ETC1 LVS20090C300030 Chip varistor provides high reliability on surface mounting Datasheet

Chip Varistor
DESCRIPTION
The LVS series is metal oxide based chip varistor for transient
voltage suppression. They have non-linear voltage-current
behavior, similar to zener diode. Multilayer structured varistor,
however, shows superiority in electrical reliability than zener
diode, since each grain exhibits small p-n junction. In addition,
LVS series shows better electrical properties such as high
clamping voltage and low leakage current.
FEATURES
APPLICATIONS
*Chip varistor provides high reliability on surface mounting
*Wide range of working voltage (VW = 5.6V˜30V)
*Good clamping ratio and low leakage current
*Electroplating of Ni and solder gives higher solderability
*Wide operating temperature (-55˜125°C )
*Various capacitance is available
*Protection from transient voltage noise in all kinds of IC
*Protection from ESD, EFT and surge in power I/O port
*Replacement of zener diode
ORDERING INFORMATION
LVS 10 033 B 200 401
Series
Capacitance
LVS = Standard
LVSL = Low
Capacitance
030 = 3pF
300 = 30pF
301 = 300pF
Size
Clamping voltage
10
16
20
32
=
=
=
=
1005(0402)
1608(0603)
2012(0805)
3216(1206)
Working voltage
056 = 5.6V
090 = 9.0V
260 = 26V
100 = 10V
300 = 30V
Transient energy
Z
A
B
C
D
E
F
G
H
I
J
K
=
=
=
=
=
=
=
=
=
=
=
=
0.005J
0.02J
0.05J
0.1J
0.2J
0.3J
0.4J
0.6J
0.8J
1.0J
1.3J
1.5J
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1
Chip Varistor
SPECIFICATIONS
Part No.
Working
Voltage
(<25µA)
Breakdown
Voltage
(@ 1mA )
Clamping
Voltage
( 8/20µS)
Peak
Current
( 8/20µS)
Transient
Energy
(10/1000µS)
Capacitance
(@ 1 kHz)
Symbol
VW (V)
VB (V)
VC (V)
IP (A)
ET (J)
C (pF)
VB (V)
VC (V)
IP (A)
ET (J)
C (pF)
20
20
20
20
20
0.05
0.05
0.05
0.05
0.05
370
200
100
50
30
VC (V)
16
20
30
40
58
65
IP (A)
30
30
30
30
30
30
ET (J)
0.1
0.1
0.1
0.1
0.1
0.1
VC (V)
IP (A)
ET (J)
C (pF)
40
40
35
35
35
35
0.1
0.1
0.1
0.1
0.1
0.1
3000
1300
800
450
300
200
IP (A)
40
40
35
35
35
35
150
ET (J)
0.1
0.1
0.1
0.1
0.1
0.1
0.4
C (pF)
1800
1300
800
450
300
200
1500
Transient Energy
0.1
0.1
0.1
0.1
0.1
Capacitance
1300
800
450
300
200
* 1MHz
1005(0402) size
Part No.
VW (V)
LVS10056B160...
LVS10090B200...
LVS10140B300...
LVS10180B400...
LVS10260B580...
5.6
9
14
18
26
7.2˜9.6
10.8˜14.3
16.8˜22.2
21.5˜28.5
30.9˜40.9
VW (V)
5.6
9
14
18
26
30
VB (V)
7.2˜9.6
10.8˜14.3
16.8˜22.2
21.5˜28.5
30.9˜40.9
35.7˜47.3
16
20
30
40
58
1608(0603) size
Part No.
LVS16056C160...
LVS16090C200...
LVS16140C300...
LVS16180C400...
LVS16260C580...
LVS16300C650...
C (pF)
1000
650
350
230
180
100
2012(0805) size
Part No.
VW (V)
LVS20056C160...
LVS20090C200...
LVS20140C300...
LVS20180C400...
LVS20260C580...
LVS20300C650...
5.6
9
14
18
26
30
7.2˜9.6
10.8˜14.3
16.8˜22.2
21.5˜28.5
30.9˜40.9
35.7˜47.3
VB (V)
VW (V)
5.6
9
14
18
26
30
18
VB (V)
7.2˜9.6
10.8˜14.3
16.8˜22.2
21.5˜28.5
30.9˜40.9
35.7˜47.3
21.5˜28.5
16
20
30
40
58
65
3216(1206) size
Part No.
LVS32056C160...
LVS32090C200...
LVS32140C300...
LVS32180C400...
LVS32260C580...
LVS32300C650...
* LVS32180F400...
VC (V)
16
20
30
40
58
65
40
* For Automotive Application : Withstand 24.5V DC for 5minutes
Low Capacitance Series
Part No.
LVS10090C200...
LVS10140C300...
LVS10180C400...
LVS10260C580...
LVS10300C650...
Working Voltage
9
14
18
26
30
Breakdown Voltage
10.8˜14.3
16.8˜22.2
21.5˜28.5
30.9˜40.9
35.7˜47.3
Clamping Voltage
20
30
40
58
65
Peak Current
40
35
35
35
35
VW = Maximum DC voltage, that is applied continuously in the maximum operating temperature of the device.
VB = Varistor voltage or normal voltage, that is measured at the applied current of 1mA.
VC = Peak voltage appearing across the varistor when measured at the condition of specified pulsed current and waveform.
(8/20µS, 0.1J 2A, 0.05J 1A)
IP = Surge current or peak current, the maximum current without causing device failure measured with specified waveform.( 8/20µS)
ET = Maximum rated transient energy that is dissipated for a single current pulse at a specified impulse duration.( 10/1000µS)
2
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Chip Varistor
RELIABILITY TEST METHOD
Item
Test Method
Criteria for judging
Resistance to Soldering
Heat
Soldering temperature : 260± 5°C
Duration of immersion : 10 ± 1sec.
Preheating : 150°C , 1min.
Visual : No mechanical damage
Solderability Test
Soldering temperature : 230 ± 5°C
Duration of immersion : 5± 1sec.
Preheating : 150°C , 1min.
The Force W is applied to DUT.
At least 75% of the electrode must
be covered with new solder.
Adhesion
∆ VB/VB<10%
Visual : No mechanical damage
0805 : over 2.0Kgf
0603 : over 1.0Kgf
0402 : over 0.7Kgf
Resistance to
Flexure of Substrate
The middle part of substrate shall,
successively, be pressurized by means of the
pressurizing rod at a rate of about 1mm/sec.
Visual : No mechanical damage
Maintenance time : 5 sec.
Bending distane : 1mm
Dry Heat Test
Test temperature : 125 ± 2°C
Test duration : 1000+48hrs.
After completion of the test, leaving the
sample under the standard conditions for 24¡ 2hrs.
Visual : No mechanical damage
∆ VB /VB <10%
Cold Test
Test temperature : -30± 2°C
Test duration : 1000+48hrs.
After completion of the test, leaving the
sample under the standard conditions for 24+ 2hrs.
Visual : No mechanical damage
∆ VB /VB <10%
Damp Heat Test
(Steady State)
Test temperature : 40± 2°C
Test relative humidity : 90˜95RH%
Test duration : 56days+24hrs.
After completion of the test, leaving the sample under
the standard conditions for 24± 2hrs.(IEC60068-2-3)
Visual : No mechanical damage
∆ VB /VB <10%
Thermal Shock
Test
Visual : No mechanical damage
∆ VB /VB <10%
This cycle is repeated 50 times. After completion of the
test, leave the sample under standard condition for 24±
2hrs.
ESD Test
(Contact discharge)
Test Voltage : 8 kV
Type of discharge : direct contact discharge
Visual : No mechanical damage
∆ VB /VB <15%
Number of test pulses : 20 times
Polarity : +/(IEC 61000-4-2)
ESD Test
(Air Discharge)
Test Voltage : 15 kV
Type of discharge : air discharge
Number of test pulses : 20 times
Polarity : +/(IEC 61000-4-2)
High Temperature
Life Test
Temp. : 125± 2°C
Duration : 1000¡ 48hrs.
Applied voltage : V dc max
After completion of the test, leave the sample under
standard condition for 24± 2hrs.
Visual : No mechanical damage
∆ VB /VB <15%
Visual : No mechanical damage
∆ VB /VB <10%
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3
Chip Varistor
CHARACTERISTIC CURVES
I-V Characteristics
Temperature vs. VB
Typical Temperature Dependence of VB
Temperature vs. a
4
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Chip Varistor
RELIABILITY TEST DATA
High Temperature Life Test
Cold Test
Thermal Shock Test
Resistance to Soldering Heat
ESD Test
Adhesion
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Chip Varistor
APPLICATION FOR ESD
What is ESD ?
Protection Performance of Lattron is Varistor for ESD
It is a kind of transient voltage noise. The definition of transient
voltage is listed in IEC 61000-4 series, which describes the
immunity requirements and test methods for electrical and
electric equipments, subjected to ESD, EFT, and surge. Figure 1
is the waveform of ESD, defined in IEC 61000-4-2.
The performance of Lattron is varistor against ESD noise is
tested with the test circuit as shown in Picture 2.
Test procedure includes three different circuit configurations;
without varistor, with varistor at DUT position, and shorted circuit
at DUT position. The test results that had collected with digital
scope are shown in Picture 3.
The performance of ESD suppression with Lattron is varistor is
as good as that of short circuit.
Picture 1.
Picture 2.
Varistor vs. TVS Diode
ESD current has the rise time of sub-nanosecond, duration of
tens of nanosecond, and its amplitude reaches over 10KV. So,
the protecting device from ESD also needs fast response time.
TVS diode has a similar performance with that of LATTRON's
varistor, in terms of response time and handling capacity. Which,
however, shows inferiority in surge current, leakage current,
operating directionality, polarity, and miniaturization as shown in
the table.
Response time
LATTRON®ó VARISTOR
TVS DIODE
< 1ns
> 1ns
ESD handling
capability
Leakage current
Surge current
handling capability
Operating temp.
Size
6
> Contact 8kV, 10 cycle
Low in all spec.
High in all spec.
Characteristics are
deteriorated over 80°C
Min. 0603 mm
High in case of
low voltage spec.
Low especially in
high voltage spec.
TEST INSTRUMENTS : TEKTRONIX TDS3054. MINIZAP
Picture 3.
Characteristics are
deteriorated from 25°C
Min. 1608 mm
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