Microchip MCP3302T-I/ST 13-bit differential input, low power a/d converter with spi serial interface Datasheet

M
MCP3302/04
13-Bit Differential Input, Low Power A/D Converter
with SPI™ Serial Interface
Features
General Description
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The Microchip Technology Inc. MCP3302/04 13-bit A/D
converters feature full differential inputs and low power
consumption in a small package that is ideal for battery
powered systems and remote data acquisition applications. The MCP3302 is programmable to provide two
differential input pairs or four single ended inputs. The
MCP3304 is programmable and provides four differential input pairs or eight single ended inputs.
Full Differential Inputs
MCP3302: 2 Differential or 4 Single ended Inputs
MCP3304: 4 Differential or 8 Single ended Inputs
±1 LSB max DNL
±1 LSB max INL (MCP3302/04-B)
±2 LSB max INL (MCP3302/04-C)
Single supply operation: 2.7V to 5.5V
100 ksps sampling rate with 5V supply voltage
50 ksps sampling rate with 2.7V supply voltage
50 nA typical standby current, 1 µA max
450 µA max active current at 5V
Industrial temp range: -40°C to +85°C
14 and 16-pin PDIP, SOIC and TSSOP packages
MXDEVTM Evaluation kit available
The MCP3302/04 devices feature low current design
that permits operation with typical standby and active
currents of only 50 nA and 300 µA, respectively. The
devices operate over a broad voltage range of 2.7V to
5.5V and are capable of conversion rates of up to
100 ksps. The reference voltage can be varied from
400 mV to 5V, yielding input-referred resolution
between 98 µV and 1.22 mV.
Applications
• Remote Sensors
• Battery Operated Systems
• Transducer Interface
Package Types
PDIP, SOIC, TSSOP
CH0
CH1
CH2
CH3
CH4
CH5
CH6
CH7
1
2
3
4
5
6
7
8
14
13
12
11
10
9
8
VDD
VREF
AGND
CLK
MCP3304
1
2
3
4
5
6
7
MCP3302
CH0
CH1
CH2
CH3
NC
NC
DGND
Incorporating a successive approximation architecture
with on-board sample and hold circuitry, these 13-bit
A/D converters are specified to have ±1 LSB Differential Nonlinearity (DNL); ±1 LSB Integral Nonlinearity
(INL) for B-grade and ±2 LSB for C-grade devices. The
industry-standard SPI™ serial interface enables 13-bit
A/D converter capability to be added to any PICmicro®
microcontroller.
16
15
14
13
12
11
10
9
VDD
VREF
AGND
CLK
DOUT
DIN
DOUT
DIN
CS/SHDN
The MCP3302 is available in 14-pin PDIP, 150 mil
SOIC and TSSOP packages. The MCP3304 is available in 16-pin PDIP and 150 mil SOIC packages. The
full differential inputs of these devices enable a wide
variety of signals to be used in applications such as
remote data acquisition, portable instrumentation and
battery operated applications.
PDIP, SOIC
 2002 Microchip Technology Inc.
CS/SHDN
DGND
DS21697B-page 1
MCP3302/04
Functional Block Diagram
VDD AGND DGND
VREF
CH0
CH1
Input
Channel
Mux
CH7*
CDAC
Sample
& Hold
Circuits
-
Comparator
13-Bit SAR
+
Control Logic
CS/SHDN DIN
CLK
Shift
Register
DOUT
* Channels 5-7 available on MCP3304 Only
DS21697B-page 2
 2002 Microchip Technology Inc.
MCP3302/04
1.0
ELECTRICAL
CHARACTERISTICS
PIN FUNCTION TABLE
Name
Function
Maximum Ratings*
CH0-CH7
Analog Inputs
VDD........................................................................ 7.0V
DGND
Digital Ground
All inputs and outputs w.r.t. VSS .....-0.3V to VDD +0.3V
CS/SHDN
Chip Select / Shutdown Input
Storage temperature .......................... -65°C to +150°C
DIN
Serial Data In
Ambient temp. with power applied ..... -65°C to +125°C
DOUT
Serial Data Out
CLK
Serial Clock
Maximum Junction Temperature ....................... 150°C
ESD protection on all pins (HBM)......................... > 4 kV
*Notice: Stresses above those listed under “Maximum ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at
those or any other conditions above those indicated in the
operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
AGND
Analog Ground
VREF
Reference Voltage Input
VDD
+2.7V to 5.5V Power Supply
ELECTRICAL SPECIFICATIONS
Electrical Characteristics: Unless otherwise noted, all parameters apply at V DD = 5V, VSS = 0V, and VREF = 5V. Full differential
input configuration (Figure 3-4) with fixed common mode voltage of 2.5V. All parameters apply over temperature with
TAMB = -40°C to +85°C (Note 7). Conversion speed (FSAMPLE) is 100 ksps with FCLK = 21*FSAMPLE
Parameter
Symbol
Min
Typ
Max
Units
Conditions
FSAMPLE
—
—
100
ksps
Note 8
—
—
50
ksps
VDD = VREF = 2.7V, VCM =1.35V
Conversion Rate
Maximum Sampling Frequency
Conversion Time
TCONV
13
CLK
periods
Acquisition Time
TACQ
1.5
CLK
periods
DC Accuracy
Resolution
12 data bits + sign
Integral Nonlinearity
INL
—
—
Differential Nonlinearity
DNL
±0.5
±1
bits
±1
±2
LSB
LSB
MCP3302/04-B
MCP3302/04-C
Monotonic over temperature
—
±0.5
±1
LSB
Positive Gain Error
-3
-0.75
+2
LSB
Negative Gain Error
-3
-0.5
+2
LSB
Offset Error
-3
+3
+6
LSB
Note 1:
2:
3:
4:
5:
6:
7:
8:
This specification is established by characterization and not 100% tested.
See characterization graphs that relate converter performance to VREF level.
VIN = 0.1V to 4.9V @ 1 kHz.
VDD =5VP-P ±500 mV @ 1 kHz, see test circuit Figure 3-3.
Maximum clock frequency specification must be met.
VREF = 400 mV, VIN = 0.1V to 4.9V @ 1 kHz
TSSOP devices are only specified at 25°C and +85°C.
For slow sample rates, see Section 6.2.1 for limitations on clock frequency.
 2002 Microchip Technology Inc.
DS21697B-page 3
MCP3302/04
ELECTRICAL SPECIFICATIONS (CONTINUED)
Electrical Characteristics: Unless otherwise noted, all parameters apply at V DD = 5V, VSS = 0V, and VREF = 5V. Full differential
input configuration (Figure 3-4) with fixed common mode voltage of 2.5V. All parameters apply over temperature with
TAMB = -40°C to +85°C (Note 7). Conversion speed (FSAMPLE) is 100 ksps with FCLK = 21*FSAMPLE
Parameter
Symbol
Min
Typ
Max
Units
Conditions
Dynamic Performance
Total Harmonic Distortion
THD
—
-91
—
dB
Note 3
Signal to Noise and Distortion
SINAD
—
78
—
dB
Note 3
Spurious Free Dynamic Range
SFDR
—
92
—
dB
Note 3
Common Mode Rejection
CMRR
—
79
—
dB
Note 6
CT
—
> -110
—
dB
Note 6
PSR
—
74
—
dB
Note 4
Voltage Range
0.4
—
VDD
V
Note 2
Current Drain
—
—
100
0.001
150
3
µA
µA
CS = VDD = 5V
V
Channel to Channel Crosstalk
Power Supply Rejection
Reference Input
Analog Inputs
Full Scale Input Span
CH0 - CH7
-V REF
—
VREF
Absolute Input Voltage
CH0 - CH7
-0.3
—
VDD + 0.3
V
—
0.001
±1
µA
Leakage Current
Switch Resistance
RS
—
1
—
kΩ
See Figure 6-3
Sample Capacitor
CSAMPLE
—
25
—
pF
See Figure 6-3
VIH
0.7 VDD
Digital Input/Output
Data Coding Format
High Level Input Voltage
Binary Two’s Complement
—
—
V
Low Level Input Voltage
VIL
—
—
0.3 VDD
V
High Level Output Voltage
VOH
4.1
—
—
V
IOH = -1 mA, VDD = 4.5V
Low Level Output Voltage
VOL
—
—
0.4
V
IOL = 1 mA, VDD = 4.5V
ILI
-10
—
10
µA
VIN = VSS or VDD
ILO
-10
—
10
µA
VOUT = VSS or VDD
CIN, C OUT
—
—
10
pF
TAMB = 25°C, F = 1 MHz, Note 1
Input Leakage Current
Output Leakage Current
Pin Capacitance
Note 1:
2:
3:
4:
5:
6:
7:
8:
This specification is established by characterization and not 100% tested.
See characterization graphs that relate converter performance to VREF level.
VIN = 0.1V to 4.9V @ 1 kHz.
VDD =5VP-P ±500 mV @ 1 kHz, see test circuit Figure 3-3.
Maximum clock frequency specification must be met.
VREF = 400 mV, VIN = 0.1V to 4.9V @ 1 kHz
TSSOP devices are only specified at 25°C and +85°C.
For slow sample rates, see Section 6.2.1 for limitations on clock frequency.
DS21697B-page 4
 2002 Microchip Technology Inc.
MCP3302/04
ELECTRICAL SPECIFICATIONS (CONTINUED)
Electrical Characteristics: Unless otherwise noted, all parameters apply at V DD = 5V, VSS = 0V, and VREF = 5V. Full differential
input configuration (Figure 3-4) with fixed common mode voltage of 2.5V. All parameters apply over temperature with
TAMB = -40°C to +85°C (Note 7). Conversion speed (FSAMPLE) is 100 ksps with FCLK = 21*FSAMPLE
Parameter
Symbol
Min
Typ
Max
Units
Conditions
FCLK
0.105
0.105
—
—
2.1
1.05
MHz
MHz
THI
210
—
—
ns
Note 5
Note 5
Timing Specifications:
Clock Frequency (Note 8)
Clock High Time
VDD = 5V, FSAMPLE = 100 ksps
VDD = 2.7V, FSAMPLE = 50 ksps
TLO
210
—
—
ns
TSUCS
100
—
—
ns
Data In Setup time
TSU
50
—
—
ns
Data In Hold Time
THD
—
—
50
ns
CLK Fall To Output Data Valid
TDO
—
—
125
200
ns
ns
VDD = 5V, see Figure 3-1
VDD = 2.7V, see Figure 3-1
CLK Fall To Output Enable
TEN
—
—
125
200
ns
ns
VDD = 5V, see Figure 3-1
VDD = 2.7V, see Figure 3-1
CS Rise To Output Disable
TDIS
—
—
100
ns
See test circuits, Figure 3-1
Note 1
Clock Low Time
CS Fall To First Rising CLK Edge
CS Disable Time
TCSH
475
—
—
ns
DOUT Rise Time
TR
—
—
100
ns
See test circuits, Figure 3-1
Note 1
DOUT Fall Time
TF
—
—
100
ns
See test circuits, Figure 3-1
Note 1
Power Requirements:
Operating Voltage
VDD
2.7
—
5.5
V
Operating Current
IDD
—
—
300
200
450
—
µA
VDD , VREF = 5V, DOUT unloaded
VDD , VREF = 2.7V, DOUT unloaded
Standby Current
IDDS
—
0.05
1
µA
CS = VDD = 5.0V
Specified Temperature Range
TA
-40
—
+85
°C
Operating Temperature Range
TA
-40
—
+85
°C
Storage Temperature Range
TA
-65
—
+150
°C
Thermal Resistance, 14L-PDIP
θJA
—
70
—
°C/W
Thermal Resistance, 14L-SOIC
θJA
—
108
—
°C/W
Thermal Resistance, 14L-TSSOP
θJA
—
100
—
°C/W
Thermal Resistance, 16L-PDIP
θJA
—
70
—
°C/W
Thermal Resistance, 16L-SOIC
θJA
—
90
—
°C/W
Temperature Ranges:
Thermal Package Resistance:
Note 1:
2:
3:
4:
5:
6:
7:
8:
This specification is established by characterization and not 100% tested.
See characterization graphs that relate converter performance to VREF level.
VIN = 0.1V to 4.9V @ 1 kHz.
VDD =5VP-P ±500 mV @ 1 kHz, see test circuit Figure 3-3.
Maximum clock frequency specification must be met.
VREF = 400 mV, VIN = 0.1V to 4.9V @ 1 kHz
TSSOP devices are only specified at 25°C and +85°C.
For slow sample rates, see Section 6.2.1 for limitations on clock frequency.
 2002 Microchip Technology Inc.
DS21697B-page 5
MCP3302/04
.
TCSH
CS
TSUCS
THI
TLO
CLK
TSU
DIN
THD
MSB IN
TEN
DOUT
FIGURE 1-1:
DS21697B-page 6
TR
TDO
Null Bit
Sign BIT
TF
TDIS
LSB
Timing Parameters
 2002 Microchip Technology Inc.
MCP3302/04
2.0
TYPICAL PERFORMANCE CURVES
Note:
The graphs and tables provided following this note are a statistical summary based on a limited number of
samples and are provided for informational purposes only. The performance characteristics listed herein
are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified
operating range (e.g., outside specified power supply range) and therefore outside the warranted range.
Note:
Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.
.
.
1
1
0.8
0.8
0.6
0.6
Positive INL
0.4
0.2
0
-0.2
-0.4
Positive INL
0.4
INL (LSB)
INL (LSB)
VDD=V REF=2.7V
0.2
0
-0.2
-0.4
Negative INL
-0.6
-0.6
-0.8
-0.8
Negative INL
-1
-1
0
50
100
150
0
200
10
20
30
FIGURE 2-1:
vs. Sample Rate
40
50
60
70
Sample Rate (ksps)
Sample Rate (ksps)
Integral Nonlinearity (INL)
FIGURE 2-4:
Integral Nonlinearity (INL)
vs. Sample Rate (VDD = 2.7V)
.
2
2
1.5
1.5
1
Positive INL
0.5
INL(LSB)
INL (LSB)
1
0
-0.5
Positive INL
0.5
0
-0.5
Negative INL
-1
Negative INL
-1
-1.5
-1.5
-2
0
1
2
3
4
-2
5
0
VREF(V)
FIGURE 2-2:
vs. VREF.
Integral Nonlinearity (INL)
1
0.8
0.6
0.6
0.4
0.4
0.2
0.2
INL (LSB)
0.8
0
-0.2
1
1.5
2
VREF(V)
2.5
3
VDD=VREF=2.7V
FSAMPLE = 50 ksps
0
-0.2
-0.4
-0.4
-0.6
-0.6
-0.8
-0.8
-1
-4096
0.5
FIGURE 2-5:
Integral Nonlinearity (INL)
vs. VREF (VDD = 2.7V)
1
INL (LSB)
VDD = 2.7V
-1
-3072
-2048
-1024
0
1024
2048
3072
4096
Code
FIGURE 2-3:
Integral Nonlinearity (INL)
vs. Code (Representative Part).
 2002 Microchip Technology Inc.
-4096
-3072
-2048
-1024
0
1024
2048
3072
4096
Code
FIGURE 2-6:
Integral Nonlinearity (INL)
vs. Code (Representative Part, VDD = 2.7V).
DS21697B-page 7
MCP3302/04
Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.
Note:
1
1
0.8
0.8
0.6
0.6
Positive INL
0.4
0.2
0
-0.2
-0.4
Positive INL
0.4
INL (LSB)
INL (LSB)
VDD=VREF=2.7V
FSAMPLE = 50 ksps
0.2
0
-0.2
-0.4
Negative INL
-0.6
-0.6
-0.8
-0.8
Negative INL
-1
-1
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
Temperature(°C)
FIGURE 2-7:
vs. Temperature.
Integral Nonlinearity (INL)
1
1
0.8
0.6
0.6
Positive DNL
DNL (LSB)
DNL (LSB)
0
-0.2
125
150
Positive DNL
0.2
0
-0.2
Negative DNL
-0.4
Negative DNL
-0.6
-0.6
-0.8
-0.8
-1
0
-1
0
50
100
150
10
20
200
FIGURE 2-8:
Differential Nonlinearity
(DNL) vs. Sample Rate.
30
40
50
60
70
Sample Rate (ksps)
Sample Rate (ksps)
FIGURE 2-11:
Differential Nonlinearity
(DNL) vs. Sample Rate (VDD = 2.7V).
2
2
1.5
1.5
1
VDD=2.7V
FSAMPLE = 50 ksps
1
Positive DNL
0.5
DNL (LSB)
DNL(LSB)
100
VDD=VREF=2.7V
0.4
0.2
-0.4
75
FIGURE 2-10:
Integral Nonlinearity (INL)
vs. Temperature (VDD = 2.7V).
0.8
0.4
50
Temperature (°C)
0
-0.5
Negative DNL
0
Negative DNL
-0.5
-1
-1
-1.5
-1.5
-2
Positive DNL
0.5
-2
0
1
2
3
4
5
VREF(V)
FIGURE 2-9:
(DNL) vs. VREF.
DS21697B-page 8
Differential Nonlinearity
6
0
0.5
1
1.5
VREF (V)
2
2.5
3
FIGURE 2-12:
Differential Nonlinearity
(DNL) vs. VREF (VDD = 2.7V).]
 2002 Microchip Technology Inc.
MCP3302/04
Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.
Note:
1
1
0.8
0.6
0.6
0.4
0.4
0.2
DNL (LSB)
DNL (LSB)
VDD=V REF=2.7V
FSAMPLE = 50 ksps
0.8
0
-0.2
0.2
0
-0.2
-0.4
-0.4
-0.6
-0.6
-0.8
-0.8
-1
-4096
-1
-3072
-2048
-1024
0
1024
2048
3072
-4096
4096
-3072
-2048
-1024
1
1
0.8
0.8
0.6
2048
3072
4096
VDD=V REF=2.7V
FSAMPLE = 50 ksps
0.6
Positive DNL
0.2
0
-0.2
Negaitive DNL
-0.4
Positive DNL
0.4
DNL (LSB)
0.4
DNL (LSB)
1024
FIGURE 2-16:
Differential Nonlinearity
(DNL) vs. Code (Representative Part,
VDD = 2.7V).
FIGURE 2-13:
Differential Nonlinearity
(DNL) vs. Code (Representative Part).
0.2
0
-0.2
Negative DNL
-0.4
-0.6
-0.6
-0.8
-0.8
-1
-1
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
Temperature (°C)
50
75
100
125
150
Temperature (°C)
FIGURE 2-14:
Differential Nonlinearity
(DNL) vs. Temperature.
FIGURE 2-17:
Differential Nonlinearity
(DNL) vs. Temperature (VDD = 2.7V).
4
20
18
3
16
2
Offset Error (LSB)
Positive Gain Error (LSB)
0
Code
Code
VDD =5V
FSAMPLE = 100 ksps
1
0
-1
14
12
VDD = 5V
FSAMPLE = 100 ksps
10
8
6
4
-2
VDD = 2.7V
FSAMPLE = 50 ksps
2
-3
0
0
1
2
3
4
5
6
0
1
VREF(V)
FIGURE 2-15:
VREF.
Positive Gain Error vs.
 2002 Microchip Technology Inc.
2
3
4
5
6
VREF(V)
FIGURE 2-18:
Offset Error vs. VREF.
DS21697B-page 9
MCP3302/04
Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.
0
3.5
-0.2
3
VDD=VREF=5V
FSAMPLE = 100 ksps
-0.4
Offset Error (LSB)
Positive Gain Error (LSB)
Note:
-0.6
-0.8
-1
-1.2
-1.4
VDD=V REF=2.7V
FSAMPLE = 50 ksps
-1.6
VDD=VREF=5V
FSAMPLE = 100 ksps
2.5
VDD=VREF =2.7V
FSAMPLE = 50 ksps
2
1.5
1
0.5
0
-1.8
-50
-50
0
50
100
0
50
Temperature (°C)
FIGURE 2-19:
Temperature.
FIGURE 2-22:
Temperature.
Offset Error vs.
90
VDD=VREF =5V
FSAMPLE = 100 ksps
90
80
80
70
70
VDD=VREF=2.7V
FSAMPLE = 50 ksps
60
SINAD (dB)
SNR (db)
150
Temperature (°C)
Positive Gain Error vs.
100
50
40
30
60
VDD=V REF=2.7V
FSAMPLE = 50 ksps
50
VDD=V REF=5V
FSAMPLE = 100 ksps
40
30
20
20
10
10
0
0
1
10
1
100
10
Input Frequency (kHz)
100
Input Frequency (kHz)
FIGURE 2-20:
Signal to Noise Ratio (SNR)
vs. Input Frequency.
FIGURE 2-23:
Signal to Noise and
Distortion (SINAD) vs. Input Frequency.
0
80
-10
70
-20
60
VDD=VREF =2.7V
FSAMPLE = 50 ksps
-40
VDD=VREF=5V
FSAMPLE = 100 ksps
-50
-60
-70
SINAD (dB)
-30
THD (dB)
100
150
50
40
VDD=V REF=2.7V
FSAMPLE = 50 ksps
30
20
-80
VDD=VREF=5V
FSAMPLE = 100 ksps
10
-90
0
-100
1
10
100
Input Frequency (kHz)
FIGURE 2-21:
Total Harmonic Distortion
(THD) vs. Input Frequency.
DS21697B-page 10
-40
-35
-30
-25
-20
-15
-10
-5
0
Input Signal Level (dB)
FIGURE 2-24:
Signal to Noise and
Distortion (SINAD) vs. Input Signal Level.
 2002 Microchip Technology Inc.
MCP3302/04
Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.
Note:
13
13
12.8
12.6
VDD=2.7V
FSAMPLE = 50 ksps
11
VDD=5V
FSAMPLE = 100 ksps
ENOB (rms)
ENOB (rms)
12
10
9
VDD=VREF=5V
FSAMPLE = 100 ksps
12.4
12.2
VDD=VREF=2.7V
FSAMPLE = 50 ksps
12
11.8
11.6
8
11.4
11.2
7
0
1
2
3
4
1
5
10
VREF(V)
FIGURE 2-25:
(ENOB) vs. VREF.
Effective Number of Bits
100
-30
80
-40
70
-45
60
VDD=V REF=2.7V
FSAMPLE = 50 ksps
40
0.1 µF Bypass
Capacitor
-35
PSR(dB)
SFDR (dB)
FIGURE 2-28:
Effective Number of Bits
(ENOB) vs. Input Frequency.
VDD=VREF=5V
FSAMPLE = 100 ksps
90
50
-50
-55
-60
30
-65
20
-70
10
-75
0
-80
1
10
100
1
10
Input Frequency (kHz)
10000
20000
30000
40000
50000
Frequency (Hz)
FIGURE 2-27:
Frequency Spectrum of
10 kHz Input (Representative Part).
 2002 Microchip Technology Inc.
1000
10000
FIGURE 2-29:
Power Supply Rejection
(PSR) vs. Ripple Frequency.
Amplitude (dB)
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
-140
-150
0
100
Ripple Frequency (kHz)
FIGURE 2-26:
Spurious Free Dynamic
Range (SFDR) vs. Input Frequency.
Amplitude (dB)
100
Input Frequency (kHz)
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
-140
-150
0
5000
10000
15000
20000
25000
Frequency (Hz)
FIGURE 2-30:
Frequency Spectrum of
1 kHz Input (Representative Part, VDD = 2.7V).
DS21697B-page 11
MCP3302/04
Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.
Note:
450
120
400
100
350
80
IREF (µA)
IDD (µA)
300
250
200
150
60
40
100
20
50
0
0
2
2.5
3
3.5
4
4.5
5
5.5
6
2
2.5
3
3.5
VDD (V)
IDD vs. VDD.
FIGURE 2-31:
5
5.5
6
120
500
VDD=V REF=5V
100
VDD=VREF =5V
80
IREF (µA)
400
IDD (µA)
4.5
IREF vs. VDD.
FIGURE 2-34:
600
300
200
60
40
VDD=V REF=2.7V
VDD=VREF =2.7V
100
20
0
0
0
50
100
150
200
0
50
Sample Rate (ksps)
100
350
90
IREF (µA)
70
200
150
60
50
40
VDD=VREF=2.7V
FSAMPLE = 50 ksps
30
VDD=V REF=2.7V
FSAMPLE = 50 ksps
100
200
VDD=VREF=5V
FSAMPLE = 100 ksps
80
V DD=VREF=5V
FSAMPLE = 100 ksps
250
150
IREF vs. Sample Rate.
FIGURE 2-35:
400
300
100
Sample Rate (ksps)
IDD vs. Sample Rate.
FIGURE 2-32:
IDD (µA)
4
VDD (V)
20
50
10
0
0
-50
0
50
100
150
-50
Temperature (°C)
FIGURE 2-33:
DS21697B-page 12
IDD vs. Temperature.
0
50
100
150
Temperature (°C)
FIGURE 2-36:
IREF vs. Temperature.
 2002 Microchip Technology Inc.
MCP3302/04
Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.
Note:
2
70
1.5
Negative Gain Error (LSB)
80
IDDS (pA)
60
50
40
30
20
10
1
VDD=V REF=2.7V
FSAMPLE = 50 ksps
0.5
VDD=VREF=5V
FSAMPLE = 100 ksps
0
-0.5
-1
-1.5
0
-2
2
2.5
3
3.5
4
4.5
5
5.5
6
-50
VDD (V)
50
100
150
Temperature (°C)
IDDS vs. VDD.
FIGURE 2-37:
0
FIGURE 2-40:
Temperature.
Negative Gain Error vs.
100
IDDS (nA)
1
0.1
0.01
0.001
-50
-25
0
25
50
75
100
79
78
77
76
75
74
73
72
71
70
Temperature (°C)
1
IDDS vs. Temperature.
FIGURE 2-38:
Common Mode Rejection Ration(dB)
80
10
FIGURE 2-41:
vs. Frequency.
4
10
100
Input Frequency (kHz)
1000
Common Mode Rejection
Negative Gain Error (LSB)
3.5
3
2.5
2
1.5
VDD=5V
FSAMPLE = 100 ksps
1
0.5
0
-0.5
-1
0
1
2
3
4
5
6
VREF (V)
FIGURE 2-39:
Negative Gain Error vs.
Reference Voltage.
 2002 Microchip Technology Inc.
DS21697B-page 13
MCP3302/04
3.0
TEST CIRCUITS
1/2 MCP602
1 kΩ
+
MCP330X
1.4V
3 kΩ
DOUT
-
20 kΩ
Test Point
5VP-P
2.63V
1 kΩ
CL = 100 pF
Load Circuit for TR, TF, TDO.
FIGURE 3-1:
FIGURE 3-3:
Power Supply Sensitivity
Test Circuit (PSRR).
Test Point
VREF = 5V
VDD
MCP330X
5V ±500 mVP-P
To V DD on DUT
1 kΩ
3 kΩ
DOUT
VDD /2
100 pF
1 µF
TDIS Waveform 2
TEN Waveform
IN(+)
IN(-)
5VP-P
0.1 µF
0.1 µF
5VP-P
TDIS Waveform 1
VSS
VDD = 5V
VREF VDD
MCP330X
VSS
Voltage Waveforms for TDIS
CS
VCM = 2.5V
VIH
DOUT
Waveform 1*
90%
TDIS
DOUT
Waveform 2†
FIGURE 3-4:
Full Differential Test
Configuration Example.
10%
VREF = 2.5V
1µF
*Waveform 1 is for an output with internal conditions such that the output is high, unless disabled by the output control.
†Waveform 2 is for an output with internal conditions such that the output is low, unless disabled by the output control.
FIGURE 3-2:
TEN.
Load circuit for TDIS and
VDD = 5V
0.1µF
0.1µF
5VP-P
IN(+)
VREF VDD
MCP330X
IN(-)
VSS
VCM = 2.5V
FIGURE 3-5:
Pseudo Differential Test
Configuration Example.
DS21697B-page 14
 2002 Microchip Technology Inc.
MCP3302/04
4.0
PIN DESCRIPTIONS
The descriptions of the pins are listed in Table 4-1.
TABLE 4-1:
PIN FUNCTION TABLE
Name
Function
4.6
Serial Clock (CLK)
The SPI clock pin is used to initiate a conversion and to
clock out each bit of the conversion as it takes place.
See Section 6.2 for constraints on clock speed. See
Figure 7-2 for serial communication protocol.
CH0-CH7
Analog Inputs
4.7
DGND
Digital Ground
CS/SHDN
Chip Select / Shutdown Input
DIN
Serial Data In
Ground connection to internal analog circuitry. To
ensure accuracy, this pin must be connected to the
same ground as DGND. If an analog ground plane is
available, it is recommended that this device be tied to
the analog ground plane in the circuit. See Section 6.6
for more information regarding circuit layout.
DOUT
Serial Data Out
CLK
Serial Clock
AGND
Analog Ground
VREF
Reference Voltage Input
VDD
+2.7V to 5.5V Power Supply
4.1
CH0-CH7
Analog input channels. These pins have an absolute
voltage range of VSS - 0.3V to VDD + 0.3V. The full scale
differential input range is defined as the absolute value
of (IN+) - (IN-). This difference can not exceed the
value of VREF - 1 LSB or digital code saturation will
occur.
4.2
4.8
AGND
Voltage Reference (VREF)
This input pin provides the reference voltage for the
device, which determines the maximum range of the
analog input signal and the LSB size.
The LSB size is determined according to the equation
shown below. As the reference input is reduced, the
LSB size is reduced accordingly.
EQUATION
LSB Size =
DGND
2 x VREF
8192
Ground connection to internal digital circuitry. To
ensure accuracy this pin must be connected to the
same ground as AGND. If an analog ground plane is
available, it is recommended that this device be tied to
the analog ground plane in the circuit. See Section 6.6
for more information regarding circuit layout.
When using an external voltage reference device, the
system designer should always refer to the manufacturer’s recommendations for circuit layout. Any instability in the operation of the reference device will have a
direct effect on the accuracy of the ADC conversion
results.
4.3
4.9
Chip Select/Shutdown (CS/SHDN)
The CS/SHDN pin is used to initiate communication
with the device when pulled low. This pin will end a conversion and put the device in low power standby when
pulled high. The CS/SHDN pin must be pulled high
between conversions and cannot be tied low for multiple conversions. See Figure 7-2 for serial communication protocol.
4.4
VDD
The voltage on this pin can range from 2.7 to 5.5V. To
ensure accuracy, a 0.1 µF ceramic bypass capacitor
should be placed as close as possible to the pin. See
Section 6.6 for more information regarding circuit layout.
Serial Data Input (D IN)
The SPI port serial data input pin is used to clock in
input channel configuration data. Data is latched on the
rising edge of the clock. See Figure 7-2 for serial communication protocol.
4.5
Serial Data Output (DOUT)
The SPI serial data output pin is used to shift out the
results of the A/D conversion. Data will always change
on the falling edge of each clock as the conversion
takes place. See Figure 7-2 for serial communication
protocol.
 2002 Microchip Technology Inc.
DS21697B-page 15
MCP3302/04
5.0
DEFINITION OF TERMS
Bipolar Operation - This applies to either a differential
or single ended input configuration, where both positive
and negative codes are output from the A/D converter.
Full bipolar range includes all 8192 codes. For bipolar
operation on a single ended input signal, the A/D converter must be configured to operate in pseudo differential mode.
Unipolar Operation - This applies to either a single
ended or differential input signal where only one side of
the device transfer is being used. This could be either
the positive or negative side, depending on which input
(IN+ or IN-) is being used for the DC bias. Full unipolar
operation is equivalent to a 12-bit converter.
Full Differential Operation - Applying a full differential
signal to both the IN(+) and IN(-) inputs is referred to as
full differential operation. This configuration is
described in Figure 3-4.
Pseudo-Differential Operation - Applying a single
ended signal to only one of the input channels with a
bipolar output is referred to as pseudo differential operation. To obtain a bipolar output from a single ended
input signal the inverting input of the A/D converter
must be biased above VSS. This operation is described
in Figure 3-5.
Integral Nonlinearity - The maximum deviation from a
straight line passing through the endpoints of the bipolar transfer function is defined as the maximum integral
nonlinearity error. The endpoints of the transfer function are a point 1/2 LSB above the first code transition
(0x1000) and 1/2 LSB below the last code transition
(0x0FFF).
Differential Nonlinearity - The difference between two
measured adjacent code transitions and the 1 LSB
ideal is defined as differential nonlinearity.
Positive Gain Error - This is the deviation between the
last positive code transition (0x0FFF) and the ideal voltage level of VREF-1/2 LSB, after the bipolar offset error
has been adjusted out.
Negative Gain Error - This is the deviation between
the last negative code transition (0X1000) and the ideal
voltage level of -VREF-1/2 LSB, after the bipolar offset
error has been adjusted out.
Offset Error - This is the deviation between the first
positive code transition (0x0001) and the ideal 1/2 LSB
voltage level.
Acquisition Time - The acquisition time is defined as
the time during which the internal sample capacitor is
charging. This occurs for 1.5 clock cycles of the external CLK as defined in Figure 7-2.
Conversion Time - The conversion time occurs immediately after the acquisition time. During this time, successive approximation of the input signal occurs as the
13-bit result is being calculated by the internal circuitry.
This occurs for 13 clock cycles of the external CLK as
defined in Figure 7-2.
DS21697B-page 16
Signal to Noise Ratio - Signal to Noise Ratio (SNR) is
defined as the ratio of the signal to noise measured at
the output of the converter. The signal is defined as the
rms amplitude of the fundamental frequency of the
input signal. The noise value is dependant on the
device noise as well as the quantization error of the
converter and is directly affected by the number of bits
in the converter. The theoretical signal to noise ratio
limit based on quantization error only for an N-bit converter is defined as:
EQUATION
SNR = ( 6.02N + 1.76 )dB
For a 13-bit converter, the theoretical SNR limit is
80.02 dB.
Total Harmonic Distortion - Total Harmonic Distortion
(THD) is the ratio of the rms sum of the harmonics to
the fundamental, measured at the output of the converter. For the MCP3302/04, it is defined using the first
9 harmonics, as is shown in the following equation:
EQUATION
2
2
2
2
2
V 2 + V 3 + V 4 + ..... + V 8 + V 9
THD(-dB) = –20 log -------------------------------------------------------------------------2
V1
Here V 1 is the rms amplitude of the fundamental and V2
through V9 are the rms amplitudes of the second
through ninth harmonics.
Signal to Noise plus Distortion (SINAD) - Numerically defined, SINAD is the calculated combination of
SNR and THD. This number represents the dynamic
performance of the converter, including any harmonic
distortion.
EQUATION
SINAD(dB) = 20 log 10
( SNR ⁄ 10 )
+ 10
– ( THD ⁄ 10 )
EffectIve Number of Bits - Effective Number of Bits
(ENOB) states the relative performance of the ADC in
terms of its resolution. This term is directly related to
SINAD by the following equation:
EQUATION
SINAD – 1.76
ENOB ( N ) = ---------------------------------6.02
For SINAD performance of 78 dB, the effective number
of bits is 12.66.
Spurious Free Dynamic Range - Spurious Free
Dynamic Range (SFDR) is the ratio of the rms value of
the fundamental to the next largest component in
ADC’s output spectrum. This is, typically, the first harmonic, but could also be a noise peak.
 2002 Microchip Technology Inc.
MCP3302/04
6.0
APPLICATIONS INFORMATION
6.2
6.1
Conversion Description
The analog input of the MCP3302/04 is easily driven,
either differentially or single ended. Any signal that is
common to the two input channels will be rejected by
the common mode rejection of the device. During the
charging time of the sample capacitor, a small charging
current will be required. For low source impedances,
this input can be driven directly. For larger source
impedances, a larger acquisition time will be required
due to the RC time constant that includes the source
impedance. For the A/D Converter to meet specification, the charge holding capacitor (CSAMPLE) must be
given enough time to acquire a 13-bit accurate voltage
level during the 1.5 clock cycle acquisition period.
IN+
CDAC
Hold
CSAMP
+
CSAMP
IN-
13-Bit SAR
Shift
Register
Hold
FIGURE 6-1:
Comp
DOUT
Simplified Block Diagram.
An analog input model is shown in Figure 6-3. This
model is accurate for an analog input, regardless if it is
configured as a single ended input, or the IN+ and INinput in differential mode. In this diagram, it is shown
that the source impedance (RS) adds to the internal
sampling switch (RSS) impedance, directly affecting the
time that is required to charge the capacitor (CSAMPLE).
Consequently, a larger source impedance with no additional acquisition time increases the offset, gain and
integral linearity errors of the conversion. To overcome
this, a slower clock speed can be used to allow for the
longer charging time. Figure 6-2 shows the maximum
clock speed associated with source impedances.
Maximum Clock Frequency (MHz)
The MCP3302/04 A/D converters employ a conventional SAR architecture. With this architecture, the
potential between the IN+ and IN- inputs are simultaneously sampled and stored with the internal sample
circuits for 1.5 clock cycles. Following this sampling
time, the input hold switches of the converter open and
the device uses the collected charge to produce a
serial 13-bit binary two’s complement output code. This
conversion process is driven by the external clock and
must include 13 clock cycles, one for each bit. During
this process, the most significant bit (MSB) is output
first. This bit is the sign bit and indicates if the IN+ or INinput is at a higher potential.
Driving the Analog Input
2.5
2.0
1.5
1.0
0.5
0.0
100
1000
10000
100000
Source Resistance (ohms)
FIGURE 6-2:
Maximum Clock Frequency
vs. Source Resistance (RS) to maintain ±1 LSB
INL.
 2002 Microchip Technology Inc.
DS21697B-page 17
MCP3302/04
VDD
RSS
VT = 0.6V
CHx
CPIN
7 pF
VA
Sampling
Switch
VT = 0.6V
SS
RS = 1 kΩ
C SAMPLE
= DAC capacitance
= 25 pF
ILEAKAGE
±1 nA
VSS
Legend
VA = signal source
RSS = source impedance
CHx = input channel pad
CPIN = input pin capacitance
VT = threshold voltage
ILEAKAGE = leakage current at the pin
due to various junctions
SS = sampling switch
RS = sampling switch resistor
CSAMPLE = sample/hold capacitance
FIGURE 6-3:
6.2.1
Analog Input Model.
MAINTAINING MINIMUM CLOCK
SPEED
When the MCP3302/04 initiates, charge is stored on
the sample capacitor. When the sample period is complete, the device converts one bit for each clock that is
received. It is important for the user to note that a slow
clock rate will allow charge to bleed off the sample cap
while the conversion is taking place. For the MCP330X
devices, the recommended minimum clock speed during the conversion cycle (TCONV) is 105 kHz. Failure to
meet this criteria may induce linearity errors into the
conversion outside the rated specifications. It should
be noted that during the entire conversion cycle, the
A/D converter does not have requirements for clock
speed or duty cycle, as long as all timing specifications
are met.
6.3
Biasing Solutions
For pseudo-differential bipolar operation, the biasing
circuit (shown in Figure 6-4) shows a single ended
input AC coupled to the converter. This configuration
will give a digital output range of -4096 to +4095. With
the 2.5V reference, the LSB size equal to 610 µV.
Although the ADC is not production tested with a 2.5V
reference as shown, linearity will not change more than
0.1 LSB. See Figure 2-2 and Figure 2-9 for DNL and
INL errors versus VREF at VDD = 5V. A trade-off exists
between the high pass corner and the acquisition time.
The value of C will need to be quite large in order to
DS21697B-page 18
bring down the high pass corner. The value of R will
need to be 1 kΩ, or less, since higher input impedances
require additional acquisition time. Using the RC values
in Figure 6-4, we have a 100 Hz corner frequency. See
Figure 2-12 for relation between input impedance and
acquisition time.
VDD = 5V
0.1 µF
C
10 µF
IN+
VIN
1 kΩ
R
IN-
VOUT
1 µF
MCP330X
VREF
VIN
MCP1525
0.1 µF
FIGURE 6-4:
Pseudo-differential biasing
circuit for bipolar operation.
Using an external operation amplifier on the input
allows for gain and also buffers the input signal from the
input to the ADC allowing for a higher source impedance. This circuit is shown in Figure 6-5.
 2002 Microchip Technology Inc.
MCP3302/04
6.4
VDD = 5V
0.1 µF
10 kΩ
MCP6021
1 kΩ
VIN
+
1 µF
IN+
IN-
1 MΩ
1 µF
MCP330X
VREF
VOUT
VIN
MCP1525
Common Mode Input Range
The common mode input range has no restriction and is
equal to the absolute input voltage range: VSS -0.3V to
VDD + 0.3V. However, for a given VREF, the common
mode voltage has a limited swing, if the entire range of
the A/D converter is to be used. Figure 6-7 and
Figure 6-8 show the relationship between VREF and the
common mode voltage swing. A smaller VREF allows for
wider flexibility in a common mode voltage. VREF levels,
down to 400 mv, exhibit less than 0.1 LSB change in
DNL and INL. For characterization graphs that show
this performance relationship, see Figure 2-9 and
Figure 2-12.
0.1 µF
VDD = 5V
FIGURE 6-5:
Adding an amplifier allows
for gain and also buffers the input from any high
impedance sources.
This circuit shows that some headroom will be lost due
to the amplifier output not being able to swing all the
way to the rail. An example would be for an output
swing of 0V to 5V. This limitation can be overcome by
supplying a VREF that is slightly less than the common
mode voltage. Using a 2.048V reference for the A/D
converter while biasing the input signal at 2.5V solves
the problem. This circuit is shown in Figure 6-5.
Common Mode Range (V)
5
4.05V
4
2.8V
3
2
2.3V
1
0.95V
0
-1
0.25
1.0
2.5
4.0
FIGURE 6-7:
Common Mode Input Range
of Full Differential Input Signal versus VREF.
VDD = 5V
10 kΩ
5
1 µF
IN+
IN-
1 MΩ
MCP330X
VREF
10 kΩ
2.048V
1 µF
VOUT
VIN
MCP1525
Common Mode Range (V)
VIN
+
VDD = 5V
0.1 µF
MCP606
1 kΩ
5.0
VREF (V)
2.8V
3
2
2.3V
1
0.95V
0
-1
0.25
0.1 µF
4.05V
4
0.5
1.25
2.0
2.5
VREF (V)
FIGURE 6-8:
Common Mode Input Range
versus VREF for Pseudo Differential Input.
FIGURE 6-6:
Circuit solution to overcome
amplifier output swing limitation.
 2002 Microchip Technology Inc.
DS21697B-page 19
MCP3302/04
6.5
Buffering/Filtering the Analog
Inputs
Inaccurate conversion results may occur if the signal
source for the A/D converter is not a low impedance
source. Buffering the input will overcome the impedance issue. It is also recommended that an analog filter
be used to eliminate any signals that may be aliased
back into the conversion results. This is illustrated in
Figure 6-9, where an op amp is used to drive the analog input of the MCP3302/04. This amplifier provides a
low impedance source for the converter input and a low
pass filter, which eliminates unwanted high frequency
noise. Values shown are for a 10 Hz Butterworth Low
Pass filter.
Low pass (anti-aliasing) filters can be designed using
Microchip’s interactive FilterLab® software. FilterLab
will calculate capacitor and resistor values, as well as
determine the number of poles that are required for the
application. For more information on filtering signals,
see Application Note 699 “Anti-Aliasing Analog Filters
for Data Acquisition Systems”.
6.6
Layout Considerations
When laying out a printed circuit board for use with
analog components, care should be taken to reduce
noise wherever possible. A bypass capacitor from VDD
to ground should always be used with this device and
should be placed as close as possible to the device pin.
A bypass capacitor value of 0.1 µF is recommended.
Digital and analog traces on the board should be separated as much as possible, with no traces running
underneath the device or the bypass capacitor. Extra
precautions should be taken to keep traces with high
frequency signals (such as clock lines) as far as possible from analog traces.
Use of an analog ground plane is recommended in
order to keep the ground potential the same for all
devices on the board. Providing V DD connections to
devices in a “star” configuration can also reduce noise
by eliminating current return paths and associated
errors (see Figure 6-10). For more information on layout tips when using the MCP3302/04, or other ADC
devices, refer to Application Note 688, “Layout Tips for
12-Bit A/D Converter Applications”.
VDD
10 µF
4.096V
Reference
0.1 µF
MCP1541
VDD
Connection
1 µF
CL
VREF
IN+
0.1 µF
MCP330X
7.86 kΩ
VIN
2.2 µF
MCP601
Device 4
IN-
+
14.6 kΩ
1 µF
-
FIGURE 6-9:
The MCP601 Operational
Amplifier is used to implement a 2nd order antialiasing filter for the signal being converted by
the MCP3302/04.
Device 1
Device 3
Device 2
FIGURE 6-10:
VDD traces arranged in a
‘Star’ configuration in order to reduce errors
caused by current return paths.
DS21697B-page 20
 2002 Microchip Technology Inc.
MCP3302/04
6.7
Utilizing the Digital and Analog
Ground Pins
The MCP3302/04 devices provide both digital and analog ground connections to provide another means of
noise reduction. As shown in Figure 6-11, the analog
and digital circuitry are separated internal to the device.
This reduces noise from the digital portion of the device
being coupled into the analog portion of the device. The
two grounds are connected internally through the substrate which has a resistance of 5 -10 Ω.
If no ground plane is utilized, then both grounds must
be connected to VSS on the board. If a ground plane is
available, both digital and analog ground pins should
be connected to the analog ground plane. If both an
analog and a digital ground plane are available, both
the digital and the analog ground pins should be connected to the analog ground plane, as shown in
Figure 6-11. Following these steps will reduce the
amount of digital noise from the rest of the board being
coupled into the A/D Converter.
VDD
MCP3302/04
Analog Side
-Sample Cap
-Capacitor Array
-Comparator
Digital Side
-SPI Interface
-Shift Register
-Control Logic
Substrate
5 - 10 Ω
DGND
AGND
0.1 µF
Analog Ground Plane
FIGURE 6-11:
Separation of Analog and
Digital Ground Pins.
 2002 Microchip Technology Inc.
DS21697B-page 21
MCP3302/04
7.0
SERIAL COMMUNICATIONS
7.1
Output Code Format
TABLE 7-1:
The output code format is a binary two’s complement
scheme, with a leading sign bit that indicates the sign
of the output. If the IN+ input is higher than the INinput, the sign bit will be a zero. If the IN- input is higher,
the sign bit will be a ‘1’.
BINARY TWO’S
COMPLEMENT OUTPUT
CODE EXAMPLES.
Analog Input Levels
The diagram shown in Figure 7-1 shows the output
code transfer function. In this diagram, the horizontal
axis is the analog input voltage and the vertical axis is
the output code of the ADC. It shows that when IN+ is
equal to IN-, both the sign bit and the data word is zero.
As IN+ gets larger with respect to IN-, the sign bit is a
zero and the data word gets larger. The full scale output
code is reached at +4095 when the input [(IN+) - (IN-)]
reaches VREF - 1 LSB. When IN- is larger than IN+, the
two’s complement output codes will be seen with the
sign bit being a one. Some examples of analog input
levels and corresponding output codes are shown in
Table 7-1.
Sign
Bit
Binary Data
Decimal
DATA
Full Scale Positive
(IN+)-(IN-)=VREF-1 LSB
0
1111 1111 1111
+4095
(IN+)-(IN-) = VREF-2 LSB
0
1111 1111 1110
+4094
IN+ = (IN-) +2 LSB
0
0000 0000 0010
+2
IN+ = (IN-) +1 LSB
0
0000 0000 0001
+1
IN+ = IN-
0
0000 0000 0000
0
IN+ = (IN-) - 1 LSB
1
1111 1111 1111
-1
IN+ = (IN-) - 2 LSB
1
1111 1111 1110
-2
(IN+)-(IN-) = VREF-2 LSB
1
0000 0000 0001
-4095
Full Scale Negative
(IN+)-(IN-) = VREF-1 LSB
1
0000 0000 0000
-4096
Output
Code
Positive Full
Scale Output = VREF -1 LSB
0 + 1111 1111 1111 (+4095)
0 + 1111 1111 1110 (+4094)
0 + 0000 0000 0011 (+3)
0 + 0000 0000 0010 (+2)
0 + 0000 0000 0001 (+1)
IN+ > IN-
0 + 0000 0000 0000 (0)
IN+ < IN-
-VREF
1 + 1111 1111 1111 (-1)
1 + 1111 1111 1110 (-2)
Analog Input
Voltage
IN+ - IN-
VREF
1 + 1111 1111 1101 (-3)
1 + 0000 0000 0001 (-4095)
Negative Full
Scale Output = -VREF
FIGURE 7-1:
DS21697B-page 22
1 + 0000 0000 0000 (-4096)
Output Code Transfer Function.
 2002 Microchip Technology Inc.
MCP3302/04
7.2
Communicating with the MCP3302
and MCP3304
Communication with the MCP3302/04 devices is done
using a standard SPI-compatible serial interface. Initiating communication with either device is done by
bringing the CS line low (see Figure 7-2). If the device
was powered up with the CS pin low, it must be brought
high and back low to initiate communication. The first
clock received with CS low and DIN high will constitute
a start bit. The SGL/DIFF bit follows the start bit and will
determine if the conversion will be done using single
ended or differential input mode. Each channel in
single ended mode will operate as a 12-bit converter
with a unipolar output. No negative codes will be output
in single ended mode. The next three bits (D0, D1 and
D2) are used to select the input channel configuration.
Table 7-2 and Table 7-3 show the configuration bits for
the MCP3302 and MCP3304, respectively. The device
will begin to sample the analog input on the fourth rising
edge of the clock after the start bit has been received.
The sample period will end on the falling edge of the
fifth clock following the start bit.
After the D0 bit is input, one more clock is required to
complete the sample and hold period (D IN is a “don’t
care” for this clock). On the falling edge of the next
clock, the device will output a low null bit. The next 13
clocks will output the result of the conversion with the
sign bit first, followed by the 12 remaining data bits, as
shown in Figure 7-2. Note that if the device is operating
in the single ended mode, the sign bit will always be
transmitted as a ‘0’. Data is always output from the
device on the falling edge of the clock. If all 13 data bits
have been transmitted, and the device continues to
receive clocks while the CS is held low, the device will
output the conversion result, LSB, first, as shown in
Figure 7-3. If more clocks are provided to the device
while CS is still low (after the LSB first data has been
transmitted), the device will clock out zeros indefinitely.
If necessary, it is possible to bring CS low and clock in
leading zeros on the DIN line before the start bit. This is
often done when dealing with microcontroller-based
SPI ports that must send 8 bits at a time. Refer to
Section 7.3 for more details on using the MCP3302/04
devices with hardware SPI ports
 2002 Microchip Technology Inc.
TABLE 7-2:
CONFIGURATION BITS FOR
THE MCP3302
Control Bit
Selections
Single
D2* D1
/Diff
D0
Input
Configuration
Channel
Selection
1
X
0
0
single ended
CH0
1
X
0
1
single ended
CH1
1
X
1
0
single ended
CH2
1
X
1
1
single ended
CH3
0
X
0
0
differential
CH0 = IN+
CH1 = IN-
0
X
0
1
differential
CH0 = INCH1 = IN+
0
X
1
0
differential
CH2 = IN+
CH3 = IN-
0
X
1
1
differential
CH2 = INCH3 = IN+
*D2 is don’t care for MCP3302
TABLE 7-3:
CONFIGURATION BITS FOR
THE MCP3304
Control Bit
Selections
Input
Configuration
Channel
Selection
0
single ended
CH0
1
single ended
CH1
1
0
single ended
CH2
0
1
1
single ended
CH3
1
0
0
single ended
CH4
1
1
0
1
single ended
CH5
1
1
1
0
single ended
CH6
1
1
1
1
single ended
CH7
0
0
0
0
differential
CH0 = IN+
CH1 = IN-
0
0
0
1
differential
CH0 = INCH1 = IN+
0
0
1
0
differential
CH2 = IN+
CH3 = IN-
0
0
1
1
differential
CH2 = INCH3 = IN+
0
1
0
0
differential
CH4 = IN+
CH5 = IN-
0
1
0
1
differential
CH4 = INCH5 = IN+
0
1
1
0
differential
CH6 = IN+
CH7 = IN-
0
1
1
1
differential
CH6 = INCH7 = IN+
SinglE
/Diff
D2
1
0
0
1
0
0
1
0
1
1
D1 D0
DS21697B-page 23
MCP3302/04
TSAMPLE
TSAMPLE
TCSH
CS
TSUCS
CLK
Start SGL/
DIFF D2 D1 D0
DIN
HI-Z
DOUT
Start SGL/
DIFF
Don’t Care
Null SB† B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 *
Bit
TCONV
TACQ
D2
HI-Z
TDATA **
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output LSB
first data, followed by zeros indefinitely. See Figure 7-3 below.
** TDATA: during this time, the bias current and the comparator power down while the reference input becomes
a high impedance node, leaving the CLK running to clock out the LSB-first data or zeros.
†
When operating in single ended mode, the sign bit will always be transmitted as a ‘0’.
FIGURE 7-2:
Communication with MCP3302/04 (MSB first Format).
TSAMPLE
TCSH
CS
TSUCS
Power Down
CLK
Start
DIN
D2 D1 D0
Don’t Care
SGL/
DIFF
DOUT
HI-Z
Null
Bit SB† B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 B1 B2 B3 B4 B5 B6 B7 B8 B9 B10 B11 SB*
HI-Z
(MSB)
TACQ
TCONV
TDATA **
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros
indefinitely.
** TDATA: During this time, the bias circuit and the comparator power down while the reference input becomes
a high impedance node, leaving the CLK running to clock out LSB first data or zeroes.
†
When operating in single ended mode, the sign bit will always be transmitted as a ‘0’.
FIGURE 7-3:
DS21697B-page 24
Communication with MCP3302/04 (LSB first Format).
 2002 Microchip Technology Inc.
MCP3302/04
7.3
Using the MCP3302/04 with
Microcontroller (MCU) SPI Ports
With most microcontroller SPI ports, it is required to
send groups of eight bits. It is also required that the
microcontroller SPI port be configured to clock out data
on the falling edge of clock and latch data in on the rising edge. Because communication with the MCP3302
and MCP3304 devices may not need multiples of eight
clocks, it will be necessary to provide more clocks than
are required. This is usually done by sending ‘leading
zeros’ before the start bit. For example, Figure 7-4 and
Figure 7-5 show how the MCP3302/04 devices can be
interfaced to a MCU with a hardware SPI port.
Figure 7-4 depicts the operation shown in SPI Mode
0,0, which requires that the SCLK from the MCU idles
in the ‘low’ state, while Figure 7-5 shows the similar
case of SPI Mode 1,1, where the clock idles in the ‘high’
state.
As shown in Figure 7-4, the first byte transmitted to the
A/D Converter contains 6 leading zeros before the start
bit. Arranging the leading zeros this way produces the
13 data bits to fall in positions easily manipulated by the
MCU. The sign bit is clocked out of the A/D Converter
on the falling edge of clock number 11, followed by the
remaining data bits (MSB first). After the second eight
clocks have been sent to the device, the MCU receive
buffer will contain 2 unknown bits (the output is at high
impedance for the first two clocks), the null bit, the sign
bit and the 4 highest order bits of the conversion. After
the third byte has been sent to the device, the receive
register will contain the lowest order eight bits of the
conversion results. Easier manipulation of the converted data can be obtained by using this method.
Figure 7-5 shows the same situation in SPI Mode 1,1,
which requires that the clock idles in the high state. As
with mode 0,0, the A/D Converter outputs data on the
falling edge of the clock and the MCU latches data from
the A/D Converter in on the rising edge of the clock.
 2002 Microchip Technology Inc.
DS21697B-page 25
MCP3302/04
CS
MCU latches data from A/D Converter
on rising edges of SCLK
SCLK
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
B4
B3
B2
B1
B0
Data is clocked out of
A/D Converter on falling edges
Start SGL/
DIFF D2
DIN
0
?
0
?
NULL
SB
BIT
0
?
0
1
?
?
SGL/
DIFF
?
D2
?
D1
?
DO
B11 B10 B9
B8
X
X
X
X
X
X
0 SB B11 B10 B9
? (Null)
?
Data stored into MCU receive register
after transmission of first 8 bits
FIGURE 7-4:
idles low).
CS
Don’t Care
B7
B6
B5
X
X
Start
Bit
MCU Transmitted Data
(Aligned with falling
edge of clock)
? = Unknown Bits
X = Don’t Care Bits
D0
HI-Z
DOUT
MCU Received Data
(Aligned with rising
edge of clock)
D1
X
B8
B7
Data stored into MCU receive register
after transmission of second 8 bits
B6
X
B5
X
B4
X
B3
X
B2
X
B1
X
B0
Data stored into MCU receive register
after transmission of last 8 bits
SPI Communication with the MCP3302/04 using 8-bit segments (Mode 0,0: SCLK
MCU latches data from A/D Converter
on rising edges of SCLK
1
SCLK
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
Data is clocked out of
A/D Converter on falling edges
Start
DIN
? = Unknown Bits
X = Don’t Care Bits
FIGURE 7-5:
idles high).
DS21697B-page 26
D2
D1
Don’tCare
Care
Don’t
D0
HI-Z
DOUT
MCU Transmitted Data
(Aligned with falling
edge of clock)
MCU Received Data
(Aligned with rising
edge of clock)
SGL/
DIFF
NULL
SB B11 B10 B9
BIT
B8
B7
B6
B5
B4
B3
B2
B1
B0
X
X
X
X
X
X
X
X
Start
Bit
0
0
?
0
?
0
?
SGL/
DIFF
1
?
?
?
D2
D1
?
DO
?
Data stored into MCU receive register
after transmission of first 8 bits
X
X
?
?
X
0
(Null)
X
X
X
SB B11 B10 B9
X
B8
Data stored into MCU receive register
after transmission of second 8 bits
B7
B6
B5
B4
B3
B2
B1
B0
Data stored into MCU receive register
after transmission of last 8 bits
SPI Communication with the MCP3302/04 using 8-bit segments (Mode 1,1: SCLK
 2002 Microchip Technology Inc.
MCP3302/04
8.0
PACKAGING INFORMATION
8.1
Package Marking Information
14-Lead PDIP (300 mil)
Example:
MCP3302-B
I/P
0125NNN
XXXXXXXXXXXXXX
XXXXXXXXXXXXXX
YYWWNNN
14-Lead SOIC (150 mil)
Example:
MCP3302-B
XXXXXXXXXXX
0YWWNNN
XXXXXXXXXXX
XXXXXXXXXXX
YYWWNNN
14-Lead TSSOP (4.4mm) †
Example:
XXXXXXXX
3302-C
YYWW
IYWW
NNN
NNN
†Please contact Microchip Factory for B-Grade TSSOP devices
Legend: XX...X
YY
WW
NNN
Customer specific information*
Year code (last 2 digits of calendar year)
Week code (week of January 1 is week ‘01’)
Alphanumeric traceability code
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line thus limiting the number of available characters
for customer specific information.
* Standard marking consists of Microchip part number, year code, week code, traceability code (facility code,
mask rev#, and assembly code). For marking beyond this, certain price adders apply. Please check with your
Microchip Sales Office.
 2002 Microchip Technology Inc.
DS21697B-page 27
MCP3302/04
Package Marking Information (Continued)
16-Lead PDIP (300 mil) (MCP3304)
Example:
MCP3304-B
I/P
YYWWNNN
XXXXXXXXXXXXXX
XXXXXXXXXXXXXX
YYWWNNN
16-Lead SOIC (150 mil) (MCP3304)
Example:
XXXXXXXXXXXXX
XXXXXXXXXXXXX
YYWWNNN
Legend: XX...X
YY
WW
NNN
MCP3304-B
XXXXXXXXXX
IYWWNNN
Customer specific information*
Year code (last 2 digits of calendar year)
Week code (week of January 1 is week ‘01’)
Alphanumeric traceability code
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line thus limiting the number of available characters
for customer specific information.
* Standard marking consists of Microchip part number, year code, week code, traceability code (facility code,
mask rev#, and assembly code). For marking beyond this, certain price adders apply. Please check with your
Microchip Sales Office.
DS21697B-page 28
 2002 Microchip Technology Inc.
MCP3302/04
14-Lead Plastic Dual In-line (P) – 300 mil (PDIP)
E1
D
2
n
1
α
E
A2
A
L
c
A1
β
eB
B1
p
B
Units
Dimension Limits
n
p
MIN
INCHES*
NOM
14
.100
.155
.130
MAX
MILLIMETERS
NOM
14
2.54
3.56
3.94
2.92
3.30
0.38
7.62
7.94
6.10
6.35
18.80
19.05
3.18
3.30
0.20
0.29
1.14
1.46
0.36
0.46
7.87
9.40
5
10
5
10
MIN
Number of Pins
Pitch
Top to Seating Plane
A
.140
.170
Molded Package Thickness
A2
.115
.145
Base to Seating Plane
A1
.015
Shoulder to Shoulder Width
E
.300
.313
.325
Molded Package Width
E1
.240
.250
.260
Overall Length
D
.740
.750
.760
Tip to Seating Plane
L
.125
.130
.135
c
Lead Thickness
.008
.012
.015
Upper Lead Width
B1
.045
.058
.070
Lower Lead Width
B
.014
.018
.022
Overall Row Spacing
§
eB
.310
.370
.430
α
Mold Draft Angle Top
5
10
15
β
Mold Draft Angle Bottom
5
10
15
* Controlling Parameter
§ Significant Characteristic
Notes:
Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed
.010” (0.254mm) per side.
JEDEC Equivalent: MS-001
Drawing No. C04-005
 2002 Microchip Technology Inc.
MAX
4.32
3.68
8.26
6.60
19.30
3.43
0.38
1.78
0.56
10.92
15
15
DS21697B-page 29
MCP3302/04
14-Lead Plastic Small Outline (SL) – Narrow, 150 mil (SOIC)
E
E1
p
D
2
B
n
1
α
h
45°
c
A2
A
φ
A1
L
β
Units
Dimension Limits
n
p
Number of Pins
Pitch
Overall Height
Molded Package Thickness
Standoff §
Overall Width
Molded Package Width
Overall Length
Chamfer Distance
Foot Length
Foot Angle
Lead Thickness
Lead Width
Mold Draft Angle Top
Mold Draft Angle Bottom
* Controlling Parameter
§ Significant Characteristic
A
A2
A1
E
E1
D
h
L
φ
c
B
α
β
MIN
.053
.052
.004
.228
.150
.337
.010
.016
0
.008
.014
0
0
INCHES*
NOM
14
.050
.061
.056
.007
.236
.154
.342
.015
.033
4
.009
.017
12
12
MAX
.069
.061
.010
.244
.157
.347
.020
.050
8
.010
.020
15
15
MILLIMETERS
NOM
14
1.27
1.35
1.55
1.32
1.42
0.10
0.18
5.79
5.99
3.81
3.90
8.56
8.69
0.25
0.38
0.41
0.84
0
4
0.20
0.23
0.36
0.42
0
12
0
12
MIN
MAX
1.75
1.55
0.25
6.20
3.99
8.81
0.51
1.27
8
0.25
0.51
15
15
Notes:
Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed
.010” (0.254mm) per side.
JEDEC Equivalent: MS-012
Drawing No. C04-065
DS21697B-page 30
 2002 Microchip Technology Inc.
MCP3302/04
14-Lead Plastic Thin Shrink Small Outline (ST) – 4.4 mm (TSSOP)
E
E1
p
D
2
1
n
B
α
A
c
φ
β
A1
L
Units
Dimension Limits
n
p
Number of Pins
Pitch
Overall Height
Molded Package Thickness
Standoff §
Overall Width
Molded Package Width
Molded Package Length
Foot Length
Foot Angle
Lead Thickness
Lead Width
Mold Draft Angle Top
Mold Draft Angle Bottom
* Controlling Parameter
§ Significant Characteristic
A
A2
A1
E
E1
D
L
φ
c
B1
α
β
MIN
.033
.002
.246
.169
.193
.020
0
.004
.007
0
0
INCHES
NOM
14
.026
.035
.004
.251
.173
.197
.024
4
.006
.010
5
5
A2
MAX
.043
.037
.006
.256
.177
.201
.028
8
.008
.012
10
10
MILLIMETERS*
NOM
MAX
14
0.65
1.10
0.85
0.90
0.95
0.05
0.10
0.15
6.25
6.38
6.50
4.30
4.40
4.50
4.90
5.00
5.10
0.50
0.60
0.70
0
4
8
0.09
0.15
0.20
0.19
0.25
0.30
0
5
10
0
5
10
MIN
Notes:
Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed
.005” (0.127mm) per side.
JEDEC Equivalent: MO-153
Drawing No. C04-087
 2002 Microchip Technology Inc.
DS21697B-page 31
MCP3302/04
16-Lead Plastic Dual In-line (P) – 300 mil (PDIP)
E1
D
2
α
1
n
E
A2
A
L
c
A1
β
B1
eB
p
B
Units
Dimension Limits
n
p
INCHES*
NOM
16
.100
.140
.155
.115
.130
.015
.300
.313
.240
.250
.740
.750
.125
.130
.008
.012
.045
.058
.014
.018
.310
.370
5
10
5
10
MIN
MAX
MILLIMETERS
NOM
16
2.54
3.56
3.94
2.92
3.30
0.38
7.62
7.94
6.10
6.35
18.80
19.05
3.18
3.30
0.20
0.29
1.14
1.46
.036
0.46
7.87
9.40
5
10
5
10
MIN
Number of Pins
Pitch
Top to Seating Plane
A
.170
Molded Package Thickness
A2
.145
Base to Seating Plane
A1
Shoulder to Shoulder Width
E
.325
Molded Package Width
E1
.260
Overall Length
D
.760
Tip to Seating Plane
L
.135
c
Lead Thickness
.015
Upper Lead Width
B1
.070
Lower Lead Width
B
.022
Overall Row Spacing
§
eB
.430
α
Mold Draft Angle Top
15
β
Mold Draft Angle Bottom
15
* Controlling Parameter
§ Significant Characteristic
Notes:
Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed
.010” (0.254mm) per side.
JEDEC Equivalent: MS-001
Drawing No. C04-017
DS21697B-page 32
MAX
4.32
3.68
8.26
6.60
19.30
3.43
0.38
1.78
0.56
10.92
15
15
 2002 Microchip Technology Inc.
MCP3302/04
16-Lead Plastic Small Outline (SL) – Narrow 150 mil (SOIC)
E
E1
p
D
2
B
n
1
α
h
45°
c
A2
A
φ
L
A1
β
Units
Dimension Limits
n
p
Number of Pins
Pitch
Overall Height
Molded Package Thickness
Standoff §
Overall Width
Molded Package Width
Overall Length
Chamfer Distance
Foot Length
Foot Angle
Lead Thickness
Lead Width
Mold Draft Angle Top
Mold Draft Angle Bottom
* Controlling Parameter
§ Significant Characteristic
A
A2
A1
E
E1
D
h
L
φ
c
B
α
β
INCHES*
NOM
16
.050
.053
.061
.052
.057
.004
.007
.228
.237
.150
.154
.386
.390
.010
.015
.016
.033
0
4
.008
.009
.013
.017
0
12
0
12
MIN
MAX
.069
.061
.010
.244
.157
.394
.020
.050
8
.010
.020
15
15
MILLIMETERS
NOM
16
1.27
1.35
1.55
1.32
1.44
0.10
0.18
5.79
6.02
3.81
3.90
9.80
9.91
0.25
0.38
0.41
0.84
0
4
0.20
0.23
0.33
0.42
0
12
0
12
MIN
MAX
1.75
1.55
0.25
6.20
3.99
10.01
0.51
1.27
8
0.25
0.51
15
15
Notes:
Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed
.010” (0.254mm) per side.
JEDEC Equivalent: MS-012
Drawing No. C04-108
 2002 Microchip Technology Inc.
DS21697B-page 33
MCP3302/04
NOTES:
DS21697B-page 34
 2002 Microchip Technology Inc.
MCP3302/04
ON-LINE SUPPORT
Microchip provides on-line support on the Microchip
World Wide Web (WWW) site.
The web site is used by Microchip as a means to make
files and information easily available to customers. To
view the site, the user must have access to the Internet
and a web browser, such as Netscape or Microsoft
Explorer. Files are also available for FTP download
from our FTP site.
Connecting to the Microchip Internet Web Site
Systems Information and Upgrade Hot Line
The Systems Information and Upgrade Line provides
system users a listing of the latest versions of all of
Microchip's development systems software products.
Plus, this line provides information on how customers
can receive any currently available upgrade kits.The
Hot Line Numbers are:
1-800-755-2345 for U.S. and most of Canada, and
1-480-792-7302 for the rest of the world.
013001
The Microchip web site is available by using your
favorite Internet browser to attach to:
www.microchip.com
The file transfer site is available by using an FTP service to connect to:
ftp://ftp.microchip.com
The web site and file transfer site provide a variety of
services. Users may download files for the latest
Development Tools, Data Sheets, Application Notes,
User's Guides, Articles and Sample Programs. A variety of Microchip specific business information is also
available, including listings of Microchip sales offices,
distributors and factory representatives. Other data
available for consideration is:
• Latest Microchip Press Releases
• Technical Support Section with Frequently Asked
Questions
• Design Tips
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• Job Postings
• Microchip Consultant Program Member Listing
• Links to other useful web sites related to
Microchip Products
• Conferences for products, Development Systems,
technical information and more
• Listing of seminars and events
 2002 Microchip Technology Inc.
DS21697B-page 35
MCP3302/04
READER RESPONSE
It is our intention to provide you with the best documentation possible to ensure successful use of your Microchip product. If you wish to provide your comments on organization, clarity, subject matter, and ways in which our documentation
can better serve you, please FAX your comments to the Technical Publications Manager at (480) 792-4150.
Please list the following information, and use this outline to provide us with your comments about this Data Sheet.
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Total Pages Sent
From: Name
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Address
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Telephone: (_______) _________ - _________
FAX: (______) _________ - _________
Application (optional):
Would you like a reply?
Device: MCP3302/04
Y
N
Literature Number: DS21697B
Questions:
1. What are the best features of this document?
2. How does this document meet your hardware and software development needs?
3. Do you find the organization of this data sheet easy to follow? If not, why?
4. What additions to the data sheet do you think would enhance the structure and subject?
5. What deletions from the data sheet could be made without affecting the overall usefulness?
6. Is there any incorrect or misleading information (what and where)?
7. How would you improve this document?
8. How would you improve our software, systems, and silicon products?
DS21697B-page 36
 2002 Microchip Technology Inc.
MCP3302/04
PRODUCT IDENTIFICATION SYSTEM
To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.
PART NO.
X
X
/XX
Device
Grade
Temperature
Range
Package
Device:
MCP3302:
MCP3302T:
MCP3304:
MCP3304T:
13-Bit Serial A/D Converter
13-Bit Serial A/D Converter (Tape and Reel)
13-Bit Serial A/D Converter
13-Bit Serial A/D Converter (Tape and Reel)
Grade:
B
C
= ±1 LSB INL
= ±2 LSB INL
Temperature Range:
I
=
Package:
P
SL
ST
= Plastic DIP (300 mil Body), 14-lead, 16-lead
= Plastic SOIC (150 mil Body), 14-lead, 16-lead
= Plastic TSSOP (4.4mm), 14-lead
Examples:
a)
MCP3302-BI/P: ±1 LSB INL, Industrial Temperature, PDIP package
b)
MCP3302-BI/SL: ±1 LSB INL, Industrial
Temperature, SOIC package
c)
MCP3302-CI/ST: ±2 LSB INL, Industrial
Temperature, TSSOP package
a)
MCP3304-BI/P: ±1 LSB INL, Industrial
Temperature, PDIP package
b)
MCP3304-BI/SL: ±1 LSB INL, Industrial
Temperature, SOIC package
-40°C to +85°C
Sales and Support
Data Sheets
Products supported by a preliminary Data Sheet may have an errata sheet describing minor operational differences and recommended workarounds. To determine if an errata sheet exists for a particular device, please contact one of the following:
1.
2.
3.
Your local Microchip sales office
The Microchip Corporate Literature Center U.S. FAX: (480) 792-7277
The Microchip Worldwide Site (www.microchip.com)
Please specify which device, revision of silicon and Data Sheet (include Literature #) you are using.
New Customer Notification System
Register on our web site (www.microchip.com/cn) to receive the most current information on our products.
 2002 Microchip Technology Inc.
DS21697B-page37
MCP3302/04
NOTES:
DS21697B-page 38
 2002 Microchip Technology Inc.
MCP3302/04
Information contained in this publication regarding device
applications and the like is intended through suggestion only
and may be superseded by updates. It is your responsibility to
ensure that your application meets with your specifications.
No representation or warranty is given and no liability is
assumed by Microchip Technology Incorporated with respect
to the accuracy or use of such information, or infringement of
patents or other intellectual property rights arising from such
use or otherwise. Use of Microchip’s products as critical components in life support systems is not authorized except with
express written approval by Microchip. No licenses are conveyed, implicitly or otherwise, under any intellectual property
rights.
Trademarks
The Microchip name and logo, the Microchip logo, FilterLab,
KEELOQ, microID, MPLAB, PIC, PICmicro, PICMASTER,
PICSTART, PRO MATE, SEEVAL and The Embedded Control
Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.
dsPIC, ECONOMONITOR, FanSense, FlexROM, fuzzyLAB,
In-Circuit Serial Programming, ICSP, ICEPIC, microPort,
Migratable Memory, MPASM, MPLIB, MPLINK, MPSIM,
MXDEV, PICC, PICDEM, PICDEM.net, rfPIC, Select Mode
and Total Endurance are trademarks of Microchip Technology
Incorporated in the U.S.A.
Serialized Quick Turn Programming (SQTP) is a service mark
of Microchip Technology Incorporated in the U.S.A.
All other trademarks mentioned herein are property of their
respective companies.
© 2002, Microchip Technology Incorporated, Printed in the
U.S.A., All Rights Reserved.
Printed on recycled paper.
Microchip received QS-9000 quality system
certification for its worldwide headquarters,
design and wafer fabrication facilities in
Chandler and Tempe, Arizona in July 1999
and Mountain View, California in March 2002.
The Company’s quality system processes and
procedures are QS-9000 compliant for its
PICmicro ® 8-bit MCUs, KEELOQ® code hopping
devices, Serial EEPROMs, microperipherals,
non-volatile memory and analog products. In
addition, Microchip’s quality system for the
design and manufacture of development
systems is ISO 9001 certified.
 2002 Microchip Technology Inc.
DS21697B-page 39
M
WORLDWIDE SALES AND SERVICE
AMERICAS
ASIA/PACIFIC
Corporate Office
Australia
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Rocky Mountain
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United Kingdom
Microchip Ltd.
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Tel: 44 118 921 5869 Fax: 44-118 921-5820
Austria
Microchip Technology Austria GmbH
Durisolstrasse 2
A-4600 Wels
Austria
Tel: 43-7242-2244-399
Fax: 43-7242-2244-393
05/16/02
DS21697B-page 40
 2002 Microchip Technology Inc.
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