YAGEO CC0100JRX7R4BB121 Surface-mount ceramic multilayer capacitor Datasheet

DATA SHEET
SURFACE-MOUNT CERAMIC
MULTILAYER CAPACITORS
01005
NP0/X5R/X7R
4 V TO 16 V
0.5 pF to 220 nF
Product Specification – January 18, 2017 V.9
RoHS compliant & Halogen Free
Product specification
Surface-Mount Ceramic Multilayer Capacitors
01005
NP0/X5RX7R
6.3V to 16V
SCOPE
ORDERING INFORMATION - GLOBAL PART NUMBER, PHYCOMP
This specification describes
01005 NP0/X5R series chip
capacitors with lead-free
terminations.
CTC & 12NC
APPLICATIONS
 Mobile
 Module
GLOBAL PART NUMBER (PREFERRED )
2
11
All part numbers are identified by the series, size, tolerance, TC material,
packing style, voltage, process code, termination and capacitance value.
YAGEO BRAND ordering code
CC
XXXX X X XXX X
(1)
(2) (3)
(4) (5)
B
X XXX
(6) (7)
(1) SIZE – INCH BASED (METRIC)
FEATURES
 Supplied in tape on reel
 Nickel-barrier end termination
 RoHS compliant
 Halogen Free compliant
0100(0402)
(2) TOLERANCE
B = ± 0.1pF
C = ± 0.25pF
D = ± 0.5pF
J = ± 5%
K = ± 10%
M = ± 20%
(3) PACKING STYLE
R = Paper/PE taping reel; Reel 7 inch
(4) TC MATERIAL
NPO
X5R
X7R
(5) RATED VOLTAGE
4= 4 V
5 = 6.3 V
6 = 10 V
7 = 16 V
(6) PROCESS
N = NP0
B = Class 2 MLCC
(7) CAPACITANCE VALUE
2 significant digits+number of zeros
The 3rd digit signifies the multiplying factor, and letter R is decimal point
Example: 121 = 12 x 101 = 120 pF
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Jan. 18, 2017 V.9
Product specification
Surface-Mount Ceramic Multilayer Capacitors
01005
NP0/X5RX7R
6.3V to 16V
3
11
CONSTRUCTION
The capacitor consists of a
rectangular block of ceramic
dielectric in which a number of
interleaved metal electrodes are
contained. This structure gives
rise to a high capacitance per
unit volume.
The inner electrodes are
connected to the two end
terminations and finally covered
with a layer of plated tin (NiSn).
The terminations are lead-free. A
cross section of the structure is
shown in Fig.1.
Fig. 1 Surface mounted multilayer ceramic capacitor construction
DIMENSION
Table 1 For outlines see fig. 2
TYPE
L1 (mm)
W (mm)
01005
0.4 ± 0.02
0.2 ± 0.02
OUTLINES
T (mm)
0.2 ± 0.02
L2 / L3 (mm)
L4 (mm)
min.
max.
min.
0.07
0.14
0.13
For dimension see Table 1
Fig. 2 Surface mounted multilayer
ceramic capacitor dimension
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Jan. 18, 2017 V.9
Product specification
Surface-Mount Ceramic Multilayer Capacitors
CAPACITANCE RANGE & THICKNESS
Table 2 01005 Sizes
NP0
CAP.
CAP.
10V / 16 V
01005
X5R
NP0/X5RX7R
6.3V
10V
4
11
X7R
CAP.
4V
6.3V to 16V
6.3V / 10V
16V
0.5 pF
0.2±0.02
100 pF
0.2±0.02
0.2±0.02
0.2±0.02
100 pF
0.2±0.02
0.2±0.02
0.6 pF
0.2±0.02
150 pF
0.2±0.02
0.2±0.02
0.2±0.02
150 pF
0.2±0.02
0.2±0.02
0.7 pF
0.2±0.02
220 pF
0.2±0.02
0.2±0.02
0.2±0.02
220 pF
0.2±0.02
0.2±0.02
0.75 pF
0.2±0.02
330 pF
0.2±0.02
0.2±0.02
0.2±0.02
330 pF
0.2±0.02
0.2±0.02
0.8 pF
0.2±0.02
470 pF
0.2±0.02
0.2±0.02
0.2±0.02
470 pF
0.2±0.02
0.2±0.02
0.9 pF
0.2±0.02
680 pF
0.2±0.02
0.2±0.02
0.2±0.02
680 pF
0.2±0.02
0.2±0.02
1.0 pF
0.2±0.02
1 000 pF
0.2±0.02
0.2±0.02
0.2±0.02
1 000 pF
0.2±0.02
0.2±0.02
1.2 pF
0.2±0.02
2.2 nF
0.2±0.02
0.2±0.02
0.2±0.02
2.2 nF
1.5 pF
0.2±0.02
4.7 nF
0.2±0.02
0.2±0.02
0.2±0.02
4.7 nF
1.8 pF
0.2±0.02
10 nF
0.2±0.02
0.2±0.02
0.2±0.02
10 nF
2.2 pF
0.2±0.02
22nF
0.2±0.02
0.2±0.02
22nF
2.7 pF
0.2±0.02
47 nF
0.2±0.02
0.2±0.02
47 nF
3.3 pF
0.2±0.02
100 nF
0.2±0.02
0.2±0.02
100 nF
3.9 pF
0.2±0.02
220 nF
0.2±0.02
0.2±0.02
220 nF
4.7 pF
0.2±0.02
Tape width
5.6 pF
0.2±0.02
6.8 pF
0.2±0.02
8.2 pF
0.2±0.02
10 pF
0.2±0.02
12 pF
0.2±0.02
15 pF
0.2±0.02
18 pF
0.2±0.02
22 pF
0.2±0.02
27 pF
0.2±0.02
33 pF
0.2±0.02
39 pF
0.2±0.02
47 pF
0.2±0.02
56 pF
0.2±0.02
68 pF
0.2±0.02
82 pF
0.2±0.02
100 pF
0.2±0.02
Tape width
8 mm
Tape width
8 mm
8 mm
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Jan. 18, 2017 V.9
Product specification
Surface-Mount Ceramic Multilayer Capacitors
01005
NP0/X5RX7R
5
11
6.3V to 16V
THICKNESS CLASSES AND PACKING QUANTITY
Table 3
Ø 180 MM / 7 INCH
Ø 330 MM / 13 INCH
SIZE
CODE
THICKNESS
CLASSIFICATION
TAPE WIDTH
QUANTITY PER REEL
Paper/PE
Blister
Paper/
Blister
QUANTITY
PER BULK CASE
01005
0.2 ± 0.02 mm
8 mm
20,000
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ELECTRICAL CHARACTERISTICS
NP0/X5R DIELECTRIC CAPACITORS; NISN TERMINATIONS
Unless otherwise specified, all test and measurements shall be made under standard atmospheric conditions
for testing as given in 5.3 of IEC 60068-1:
-
Temperature: 15 °C to 35 °C
Relative humidity: 25% to 75%
Air pressure: 86 kPa to 106 kPa
Before the measurements are made, the capacitor shall be stored at the measuring temperature for a time
sufficient to allow the entire capacitor to reach this temperature.
The period as prescribed for recovery at the end of a test is normally sufficient for this purpose.
Table 4
VALUE
DESCRIPTION
Capacitance range
0.5 pF to 220 nF
Capacitance tolerance
NP0
C< 10 pF
± 0.1pF, ± 0.25pF, ± 0.5pF
C ≥ 10 pF
± 5%, ± 10%
X5R / X7R
± 10%, ± 20%
Dissipation factor (D.F.)
NP0
C < 30 pF
≤ 1 / ( 400 + 20C )
C ≥ 30 pF
≤ 0.1 %
X5R / X7R
Insulation resistance after 1 minute at Ur (DC)
≤ 10 %
Rins ≥ 10 GΩ or Rins × C ≥ 500Ω · F whichever is less
X5R/X7R > 10nF:
Rins x C ≥ 50Ω· F
Maximum capacitance change as a function of temperature
(temperature characteristic/coefficient):
NP0
X5R / X7R
± 30 ppm/°C
± 15%
Operating temperature range:
NP0
–55 °C to +125 °C
X5R
–55 °C to +85 °C
X7R
–55 °C to +125 °C
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Jan. 18, 2017 V.9
Product specification
Surface-Mount Ceramic Multilayer Capacitors
01005
NP0/X5RX7R
6.3V to 16V
6
11
SOLDERING RECOMMENDATION
Table 5
SOLDERING
METHOD
Reflow
SIZE
01005
Reflow only
Reflow/Wave
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TESTS AND REQUIREMENTS
Table 6
Test procedures and requirements
TEST
TEST METHOD
PROCEDURE
REQUIREMENTS
Mounting
IEC 60384- 4.3
21/22
The capacitors may be mounted on printed-circuit boards or
ceramic substrates
No visible damage
Visual
Inspection and
Dimension
Check
4.4
Any applicable method using × 10 magnification
In accordance with specification
Capacitance
4.5.1
Class 1:
f = 1 MHz for C ≤ 1 nF, measuring at voltage 1 Vrms at 20 °C
f = 1 KHz for C > 1 nF, measuring at voltage 1 Vrms at 20 °C
Within specified tolerance
Class 2:
C ≤ 1 nF
f = 1 KHz, measuring at voltage 1 Vrms at 20 °C
Dissipation
Factor (D.F.)
4.5.2
C > 1 nF
f = 1 KHz, rated voltage ≤ 6.3 V, measuring at voltage 0.5 Vrms at
20 °C
f = 1 KHz, rated voltage > 10 V, measuring at voltage 1 Vrms at 20 °C
Class 1:
f = 1 MHz for C ≤ 1 nF , measuring at voltage 1 Vrms at 20 °C
f = 1 KHz for C > 1 nF, measuring at voltage 1 Vrms at 20 °C
In accordance with specification
Class 2:
C ≤ 1 nF
f = 1 KHz, measuring at voltage 1 Vrms at 20 °C
C > 1 nF
f = 1 KHz, rated voltage ≤ 6.3 V,
measuring at voltage 0.5 Vrms at 20 °C
f = 1 KHz, rated voltage > 10 V,
measuring at voltage 1 Vrms at 20 °C
Insulation
Resistance
4.5.3
At Ur (DC) for 1 minute
In accordance with specification
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Jan. 18, 2017 V.9
Product specification
Surface-Mount Ceramic Multilayer Capacitors
TEST
TEST METHOD
4.6
Temperature
coefficient
NP0/X5RX7R
01005
PROCEDURE
REQUIREMENTS
Capacitance shall be measured by the steps shown
in the following table.
∆C/C
The capacitance change should be measured after
5 min at each specified temperature stage.
Step
Temperature(℃)
a
25± 2
b
Lower temperature± 3℃
c
25± 2
d
Upper Temperature± 2℃
e
25± 2
(1) Class I
6.3V to 16V
7
11
Class1 (NP0):
± 30ppm
Class 2: (X7R/X5R):
± 15%
In case of applying voltage, the capacitance
change should be measured after 1 more min.
with applying
voltage in equilibration of each temp. stage.
CC0100MRX5R4(5)BB104(224):
0.2V± 0.1Vrms
Temperature Coefficient shall be calculated from
the formula as below
C2 - C1
106 [ppm/℃]
Temp, Coefficient =
C1 xΔT
C1: Capacitance at step c
C2: Capacitance at 125℃
∆T: 100℃(=125℃-25℃)
Measuring Voltage: 0.5 to 5 Vrms
(2) Class II
Capacitance Change shall be calculated from the
formula as below
∆C =
C2 - C1
x 100%
C1
C1: Capacitance at step c
C2: Capacitance at step b or d
Adhesion
Bending
Strength
IEC 6038421/22
4.7
A force applied for 10 seconds to the line joining
the terminations and in a plane parallel to the
substrate
Force
size 01005 : 1N
4.8
Mounting in accordance with IEC 60384-22
paragraph 4.3
No visible damage
Conditions: bending 1 mm at a rate of 1 mm/s,
radius jig 5 mm
∆C/C
Class 1 (NP0):
within ± 1% or 0.5 pF, whichever is greater
Class2 (X5R/X7R):
± 10%
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Jan. 18, 2017 V.9
8
Product specification
Surface-Mount Ceramic Multilayer Capacitors
TEST
TEST METHOD
4.9
Resistance to
Soldering
Heat
01005
NP0/X5RX7R
6.3V to 16V
11
PROCEDURE
REQUIREMENTS
Precondition: 150 +0/–10 °C for 1 hour,
then keep for 24 ± 1 hours at room
temperature
Dissolution of the end face plating shall not exceed
25% of the length of the edge concerned
Preheating: 120 °C to 150 °C for 1 minute
and 170 °C to 200 °C for 1 minute.
∆C/C
Class 1 (NP0):
within ± 0.5% or 0.5 pF, whichever is greater
Solder bath temperature: 260 ± 5 °C
Dipping time: 10 ± 0.5 seconds
Recovery time: 24 ± 2 hours
Class2 (X5R/X7R):
± 10%
D.F. within initial specified value
Rins within initial specified value
4.10
Solderability
Preheated the temperature of 80 °C to 140
°C and maintained for 30 seconds to 60
seconds.
The solder should cover over 95% of the critical area
of each termination
Test conditions for leadfree containing
solder alloy
Temperature: 245 ± 5 °C
Dipping time: 3 ± 0.3 seconds
Depth of immersion: 10 mm
Rapid Change
of
Temperature
IEC 6038421/22
4.11
Preconditioning;
150 +0/–10 °C for 1 hour, then keep for
24 ± 1 hours at room temperature
5 cycles with following detail:
30 minutes at lower category temperature
30 minutes at upper category temperature
Recovery time 24 ± 2 hours
No visual damage
∆C/C
Class 1 (NP0):
within ± 2.5% or 0.25 pF, whichever is greater
Class2 (X5R/X7R):
± 15%
D.F. meet initial specified value
Rins meet initial specified value
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Jan. 18, 2017 V.9
Product specification
Surface-Mount Ceramic Multilayer Capacitors
01005
NP0/X5RX7R
6.3V to 16V
TEST
TEST METHOD
PROCEDURE
REQUIREMENTS
Damp Heat
with
Ur load
1. Preconditioning, class 2 only:
No visual damage after recovery
4.13
150 +0/-10 °C /1 hour, then keep for
24 ± 1 hour at room temp
2. Initial measure:
Spec: refer initial spec C, D, IR
3. Damp heat test:
500 ± 12 hours at 40 ± 2 °C;
90 to 95% R.H; 1.0 Ur applied.
4. Recovery:
Class 1: 6 to 24 hours
Class 2: 24 ± 2 hours
5. Final measure: C, D, IR
P.S. If the capacitance value is less than the
minimum value permitted, then after the other
measurements have been made the capacitor shall
be precondition according to “IEC 60384 4.1” and
then the requirement shall be met.
9
11
Class 1 (NP0):
∆C/C
within ± 7.5% or 0.75 pF, whichever is greater
D.F.
≤ 2 x specified value
I.R.
≥ 2,500 MΩ or Rins x Cr ≥ 25Ω· F whichever
is less
Class2 (X5R/X7R):
C ≤ 1nF
∆C/C
± 15%
D.F.
≤ 10%
I.R.
≥ 500 MΩ
10nF ≥ C > 1nF
∆C/C
± 20%
D.F.
≤ 10%
I.R.
≥ 500 MΩ
C > 10nF
∆C/C
± 25%
D.F.
≤ 20%
I.R.
Rins x Cr ≥ 5Ω· F
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Jan. 18, 2017 V.9
Product specification
Surface-Mount Ceramic Multilayer Capacitors
01005
NP0/X5RX7R
TEST
TEST METHOD
PROCEDURE
REQUIREMENTS
Endurance
IEC 6038421/22
1. Preconditioning, class 2 only:
No visual damage
4.14
150 +0/-10 °C /1 hour, then keep for
24 ± 1 hour at room temp
2. Initial measure:
Spec: refer initial spec C, D, IR
3. Endurance test:
Temperature: NP0: 125 °C
Specified stress voltage applied for 1,000 hours:
Applied 2.0 x Ur for general product
Temperature: X5R: 85°C, X7R: 125°C
Specified stress voltage applied for 1,000 hours:
Applied 1.5 x Ur for general product
4. Recovery time: 24 ± 2 hours
5. Final measure: C, D, IR
P.S. If the capacitance value is less than the
minimum value permitted, then after the other
measurements have been made the capacitor shall
be precondition according to “IEC 60384 4.1” and
then the requirement shall be met.
6.3V to 16V
10
11
Class 1 (NP0):
∆C/C
within ± 3% or 0.3 pF, whichever is greater
D.F.
≤ 2 x specified value
I.R.
≥ 4,000 MΩ or Rins x Cr ≥ 40Ω· F whichever
is less
Class2 (X5R/X7R):
C ≤ 1nF
∆C/C
± 15%
D.F.
≤ 10%
I.R.
≥ 1GΩ
10nF ≥ C >1nF
∆C/C
± 15%
D.F.
≤ 10%
I.R.
≥ 1GΩ
C >10nF
∆C/C
± 25%
D.F.
≤ 20%
I.R.
Rins x Cr ≥ 10Ω· F
Voltage Proof
IEC 60384-1 4.5.4
Specified stress voltage applied for 1~5 seconds
No breakdown or flashover
Ur ≤ 100 V: series applied 2.5 Ur
Charge/Discharge current is less than 50 mA
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Jan. 18, 2017 V.9
Product specification
Surface-Mount Ceramic Multilayer Capacitors
01005
NP0/X5RX7R
6.3V to 16V
11
11
REVISION HISTORY
REVISION DATE
CHANGE NOTIFICATION
DESCRIPTION
Version 9
Jan. 17, 2017
- Test condition updated
Version 8
Jan. 12, 2016
- Capacitance range & thickness update
Version 7
Oct. 31, 2015
- Capacitance range & thickness update
Version 6
Jun. 29, 2015
- Test procedures and requirements
Version 5
Jun. 06, 2013
- Test procedures and requirements
Version 4
Mar. 27, 2013
- Change Tolerance
Version 3
Jan. 15, 2013
- Change Range
Version 2
Oct. 23, 2012
- Change Range
Version 1
July 03, 2012
- Change Range
Version 0
Apr 16, 2012
-
- New
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Jan. 18, 2017 V.9
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