Renesas ISL5829/2IN Dual 12-bit, 3.3v, 130/210msps, high speed d/a converter Datasheet

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ISL5829
DATASHEET
FN6020
Rev 1.00
Feb 2002
Dual 12-bit, +3.3V, 130/210+MSPS, High Speed D/A Converter
The ISL5829 is a dual 12-bit, 130/210+MSPS (Mega
Samples Per Second), CMOS, high speed, low power, D/A
(digital to analog) converter, designed specifically for use in
high performance communication systems such as base
transceiver stations utilizing 2.5G or 3G cellular protocols.
This device complements the ISL5x61 and ISL5x29 families
of high speed converters, which include 8-, 10-, 12-, and 14bit devices.
Features
• Speed Grades . . . . . . . . . . . . . . . . 130M and 210+MSPS
• Low Power . . . . . 233mW with 20mA Output at 130MSPS
• Adjustable Full Scale Output Current . . . . . 2mA to 20mA
• Guaranteed Gain Matching < 0.14dB
• +3.3V Power Supply
• 3V LVCMOS Compatible Inputs
Ordering Information
• Excellent Spurious Free Dynamic Range
(73dBc to Nyquist, f S = 130MSPS, fOUT = 10MHz)
TEMP.
RANGE
(oC)
PACKAGE
ISL5829IN
-40 to 85
48 Ld LQFP
Q48.7x7A 130MHz
• EDGE/GSM SFDR = 90dBc at 11MHz in 20MHz Window
ISL5829/2IN
-40 to 85
48 Ld LQFP
Q48.7x7A 210MHz
• Dual, 3.3V, Lower Power Replacement for AD9765
PART
NUMBER
ISL5829EVAL1
25
PKG. NO.
Evaluation Platform
CLOCK
SPEED
210MHz
• BWA Infrastructure
• Quadrature Transmit with IF Range 0–80MHz
QD3
• Medical/Test Instrumentation and Equipment
QD1
QD2
QD0 (LSB)
NC
NC
ID11 (MSB)
ID8
ID9
ID10
ID7
ID6
ISL5829
(LQFP)
TOP VIEW
• Wireless Communication Systems
ID5
1
48 47 46 45 44 43 42 41 40 39 38 37
36
QD4
ID4
2
35
QD5
ID3
ID2
3
34
QD6
4
33
ID1
5
32
(LSB) ID0
6
7
31
QD7
QD8
QD9
30
QD10
8
29
9
28
QD11 (MSB)
CLK
10
27
DGND
11
12
26
AGND
FN6020 Rev 1.00
Feb 2002
QCOMP
AVDD
NC
QOUTB
QOUTA
AGND
FSADJ
REFIO
25
13 14 15 16 17 18 19 20 21 22 23 24
AVDD
ICOMP
REFLO
AGND
IOUTA
IOUTB
SLEEP
DVDD
NC
NC
Applications
• Cellular Infrastructure - Single or Multi-Carrier: IS-136,
IS-95, GSM, EDGE, CDMA2000, WCDMA, TDS-CDMA
Pinout
NC
• UMTS Adjacent Channel Power = 70dB at 19.2MHz
Page 1 of 13
ISL5829
ID6
ID7
ID8
ID9
ID10
ID11 (MSB)
NC
NC
QD0 (LSB)
QD1
QD2
QD3
Typical Applications Circuit
SLEEP
DVPP
C1
0.1F
ICOMP
C2
0.1F
AVPP
48 47 46 45 44 43 42 41 40 39 38 37
36
1
35
2
34
3
33
4
32
5
31
6
30
7
29
8
CLK 28
9
DGND 27
10 DVDD
AGND 26
11 AGND
25
12
13 14 15 16 17 18 19 20 21 22 23 24
REFIO
REFLO
AGND
FSADJ
ID5
ID4
ID3
ID2
ID1
(LSB) ID0
NC
NC
AVDD
AVDD
C4
0.1F
QD4
QD5
QD6
QD7
QD8
QD9
QD10
QD11 (MSB)
R1
50
QCOMP
C3
0.1F
AVPP
C5
0.1F
C6
0.1F
RSET
1.91k
50
R3
R2
50
1:1 TRANSFORMER
(50)
REPRESENTS
ANY 50 LOAD
(50)
QOUT
IOUT
BEAD
FERRITE
+ C11
10F
L1
10H
DVPP (DIGITAL POWER PLANE) = +3.3V
C9
0.1F
C10
1F
C12
0.1F
C13
1F
+3.3V POWER SOURCE
FERRITE
BEAD
+ C14
10F
FN6020 Rev 1.00
Feb 2002
L2
10H
AVPP (ANALOG POWER PLANE) = +3.3V
Page 2 of 13
ISL5829
Functional Block Diagram
NC
QOUTA
NC
QOUTB
(LSB) QD0
QD1
QD2
INPUT
LATCH
CASCODE
QD3
38
QD4
SWITCH
MATRIX
38
CURRENT
SOURCE
QD5
QD6
7 LSBs
QD7
QD8
QD9
QD10
+
31 MSB
SEGMENTS
UPPER
5-BIT
DECODER
(MSB) QD11
QCOMP
SLEEP
INT/EXT
VOLTAGE
CLK
BIAS
GENERATION
REFERENCE
FSADJ
REFIO
REFLO
ICOMP
NC
NC
IOUTA
(LSB) ID0
ID1
ID2
IOUTB
INPUT
LATCH
CASCODE
ID3
38
ID4
SWITCH
MATRIX
38
CURRENT
SOURCE
ID5
ID6
7 LSBs
ID7
ID8
ID9
ID10
UPPER
5-BIT
+
31 MSB
SEGMENTS
DECODER
(MSB) ID11
FN6020 Rev 1.00
Feb 2002
Page 3 of 13
ISL5829
Pin Descriptions
PIN NO.
PIN NAME
11, 19, 26
AGND
Analog ground.
13, 24
AVDD
Analog supply (+2.7V to +3.6V).
28
CLK
Clock input.
27
DGND
Connect to digital ground.
10
DVDD
Digital supply (+2.7V to +3.6V).
20
FSADJ
Full scale current adjust. Use a resistor to ground to adjust full scale output current. Full scale output
current = 32 x VFSADJ/RSET.
14, 23
NC
12, 25
ICOMP, QCOMP
1-6, 29-40,
43-48
PIN DESCRIPTION
Not internally connected. Recommend no connect.
Compensation pin for internal bias generation. Each pin should be individually decoupled to AGND with
a 0.1F capacitor.
ID11-ID0, QD11-QD0 Digital data input ports. Bit 11 is most significant bit (MSB) and bit 0 is the least significant bit (LSB).
15, 22
IOUTA, QOUTA
Current outputs of the device. Full scale output current is achieved when all input bits are set to binary 1.
16, 21
IOUTB, QOUTB
Complementary current outputs of the device. Full scale output current is achieved on the complementary
outputs when all input bits are set to binary 0.
17
REFIO
Reference voltage input if Internal reference is disabled. The internal reference is not intended to drive an
external load. Use 0.1F cap to ground when internal reference is enabled.
18
REFLO
Connect to analog ground to enable internal 1.2V reference or connect to AVDD to disable internal reference.
7, 8, 41, 42
NC
No connect (NC). Not internally connected. No termination required, may be used for device migration to
higher resolution DACs.
9
SLEEP
FN6020 Rev 1.00
Feb 2002
Connect to digital ground or leave floating for normal operation. Connect to DVDD for sleep mode.
Page 4 of 13
ISL5829
Absolute Maximum Ratings
Thermal Information
Digital Supply Voltage DVDD to DGND . . . . . . . . . . . . . . . . . . +3.6V
Analog Supply Voltage AVDD to AGND . . . . . . . . . . . . . . . . . . +3.6V
Grounds, AGND TO DGND . . . . . . . . . . . . . . . . . . . . -0.3V to +0.3V
Digital Input Voltages (DATA, CLK, SLEEP) . . . . . . . . DVDD + 0.3V
Reference Input Voltage Range. . . . . . . . . . . . . . . . . . AVDD + 0.3V
Analog Output Current (IOUT) . . . . . . . . . . . . . . . . . . . . . . . . . 24mA
Thermal Resistance (Typical, Note 1)
JA(°C/W)
LQFP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
70
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150°C
Maximum Storage Temperature Range . . . . . . . . . . . -65°C to 150°C
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300°C
Operating Conditions
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . .-40°C to 85°C
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. JA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications
AVDD = DVDD = +3.3V, VREF = Internal 1.2V, IOUTFS = 20mA, TA = 25°C for All Typical Values
TA = -40°C TO 85°C
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNITS
12
-
-
Bits
-1.25
0.5
+1.25
LSB
-1
0.5
+1
LSB
+0.006
% FSR
SYSTEM PERFORMANCE
Resolution
Integral Linearity Error, INL
“Best Fit” Straight Line (Note 7)
Differential Linearity Error, DNL
(Note 7)
Offset Error, IOS
IOUTA (Note 7)
Offset Drift Coefficient
(Note 7)
-
0.1
-
ppm
FSR/°C
Full Scale Gain Error, FSE
With External Reference (Notes 2, 7)
-3
0.5
+3
% FSR
With Internal Reference (Notes 2, 7)
-3
0.5
+3
% FSR
With External Reference (Note 7)
-
50
-
ppm
FSR/°C
With Internal Reference (Note 7)
-
100
-
ppm
FSR/°C
fCLK = 100MSPS, fOUT = 10MHz
-
83
-
dB
fCLK = 100MSPS, fOUT = 40MHz
-
74
-
dB
As a percentage of Full Scale Range
-1.6
0.6
+1.6
% FSR
In dB Full Scale Range
-0.14
0.05
+0.14
dB FSR
2
20
22
mA
(Note 3)
-1.0
-
1.25
V
Maximum Clock Rate, fCLK
ISL5829/2IN
210
250
-
MHz
Maximum Clock Rate, fCLK
ISL5829IN
130
150
-
MHz
Output Rise Time
Full Scale Step
-
1
-
ns
Output Fall Time
Full Scale Step
-
1
-
ns
-
5
-
pF
IOUTFS = 20mA
-
50
-
pA/Hz
IOUTFS = 2mA
-
30
-
pA/Hz
Full Scale Gain Drift
Crosstalk
Gain Matching Between Channels
(DC Measurement)
Full Scale Output Current, IFS
Output Voltage Compliance Range
-0.006
DYNAMIC CHARACTERISTICS
Output Capacitance
Output Noise
FN6020 Rev 1.00
Feb 2002
Page 5 of 13
ISL5829
Electrical Specifications
AVDD = DVDD = +3.3V, VREF = Internal 1.2V, IOUTFS = 20mA, TA = 25°C for All Typical Values (Continued)
TA = -40°C TO 85°C
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNITS
AC CHARACTERISTICS (Using Figure 13 with RDIFF = 50 and RLOAD = 50, Full Scale Output = -2.5dBm
Spurious Free Dynamic Range,
SFDR Within a Window
Spurious Free Dynamic Range,
SFDR to Nyquist (fCLK/2)
fCLK = 210MSPS, fOUT = 80.8MHz, 30MHz Span (Notes 4, 7)
-
72
-
dBc
fCLK = 210MSPS, fOUT = 40.4MHz, 30MHz Span (Notes 4, 7)
-
78
-
dBc
fCLK = 130MSPS, fOUT = 20.2MHz, 20MHz Span (Notes 4, 7)
-
84
-
dBc
fCLK = 210MSPS, fOUT = 80.8MHz (Notes 4, 7)
-
54
-
dBc
fCLK = 210MSPS, fOUT = 40.4MHz (Notes 4, 7, 9)
-
65
-
dBc
fCLK = 200MSPS, fOUT = 20.2MHz, T = 25°C (Notes 4, 7)
60
66
-
dBc
fCLK = 200MSPS, fOUT = 20.2MHz, T = -40°C to 85°C (Notes 4, 7)
58
-
-
dBc
fCLK = 130MSPS, fOUT = 50.5MHz (Notes 4, 7)
-
57
-
dBc
fCLK = 130MSPS, fOUT = 40.4MHz (Notes 4, 7)
-
62
-
dBc
fCLK = 130MSPS, fOUT = 20.2MHz (Notes 4, 7)
-
69
-
dBc
68
73
-
dBc
-
77
-
dBc
fCLK = 130MSPS, fOUT
= 10.1MHz, T = -40oC to 85oC (Notes 4, 7)
fCLK = 130MSPS, fOUT = 5.05MHz (Notes 4, 7)
Spurious Free Dynamic Range,
SFDR in a Window with Eight Tones
fCLK = 100MSPS, fOUT = 40.4MHz (Notes 4, 7)
-
60
-
dBc
fCLK = 80MSPS, fOUT = 30.3MHz (Notes 4, 7)
-
63
-
dBc
fCLK = 80MSPS, fOUT = 20.2MHz (Notes 4, 7)
-
70
-
dBc
fCLK = 80MSPS, fOUT = 10.1MHz (Notes 4, 7, 9)
-
73
-
dBc
fCLK = 80MSPS, fOUT = 5.05MHz (Notes 4, 7)
-
76
-
dBc
fCLK = 50MSPS, fOUT = 20.2MHz (Notes 4, 7)
-
66
-
dBc
fCLK = 50MSPS, fOUT = 10.1MHz (Notes 4, 7)
-
73
-
dBc
fCLK = 50MSPS, fOUT = 5.05MHz (Notes 4, 7)
-
77
-
dBc
fCLK = 210MSPS, fOUT = 28.3MHz to 45.2MHz, 2.1MHz Spacing,
50MHz Span (Notes 4, 7, 9)
-
64
-
dBc
fCLK = 130MSPS, fOUT = 17.5MHz to 27.9MHz, 1.3MHz Spacing,
35MHz Span (Notes 4, 7)
-
67
-
dBc
fCLK = 80MSPS, fOUT = 10.8MHz to 17.2MHz, 811kHz Spacing,
15MHz Span (Notes 4, 7)
-
74
-
dBc
fCLK = 50MSPS, fOUT = 6.7MHz to 10.8MHz, 490kHz Spacing,
10MHz Span (Notes 4, 7)
-
75
-
dBc
-
90
-
dBc
-
70
-
dB
1.2
1.23
1.3
V
Spurious Free Dynamic Range,
fCLK = 78MSPS, fOUT = 11MHz, in a 20MHz Window, RBW = 30kHz
SFDR in a Window with EDGE or GSM (Notes 4, 7, 9)
Adjacent Channel Power Ratio,
ACPR with UMTS
fCLK = 76.8MSPS, fOUT = 19.2MHz, RBW = 30kHz (Notes 4, 7, 9)
VOLTAGE REFERENCE
Internal Reference Voltage, VFSADJ
Pin 20 Voltage with Internal Reference
-
40
-
ppm/°C
-
0
-
A
Reference Input Impedance
-
1
-
M
Reference Input Multiplying Bandwidth (Note 7)
-
1.0
-
MHz
Internal Reference Voltage Drift
Internal Reference Output Current
Sink/Source Capability
FN6020 Rev 1.00
Feb 2002
Reference is not intended to drive an external load
Page 6 of 13
ISL5829
Electrical Specifications
AVDD = DVDD = +3.3V, VREF = Internal 1.2V, IOUTFS = 20mA, TA = 25°C for All Typical Values (Continued)
TA = -40°C TO 85°C
PARAMETER
DIGITAL INPUTS
TEST CONDITIONS
MIN
TYP
MAX
UNITS
D11-D0, CLK
Input Logic High Voltage with
3.3V Supply, VIH
(Note 3)
2.3
3.3
-
V
Input Logic Low Voltage with
3.3V Supply, VIL
(Note 3)
-
0
1.0
V
Sleep Input Current, IIH
-25
-
+25
A
Input Logic Current, IIH, IL
-20
-
+20
A
Clock Input Current, IIH, IL
-10
-
+10
A
-
3
-
pF
Digital Input Capacitance, CIN
TIMING CHARACTERISTICS
Data Setup Time, tSU
See Figure 15
-
1.5
-
ns
Data Hold Time, tHLD
See Figure 15
-
1.5
-
ns
Propagation Delay Time, tPD
See Figure 15
-
1
-
Clock
Period
CLK Pulse Width, tPW1 , tPW2
See Figure 15 (Note 3)
2
-
-
ns
POWER SUPPLY CHARACTERISTICS
AVDD Power Supply
(Note 8)
2.7
3.3
3.6
V
DVDD Power Supply
(Note 8)
2.7
3.3
3.6
V
Analog Supply Current (IAVDD)
3.3V, IOUTFS = 20mA
-
60
62
mA
3.3V, IOUTFS = 2mA
-
24
-
mA
Digital Supply Current (IDVDD)
3.3V (Note 5)
-
11
15
mA
3.3V (Note 6)
-
17
21
mA
Supply Current (IAVDD) Sleep Mode
3.3V, IOUTFS = Don’t Care
-
5
-
mA
Power Dissipation
3.3V, IOUTFS = 20mA (Note 5)
-
233
255
mW
3.3V, IOUTFS = 20mA (Note 6)
-
253
274
mW
3.3V, IOUTFS = 2mA (Note 5)
-
115
-
mW
-0.125
-
+0.125
%FSR/V
Power Supply Rejection
Single Supply (Note 7)
NOTES:
2. Gain Error measured as the error in the ratio between the full scale output current and the current through RSET (typically 625A). Ideally the
ratio should be 32.
3. Parameter guaranteed by design or characterization and not production tested.
4. Spectral measurements made with differential transformer coupled output and no external filtering. For multitone testing, the same pattern was
used at different clock rates, producing different output frequencies but at the same ratio to the clock rate.
5. Measured with the clock at 130MSPS and the output frequency at 10MHz.
6. Measured with the clock at 200MSPS and the output frequency at 20MHz.
7. See Definition of Specifications.
8. Recommended operation is from 3.0V to 3.6V. Operation below 3.0V is possible with some degradation in spectral performance. Reduction in
analog output current may be necessary to maintain spectral performance.
9. See Typical Performance plots.
FN6020 Rev 1.00
Feb 2002
Page 7 of 13
ISL5829
Typical Performance (+3.3V Supply, Using Figure 13 with RDIFF = 100 and RLOAD = 50)
SPECTRAL MASK FOR
GSM900/DCS1800/PCS1900
P>43dBm NORMAL BTS
WITH 30kHz RBW
FIGURE 1. EDGE AT 11MHz, 78MSPS CLOCK
(91+dBc @ f = +6MHz)
FIGURE 2. EDGE AT 11MHz, 78MSPS CLOCK
(75dBc -NYQUIST, 6dB PAD)
SPECTRAL MASK FOR
GSM900/DCS1800/PCS1900
P>43dBm NORMAL BTS
WITH 30kHz RBW
FIGURE 3. GSM AT 11MHz, 78MSPS CLOCK
(90+dBc @ f = +6MHz, 3dB PAD)
FIGURE 4. GSM AT 11MHz, 78MSPS CLOCK
(75dBc - NYQUIST, 9dB PAD)
FIGURE 5. FOUR EDGE CARRIERS AT 12.4–15.6MHz,
800kHz SPACING, 78MSPS (71dBc - 20MHz
WINDOW)
FIGURE 6. FOUR GSM CARRIERS AT 12.4–15.6MHz,
78MSPS (73dBc - 20MHz WINDOW, 6dB PAD)
FN6020 Rev 1.00
Feb 2002
Page 8 of 13
ISL5829
Typical Performance (+3.3V Supply, Using Figure 13 with RDIFF = 100 and RLOAD = 50)
(Continued)
SPECTRAL MASK
UMTS TDD
P>43dBm BTS
FIGURE 7. UMTS AT 19.2MHz, 76.8MSPS
(70dB 1stACPR, 70dB 2ndACPR)
FIGURE 9. ONE TONE AT 40.4MHz, 210MSPS CLOCK
(61dBc - NYQUIST, 6dB PAD)
FIGURE 11. TWO TONES (CkHzF=6) AT 8.5MHz, 50MSPS
CLOCK, 500kHz SPACING (82dBc - 10MHz
WINDOW, 6dB PAD)
FN6020 Rev 1.00
Feb 2002
FIGURE 8. ONE TONE AT 10.1MHz, 80MSPS CLOCK
(71dBc - NYQUIST, 6dB PAD)
FIGURE 10. EIGHT TONES (CREST FACTOR=8.9) AT 37MHz,
210MSPS CLOCK, 2.1MHz SPACING
(65dBc - NYQUIST)
FIGURE 12. FOUR TONES (CF=8.1) AT 14MHz, 80MSPS
CLOCK, 800kHz SPACING (70dBc - NYQUIST,
6dB PAD)
Page 9 of 13
ISL5829
Definition of Specifications
Adjacent Channel Power Ratio, ACPR, is the ratio of the
average power in the adjacent frequency channel (or offset) to
the average power in the transmitted frequency channel.
Crosstalk, is the measure of the channel isolation from one
DAC to the other. It is measured by generating a sinewave in
one DAC while the other DAC is clocked with a static input,
and comparing the output power of each DAC at the frequency
generated.
Differential Linearity Error, DNL, is the measure of the step
size output deviation from code to code. Ideally the step size
should be one LSB. A DNL specification of one LSB or less
guarantees monotonicity.
EDGE, Enhanced Data for Global Evolution, a TDMA
standard for cellular applications which uses 200kHz BW,
8-PSK modulated carriers.
Full Scale Gain Drift, is measured by setting the data inputs to
be all logic high (all 1s) and measuring the output voltage
through a known resistance as the temperature is varied from
TMIN to TMAX . It is defined as the maximum deviation from the
value measured at room temperature to the value measured at
either TMIN or TMAX . The units are ppm of FSR (full scale
range) per °C.
Full Scale Gain Error, is the error from an ideal ratio of 32
between the output current and the full scale adjust current
(through RSET).
Gain Matching, is a measure of the full scale amplitude match
between the I and Q channels given the same input pattern. It
is typically measured with all 1s at the input to both channels,
and the full scale output voltage developed into matching loads
is compared for the I and Q outputs.
GSM, Global System for Mobile Communication, a TDMA
standard for cellular applications which uses 200kHz BW,
GMSK modulated carriers.
Integral Linearity Error, INL, is the measure of the worst case
point that deviates from a best fit straight line of data values
along the transfer curve.
Internal Reference Voltage Drift, is defined as the maximum
deviation from the value measured at room temperature to the
value measured at either TMIN or TMAX . The units are ppm per
°C.
Offset Drift, is measured by setting the data inputs to all logic
low (all 0s) and measuring the output voltage at IOUTA through
a known resistance as the temperature is varied from TMIN to
TMAX . It is defined as the maximum deviation from the value
measured at room temperature to the value measured at either
TMIN or TMAX . The units are ppm of FSR (full scale range) per
degree °C.
Offset Error, is measured by setting the data inputs to all logic
low (all 0s) and measuring the output voltage of IOUTA through
FN6020 Rev 1.00
Feb 2002
a known resistance. Offset error is defined as the maximum
deviation of the IOUTA output current from a value of 0mA.
Output Voltage Compliance Range, is the voltage limit
imposed on the output. The output impedance should be
chosen such that the voltage developed does not violate the
compliance range.
Power Supply Rejection, is measured using a single power
supply. The nominal supply voltage is varied 10% and the
change in the DAC full scale output is noted.
Reference Input Multiplying Bandwidth, is defined as the
3dB bandwidth of the voltage reference input. It is measured
by using a sinusoidal waveform as the external reference with
the digital inputs set to all 1s. The frequency is increased until
the amplitude of the output waveform is 0.707 (-3dB) of its
original value.
Spurious Free Dynamic Range, SFDR, is the amplitude
difference from the fundamental signal to the largest
harmonically or non-harmonically related spur within the
specified frequency window.
Total Harmonic Distortion, THD, is the ratio of the RMS value
of the fundamental output signal to the RMS sum of the first
five harmonic components.
UMTS, Universal Mobile Telecommunications System, a
W-CDMA standard for cellular applications which uses
3.84MHz modulated carriers.
Detailed Description
The ISL5829 is a dual 12-bit, current out, CMOS, digital to
analog converter. The core of each DAC is based on the
ISL5861. The maximum update rate is at least 210+MSPS and
can be powered by a single power supply in the recommended
range of +3.0V to +3.6V. Operation with clock rates higher than
210MSPS is possible; please contact the factory for more
information. It consumes less than 125mW of power per
channel when using a +3.3V supply, the maximum 20mA of
output current, and the data switching at 210MSPS. The
architecture is based on a segmented current source
arrangement that reduces glitch by reducing the amount of
current switching at any one time. In previous architectures
that contained all binary weighted current sources or a binary
weighted resistor ladder, the converter might have a
substantially larger amount of current turning on and off at
certain, worst-case transition points such as midscale and
quarter scale transitions. By greatly reducing the amount of
current switching at these major transitions, the overall glitch of
the converter is dramatically reduced, improving settling time,
transient problems, and accuracy.
Digital Inputs and Termination
The ISL5829 digital inputs are formatted as offset binary and
guaranteed to 3V LVCMOS levels. The internal register is
updated on the rising edge of the clock. To minimize
reflections, proper termination should be implemented. If the
Page 10 of 13
ISL5829
lines driving the clock and the digital inputs are long 50 lines,
then 50 termination resistors should be placed as close to the
converter inputs as possible connected to the digital ground
plane (if separate grounds are used). These termination
resistors are not likely needed as long as the digital waveform
source is within a few inches of the DAC. For pattern drivers
with very high speed edge rates, it is recommended that the
user consider series termination (50-200prior to the DAC’s
inputs in order to reduce the amount of noise.
Power Supply
Separate digital and analog power supplies are recommended.
The allowable supply range is +2.7V to +3.6V. The
recommended supply range is +3.0 to 3.6V (nominally +3.3V)
to maintain optimum SFDR. However, operation down to +2.7V
is possible with some degradation in SFDR. Reducing the
analog output current can help the SFDR at +2.7V. The SFDR
values stated in the table of specifications were obtained with a
+3.3V supply.
Ground Planes
Separate digital and analog ground planes should be used. All
of the digital functions of the device and their corresponding
components should be located over the digital ground plane
and terminated to the digital ground plane. The same is true for
the analog components and the analog ground plane.
Noise Reduction
To minimize power supply noise, 0.1F capacitors should be
placed as close as possible to the converter’s power supply
pins, AVDD and DVDD . Also, the layout should be designed
using separate digital and analog ground planes and these
capacitors should be terminated to the digital ground for DVDD
and to the analog ground for AVDD . Additional filtering of the
power supplies on the board is recommended.
Voltage Reference
The internal voltage reference of the device has a nominal value
of +1.23V with a 40ppm/°C drift coefficient over the full
temperature range of the converter. It is recommended that a
0.1F capacitor be placed as close as possible to the REFIO
pin, connected to the analog ground. The REFLO pin selects
the reference. The internal reference can be selected if REFLO
is tied low (ground). If an external reference is desired, then
REFLO should be tied high (the analog supply voltage) and the
external reference driven into REFIO. The full scale output
current of the converter is a function of the voltage reference
used and the value of RSET. IOUT should be within the 2mA to
22mA range, though operation below 2mA is possible, with
performance degradation.
If the internal reference is used, VFSADJ will equal
approximately 1.2V. If an external reference is used, VFSADJ
will equal the external reference. The calculation for IOUT (Full
Scale) is:
IOUT(Full Scale) = (VFSADJ/RSET) X 32.
FN6020 Rev 1.00
Feb 2002
If the full scale output current is set to 20mA by using the
internal voltage reference (1.23V) and a 1.91k RSET resistor,
then the input coding to output current will resemble the
following:
TABLE 1. INPUT CODING vs OUTPUT CURRENT WITH
INTERNAL REFERENCE (1.23V TYP) AND
RSET=1.91K
INPUT CODE (D11-D0)
IOUTA (mA)
IOUTB (mA)
1111 1111 1111
20.6
0
1000 0000 0000
10.3
10.3
0000 0000 0000
0
20.6
Analog Output
IOUTA and IOUTB are complementary current outputs. The
sum of the two currents is always equal to the full scale output
current minus one LSB. If single ended use is desired, a load
resistor can be used to convert the output current to a voltage.
It is recommended that the unused output be either grounded
or equally terminated. The voltage developed at the output
must not violate the output voltage compliance range of -1.0V
to 1.25V. ROUT (the impedance loading each current output)
should be chosen so that the desired output voltage is
produced in conjunction with the output full scale current. If a
known line impedance is to be driven, then the output load
resistor should be chosen to match this impedance. The output
voltage equation is:
VOUT = IOUT X ROUT.
The most effective method for reducing the power
consumption is to reduce the analog output current, which
dominates the supply current. The maximum recommended
output current is 20mA.
Differential Output
IOUTA and IOUTB can be used in a differential-to-singleended arrangement to achieve better harmonic rejection. With
RDIFF= 50and RLOAD=50, the circuit in Figure 13 will
provide a 500mV (-2.5dBm) signal at the output of the
transformer if the full scale output current of the DAC is set to
20mA (used for the electrical specifications table). Values of
RDIFF= 100and RLOAD=50 were used for the typical
performance curves to increase the output power and the
dynamic range. The center tap in Figure 13 must be grounded.
In the circuit in Figure 14, the user is left with the option to
ground or float the center tap. The DC voltage that will exist at
either IOUTA or IOUTB if the center tap is floating is IOUTDC x
(RA//RB) V because RDIFF is DC shorted by the transformer. If
the center tap is grounded, the DC voltage is 0V.
Recommended values for the circuit in Figure 14 are
RA=RB=50, RDIFF=100, assuming RLOAD=50. The
performance of Figure 13 and Figure 14 is basically the same,
however leaving the center tap of Figure 14 floating allows the
circuit to find a more balanced virtual ground, theoretically
improving the even order harmonic rejection, but likely
Page 11 of 13
ISL5829
reducing the signal swing available due to the output voltage
compliance range limitations.
REQ = 0.5 x (RLOAD // RDIFF// RA), WHERE RA=RB
AT EACH OUTPUT
RA
REQ = 0.5 x (RLOAD // RDIFF)
AT EACH OUTPUT
OUTA
ISL5829
RDIFF
ISL5829
RDIFF
VOUT = (2 x OUTA x REQ)V
1:1
OUTA
VOUT = (2 x OUTA x REQ)V
OUTB
RLOAD
RB
RLOAD
OUTB
RLOAD REPRESENTS THE
LOAD SEEN BY THE TRANSFORMER
FIGURE 14. ALTERNATIVE OUTPUT LOADING
RLOAD REPRESENTS THE
LOAD SEEN BY THE TRANSFORMER
Propagation Delay
The converter requires two clock rising edges for data to be
represented at the output. Each rising edge of the clock
captures the present data word and outputs the previous data.
The propagation delay is therefore 1/CLK, plus <2ns of
processing. See Figure 15.
FIGURE 13. OUTPUT LOADING FOR DATASHEET
MEASUREMENTS
Test Service
Intersil offers customer-specific testing of converters with a
service called Testdrive. To submit a request, fill out the
Testdrive form at www.intersil.com/testdrive. Or, send a
request to the technical support center.
Timing Diagram
tPW2
tPW1
50%
CLK
tSU
tSU
tHLD
D11-D0
W0
tSU
tHLD
tHLD
W1
W2
W3
tPD
tPD
OUTPUT=W0
IOUT
OUTPUT=W-1
OUTPUT=W1
FIGURE 15. PROPAGATION DELAY, SETUP TIME, HOLD TIME AND MINIMUM PULSE WIDTH DIAGRAM
FN6020 Rev 1.00
Feb 2002
Page 12 of 13
ISL5829
Thin Plastic Quad Flatpack Packages (LQFP)
D
Q48.7x7A (JEDEC MS-026BBC ISSUE B)
48 LEAD THIN PLASTIC QUAD FLATPACK PACKAGE
D1
-D-
INCHES
SYMBOL
-A-
-B-
E E1
e
PIN 1
SEATING
A PLANE
-H-
0.08
0.003
-C-
MIN
MAX
MILLIMETERS
MIN
MAX
NOTES
A
-
0.062
-
1.60
-
A1
0.002
0.005
0.05
0.15
-
A2
0.054
0.057
1.35
1.45
-
b
0.007
0.010
0.17
0.27
6
b1
0.007
0.009
0.17
0.23
-
D
0.350
0.358
8.90
9.10
3
D1
0.272
0.280
6.90
7.10
4, 5
E
0.350
0.358
8.90
9.10
3
E1
0.272
0.280
6.90
7.10
4, 5
L
0.018
0.029
0.45
0.75
-
N
48
48
7
e
0.020 BSC
0.50 BSC
Rev. 2 1/99
NOTES:
1. Controlling dimension: MILLIMETER. Converted inch
dimensions are not necessarily exact.
2. All dimensions and tolerances per ANSI Y14.5M-1982.
0.08
0.003 M
C A-B S
11o-13o
0.020
0.008 MIN
0o MIN
D S
3. Dimensions D and E to be determined at seating plane -C- .
b
4. Dimensions D1 and E1 to be determined at datum plane
-H- .
b1
0.09/0.16
A2 A1 0.004/0.006
GAGE
PLANE
6. Dimension b does not include dambar protrusion. Allowable
dambar protrusion shall not cause the lead width to exceed
the maximum b dimension by more than 0.08mm (0.003
inch).
BASE METAL
WITH PLATING
L
0o-7o
0.25
0.010
11o-13o
5. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is 0.25mm (0.010 inch) per side.
0.09/0.20
0.004/0.008
7. “N” is the number of terminal positions.
© Copyright Intersil Americas LLC 2002. All Rights Reserved.
All trademarks and registered trademarks are the property of their respective owners.
For additional products, see www.intersil.com/en/products.html
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such
modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are
current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its
subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
FN6020 Rev 1.00
Feb 2002
Page 13 of 13
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