IRUH33PA13B20K ELDRS Test Report FEBRUARY 2006 Revision A International Rectifier currently does not have a DSCC approved Radiation Hardness Assurance Program for MIL-PRF-38534. ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Table of Contents Introduction .………………………………………………. 3 Summary of Results ……………………………………... 3 Test Method .……………………………………………… 3 Test Plan .…………………………………………………. 3 Test Facility ………………………………………………. 4 Test Results ...……………………………………………. 5 Conclusion .………………………………………………...9 Appendix A – Electrical Data Appendix B – Radiation Test Specification 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 2 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A INTRODUCTION This test report covers the total ionizing dose tests performed on the IRUH33PA13B20K Adjustable Low Dropout linear regulator in a hermetic package. The ELDRS test was performed on ten samples of the device from production lot H903185, which had completed MIL-PRF38534 “H” level assembly and screening. On January 19, 2006 International Rectifier tested this device for ELDRS hardness at the University of Massachusetts, Nuclear Research Facility using their CO60 source. SUMMARY OF RESULTS All of the test samples passed the post radiation test requirements for total ionizing dose levels up to 44.6K RAD(Si). The results show more degradation on the off-bias devices for all tests parameters as a function of radiation. The “ON” biased samples passed the post radiation test requirements for all of the required dose levels. TEST METHOD The test method used as a guide in the development of the Test Plan was MIL-STD-883, Method 1019 Ionizing Radiation, Condition C. This method establishes the basic requirements for the performance and execution of the tests. TEST PLAN The samples were exposed to CO60 irradiation in both an “ON” and “OFF” biased state per the requirements of the test plan and the radiation test specification. Post radiation testing of the devices occurred at the UMass facility after each dose step was complete. The devices were tested starting on January 20, 2006 for post radiation effects for dose levels up to 100K Rad(Si) at a dose rate of 0.065 Rad(Si)/sec. ON Biased serial numbers: 111, 114, 89, 67, 96 OFF Biased serial numbers: 94, 93, 85, 117, 76 Control Samples: 71 and 107. The Radiation Test Specification is included in Appendix B. The testing occurred in the following manner: 1.0 Purpose The purpose of this test is to characterize and qualify the ELDRS effects for International Rectifier’s hybrid low dropout regulator devices. The data resulting from the tests may be incorporated in the IR data sheet for the product. 2.0 Test Responsibility International Rectifier shall be responsible for conducting the tests, which shall be performed at the University of Massachusetts Research Reactor facility. International Rectifier shall be responsible for the final Test Report. 3.0 Test Facility 3.1 Nuclear Reactor The University of Massachusetts Research Reactor shall be used to provide the source for Gamma radiation. UMRR will also provide information on dose rate, total dose, irradiation test times and dosimetry for this evaluation. 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 3 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A 3.2 Test Equipment The necessary test equipment including interface board, cables, power supplies, measurement system, etc. shall be provided by International Rectifier. 3.3 Sample Size Sample size shall be determined based on device type, characterization parameters. As a minimum, the sample size shall meet the requirements of Mil- PRF-38534. Sample size for this TID evaluation equals 12 devices. Five of the samples shall be biased with the worst-case input voltage of 6.8 volts and five samples shall be biased “in-circuit” with the power supply turned off. Two samples shall be maintained as controls of which one shall be tested at each dose step. 4.0 Test Devices 4.1 The following device is planned for Total Ionizing Dose characterization: a. IRUH33PA13B20K 4.2 All devices shall be subjected to a minimum of 160hrs of burn-in and electrically tested over the entire operating range prior to radiation exposure. 4.3 All devices shall be tested after each radiation exposure per T090104G within 1 hour and placed back on to radiation exposure within 2 hours. 5.0 Test Method MIL-STD-883, Method 1019 Condition C shall be used to establish the procedure for all testing described herein. 6.0 Record Keeping 7.0 Test Report The Reactor facility shall provide dosimetry data for the CO60 source. Each exposure run shall be cataloged with the appropriate number in order to maintain correlation to the appropriate data set. IR will be responsible for collecting and compiling the test data. The Test Report shall include the following information: a. Device type(s), serial numbers, wafer lot identification (per active component) b. Test dates c. Facility, source type d. Bias conditions e. Comments and observations f. Pre and Post Electrical data g. Summary descriptive including graphs (if applicable) TEST FACILITY The University of Massachusetts, Lowell, Nuclear Research Reactor is a 1 Mega-Watt, Uranium235 enhanced core reactor. The UMass Lowell Radiation Laboratory provides controlled radiation environments and analytical measurement services to government organizations and to industry. The laboratory provides facilities for proton, neutron, and gamma environments. The Gamma Cave is an irradiation room inside this facility having an equi-dimensional volume of 512 cubic feet. A wide range of dose rates, 1Gray (100 rad) per hour to 10,000 Gray (1 Mrad) per hour, is available. Several small ports penetrate one shielding wall to provide access for instrumentation cables. 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 4 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Test Results The key pre and post radiation test results are shown in Tables 1 thru 10. In Figures 1-6, the parametric shifts are shown graphically for all exposed devices. The raw test data for all the parameters tested is shown in Appendix A. As outlined in the Test Plan, five of the devices exposed to total ionizing dose irradiation were biased “ON” with the maximum input voltage and five samples were placed in the bias circuit with the power supply off or biased “OFF”. All samples passed the post radiation test requirements up to 44.6K RAD(Si). The parameters affected the most by the ionizing radiation were Output Voltage, Ripple Rejection, and Shutdown Threshold Voltage with the worst-case condition being the “OFF” bias. The output voltage shift over radiation exposure with a 1.5A load current was +6.2% for the “OFF” biased samples and + 3.7% for the “ON” biased samples after exposure 100K RAD(Si). The shift at 44.6K RAD(Si) exposure was +4.7% for the “OFF” biased samples and + 3.2% for the “ON” biased samples. Table 1 “ON” Biased Samples, VOUT, VIN=3.3V @1.5A T#1 Serial # 71 107 111 114 89 67 96 Min Avg Max VOUT 0 2.510 2.494 2.497 2.509 2.506 2.503 2.506 2.497 2.504 2.509 6 2.510 2.495 2.510 2.520 2.520 2.515 2.524 2.510 2.518 2.524 KRAD LEVEL 22 2.505 2.495 2.545 2.550 2.554 2.549 2.566 2.545 2.553 2.566 Limits 45 2.508 2.493 2.572 2.579 2.588 2.580 2.588 2.572 2.581 2.588 100 2.509 2.492 2.587 2.595 2.601 2.597 2.602 2.587 2.596 2.602 Min 2.375 2.375 2.375 2.375 2.375 2.375 2.375 2.375 2.375 2.375 Max 2.625 2.625 2.625 2.625 2.625 2.625 2.625 2.625 2.625 2.625 U/M V V V V V V V V V V Table 2 “OFF” Biased Samples, VOUT, VIN=3.3V @1.5A VOUT T#1 Serial # 71 107 94 93 85 117 76 Min Avg Max 0 2.510 2.494 2.505 2.499 2.500 2.510 2.499 2.499 2.503 2.510 6 2.510 2.495 2.516 2.517 2.514 2.529 2.515 2.514 2.518 2.529 KRAD LEVEL 22 2.505 2.495 2.569 2.563 2.561 2.570 2.556 2.556 2.564 2.570 205 Crawford St, Leominster, Ma 01453 45 2.508 2.493 2.608 2.610 2.604 2.612 2.600 2.600 2.607 2.612 100 2.509 2.492 2.665 2.655 2.651 2.661 2.651 2.651 2.657 2.665 Tel: 976-534-5776 Limits Min Max 2.375 2.625 2.375 2.625 2.375 2.625 2.375 2.625 2.375 2.625 2.375 2.625 2.375 2.625 2.375 2.625 2.375 2.625 2.375 2.625 www.irf.com U/M V V V V V V V V V V 5 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Table 3 “ON” Biased Samples, VDROP, IOUT=3A T#8 VDROP Serial # 71 107 111 114 89 67 96 Min Avg Max 0 0.20 0.19 0.20 0.20 0.19 0.19 0.20 0.192 0.195 0.199 6 0.20 0.19 0.21 0.21 0.20 0.21 0.20 0.197 0.206 0.212 KRAD LEVEL 22 0.19 0.19 0.22 0.22 0.22 0.22 0.22 0.215 0.217 0.219 45 0.19 0.19 0.23 0.23 0.23 0.23 0.23 0.227 0.231 0.234 100 0.20 0.19 0.24 0.24 0.24 0.25 0.25 0.239 0.244 0.250 Limits Min Max 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 U/M V V V V V V V V V V Table 4 “OFF” Biased Samples, VDROP, IOUT=3A T#8 Serial # 71 107 94 93 85 117 76 Min Avg Max 0 0.20 0.19 0.20 0.19 0.21 0.20 0.20 0.192 0.199 0.210 VDROP KRAD LEVEL 6 22 45 0.20 0.19 0.19 0.19 0.19 0.19 0.20 0.22 0.22 0.20 0.22 0.23 0.22 0.23 0.25 0.22 0.22 0.24 0.21 0.22 0.24 0.204 0.215 0.223 0.212 0.222 0.237 0.223 0.230 0.249 100 0.20 0.19 0.25 0.25 0.23 0.27 0.25 0.232 0.252 0.265 Limits Min Max 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 0 0.4 U/M V V V V V V V V V V Table 5 “ON” Biased Samples, CURRENT LIMIT, VIN=3.3 T#9 Serial # 71 107 111 114 89 67 96 Min Avg Max 0 9.2 8.9 8.8 8.8 8.8 9.1 8.9 8.795 8.890 9.112 6 9.2 9.2 9.1 9.1 9.1 9.0 8.8 8.845 9.026 9.117 CURRENT LIMIT KRAD LEVEL 22 45 100 9.2 9.1 8.9 9.3 9.1 9.1 9.3 9.1 8.8 9.3 8.9 8.9 9.3 9.1 8.9 8.9 8.9 8.5 9.1 9.1 8.8 8.935 8.868 8.511 9.161 8.986 8.783 9.252 9.095 8.874 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 Limits Min Max 3 10 3 10 3 10 3 10 3 10 3 10 3 10 3 10 3 10 3 10 www.irf.com U/M A A A A A A A A A A 6 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Table 6 “OFF” Biased Samples, CURRENT LIMIT, VIN=3.3 T#9 Serial # 71 107 94 93 85 117 76 Min Avg Max 0 9.2 8.9 8.7 8.7 8.5 8.9 8.5 8.477 8.649 8.885 CURRENT LIMIT KRAD LEVEL 6 22 45 100 9.2 9.2 9.1 8.9 9.2 9.3 9.1 9.1 8.8 8.8 9.1 9.1 8.8 9.1 9.5 8.8 8.5 8.8 8.5 8.5 9.1 9.1 9.1 8.9 9.1 9.1 9.1 8.9 8.481 8.798 8.505 8.511 8.861 8.980 9.040 8.838 9.117 9.116 9.459 9.101 Limits Min Max 3 10 3 10 3 10 3 10 3 10 3 10 3 10 3 10 3 10 3 10 U/M A A A A A A A A A A Table 7 “ON” Biased Samples, RIPPLE REJECTION = 120Hz. T#10 Serial # 71 107 111 114 89 67 96 Min Avg Max 0 97.2 98.2 98.6 97.6 99.8 100.4 97.6 97.600 98.810 100.400 6 97.2 98.1 100.4 99.2 100.5 101.2 99.8 99.230 100.224 101.200 RIPPLE REJECTION KRAD LEVEL 22 45 99.2 99.2 98.2 99.2 98.6 89.5 100.4 91.8 98.7 89.5 99.2 89.6 101.1 89.5 98.630 89.450 99.590 89.970 101.100 91.820 100 98.2 99.8 61.9 61.9 60.7 60.8 61.9 60.740 61.460 61.940 Limits Min Max 40 200 40 200 40 200 40 200 40 200 40 200 40 200 40 200 40 200 40 200 U/M dB dB dB dB dB dB dB dB dB dB Table 8 “OFF” Biased Samples, RIPPLE REJECTION = 120Hz T#10 Serial # 71 107 94 93 85 117 76 Min Avg Max 0 97.2 98.2 98.1 99.2 98.1 98.1 99.7 98.060 98.622 99.740 RIPPLE REJECTION KRAD LEVEL 6 22 45 100 97.2 99.2 99.2 98.2 98.1 98.2 99.2 99.8 99.8 95.1 63.3 58.0 99.2 96.3 64.9 59.7 100.5 95.9 61.9 59.7 99.2 95.5 64.8 59.7 98.6 95.9 64.9 59.7 98.630 95.110 61.900 58.020 99.468 95.744 63.946 59.370 100.500 96.310 64.860 59.720 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 Limits Min Max 40 200 40 200 40 200 40 200 40 200 40 200 40 200 40 200 40 200 40 200 www.irf.com U/M dB dB dB dB dB dB dB dB dB dB 7 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Table 9 “ON” Biased Samples, VOLTAGE SHUTDOWN T#11 VSHDN Serial # 71 107 111 114 89 67 96 Min Avg Max 0 1.38 1.32 1.34 1.36 1.36 1.32 1.34 1.319 1.344 1.360 6 1.38 1.34 1.36 1.38 1.38 1.34 1.38 1.338 1.367 1.380 KRAD LEVEL 22 1.37 1.31 1.45 1.45 1.45 1.43 1.51 1.432 1.459 1.505 45 1.35 1.35 1.51 1.47 1.51 1.45 1.53 1.447 1.493 1.530 100 1.36 1.36 1.53 1.53 1.53 1.51 1.55 1.507 1.527 1.548 Limits Min Max 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 U/M V V V V V V V V V V Table 10 “OFF” Biased Samples, VOLTAGE SHUTDOWN T#11 Serial # 71 107 94 93 85 117 76 Min Avg Max 0 1.38 1.32 1.32 1.34 1.32 1.34 1.32 1.319 1.327 1.339 VSHDN KRAD LEVEL 6 22 45 1.38 1.37 1.35 1.34 1.31 1.35 1.38 1.47 1.50 1.34 1.45 1.49 1.36 1.43 1.47 1.40 1.47 1.49 1.36 1.41 1.45 1.338 1.411 1.447 1.367 1.449 1.478 1.401 1.474 1.499 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 100 1.36 1.36 1.47 1.47 1.44 1.47 1.44 1.444 1.457 1.465 Limits Min Max 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 1 1.7 www.irf.com U/M V V V V V V V V V V 8 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Parametric Shifts as a Function of ELDRS Radiation Figure 1 71_CNTRL VOUT VOUT (Vin 3.3v @1.5A) 107_CNTRL 2.680 2.660 2.640 2.620 2.600 2.580 2.560 2.540 2.520 2.500 2.480 94 93 85 117 76 111 114 89 1 10 100 KRAD 67 96 Figure 2 VOUT VOUT (Vin 3.3v @50mA) 71_CNTRL 2.680 2.660 2.640 2.620 2.600 2.580 2.560 2.540 2.520 2.500 2.480 107_CNTRL 94 93 85 117 76 111 114 89 1 10 KRAD 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 100 67 96 www.irf.com 9 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Figure 3 VOUT VOUT (Vin 3.8v @3A) 71_CNTRL 2.680 2.660 2.640 2.620 2.600 2.580 2.560 2.540 2.520 2.500 2.480 107_CNTRL 94 93 85 117 76 111 114 89 1 10 100 KRAD 67 96 Figure 4 71_CNTRL VOUT (Vin 2.8v @50mA) 107_CNTRL 2.700 94 93 VOUT 2.650 85 2.600 117 76 2.550 111 2.500 114 89 2.450 1 10 KRAD 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 100 67 96 www.irf.com 10 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Figure 5 VREF (3.3V @25mA) 71_CNTRL 107_CNTRL 1.350 94 VREF 1.330 93 85 1.310 117 1.290 76 111 1.270 114 1.250 89 1 10 100 KRAD 67 96 Figure 6 71_CNTRL RIPPLE REJ RATIO (F=120Hz) 107_CNTRL 94 100.0 Ripple Rej (dB) 93 90.0 85 117 80.0 76 70.0 111 60.0 114 50.0 89 1 10 KRAD 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 100 67 96 www.irf.com 11 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A CONCLUSION The IRUH33PA13B20K has demonstrated hardness to ELDRS radiation exposure up to 44.6 KRAD(Si) at dose rate of 0.065 Rad (Si)/sec with no parametric failures when device is in the “ON” or “OFF” bias condition and the results show it to meet all the post radiation test requirements. There are parametric shifts for Output Voltage, Dropout Voltage, Ripple Rejection, and Shutdown Threshold Voltage, which need to be considered in designs where tight tolerances over the life of the product need to be maintained. 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 12 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Appendix A Electrical Data 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 13 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Electrical Test Data (Pre-radiation) TEST Vout1 Vout2 Vout3 Vout4 Vout5 Line Reg Load Reg Vdrop Current Limit Ripple Rej. Vshdn Vout @shdn Ishdn* Max Limit 2.525 2.625 2.625 2.625 2.625 6.25 73.8 0.4 10 200 1.6 100 ---- Min Limit Serial # 71 107 94 93 85 117 76 111 114 89 67 96 2.475 2.375 2.375 2.375 2.375 -6.25 -73.8 0 3 65 1.0 -100 ---- (V) (V) (V) (V) (V) (mV) (mV) (V) (A) (dB) (V) (mV) (uA) 2.510 2.494 2.505 2.499 2.500 2.510 2.499 2.497 2.509 2.506 2.503 2.506 2.505 2.492 2.501 2.497 2.497 2.506 2.497 2.495 2.505 2.504 2.501 2.503 2.507 2.493 2.503 2.500 2.501 2.509 2.501 2.497 2.510 2.507 2.501 2.505 2.504 2.492 2.502 2.497 2.498 2.505 2.497 2.494 2.505 2.505 2.501 2.503 1.268 1.258 1.271 1.267 1.267 1.273 1.267 1.266 1.272 1.272 1.269 1.265 -0.678 0.181 -1.718 -0.407 -0.407 0.090 -0.904 0.045 -0.542 0.090 -0.136 -0.949 4.370 4.541 3.237 2.402 4.260 2.834 4.157 3.010 4.206 3.547 2.428 3.199 0.201 0.193 0.195 0.192 0.210 0.203 0.195 0.195 0.199 0.192 0.192 0.197 9.152 8.907 8.658 8.749 8.477 8.885 8.477 8.840 8.840 8.795 9.112 8.862 97.18 98.18 98.06 99.15 98.06 98.10 99.74 98.58 97.60 99.83 100.40 97.64 1.378 1.319 1.319 1.339 1.319 1.339 1.319 1.339 1.360 1.360 1.319 1.340 -1.967 -1.059 -1.033 -1.133 -1.119 -0.975 -1.018 -1.248 -1.578 -1.535 -2.338 -1.332 0.151 0.147 0.145 0.145 0.144 0.151 0.149 0.146 0.150 0.145 0.151 0.146 * Data collected for information purposes only parameter not specified for post radiation. Electrical Test Data (Post radiation – 6K RAD(Si)) TEST Vout1 Vout2 Vout3 Vout4 Vout5 Line Reg Load Reg Vdrop Current Limit Ripple Rej. Vshdn Vout @shdn Ishdn* Max Limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 100 ---- Min Limit Serial # 71 107 94 93 85 117 76 111 114 89 67 96 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 65 1.0 -100 ---- (V) (V) (V) (V) (V) (mV) (mV) (V) (A) (dB) (V) (mV) (uA) 2.510 2.495 2.516 2.517 2.514 2.529 2.515 2.510 2.520 2.520 2.515 2.524 2.505 2.493 2.513 2.514 2.512 2.523 2.512 2.505 2.517 2.516 2.512 2.522 2.507 2.496 2.516 2.516 2.515 2.526 2.517 2.510 2.520 2.520 2.514 2.524 2.504 2.494 2.514 2.514 2.513 2.524 2.513 2.506 2.519 2.517 2.512 2.522 1.268 1.263 1.274 1.277 1.276 1.281 1.276 1.273 1.278 1.277 1.275 1.279 -0.677 -0.225 -1.31 -0.993 -0.722 -0.406 0.1355 -0.180 0.6777 -0.180 0.3614 0.4969 4.37 4.297 4.468 4.023 2.932 3.008 4.805 3.21 5.719 3.026 3.396 2.368 0.201 0.189 0.204 0.204 0.223 0.219 0.208 0.212 0.212 0.197 0.208 0.204 9.152 9.198 8.790 8.845 8.481 9.072 9.117 9.072 9.072 9.117 9.026 8.845 97.18 98.14 99.79 99.23 100.50 99.19 98.63 100.40 99.23 100.50 101.20 99.79 1.378 1.336 1.378 1.338 1.359 1.401 1.359 1.359 1.380 1.380 1.338 1.380 -1.967 -1.034 -1.034 -1.277 -1.233 -0.557 -2.111 -2.212 -2.457 -0.859 -2.338 -1.332 0.1514 0.146 0.1427 0.1474 0.1413 0.1464 0.1435 0.1444 0.1462 0.1445 0.1512 0.1461 * Data collected for information purposes only parameter not specified for post radiation. 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 14 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Electrical Test Data (Post radiation – 22K RAD(Si)) TEST Vout1 Vout2 Vout3 Vout4 Vout5 Line Reg Load Reg Vdrop Current Limit Ripple Rej. Vshdn Vout @shdn Ishdn* Max Limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 100 ---- Min Limit Serial # 71 107 94 93 85 117 76 111 114 89 67 96 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 40 1.0 -100 ---- (V) (V) (V) (V) (V) (mV) (mV) (V) (A) (dB) (V) (mV) (uA) 2.505 2.495 2.569 2.563 2.561 2.570 2.556 2.545 2.550 2.554 2.549 2.566 2.503 2.492 2.566 2.560 2.557 2.567 2.552 2.541 2.548 2.551 2.544 2.562 2.507 2.495 2.569 2.563 2.559 2.569 2.556 2.547 2.551 2.556 2.549 2.566 2.504 2.491 2.565 2.558 2.557 2.566 2.551 2.540 2.547 2.552 2.545 2.562 1.268 1.262 1.300 1.296 1.295 1.300 1.291 1.289 1.291 1.294 1.289 1.301 0.4516 -0.541 -0.541 -0.271 0 0.7226 -0.180 0 0.6774 0.271 0.4968 0.6774 4.534 3.915 4.025 3.761 3.208 3.438 4.166 5.714 2.704 4.518 2.37 4.78 0.189 0.189 0.223 0.219 0.230 0.223 0.215 0.215 0.219 0.215 0.219 0.215 9.207 9.252 8.844 9.071 8.798 9.116 9.071 9.252 9.252 9.252 8.935 9.113 99.150 98.150 95.110 96.310 95.870 95.520 95.910 98.630 100.400 98.670 99.150 101.100 1.369 1.306 1.474 1.453 1.432 1.474 1.411 1.453 1.453 1.453 1.432 1.505 -1.565 -1.738 -2.227 -3.149 -3.351 -3.235 -3.423 -0.686 -1.162 -1.867 -1.507 -2.602 0.149 0.1488 0.1388 0.1399 0.1387 0.1433 0.1417 0.1367 0.1419 0.1386 0.1393 0.1421 * Data collected for information purposes only parameter not specified for post radiation. Electrical Test Data (Post radiation – 44K RAD(Si)) TEST Vout1 Vout2 Vout3 Vout4 Vout5 Line Reg Load Reg Vdrop Current Limit Ripple Rej. Vshdn Vout @shdn Ishdn* Max Limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 100 ---- Min Limit Serial # 71 107 94 93 85 117 76 111 114 89 67 96 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 40 1.0 -100 ---- (V) (V) (V) (V) (V) (mV) (mV) (V) (A) (dB) (V) (mV) (uA) 2.508 2.493 2.608 2.610 2.604 2.612 2.600 2.572 2.579 2.588 2.580 2.588 2.503 2.491 2.606 2.608 2.601 2.609 2.597 2.571 2.578 2.585 2.578 2.586 2.510 2.494 2.608 2.609 2.605 2.611 2.600 2.573 2.579 2.588 2.580 2.589 2.503 2.491 2.606 2.606 2.601 2.609 2.597 2.571 2.577 2.584 2.578 2.587 1.267 1.260 1.317 1.323 1.319 1.323 1.317 1.305 1.307 1.311 1.307 1.311 -0.0903 -0.0903 1.265 -0.0452 2.169 0 0.6327 0.4972 1.085 -0.2712 0.0452 0.4972 7.459 3.813 2.861 2.134 3.323 1.983 3.439 1.604 1.54 2.311 1.783 2.485 0.189 0.186 0.223 0.234 0.249 0.238 0.238 0.234 0.227 0.227 0.234 0.231 9.134 9.089 9.089 9.459 8.505 9.050 9.095 9.050 8.868 9.050 8.868 9.095 99.240 99.240 63.290 64.860 61.900 64.820 64.860 89.450 91.820 89.450 89.640 89.490 1.352 1.352 1.499 1.488 1.468 1.488 1.447 1.509 1.468 1.509 1.447 1.530 -0.982 -1.73 -1.241 -1.942 -2.072 -3.31 -2.417 -2.417 -3.152 -3.282 -3.742 -4.074 0.1478 0.1458 0.1384 0.1406 0.1381 0.1411 0.1409 0.1376 0.1395 0.1361 0.1356 0.1369 * Data collected for information purposes only parameter not specified for post radiation. 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 15 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Electrical Test Data (Post radiation – 100K RAD(Si)) TEST Vout1 Vout2 Vout3 Vout4 Vout5 Line Reg Load Reg Vdrop Current Limit Ripple Rej. Vshdn Vout @shdn Ishdn* Max Limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 100 ---- Min Limit Serial # 71 107 94 93 85 117 76 111 114 89 67 96 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 40 1.0 -100 ---- (V) (V) (V) (V) (V) (mV) (mV) (V) (A) (dB) (V) (mV) (uA) 2.509 2.492 2.665 2.655 2.651 2.661 2.651 2.587 2.595 2.601 2.597 2.602 2.503 2.491 2.661 2.655 2.650 2.659 2.648 2.584 2.591 2.598 2.593 2.599 2.508 2.493 2.664 2.654 2.650 2.660 2.651 2.585 2.594 2.601 2.597 2.603 2.503 2.491 2.660 2.653 2.649 2.658 2.647 2.584 2.592 2.598 2.594 2.599 1.269 1.260 1.349 1.346 1.343 1.348 1.343 1.310 1.315 1.318 1.316 1.318 0 0 -0.677 1.401 0.4518 -0.858 1.446 1.129 0.2259 -0.677 -0.632 0.5421 5.659 4.497 0.7832 0.467 0.7231 2.436 1.91 2.896 3.316 3.027 3.856 4.724 0.197 0.189 0.254 0.254 0.232 0.265 0.254 0.243 0.243 0.239 0.250 0.247 8.855 9.127 9.101 8.829 8.511 8.874 8.874 8.829 8.874 8.874 8.511 8.829 98.150 99.830 58.020 59.670 59.720 59.720 59.720 61.940 61.900 60.740 60.780 61.94 1.357 1.357 1.465 1.465 1.444 1.465 1.444 1.527 1.527 1.527 1.507 1.548 -2.027 -0.719 -2.405 -0.836 -1.225 -2.045 -2.75 -1.542 -2.16 -2.074 -4.059 -2.376 0.1499 0.1475 0.1455 0.1408 0.1418 0.145 0.1435 0.1346 0.1359 0.1332 0.1339 0.1338 * Data collected for information purposes only parameter not specified for pre-radiation. 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 16 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Appendix B Radiation Test Specification 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 17 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Specification # T090104G Revision: A ECN # Date: IR Base Part No. IRRUH33PA13B20K PRODUCT DISCRIPTION: ADJUSTABLE LOW DROPOUT VOLTAGE REGULATOR Automatic Test Tester: PXI TEST CONSOLE 04-134-TC Table 1: Pre Radiation Tests, 25C tests only 1 Prog. Ref. A Test Output Voltage Symbol V out A Output Voltage V out A Output Voltage V out A Output Voltage V out A Output Voltage V ref A Line Regulation Vrline A Load Regulation Vrload A Dropout Voltage Vdrop Test Conditions Vin = 3.30 Vdc Iout = 1.5 A Vin = 3.3 Vdc Iout = 50 mA Vin = 3.8 Vdc Iout = 3.0 A Vin = 2.8 Vdc Iout = 50 mA Vin = 3.3 Vdc Iout = 25mA 2.9V < Vin < 3.8V Iout = 50 mA Vin = 3.3V 50mA < Io < 3.0A Iout = 3A A Current Limit I limit A Ripple Rejection Rrej A Shutdown Threshold Vshutdown A Output voltage At Shutdown Vout shdn A Shutdown Pin Current Ishutdown Rad Level: Pre Rad Notes MIN 2.475 MAX 2.525 Units Vdc Pre Rad 2.375 2.625 Vdc Pre Rad 2.375 2.625 Vdc Pre Rad 2.375 2.625 Vdc Pre Rad 1.225 1.305 Vdc Pre Rad -6.25 6.25 mVdc Pre Rad -73.8 73.8 mVdc Pre Rad 0 0.40 Vdc Vin = 3.3 Vdc Pre Rad 3.0 10.0 A F= 120 Hz Iout = 50 mA Vin = 5.0 Vdc, Vshutdown ramp from 0.8V to 4.8V, output monitored for 100mV drop below Vin = 3.3 Vdc Iout = 50 mA Vshdn = +5 Vdc Vin = 3.3 Vdc Iout = 50 mA Vshdn = +5 Vdc Pre Rad 65 200 dB Pre Rad 1.0 1.6 V Pre Rad -0.1 +0.1 V --- --- uA Pre Rad 2 Notes: 1. Regulator shall be biased at a nominal Vout of 2.5V with Radjust set at 976 ohms and tested to the limits specified on the data sheet. 2. These tests are performed for information purposes only. This is proprietary information of International Rectifier Hi-Rel Products and it is understood that this will not be divulged to a third party or used in any way prejudicial to the interest of International Rectifier Hi-Rel Products. 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 18 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Automatic Test Tester: PXI TEST CONSOLE 04-134-TC Table 2: Post Radiation Tests, 25C tests only 1 Prog. Ref. B Test Output Voltage Symbol V out B Output Voltage V out B Output Voltage V out B Output Voltage V out B Output Voltage V ref B Line Regulation Vrline B Load Regulation Vrload B Dropout Voltage Vdrop Test Conditions Vin = 3.30 Vdc Iout = 1.5 A Vin = 3.3 Vdc Iout = 50 mA Vin = 3.8 Vdc Iout = 3.0 A Vin = 2.8 Vdc Iout = 50 mA Vin = 3.3 Vdc Iout = 25mA 2.9V < Vin < 3.8V Iout = 50 mA Vin = 3.3V 50mA < Io < 3.0A Iout = 3A B Current Limit I limit B Ripple Rejection Rrej B Shutdown Threshold Output voltage At Shutdown Vshutdown Shutdown Pin Current Ishutdown B B Vout shdn Rad Level: Post Rad Notes MIN 2.375 MAX 2.625 Units Vdc Post Rad 2.375 2.625 Vdc Post Rad 2.375 2.625 Vdc Post Rad 2.375 2.625 Vdc Post Rad 1.202 1.328 Vdc Post Rad -12.5 12.5 mVdc Post Rad -147.6 147.6 mVdc Post Rad 0 0.40 Vdc Vin = 3.3 Vdc Post Rad 3.0 10.0 A F= 120 Hz Iout = 50 mA Vin = 5.0 Vdc, Vshutdown ramp from 0.8V to 4.8V, output Vin = 3.3 Vdc Iout = 50 mA Vshdn = +5 Vdc Vin = 3.3 Vdc Iout = 50 mA Vshdn = +5 Vdc Post Rad 40 200 dB Post Rad 1.0 1.7 V Post Rad -0.1 +0.1 V --- --- uA Post Rad 2 Notes: 1. Regulator shall be biased at a nominal Vout of 2.5V with Radjust set at 976 ohms and tested to the limits specified on the data sheet. 2. These tests are performed for information purposes only. This is proprietary information of International Rectifier Hi-Rel Products and it is understood that this will not be divulged to a third party or used in any way prejudicial to the interest of International Rectifier Hi-Rel Products. 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 19 ELDRS Test Report IRUH33PA13B20K February 2006, Rev A Table 3: Total Dose Radiation Requirements Bias Conditions Dose Step Profile Dose Rate Range Board Number Program Card Number Chamber Test Temperature High Dose Rate 3 Vin = 6.8V, Vout = 2.5V, Io=10mA 30K, 20K, 50K, 50K, 50K 50 to 300 Rad(Si)/sec TF-02-011 05-043-TA Gamma Cave 25C +/-5C Unbiased, in circuit with power supply off 30K, 20K, 50K, 50K, 50K 50 to 300 Rad(Si)/sec TF-02-011 05-043-TA Gamma Cave 25C +/-5C Bias Conditions Dose Step Profile Dose Rate Range Board Number Program Card Number Chamber Test Temperature Low Dose Rate 3 Vin = 6.8V, Vout = 2.5V, Io=10mA 30K, 20K, 50K, 50K, 50K 0.01 to 0.10 Rad(Si)/sec TF-02-008 05-043-TA Hot Cell 25C +/-5C Unbiased, in circuit with power supply off 30K, 20K, 50K, 50K, 50K 0.01 to 0.10 Rad(Si)/sec TF-02-008 05-043-TA Hot Cell 25C +/-5C 3. Performed at during initial qualification of the device and retested only when specified by Quality Assurance due to a change per MIL-PRF-38534. 5 4 3 2 1 Radiation Circuit 976 ohm 1% Vin 1uF 50V 205 Crawford St, Leominster, Ma 01453 1uF 50V Tel: 976-534-5776 250 ohm 5% www.irf.com 20