect the appropriate pins of both FSB agents.
TRST#
I
TRST# (Test Reset) resets the Test Access Port (TAP) logic.
TRST# must be driven low during power on Reset.
VCCA
PWR
VCCA provides isolated power for the internal processor core
PLLs.
VCC
PWR
Processor core power supply
VSS
GND
Processor core ground node.
VSS/NCTF
GND
Non Critical to Function
Datasheet
Package Mechanical Specifications and Pin Information
Signal Name
VID[6:0]
Type
O
Description
VID[6:0] (Voltage ID) pins are used to support automatic
selection of power supply voltages (VCC). Unlike some previous
generations of processors, these are CMOS signals that are
driven by the processor. The voltage supply for these pins must
be valid before the VR can supply VCC to the processor.
Conversely, the VR output must be disabled until the voltage
supply for the VID pins becomes valid. The VID pins are needed
to support the processor voltage specification variations. See
Table 3 for definitions of these pins. The VR must supply the
voltage that is requested by the pins, or disable itself.
VCCP
PWR
Processor I/O Power Supply which needs to remain on in Deep
Power Down Technology (C6) state.
VCCPC6
PWR
Processor I/O Power Supply which needs to remain on in Deep
Power Down Technology (C6) state.
VCC_SENSE
O
VCC_SENSE is an isolated low impedance connection to the
processor core power (VCC). It can be used to sense or measure
power near the silicon with little noise.
VSS_SENSE
O
VSS_SENSE is an isolated low impedance connection to
processor core VSS. It can be used to sense or measure ground
near the silicon with little noise.
§
Datasheet
63
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64
Datasheet
Thermal Specifications and Design Considerations
5
Thermal Specifications and
Design Considerations
The processor requires a thermal solution to maintain temperatures within operating
limits as set forth in Section 5.1. Any attempt to operate the processor outside these
operating limits may result in permanent damage to the processor and potentially
other components in the system. As processor technology changes, thermal
management becomes increasingly crucial when building computer systems.
Maintaining the proper thermal environment is critical to reliable, long-term system
operation. A complete thermal solution includes both component and system level
thermal management features. Component level thermal solutions include active or
passive heat spreaders or heat exchangers attached to the exposed processor die. The
solution should make firm contact to the die while maintaining processor mechanical
specifications such as pressure. A typical system level thermal solution may consist of
a system fan used to evacuate or pull air through the system in conjunction with a
multi-component heat spreader used to reduce the temperature of the processor and
other components while maintaining as uniform a skin temperature as possible.
Alternatively, the processor may be in a fan-less system, but would likely still use a
multi-component heat spreader.
Note: Trading thermal solutions also involves trading performance.
To allow for the optimal operation and long-term reliability of Intel processor-based
systems, the system/processor thermal solution should be designed such that the
processor remains within the minimum and maximum junction temperature (TJ)
specifications at the corresponding thermal design power (TDP) value listed in
Table 16 and Table 17. Thermal solutions not designed to provide this level of thermal
capability may affect the long-term reliability of the processor and system.
Refer to the Intel Centrino Atom Platform Thermal Application Note document for
more details on processor and system level cooling approaches.
The maximum junction temperature is defined by an activation of the processor Intel
Thermal Monitor. Refer to Section 5.1.2 for more details. Analysis indicates that real
applications are unlikely to cause the processor to consume the theoretical maximum
power dissipation for sustained time periods. Intel recommends that complete thermal
solution designs target the TDP indicated in Table 16 and Table 17. The Intel Thermal
Monitor feature is designed to help protect the processor in the unlikely event that an
application exceeds the TDP recommendation for a sustained period of time. For more
details on the usage of this feature, refer to Section 5.1.2. In all cases the Intel
Thermal Monitor feature must be enabled for the processor to remain within
specification.
Datasheet
65
Table 16. Power Specifications for Intel® Atom™ Processors Z560, Z550, Z540, Z530,
Z520, and Z510
Symbol
Processor
Number
Z510
Z520
TDP
Z530
Z540
Z550
Z560
Symbol
Core Frequency and
Voltage
Thermal Design
Power
Unit
Notes
2.0 W
W
@ 90°C
1.1 GHz and HFM VCC
0.6 GHZ and LFM VCC
1, 4
1.33 GHz and HFM VCC
0.8 GHZ and LFM VCC
2.0 W
2.2 W with HT enabled
W
1.60 GHz and HFM VCC
0.8 GHZ and LFM VCC
2.0 W
2.2 W with HT enabled
W
1.86 GHz and HFM VCC
0.8 GHZ and LFM VCC
2.4 W
2.64 W with HT enabled
W
2.00 GHz and HFM VCC
0.8 GHZ and LFM VCC
2.4 W
2.64 W with HT enabled
W
2.13 GHz and HFM VCC
0.8 GHZ and LFM VCC
2.5 W
2.75 W with HT enabled
W
Parameter
Min.
Typ.
—
—
Max.
1, 4, 6
@ 90°C
1, 4, 6
Unit
@ HFM VCC
1.0
W
@ LFM VCC
0.7
W
0.5
W
—
@ 90°C
1, 4, 6
PSGNT
—
@ 90°C
1, 4, 6
Auto Halt, Stop Grant Power
Deeper Sleep Power
@ 90°C
1, 4, 6
PAH,
PDPRSLP
@ 90°C
Notes
@ 70°C
2
@ 50°C
2, 5
PDC6
Deep Power Down Technology (C6)
—
—
0.1
W
@ 50°C
2
TJ
Junction Temperature
0
—
90
°C
3, 4
NOTES:
1.
The TDP specification should be used to design the processor thermal solution. The
TDP is not the maximum theoretical power the processor can generate.
2.
Not 100% tested. These power specifications are determined by characterization of the
processor currents at higher temperatures and extrapolating the values for the
temperature indicated.
3.
As measured by the activation of the on-die Intel Thermal Monitor. The Intel Thermal
Monitor’s automatic mode is used to indicate that the maximum TJ has been reached.
Refer to Section 5.1 for more details.
4.
The Intel Thermal Monitor automatic mode must be enabled for the processor to
operate within specifications.
5.
Deep Sleep state is mapped to Deeper Sleep State.
6.
Intel Hyper-Threading Technology requires a computer system with an Intel processor
supporting Hyper-Threading Technology and an HT Technology enabled chipset, BIOS
and operating system. Hyper-threading technology is available on select Intel Atom™
processor components (Z520, Z530, Z540, Z550, and Z560). HT Technology can add
200 mW of power above TDP.
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Datasheet
Thermal Specifications and Design Considerations
Table 17. Power Specifications for Intel® Atom™ Processors Z515 and Z500
Symbol
TDP
Processor
Number
Z500/Z515
0.8 GHz and HFM VCC
Z500/Z515
0.6 GHz and LFM VCC
Symbol
PAH,
PSGNT
PDPRSLP
PDC6
TJ
Core Frequency and
Voltage
Parameter
Thermal Design
Power
0.65
Min.
Typ.
Unit
W
Max.
Unit
Notes
@ 90°C
1, 4, 6, 7
Notes
@ 70°C
Auto Halt, Stop Grant Power
@ HFM VCC
—
—
0.6
W
2, 6, 7
@ LFM VCC
—
—
0.5
W
Deeper Sleep Power
—
—
0.3
W
2, 5
Deep Power Down Technology (C6)
—
—
0.08
W
2
Junction Temperature
0
—
90
°C
3, 4
NOTES:
1.
The TDP specification should be used to design the processor thermal solution. The
TDP is not the maximum theoretical power the processor can generate.
2.
Not 100% tested. These power specifications are determined by characterization of the
processor currents at higher temperatures and extrapolating the values for the
temperature indicated.
3.
As measured by the activation of the on-die Intel Thermal Monitor. The Intel Thermal
Monitor’s automatic mode is used to indicate that the maximum TJ has been reached.
Refer to Section 5.1 for more details.
4.
The Intel Thermal Monitor automatic mode must be enabled for the processor to
operate within specifications.
5.
Deep Sleep state is mapped to Deeper Sleep State.
6.
Intel Atom processor Z515 enables Intel® Burst Performance Technology.
7.
Intel® HT Technology requires a computer system with an Intel processor supporting
Hyper-Threading Technology and an Intel® HT Technology enabled chipset, BIOS, and
operating system. The Intel Atom processor Z500 does not support Intel® HT
Technology while the Intel Atom processor Z515 does support Intel® HT Technology.
Datasheet
67
5.1
Thermal Specifications
The processor incorporates three methods of monitoring die temperature—Digital
Thermal Sensor, Intel Thermal Monitor, and the Thermal Diode. The Intel Thermal
Monitor (detailed in Section 5.1.2) must be used to determine when the maximum
specified processor junction temperature has been reached.
5.1.1
Thermal Diode
The processor incorporates an on-die PNP transistor whose base emitter junction is
used as a thermal “diode”, with its collector shorted to ground. The thermal diode can
be read by an off-die analog/digital converter (a thermal sensor) located on the
motherboard or a stand-alone measurement kit. The thermal diode may be used to
monitor the die temperature of the processor for thermal management or
instrumentation purposes but is not a reliable indication that the maximum operating
temperature of the processor has been reached. When using the thermal diode, a
temperature offset value must be read from a processor MSR and applied. See
Section 5.1.2 for more details. See Section 5.1.3 for thermal diode usage
recommendation when the PROCHOT# signal is not asserted.
The reading of the external thermal sensor (on the motherboard) connected to the
processor thermal diode signals will not necessarily reflect the temperature of the
hottest location on the die. This is due to inaccuracies in the external thermal sensor,
on-die temperature gradients between the location of the thermal diode and the
hottest location on the die, and time based variations in the die temperature
measurement. Time based variations can occur when the sampling rate of the thermal
diode (by the thermal sensor) is slower than the rate at which the TJ temperature can
change.
Offset between the thermal diode based temperature reading and the Intel Thermal
Monitor reading may be characterized using the Intel Thermal Monitor’s Automatic
mode activation of the thermal control circuit. This temperature offset must be taken
into account when using the processor thermal diode to implement power
management events. This offset is different than the diode TOFFSET value programmed
into the processor Model Specific Register (MSR).
Table 18. and Table 19 provide the diode interface and specifications. Transistor
model parameters shown in Table 19 provide more accurate temperature
measurements when the diode ideality factor is closer to the maximum or minimum
limits. Contact your external sensor supplier for their recommendation. The thermal
diode is separate from the Thermal Monitor’s thermal sensor and cannot be used to
predict the behavior of the Thermal Monitor.
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Datasheet
Thermal Specifications and Design Considerations
Table 18. Thermal Diode Interface
Signal Name
Pin/Ball Number
Signal Description
THERMDA
T5
Thermal diode anode
THERMDC
U4
Thermal diode cathode
Table 19. Thermal Diode Parameters Using Transistor Model
Min.
Typ.
Max.
Unit
Note
s
Forward Bias Current
5
—
200
µA
1
IE
Emitter Current
5
—
200
µA
1
nQ
Transistor Ideality
0.997
1.001
1.015
2, 3, 4
0.25
—
0.65
2, 3
2.79
4.52
6.24
Symbol
IFW
Parameter
Beta
RT
Series Resistance
Ω
2, 5
NOTES:
1.
Intel does not support or recommend operation of the thermal diode under reverse
bias.
2.
Characterized across a temperature range of 50–100 °C.
3.
Not 100% tested. Specified by design characterization.
4.
The ideality factor, nQ, represents the deviation from ideal transistor model behavior
as exemplified by the equation for the collector current:
IC = IS * (e
qVBE/nQkT
–1)
Where IS = saturation current, q = electronic charge, VBE = voltage across the
transistor base emitter junction (same nodes as VD), k = Boltzmann Constant, and
T = absolute temperature (Kelvin).
5.
The series resistance, RT, provided in the Diode Model Table (Table 19) can be used for
more accurate readings as needed.
When calculating a temperature based on the thermal diode measurements, a number
of parameters must be either measured or assumed. Most devices measure the diode
ideality and assume a series resistance and ideality trim value, although are capable
of also measuring the series resistance. Calculating the temperature is then
accomplished using the equation listed under Table 19. In most sensing devices, an
expected value for the diode ideality is designed-in to the temperature calculation
equation. If the designer of the temperature sensing device assumes a perfect diode,
the ideality value (also called ntrim) will be 1.000. Given that most diodes are not
perfect, the designers usually select an ntrim value that more closely matches the
behavior of the diodes in the processor. If the processor diode ideality deviates from
that of the ntrim, each calculated temperature will be offset by a fixed amount. This
temperature offset can be calculated with the equation:
Terror(nf) = Tmeasured * (1 – nactual/ntrim)
Where Terror(nf) is the offset in degrees C, Tmeasured is in Kelvin, nactual is the measured
ideality of the diode, and ntrim is the diode ideality assumed by the temperature
sensing device.
Datasheet
69
5.1.2
Intel® Thermal Monitor
The Intel Thermal Monitor helps control the processor temperature by activating the
TCC (Thermal Control Circuit) when the processor silicon reaches its maximum
operating temperature. The temperature at which the Intel Thermal Monitor activates
the TCC is not user configurable. Bus traffic is snooped in the normal manner and
interrupt requests are latched (and serviced during the time that the clocks are on)
while the TCC is active.
With a properly designed and characterized thermal solution, it is anticipated that the
TCC would only be activated for very short periods of time when running the most
power intensive applications. The processor performance impact due to these brief
periods of TCC activation is expected to be minor and hence not detectable. An underdesigned thermal solution that is not able to prevent excessive activation of the TCC in
the anticipated ambient environment may cause a noticeable performance loss and
may affect the long-term reliability of the processor. In addition, a thermal solution
that is significantly under designed may not be capable of cooling the processor even
when the TCC is active continuously.
The Intel Thermal Monitor controls the processor temperature by modulating (starting
and stopping) the processor core clocks or by initiating an Enhanced Intel SpeedStep
Technology transition when the processor silicon reaches its maximum operating
temperature. The Intel Thermal Monitor uses two modes to activate the TCC:
automatic mode and on-demand mode. If both modes are activated, automatic mode
takes precedence.
There are two automatic modes called Intel Thermal Monitor 1 (TM1) and Intel
Thermal Monitor 2 (TM2). These modes are selected by writing values to the MSRs of
the processor. After automatic mode is enabled, the TCC will activate only when the
internal die temperature reaches the maximum allowed value for operation.
The Intel Thermal Monitor automatic mode must be enabled through BIOS for the
processor to be operating within specifications. Intel recommends TM1 and TM2 be
enabled on the processor.
When TM1 is enabled and a high temperature situation exists, the clocks will be
modulated by alternately turning the clocks off and on at a 50% duty cycle. Cycle
times are processor speed dependent and will decrease linearly as processor core
frequencies increase. Once the temperature has returned to a non-critical level,
modulation ceases and TCC goes inactive. A small amount of hysteresis has been
included to prevent rapid active/inactive transitions of the TCC when the processor
temperature is near the trip point. The duty cycle is factory configured and cannot be
modified. Also, automatic mode does not require any additional hardware, software
drivers, or interrupt handling routines. Processor performance will be decreased by the
same amount as the duty cycle when the TCC is active.
When TM2 is enabled and a high temperature situation exists, the processor will
perform an Enhanced Intel SpeedStep Technology transition to the LFM. When the
processor temperature drops below the critical level, the processor will make an
Enhanced Intel SpeedStep Technology transition to the last requested operating point.
The Intel Thermal Monitor automatic mode must be enabled through BIOS for
the processor to be operating within specifications. Intel recommends TM1
and TM2 be enabled on the processors.
TM1 and TM2 can co-exist within the processor. If both TM1 and TM2 bits are enabled
in the auto-throttle MSR, TM2 will take precedence over TM1. However, if Force TM1
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Datasheet
Thermal Specifications and Design Considerations
over TM2 is enabled in MSRs using BIOS and TM2 is not sufficient to cool the
processor below the maximum operating temperature, then TM1 will also activate to
help cool down the processor.
If a processor load based Enhanced Intel SpeedStep Technology transition (through
MSR write) is initiated when a TM2 period is active, there are two possible results:
• If the processor load based Enhanced Intel SpeedStep Technology transition
target frequency is higher than the TM2 transition based target frequency, the
processor load-based transition will be deferred until the TM2 event has been
completed.
• If the processor load-based Enhanced Intel SpeedStep Technology transition
target frequency is lower than the TM2 transition based target frequency, the
processor will transition to the processor load-based Enhanced Intel SpeedStep
Technology target frequency point.
The TCC may also be activated using on-demand mode. If bit 4 of the ACPI Intel
Thermal Monitor control register is written to a 1, the TCC will be activated
immediately independent of the processor temperature. When using on-demand mode
to activate the TCC, the duty cycle of the clock modulation is programmable using bits
3:1 of the same ACPI Intel Thermal Monitor control register. In automatic mode, the
duty cycle is fixed at 50% on, 50% off, however in on-demand mode, the duty cycle
can be programmed from 12.5% on/ 87.5% off, to 87.5% on/12.5% off in 12.5%
increments. On-demand mode may be used at the same time automatic mode is
enabled—however, if the system tries to enable the TCC using on-demand mode at
the same time automatic mode is enabled and a high temperature condition exists,
automatic mode will take precedence.
An external signal, PROCHOT# (processor hot) is asserted when the processor detects
that its temperature is above the thermal trip point. Bus snooping and interrupt
latching are also active while the TCC is active.
Besides the thermal sensor and thermal control circuit, the Intel Thermal Monitor also
includes one ACPI register, one performance counter register, three MSR, and one I/O
pin (PROCHOT#). All are available to monitor and control the state of the Intel
Thermal Monitor feature. The Intel Thermal Monitor can be configured to generate an
interrupt upon the assertion or de-assertion of PROCHOT#.
PROCHOT# will not be asserted when the processor is in the Stop Grant, Sleep, Deep
Sleep, and Deeper Sleep low power states—hence, the thermal diode reading must be
used as a safeguard to maintain the processor junction temperature within maximum
specification. If the platform thermal solution is not able to maintain the processor
junction temperature within the maximum specification, the system must initiate an
orderly shutdown to prevent damage. If the processor enters one of the above low
power states with PROCHOT# already asserted, PROCHOT# will remain asserted until
the processor exits the low power state and the processor junction temperature drops
below the thermal trip point.
If Intel Thermal Monitor automatic mode is disabled, the processor will operate out of
specification. Regardless of enabling the automatic or on-demand modes, in the event
of a catastrophic cooling failure, the processor will automatically shut down when the
silicon has reached a temperature of approximately 120 °C. At this point the
THERMTRIP# signal will go active. THERMTRIP# activation is independent of processor
activity and does not generate any bus cycles. When THERMTRIP# is asserted, the
processor core voltage must shut down within the time specified in Chapter 0.
Datasheet
71
5.1.3
Digital Thermal Sensor
The processor also contains an on die Digital Thermal Sensor (DTS) that is read using
an MSR (no I/O interface). The processor has a unique digital thermal sensor that’s
temperature is accessible using the processor MSRs. The DTS is the preferred method
of reading the processor die temperature since it can be located much closer to the
hottest portions of the die and can thus more accurately track the die temperature
and potential activation of processor core clock modulation using the Thermal Monitor.
The DTS is only valid while the processor is in the normal operating state (the Normal
package level low power state).
Unlike traditional thermal devices, the DTS outputs a temperature relative to the
maximum supported operating temperature of the processor (TJ_max). It is the
responsibility of software to convert the relative temperature to an absolute
temperature. The temperature returned by the DTS will always be at or below TJ_max.
Catastrophic temperature conditions are detectable using an Out Of Spec status bit.
This bit is also part of the DTS MSR. When this bit is set, the processor is operating
out of specification and immediate shutdown of the system should occur. The
processor operation and code execution is not ensured once the activation of the “Out
of Spec” status bit is set.
The DTS-relative temperature readout corresponds to the Thermal Monitor (TM1/TM2)
trigger point. When the DTS indicates maximum processor core temperature has been
reached, the TM1 or TM2 hardware thermal control mechanism will activate. The DTS
and TM1/TM2 temperature may not correspond to the thermal diode reading since the
thermal diode is located in a separate portion of the die and thermal gradient from the
core DTS. Additionally, the thermal gradient from DTS to thermal diode can vary
substantially due to changes in processor power, mechanical and thermal attach, and
software application. The system designer is required to use the DTS to ensure proper
operation of the processor within its temperature operating specifications.
Changes to the temperature can be detected using two programmable thresholds
located in the processor MSRs. These thresholds have the capability of generating
interrupts using the core's local APIC. Refer to the Intel® 64 and IA-32 Architectures
Software Developer's Manuals for specific register and programming details.
5.1.4
Out of Specification Detection
Overheat detection is performed by monitoring the processor temperature and
temperature gradient. This feature is intended for graceful shut down before the
THERMTRIP# is activated. If the processor’s TM1 or TM2 are triggered and the
temperature remains high, an “Out Of Spec” status and sticky bit are latched in the
status MSR register and generates thermal interrupt.
5.1.5
PROCHOT# Signal Pin
An external signal, PROCHOT# (processor hot), is asserted when the processor die
temperature has reached its maximum operating temperature. If TM1 or TM2 is
enabled, then the TCC will be active when PROCHOT# is asserted. The processor can
be configured to generate an interrupt upon the assertion or de-assertion of
PROCHOT#. Refer to the Intel® 64 and IA-32 Architectures Software Developer's
Manuals.
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Datasheet
Thermal Specifications and Design Considerations
The processor implements a bidirectional PROCHOT# capability to allow system
designs to protect various components from overheating situations. The PROCHOT#
signal is bidirectional in that it can either signal when the processor has reached its
maximum operating temperature or be driven from an external source to activate the
TCC. The ability to activate the TCC using PROCHOT# can provide a means for thermal
protection of system components.
Only a single PROCHOT# pin exists at a package level of the processor. When the
core's thermal sensor trips, the PROCHOT# signal is driven by the processor package.
If only TM1 is enabled, PROCHOT# will be asserted and only the core that is above
TCC temperature trip point will have its core clocks modulated. If TM2 is enabled and
the core is above TCC temperature trip point, it will enter the lowest programmed TM2
performance state. It is important to note that Intel recommends both TM1 and TM2
to be enabled.
When PROCHOT# is driven by an external agent, if only TM1 is enabled on the core,
then the processor core will have the clocks modulated. If TM2 is enabled, then the
processor core will enter the lowest programmed TM2 performance state. It should be
noted that Force TM1 on TM2, enabled using BIOS, does not have any effect on
external PROCHOT#. If PROCHOT# is driven by an external agent when TM1, TM2,
and Force TM1 on TM2 are all enabled, then the processor will still apply only TM2.
PROCHOT# may be used for thermal protection of voltage regulators (VR). System
designers can create a circuit to monitor the VR temperature and activate the TCC
when the temperature limit of the VR is reached. By asserting PROCHOT# (pulled-low)
and activating the TCC, the VR will cool down as a result of reduced processor power
consumption. Bidirectional PROCHOT# can allow VR thermal designs to target
maximum sustained current instead of maximum current. Systems should still provide
proper cooling for the VR and rely on bidirectional PROCHOT# only as a backup in
case of system cooling failure. The system thermal design should allow the power
delivery circuitry to operate within its temperature specification even while the
processor is operating at its TDP. With a properly designed and characterized thermal
solution, it is anticipated that bidirectional PROCHOT# would only be asserted for very
short periods of time when running the most power intensive applications. An underdesigned thermal solution that is not able to prevent excessive assertion of
PROCHOT# in the anticipated ambient environment may cause a noticeable
performance loss.
Datasheet
73
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