Fairchild FDB024N08BL7 Synchronous rectification for atx / server / telecom psu Datasheet

FDB024N08BL7
N-Channel PowerTrench® MOSFET
80 V, 229 A, 2.4 mΩ
Features
Description
• RDS(on) = 1.7 mΩ ( Typ.) @ VGS = 10 V, ID = 100 A
This N-Channel MOSFET is produced using Fairchild
Semiconductor’s advance PowerTrench® process that has been
tailored to minimize the on-state resistance while maintaining
superior switching performance.
• Low FOM RDS(on) *QG
• Low Reverse Recovery Charge, Qrr = 112 nC
• Soft Reverse Recovery Body Diode
• Enables Highly Efficiency in Synchronous Rectification
Applications
• Fast Switching Speed
• Synchronous Rectification for ATX / Server / Telecom PSU
• RoHS Compliant
• Battery Protection Circuit
• Qualified according to JEDEC Standards JESD22-A113F and
IPC/JEDEC J-STD-020D.1
• Motor drives and Uninterruptible Power Supplies
D(Pin4, tab)
4
12
3
56
7
1. Gate
2. Source
3. Source
4. Drain
5. Source
6. Source
7. Source
G
(Pin1)
D2-PAK
(TO-263)
S(Pin2,3,5,6,7)
MOSFET Maximum Ratings TC = 25oC unless otherwise noted
Symbol
VDSS
Drain to Source Voltage
Parameter
VGSS
Gate to Source Voltage
- Continuous (TC = 25oC, Silicon Limited)
Drain Current
ID
IDM
Drain Current
EAS
Single Pulsed Avalanche Energy
dv/dt
Peak Diode Recovery dv/dt
Power Dissipation
PD
- Continuous (TC = 100oC, Silicon Limited)
FDB024N08BL7
80
Unit
V
±20
V
229*
162*
A
- Continuous (TC = 25oC, Package Limited)
120
- Pulsed
(Note 1)
916
A
(Note 2)
917
mJ
6.0
V/ns
(Note 3)
(TC = 25oC)
- Derate Above 25oC
246
W
1.64
W/oC
TJ, TSTG
Operating and Storage Temperature Range
-55 to +175
Maximum Lead Temperature for Soldering,
TL
300
1/8” from Case for 5 Seconds
*Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 120 A.
o
C
o
C
Thermal Characteristics
Symbol
Parameter
FDB024N08BL7
RθJC
Thermal Resistance, Junction to Case, Max.
0.61
RθJA
Thermal Resistance, Junction to Ambient, Max.
62.5
©2012 Fairchild Semiconductor Corporation
FDB024N08BL7 Rev.C4
1
Unit
oC/W
www.fairchildsemi.com
FDB024N08BL7 N-Channel PowerTrench® MOSFET
June 2014
Part Number
FDB024N08BL7
Top Mark
FDB024N08B
Package
D2PAK-7L
Packing Method
Tape and Reel
Reel Size
330 mm
Tape Width
24 mm
Quantity
800 units
Electrical Characteristics TC = 25oC unless otherwise noted
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
80
-
-
V
-
0.05
-
V/oC
Off Characteristics
BVDSS
ΔBVDSS
ΔTJ
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate to Body Leakage Current
ID = 250 μA, VGS = 0 V
ID = 250 μA, Referenced to
25oC
VDS = 64 V, VGS = 0 V
-
-
1
VDS = 64 V, TC = 150oC
-
-
500
VGS = ±20 V, VDS = 0 V
-
-
±100
μA
nA
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
VGS = VDS, ID = 250 μA
2.5
-
4.5
V
Static Drain to Source On Resistance
-
1.7
2.4
mΩ
gFS
Forward Transconductance
VGS = 10 V, ID = 100 A
VDS = 10 V, ID = 100 A
-
227
-
S
-
10170
13530
pF
-
1670
2220
pF
-
35
-
pF
-
3025
-
pF
-
137
178
nC
-
56
-
nC
-
25
-
nC
-
28
-
nC
f = 1MHz
-
2.4
-
Ω
-
47
104
ns
VDD = 40 V, ID = 100 A,
VGS = 10 V, RG = 4.7 Ω
-
66
142
ns
-
87
184
ns
-
41
92
ns
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Coss(er)
Engry Related Output Capacitance
Qg(tot)
Total Gate Charge at 10V
Qgs
Gate to Source Gate Charge
Qgs2
Gate Charge Threshold to Plateau
Qgd
Gate to Drain “Miller” Charge
ESR
Equivalent Series Resistance (G-S)
VDS = 40 V, VGS = 0 V,
f = 1 MHz
VDS = 40 V, VGS = 0 V
VDS = 40 V, VGS = 10 V,
ID = 100 A
(Note 4)
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
(Note 4)
Drain-Source Diode Characteristics
IS
Maximum Continuous Drain to Source Diode Forward Current
-
-
229*
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
916
A
VSD
Drain to Source Diode Forward Voltage
VGS = 0 V, ISD = 100 A
-
-
1.3
V
trr
Reverse Recovery Time
-
80
-
ns
Qrr
Reverse Recovery Charge
VGS = 0 V, VDD = 40 V, ISD = 100 A,
dIF/dt = 100 A/μs
-
112
-
nC
Notes:
1. Repetitive rating: pulse width limited by maximum junction temperature.
2. L = 3 mH, IAS = 24.72 A, RG = 25 Ω, starting TJ = 25°C.
3. ISD ≤ 100 A, di/dt ≤ 200 A/μs, VDD ≤ BVDSS, starting TJ = 25°C.
4. Essentially independent of operating temperature typical characteristics.
©2012 Fairchild Semiconductor Corporation
FDB024N08BL7 Rev.C4
2
www.fairchildsemi.com
FDB024N08BL7 N-Channel PowerTrench® MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
500
500
*Notes:
1. VDS = 10V
2. 250μs Pulse Test
100
ID, Drain Current[A]
ID, Drain Current[A]
100
10
1
*Notes:
1. 250μs Pulse Test
o
2. TC = 25 C
0.1
0.01
VGS = 15.0V
10.0V
8.0V
6.5V
6.0V
5.5V
5.0V
o
25 C
10
o
-55 C
0.1
1
VDS, Drain-Source Voltage[V]
1
2.5
5
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
3.0
3.5 4.0 4.5 5.0 5.5
VGS, Gate-Source Voltage[V]
IS, Reverse Drain Current [A]
VGS = 10V
1.6
1.4
VGS = 20V
1.2
100
o
o
25 C
175 C
10
*Notes:
1. VGS = 0V
o
2. 250μs Pulse Test
*Note: TC = 25 C
0
100
200
300
ID, Drain Current [A]
1
0.2
400
Figure 5. Capacitance Characteristics
10
VGS, Gate-Source Voltage [V]
10000
Ciss
Capacitances [pF]
0.4
0.6
0.8
1.0
1.2 1.3
VSD, Body Diode Forward Voltage [V]
Figure 6. Gate Charge Characteristics
30000
1000
100
6.5
500
1.8
1.0
6.0
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
2.0
RDS(ON) [mΩ],
Drain-Source On-Resistance
o
175 C
Coss
*Note:
1. VGS = 0V
2. f = 1MHz
Crss
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
10
0.1
1
10
VDS, Drain-Source Voltage [V]
©2012 Fairchild Semiconductor Corporation
FDB024N08BL7 Rev.C4
6
4
2
0
80
3
VDS = 16V
VDS = 40V
VDS = 64V
8
*Note: ID = 100A
0
30
60
90
120
Qg, Total Gate Charge [nC]
150
www.fairchildsemi.com
FDB024N08BL7 N-Channel PowerTrench® MOSFET
Typical Performance Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
2.1
RDS(on), [Normalized]
Drain-Source On-Resistance
BVDSS, [Normalized]
Drain-Source Breakdown Voltage
1.08
1.04
1.00
0.96
*Notes:
1. VGS = 0V
2. ID = 250μA
0.92
-80
-40
0
40
80
120 160
o
TJ, Junction Temperature [ C]
1.8
1.5
1.2
0.9
0.6
-80
200
Figure 9. Maximum Safe Operating Area
*Notes:
1. VGS = 10V
2. ID = 100A
-40
0
40
80
120 160
o
TJ, Junction Temperature [ C]
Figure 10. Maximum Drain Current
vs. Case Temperature
2000
1000
300
VGS= 10V
10us
250
100us
100
ID, Drain Current [A]
ID, Drain Current [A]
1ms
10ms
DC
10
Operation in This Area
is Limited by R DS(on)
1
*Notes:
o
1. TC = 25 C
0.1
1
10
VDS, Drain-Source Voltage [V]
200
150
100
50
o
2. TJ = 175 C
3. Single Pulse
0.01
0.1
o
RθJC= 0.61 C/W
0
25
100
Figure 11. Eoss vs. Drain to Source Voltage
50
75
100
125
150
o
TC, Case Temperature [ C]
175
Figure 12. Unclamped Inductive
Switching Capability
6
50
IAS, Avalanche Current [A]
5
EOSS, [μJ]
200
4
3
2
If R = 0
tAV = (L)(IAS)/(1.3*RATED BVDSS-VDD)
If R = 0
tAV = (L/R)In[(IAS*R)/(1.3*RATED BVDSS-VDD)+1]
o
STARTING TJ = 25 C
10
o
STARTING TJ = 150 C
1
0
0
20
40
60
VDS, Drain to Source Voltage [V]
©2012 Fairchild Semiconductor Corporation
FDB024N08BL7 Rev.C4
1
0.1
80
4
1
10
100
tAV, Time In Avalanche [ms]
1000
www.fairchildsemi.com
FDB024N08BL7 N-Channel PowerTrench® MOSFET
Typical Performance Characteristics (Continued)
FDB024N08BL7 N-Channel PowerTrench® MOSFET
Typical Performance Characteristics (Continued)
Figure 12. Transient Thermal Response Curve
Thermal Response [ZθJC]
1
0.5
0.1
0.2
PDM
0.1
t1
0.05
o
0.01
0.01
1. ZθJC(t) = 0.61 C/W Max.
2. Duty Factor, D= t1/t2
3. TJM - TC = PDM * ZθJC(t)
Single pulse
0.005
-5
10
©2012 Fairchild Semiconductor Corporation
FDB024N08BL7 Rev.C4
t2
*Notes:
0.02
-4
10
-3
-2
10
10
Rectangular Pulse Duration [sec]
5
-1
10
1
www.fairchildsemi.com
FDB024N08BL7 N-Channel PowerTrench® MOSFET
Figure 13. Gate Charge Test Circuit & Waveform
Figure 14. Resistive Switching Test Circuit & Waveforms
VDS
RG
RL
VDS
VDD
VGS
VGS
DUT
V
10V
GS
90%
10%
td(on)
tr
t on
td(off)
tf
t off
Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms
VGS
©2012 Fairchild Semiconductor Corporation
FDB024N08BL7 Rev.C4
6
www.fairchildsemi.com
FDB024N08BL7 N-Channel PowerTrench® MOSFET
Figure 16. Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
I SD
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VSD
VDD
Body Diode
Forward Voltage Drop
©2012 Fairchild Semiconductor Corporation
FDB024N08BL7 Rev.C4
7
www.fairchildsemi.com
FDB024N08BL7 N-Channel PowerTrench® MOSFET
Mechanical Dimensions
Figure 17. TO263 (D2PAK), Molded, 7-Lead, Surface Mount
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without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
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©2012 Fairchild Semiconductor Corporation
FDB024N08BL7 Rev.C4
8
www.fairchildsemi.com
tm
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Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
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First Production
Datasheet contains preliminary data; supplementary data will be published at a later
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Semiconductor. The datasheet is for reference information only.
Rev. I68
©2012 Fairchild Semiconductor Corporation
FDB024N08BL7 Rev.C4
9
www.fairchildsemi.com
FDB024N08BL7 N-Channel PowerTrench® MOSFET
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