Siemens C67078-S1325-A2 Sipmos power transistor (n channel enhancement mode avalanche-rated logic level) Datasheet

BUZ 70 L
SIPMOS ® Power Transistor
• N channel
• Enhancement mode
• Avalanche-rated
• Logic Level
Pin 1
Pin 2
G
Pin 3
D
S
Type
VDS
ID
RDS(on)
Package
Ordering Code
BUZ 70 L
60 V
12 A
0.15 Ω
TO-220 AB
C67078-S1325-A2
Maximum Ratings
Parameter
Symbol
Continuous drain current
ID
TC = 33 °C
Values
Unit
A
12
IDpuls
Pulsed drain current
TC = 25 °C
48
Avalanche current,limited by Tjmax
IAR
12
Avalanche energy,periodic limited by Tjmax
EAR
1
Avalanche energy, single pulse
EAS
mJ
ID = 12 A, VDD = 25 V, RGS = 25 Ω
L = 48.6 µH, Tj = 25 °C
6
Gate source voltage
VGS
± 14
Gate-source peak voltage,aperiodic
Vgs
± 20
Power dissipation
Ptot
TC = 25 °C
W
40
Operating temperature
Tj
-55 ... + 150
Storage temperature
Tstg
-55 ... + 150
Thermal resistance, chip case
RthJC
≤ 3.1
Thermal resistance, chip to ambient
RthJA
75
DIN humidity category, DIN 40 040
°C
K/W
E
IEC climatic category, DIN IEC 68-1
Semiconductor Group
V
55 / 150 / 56
1
07/96
BUZ 70 L
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Static Characteristics
Drain- source breakdown voltage
V(BR)DSS
VGS = 0 V, ID = 0.25 mA, Tj = 25 °C
Gate threshold voltage
60
-
-
VGS(th)
VGS=VDS, ID = 1 mA
Zero gate voltage drain current
V
1.2
1.6
2
IDSS
µA
VDS = 60 V, VGS = 0 V, Tj = 25 °C
-
0.1
1
VDS = 60 V, VGS = 0 V, Tj = 125 °C
-
10
100
Gate-source leakage current
IGSS
VGS = 20 V, VDS = 0 V
Drain-Source on-resistance
-
10
100
Ω
RDS(on)
VGS = 5 V, ID = 6 A
Semiconductor Group
nA
-
2
0.12
0.15
07/96
BUZ 70 L
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Dynamic Characteristics
Transconductance
gfs
VDS≥ 2 * ID * RDS(on)max, ID = 6 A
Input capacitance
2
pF
-
420
560
-
160
250
-
60
110
Crss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Turn-on delay time
-
Coss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Reverse transfer capacitance
7.5
Ciss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Output capacitance
S
td(on)
ns
VDD = 30 V, VGS = 5 V, ID = 3 A
RGS = 50 Ω
Rise time
-
15
25
-
55
80
-
45
60
-
40
55
tr
VDD = 30 V, VGS = 5 V, ID = 3 A
RGS = 50 Ω
Turn-off delay time
td(off)
VDD = 30 V, VGS = 5 V, ID = 3 A
RGS = 50 Ω
Fall time
tf
VDD = 30 V, VGS = 5 V, ID = 3 A
RGS = 50 Ω
Semiconductor Group
3
07/96
BUZ 70 L
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Reverse Diode
Inverse diode continuous forward current IS
TC = 25 °C
Inverse diode direct current,pulsed
-
-
48
V
1.5
1.8
trr
ns
-
60
-
Qrr
VR = 30 V, IF=lS, diF/dt = 100 A/µs
Semiconductor Group
12
-
VR = 30 V, IF=lS, diF/dt = 100 A/µs
Reverse recovery charge
-
VSD
VGS = 0 V, IF = 25 A
Reverse recovery time
-
ISM
TC = 25 °C
Inverse diode forward voltage
A
µC
-
4
0.1
-
07/96
BUZ 70 L
Power dissipation
Ptot = ƒ(TC)
Drain current
ID = ƒ(TC)
parameter: VGS ≥ 5 V
45
13
A
W
11
Ptot
ID
35
10
9
30
8
25
7
20
6
5
15
4
3
10
2
5
1
0
0
0
20
40
60
80
100
120
°C
160
0
20
40
60
80
100
120
TC
°C
160
TC
Safe operating area
ID = ƒ(VDS)
parameter: D = 0.01, TC = 25°C
Transient thermal impedance
Zth JC = ƒ(tp)
parameter: D = tp / T
10 1
10 2
t = 20.0µs
p
K/W
A
I
D
100 µs
ZthJC
10 1
V
DS
(o
n)
=
DS
/
ID
10 0
1 ms
R
10 -1
D = 0.50
10 ms
0.20
10
0
0.10
0.05
10 -2
DC
0.02
single pulse
10 -1
0
10
10
1
V 10
10 -3
-7
10
2
VDS
Semiconductor Group
10
-6
10
-5
0.01
10
-4
10
-3
10
-2
10
-1
s 10
tp
5
07/96
0
BUZ 70 L
Typ. output characteristics
ID = ƒ(VDS)
Typ. drain-source on-resistance
RDS (on) = ƒ(ID)
parameter: VGS
parameter: tp = 80 µs
28
0.45
Ptot = 40W
A
l kj i
h
VGS [V]
a
2.5
22
f
20
18
16
e
14
12
b
3.0
c
3.5
d
4.0
e
4.5
f
5.0
g
5.5
h
6.0
d i
7.0
10
j
8.0
8
k
9.0
l
10.0
c
6
3.0
e
0.25
0.20
0.15
4.0
f
g
hi
j k
0.10
0.05
a
2.0
d
0.30
b
1.0
c
RDS (on)0.35
4
2
0
0.0
b
Ω
g
24
ID
a
5.0
V
VGS [V] =
a
2.5
3.0
b
3.5
0.00
0
6.5
c
4.0
d
4.5
4
e
f
5.0 5.5
8
g
6.0
12
h
i
7.0 8.0
16
VDS
j
9.0
k
10.0
A
24
ID
Typ. transfer characteristics ID = f (VGS)
Typ. forward transconductance gfs = f (ID)
parameter: tp = 80 µs
VDS≥2 x ID x RDS(on)max
parameter: tp = 80 µs,
VDS≥2 x ID x RDS(on)max
10
30
A
S
26
ID
24
gfs
22
8
7
20
6
18
16
5
14
4
12
10
3
8
2
6
4
2
0
0
1
0
1
2
3
4
5
6
7
8
V
10
VGS
Semiconductor Group
6
0
4
8
12
16
20
A
ID
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28
BUZ 70 L
Drain-source on-resistance
RDS (on) = ƒ(Tj )
parameter: ID = 6 A, VGS = 5 V
Gate threshold voltage
VGS (th) = ƒ(Tj)
parameter: VGS = VDS, ID = 1 mA
0.70
4.6
Ω
V
0.60
4.0
RDS (on)0.55
VGS(th)
0.50
3.6
3.2
0.45
2.8
0.40
2.4
0.35
98%
2.0
0.30
typ
0.25
98%
0.20
typ
1.6
2%
1.2
0.15
0.8
0.10
0.4
0.05
0.00
-60
-20
20
60
100
°C
0.0
-60
160
-20
20
60
100
°C
Tj
160
Tj
Typ. capacitances
Forward characteristics of reverse diode
IF = ƒ(VSD)
parameter: Tj , tp = 80 µs
C = f (VDS)
parameter:VGS = 0V, f = 1MHz
10 1
10 2
nF
A
IF
C
10 0
10 1
Ciss
Coss
10 -1
10 0
Tj = 25 °C typ
Crss
Tj = 150 °C typ
Tj = 25 °C (98%)
Tj = 150 °C (98%)
10 -2
0
5
10
Semiconductor Group
15
20
25
30
V
VDS
40
10 -1
0.0
0.4
0.8
1.2
1.6
2.0
2.4
V
VSD
7
07/96
3.0
BUZ 70 L
Avalanche energy EAS = ƒ(Tj )
parameter: ID = 12 A, VDD = 25 V
RGS = 25 Ω, L = 48.6 µH
Typ. gate charge
VGS = ƒ(QGate)
parameter: ID puls = 18 A
6.5
16
mJ
V
5.5
EAS
VGS
5.0
12
4.5
10
4.0
3.5
0,2 VDS max
8
0,8 VDS max
3.0
2.5
6
2.0
4
1.5
1.0
2
0.5
0.0
20
0
40
60
80
100
120
°C
160
Tj
0
4
8
12
16
20
nC
Q Gate
Drain-source breakdown voltage
V(BR)DSS = ƒ(Tj )
71
V
V(BR)DSS
68
66
64
62
60
58
56
54
-60
-20
20
60
100
°C
160
Tj
Semiconductor Group
8
07/96
26
BUZ 70 L
Package Outlines
TO-220 AB
Dimension in mm
Semiconductor Group
9
07/96
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