ON NSV40501UW3T2G 40 v, 5.0 a, low vce(sat) npn transistor Datasheet

NSS40501UW3,
NSV40501UW3
40 V, 5.0 A, Low VCE(sat)
NPN Transistor
ON Semiconductor’s e2 PowerEdge family of low VCE(sat)
transistors are miniature surface mount devices featuring ultra low
saturation voltage (VCE(sat)) and high current gain capability. These
are designed for use in low voltage, high speed switching applications
where affordable efficient energy control is important.
Typical applications are DC−DC converters and power management
in portable and battery powered products such as cellular and cordless
phones, PDAs, computers, printers, digital cameras and MP3 players.
Other applications are low voltage motor controls in mass storage
products such as disc drives and tape drives. In the automotive
industry they can be used in air bag deployment and in the instrument
cluster. The high current gain allows e2PowerEdge devices to be
driven directly from PMU’s control outputs, and the Linear Gain
(Beta) makes them ideal components in analog amplifiers.
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40 VOLTS, 5.0 AMPS
NPN LOW VCE(sat) TRANSISTOR
EQUIVALENT RDS(on) 38 mW
COLLECTOR
3
1
BASE
Features
• NSV Prefix for Automotive and Other Applications Requiring
•
Unique Site and Control Change Requirements; AEC−Q101
Qualified and PPAP Capable
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
MAXIMUM RATINGS (TA = 25°C)
Max
Unit
Collector-Emitter Voltage
VCEO
40
Vdc
Collector-Base Voltage
VCBO
40
Vdc
Emitter-Base Voltage
VEBO
6.0
Vdc
IC
5.0
Adc
Collector Current − Peak
ICM
7.0
A
Electrostatic Discharge
ESD
Collector Current − Continuous
HBM Class 3B
MM Class C
THERMAL CHARACTERISTICS
Characteristic
Symbol
Max
Unit
Total Device Dissipation, TA = 25°C
Derate above 25°C
PD (Note 1)
875
7.0
mW
mW/°C
RqJA (Note 1)
143
°C/W
PD (Note 2)
1.5
11.8
W
mW/°C
Thermal Resistance,
Junction−to−Ambient
RqJA (Note 2)
85
Thermal Resistance,
Junction−to−Lead #3
RqJL (Note 2)
Junction and Storage
Temperature Range
TJ, Tstg
Thermal Resistance,
Junction−to−Ambient
Total Device Dissipation, TA = 25°C
Derate above 25°C
3
WDFN3
CASE 506AU
2
Symbol
Rating
2
EMITTER
1
MARKING DIAGRAM
VB M G
G
1
VB = Specific Device Code
M = Date Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
Device
Package
Shipping†
NSS40501UW3T2G
WDFN3
(Pb−Free)
3000/
Tape & Reel
°C/W
NSV40501UW3T2G
WDFN3
(Pb−Free)
3000/
Tape & Reel
23
°C/W
−55 to
+150
°C
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. FR−4 @ 100 mm2, 1 oz copper traces.
2. FR−4 @ 500 mm2, 1 oz copper traces.
© Semiconductor Components Industries, LLC, 2013
August, 2013 − Rev. 5
1
Publication Order Number:
NSS40501UW3/D
NSS40501UW3, NSV40501UW3
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typical
Max
40
−
−
40
−
−
6.0
−
−
−
−
0.1
−
−
0.1
200
200
200
200
180
−
−
320
305
295
−
−
−
−
−
−
−
−
−
−
−
0.006
0.038
0.060
0.097
0.130
0.110
0.010
0.045
0.080
0.120
0.160
0.150
−
0.760
0.900
−
0.730
0.900
150
−
−
Unit
OFF CHARACTERISTICS
Collector −Emitter Breakdown Voltage
(IC = 10 mAdc, IB = 0)
V(BR)CEO
Collector −Base Breakdown Voltage
(IC = 0.1 mAdc, IE = 0)
V(BR)CBO
Emitter −Base Breakdown Voltage
(IE = 0.1 mAdc, IC = 0)
V(BR)EBO
Collector Cutoff Current
(VCB = 40 Vdc, IE = 0)
ICBO
Emitter Cutoff Current
(VEB = 6.0 Vdc)
IEBO
Vdc
Vdc
Vdc
mAdc
mAdc
ON CHARACTERISTICS
hFE
DC Current Gain (Note 3)
(IC = 10 mA, VCE = 2.0 V)
(IC = 500 mA, VCE = 2.0 V)
(IC = 1.0 A, VCE = 2.0 V)
(IC = 2.0 A, VCE = 2.0 V)
(IC = 3.0 A, VCE = 2.0 V)
Collector −Emitter Saturation Voltage (Note 3)
(IC = 0.1 A, IB = 0.010 A)
(IC = 1.0 A, IB = 0.100 A)
(IC = 1.0 A, IB = 0.010 A)
(IC = 2.0 A, IB = 0.020 A)
(IC = 3.0 A, IB = 0.030 A)
(IC = 4.0 A, IB = 0.400 A)
VCE(sat)
Base −Emitter Saturation Voltage (Note 3)
(IC = 1.0 A, IB = 0.01 A)
VBE(sat)
Base −Emitter Turn−on Voltage (Note 3)
(IC = 2.0 A, VCE = 2.0 V)
VBE(on)
Cutoff Frequency
(IC = 100 mA, VCE = 5.0 V, f = 100 MHz)
fT
V
V
V
MHz
Input Capacitance (VEB = 0.5 V, f = 1.0 MHz)
Cibo
−
650
pF
Output Capacitance (VCB = 3.0 V, f = 1.0 MHz)
Cobo
−
70
pF
Delay (VCC = 30 V, IC = 750 mA, IB1 = 15 mA)
td
−
−
90
ns
Rise (VCC = 30 V, IC = 750 mA, IB1 = 15 mA)
tr
−
−
100
ns
Storage (VCC = 30 V, IC = 750 mA, IB1 = 15 mA)
ts
−
−
1050
ns
Fall (VCC = 30 V, IC = 750 mA, IB1 = 15 mA)
tf
−
−
100
ns
SWITCHING CHARACTERISTICS
3. Pulsed Condition: Pulse Width = 300 msec, Duty Cycle ≤ 2%.
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2
NSS40501UW3, NSV40501UW3
0.40
IC/IB = 10
VCE(sat) = 150°C
0.15
25°C
0.10
−55°C
0.05
0
0.01
0.001
0.1
1.0
VCE(sat), COLLECTOR EMITTER
SATURATION VOLTAGE (V)
VCE(sat), COLLECTOR EMITTER
SATURATION VOLTAGE (V)
0.20
0.30
0.25
VCE(sat) = −55°C
0.20
25°C
0.15
0.10
0.05
0
10
0.001
Figure 1. Collector Emitter Saturation Voltage
vs. Collector Current
VBE(sat), BASE EMITTER
SATURATION VOLTAGE (V)
25°C (5 V)
25°C (2 V)
250
200
−55°C (5 V)
150
−55°C (2 V)
1.0
0.9
1.1
IC/IB = 10
1.0
0.9
−55°C
0.8
25°C
0.7
0.6
150°C
0.5
0.4
0.001
0.01
0.1
1.0
10
0.001
0.1
10
1.0
IC, COLLECTOR CURRENT (A)
Figure 3. DC Current Gain vs.
Collector Current
Figure 4. Base Emitter Saturation Voltage vs.
Collector Current
VCE = 2.0 V
−55°C
25°C
0.7
0.6
0.5
150°C
0.4
0.3
0.001
0.01
IC, COLLECTOR CURRENT (A)
0.8
0.2
10
0.3
VCE, COLLECTOR−EMITTER VOLTAGE (V)
hFE, DC CURRENT GAIN
400
100
VBE(on), BASE EMITTER TURN−ON VOLTAGE (V)
150°C (2 V)
300
1.0
1.2
500
350
0.1
Figure 2. Collector Emitter Saturation Voltage
vs. Collector Current
150°C (5 V)
450
0.01
IC, COLLECTOR CURRENT (A)
IC, COLLECTOR CURRENT (A)
550
150°C
IC/IB = 100
0.35
0.01
0.1
1.0
10
1.0
10 mA
100 mA
IC = 500 mA
0.8
300 mA
0.6
0.4
0.2
0
0.01
0.1
1.0
10
IC, COLLECTOR CURRENT (A)
IB, BASE CURRENT (mA)
Figure 5. Base Emitter Turn−On Voltage vs.
Collector Current
Figure 6. Saturation Region
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3
100
NSS40501UW3, NSV40501UW3
130
625
Cobo, OUTPUT CAPACITANCE (pF)
Cibo (pF)
575
525
475
425
375
325
275
0
1.0
2.0
4.0
3.0
5.0
Cobo (pF)
110
90
70
50
30
10
6.0
0
5.0
10
15
20
25
30
VEB, EMITTER BASE VOLTAGE (V)
VCB, COLLECTOR BASE VOLTAGE (V)
Figure 7. Input Capacitance
Figure 8. Output Capacitance
10
1.0
IC (A)
Cibo, INPUT CAPACITANCE (pF)
675
1.0 mS
10 mS
100 mS
1.0 S
0.1
Single Pulse Test
at Tamb = 25°C
Thermal
Limit
0.01
0.01
0.1
1.0
10
VCE (Vdc)
Figure 9. Safe Operating Area
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4
100
35
NSS40501UW3, NSV40501UW3
PACKAGE DIMENSIONS
WDFN3
CASE 506AU
ISSUE O
D
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994 .
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS
MEASURED BETWEEN 0.25 AND 0.30 MM FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS
THE TERMINALS.
A
B
PIN ONE
REFERENCE
2X
0.10 C
2X
ÇÇÇÇ
ÇÇÇÇ
ÇÇÇÇ
ÇÇÇÇ
DIM
A
A1
A3
b
D
D2
E
E2
e
K
L
E
MIN
0.70
0.00
0.25
1.40
0.90
0.35
MILLIMETERS
NOM
MAX
0.75
0.80
0.05
0.20 REF
0.30
0.35
2.00 BSC
1.50
1.60
2.00 BSC
1.00
1.10
1.30 BSC
0.35 REF
0.40
0.45
MIN
0.028
0.000
INCHES
NOM
0.030
0.008 REF
0.012
0.079 BSC
0.055
0.059
0.079 BSC
0.035
0.039
0.051 BSC
0.014 REF
0.014
0.016
0.010
MAX
0.031
0.002
0.014
0.063
0.043
0.018
TOP VIEW
0.10 C
SOLDERING FOOTPRINT*
A
0.10 C
1.300
2X
8X
0.08 C
SEATING
PLANE
(A3)
SIDE VIEW
A1
0.400
0.600
C
0.250
D2
e
2
1
2X
1.100
e/2
0.300
L
0.400
K
0.275
1.600
E2
3
3X
b
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
0.10 C A B
0.05 C
NOTE 3
BOTTOM VIEW
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