Allegro A1367LKTTN-5-T Low-noise, high-precision, programmable linear hall-effect sensor ic Datasheet

A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
FEATURES AND BENEFITS
• 240 kHz nominal bandwidth achieved via proprietary
packaging and chopper stabilization techniques
• On-board supply regulator with reverse-battery protection
• Proprietary segmented linear temperature compensation
(TC) technology provides a typical accuracy of 1% over
the full operating temperature range
• Customer-programmable, high-resolution offset and
sensitivity trim
• Factory-programmed sensitivity and quiescent
output voltage TC with extremely stable temperature
performance
• High-sensitivity Hall element for maximum accuracy
• Extremely low noise and high resolution achieved via
proprietary Hall element and low-noise amplifier circuits
Continued on the next page…
PACKAGE:
4-Pin SIP (suffix KT)
DESCRIPTION
The Allegro™ A1367 programmable linear Hall-effect
current sensor IC has been designed to achieve high accuracy
and resolution without compromising bandwidth. This goal
is achieved through new proprietary linearly interpolated
temperature compensation technology that is programmed
at the Allegro factory and provides sensitivity and offset that
are virtually flat across the full operating temperature range.
Temperature compensation is performed in the digital domain
with integrated EEPROM technology while maintaining a
240 kHz bandwidth analog signal path, making this device
ideal for HEV inverter, DC-to-DC converter, and electric power
steering (EPS) applications.
This ratiometric Hall-effect sensor IC provides a voltage output
that is proportional to the applied magnetic field. The customer
can configure the sensitivity and quiescent (zero field) output
voltage through programming on the VCC and output pins,
to optimize performance in the end application. The quiescent
output voltage is user-adjustable, around 50% (bidirectional
configuration) or 10% (unidirectional configuration) of the
supply voltage, VCC, and the output sensitivity is adjustable
within the range of 0.6 to 6.4 mV/G.
Continued on the next page…
Not to scale
VCC
(Programming)
Regulator
Programming
Control
Undervoltage
Detection
Charge Pump
Pulse Generator
To all
subcircuits
CBYPASS
Dynamic Offset Cancellation
Temperature
Sensor
Sensitivity Control
EEPROM and
Control Logic
Active Temp.
Compensation
Offset Control
Push/Pull
Output Driver
Functional Block Diagram
Output
Clamps
VOUT
(Programming)
Signal Recovery
GND
A1367-DS, Rev. 1
Broken
Ground
Detection
CL
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
FEATURES AND BENEFITS (CONTINUED)
• Patented circuits suppress IC output spiking during fast current
step inputs
• Open circuit detection on ground pin (broken wire)
• Selectable sensitivity range between 0.6 and 6.4 mV/G
through use of coarse sensitivity program bits
• User-selectable ratiometric behavior of sensitivity, quiescent
voltage, and clamps (ratiometry can be disabled), for simple
interface with application A-to-D converter (ADC)
• Precise recoverability after temperature cycling
• Output voltage clamps provide short-circuit diagnostic
capabilities
• Wide ambient temperature range: –40°C to 150°C
• Immune to mechanical stress
• Extremely thin package: 1 mm case thickness
• AEC-Q100 automotive qualified
DESCRIPTION (CONTINUED)
The sensor IC incorporates a highly sensitive Hall element with
a BiCMOS interface integrated circuit that employs a low-noise
small-signal high-gain amplifier, a clamped low-impedance output
stage, and a proprietary, high-bandwidth dynamic offset cancellation
technique. These advances in Hall-effect technology work together
to provide an industry-leading sensing resolution at the full 240 kHz
bandwidth. Broken ground wire detection as well as user-selectable
output voltage clamps also are built into this device for high reliability
in automotive applications.
Device parameters are specified across an extended ambient
temperature range: –40°C to 150°C. The A1367 sensor IC is provided
in an extremely thin case (1 mm thick), 4-pin SIP (single in-line
package, suffix KT) that is lead (Pb) free, with 100% matte-tin
leadframe plating.
Selection Guide
Part Number
Package
Packing1
Sensitivity Range2
(mV/G)
A1367LKTTN-1-T
4-pin SIP
4000 pieces per 13-in. reel
SENS_COARSE 00: 0.6 to 1.3
A1367LKTTN-2-T
4-pin SIP
4000 pieces per 13-in. reel
SENS_COARSE 01: 1.3 to 2.9
A1367LKTTN-2U-T
4-pin SIP
4000 pieces per 13-in. reel
SENS_COARSE 01: 1.3 to 2.9
A1367LKTTN-5-T
4-pin SIP
4000 pieces per 13-in. reel
SENS_COARSE 10: 2.9 to 6.4
1 Contact Allegro
for additional packing options
2 Allegro recommends against changing Coarse Sensitivity settings when programming devices that will be used in production. Each A1367
has been factory temperature compensated at a specific sensitivity range, and changing the coarse bits setting could cause sensitivity drift
through temperature range (ΔSensTC ) to exceed specified limits.
Specifications
Absolute Maximum Ratings
Thermal Characteristics
Pinout Diagram and Terminal List Table
Operating Characteristics
Characteristic Performance Data
Characteristic Definitions
Functional Description
Programming Sensitivity and Quiescent
Voltage Output
Coarse Sensitivity
Memory-Locking Mechanisms
Power-On Reset (POR) Operation
Detecting Broken Ground Wire
Chopper Stabilization Technique
3
3
3
4
5
8
11
16
16
16
16
17
18
19
Table of Contents
Programming Guidelines
20
Package Outline Drawing
26
Serial Communication
Writing Access Code
Writing to Volatile Memory
Writing to Nonvolatile Memory
Reading from EEPROM or Volatile Memory
Enabling/Disabling Ratiometry
EEPROM Cell Organization
Diagnostic Clamps
EEPROM Error Checking and Correction (ECC)
Detecting ECC Error
20
22
22
22
22
24
24
25
25
25
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
2
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
SPECIFICATIONS
Absolute Maximum Ratings
Characteristic
Symbol
Notes
Forward Supply Voltage
VCC
Reverse Supply Voltage
VRCC
TJ(max) should not be exceeded
Rating
Unit
15
V
–15
V
Forward Output Voltage
VOUT
VOUT < VCC + 2 V
16
V
Reverse Output Voltage
VROUT
Difference between VCC and output should not exceed 20 V
–6
V
Output Source Current
IOUT(source)
VOUT to GND
2.8
mA
IOUT(sink)
VCC to VOUT
10
mA
100
cycle
Output Sink Current
Maximum Number of EEPROM Write
Cycles
EEPROMw(max)
Operating Ambient Temperature
TA
–40 to 150
°C
Storage Temperature
Tstg
–65 to 165
°C
TJ(max)
165
°C
Value
Unit
174
°C/W
Maximum Junction Temperature
L temperature range
Thermal Characteristics: May require derating at maximum conditions; see application information
Characteristic
Symbol
Package Thermal Resistance
RθJA
Test Conditions*
On 1-layer PCB with exposed copper limited to solder pads
*Additional thermal information available on the Allegro website
Power Dissipation versus Ambient Temperature
900
800
Power Dissipation, PD (mW)
700
600
(R
500
qJ
A
=
17
4
400
ºC
/W
)
300
200
100
0
20
40
60
80
100
120
Temperature, TA (°C)
140
160
180
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
3
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
Pinout Diagram and Terminal List Table
Terminal List Table
1
Number
Name
1
VCC
2
VOUT
3
NC
4
GND
Function
Input Power Supply, use bypass capacitor to connect to ground;
also used for programming
Output Signal, also used for programming
No connection; connect to GND for optimal ESD performance
Ground
2 3 4
KT Package Pinout Diagram
(Ejector pin mark on opposite side)
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
4
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
OPERATING CHARACTERISTICS: Valid through the full operating temperature range, TA, CBYPASS = 0.1 µF, VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ.
Max.
Unit1
4.5
5
5.5
V
ELECTRICAL CHARACTERISTICS
Supply Voltage
VCC
Supply Current
ICC
No load on VOUT
–
11
16.25
mA
Power-On Time2
tPO
TA = 25°C, CBYPASS = open, CL = 1 nF,
Sens = 2 mV/G, constant magnetic field
of 400 G
–
80
–
µs
Temperature Compensation
Power-On Time2
tTC
TA = 150°C, CBYPASS = open, CL = 1 nF,
Sens = 2 mV/G, constant magnetic field
of 400 G
–
146
–
µs
Power-On Reset Voltage2
Power-On Reset Hysteresis
VPORH
TA = 25°C, VCC rising
3.75
4
4.2
V
VPORL
TA = 25°C, VCC falling
–
3.5
–
V
VPORHYS
TA = 25°C
–
500
–
mV
Power-On Reset Release Time2
tPORR
TA = 25°C, VCC rising
–
32
–
µs
Power-On Reset Analog Delay
tPORA
TA = 25°C, VCC rising
µs
–
46
–
6.5
7.5
–
V
Small signal –3 dB, CL = 1 nF, TA = 25°C
–
240
–
kHz
fC
TA = 25°C
–
1
–
MHz
Propagation Delay Time2
tpd
TA = 25°C, magnetic field step of 400 G,
CL = 1 nF, Sens = 2 mV/G
–
1.1
–
µs
Rise Time2
tr
TA = 25°C, magnetic field step of 400 G,
CL = 1 nF, Sens = 2 mV/G
–
2.4
–
µs
TA = 25°C, magnetic field step of 400 G,
CL = 1 nF, Sens = 2 mV/G, measurement of
80% input to 80% output
–
1.8
–
µs
TA = 25°C, magnetic field step of 400 G,
CL = 1 nF, Sens = 2 mV/G, measurement of
90% input to 90% output
–
2.2
–
µs
TA = 25°C, magnetic field step from 800 to
1200 G, CL = 1 nF, Sens = 2 mV/G
–
10
–
µs
Supply Zener Clamp Voltage
Internal Bandwidth
Chopping Frequency3
Vz
BWi
TA = 25°C, ICC = 30 mA
OUTPUT CHARACTERISTICS
Response Time2
Delay to Clamp2
Output Voltage Clamp4
Output Saturation Voltage2
Broken Wire Voltage2
Noise5
tRESPONSE
tCLP
VCLP(HIGH)
TA = 25°C, RL(PULLDWN) = 10 kΩ to GND
4.55
–
4.85
V
VCLP(LOW)
TA = 25°C, RL(PULLUP) = 10 kΩ to VCC
0.15
–
0.45
V
VSAT(HIGH)
TA = 25°C, RL(PULLDWN) = 10 kΩ to GND
4.7
–
–
V
VSAT(LOW)
TA = 25°C, RL(PULLDWN) = 10 kΩ to VCC
–
–
400
mV
VBRK(HIGH)
TA = 25°C, RL(PULLUP) = 10 kΩ to VCC
–
VCC
–
V
VBRK(LOW)
TA = 25°C, RL(PULLDWN) = 10 kΩ to GND
–
100
–
mV
TA = 25°C, CL = 1 nF, BWf = BWi
–
1.4
–
mG/√(Hz)
TA = 25°C, CL = 1 nF, Sens = 2 mV/G,
BWf = BWi
–
12.6
–
mVp-p
TA = 25°C, CL = 1 nF, Sens = 2 mV/G,
BWf = BWi
–
2.1
–
mVRMS
VN
Continued on the next page…
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
5
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
OPERATING CHARACTERISTICS (continued): Valid through the full operating temperature range, TA, CBYPASS = 0.1 µF,
VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ.
Max.
Unit1
OUTPUT CHARACTERISTICS (continued)
DC Output Resistance
ROUT
Output Load Resistance
–
3
–
Ω
RL(PULLUP)
VOUT to VCC
4.7
–
–
kΩ
RL(PULLDWN)
VOUT to GND
4.7
–
–
kΩ
CL
VOUT to GND
–
1
10
nF
SR
Sens = 2 mV/G, CL = 1 nF
–
480
–
V/ms
Output Load Capacitance6
Output Slew
Rate7
QUIESCENT VOLTAGE OUTPUT (VOUT(Q))2
Initial Unprogrammed Quiescent
Voltage Output2,8
VOUT(QBI)init
TA = 25°C
2.4
2.5
2.6
V
VOUT(QU)init
TA = 25°C
0.45
0.5
0.55
V
Quiescent Voltage Output
Programming Range2,4,9
VOUT(QBI)PR
TA = 25°C
2.35
–
2.65
V
VOUT(QU)PR
TA = 25°C
0.4
–
0.6
V
–
9
–
bit
0.95
1.15
1.4
mV
–
±0.5 ×
StepVOUT(Q)
–
mV
SENS_COARSE = 00, TA = 25°C
–
1
–
mV/G
Quiescent Voltage Output
Programming Bits10
QVO
Average Quiescent Voltage Output
Programming Step Size2,11,12
StepVOUT(Q)
Quiescent Voltage Output
Programming Resolution2,13
ErrPGVOUT(Q) TA = 25°C
TA = 25°C
SENSITIVITY (Sens)2
Initial Unprogrammed
Sensitivity8
Sensitivity Programming Range4,9
Coarse Sensitivity Programming Bits14
Fine Sensitivity Programming
Bits10
Sensinit
SensPR
SENS_COARSE = 01, TA = 25°C
–
2.2
–
mV/G
SENS_COARSE = 10, TA = 25°C
–
4.7
–
mV/G
SENS_COARSE = 00, TA = 25°C
0.6
–
1.3
mV/G
SENS_COARSE = 01, TA = 25°C
1.3
–
2.9
mV/G
SENS_COARSE = 10, TA = 25°C
2.9
–
6.4
mV/G
–
2
–
bit
SENS_COARSE
SENS_FINE
SENS_COARSE = 00, TA = 25°C
Average Fine Sensitivity and
Temperature Compensation
Programming Step Size2,14,15
StepSENS
Sensitivity Programming Resolution2,13
ErrPGSENS
–
9
–
bit
2.4
3.2
4.1
µV/G
SENS_COARSE = 01, TA = 25°C
5
6.6
8.5
µV/G
SENS_COARSE = 10, TA = 25°C
11
14.2
18
µV/G
TA = 25°C
–
±0.5 ×
StepSENS
–
µV/G
–
0
–
%/°C
TA = 25°C to 150°C
–2
–
2
%
TA = –40°C to 25°C
–3.5
–
3.5
%
FACTORY-PROGRAMMED SENSITIVITY TEMPERATURE COEFFICIENT
Sensitivity Temperature Coefficient2
TCSENS
Sensitivity Drift Through Temperature
Range2,9,15
ΔSensTC
Average Sensitivity Temperature
Compensation Step Size
StepSENSTC
TA = 150°C, TA= –40°C, calculated relative to
25°C
TA = –40°C to 150°C
2 × StepSENS
µV/G
Continued on the next page…
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
6
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
OPERATING CHARACTERISTICS (continued): Valid through the full operating temperature range, TA, CBYPASS = 0.1 µF,
VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ.
Max.
Unit1
TA = 150°C, TA = –40°C, calculated relative
to 25°C
–
0
–
mV/°C
TA = 25°C to 150°C; SENS_COARSE = 00
or 01
–10
–
10
mV
TA = 25°C to 150°C; SENS_COARSE = 10
–15
–
15
mV
TA = –40°C to 25°C
–30
–
30
mV
StepQVOTC
–
2.3
–
mV
EELOCK
–
1
–
bit
LinERR
–1
< ±0.25
1
%
FACTORY-PROGRAMMED QUIESCENT VOLTAGE OUTPUT TEMPERATURE COEFFICIENT
Quiescent Voltage Output
Temperature Coefficient2
Quiescent Voltage Output Drift
Through Temperature Range2,9,15
Average Quiescent Voltage
Output Temperature Compensation
Step Size
TCQVO
ΔVOUT(Q)TC
LOCK BIT PROGRAMMING
EEPROM Lock Bit
ERROR COMPONENTS
Linearity Sensitivity Error2,16
Symmetry Sensitivity
Error2
Ratiometry Quiescent Voltage Output
Error2,17
SymERR
RatERRVOUT(Q)
–1
< ±0.25
1
%
Through supply voltage range (relative to
VCC = 5 V ±5%); SENS_COARSE = 00
–0.8
±0.15
0.8
%
Through supply voltage range (relative to
VCC = 5 V ±5%); SENS_COARSE = 01
–0.9
±0.15
0.9
%
Through supply voltage range (relative to
VCC = 5 V ±5%); SENS_COARSE = 10
–1.2
±0.25
1.2
%
Ratiometry Sensitivity Error2,17
RatERRSens
Through supply voltage range (relative to
VCC = 5 V ±5%)
–1
< ±0.5
1
%
Ratiometry Clamp Error2,18
RatERRCLP
Through supply voltage range (relative to
VCC = 5 V ±5%), TA = 25°C
–
< ±1
–
%
Sensitivity Drift Due to Package
Hysteresis2
ΔSensPKG
TA = 25°C, after temperature cycling, 25°C to
150°C and back to 25°C
–
±0.6
–
%
Sensitivity Drift Over Lifetime19
ΔSensLIFE
TA = 25°C, shift after AEC Q100 grade 0
qualification testing
–
±1
–
%
11
G (gauss) = 0.1 mT (millitesla).
Characteristic Definitions section.
3 f varies up to approximately ±20% over the full operating ambient temperature range, T , and process.
C
A
4 Sens, V
OUT(Q) , VCLP(LOW) , and VCLP(HIGH) scale with VCC due to ratiometry.
5 Noise, measured in mV
and
in
mV
,
is
dependent
on
the
sensitivity
of
the
device.
PP
RMS
6 Output stability is maintained for capacitive loads as large as 10 nF.
7 High-to-low transition of output voltage is a function of external load components and device sensitivity.
8 Raw device characteristic values before any programming.
9 Exceeding the specified ranges will cause sensitivity and Quiescent Voltage Output drift through the temperature range to deteriorate beyond the specified values.
10 Refer to Functional Description section.
11 Step size is larger than required, in order to provide for manufacturing spread. See Characteristic Definitions section.
12 Non-ideal behavior in the programming DAC can cause the step size at each significant bit rollover code to be greater than twice the maximum specified value of
StepVOUT(Q) or StepSENS.
13 Overall programming value accuracy. See Characteristic Definitions section.
14 Each A1367 part number is factory programmed and temperature compensated at a different coarse sensitivity setting. Changing coarse bits setting could cause sensitivity drift through temperature range,ΔSensTC , to exceed specified limits.
15 Allegro will be testing and temperature compensating each device at 150°C. Allegro will not be testing devices at –40°C. Temperature compensation codes will be applied
based on characterization data.
16 Linearity applies to output voltage ranges of ±2 V from the quiescent output for bidirectional devices.
17 Percent change from actual value at V
CC = 5 V, for a given temperature, through the supply voltage operating range.
18 Percent change from actual value at V
CC = 5 V, TA = 25°C, through the supply voltage operating range.
19 Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information.
2 See
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
7
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
CHARACTERISTIC PERFORMANCE DATA
Response Time (tRESPONSE)
400 G Excitation Signal with 10%-90% rise time = 1 µs
Response time (80% input to 80% output) = 2.06 µs, Sensitivity = 2 mV/G, CBYPASS = 0.1 µF, CL = 1 nF
tRESPONSE = 2 µs
Propagation Delay (tPD)
400 G Excitation Signal with 10%-90% rise time = 1 µs
Sensitivity = 2 mV/G, CBYPASS = 0.1 µF, CL = 1 nF
tPD = 1.1 µs
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
8
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
CHARACTERISTIC PERFORMANCE DATA (continued)
Rise Time (tr)
400 G Excitation Signal with 10%-90% rise time = 1 µs
Sensitivity = 2 mV/G, CBYPASS = 0.1 µF, CL = 1 nF
tr = 2.3 µs
Power-On Time (tPO)
400 G Constant Excitation Signal with tPO = 81 µs
Sensitivity = 2 mV/G, CBYPASS = Open, CL = 1 nF
tPO = 71.6 µs
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
9
CHARACTERISTIC PERFORMANCE DATA (continued)
Quiescent Voltage Output Drift Through Temperature Range
versus Ambient Temperature
ΔVOUT(Q)TC (typ), (mV)
30
20
10
0
-10
-20
-30
-50
-30
-10
10
30
50
70
90
110
130
150
TA (°C)
Sensitivity Drift Through Temperature Range
versus Ambient Temperature
3
2
ΔSensTC (typ) (%)
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
1
0
-1
-2
-3
-50
-30
-10
10
30
50
70
90
110
130
150
TA (°C)
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
10
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
CHARACTERISTIC DEFINITIONS
Power-On Time (tPO)
When the supply is ramped to its operating voltage, the device
requires a finite time to power its internal components before
responding to an input magnetic field.
Power-On Time (tPO ) is defined as: the time it takes for the output voltage to settle within ±10% of its steady-state value under
an applied magnetic field, after the power supply has reached
its minimum specified operating voltage (VCC(min)) as shown in
Figure 1.
V
VCC
VCC(typ)
VOUT
90% VOUT
VCC(min)
t1
t2= time at which output voltage settles
within ±10% of its steady-state value
under an applied magnetic field
After Power-On Time (tPO ) elapses, tTC is also required before a
valid temperature compensated output.
0
Propagation Delay (tpd)
(%)
90
The time interval between a) when the sensor IC reaches 10% of
its final value, and b) when it reaches 90% of its final value (see
Figure 2).
Applied Magnetic Field
Transducer Output
Rise Time, tr
Response Time (tRESPONSE)
Continued on the next page…
+t
Figure 1: Power-On Time Definition
Rise Time (tr)
The time interval between a) when the applied magnetic field
reaches 80% of its final value, and b) when the sensor reaches
80% of its output corresponding to the applied magnetic field
(see Figure 3). The 90%-90% is also shown in the Electrical
Characteristics table.
tPO
t1= time at which power supply reaches
minimum specified operating voltage
Temperature Compensation Power-On Time
(tTC )
The time interval between a) when the applied magnetic field
reaches 20% of its final value, and b) when the output reaches
20% of its final value (see Figure 2).
t2
20
10
0
Propagation Delay, tpd
t
Figure 2: Propagation Delay and Rise Time Definitions
(%)
80
Applied Magnetic Field
Transducer Output
Response Time, tRESPONSE
0
t
Figure 3: Response Time Definition
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115 Northeast Cutoff
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11
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
CHARACTERISTIC DEFINITIONS (continued)
Delay to Clamp (tCLP )
A large magnetic input step may cause the clamp to overshoot
its steady-state value. The Delay to Clamp (tCLP ) is defined as:
the time it takes for the output voltage to settle within ±1% of its
steady-state value, after initially passing through its steady-state
voltage, as shown in Figure 4.
Quiescent Voltage Output (VOUT(Q))
In the quiescent state (no significant magnetic field: B = 0 G),
the output (VOUT(Q) ) has a constant ratio to the supply voltage
(VCC ) throughout the entire operating ranges of VCC and ambient
temperature (TA) .
Initial Unprogrammed Quiescent Voltage
Output ( VOUT(Q)init )
Before any programming, the Quiescent Voltage Output
(VOUT(Q)) has a nominal value of VCC / 2, as shown in Figure 5.
Quiescent Voltage Output Programming
Range ( VOUT(Q)PR )
Magnetic Input
VCLP(HIGH)
VOUT
tCLP
t1
VOUT(Q)maxcode – VOUT(Q)mincode
2n – 1
,
(1)
where n is the number of available programming bits in the trim
range, 9 bits, VOUT(Q)maxcode is at decimal code 255, and
VOUT(Q)mincode is at decimal code 256.
Quiescent Voltage Output Programming Resolution (ErrPGVOUT(Q) )
The programming resolution for any device is half of its programming step size. Therefore, the typical programming resolution will be:
(2)
Quiescent Voltage Output Temperature Coefficient (TCQVO)
Device VOUT(Q) changes as temperature changes, with respect to
its programmed Quiescent Voltage Output Temperature Coefficient, TCQVO . TCQVO is programmed at 150°C and calculated
relative to the nominal VOUT(Q) programming temperature of
25°C. TCQVO (mV/°C) is defined as:
(3)
where T1 is the nominal VOUT(Q) programming temperature of
t1= time at which output voltage initially
reaches steady-state clamp voltage
t2= time at which output voltage settles to
steady-state clamp voltage ±1% of the
clamp voltage dynamic range, where
clamp voltage dynamic range =
VCLP(HIGH)(min) – VCLP(LOW)(max)
Note: Times apply to both high clamp
(shown) and low clamp.
Figure 4: Delay to Clamp definition
StepVOUT(Q) =
TCQVO = [VOUT(Q)T2 – VOUT(Q)T1][1/(T2 – T1)]
t2
0
The Average Quiescent Voltage Output Progamming Step Size
(StepVOUT(Q) ) is determined using the following calculation:
ErrPGVOUT(Q)(typ) = 0.5 × StepVOUT(Q)(typ)
The Quiescent Voltage Output (VOUT(Q) ) can be programmed
within the Quiescent Voltage Output Range limits: VOUT(Q)PR(min)
and VOUT(Q)PR(max). Exceeding the specified Quiescent Voltage
Output Range will cause Quiescent Voltage Output Drift Through
Temperature Range (ΔVOUT(Q)TC) to deteriorate beyond the
specified values, as shown in Figure 5.
V
Average Quiescent Voltage Output Programming Step Size (StepVOUT(Q))
t
VOUT(Q)PR(min)
value
Distribution of values
resulting from minimum
programming code
(QVO programming bits
set to decimal code 256)
VOUT(Q)
Programming range
(specified limits)
Typical initial value before
customer programming
VOUT(Q)init
(QVO programming
bits set to code 0)
VOUT(Q)PR(max)
value
Distribution of values
resulting from maximum
programming code
(QVO programming bits
set to decimal code 255)
Figure 5: Quiescent Voltage Output Range definition
Continued on the next page…
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115 Northeast Cutoff
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12
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
CHARACTERISTIC DEFINITIONS (continued)
25°C, and T2 is the TCQVO programming temperature of 150°C.
The expected VOUT(Q) through the full ambient temperature range
(VOUT(Q)EXPECTED(TA) ) is defined as:
VOUT(Q)EXPECTED(TA) = VOUT(Q)T1 + TCQVO(TA – T1)
(4)
VOUT(Q)EXPECTED(TA) should be calculated using the actual measured values of VOUT(Q)T1 and TCQVO rather than programming
target values.
Quiescent Voltage Output Drift Through Temperature Range (ΔVOUT(Q)TC)
Due to internal component tolerances and thermal considerations, the Quiescent Voltage Output (VOUT(Q)) may drift from its
nominal value through the operating ambient temperature (TA ).
The Quiescent Voltage Output Drift Through Temperature Range
(ΔVOUT(Q)TC) is defined as:
DVOUT(Q)TC = VOUT(Q)(TA) – VOUT(Q)EXPECTED(TA)
(5)
∆VOUT(Q)TC should be calculated using the actual measured
values of ∆VOUT(Q)(TA) and ∆VOUT(Q)EXPECTED(TA) rather than
programming target values.
Sensitivity (Sens)
The presence of a south polarity magnetic field, perpendicular
to the branded surface of the package face, increases the output
voltage from its quiescent value toward the supply voltage rail.
The amount of the output voltage increase is proportional to the
magnitude of the magnetic field applied.
Conversely, the application of a north polarity field decreases the
output voltage from its quiescent value. This proportionality is
specified as the magnetic sensitivity, Sens (mv/G), of the device,
and it is defined as:
Sens =
Branded
Face
VOUT(BPOS) – VOUT(BNEG)
BPOS – BNEG
,
Mold Ejector
Pin Indent
Magnetic Flux
Direction Causing the
Output to Increase
Figure 6: Magnetic Flux Polarity
(6)
where BPOS and BNEG are two magnetic fields with opposite
polarities.
Initial Unprogrammed Sensitivity ( Sensinit )
Before any programming, Sensitivity has a nominal value that
depends on the SENS_COARSE bits setting. Each A1367 variant
has a different SENS_COARSE setting.
Sensitivity Programming Range (SensPR)
The magnetic sensitivity (Sens) can be programmed around its
initial value within the sensitivity range limits: SensPR(min) and
SensPR(max). Exceeding the specified Sensitivity Range will
cause Sensitivity Drift Through Temperature Range (ΔSensTC)
to deteriorate beyond the specified values. Refer to the Quiescent
Voltage Output Range section for a conceptual explanation of
how value distributions and ranges are related.
Average Fine Sensitivity Programming Step
Size (StepSENS)
Refer to the Average Quiescent Voltage Output Programming
Step Size section for a conceptual explanation.
Sensitivity Programming Resolution
( ErrPGSENS )
Refer to the Quiescent Voltage Output Programming Resolution
section for a conceptual explanation.
Sensitivity Temperature Coefficient (TCSENS)
Device sensitivity changes as temperature changes, with respect
to its programmed sensitivity temperature coefficient, TCSENS .
TCSENS is programmed at 150°C and is calculated relative to the
nominal sensitivity programming temperature of 25°C.
TCSENS (%/°C) is defined as:
TCSENS =
SensT2 – SensT1
1
× 100% T2–T1
SensT1
,
(7)
where T1 is the nominal Sens programming temperature of 25°C,
and T2 is the TCSENS programming temperature of 150°C. The
expected value of Sens over the full ambient temperature range,
SensEXPECTED(TA), is defined as:
SensEXPECTED(TA) = SensT1 × 100% +
TCSENS (TA –T1)
100
(8)
Continued on the next page…
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115 Northeast Cutoff
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13
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
CHARACTERISTIC DEFINITIONS (CONTINUED)
SensEXPECTED(TA) should be calculated using the actual measured
values of SensT1 rather than programming target values.
Sensitivity Drift Through Temperature Range
(ΔSensTC )
Second-order sensitivity temperature coefficient effects cause the
magnetic sensitivity, Sens, to drift from its expected value over
the operating ambient temperature range (TA). The Sensitivity
Drift Through Temperature Range (∆SensTC ) is defined as:
∆SensTC =
SensTA – SensEXPECTED(TA)
SensEXPECTED(TA)
× 100% .
(9)
Sensitivity Drift Due to Package Hysteresis
(ΔSensPKG )
Package stress and relaxation can cause the device sensitivity at
TA = 25°C to change during and after temperature cycling. The
sensitivity drift due to package hysteresis (∆SensPKG ) is defined
as:
∆SensPKG =
Sens(25°C)2 – Sens(25°C)1
× 100%
Sens(25°C)1
,
(10)
where Sens(25°C)1 is the programmed value of sensitivity at TA
= 25°C, and Sens(25°C)2 is the value of sensitivity at TA = 25°C,
after temperature cycling TA up to 150°C and back to 25°C.
Linearity Sensitivity Error (LinERR )
The A1367 is designed to provide a linear output in response to
a ramping applied magnetic field. Consider two magnetic fields,
B1 and B2. Ideally, the sensitivity of a device is the same for both
fields, for a given supply voltage and temperature. Linearity error
is present when there is a difference between the sensitivities
measured at B1 and B2.
Linearity Error
Linearity error is calculated separately for the positive
(LinERRPOS ) and negative (LinERRNEG ) applied magnetic fields.
Linearity Error (%) is measured and defined as:
 SensBPOS2 
 × 100%
LinERRPOS = 1–
 SensBPOS1 
,
 SensBNEG2
 × 100%
LinERRNEG = 1–
 SensBNEG1
,
where:
SensBx =
|VOUT(Bx) – VOUT(Q)|
Bx
(12)
,
and BPOSx and BNEGx are positive and negative magnetic
fields, with respect to the quiescent voltage output such that
|BPOS2| = 2 × |BPOS1| and |BNEG2| = 2 × |BNEG1|.
Then:
LinERR = max( LinERRPOS , LinERRNEG )
.
(13)
Symmetry Sensitivity Error (SymERR )
The magnetic sensitivity of an A1367 device is constant for
any two applied magnetic fields of equal magnitude and opposite polarities. Symmetry Error, SymERR (%), is measured and
defined as:
 SensBPOS
SymERR = 1–
 SensBNEG

 × 100%

,
(14)
where SensBx is as defined in equation 12, and BPOSx and
BNEGx are positive and negative magnetic fields such that
|BPOSx| = |BNEGx|.
Ratiometry Error (RatERR )
The A1367 device features ratiometric output. This means that
the Quiescent Voltage Output (VOUT(Q) ) magnetic sensitivity,
Sens, and Output Voltage Clamp (VCLP(HIGH) and VCLP(LOW) ) are
proportional to the Supply Voltage (VCC). In other words, when
the supply voltage increases or decreases by a certain percentage, each characteristic also increases or decreases by the same
percentage. Error is the difference between the measured change
in the supply voltage relative to 5 V, and the measured change in
each characteristic.
The ratiometric error in Quiescent Voltage Output,
RatERRVOUT(Q) (%), for a given supply voltage (VCC) is defined
as:
 VOUT(QBI)(VCC)  


 

 VOUT(QBI)(5V)  

(15)
RatERRVOUT(QBI) = 1 –
 × 100% .
VCC


5V


(11)
Continued on the next page…
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115 Northeast Cutoff
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14
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
CHARACTERISTIC DEFINITIONS (CONTINUED)
RatERRVOUT(QU) is defined in the same way as RatERRVOUT(QBI)
with a factor of 1/5 multiplied.



RatERRVOUT(QU) = 1 –


 VOUT(QU)(VCC) 


 VOUT(QU)(5V) 
VCC
5V


 1
 × 5 × 100% . (16)


This is to scale the ratiometry error of the unidirectional device so
that it can be compared with the bidirectional device.
The ratiometric error in magnetic sensitivity, RatERRSens (%), for
a given Supply Voltage (VCC ) is defined as:
 Sens(VCC) / Sens(5V) 
 × 100% .
RatERRSens = 1–
VCC / 5 V


(17)
The ratiometric error in the clamp voltages, RatERRCLP (%), for a
given supply voltage (VCC) is defined as:
 VCLP(VCC) / VCLP(5V) 
 × 100% ,
RatERRCLP = 1–
VCC / 5 V


where VCLP is either VCLP(HIGH) or VCLP(LOW).
(18)
Power-On Reset Voltage (VPOR )
On power-up, to initialize to a known state and avoid current
spikes, the A1367 is held in Reset state. The Reset signal is
disabled when VCC reaches VPORH and time tPORR has elapsed,
allowing the output voltage to go from a high-impedance state
into normal operation. During power-down, the Reset signal is
enabled when VCC reaches VPORL , causing the output voltage to
go into a high-impedance state. (Note that a detailed description
of POR can be found in the Functional Description section).
Power-On Reset Release Time (tPORR)
When VCC rises to VPORH , the Power-On Reset Counter starts.
The A1367 output voltage will transition from a high-impedance
state to normal operation only when the Power-On Reset Counter
has reached tPORR and VCC has been maintained above VPORH .
Output Saturation Voltage (VSAT )
When output voltage clamps are disabled, the output voltage
can swing to a maximum of VSAT(HIGH) and to a minimum of
VSAT(LOW) .
Broken Wire Voltage (VBRK )
If the GND pin is disconnected (broken wire event), output voltage will go to VBRK(HIGH) (if a load resistor is connected to VCC)
or to VBRK(LOW) (if a load resistor is connected to GND).
Allegro MicroSystems, LLC
115 Northeast Cutoff
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1.508.853.5000; www.allegromicro.com
15
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
FUNCTIONAL DESCRIPTION
Programming Sensitivity and Quiescent Voltage Output
Sensitivity and VOUT(Q) can be adjusted by programming
SENS_FINE and QVO bits, as illustrated in Figure 7 and Figure 8.
Customers should not program sensitivity or VOUT(Q) beyond
the maximum or minimum programming ranges specified in the
Operating Characteristics table. Exceeding the specified limits
will cause the sensitivity and VOUT(Q) drift over the temperature
range (ΔSensTC and ΔVOUT(Q)TC ) to deteriorate beyond the specified values.
Programming sensitivity might cause a small drift in VOUT(Q) . As
a result, Allegro recommends programming sensitivity first, then
VOUT(Q) .
Coarse Sensitivity
Each A1367 variant is programmed to a different coarse sensitivity setting. Devices are tested, and temperature compensation is
factory programmed under that specific coarse sensitivity setting.
If the coarse sensitivity setting is changed by programming
SENS_COARSE bits, Allegro cannot guarantee the specified
sensitivity drift through temperature range limits (ΔSensTC ).
Memory-Locking Mechanisms
The A1367 is equipped with two distinct memory-locking mechanisms:
• Default Lock At power-up, all registers of the A1367 are
locked by default. EEPROM and volatile memory cannot
be read or written. To disable Default Lock, a specific 30 bit
customer access code has to be written to address 0x24 within
Access Code Timeout (tACC = 8 ms) from power-up. After
doing so, registers can be accessed. If VCC is power-cycled,
the Default Lock will automatically be re-enabled. This
ensures that during normal operation, memory content will not
be altered due to unwanted glitches on VCC or the output pin.
• Lock Bit After EEPROM has been programmed by the user,
the EELOCK bit can be set high and VCC power-cycled to
permanently disable the ability to read or write any register.
This will prevent the ability to disable Default Lock using the
method described above. Please note that after the EELOCK
bit is set high and the VCC pin is power-cycled, you will not
have the ability to clear the EELOCK bit or read/write any
register.
Quiescent Voltage Output,
VOUT(Q) (mV)
Sensitivity, Sens (mV/G)
Max Specified
VOUT(Q)PR
Max Specified
SensPR
Specified Sensitivity
Programming Range
Mid Range
Specified VOUT(Q)
Programming Range
Mid Range
Min Specified
VOUT(Q)PR
Min Specified
SensPR
0
255 256
511
SENS_FINE Code
Figure 7: Device Sensitivity versus SENS_FINE
Programmed Value
0
255 256
511
QVO Code
Figure 8: Device VOUT(Q) versus QVO Programmed Value
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115 Northeast Cutoff
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16
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
FUNCTIONAL DESCRIPTION (continued)
Power-On Reset (POR) Operation
The descriptions in this section assume temperature = 25°C, no
output load (RL, CL ) , and no significant magnetic field is present.
• Power-Up. At power-up, as VCC ramps up, the output is in a
high-impedance state. When VCC crosses VPORH, the output
will go to VCC/2 after tPORD, where tPORD = POR Release
counter tPORR + POR Analog delay tPORA.
• VCC drops below VCC(min) = 4.5 V. If VCC drops below VPORL,
the output will be in a high-impedance state. If VCC recovers
and exceeds VPORH, the output will go back to normal
operation after tPORD.
VCC
5V
VPORH
VPORL
VOUT
tPORD
tPORR
tPORA
tPORD
2.5
Time
Figure 9: POR Operation
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115 Northeast Cutoff
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17
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
FUNCTIONAL DESCRIPTION (continued)
Detecting Broken Ground Wire
V+
If the GND pin is disconnected, node A becoming open (see
Figure 11), the VOUT pin will go to a high-impedance state.
The output voltage will go to VBRK(HIGH) if a load resistor
RL(PULLUP) is connected to VCC or to VBRK(LOW) if a load resistor
RL(PULLDWN) is connected to GND. The device will not respond
to any applied magnetic field.
VCC
VOUT
A1367
CBYPASS
GND
CL
(Recommended)
If the ground wire is reconnected, the A1367 will resume normal
operation.
Figure 10: Typical Application Drawing
VCC
VCC
VCC
RL(PULLUP)
VOUT
VCC
A1367
VOUT
VCC
A1367
RL(PULLDWN)
GND
GND
A
A
Connecting VOUT to RL(PULLUP)
Connecting VOUT to RL(PULLDWN)
Figure 11: Connections for Detecting Broken Ground Wire
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115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
18
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
FUNCTIONAL DESCRIPTION (continued)
Chopper Stabilization Technique
When using Hall-effect technology, a limiting factor for total
accuracy is the small signal voltage developed across the Hall
element. This voltage is disproportionally small relative to the
offset that can be produced at the output of the Hall sensor. This
makes it difficult to process the signal while maintaining an accurate, reliable output over the specified operating temperature and
voltage ranges. Chopper stabilization is a unique approach used
to minimize Hall offset on the chip.
The patented Allegro technique removes key sources of the output drift induced by thermal and mechanical stresses. This offset
reduction technique is based on a signal modulation-demodulation process. The undesired offset signal is separated from the
magnetic field-induced signal in the frequency domain through
modulation. The subsequent demodulation acts as a modulation
process for the offset, causing the magnetic field-induced signal
to recover its original spectrum at base band, while the DC offset
becomes a high-frequency signal. The magnetic-sourced signal
can then pass through a low-pass filter, while the modulated
DC offset is suppressed. This high-frequency operation allows
a greater sampling rate that results in higher accuracy and faster
signal-processing capability. This approach desensitizes the chip
to the effects of thermal and mechanical stresses, and produces
devices that have extremely stable quiescent Hall output voltages and precise recoverability after temperature cycling. This
technique is made possible through the use of a BiCMOS process, which allows the use of low-offset, low-noise amplifiers in
combination with high-density logic integration and a proprietary,
dynamic notch filter. The new Allegro filtering techniques are far
more effective at suppressing chopper-induced signal noise compared to the previous generation of Allegro chopper-stabilized
devices.
Regulator
Clock/Logic
Hall Element
Amp
Anti-Aliasing Tuned
LP Filter
Filter
Figure 12: Concept of Chopper Stabilization
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115 Northeast Cutoff
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1.508.853.5000; www.allegromicro.com
19
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
PROGRAMMING GUIDELINES
Serial Communication
The serial interface allows an external controller to read and write
registers, including EEPROM, in the A1367 using a point-topoint command/acknowledge protocol. The A1367 does not initiate communication; it only responds to commands from the external controller. Each transaction consists of a command from the
controller. If the command is a write, there is no acknowledging
from the A1367. If the command is a read, the A1367 responds
by transmitting the requested data.
Serial interface timing parameters can be found in the Program-
ming Levels table on page 22. Note that the external controller
must avoid sending a Command frame that overlaps a Read
Acknowledge frame.
The serial interface uses a Manchester-encoding-based protocol
per G.E. Thomas (0 = rising edge, 1 = falling edge), with address
and data transmitted MSB first. Four commands are recognized
by the A1367: Write Access Code, Write to Volatile Memory,
Write to Non-Volatile Memory (EEPROM) and Read. One frame
type, Read Acknowledge, is sent by the A1367 in response to a
Read command.
Read/Write
Memory Address
Synchronize
0
0 0/1
0
0
Data
CRC
0/1
VMAN(H)
VMAN(L)
0V
1
0
Bit boundaries
Figure 13: General Format for Serial Interface Commands
Allegro MicroSystems, LLC
115 Northeast Cutoff
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20
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
PROGRAMMING GUIDELINES (continued)
The A1367 device uses a three-wire programming interface,
where VCC is used to control the program enable signal, data
is transmitted on VOUT, and all signals are referenced to GND.
This three-wire interface makes it possible to communicate with
multiple devices with shared VCC and GND lines.
The four transactions (Write Access, Write to EEPROM, Write
to Volatile Memory, and Read) are show in the figures on the
following pages. To initialize any communication, VCC should
be increased to a level above VprgH(min) without exceeding
VprgH(max). At this time, VOUT is disabled and acts as an input.
After program enable is asserted, the external controller must
drive the output low in a time less than td . This prevents the
device interpreting any false transients on VOUT as data pulses.
After the command is completed, VCC is reduced below VprgL,
back to normal operating level. Also, the output is enabled and
responds to magnetic input.
When performing a Write to EEPROM transaction, the A1367
requires a delay of tw to store the data into the EEPROM. The
device will respond with a high-to-low transition on VOUT to
indicate the Write to EEPROM sequence is complete.
When sending multiple command frames, it is necessary to
toggle the program enable signal on VCC. After the first command frame is completed, and VCC remains at VprgH , the device
will ignore any subsequent pulses on the output. When the program enable signal is brought below VprgL(max) , the output will
respond to the magnetic input. To send the next command, the
program enable signal is increased to VprgH .
Read/Write
Synchronize
0
Memory Address
Data
0 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1
MSB
...
CRC
0/1 0/1 0/1 0/1
MSB
Quantity of Bits
Name
Values
2
Synchronization
00
Used to identify the beginning of a serial interface command
Description
1
Read / Write
0
[As required] Write operation
1
[As required] Read operation
6
Address
0/1
[Read/Write] Register address (volatile memory or EEPROM)
30
Data
0/1
24 data bits and 6 ECC bits. For a read command frame the data consists of 30 bits: [29:26]
Don’t Care, [25:24] ECC Pass/Fail, and [23:0] Data. Where bit 0 is the LSB. For a write
command frame the data consists of 30 bits: [29:24] Don’t Care and [23:0] Data. Where bit 0 is
the LSB.
3
CRC
0/1
Bits to check the validity of frame.
Figure 14: Command Frame General Format
VprgH
VCC
VprgL
VOUT
Command
Frame 1
Command
Frame 2
Command
Frame 3
Figure 15: Format for Sending Multiple Transactions
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
21
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
PROGRAMMING GUIDELINES (continued)
Programming Parameters, CBYPASS = 0.1 µF, VCC = 5 V
Min.
Typ.
Max.
Unit
Program Enable Voltage (High)
Characteristics
Symbol
VprgH
Program enable signal high level on VCC
8
8.25
8.5
V
Program Enable Voltage (Low)
VprgL
Program enable signal low level on VCC
VCC
–
6
V
te
External capacitance (CLX) on VOUT may
increase the Output Enable Delay
–
125
–
µs
Output Enable Delay
Note
Program Time Delay
td
–
15
–
µs
Program Write Delay
tw
–
20
–
ms
Manchester High Voltage
VMAN(H)
Data pulses on VOUT
4
5
VCC
V
Manchester Low Voltage
VMAN(L)
Data pulses on VOUT
0
–
1
V
0.3
80
100
kbps
–
(10)
–
µs
Bit Rate
tBITR
Communication rate
Bit Time
tBIT
Data bit pulse width at 100 kbps
VprgH
VprgH
VprgL
VprgL
VCC
VCC
5V
Normal
Output
VOUT (Output)
VOUT (Input)
External Control
Normal
Output
High Z
Access Code
High Z
td
0V
5V
High Z
VOUT (Input)
External Control
Normal
Output
High Z
Write
Command
High Z
0V
Data
td
te
0V
5V
High Z
0V
te
Figure 17: Write Volatile Memory
VprgH
VprgH
VprgL
VCC
VOUT (Input)
External Control
Normal
Output
VOUT (Output)
Figure 16: Write Access Code
VOUT (Output)
5V
Normal
Output
Normal
Output
High Z
Write
Data
Command
High Z
td
tw
0V
5V
High Z
td
5V
VCC
0V
te
Figure 18: Write Non-Volatile Memory
VprgL
VCC
VOUT (Output)
VOUT (Input)
External Control
5V
VCC
Normal
Output
Read
Command
High Z
td
Normal
Output
Data
High Z
5V
High Z
td
0V
0V
te
Figure 19: Read
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
22
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
PROGRAMMING GUIDELINES (continued)
Read (Controller to A1367)
Figure 22 shows the sequence for a Write command. Bits [29:24]
are Don’t Care because the A1367 automatically generates 6 ECC
bits based on the content of bits [23:0]. These ECC bits will be
stored in EEPROM at locations [29:24].
The fields for the Read command are:
• Sync (2 zero bits)
• Read/Write (1 bit, must be 1 for read)
• CRC (3 bits)
Read/Write
Figure 20 shows the sequence for a Read command.
0
0
0 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1
Read/Write
MSB
Memory Address
Synchronize
0
0
CRC
1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1
MSB
Figure 20: Read Sequence
Read Acknowledge (A1367 to Controller)
The fields for the data return frame are:
• Sync (2 zero bits)
• Data (30 bits):
□□ [29:26] Don’t Care
□□ [25:24] ECC Pass/Fail
□□ [23:0] Data
0
...
CRC
0/1 0/1 0/1 0/1
MSB
Figure 22: Write Sequence
Write Access Code (Controller to A1367)
The fields for the Access Code command are:
•
•
•
•
•
Sync (2 zero bits)
Read/Write (1 bit, must be 0 for write)
Address (6 bits, address 0x24 for Customer Access)
Data (30 bits, 0x2C413737 for Customer Access)
CRC (3 bits)
Figure 23 shows the sequence for an Access Code command.
Read/Write
Figure 21 shows the sequence for a Read Acknowledge. Refer to
the Detecting ECC Error section for instructions on how to detect
Read/Write Synchronize Memory Address Data (30 bits) and
ECC failure.
Data
(30 bits)
Synchronize
Data
(30 bits)
Memory Address
Synchronize
0 0/1 0/1 0/1 0/1
...
CRC
0/1 0/1 0/1 0/1 0/1
MSB
Figure 21: Read Acknowledgement Sequence
Synchronize
0
0
• Sync (2 zero bits)
• Read/Write (1 bit, must be 0 for write)
• Address (6 bits, ADDR[5] is for EEPROM, 1 for register; refer
to the address map)
• Data (30 bits):
□□ [29:24] Don’t Care
□□ [23:0] Data
• CRC (3 bits)
0
1
0
0
1
0
MSB
0 0/1 0/1 0/1
...
CRC
0/1 0/1 0/1 0/1
MSB
Figure 23: Write Access Code
The controller must open the serial communication with the
A1367 device by sending an Access Code. It must be sent within
Access Code Timeout, tACC, from power-up, or the device will be
disabled for read and write access.
Access Codes Information
Name
Write (Controller to A1367)
The fields for the Write command are:
Data
(30 bits)
Memory Address
Customer
Serial Interface Format
Register Address
(Hex)
Data (Hex)
0x24
0x2C413737
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
23
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
PROGRAMMING GUIDELINES (CONTINUED)
Memory Address Map
Address
Register Name
0x02
ID_C
Parameter Name
Description
CUST_ID
SENSE_C
0x04
QVO_C
r/w
24
23:0
9
8:0
SENS_COARSE1
Coarse sensitivity
r/w
2
10:9
POL
Reverses output polarity
r/w
1
11
RESERVED
Reserved scratch pad for SENS_FINE
r/w
9
20:12
RESERVED
Reserved scratch pad for SENS_COARSE
r/w
2
22:21
RESERVED
Reserved scratch pad for SENS polarity
r/w
1
23
QVO_FINE
Quiescent Output Voltage (QVO), fine adjustment
r/w
9
8:0
UNI
Unidirectional bit
r/w
1
9
CLAMP_EN
Enables output clamps high and low
r/w
1
10
RATIOM_DIS
Ratiometry disable
r/w
1
11
RESERVED
Reserved scratch pad for QVO_FINE
r/w
9
20:12
r/w
3
23:21
1
DEV_LOCK
COMCFG_C
Location
r/w
RESERVED
0x06
Bits
Sensitivity, fine adjustment
SENS_FINE
0x03
r/w
Bit to set the EELOCK (for new lock sequence)
Unused
r/w
1
0
r/w
11
23:1
SENS_COARSE[0..1] = 11 is factory reserved. Only 00, 01, and 10 are valid entries.
Enabling/Disabling Ratiometry
EEPROM Cell Organization
By default, this device has an output that is ratiometric, meaning
that Quiescent Voltage Output (VOUT(Q)) magnetic sensitivity,
Sens, and Output Voltage Clamp (VCLP(HIGH) and VCLP(LOW) ) are
proportional to the Supply Voltage (VCC). There is an EEPROM
bit (RATIOM_DIS) that can be used to disable the ratiometry
of the output, making the above mentioned components of the
output no longer proportional to VCC. This bit can be found in the
QVO_C register (0x04). Writing a 1 to this bit disables ratiometry; writing a 0 to this bit enables ratiometry.
Programming coefficients are stored in non-volatile EEPROM,
which is separate from the digital subsystem, and accessed by the
digital subsystem EEPROM Controller module. The EEPROM
is organized as 30 bit wide words, each word is made up of 24
data bits and 6 ECC (Error Checking and Correction) check bits,
stored as shown in table below.
EEPROM Bit
29
28
27
26
25
24
23
22
21
20
19
18
17
16
15
Contents
C5
C4
C3
C2
C1
C0
D23
D22
D21
D20
D19
D18
D17
D16
D15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
External EEPROM Word Bit Sequence; C# – Check Bit, D# – Data Bit
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
24
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
PROGRAMMING GUIDELINES (CONTINUED)
Diagnostic Clamps
Detecting ECC Error
Diagnostic clamps can be enabled in EEPROM for this device.
By writing a 1 to CLAMP_EN (bit 10 in QVO_C register
(0x04)), the output voltage hits a maximum and minimum voltage that correspond to the specification Output Voltage Clamp in
the above tables. Writing a 0 to this bit disables the clamps and
allows the output to swing to the Output Saturation Voltage.
If an uncorrectable error has occurred, bits 25:24 are set to 10,
the VOUT pin will go to a high-impedance state, and the device
will not respond to the applied magnetic field. To detect this
high-impedance state, the circuit connection with RL(PULLDWN)
shown in Figure 11 must be used and the output voltage will go
to VBRK(LOW). The connection with RL(PULLUP) should not be
used to detect this error.
EEPROM Error Checking and Correction (ECC)
Hamming code methodology is implemented for EEPROM
checking and correction. The device has ECC enabled after
power-up.
The device always returns 30 bits.
The message received from controller is analyzed by the device
EEPROM driver and ECC bits are added. The first 6 received bits
from device to controller are dedicated to ECC.
EEPROM ECC Errors
Bits
Name
Description
29:26
–
No meaning
25:24
ECC
23:0
D[23:0]
00 = No Error
01 = Error detected and message corrected
10 = Uncorrectable error
11 = No meaning
EEPROM data
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
25
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
A1367
PACKAGE OUTLINE DRAWING
For Reference Only - Not for Tooling Use
(Reference DWG-9202)
Dimensions in millimeters - NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
B
10°
5.21
+0.08
–0.05
1.00
+0.08
–0.05
E
2.60 F
1.41 F
Mold Ejector
Pin Indent
+0.08
3.43
–0.05
F
0.89 MAX
1
2
3
4
A
Branded
Face
0.54 REF
NNNN
YYWW
0.41
+0.08
–0.05
+0.08
0.20
–0.05
D
12.14 ±0.05
1.27 NOM
N = Device part number
Y = Last two digits of year of manufacture
W = Week of manufacture
0.54 REF
0.89 MAX
1.50
+0.08
–0.05
D
+0.08
5.21
–0.05
Standard Branding Reference View
A
Dambar removal protrusion (16X)
B
Gate and tie burr area
C
Branding scale and appearance at supplier discretion
D
Molded Lead Bar for preventing damage to leads during shipment
E
Active Area Depth, 0.37 mm REF
F
Hall element, not to scale
+0.08
1.00
–0.05
Figure 24: Package KT, 4-Pin SIP
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
26
A1367
Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
with Regulated Supply, Advanced Temperature Compensation,
and High-Bandwidth (240 kHz) Analog Output
Revision History
Revision
Date
Description
–
March 9, 2016
Initial release
1
May 31, 2016
Updated Description (page 1), Features and Benefits (page 2), Noise (page 5), Quiescent Voltage
Output Programming Range (page 6), Sensitivity Drift Due to Package Hysteresis (page 7), and
Character Performance Data plots (page 8-9).
Copyright ©2016, Allegro MicroSystems, LLC
Allegro MicroSystems, LLC reserves the right to make, from time to time, such departures from the detail specifications as may be required to
permit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that
the information being relied upon is current.
Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of
Allegro’s product can reasonably be expected to cause bodily harm.
The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems, LLC assumes no responsibility for its
use; nor for any infringement of patents or other rights of third parties which may result from its use.
For the latest version of this document, visit our website:
www.allegromicro.com
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
27
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