TI1 OPA191IDBVR 36-v, low power, precision, cmos, rail-to-rail input/output, low offset voltage, low input bias current op amp Datasheet

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OPA191, OPA2191, OPA4191
SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
OPAx191 36-V, Low Power, Precision, CMOS, Rail-to-Rail Input/Output,
Low Offset Voltage, Low Input Bias Current Op Amp
1 Features
3 Description
•
•
•
•
•
•
•
•
•
•
•
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The OPAx191 family (OPA191, OPA2191, and
OPA4191) is a new generation of 36-V, e-trim
operational amplifiers.
1
Low Offset Voltage: ±5 µV
Low Offset Voltage Drift: ±0.1 µV/°C
Low Noise: 15 nV/√Hz at 1 kHz
High Common-Mode Rejection: 140 dB
Low Bias Current: ±5 pA
Rail-to-Rail Input and Output
Wide Bandwidth: 2.5-MHz GBW
High Slew Rate: 5 V/µs
Low Quiescent Current: 140 µA per Amplifier
Wide Supply: ±2.25 V to ±18 V, 4.5 V to 36 V
EMI/RFI Filtered Inputs
Differential Input Voltage Range to Supply Rail
High Capacitive Load Drive Capability: 1 nF
Industry Standard Packages:
– Single in SOIC-8, SOT-5, and VSSOP-8
– Dual in SOIC-8 and VSSOP-8
– Quad in SOIC-14 and TSSOP-14
These devices offer outstanding dc precision and ac
performance, including rail-to-rail input/output, low
offset voltage (±5 µV, typ), low offset drift (±0.2
µV/°C, typ), and 2-MHz bandwidth.
Unique features, such as differential input-voltage
range to the supply rail, high output current (±65 mA),
high capacitive load drive of up to 1 nF, and high
slew rate (5 V/µs), make the OPAx191 a robust, highperformance operational amplifier for high-voltage
industrial applications.
The OPAx191 family of op amps is available in
standard packages and is specified from –40°C to
+125°C.
Device Information(1)
PART NUMBER
OPA191
2 Applications
•
•
•
•
•
•
•
Multiplexed Data-Acquisition Systems
Test and Measurement Equipment
High-Resolution ADC Driver Amplifiers
SAR ADC Reference Buffers
Programmable Logic Controllers
High-Side and Low-Side Current Sensing
High Precision Comparator
OPA2191
OPA4191
PACKAGE
BODY SIZE (NOM)
SOIC (8)
4.90 mm × 3.90 mm
SOT (5)
2.90 mm × 1.60 mm
VSSOP (8)
3.00 mm × 3.00 mm
SOIC (8)
4.90 mm × 3.90 mm
VSSOP (8)
3.00 mm × 3.00 mm
SOIC (14)
8.65 mm x 3.90 mm
TSSOP (14)
5.00 mm x 4.40 mm
(1) For all available packages, see the package option addendum
at the end of the data sheet.
OPA191 in a High-Voltage, Multiplexed, Data-Acquisition System
Analog Inputs
REF3140
Bridge Sensor
OPA191
Gain
Gain
RC Filter
RC Filter
OPA625
Reference Driver
+
Thermocouple
4:2
HV MUX
+
OPA191
+
Antialiasing
Filter
REF
P
ADS8864
VIN
Current Sensing
M
Gain
Optical Sensor
VIN
OPA191
Gain
High-Voltage Multiplexed Input
High-Voltage Level Translation
VCM
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. UNLESS OTHERWISE NOTED, this document contains PRODUCTION
DATA.
OPA191, OPA2191, OPA4191
SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
www.ti.com
Table of Contents
1
2
3
4
5
6
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
3
5
6.1
6.2
6.3
6.4
6.5
6.6
6.7
Absolute Maximum Ratings ...................................... 5
ESD Ratings.............................................................. 5
Recommended Operating Conditions....................... 5
Thermal Information: OPA191 .................................. 5
Thermal Information: OPA2191 ................................ 6
Thermal Information: OPA4191 ................................ 6
Electrical Characteristics: VS = ±4 V to ±18 V (VS = 8
V to 36 V) ................................................................... 7
6.8 Electrical Characteristics: VS = ±2.25 V to ±4 V (VS =
4.5 V to 8 V)............................................................... 9
6.9 Typical Characteristics ............................................ 11
7
Parameter Measurement Information ................ 20
8
Detailed Description ............................................ 22
7.1 Input Offset Voltage Drift......................................... 20
8.2 Functional Block Diagram ....................................... 22
8.3 Feature Description................................................. 23
8.4 Device Functional Modes........................................ 30
9
Application and Implementation ........................ 31
9.1 Application Information............................................ 31
9.2 Typical Applications ................................................ 31
10 Power-Supply Recommendations ..................... 35
11 Layout................................................................... 35
11.1 Layout Guidelines ................................................. 35
11.2 Layout Example .................................................... 36
12 Device and Documentation Support ................. 37
12.1
12.2
12.3
12.4
12.5
12.6
12.7
Device Support......................................................
Documentation Support ........................................
Related Links ........................................................
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
37
37
37
37
38
38
38
13 Mechanical, Packaging, and Orderable
Information ........................................................... 38
8.1 Overview ................................................................. 22
4 Revision History
Changes from Original (December 2015) to Revision A
Page
•
Changed DBV and DGK packages from product preview to production data ....................................................................... 1
•
Added input offset voltage drift values for DBV and DGK packages to both electrical characteristics tables ....................... 5
•
Added crosstalk values to both electrical characteristics tables............................................................................................. 5
•
Updated Figure 23, 0.1-Hz to 10-Hz Noise graph ................................................................................................................ 14
•
Added text regarding capacitive load drive to the Capacitive Load and Stability section .................................................... 26
•
Added Figure 56 .................................................................................................................................................................. 26
2
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Product Folder Links: OPA191 OPA2191 OPA4191
OPA191, OPA2191, OPA4191
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SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
5 Pin Configuration and Functions
DBV Package: OPA191
5-Pin SOT
Top View
OUT
1
V-
2
+IN
3
D and DGK Packages: OPA2191
8-Pin SOIC and VSSOP
Top View
V+
5
4
-IN
D and DGK Packages: OPA191
8-Pin SOIC and VSSOP
Top View
1
8
NC(1)
-IN
2
7
V+
+IN
3
6
5
(1)
4
1
8
V+
-IN A
2
7
OUT B
+IN A
3
6
-IN B
V-
4
5
+IN B
D and PW Packages: OPA4191
14-Pin SOIC and TSSOP
Top View
NC(1)
V-
OUT A
OUT A
1
14
OUT D
OUT
-IN A
2
13
-IN D
(1)
+IN A
3
12
+IN D
V+
4
11
V-
+IN B
5
10
+IN C
-IN B
6
9
-IN C
OUT B
7
8
OUT C
NC
NC = No internal connection.
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OPA191, OPA2191, OPA4191
SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
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Pin Functions: OPA191
PIN
OPA191
NAME
+IN
I/O
D (SOIC),
DGK (VSSOP)
DBV (SOT)
3
3
DESCRIPTION
I
Noninverting input
Inverting input
–IN
2
4
I
NC
1, 5, 8
—
—
No internal connection (can be left floating)
OUT
6
1
O
Output
V+
7
5
—
Positive (highest) power supply
V–
4
2
—
Negative (lowest) power supply
Pin Functions: OPA2191 and OPA4191
PIN
OPA2191
OPA4191
D (SOIC),
DGK (VSSOP)
D (SOIC),
PW (TSSOP)
+IN A
3
3
I
Noninverting input, channel A
+IN B
5
5
I
Noninverting input, channel B
+IN C
—
10
I
Noninverting input, channel C
+IN D
—
12
I
Noninverting input, channel D
–IN A
2
2
I
Inverting input, channel A
–IN B
6
6
I
Inverting input, channel B
–IN C
—
9
I
Inverting input,,channel C
–IN D
—
13
I
Inverting input, channel D
OUT A
1
1
O
Output, channel A
OUT B
7
7
O
Output, channel B
OUT C
—
8
O
Output, channel C
OUT D
—
14
O
Output, channel D
V+
8
4
—
Positive (highest) power supply
V–
4
11
—
Negative (lowest) power supply
NAME
4
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I/O
DESCRIPTION
Copyright © 2015–2016, Texas Instruments Incorporated
Product Folder Links: OPA191 OPA2191 OPA4191
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SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
MIN
Supply voltage, VS = (V+) – (V–)
±20
Single supply
40
Common-mode
Voltage
Signal input pins
MAX
Dual supply
(V–) – 0.5
±10
mA
Continuous
Operating
mA
–40
150
Junction
150
Storage, Tstg
(2)
V
(V+) – (V–) + 0.2
Current
(1)
V
(V+) + 0.5
Differential
Output short circuit (2)
Temperature
UNIT
–65
°C
150
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Short-circuit to ground, one amplifier per package.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1)
±3000
Charged-device model (CDM), per JEDEC specification JESD22-C101 (2)
±1000
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
Supply voltage, VS = (V+) – (V–)
Dual supply
Single supply
Operating temperature
NOM
MAX
±2.25
±18
4.5
36
–40
125
UNIT
V
°C
6.4 Thermal Information: OPA191
OPA191
THERMAL METRIC
(1)
8 PINS
5 PINS
UNIT
D (SOIC)
DGK (VSSOP)
DBV (SOT)
180.4
158.8
°C/W
RθJA
Junction-to-ambient thermal resistance
115.8
RθJC(top)
Junction-to-case(top) thermal resistance
60.1
67.9
60.7
°C/W
RθJB
Junction-to-board thermal resistance
56.4
102.1
44.8
°C/W
ψJT
Junction-to-top characterization parameter
12.8
10.4
1.6
°C/W
ψJB
Junction-to-board characterization parameter
55.9
100.3
4.2
°C/W
RθJC(bot)
Junction-to-case(bottom) thermal resistance
N/A
N/A
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
Copyright © 2015–2016, Texas Instruments Incorporated
Product Folder Links: OPA191 OPA2191 OPA4191
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6.5 Thermal Information: OPA2191
OPA2191
THERMAL METRIC (1)
8 PINS
UNIT
D (SOIC)
DGK (VSSOP)
RθJA
Junction-to-ambient thermal resistance
107.9
158
°C/W
RθJC(top)
Junction-to-case(top) thermal resistance
53.9
48.6
°C/W
RθJB
Junction-to-board thermal resistance
48.9
78.7
°C/W
ψJT
Junction-to-top characterization parameter
6.6
3.9
°C/W
ψJB
Junction-to-board characterization parameter
48.3
77.3
°C/W
RθJC(bot)
Junction-to-case(bottom) thermal resistance
N/A
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.6 Thermal Information: OPA4191
OPA4191
THERMAL METRIC
(1)
14 PINS
UNIT
D (SOIC)
PW (TSSOP)
RθJA
Junction-to-ambient thermal resistance
86.4
92.6
°C/W
RθJC(top)
Junction-to-case(top) thermal resistance
46.3
27.5
°C/W
RθJB
Junction-to-board thermal resistance
41.0
33.6
°C/W
ψJT
Junction-to-top characterization parameter
11.3
1.9
°C/W
ψJB
Junction-to-board characterization parameter
40.7
33.1
°C/W
RθJC(bot)
Junction-to-case(bottom) thermal resistance
N/A
N/A
°C/W
(1)
6
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
Submit Documentation Feedback
Copyright © 2015–2016, Texas Instruments Incorporated
Product Folder Links: OPA191 OPA2191 OPA4191
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SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
6.7 Electrical Characteristics: VS = ±4 V to ±18 V (VS = 8 V to 36 V)
at TA = 25°C, VCM = VOUT = VS / 2, and RL = 10 kΩ connected to VS / 2 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
±5
±25
UNIT
OFFSET VOLTAGE
VS = ±18 V
TA = 0°C to 85°C
TA = –40°C to +125°C
VOS
Input offset voltage
Input offset voltage drift
Power-supply rejection
ratio
±125
µV
±10
±50
±25
±150
TA = –40°C to +125°C
±50
±250
VS = ±18 V,
D package only
TA = 0°C to 85°C
±0.1
±0.8
±0.15
±1.2
VS = ±18 V,
DGK and DBV packages only
TA = 0°C to 85°C
VS = ±18 V,
VCM = (V+) – 1.5 V
PSRR
±75
±10
See
Common-Mode Voltage Range
section
(V+) – 3.0 V < VCM < (V+) – 1.5 V
VS = ±18 V,
VCM = (V+) – 1.5 V
dVOS/dT
±8
TA = 0°C to 85°C
TA = –40°C to +125°C
±0.1
±0.9
TA = –40°C to +125°C
±0.15
±1.3
TA = –40°C to +125°C
±0.5
TA = –40°C to +125°C
µV/°C
±0.3
±1.0
µV/V
±5
±20
pA
±9
nA
±20
pA
±2
nA
INPUT BIAS CURRENT
IB
IOS
Input bias current
Input offset current
TA = –40°C to +125°C
±2
TA = –40°C to +125°C
NOISE
En
Input voltage noise
(V–) – 0.1 V < VCM < (V+) – 3 V
f = 0.1 Hz to 10 Hz
1.4
(V+) – 1.5 V < VCM < (V+) + 0.1 V
f = 0.1 Hz to 10 Hz
7
(V–) – 0.1 V < VCM < (V+) – 3 V
en
Input voltage noise
density
(V+) – 1.5 V < VCM < (V+) + 0.1 V
in
Input current noise
density
f = 100 Hz
18
f = 1 kHz
15
f = 100 Hz
53
f = 1 kHz
24
f = 1 kHz
µVPP
nV/√Hz
1.5
fA/√Hz
INPUT VOLTAGE
VCM
Common-mode voltage
range
(V–) – 0.1
VS = ±18 V,
(V–) – 0.1 V < VCM < (V+) – 3 V
CMRR
Common-mode
rejection ratio
VS = ±18 V,
(V–) < VCM < (V+) – 3 V
VS = ±18 V,
(V+) – 1.5 V < VCM < (V+)
TA = –40°C to +125°C
TA = –40°C to +125°C
(V+) + 0.1
120
140
114
126
96
120
86
100
V
dB
See
Typical Characteristics
(V+) – 3 V < VCM < (V+) – 1.5 V
INPUT IMPEDANCE
ZID
Differential
ZIC
Common-mode
100 || 1.6
1 || 6.4
MΩ || pF
1013Ω || pF
OPEN-LOOP GAIN
AOL
Open-loop voltage gain
VS = ±18 V,
(V–) + 0.6 V < VO < (V+) – 0.6 V,
RL = 2 kΩ
VS = ±18 V,
(V–) + 0.3 V < VO < (V+) – 0.3 V,
RL = 10 kΩ
TA = –40°C to +125°C
TA = –40°C to +125°C
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Electrical Characteristics: VS = ±4 V to ±18 V (VS = 8 V to 36 V) (continued)
at TA = 25°C, VCM = VOUT = VS / 2, and RL = 10 kΩ connected to VS / 2 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
FREQUENCY RESPONSE
GBW
Unity gain bandwidth
SR
Slew rate
2.5
VS = ±18 V, G = 1, 10-V step
To 0.01%, CL = 20 pF
ts
Settling time
To 0.001%, CL = 20 pF
tOR
Overload recovery time
VIN × G = VS
THD+N
Total harmonic
distortion + noise
G = 1, f = 1 kHz, VO = 3.5 VRMS
Crosstalk
Rising
7.5
Falling
5.5
VS = ±18 V, G = 1, 2-V step
0.7
VS = ±18 V, G = 1, 5-V step
1
VS = ±18 V, G = 1, 2-V step
1.8
VS = ±18 V, G = 1, 5-V step
3.7
From overload to negative rail
0.4
From overload to positive rail
MHz
V/µs
µs
µs
1
0.0012%
OPA2191 and OPA4191, at dc
150
dB
OPA2191 and OPA4191, f = 100 kHz
130
dB
OUTPUT
No load
Positive rail
VO
Voltage output swing
from rail
Short-circuit current
CL
Capacitive load drive
ZO
Open-loop output
impedance
15
50
110
RL = 2 kΩ
200
500
5
15
RL = 10 kΩ
50
110
RL = 2 kΩ
200
500
No load
Negative rail
ISC
5
RL = 10 kΩ
VS = ±18 V
±65
mV
mA
See Typical Characteristics
f = 1 MHz, IO = 0 A, See Figure 31
Ω
700
POWER SUPPLY
IQ
Quiescent current per
amplifier
IO = 0 A
140
TA = –40°C to +125°C
200
250
µA
TEMPERATURE
8
Thermal protection
180
°C
Thermal hysteresis
30
°C
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SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
6.8 Electrical Characteristics: VS = ±2.25 V to ±4 V (VS = 4.5 V to 8 V)
at TA = 25°C, VCM = VOUT = VS / 2, and RL = 10 kΩ connected to VS / 2 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
±5
±25
UNIT
OFFSET VOLTAGE
VS = ±2.25 V,
VCM = (V+) – 3 V
TA = 0°C to 85°C
TA = –40°C to +125°C
VOS
Input offset voltage
dVOS/dT
Input offset voltage drift
Power-supply rejection
ratio
±125
TA = 0°C to 85°C
µV
±10
±50
±25
±150
TA = –40°C to +125°C
±50
±250
VS = ±2.25 V,
VCM = (V+) – 3 V,
D package only
TA = 0°C to 85°C
±0.1
±0.8
±0.15
±1.2
VS = ±2.25 V,
VCM = (V+) – 3 V,
DGK and DBV packages only
TA = 0°C to 85°C
±0.1
±0.9
TA = –40°C to +125°C
±0.15
±1.3
TA = –40°C to +125°C
±0.5
VS = ±2.25 V,
VCM = (V+) – 1.5 V
PSRR
±75
±10
See
Common-Mode Voltage Range
section
(V+) – 3.0 V < VCM < (V+) – 1.5 V
VS = ±3 V,
VCM = (V+) – 1.5 V
±8
TA = –40°C to +125°C
TA = –40°C to +125°C, VCM = VS / 2 – 0.75 V
µV/°C
±1
µV/V
INPUT BIAS CURRENT
IB
IOS
Input bias current
Input offset current
±5
TA = –40°C to +125°C
±2
TA = –40°C to +125°C
±20
pA
±9
nA
±20
pA
±2
nA
NOISE
En
Input voltage noise
(V–) – 0.1 V < VCM < (V+) – 3 V
f = 0.1 Hz to 10 Hz
1.4
(V+) – 1.5 V < VCM < (V+) + 0.1 V
f = 0.1 Hz to 10 Hz
7
(V–) – 0.1 V < VCM < (V+) – 3 V
en
Input voltage noise
density
(V+) – 1.5 V < VCM < (V+) + 0.1 V
in
Input current noise
density
f = 100 Hz
18
f = 1 kHz
15
f = 100 Hz
53
f = 1 kHz
24
f = 1 kHz
1.5
µVPP
nV/√Hz
fA/√Hz
INPUT VOLTAGE
VCM
Common-mode voltage
range
(V–) – 0.1
VS = ±2.25 V,
(V–) – 0.1 V < VCM < (V+) – 3 V
CMRR
Common-mode
rejection ratio
VS = ±2.25 V,
(V–) < VCM < (V+) – 3 V
VS = ±2.25 V,
(V+) – 1.5 V < VCM < (V+)
TA = –40°C to +125°C
TA = –40°C to +125°C
(V+) + 0.1
96
110
90
104
96
120
84
100
V
dB
See
Typical Characteristics
(V+) – 3 V < VCM < (V+) – 1.5 V
INPUT IMPEDANCE
ZID
Differential
ZIC
Common-mode
100 || 1.6
1 || 6.4
MΩ || pF
1013Ω || pF
OPEN-LOOP GAIN
AOL
Open-loop voltage gain
VS = ±2.25 V,
(V–) + 0.6 V < VO < (V+) – 0.6 V,
RL = 2 kΩ
VS = ±2.25 V,
(V–) + 0.3 V < VO < (V+) – 0.3 V,
RL = 10 kΩ
TA = –40°C to +125°C
TA = –40°C to +125°C
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120
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Electrical Characteristics: VS = ±2.25 V to ±4 V (VS = 4.5 V to 8 V) (continued)
at TA = 25°C, VCM = VOUT = VS / 2, and RL = 10 kΩ connected to VS / 2 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
FREQUENCY RESPONSE
GBW
Unity gain bandwidth
2.2
SR
Slew rate
VS = ±2.25 V, G = 1, 1-V step
tOR
Overload recovery time
VIN × G = VS
Crosstalk
Rising
6.5
Falling
5.5
From overload to negative rail
0.4
From overload to positive rail
MHz
V/µs
µs
1
OPA2191 and OPA4191, at dc
150
dB
OPA2191 and OPA4191, f = 100 kHz
130
dB
OUTPUT
No load
Positive rail
VO
Voltage output swing
from rail
Short-circuit current
CL
Capacitive load drive
ZO
Open-loop output
impedance
15
15
110
RL = 2 kΩ
60
500
5
15
RL = 10 kΩ
15
110
RL = 2 kΩ
60
500
No load
Negative rail
ISC
5
RL = 10 kΩ
VS = ±2.25 V
±30
mV
mA
See Typical Characteristics
f = 1 MHz, IO = 0 A, see Figure 31
Ω
700
POWER SUPPLY
IQ
Quiescent current per
amplifier
IO = 0 A
140
TA = –40°C to +125°C
200
250
µA
TEMPERATURE
10
Thermal protection
180
°C
Thermal hysteresis
30
°C
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6.9 Typical Characteristics
Table 1. Table of Graphs
DESCRIPTION
FIGURE
Offset Voltage Production Distribution
Figure 1, Figure 2, Figure 3, Figure 4, Figure 5, Figure 6
Offset Voltage Drift Distribution
Figure 7, Figure 8,
Offset Voltage vs Temperature
Figure 9, Figure 10
Offset Voltage vs Common-Mode Voltage
Figure 11, Figure 12
Offset Voltage vs Power Supply
Figure 13
Open-Loop Gain and Phase vs Frequency
Figure 14
Closed-Loop Gain and Phase vs Frequency
Figure 15
Input Bias Current vs Common-Mode Voltage
Figure 16
Input Bias Current vs Temperature
Figure 17
Output Voltage Swing vs Output Current (maximum supply)
Figure 18, Figure 19
CMRR and PSRR vs Frequency
Figure 20
CMRR vs Temperature
Figure 21
PSRR vs Temperature
Figure 22
0.1-Hz to 10-Hz Noise
Figure 23
Input Voltage Noise Spectral Density vs Frequency
Figure 24
THD+N Ratio vs Frequency
Figure 25
THD+N vs Output Amplitude
Figure 26
Quiescent Current vs Supply Voltage
Figure 27
Quiescent Current vs Temperature
Figure 28
Open Loop Gain vs Temperature
Figure 29, Figure 30
Open Loop Output Impedance vs Frequency
Figure 31
Small Signal Overshoot vs Capacitive Load (100-mV output step)
Figure 32, Figure 33
No Phase Reversal
Figure 34
Overload Recovery
Figure 35
Small-Signal Step Response (100 mV)
Figure 36, Figure 37
Large-Signal Step Response
Figure 38, Figure 39
Settling Time
Figure 40, Figure 41, Figure 42, Figure 43
Short-Circuit Current vs Temperature
Figure 44
Maximum Output Voltage vs Frequency
Figure 45
Propagation Delay Rising Edge
Figure 46
Propagation Delay Falling Edge
Figure 47
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At TA = 25°C, VS = ±18 V, VCM = VS / 2, RL = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted.
35
48
30
42
36
Amplifiers (%)
Amplifiers (%)
25
20
15
10
30
24
18
12
5
6
0
-25
-20
-15
-10
-5
0
5
10
Input Offset Voltage (PV)
15
20
0
-50
25
-40
-30
-20 -10
0
10
20
Input Offset Voltage (PV)
TA = 25°C
42
42
36
36
30
24
18
30
24
18
12
12
6
6
-30
-20 -10
0
10
20
Input Offset Voltage (PV)
30
40
0
-50
50
-40
-30
-20 -10
0
10
20
Input Offset Voltage (PV)
TA = 85°C
42
42
36
36
30
24
18
24
18
12
6
6
-30 -15
0
15
30
Input Offset Voltage (PV)
45
60
75
0
-75
-60
-45
-30 -15
0
15
30
Input Offset Voltage (PV)
TA = –25°C
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45
60
75
TA = –40°C
Figure 5. Offset Voltage Production Distribution
12
50
30
12
-45
40
Figure 4. Offset Voltage Production Distribution
48
Amplifiers (%)
Amplifiers (%)
Figure 3. Offset Voltage Production Distribution
-60
30
TA = 0°C
48
0
-75
50
Figure 2. Offset Voltage Production Distribution
48
Amplifiers (%)
Amplifiers (%)
Figure 1. Offset Voltage Production Distribution
-40
40
TA = 125°C
48
0
-50
30
Figure 6. Offset Voltage Production Distribution
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40
30
30
Offset Voltage Drift (µV/ƒC)
Offset Voltage Drift (µV/ƒC)
C013
C013
TA = –40°C to +125°C, SOIC package
TA = 0°C to 85°C, SOIC package
Figure 7. Offset Voltage Drift Distribution
Figure 8. Offset Voltage Drift Distribution
125
125
Average r 3G
Average r 1G
100
Input Offset Voltage ( V)
75
Input Offset Voltage (PV)
0.8
0.6
0.4
0.2
0
-0.8
1.2
1
0.8
0.6
0.4
0.2
0
-0.2
-0.4
0
-0.6
0
-1
10
-0.8
10
-0.2
20
-0.4
20
-0.6
Amplifiers (%)
40
-1.2
Amplifiers (%)
At TA = 25°C, VS = ±18 V, VCM = VS / 2, RL = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted.
50
25
0
-25
-50
-75
-100
75
25
±25
±75
±125
-125
-75
±75
-50
-25
0
25
50
75
Temperature (qC)
100
125
±50
±25
0
150
25
50
75
100
125
Temperature (ƒC)
150
C001
4 typical units
Statistical Distribution
Figure 10. Offset Voltage vs Temperature
Figure 9. Offset Voltage vs Temperature
250
25
Input Offset Voltage (µV)
Input Offset Voltage ( V)
200
15
VCM = ±18.1 V
5
±5
±15
Transition
150
100
P-Channel
VCM = -18.1 V
50
0
±50
N-Channel
VCM = 18 V
±100
±150
±200
±250
±25
±20
±15
±10
±5
0
5
Common Mode Voltage (V)
10
15
13
14
Figure 11. Offset Voltage vs Common-Mode Voltage
15
16
17
18
Common Mode Voltage (V)
C001
19
C001
Figure 12. Offset Voltage vs Common-Mode Voltage in
Transition Region
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160
20
140
15
120
10
100
Gain (dB)
25
5
0
-5
180
Open-loop Gain
135
Phase
90
80
45
60
0
40
20
-10
0
-15
±20
-20
±40
-45
-90
0.1
-25
0
r5
r10
r15
Power Supply Voltage (V)
Phase (ƒ)
Input Offset Volatge (PV)
At TA = 25°C, VS = ±18 V, VCM = VS / 2, RL = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted.
1.0
10.0 100.0
1k
10k
100k
1M
-135
10M 100M
Frequency (Hz)
r20
C001
30 typical units
Figure 14. Open-Loop Gain and Phase vs Frequency
Figure 13. Offset Voltage vs Power Supply
1000
60
800
G = +1
600
Input Bias Current (pA)
40
G = -1
G= -10
Gain (dB)
G= -100
20
0
400
200
0
±200
±400
±600
±800
-20
100
1k
10k
100k
1M
10M
Frequency (Hz)
100M
±1000
±20
±10
±5
0
5
10
Common Mode Voltage (V)
Figure 15. Closed-Loop Gain vs Frequency
15
20
C001
Figure 16. Input Bias Current vs Common-Mode Voltage
10
20
IB IB+
9
18
8
16
7
14
Output Voltage (V)
Input Bias Current (nA)
±15
C004
6
5
4
3
2
12
10
8
6
40qC
25qC
85qC
125qC
4
1
2
0
±75
±50
±25
0
25
50
75
100
125
Temperature (ƒC)
150
C001
0
0
20
40
60
Output Current (mA)
80
100
Sourcing
Figure 17. Input Bias Current vs Temperature
14
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Figure 18. Output Voltage Swing vs Output Current
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At TA = 25°C, VS = ±18 V, VCM = VS / 2, RL = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted.
0
Common-Mode Rejection Ratio (dB)
-4
Output Voltage (V)
140
40qC
25qC
85qC
125qC
-2
-6
-8
-10
-12
-14
-16
-18
120
100
80
60
40
CMRR
+PSRR
20
±PSRR
0
0.1
-20
0
20
40
60
Output Current (mA)
80
1.0
10.0
100.0
100
1k
10k
100k
1M
10M
Frequency (Hz)
C004
Sinking
Figure 20. CMRR and PSRR vs Frequency
10
5
VS = ±2.25 V, (V±) ” 9CM ” 9
8
Power-Supply Rejection Ratio (µV/V)
Common-Mode Rejection Ratio (µV/V)
Figure 19. Output Voltage Swing vs Output Current
±3V
6
4
2
0
-2
VS = ±18 V, (V±) ” 9CM ” 9
±3V
-4
-6
-8
-10
4
3
2
1
0
-1
-2
-3
-4
-5
±75
±50
±25
0
25
50
75
100
Temperature (ƒC)
125
150
±75
±50
0
25
50
75
100
125
Temperature (ƒC)
C001
100
10
1
10
100
Time (1 s/div)
1k
10k
100k
1M
10M
Frequency (Hz)
Figure 23. 0.1-Hz to 10-Hz Noise
150
Figure 22. PSRR vs Temperature
Voltage Noise Spectral Density (nv/¥Hz)
Figure 21. CMRR vs Temperature
400 nV/div
±25
C001
C002
Figure 24. Input Voltage Noise Spectral Density
vs Frequency
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0.1
0.5
-40
G = -1, 2k- Load
G = -1, 10k- Load
G = +1, 2k- Load
G = +1, 10k- Load
-60
0.01
-80
0.001
-100
0.0001
-120
-140
20k
0.00001
20
200
2k
Frequency (Hz)
C004
G = 1 V/V, RL = 2 k:
G = 1 V/V, RL = 10 k:
Total Harmonic Distortion + Noise (%)
1
Total Harmonic Distortion + Noise (dB)
Total Harmonic Distortion + Noise (%)
At TA = 25°C, VS = ±18 V, VCM = VS / 2, RL = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted.
0.1
0.01
0.001
0.0005
0.01
Figure 25. THD+N vs Frequency
10
20
Figure 26. THD+N vs Output Amplitude
VS = r2.25 V
180
VS = r18 V
160
Quiescent Current (µA)
Quiescent Current (PA)
180
140
120
100
80
60
40
VS = ±18 V
160
140
VS = ±2.25 V
120
100
80
60
40
20
20
0
±75
0
0
2
4
6
8
10
12
14
Supply Voltage (V)
16
18
5.0
4.0
3.0
3.0
25
50
75
100
125
150
C001
VS = ±2.25 V
2.0
AOL (µV/V)
VS = ±2.25 V
0.0
±1.0
0
Figure 28. Quiescent Current vs Temperature
4.0
1.0
±25
Temperature (ƒC)
5.0
2.0
±50
20
Figure 27. Quiescent Current vs Supply Voltage
AOL (µV/V)
0.1
1
Output Amplitude (VRMS)
200
200
VS = ±18 V
1.0
0.0
±1.0
±2.0
±2.0
±3.0
±3.0
±4.0
±4.0
±5.0
VS = ±18 V
±5.0
±75
±50
±25
0
25
50
75
100
125
Temperature (ƒC)
150
±75
±50
±25
25
50
75
100
125
150
C001
RL = 2k Ω
Figure 29. Open-Loop Gain vs Temperature
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0
Temperature (ƒC)
C001
RL = 10k Ω
16
G = 1 V/V, RL = 2 k:
G = 1 V/V, RL = 10 k:
Figure 30. Open-Loop Gain vs Temperature
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At TA = 25°C, VS = ±18 V, VCM = VS / 2, RL = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted.
100k
60
RISO = 0
RISO = 25
50
RISO = 50
ZO (:)
Overshoot (%)
10k
1k
40
30
20
10
0
100
100m
10
1
10
100
1k
10k
Frequency (Hz)
100k
1M
100
10M
1000
Capacitive Load (pF)
C004
G = –1, 100-mV output step
Figure 32. Small-Signal Overshoot vs Capacitive Load
(100-mV Output Step)
Figure 31. Open-Loop Output Impedance vs Frequency
20
Output
Input
RISO = 0
RISO = 25
Voltage (5 V/div)
Overshoot (%)
RISO = 50
10
0
10
100
1000
Capacitive Load (pF)
Time (50 Ps/div)
C004
G = 1, 100-mV output step
Figure 34. No Phase Reversal
20 mV/div
Negative overload
Positive overload
t=0
Output (V)
Figure 33. Small-Signal Overshoot vs Capacitive Load
Time (2.5 µs/div)
Time (Ps)
C017
VS = ±18 V, G = –10 V/V
Figure 35. Overload Recovery
G = 1, CL = 10 pF
Figure 36. Small-Signal Step Response
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2 V/div
20 mV/div
At TA = 25°C, VS = ±18 V, VCM = VS / 2, RL = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted.
Time (2.5 µs/div)
Time (2.5 µs/div)
C017
C017
G = –1, RL = 1 kΩ, CL = 10 pF
G = 1, CL = 10 pF
Figure 37. Small-Signal Step Response
Figure 38. Large-Signal Step Response
2 V/div
Output Voltage (200 PV/div)
0.01% settling = r200 PV
Time (2.5 µs/div)
Time (500 ns/div)
C017
G = –1, RL = 1 kΩ, CL = 10 pF
Gain = 1, 2-V step, rising, step applied at t = 0 µs on all four plots
Figure 40. 0.01% Settling Time
Figure 39. Large-Signal Step Response
0.01% settling = r500 PV
Output Voltage (200 PV/div)
Output Voltage (200 PV/div)
0.01% settling = r200 PV
Time (500 ns/div)
Gain = 1, 2-V step, falling, step applied at t = 0 µs
Figure 41. 0.01% Settling Time
18
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Time (500 ns/div)
Gain = 1, 5-V step, rising, step applied at t = 0 µs
Figure 42. 0.01% Settling Time
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At TA = 25°C, VS = ±18 V, VCM = VS / 2, RL = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted.
100
Output Voltage (200 PV/div)
Short Circuit Current (mA)
0.01% settling = r500 PV
ISC, Source
80
60
ISC, Sink
40
20
0
±75
Time (500 ns/div)
±50
0
±25
25
50
75
100
125
150
Temperature (ƒC)
Gain = 1, 5-V step, falling, step applied at t = 0 µs
Figure 43. 0.01% Settling Time
C001
Figure 44. Short-Circuit Current vs Temperature
35
Maximum output voltage without
slew-rate induced distortion.
VS = ±15 V
25
20
15
10
Overdrive = 100 mV
Output Voltage (10 V/div)
Output Voltage (VPP)
30
VS = ±4 V
tpLH = 26 µs
VOUT Voltage
5
VS = ±2.25 V
0
100
1k
10k
100k
1M
Frequency (Hz)
Time (10 µs/div)
10M
C001
C017
Output Voltage (10 V/div)
Figure 45. Maximum Output Voltage vs Frequency
Figure 46. Propagation Delay Rising Edge
tpHL = 26 µs
VOUT Voltage
Overdrive = 100 mV
Time (10 µs/div)
C017
Figure 47. Propagation Delay Falling Edge
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7 Parameter Measurement Information
7.1 Input Offset Voltage Drift
The OPAx191 family of operational amplifiers is manufactured using TI’s e-trim technology. The e-trim
technology is a TI proprietary method of trimming internal device parameters during either wafer probing or final
testing. Each amplifier input offset voltage and input offset voltage drift is trimmed in production, thereby
minimizing errors associated with input offset voltage and input offset voltage drift. When trimming input offset
voltage drift, the systematic or linear drift error on each device is trimmed to zero. Figure 48 illustrates this
concept.
Input Offset Voltage
VOS Before e-trim
VOS After e-trim
Linear component of drift
Linear component of drift
Temperature
Figure 48. Input Offset Before and After Drift Trim
A common method of specifying input offset voltage drift is the box method. The box method estimates a
maximum input offset drift by bounding an offset voltage versus temperature curve with a box and using the
corners of this bounding box to determine the drift. The slope of the line connecting the diagonal corners of the
box corresponds to the input offset voltage drift. Figure 49 illustrates the box method concept. The box method
works particularly well when the input offset drift is dominated by the linear component of drift, but because the
OPA191 family uses TI’s e-trim technology to remove the linear component input offset voltage drift, the box
method is not a particularly useful method of accurately performing an error analysis. Shown in Figure 49 are 30
typical units of OPAx191 with the box method superimposed for illustrative purposes. The boundaries of the box
are determined by the specified temperature range along the x-axis and the maximum specified input offset
voltage across that same temperature range along the y-axis. Using the box method predicts an input offset
voltage drift of 0.9 µV/°C. As shown in Figure 49, the slopes of the actual input offset voltage versus temperature
are much less than that predicted by the box method. The box method predicts a pessimistic value for the
maximum input offset voltage drift and is not recommended when performing an error analysis.
Offset Voltage vs Temperature
100
75
Offset Voltage (PV)
50
25
0
-25
-50
-75
-100
-50
-25
0
25
50
75
Temperature (qC)
100
125
150
Figure 49. The Box Method
20
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Input Offset Voltage Drift (continued)
Instead of the box method, a convenient way to illustrate input offset drift is to compute the slopes of the input
offset voltage versus temperature curve. This is the same as computing the input offset drift at each point along
the input offset voltage versus temperature curve. The results for the OPAx191 family are illustrated in Figure 50.
Input Offset Voltage Drift ( V / ºC)
1.2
0.9
0.6
+3 1
0.3
1
0
-1
-0.3
-0.6
-0.9
-3 1
-1.2
±75
±50
±25
0
25
50
75
100
125
Temperature (ƒC)
150
C001
Figure 50. Input Offset Voltage Drift vs Temperature
(SOIC Package)
As illustrated in Figure 50, the input offset drift is typically less than ±0.3 µV/°C over the range from –40°C to
+125°C. When performing an error analysis over the full specified temperature range, use the typical and
maximum values for input offset voltage drift as described in the Electrical Characteristics tables. If a reduced
temperature range is applicable, use the information illustrated in Figure 50 when performing an error analysis.
To determine the change in input offset voltage, use Equation 1:
ΔVOS = ΔT × dVOS/dT
where
•
•
•
ΔVOS = Change in input offset voltage
ΔT = Change in temperature
dVOS/dT = Input offset voltage drift
(1)
For example, determine the amount of OPA191ID input offset voltage change over the temperature range of
25°C to 75°C for 1 σ (68%) of the units. As shown in Figure 50, the input offset drift is typically 0.25 µV/°C. This
input offset drift results in a typical input offset voltage change of (75°C – 25°C) × 0.25 µV/°C = 12.5 µV.
For 3 σ (99.7%) of the units, Figure 50 shows a typical input offset drift of approximately 0.75 µV/°C. This input
offset drift results in a typical input offset voltage change of (75°C – 25°C) × 0.75 µV/°C = 37.5 µV.
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8 Detailed Description
8.1 Overview
The OPAx191 family of operational amplifiers use e-trim, a method of package-level trim for offset and offset
temperature drift implemented during the final steps of manufacturing after the plastic molding process. This
method minimizes the influence of inherent input transistor mismatch, as well as errors induced during package
molding. The trim communication occurs on the output pin of the standard pinout, and after the trim points are
set, further communication to the trim structure is permanently disabled. The Functional Block Diagram section
shows the simplified diagram of the OPA191 with e-trim.
Unlike previous e-trim op amps, the OPAx191 uses a patented two-temperature trim architecture to achieve a
very low offset voltage and low voltage offset drift over the full specified temperature range. This level of
precision performance at wide supply voltages makes these amplifiers useful for high-impedance industrial
sensors, filters, and high-voltage data acquisition.
8.2 Functional Block Diagram
OPAx191
NCH Input
Stage
IN+
36-V
Differential
Front End
Slew
Boost
High
Capacitive Load
Compensation
Output
Stage
VOUT
IN
PCH Input
Stage
t
e-trim
Package Level Trim
22
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8.3 Feature Description
8.3.1 Input Protection Circuitry
The OPAx191 uses a unique input architecture to eliminate the need for input protection diodes but still provides
robust input protection under transient conditions. Conventional input diode protection schemes shown in
Figure 51 can be activated by fast transient step responses and can introduce signal distortion and settling time
delays because of alternate current paths, as shown in Figure 52. For low-gain circuits, these fast-ramping input
signals forward-bias back-to-back diodes that cause an increase in input current, resulting in extended settling
time.
V+
V+
VIN+
VIN+
VOUT
VOUT
OPAx191
36 V
~0.7 V
VIN
VIN
V
OPAx191 Provides Full 36V Differential Input Range
V
Conventional Input Protection
Limits Differential Input Range
Figure 51. OPA191 Input Protection Does Not Limit Differential Input Capability
Vn = +10 V
RFILT
+10 V
1
Ron_mux
Sn
1
D
+10 V
CFILT
2
~±9.3 V
CS
CD
Vn+1 = ±10 V RFILT
±10 V
Ron_mux
Sn+1
Vin±
2
~0.7 V
CFILT
CS
Vout
Idiode_transient
±10 V
Input Low Pass Filter
Vin+
Buffer Amplifier
Simplified Mux Model
Figure 52. Back-to-Back Diodes Create Settling Issues
The OPAx191 family of operational amplifiers provides a true high-impedance differential input capability for highvoltage applications. This patented input protection architecture does not introduce additional signal distortion or
delayed settling time, making the device an optimal op amp for multichannel, high-switched, input applications.
The OPA191 can tolerate a maximum differential swing (voltage between inverting and noninverting pins of the
op amp) of up to 36 V, making the device suitable for use as a comparator or in applications with fast-ramping
input signals such as multiplexed data-acquisition systems (see Figure 64.
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Feature Description (continued)
8.3.2 EMI Rejection
The OPAx191 uses integrated electromagnetic interference (EMI) filtering to reduce the effects of EMI from
sources such as wireless communications and densely-populated boards with a mix of analog signal chain and
digital components. EMI immunity can be improved with circuit design techniques; the OPAx191 benefits from
these design improvements. Texas Instruments has developed the ability to accurately measure and quantify the
immunity of an operational amplifier over a broad frequency spectrum extending from 10 MHz to 6 GHz.
Figure 53 shows the results of this testing on the OPAx191. Table 2 shows the EMIRR IN+ values for the
OPAx191 at particular frequencies commonly encountered in real-world applications. Applications listed in
Table 2 may be centered on or operated near the particular frequency shown. Detailed information can also be
found in the application report EMI Rejection Ratio of Operational Amplifiers, SBOA128, available for download
from www.ti.com.
120
EMIRR IN+ (dB)
100
80
60
40
20
0
10
100
1k
Frequency (MHz)
10k
PRF = –10 dBm, VS = ±15 V, VCM = 0 V
Figure 53. EMIRR Testing
Table 2. OPA191 EMIRR IN+ For Frequencies of Interest
FREQUENCY
APPLICATION OR ALLOCATION
EMIRR IN+
400 MHz
Mobile radio, mobile satellite, space operation, weather, radar, ultra-high frequency (UHF)
applications
36 dB
900 MHz
Global system for mobile communications (GSM) applications, radio communication, navigation,
GPS (to 1.6 GHz), GSM, aeronautical mobile, UHF applications
45 dB
1.8 GHz
GSM applications, mobile personal communications, broadband, satellite, L-band (1 GHz to 2 GHz)
57 dB
®
24
2.4 GHz
802.11b, 802.11g, 802.11n, Bluetooth , mobile personal communications, industrial, scientific and
medical (ISM) radio band, amateur radio and satellite, S-band (2 GHz to 4 GHz)
62 dB
3.6 GHz
Radiolocation, aero communication and navigation, satellite, mobile, S-band
76 dB
5.0 GHz
802.11a, 802.11n, aero communication and navigation, mobile communication, space and satellite
operation, C-band (4 GHz to 8 GHz)
86 dB
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8.3.3 Phase Reversal Protection
The OPAx191 family has internal phase-reversal protection. Many op amps exhibit phase reversal when the
input is driven beyond the linear common-mode range. This condition is most often encountered in noninverting
circuits when the input is driven beyond the specified common-mode voltage range, causing the output to
reverse into the opposite rail. The OPAx191 is a rail-to-rail input op amp, and therefore the common-mode range
can extend up to the rails. Input signals beyond the rails do not cause phase reversal; instead, the output limits
into the appropriate rail. This performance is shown in Figure 54.
5 V/div
VIN
VOUT
Time (35 ms/div)
C017
Figure 54. No Phase Reversal
8.3.4 Thermal Protection
The internal power dissipation of any amplifier causes the internal (junction) temperature to rise. This
phenomenon is called self heating. The OPAx191 has a thermal protection feature that prevents damage from
self heating.
This thermal protection works by monitoring the temperature of the output stage and turning off the op amp
output drive for temperatures above approximately 180°C. Thermal protection forces the output to a highimpedance state. The OPAx191 is also designed with approximately 30°C of thermal hysteresis. Thermal
hysteresis prevents the output stage from cycling in and out of the high-impedance state. The OPAx191 returns
to normal operation when the output stage temperature falls below approximately 150°C.
The absolute maximum junction temperature of the OPAx191 is 150°C. Exceeding the limits shown in the
Absolute Maximum Ratings table may cause damage to the device. Thermal protection triggers at 180°C
because of unit-to-unit variance, but does not interfere with device operation up to the absolute maximum ratings.
This thermal protection is not designed to prevent this device from exceeding absolute maximum ratings, but
rather from excessive thermal overload.
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8.3.5 Capacitive Load and Stability
The OPAx191 features a patented output stage capable of driving large capacitive loads, and in a unity-gain
configuration, directly drives up to 1 nF of pure capacitive load. Increasing the gain enhances the ability of the
amplifier to drive greater capacitive loads; see Figure 55. The particular op amp circuit configuration, layout, gain,
and output loading are some of the factors to consider when establishing whether an amplifier will be stable in
operation.
Output (50 mV/Div)
G = +1 V/V
Time (2 Ps/Div)
Figure 55. Transient Response with a Purely Capacitive Load of 1 nF
Like many low-power amplifiers, some ringing can occur even with capacitive loads less than 100 pF. In unitygain configurations with no or very light dc loads, place an RC snubber circuit at the OPAx191 output to reduce
any possibility of ringing in lightly-loaded applications. Figure 56 illustrates the recommended RC snubber circuit.
±
Output
Input
+
R 619
C 320 pF
Figure 56. RC Snubber Circuit for Lightly-Loaded Applications in Unity Gain
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For additional drive capability in unity-gain configurations, improve capacitive load drive by inserting a small,
10-Ω to 20-Ω resistor (RISO) in series with the output, as shown in Figure 57. This resistor significantly reduces
ringing while maintaining dc performance for purely capacitive loads. However, if there is a resistive load in
parallel with the capacitive load, a voltage divider is created, introducing a gain error at the output and slightly
reducing the output swing. The error introduced is proportional to the ratio RISO / RL, and is generally negligible at
low output levels. A high capacitive load drive makes the OPA191 well suited for applications such as reference
buffers, MOSFET gate drives, and cable-shield drives. The circuit shown in Figure 57 uses RISO to stabilize the
output of an op amp. RISO modifies the open-loop gain of the system for increased phase margin. Results using
the OPA191 are summarized in Table 3. For additional information on techniques to optimize and design using
this circuit, TI Precision Design TIDU032 details complete design goals, simulation, and test results.
+Vs
Vout
Riso
+
Cload
+
±
Vin
-Vs
Figure 57. Extending Capacitive Load Drive With the OPA191
Table 3. OPA191 Capacitive Load Drive Solution Using Isolation Resistor Comparison of Calculated and
Measured Results
PARAMETER
VALUE
Capacitive Load
100 pF
Phase Margin
45°
45°
1000 pF
60°
45°
0.01 µF
60°
45°
0.1 µF
60°
45°
1 µF
60°
RISO (Ω)
280
113
432
68
210
17.8
53.6
3.6
10
Measured
Overshoot (%)
23
23
8
23
8
23
8
23
8
For step-by-step design procedure, circuit schematics, bill of materials, printed circuit board (PCB) files,
simulation results, and test results, refer to TI Precision Design TIDU032, Capacitive Load Drive Solution using
an Isolation Resistor .
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8.3.6 Common-Mode Voltage Range
The OPAx191 is a 36-V, true rail-to-rail input operational amplifier with an input common-mode range that
extends 100 mV beyond either supply rail. This wide range is achieved with paralleled complementary N-channel
and P-channel differential input pairs, as shown in Figure 58. The N-channel pair is active for input voltages
close to the positive rail, typically (V+) – 3 V to 100 mV above the positive supply. The P-channel pair is active
for inputs from 100 mV below the negative supply to approximately (V+) – 1.5 V. There is a small transition
region, typically (V+) –3 V to (V+) – 1.5 V in which both input pairs are active. This transition region varies
modestly with process variation. Within this region PSRR, CMRR, offset voltage, offset drift, noise, and THD
performance are degraded compared to operation outside this region.
+Vsupply
IS1
VINPCH1
NCH4
NCH3
PCH2
VIN+
e-TrimTM
FUSE BANK
VOS TRIM
VOS DRIFT TRIM
-Vsupply
Figure 58. Rail-to-Rail Input Stage
To achieve the best performance for two-stage rail-to-rail input amplifiers, avoid the transition region when
possible. The OPAx191 uses a precision trim for both the N-channel and P-channel regions. This technique
enables significantly lower levels of offset than previous-generation devices, causing variance in the transition
region of the input stages to appear exaggerated relative to offset over the full common-mode range, as shown in
Figure 59.
Transition
Region
N-Channel
Region
P-Channel
Region
200
200
100
100
Input Offset Voltage ( V)
Input Offset Voltage ( V)
P-Channel
Region
0
±100
OPAx191 e-Trim
Input Offset Voltage vs Vcm
±200
Transition
Region
N-Channel
Region
0
±100
±200
Input Offset Voltage vs Vcm
without e-Trim Input
±300
±15.0
±14.0
«
11.0
12.0
13.0
Common-Mode Voltage (V)
14.0
15.0
±300
±15.0
±14.0
«
11.0
12.0
13.0
Common-Mode Voltage (V)
14.0
15.0
Figure 59. Common-Mode Transition vs Standard Rail-to-Rail Amplifiers
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8.3.7 Electrical Overstress
Designers often ask questions about the capability of an operational amplifier to withstand electrical overstress
(EOS). These questions tend to focus on the device inputs, but may involve the supply voltage pins or even the
output pin. Each of these different pin functions have electrical stress limits determined by the voltage breakdown
characteristics of the particular semiconductor fabrication process and specific circuits connected to the pin.
Additionally, internal electrostatic discharge (ESD) protection is built into these circuits to protect them from
accidental ESD events both before and during product assembly.
Having a good understanding of this basic ESD circuitry and its relevance to an electrical overstress event is
helpful. See Figure 60 for an illustration of the ESD circuits contained in the OPAx191 (indicated by the dashed
line area). The ESD protection circuitry involves several current-steering diodes connected from the input and
output pins and routed back to the internal power-supply lines, where the diodes meet at an absorption device or
the power-supply ESD cell, internal to the operational amplifier. This protection circuitry is intended to remain
inactive during normal circuit operation.
TVS
±
+
RF
+VS
VDD
R1
RS
IN±
100 Ÿ
IN+
100 Ÿ
OPAx191
±
+
Power-Supply
ESD Cell
ID
RL
+
VIN
±
VSS
+
±
±VS
TVS
Figure 60. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application
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An ESD event is very high voltage for a very short duration (for example, 1 kV for 100 ns); whereas, an EOS
event is lower voltage for a longer duration (for example, 50 V for 100 ms). The ESD diodes are designed for
out-of-circuit ESD protection (that is, during assembly, test, and storage of the device before being soldered to
the PCB). During an ESD event, the ESD signal is passed through the ESD steering diodes to an absorption
circuit labeled ESD power-supply circuit. The ESD absorption circuit clamps the supplies to a safe level.
Although this behavior is necessary for out-of-circuit protection, excessive current and damage is caused if
activated in-circuit. A transient voltage suppressor (TVS) can be used to prevent against damage caused by
turning on the ESD absorption circuit during an in-circuit ESD event. Using the appropriate current limiting
resistors and TVS diodes allows for the use of device ESD diodes to protect against EOS events.
8.3.8 Overload Recovery
Overload recovery is defined as the time required for the op amp output to recover from a saturated state to a
linear state. The output devices of the op amp enter a saturation region when the output voltage exceeds the
rated operating voltage, either due to the high input voltage or the high gain. After the device enters the
saturation region, the charge carriers in the output devices require time to return back to the linear state. After
the charge carriers return back to the linear state, the device begins to slew at the specified slew rate. Thus, the
propagation delay in case of an overload condition is the sum of the overload recovery time and the slew time.
8.4 Device Functional Modes
The OPAx191 has a single functional mode and is operational when the power-supply voltage is greater than
4.5 V (±2.25 V). The maximum power supply voltage for the OPAx191 is 36 V (±18 V).
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The OPAx191 family offers outstanding dc precision and ac performance. These devices operate up to 36-V
supply rails and offer true rail-to-rail input/output, ultralow offset voltage and offset voltage drift, as well as
2-MHz bandwidth and high capacitive load drive. These features make the OPAx191 a robust, high-performance
operational amplifier for high-voltage industrial applications.
9.2 Typical Applications
9.2.1 Low-side Current Measurement
Figure 61 shows the OPA191 configured in a low-side current sensing application. For a full analysis of the
circuit shown in Figure 61 including theory, calculations, simulations, and measured data see the 0-1A, singlesupply, low-side, current sensing solutionTIPD129.
VCC
5V
LOAD
+
OPA191
VOUT
±
ILOAD
RSHUNT
100m
LM7705
RF
360k
RG
7.5k
Figure 61. OPA191 in a Low-Side, Current-Sensing Application
9.2.1.1 Design Requirements
The design requirements for this design are:
• Load current: 0 A to 1 A
• Output voltage: 4.9 V
• Maximum shunt voltage: 100 mV
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Typical Applications (continued)
9.2.1.2 Detailed Design Procedure
The transfer function of the circuit in Figure 61 is given in Equation 2
VOUT ILOAD u RSHUNT u Gain
(2)
The load current (ILOAD) produces a voltage drop across the shunt resistor (RSHUNT). The load current is set from
0 A to 1 A. To keep the shunt voltage below 100 mV at maximum load current, the largest shunt resistor is
defined using Equation 3.
VSHUNT _ MAX 100mV
RSHUNT
100m:
ILOAD _ MAX
1A
(3)
Using Equation 3, RSHUNT is calculated to be 100 mΩ. The voltage drop produced by ILOAD and RSHUNT is
amplified by the OPA191 to produce an output voltage of 0 V to 4.9 V. The gain needed by the OPA191 to
produce the necessary output voltage is calculated using Equation 4:
VOUT _ MAX
Gain
VIN _ MAX
VOUT _ MIN
VIN _ MIN
(4)
Using Equation 4, the required gain is calculated to be 49 V/V, which is set with resistors RF and RG. Equation 5
is used to size the resistors, RF and RG, to set the gain of the OPA191 to 49 V/V.
RF
Gain 1
RG
(5)
Choosing RF as 360 kΩ, RG is calculated to be 7.5 kΩ. RF and RG were chosen as 360 kΩ and 7.5 kΩ because
they are standard value resistors that create a 49:1 ratio. Other resistors that create a 49:1 ratio can also be
used. Figure 2 shows the measured transfer function of the circuit shown in Figure 61.
5
0.1
4
0.08
Error (%FSR)
Output (V)
9.2.1.3 Application Curves
3
2
1
0.04
0.02
0
0
0
0.1
0.2
0.3
0.4
0.5 0.6
ILOAD (A)
0.7
0.8
0.9
1
Figure 62. Low-Side, Current-Sense, Transfer Function
32
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0
0.1
0.2
0.3
0.4
0.5 0.6
ILOAD (A)
0.7
0.8
0.9
1
Figure 63. Low-Side, Current-Sense, Full-Scale Error
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Typical Applications (continued)
9.2.2 16-Bit Precision Multiplexed Data-Acquisition System
Figure 64 shows a 16-bit, differential, 4-channel, multiplexed, data-acquisition system. This example is typical in
industrial applications that require low distortion and a high-voltage differential input. The circuit uses the
ADS8864, a 16-bit, 400-kSPS successive-approximation-resistor (SAR), analog-to-digital converter (ADC), along
with a precision, high-voltage, signal-conditioning front-end, and a 4-channel differential multiplexer (mux). This
application example shows the process for optimizing the precision, high-voltage, front-end drive circuit using the
OPA191 and OPA140 to achieve excellent dynamic performance and linearity with the ADS8864. The full TI
Precision Design can be found in TIDU181.
1
2
Very Low Output Impedance
Input-Filter Bandwidth
3
High-Impedance Inputs
No Differential Input Clamps
Fast Settling-Time Requirements
Attenuate High-Voltage Input Signal
Fast-Settling Time Requirements
Stability of the Input Driver
Attenuate ADC Kickback Noise
VREF Output: Value and Accuracy
Low Temp and Long-Term Drift
Voltage
Reference
CH0+
±20-V,
10-kHz
Sine Wave
4
+
RC Filter
Buffer
RC Filter
OPA191
Reference Driver
+
CH0-
Gain
Network
OPA191
Gain
Network
+
OPA191
4:2
Mux
REFP
+
CH3+
±20-V,
10-kHz
Sine Wave
+
OPA140
Gain
Network
OPA191
VINP
+
Antialiasing
Filter
OPA191
SAR
ADC
+
VINM
OPA191
CONV
Gain
Network
CH3n
16 Bits
400 kSPS
High-Voltage Level Translation
High-Voltage Multiplexed Input
VCM
REF3240
Voltage
Divider
OPA350
VCM Generation Circuit
Counter
n
Shmidtt
Trigger
Delay
Digital Counter For Multiplexer
5
Fast logic transition
Figure 64. OPA191 in 16-Bit, 400-kSPS, 4-Channel, Multiplexed Data Acquisition System for High-Voltage
Inputs With Lowest Distortion
9.2.2.1 Design Requirements
The primary objective is to design a ±20-V, differential, 4-channel, multiplexed, data acquisition system with
lowest distortion using the 16-bit ADS8864 at a throughput of 400 kSPS for a 10-kHz, full-scale, pure sine-wave
input. The design requirements for this block design are:
• System supply voltage: ±15 V
• ADC supply voltage: 3.3 V
• ADC sampling rate: 400 kSPS
• ADC reference voltage (REFP): 4.096 V
• System input signal: A high-voltage differential input signal with a peak amplitude of 10 V and frequency
(fIN) of 10 kHz are applied to each differential input of the mux.
9.2.2.2 Detailed Design Procedure
The purpose of this application example is to design an optimal, high-voltage, multiplexed, data-acquisition
system for highest system linearity and fast settling. The overall system block diagram is shown in Figure 64.
The circuit is a multichannel, data-acquisition, signal chain consisting of an input low-pass filter, multiplexer
(mux), mux output buffer, attenuating SAR ADC driver, digital counter for the mux, and the reference driver. The
architecture allows fast sampling of multiple channels using a single ADC, providing a low-cost solution. The two
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Typical Applications (continued)
primary design considerations to maximize the performance of a precision, multiplexed, data-acquisition system
are the mux input analog front-end and the high-voltage, level translation, SAR ADC driver design. However,
carefully design each analog circuit block based on the ADC performance specifications in order to achieve the
fastest settling at 16-bit resolution and lowest distortion system. Figure 64 includes the most important
specifications for each individual analog block.
This design systematically approaches each analog circuit block to achieve a 16-bit settling for a full-scale input
stage voltage and linearity for a 10-kHz sinusoidal input signal at each input channel. The first step in the design
is to understand the requirement for an extremely-low-impedance input-filter design for the mux. This
understanding helps in the decision of an appropriate input filter and selection of a mux to meet the system
settling requirements. The next important step is the design of the attenuating analog front-end (AFE) used to
level translate the high-voltage input signal to a low-voltage ADC input while maintaining the amplifier stability.
Then, the next step is to design a digital interface to switch the mux input channels with minimum delay. The final
design challenge is to design a high-precision, reference-driver circuit that provides the required REFP reference
voltage with low offset, drift, and noise contributions.
For step-by-step design procedure, circuit schematics, bill of materials, PCB files, simulation results, and test
results, refer to TI Precision Design TIDU181, 16-bit, 400-kSPS, 4-Channel, Multiplexed Data Acquisition
System for High Voltage Inputs with Lowest Distortion.
9.2.3 Slew Rate Limit for Input Protection
In control systems for valves or motors, abrupt changes in voltages or currents can cause mechanical damages.
By controlling the slew rate of the command voltages into the drive circuits, the load voltages ramps up and down
at a safe rate. For symmetrical slew-rate applications (positive slew rate equals negative slew rate), one
additional op amp provides slew-rate control for a given analog gain stage. The unique input protection and high
output current and slew rate of the OPAx191 make the device an optimal amplifier to achieve slew rate control
for both dual- and single-supply systems.Figure 65 shows the OPA191 in a slew-rate limit design.
Op Amp Gain Stage
Slew Rate Limiter
C1
R1
VCC
VCC
+
VIN
R2
OPA191
+
OPA191
+
VOUT
VEE
RL
VEE
Figure 65. Slew Rate Limiter Uses One Op Amp
For step-by-step design procedure, circuit schematics, bill of materials, PCB files, simulation results, and test
results, refer to TI Precision Design TIDU026, Slew Rate Limiter Uses One Op Amp.
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10 Power-Supply Recommendations
The OPAx191 is specified for operation from 4.5 V to 36 V (±2.25 V to ±18 V); many specifications apply from
–40°C to +125°C. Parameters that can exhibit significant variance with regard to operating voltage or
temperature are presented in the Typical Characteristics.
CAUTION
Supply voltages larger than 40 V can permanently damage the device; see the
Absolute Maximum Ratings.
Place 0.1-μF bypass capacitors close to the power-supply pins to reduce errors coupling in from noisy or highimpedance power supplies. For more detailed information on bypass capacitor placement, refer to the Layout
section.
11 Layout
11.1 Layout Guidelines
For best operational performance of the device, use good PCB layout practices, including:
• Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as close
to the device as possible. A single bypass capacitor from V+ to ground is applicable for single-supply
applications.
– Noise can propagate into analog circuitry through the power pins of the circuit as a whole and op amp
itself. Bypass capacitors are used to reduce the coupled noise by providing low-impedance power sources
local to the analog circuitry.
• Make sure to physically separate digital and analog grounds paying attention to the flow of the ground
current. Separate grounding for analog and digital portions of circuitry is one of the simplest and mosteffective methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to
ground planes. A ground plane helps distribute heat and reduces EMI noise pickup. For more detailed
information refer to Circuit Board Layout Techniques, SLOA089.
• In order to reduce parasitic coupling, run the input traces as far away from the supply or output traces as
possible. If these traces cannot be kept separate, crossing the sensitive trace perpendicular is much better as
opposed to in parallel with the noisy trace.
• Place the external components as close to the device as possible. As shown in Figure 67, keeping RF and
RG close to the inverting input minimizes parasitic capacitance.
• Keep the length of input traces as short as possible. Always remember that the input traces are the most
sensitive part of the circuit.
• Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly reduce
leakage currents from nearby traces that are at different potentials.
• Clean the PCB following board assembly for best performance.
• Any precision integrated circuit may experience performance shifts due to moisture ingress into the plastic
package. After any aqueous PCB cleaning process, bake the PCB assembly to remove moisture introduced
into the device packaging during the cleaning process. A low-temperature, post-cleaning bake at 85°C for 30
minutes is sufficient for most circumstances.
Copyright © 2015–2016, Texas Instruments Incorporated
Product Folder Links: OPA191 OPA2191 OPA4191
Submit Documentation Feedback
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OPA191, OPA2191, OPA4191
SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
www.ti.com
11.2 Layout Example
+
VIN
VOUT
RG
RF
Figure 66. Schematic Representation
Run the input traces
as far away from
the supply lines
as possible
Place components
close to device and to
each other to reduce
parasitic errors
VS+
RF
N/C
N/C
GND
±IN
V+
VIN
+IN
OUTPUT
V±
N/C
RG
Use low-ESR,
ceramic bypass
capacitor
GND
VS±
GND
Use low-ESR, ceramic
bypass capacitor
VOUT
Ground (GND) plane on another layer
Figure 67. Operational Amplifier Board Layout for Noninverting Configuration
36
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Copyright © 2015–2016, Texas Instruments Incorporated
Product Folder Links: OPA191 OPA2191 OPA4191
OPA191, OPA2191, OPA4191
www.ti.com
SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
12 Device and Documentation Support
12.1 Device Support
12.1.1 Development Support
12.1.1.1 TINA-TI™ (Free Software Download)
TINA™ is a simple, powerful, and easy-to-use circuit simulation program based on a SPICE engine. TINA-TI is a
free, fully-functional version of the TINA software, preloaded with a library of macro models in addition to a range
of both passive and active models. TINA-TI provides all the conventional dc, transient, and frequency domain
analysis of SPICE, as well as additional design capabilities.
Available as a free download from the Analog eLab Design Center, TINA-TI offers extensive post-processing
capability that allows users to format results in a variety of ways. Virtual instruments offer the ability to select
input waveforms and probe circuit nodes, voltages, and waveforms, creating a dynamic quick-start tool.
NOTE
These files require that either the TINA software (from DesignSoft™) or TINA-TI software
be installed. Download the free TINA-TI software from the TINA-TI folder at
http://www.ti.com/tool/tina-ti.
12.1.1.2 TI Precision Designs
TI Precision Designs, available online at http://www.ti.com/ww/en/analog/precision-designs/, are analog solutions
created by TI’s precision analog applications experts and offer the theory of operation, component selection,
simulation, complete PCB schematic and layout, bill of materials, and measured performance of many useful
circuits.
12.2 Documentation Support
12.2.1 Related Documentation
• Circuit Board Layout Techniques, SLOA089.
• Op Amps for Everyone, SLOD006.
12.3 Related Links
Table 4 lists quick access links. Categories include technical documents, support and community resources,
tools and software, and quick access to sample or buy.
Table 4. Related Links
PARTS
PRODUCT FOLDER
SAMPLE & BUY
TECHNICAL
DOCUMENTS
TOOLS &
SOFTWARE
SUPPORT &
COMMUNITY
OPA191
Click here
Click here
Click here
Click here
Click here
OPA2191
Click here
Click here
Click here
Click here
Click here
OPA4191
Click here
Click here
Click here
Click here
Click here
12.4 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
Copyright © 2015–2016, Texas Instruments Incorporated
Product Folder Links: OPA191 OPA2191 OPA4191
Submit Documentation Feedback
37
OPA191, OPA2191, OPA4191
SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016
www.ti.com
12.5 Trademarks
E2E is a trademark of Texas Instruments.
TINA-TI is a trademark of Texas Instruments, Inc and DesignSoft, Inc.
Bluetooth is a registered trademark of Bluetooth SIG, Inc.
TINA, DesignSoft are trademarks of DesignSoft, Inc.
All other trademarks are the property of their respective owners.
12.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
38
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Copyright © 2015–2016, Texas Instruments Incorporated
Product Folder Links: OPA191 OPA2191 OPA4191
PACKAGE OPTION ADDENDUM
www.ti.com
4-Apr-2017
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
OPA191ID
ACTIVE
SOIC
D
8
75
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
OPA191
OPA191IDBVR
ACTIVE
SOT-23
DBV
5
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
ZAMV
OPA191IDBVT
ACTIVE
SOT-23
DBV
5
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
ZAMV
OPA191IDGKR
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
ZANV
OPA191IDGKT
ACTIVE
VSSOP
DGK
8
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
ZANV
OPA191IDR
ACTIVE
SOIC
D
8
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
OPA191
OPA2191ID
ACTIVE
SOIC
D
8
75
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
2191
OPA2191IDGKR
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
2191
OPA2191IDGKT
ACTIVE
VSSOP
DGK
8
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
2191
OPA2191IDR
ACTIVE
SOIC
D
8
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
2191
OPA4191ID
ACTIVE
SOIC
D
14
50
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 125
OPA4191
OPA4191IDR
ACTIVE
SOIC
D
14
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 125
OPA4191
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
4-Apr-2017
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
30-Apr-2017
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
OPA191IDGKR
Package Package Pins
Type Drawing
VSSOP
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
DGK
8
2500
330.0
12.4
5.3
3.4
1.4
8.0
12.0
Q1
OPA191IDR
SOIC
D
8
2500
330.0
12.4
6.4
5.2
2.1
8.0
12.0
Q1
OPA2191IDGKR
VSSOP
DGK
8
2500
330.0
12.4
5.3
3.4
1.4
8.0
12.0
Q1
OPA2191IDGKT
VSSOP
DGK
8
250
180.0
12.4
5.3
3.4
1.4
8.0
12.0
Q1
OPA2191IDR
SOIC
D
8
2500
330.0
12.4
6.4
5.2
2.1
8.0
12.0
Q1
OPA4191IDR
SOIC
D
14
2500
330.0
16.4
6.5
9.0
2.1
8.0
16.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
30-Apr-2017
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
OPA191IDGKR
VSSOP
DGK
8
2500
346.0
346.0
29.0
OPA191IDR
SOIC
D
8
2500
367.0
367.0
35.0
OPA2191IDGKR
VSSOP
DGK
8
2500
367.0
367.0
35.0
OPA2191IDGKT
VSSOP
DGK
8
250
210.0
185.0
35.0
OPA2191IDR
SOIC
D
8
2500
367.0
367.0
35.0
OPA4191IDR
SOIC
D
14
2500
367.0
367.0
38.0
Pack Materials-Page 2
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