AD AD9284BCPZRL7-250 8-bit, 250 msps, 1.8 v dual analog-to-digital converter (adc) Datasheet

8-Bit, 250 MSPS, 1.8 V Dual
Analog-to-Digital Converter (ADC)
AD9284
Data Sheet
FEATURES
GENERAL DESCRIPTION
Single 1.8 V supply operation
SNR: 49.3 dBFS at 200 MHz input at 250 MSPS
SFDR: 65 dBc at 200 MHz input at 250 MSPS
Low power: 314 mW at 250 MSPS
On-chip reference and track-and-hold
1.2 V p-p analog input range for each channel
Differential input with 500 MHz bandwidth
LVDS-compliant digital output
DNL: ±0.2 LSB
Serial port control options
Offset binary, Gray code, or twos complement data format
Optional clock duty cycle stabilizer
Built-in selectable digital test pattern generation
Pin-programmable power-down function
Available in 48-lead LFCSP
The AD9284 is a dual 8-bit, monolithic sampling, analog-to-digital
converter (ADC) that supports simultaneous operation and is
optimized for low cost, low power, and ease of use. Each ADC
operates at up to a 250 MSPS conversion rate with outstanding
dynamic performance.
The ADC requires a single 1.8 V supply and an encode clock for
full performance operation. No external reference components
are required for many applications. The digital outputs are LVDS
compatible.
The AD9284 is available in a Pb-free, 48-lead LFCSP that is
specified over the industrial temperature range of −40°C to +85°C.
PRODUCT HIGHLIGHTS
1.
2.
3.
APPLICATIONS
Communications
Diversity radio systems
I/Q demodulation systems
Battery-powered instruments
Handheld scope meters
Low cost digital oscilloscopes
OTS: video over fiber
Integrated Dual 8-Bit, 250 MSPS ADC.
Single 1.8 V Supply Operation with LVDS Outputs.
Power-Down Option Controlled via a Pin-Programmable
Setting.
FUNCTIONAL BLOCK DIAGRAM
SDIO/
PWDN CSB SCLK
LVDS
OUTPUT BUFFER
OE
SPI
CLK+
CLK–
VIN+A
ADC
VIN–A
D7+ (MSB), D7– (MSB)
D0+ (LSB), D0– (LSB)
(CHANNEL A)
VCM
×1.5
CLOCK
MANAGEMENT
1.0V
VREF
DCO
GENERATION
LVDS
OUTPUT BUFFER
REF
SELECT
VREF
VIN–B
ADC
VIN+B
DCO+
DCO–
D7+ (MSB), D7– (MSB)
D0+ (LSB), D0– (LSB)
(CHANNEL B)
RBIAS
AGND
AVDD
DRVDD
DRGND
09085-001
AD9284
Figure 1.
Rev. A
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AD9284* PRODUCT PAGE QUICK LINKS
Last Content Update: 02/23/2017
COMPARABLE PARTS
TOOLS AND SIMULATIONS
View a parametric search of comparable parts.
• Visual Analog
• AD9284 IBIS Model
EVALUATION KITS
• AD9284 Evaluation Board
REFERENCE MATERIALS
Technical Articles
DOCUMENTATION
• MS-2210: Designing Power Supplies for High Speed ADC
Application Notes
• AN-1142: Techniques for High Speed ADC PCB Layout
DESIGN RESOURCES
• AN-282: Fundamentals of Sampled Data Systems
• AD9284 Material Declaration
• AN-345: Grounding for Low-and-High-Frequency Circuits
• PCN-PDN Information
• AN-501: Aperture Uncertainty and ADC System
Performance
• Quality And Reliability
• Symbols and Footprints
• AN-586: LVDS Outputs for High Speed A/D Converters
• AN-715: A First Approach to IBIS Models: What They Are
and How They Are Generated
DISCUSSIONS
View all AD9284 EngineerZone Discussions.
• AN-737: How ADIsimADC Models an ADC
• AN-742: Frequency Domain Response of SwitchedCapacitor ADCs
• AN-756: Sampled Systems and the Effects of Clock Phase
Noise and Jitter
• AN-827: A Resonant Approach to Interfacing Amplifiers to
Switched-Capacitor ADCs
• AN-835: Understanding High Speed ADC Testing and
Evaluation
• AN-851: A WiMax Double Downconversion IF Sampling
Receiver Design
SAMPLE AND BUY
Visit the product page to see pricing options.
TECHNICAL SUPPORT
Submit a technical question or find your regional support
number.
DOCUMENT FEEDBACK
Submit feedback for this data sheet.
• AN-878: High Speed ADC SPI Control Software
• AN-905: Visual Analog Converter Evaluation Tool Version
1.0 User Manual
• AN-935: Designing an ADC Transformer-Coupled Front
End
Data Sheet
• AD9284: 8-Bit, 250 MSPS, 1.8 V Dual Analog-to-Digital
Converter (ADC) Data Sheet
User Guides
• UG-178: Evaluating the AD9284 Analog-to-Digital
Converter
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AD9284
Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Voltage Reference ....................................................................... 13
Applications ....................................................................................... 1
RBIAS ........................................................................................... 13
General Description ......................................................................... 1
Clock Input Considerations ...................................................... 14
Product Highlights ........................................................................... 1
Digital Outputs ........................................................................... 14
Functional Block Diagram .............................................................. 1
Built-In Self-Test (BIST) and Output Test .................................. 15
Revision History ............................................................................... 2
Built-In Self-Test (BIST) ............................................................ 15
Specifications..................................................................................... 3
Output Test Modes ..................................................................... 15
DC Specifications ......................................................................... 3
Serial Port Interface (SPI) .............................................................. 16
AC Specifications.......................................................................... 4
Configuration Using the SPI ..................................................... 16
Digital Specifications ................................................................... 5
Hardware Interface ..................................................................... 17
Switching Specifications .............................................................. 6
Configuration Without the SPI ................................................ 17
SPI Timing Specifications ........................................................... 6
SPI Accessible Features .............................................................. 17
Absolute Maximum Ratings ............................................................ 7
Memory Map .................................................................................. 18
Thermal Resistance ...................................................................... 7
Reading the Memory Map Register Table............................... 18
ESD Caution .................................................................................. 7
Memory Map Register Table ..................................................... 19
Pin Configuration and Function Descriptions ............................. 8
Memory Map Register Descriptions ........................................ 21
Typical Performance Characteristics ........................................... 10
Applications Information .............................................................. 22
Equivalent Circuits ......................................................................... 12
Design Guidelines ...................................................................... 22
Theory of Operation ...................................................................... 13
Outline Dimensions ....................................................................... 23
ADC Architecture ...................................................................... 13
Ordering Guide .......................................................................... 23
Analog Input Considerations.................................................... 13
REVISION HISTORY
6/13—Rev. 0 to Rev. A
Changes to Clock Input Parameters, Table 4 ................................. 6
1/11—Revision 0: Initial Version
Rev. A | Page 2 of 24
Data Sheet
AD9284
SPECIFICATIONS
DC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 1.0 V internal ADC reference, unless otherwise noted.
Table 1.
Parameter 1
RESOLUTION
DC ACCURACY
Differential Nonlinearity
Integral Nonlinearity
No Missing Codes
Offset Error
Gain Error
MATCHING CHARACTERISTICS
Offset Error
Gain Error
TEMPERATURE DRIFT
Offset Error
Gain Error
ANALOG INPUT
Input Span
Input Common-Mode Voltage
Input Resistance (Differential)
Input Capacitance (Differential)
Full Power Bandwidth
VOLTAGE REFERENCE
Internal Reference
Input Resistance
POWER SUPPLIES
Supply Voltage
AVDD
DRVDD
Supply Current
IAVDD
IDRVDD
POWER CONSUMPTION
Sine Wave Input 2
Power-Down Power
1
2
Temperature
Full
Min
8
Typ
Max
Unit
Bits
±0.4
±0.3
LSB
LSB
±2.1
±2.8
% FS
% FS
±2.6
±0.7
% FS
% FS
Full
Full
Full
Full
Full
0
0
±0.2
±0.1
Guaranteed
±0.4
±2.5
Full
Full
0
0
±0.5
±0.1
Full
Full
±2
±20
ppm/°C
ppm/°C
Full
Full
Full
Full
Full
1.2
1.4
16
250
700
V p-p
V
kΩ
fF
MHz
Full
Full
0.97
0.98
3
0.99
V
kΩ
Full
Full
1.7
1.7
1.8
1.8
1.9
1.9
V
V
Full
Full
124
51
128
54
mA
mA
Full
Full
314
0.3
330
1.7
mW
mW
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and an explanation of how these tests were
completed.
Measured with a low frequency, full-scale sine wave, with approximately 5 pF loading on each output bit.
Rev. A | Page 3 of 24
AD9284
Data Sheet
AC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 1.0 V internal ADC reference, maximum sample rate, VIN = −1.0 dBFS differential input, unless
otherwise noted.
Table 2.
Parameter
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 10.3 MHz
fIN = 70 MHz
fIN = 96.6 MHz
fIN = 220 MHz
SIGNAL-TO-NOISE-AND-DISTORTION (SINAD)
fIN = 10.3 MHz
fIN = 70 MHz
fIN = 96.6 MHz
fIN = 220 MHz
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 10.3 MHz
fIN = 70 MHz
fIN = 96.6 MHz
fIN = 220 MHz
WORST SECOND OR THIRD HARMONIC
fIN = 10.3 MHz
fIN = 70 MHz
fIN = 96.6 MHz
fIN = 220 MHz
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 10.3 MHz
fIN = 70 MHz
fIN = 96.6 MHz
fIN = 220 MHz
WORST OTHER HARMONIC OR SPUR
fIN = 10.3 MHz
fIN = 70 MHz
fIN = 96.6 MHz
fIN = 220 MHz
CROSSTALK
Temperature
25°C
25°C
Full
25°C
Typ
Max
Unit
49.3
49.3
49.3
49.3
dBFS
dBFS
dBFS
dBFS
49.2
49.2
49.2
49.2
dBFS
dBFS
dBFS
dBFS
7.9
7.9
7.9
7.9
Bits
Bits
Bits
Bits
25°C
25°C
Full
25°C
−70
−70
−70
−65
dBc
dBc
dBc
dBc
25°C
25°C
Full
25°C
70
70
69
65
dBc
dBc
dBc
dBc
−71
−71
−70
−67
−80
dBc
dBc
dBc
dBc
dBc
25°C
25°C
Full
25°C
25°C
25°C
Full
25°C
25°C
25°C
Full
25°C
Full
Rev. A | Page 4 of 24
Min
48.7
48.5
7.8
61
−61
−64
Data Sheet
AD9284
DIGITAL SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 1.0 V internal ADC reference, full temperature, unless otherwise noted.
Table 3.
Parameter 1
CLOCK INPUTS (CLK+, CLK−)
Logic Compliance
Internal Common-Mode Bias
Differential Input Voltage 2
Input Voltage Range
High Level Input Voltage
Low Level Input Voltage
High Level Input Current
Low Level Input Current
Input Resistance (Differential)
Input Capacitance
LOGIC INPUTS
CSB
High Level Input Voltage
Low Level Input Voltage
High Level Input Current
Low Level Input Current
Input Resistance
Input Capacitance
SCLK, SDIO/PWDN, OE
High Level Input Voltage
Low Level Input Voltage
High Level Input Current
Low Level Input Current
Input Resistance
Input Capacitance
DIGITAL OUTPUTS (D7+, D7− to D0+, D0−), LVDS
DRVDD = 1.8 V
Differential Output Voltage (VOD)
Output Offset Voltage (VOS)
Output Coding (Default)
1
2
Temperature
Full
Full
Full
Full
Full
Full
Full
25°C
25°C
Min
Typ
Max
LVDS/PECL
1.2
0.2
AVDD − 0.3
1.2
0
−10
−10
6
AVDD + 1.6
3.6
0.8
+10
+10
20
4
Full
Full
Full
Full
25°C
25°C
1.2
0
−5
−80
Full
Full
Full
Full
25°C
25°C
1.2
0
50
−5
Full
Full
290
1.15
−0.4
−63
30
2
57
−0.4
30
2
345
1.25
Offset binary
Unit
V
V p-p
V
V
V
μA
μA
kΩ
pF
DRVDD + 0.3
0.8
+5
−50
V
V
μA
μA
kΩ
pF
DRVDD + 0.3
0.8
70
+5
V
V
μA
μA
kΩ
pF
400
1.35
mV
V
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and an explanation of how these tests were
completed.
Specified for LVDS and LVPECL only.
Rev. A | Page 5 of 24
AD9284
Data Sheet
SWITCHING SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, maximum sample rate, −1.0 dBFS differential input, 1.0 V internal reference, unless otherwise noted.
Table 4.
Parameter
CLOCK INPUT PARAMETERS
Input Clock Rate
CLK Period (tCLK)
CLK Pulse Width High (tCH)
DATA OUTPUT PARAMETERS
Data Propagation Delay (tPD)
DCO Propagation Delay (tDCO)
DCO to Data Skew (tSKEW)
Pipeline Delay (Latency)
Aperture Delay (tA)
Aperture Uncertainty (Jitter, tJ)
Wake-Up Time1
OUT-OF-RANGE RECOVERY TIME
1
Temperature
Min
Full
Full
Full
30
4
Full
Full
Full
Full
Full
Full
Full
Typ
−280
Max
Unit
250
2
MHz
ns
ns
3.7
3.7
−60
10.5
1.0
0.1
500
2
ns
ns
ps
Cycles
ns
ps rms
μs
Cycles
+100
Wake-up time is dependent on the value of the decoupling capacitors.
SPI TIMING SPECIFICATIONS
Table 5.
Parameter
SPI TIMING REQUIREMENTS
tDS
tDH
tCLK
tS
tH
tHIGH
tLOW
tEN_SDIO
tDIS_SDIO
Description
Min
Typ
Max
Setup time between the data and the rising edge of SCLK
Hold time between the data and the rising edge of SCLK
Period of the SCLK
Setup time between CSB and SCLK
Hold time between CSB and SCLK
SCLK pulse width high
SCLK pulse width low
Time required for the SDIO pin to switch from an input
to an output relative to the SCLK falling edge
Time required for the SDIO pin to switch from an output
to an input relative to the SCLK rising edge
2
2
40
2
2
10
10
10
ns
ns
ns
ns
ns
ns
ns
ns
10
ns
Timing Diagram
M–1
M+4
M
VIN±A
N–1
tA
M+1
N+4
M+2
N
VIN±B
N+5
N+3
N+1
tCH
M+5
M+3
N+2
tCLK
CLK+
DATA CH A, CH B
tDCO
tSKEW
N – 11 M – 10 N – 10
M–9
N–9
tPD
Figure 2. Output Data Timing
Rev. A | Page 6 of 24
M–8
N–8
M–7
N–7
09085-002
CLK–
DCO+, DCO–
CH A, CH B
Unit
Data Sheet
AD9284
ABSOLUTE MAXIMUM RATINGS
Table 6.
Parameter
Electrical
AVDD to AGND
DRVDD to DRGND
AGND to DRGND
AVDD to DRVDD
D0+/D0− through D7+/D7−
to DRGND
DCO+, DCO− to DRGND
CLK+, CLK− to AGND
VIN±A, VIN±B to AGND
SDIO/PWDN to DRGND
CSB to AGND
SCLK to AGND
Environmental
Storage Temperature Range
Operating Temperature Range
Lead Temperature
(Soldering, 10 sec)
Junction Temperature
Rating
−0.3 V to +2.0 V
−0.3 V to +2.0 V
−0.3 V to +0.3 V
−2.0 V to +2.0 V
−0.3 V to DRVDD + 0.3 V
−0.3 V to DRVDD + 0.3 V
−0.3 V to AVDD + 0.2 V
−0.3 V to AVDD + 0.2 V
−0.3 V to DRVDD + 0.3 V
−0.3 V to DRVDD + 0.3 V
−0.3 V to DRVDD + 0.3 V
−65°C to +125°C
−40°C to +85°C
300°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages.
Table 7. Thermal Resistance
Package Type
48-Lead LFCSP (CP-48-12)
ESD CAUTION
150°C
Rev. A | Page 7 of 24
θJA
30.4
θJC
2.9
Unit
°C/W
AD9284
Data Sheet
48
47
46
45
44
43
42
41
40
39
38
37
AVDD
VIN–B
VIN+B
AVDD
AVDD
VREF
AVDD
VCM
AVDD
VIN+A
VIN–A
AVDD
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
AVDD
AVDD
1
2
PIN 1
INDICATOR
DNC 3
DNC 4
RBIAS 5
DNC 6
DRGND 7
DRVDD 8
D0– (LSB) 9
D0+ (LSB) 10
D1– 11
D1+ 12
AD9284
AVDD
AVDD
CLK+
CLK–
CSB
SDIO/PWDN
SCLK
OE
DRGND
DRVDD
D7+ (MSB)
D7– (MSB)
NOTES
1. DNC = DO NOT CONNECT. DO NOT CONNECT TO THIS PIN.
2. THE EXPOSED PADDLE MUST BE SOLDERED TO THE PCB ANALOG
GROUND TO ENSURE PROPER FUNCTIONALITY AND HEAT
DISSIPATION, NOISE, AND MECHANICAL STRENGTH BENEFITS.
09085-003
D2–
D2+
D3–
D3+
DCO–
DCO+
D4–
D4+
D5–
D5+
D6–
D6+
13
14
15
16
17
18
19
20
21
22
23
24
TOP VIEW
(Not to Scale)
36
35
34
33
32
31
30
29
28
27
26
25
Figure 3. Pin Configuration
Table 8. Pin Function Descriptions
Pin No.
ADC Power Pins
1, 2, 35, 36, 37, 40, 42,
44, 45, 48
8, 27
7, 28
0
ADC Analog Pins
39
38
46
47
43
5
41
34
33
Digital Input
29
Digital Outputs
26
25
24
23
22
21
20
19
Mnemonic
Type
Description
AVDD
Supply
Analog Power Supply (1.8 V Nominal).
DRVDD
DRGND
AGND
Supply
Ground
Ground
Digital Output Driver Supply (1.8 V Nominal).
Digital Output Ground.
Analog Ground. Pin 0 is the exposed thermal pad on the bottom of the
package. This is the only ground connection, and it must be soldered to
the PCB analog ground to ensure proper functionality and heat dissipation,
noise, and mechanical strength benefits.
VIN+A
VIN−A
VIN+B
VIN−B
VREF
RBIAS
VCM
CLK+
CLK−
Input
Input
Input
Input
Input/output
Input/output
Output
Input
Input
Differential Analog Input Pin (+) for Channel A.
Differential Analog Input Pin (−) for Channel A.
Differential Analog Input Pin (+) for Channel B.
Differential Analog Input Pin (−) for Channel B.
Voltage Reference Input/Output.
External Reference Bias Resistor. Connect 10 kΩ from RBIAS to AGND.
Common-Mode Level Bias Output for Analog Inputs.
ADC Clock Input—True.
ADC Clock Input—Complement.
OE
Input
Digital Enable (Active Low) to Tristate Output Data Pins.
D7+ (MSB)
D7− (MSB)
D6+
D6−
D5+
D5−
D4+
D4−
Output
Output
Output
Output
Output
Output
Output
Output
Channel A/Channel B LVDS Output Data 7—True.
Channel A/Channel B LVDS Output Data 7—Complement.
Channel A/Channel B LVDS Output Data 6—True.
Channel A/Channel B LVDS Output Data 6—Complement.
Channel A/Channel B LVDS Output Data 5—True.
Channel A/Channel B LVDS Output Data 5—Complement.
Channel A/Channel B LVDS Output Data 4—True.
Channel A/Channel B LVDS Output Data 4—Complement.
Rev. A | Page 8 of 24
Data Sheet
Pin No.
16
15
14
13
12
11
10
9
18
17
SPI Control Pins
30
31
32
Do Not Connect
3, 4, 6
AD9284
Mnemonic
D3+
D3−
D2+
D2−
D1+
D1−
D0+ (LSB)
D0− (LSB)
DCO+
DCO−
Type
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Description
Channel A/Channel B LVDS Output Data 3—True.
Channel A/Channel B LVDS Output Data 3—Complement.
Channel A/Channel B LVDS Output Data 2—True.
Channel A/Channel B LVDS Output Data 2—Complement.
Channel A/Channel B LVDS Output Data 1—True.
Channel A/Channel B LVDS Output Data 1—Complement.
Channel A/Channel B LVDS Output Data 0—True.
Channel A/Channel B LVDS Output Data 0—Complement.
Channel A/Channel B LVDS Data Clock Output—True.
Channel A/Channel B LVDS Data Clock Output—Complement.
SCLK
SDIO/PWDN
CSB
Input
Input/output
Input
SPI Serial Clock.
SPI Serial Data I/O (SDIO)/Power-Down Input in External Mode (PWDN).
SPI Chip Select (Active Low).
DNC
N/A
Do Not Connect. Do not connect to this pin.
Rev. A | Page 9 of 24
AD9284
Data Sheet
TYPICAL PERFORMANCE CHARACTERISTICS
AVDD = 1.8 V, DRVDD = 1.8 V, sample rate = 250 MSPS, DCS enabled, 1.2 V p-p differential input, VIN = −1.0 dBFS, 64k sample,
TA = 25°C, unless otherwise noted.
0
250MSPS
96.6MHz @ –1dBFS
SNR = 48.3dB (49.3dBFS)
ENOB = 7.7
SFDR = 70.0dBc
–20
AMPLITUDE (dBFS)
–20
–40
SECOND HARMONIC
–60
THIRD HARMONIC
–80
–100
–40
SECOND HARMONIC
–60
THIRD HARMONIC
–80
–100
0
25
50
75
100
125
FREQUENCY (MHz)
–120
09085-107
–120
0
75
0
250MSPS
330.3MHz @ –1dBFS
SNR = 48.2dB (49.2dBFS)
–20
ENOB = 7.6
SFDR = 60.9dBc
125
250MSPS
29.2MHz @ –7dBFS
32.2MHz @ –7dBFS
SFDR = 69.6dBc (76.6dBFS)
AMPLITUDE (dBFS)
–20
–40
THIRD HARMONIC
100
Figure 7. Single-Tone FFT with fIN = 96.6 MHz
0
SECOND HARMONIC
–40
–60
–80
–80
–100
–120
0
0
25
50
75
100
125
FREQUENCY (MHz)
25
50
75
100
125
FREQUENCY (MHz)
09085-108
–120
Figure 5. Single-Tone FFT with fIN = 220.3 MHz
09085-111
–100
Figure 8. Two-Tone FFT with fIN1 = 29.1 MHz and fIN2 = 32.1 MHz
80
80
70
IMD3 (dBFS)
70
SFDR (dBFS)
60
60
REFERENCE LINE
SFDR/IMD3 (dB)
50
40
SFDR (dBFS)
SNR (dBFS)
SFDR (dBc)
30
50
40
IMD3 (dBc)
30
SFDR (dBc)
20
20
SNR (dBc)
0
–45
10
–40
–35
–30
–25
–20
–15
–10
–5
0
AIN POWER (dBFS)
Figure 6. SFDR/SNR vs. Input Amplitude (AIN) with fIN = 2.2 MHz
0
–45
–40
–35
–30
–25
–20
–15
–10
–5
AIN POWER (dBFS)
Figure 9. Two-Tone SFDR/IMD3 vs. Input Amplitude (AIN)
with fIN1 = 29.1 MHz and fIN2 = 32.1 MHz
Rev. A | Page 10 of 24
0
09085-112
10
09085-109
SFDR/SNR (dB)
AMPLITUDE (dBFS)
50
FREQUENCY (MHz)
Figure 4. Single-Tone FFT with fIN = 4.3 MHz
–60
25
09085-110
AMPLITUDE (dBFS)
0
250MSPS
4.3MHz @ –1dBFS
SNR = 48.3dB (49.3dBFS)
ENOB = 7.7
SFDR = 70.3dBc
Data Sheet
AD9284
70
49.8
SFDR (dBc)
SFDR: SIDE A
SFDR: SIDE B
65
49.6
SNRFS: SIDE A
60
49.4
SNRFS: SIDE B
55
0.15
0.10
INL ERROR (LSB)
50.0
SNRFS (dBFS)
75
0.05
0
–0.05
49.2
75
100
125
150
175
200
225
49.0
250
ENCODE (MSPS)
Figure 10. SNRFS/SFDR vs Encode with fIN = 2.4 MHz
0.05
0
–0.05
–0.10
–0.15
64
96
128
160
192
OUTPUT CODE
224
256
09085-115
DNL ERROR (LSB)
0.10
32
0
32
64
96
128
160
192
OUTPUT CODE
Figure 12. INL Error with fIN = 4.3 MHz
0.15
0
–0.15
Figure 11. DNL Error with fIN = 4.3 MHz
Rev. A | Page 11 of 24
224
256
09085-117
50
50
09085-113
–0.10
AD9284
Data Sheet
EQUIVALENT CIRCUITS
AVDD
DRVDD
AVDD
AVDD
1.2V
10kΩ
10kΩ
CLK–
350Ω
SCLK, OE,
AUXCLKEN
30kΩ
09085-022
09085-019
CLK+
DRVDD
Figure 13. Clock Inputs
Figure 16. SCLK, OE
AVDD
BUF
AVDD
DRVDD
350Ω
8kΩ
BUF
AVDD
VCML
~1.4V
30kΩ
8kΩ
SDIO
09085-020
BUF
VIN–
CTRL
09085-023
VIN+
Figure 17. SDIO
Figure 14. Analog Inputs (VCML = ~1.4 V)
DRVDD
DRVDD
DRVDD
30kΩ
D7– TO D0–
V–
D7+ TO D0+
V+
09085-024
350Ω
V–
09085-021
CSB
V+
DRVDD
Figure 18. LVDS Output Driver
Figure 15. CSB
Rev. A | Page 12 of 24
Data Sheet
AD9284
THEORY OF OPERATION
The AD9284 is a pipeline-type converter. The input buffers are
differential, and both sets of inputs are internally biased. This
allows the use of ac or dc input modes. A sample-and-hold
amplifier is incorporated into the first stage of the multistage
pipeline converter core. The output staging block aligns the
data, carries out error correction for the pipeline stages, and
feeds that data to the output buffers. The two ADC channels
are sampled simultaneously through a single encoding clock.
All user-selected options are programmed through dedicated
digital input pins or a serial port interface (SPI).
Differential Input Configurations
Optimum performance is achieved when driving the AD9284
in a differential input configuration. For baseband applications,
the ADA4937-1 differential driver provides excellent performance
and a flexible interface to the ADC (see Figure 19). The output
common-mode voltage of the AD9284 is easily set to 1.4 V, and
the driver can be configured in a Sallen-Key filter topology to
provide band limiting of the input signal.
200Ω
61.9Ω
1.2V p-p
ADC ARCHITECTURE
200Ω
33Ω
AD9284
–
4.7pF
Each stage of the pipeline, excluding the last, consists of a low
resolution flash ADC connected to a switched-capacitor DAC
and interstage residue amplifier (MDAC). The residue amplifier
magnifies the difference between the reconstructed DAC output
and the flash input for the next stage in the pipeline. One bit of
redundancy is used in each stage to facilitate digital correction
of flash errors. The last stage consists of a flash ADC.
The input stage contains a differential SHA that can be ac- or
dc-coupled in differential or single-ended mode. The output
staging block aligns the data, carries out error correction, and
passes the data to the output buffers. The output buffers are
powered from a separate supply, allowing adjustment of the
output voltage swing. During power-down, the output buffers
enter a high impedance state.
ANALOG INPUT CONSIDERATIONS
ADA4937-1
+
+
VIN
–
33Ω
200Ω
09085-025
227.4Ω
0.1µF
VCM
Figure 19. Differential Input Configuration Using the ADA4937-1
The AD9284 can also be driven passively with a differential
transformer-coupled input (see Figure 20). To bias the analog
input, the VCM voltage can be connected to the center tap of
the secondary winding of the transformer.
33Ω
1.2V p-p
AD9284
49.9Ω
4.7pF
+
–
VIN
33Ω
VCM
0.1µF
09085-026
Each channel of the AD9284 consists of a differential input
buffer followed by a sample-and-hold amplifier (SHA). The
SHA is followed by a pipeline switched-capacitor ADC. The
quantized outputs from each stage are combined into a final
8-bit result in the digital correction logic. The pipelined
architecture permits the first stage to operate on a new input
sample, whereas the remaining stages operate on preceding
samples.
Figure 20. Differential Transformer-Coupled Configuration
The signal characteristics must be considered when selecting a
transformer. Most RF transformers saturate at frequencies below
a few megahertz (MHz). Excessive signal power can also cause
core saturation, which leads to distortion.
The analog inputs of the AD9284 are differentially buffered.
For best dynamic performance, the source impedances driving
VIN+A, VIN+B, VIN−A, and VIN−B should be matched such
that common-mode settling errors are symmetrical. The analog
inputs are optimized to provide superior wideband performance
and must be driven differentially. SNR and SINAD performance
degrades significantly if the analog inputs are driven with a singleended signal.
An internal differential voltage reference creates positive and
negative reference voltages that define the 1.2 V p-p fixed span
of the ADC core. This internal voltage reference can be adjusted
by means of SPI control. It can also be driven externally with
an off-chip stable reference. See the Memory Map Register
Descriptions section for more details.
A wideband transformer, such as Mini-Circuits® ADT1-1WT,
can provide the differential analog inputs for applications that
require a single-ended-to-differential conversion. Both analog
inputs are self-biased by an on-chip resistor divider to
a nominal 1.4 V.
The AD9284 requires the user to place a 10 kΩ resistor between
the RBIAS pin and ground. This resistor, which is used to set
the master current reference of the ADC core, should have a 1%
tolerance.
VOLTAGE REFERENCE
RBIAS
Rev. A | Page 13 of 24
AD9284
Data Sheet
For optimum performance, clock the AD9284 sample clock inputs,
CLK+ and CLK− with a differential signal. The signal is typically
ac-coupled into the CLK+ and CLK− pins via a transformer or
capacitors.
If a low jitter clock source is not available, another option is to
ac couple a differential PECL signal to the sample clock input
pins, as shown in Figure 23. The AD9510/AD9511/AD9512/
AD9513/AD9514/AD9515/AD9516/AD9517 clock drivers offer
excellent jitter performance.
Clock Input Options
The AD9284 has a very flexible clock input structure. The clock
input can be an LVDS, LVPECL, or sine wave signal. Each configuration that is described in this section applies to CLK+ and CLK−.
Figure 21 and Figure 22 show the two preferred methods for
clocking the AD9284. A low jitter clock source is converted
from a single-ended signal to a differential signal using either
an RF transformer or an RF balun. The back-to-back Schottky
diodes across the transformer/balun secondary limit clock
excursions into the AD9284 to approximately 0.8 V p-p
differential.
50Ω
CLOCK
INPUT
50kΩ
ADC
CLK–
240Ω
50kΩ
240Ω
0.1µF
0.1µF
CLK+
AD951x
ADC
0.1µF
LVDS DRIVER
100Ω
0.1µF
ADC
CLK–
50kΩ
Figure 24. Differential LVDS Sample Clock
09085-027
0.1µF
SCHOTTKY
DIODES:
HSM2822
Figure 21. Transformer-Coupled Differential Clock
DIGITAL OUTPUTS
Digital Output Enable Function (OE)
The AD9284 has a flexible three-state ability for the digital output
pins. The three-state mode is enabled using the OE pin. When
OE is set to logic level high, the output drivers for both data buses
are placed into a high impedance state.
1nF
CLK+
50Ω
100Ω
0.1µF
PECL DRIVER
0.1µF
ADC
1nF
0.1µF
SCHOTTKY
DIODES:
HSM2822
09085-028
CLK–
Figure 22. Balun-Coupled Differential Clock
Rev. A | Page 14 of 24
09085-030
CLOCK
INPUT
CLK–
CLOCK
INPUT
0.1µF
CLK+
0.1µF
0.1µF
AD951x
CLOCK
INPUT
50kΩ
XFMR
100Ω
CLK+
A third option is to ac couple a differential LVDS signal to the
sample clock input pins, as shown in Figure 24. The AD9510/
AD9511/AD9512/AD9513/AD9514/AD9515/AD9516/AD9517
clock drivers offer excellent jitter performance.
Mini-Circuits®
ADT1-1WT, 1:1 Z
CLOCK
INPUT
0.1µF
0.1µF
Figure 23. Differential PECL Sample Clock
This limit helps prevent the large voltage swings of the clock
from feeding through to other portions of the AD9284, while
preserving the fast rise and fall times of the signal that are
critical to low jitter performance.
0.1µF
CLOCK
INPUT
09085-029
CLOCK INPUT CONSIDERATIONS
Data Sheet
AD9284
BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST
The AD9284 includes a built-in self-test feature that is designed
to enable verification of the integrity of each channel, as well as
facilitate board level debugging. A built-in self-test (BIST) feature
that verifies the integrity of the digital datapath of the AD9284
is included. Various output test options are also provided to
place predictable values on the outputs of the AD9284.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9284 signal path. Perform the BIST test after a reset to ensure
that the part is in a known state. During BIST, data from an
internal pseudorandom noise (PN) source is driven through
the digital datapath of both channels, starting at the ADC block
output. At the datapath output, CRC logic calculates a signature
from the data. The BIST sequence runs for 512 cycles and then
stops. When the test is completed, the BIST compares the signature
results with a predetermined value. If the signatures match, the
BIST sets Bit 0 of Register 0x0E, signifying that the test passed.
If the BIST test fails, Bit 0 of Register 0x0E is cleared. The outputs
are connected during this test, so the PN sequence can be observed
as it runs.
Writing a value of 0x05 to Register 0x0E runs the BIST. This
enables Bit 0 (BIST enable) of Register 0x0E and resets the PN
sequence generator, Bit 2 (BIST init) of Register 0x0E. At the
completion of the BIST, Bit 0 of Register 0x0E is automatically
cleared. The PN sequence can be continued from its last value
by writing a 0 to Bit 2 of Register 0x0E. However, if the PN
sequence is not reset, the signature calculation does not equal
the predetermined value at the end of the test. At that point, the
user must rely on verifying the output data.
OUTPUT TEST MODES
The output test options are described in Table 12 at Address 0x0D.
When an output test mode is enabled, the analog section of the
ADC is disconnected from the digital back-end blocks, and the
test pattern is run through the output formatting block. Some
test patterns are subject to output formatting, and some are not.
The PN generators from the PN sequence tests can be reset by
setting Bit 4 or Bit 5 of Register 0x0D. These tests can be performed
with or without an analog signal (if present, the analog signal
is ignored), but they do require an encode clock. For more
information, see the AN-877 Application Note, Interfacing to
High Speed ADCs via SPI.
Rev. A | Page 15 of 24
AD9284
Data Sheet
SERIAL PORT INTERFACE (SPI)
The AD9284 serial port interface (SPI) allows the user to configure
the converter for specific functions or operations through a
structured register space provided inside the ADC. The SPI
gives the user added flexibility and customization, depending
on the application. Addresses are accessed via the serial port
and can be written to or read from via the port. Memory is
organized into bytes that can be further divided into fields,
which are documented in the Memory Map section. For detailed
operational information, see the AN-877 Application Note,
Interfacing to High Speed ADCs via SPI.
The falling edge of CSB, in conjunction with the rising edge of
SCLK, determines the start of the framing. An example of the
serial timing and its definitions can be found in Figure 25.
Other modes involving CSB are available. The CSB pin can be
held low indefinitely, which permanently enables the device;
this is called streaming. CSB can stall high between bytes to
allow for additional external timing. When the CSB pin is tied
high, SPI functions are placed in high impedance mode. This
mode turns on any SPI pin secondary functions.
During the instruction phase, a 16-bit instruction is transmitted.
Data follows the instruction phase, and its length is determined
by the W0 and W1 bits, as shown in Figure 25.
CONFIGURATION USING THE SPI
Three pins define the SPI of this ADC: SCLK, SDIO, and CSB
(see Table 9). SCLK (a serial clock) is used to synchronize the
read and write data presented from and to the ADC. SDIO
(serial data input/output) is a dual-purpose pin that allows data
to be sent to and read from the internal ADC memory map
registers. CSB (chip select bar) is an active low control that
enables or disables the read and write cycles.
All data is composed of 8-bit words. The first bit of the first byte
in a multibyte serial data transfer frame indicates whether a read
command or a write command is issued. This allows the serial
data input/output (SDIO) pin to change direction from an input
to an output at the appropriate point in the serial frame.
In addition to word length, the instruction phase determines
whether the serial frame is a read or write operation, allowing
the serial port to be used both to program the chip and to read
the contents of the on-chip memory. If the instruction is a readback
operation, the serial data input/output (SDIO) pin changes
direction, from an input to an output, at the appropriate point in
the serial frame.
Table 9. Serial Port Interface Pins
Pin
SCLK
SDIO
CSB
Function
Serial clock. A serial shift clock input that is used to
synchronize serial interface reads and writes.
Serial data input/output. A dual-purpose pin that
typically serves as an input or an output, depending
on the instruction being sent and the relative position
in the timing frame.
Chip select bar. An active low control that gates the
read and write cycles.
tHIGH
tDS
tS
tDH
Data can be sent in MSB-first mode or in LSB-first mode. MSB
first is the default on power-up and can be changed via the SPI
port configuration register. For more information about this
and other features, see the AN-877 Application Note, Interfacing
to High Speed ADCs via SPI.
tCLK
tH
tLOW
CSB
SDIO DON’T CARE
DON’T CARE
R/W
W1
W0
A12
A11
A10
A9
A8
A7
D5
Figure 25. Serial Port Interface Timing Diagram
Rev. A | Page 16 of 24
D4
D3
D2
D1
D0
DON’T CARE
09085-004
SCLK DON’T CARE
Data Sheet
AD9284
HARDWARE INTERFACE
CONFIGURATION WITHOUT THE SPI
The pins described in Table 9 constitute the physical interface
between the programming device of the user and the serial port
of the AD9284. The SCLK and CSB pins function as inputs
when using the SPI interface. The SDIO pin is bidirectional,
functioning as an input during write phases and as an output
during readback.
In applications that do not interface to the SPI control registers,
the SDIO/PWDN pin serves as a standalone, CMOS-compatible
control pin. When the device is powered up, it is assumed that
the user intends to use the SDIO, SCLK, and CSB pins as static
control lines for the output enable and power-down feature control.
In this mode, connecting the CSB chip select to AVDD disables
the serial port interface.
The SPI interface is flexible enough to be controlled by either
FPGAs or microcontrollers. One method for SPI configuration
is described in detail in the AN-812 Application Note, Microcontroller-Based Serial Port Interface (SPI) Boot Circuit.
The SPI port should not be active during periods when the full
dynamic performance of the converter is required. Because the
SCLK, CSB, and SDIO signals are typically asynchronous to the
ADC clock, noise from these signals can degrade converter
performance. If the on-board SPI bus is used for other devices,
it may be necessary to provide buffers between this bus and the
AD9284 to prevent these signals from transitioning at the converter
inputs during critical sampling periods.
SDIO/PWDN serves a dual function when the SPI interface is
not being used. When the pin is strapped to AVDD or ground
during device power-on, it is associated with a specific function.
The mode selection table (see Table 10) describes the strappable
functions that are supported on the AD9284.
Table 10. Mode Selection
Pin
SDIO/PWDN
OE
External Voltage
AVDD (default)
AGND
AVDD
AGND (default)
Configuration
Chip in full power-down
Normal operation
Outputs in high impedance
Outputs enabled
SPI ACCESSIBLE FEATURES
Table 11 provides a brief description of the general features that
are accessible via the SPI. These features are described in detail
in the AN-877 Application Note, Interfacing to High Speed ADCs
via SPI. The AD9284 part-specific features are described in
detail in Table 12.
Table 11. Features Accessible Using the SPI
Feature
Mode
Clock
Offset
Test I/O
Output Mode
Output Phase
Output Delay
Voltage
Reference
Rev. A | Page 17 of 24
Description
Allows the user to set either power-down mode
or standby mode
Allows the user to access the DCS via the SPI
Allows the user to digitally adjust the converter
offset
Allows the user to set test modes to have known
data on output bits
Allows the user to set up outputs
Allows the user to set the output clock polarity
Allows the user to vary the DCO delay
Allows the user to set the voltage reference
AD9284
Data Sheet
MEMORY MAP
READING THE MEMORY MAP REGISTER TABLE
Logic Levels
Each row in the memory map register table (see Table 12) has
eight bit locations. The memory map is roughly divided into
three sections: the chip configuration registers (Address 0x00
to Address 0x02), the device index and transfer registers
(Address 0x05 and Address 0xFF), and the program registers
(Address 0x08 to Address 0x25).
An explanation of logic level terminology follows:
Table 12 documents the default hexadecimal value for each
hexadecimal address shown. The column with the heading Bit 7
(MSB) is the start of the default hexadecimal value given. For
more information on this function and others, see the AN-877
Application Note, Interfacing to High Speed ADCs via SPI. This
document details the functions controlled by Register 0x00 to
Register 0xFF.
•
•
“Bit is set” is synonymous with “bit is set to Logic 1” or
“writing Logic 1 for the bit.”
“Bit is cleared” is synonymous with “bit is set to Logic 0” or
“writing Logic 0 for the bit.”
Transfer Register Map
Address 0x08 to Address 0x38 are shadowed. Writes to these
addresses do not affect part operation until a transfer command
is issued by writing 0x01 to Address 0xFF, setting the transfer bit.
Setting the transfer bit allows these registers to be updated
internally and simultaneously. The internal update takes place
when the transfer bit is set, and then the bit autoclears.
Open Locations
Channel-Specific Registers
All address and bit locations that are not included in the SPI
map are not currently supported for this device. Unused bits of
a valid address location should be written with 0s. Writing to these
locations is required only when part of an address location is
open. If the entire address location is open, it is omitted from the
SPI map (for example, Address 0x13) and should not be written.
Some channel setup functions can be programmed differently
for each channel. In these cases, channel address locations are
internally duplicated for each channel. These registers and bits
are designated in the memory map register table as local. These
local registers and bits can be accessed by setting the appropriate
Channel A (Bit 0) or Channel B (Bit 1) bits in Register 0x05.
Default Values
If both bits are set, the subsequent write affects the registers of
both channels. In a read cycle, set only Channel A or Channel B
to read one of the two registers. If both bits are set during a SPI
read cycle, the part returns the value for Channel A. Registers
and bits designated as global in the memory map register table
affect the entire part or the channel features for which independent
settings are not allowed between channels. The settings in
Register 0x05 do not affect the global registers and bits.
After the AD9284 is reset, critical registers are loaded with
default values. The default values for the registers are given
in the memory map register table (see Table 12).
Rev. A | Page 18 of 24
Data Sheet
AD9284
MEMORY MAP REGISTER TABLE
All address and bit locations that are not included in Table 12 are not currently supported for this device.
Table 12. Memory Map Registers
Addr
Register
Bit 7
(Hex)
Name
(MSB)
Chip Configuration Registers
0x00
SPI port
0
configuration
0x01
Chip ID
(global)
0x02
Chip grade
(global)
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
(LSB)
LSB first
Soft reset
1
1
Soft reset
LSB first
0
8-bit chip ID
Open
Speed grade ID
000 = 250 MSPS
Device Index and Transfer Registers
0x05
Device
Index A
0xFF
Transfer
ADC B
default
Open
Program Registers (May or may not be indexed by device index)
0x08
Modes
Open
(global)
0x09
0x0D
0x0E
Clock
(global)
Test mode
(local)
BIST (local)
Open
Open
Reset
PN23 gen
Reset
PN9 gen
Open
Open
Rev. A | Page 19 of 24
Default
Notes/
Comments
0x18
Nibbles are
mirrored so
that LSB-first
or MSB-first
mode
registers
correctly,
regardless of
shift mode
Unique chip
ID used to
differentiate
devices; read
only
Unique speed
grade ID is
used to
differentiate
devices; read
only
0x0A
Open
Open
Default
Value
(Hex)
0x00
ADC A
default
0xFF
Transfer
0xFF
Internal power-down mode
00: chip run
01: full power-down
10: reserved
11: reserved
0x00
Clock
Duty cycle
boost
stabilizer
Output test mode
000: off
001: midscale short
010: +FS short
011: −FS short
100: checkerboard output
101: PN23 sequence
110: PN9 sequence
111: one-/zero-word toggle
BIST init
Open
BIST enable
0x01
Bits are set to
determine
which on-chip
device
receives the
next write
command;
default is all
devices on the
chip
Synchronous
transfer of
data from the
master shift
register to
the slave
Determines
various
generic
modes
of chip
operation
0x00
When test
mode is set,
test data is
placed on the
output pins
in place of
normal data
0x00
BIST mode
config
AD9284
Addr
(Hex)
0x0F
Register
Name
ADC input
(global/local)
0x10
Offset (local)
0x14
Output
mode (local)
0x16
Output
phase
(global)
Voltage
reference
(global)
MISR LSB
(local)
0x18
0x24
0x25
MISR MSB
(local)
Data Sheet
Bit 7
(MSB)
Bit 6
Bit 5
Open
Bit 4
Open
Open
DCO invert
Open
Output
enable
Bit 3
Bit 2
Analog
disconnect
(local)
Bit 0
(LSB)
Open
Bit 1
Commonmode
input
enable
(global)
Offset adjust (twos complement format)
0111: +7
0110: +6
…
0001: +1
0000: 0
1111: −1
…
1001: −7
1000: −8
Open
Output
Data format select
invert
00: offset binary
01: twos complement
10: Gray code
11: reserved
Open
Voltage reference and input full-scale adjustment (see Table 13)
Default
Value
(Hex)
0x00
Default
Notes/
Comments
0x00
Device offset
trim
0x00
Configures
the outputs
and the
format of
the data
0x00
0x00
Selects/
adjusts VREF
LSBs of multiple input shift register (MISR)
0x00
MSBs of multiple input shift register (MISR)
0x00
MISR least
significant
byte; read
only
MISR most
significant
byte; read
only
Rev. A | Page 20 of 24
Data Sheet
AD9284
MEMORY MAP REGISTER DESCRIPTIONS
Table 13. VREF and Input Full Scale (Register 0x18)
For more information about functions controlled in Register 0x00
to Register 0xFF, see the AN-877 Application Note, Interfacing
to High Speed ADCs via SPI.
Value
0x14
0x15
0x16
0x17
0x18
0x19
0x1A
0x1B
0x1C
0x1D
0x1E
0x1F
0x00
0x01
0x02
0x03
0x04
0x05
0x06
0x07
0x08
0x09
0x0A
0x0B
0x0C
0x0D
0x0E
0x0F
0x10
0x11
0x12
0x13
Voltage Reference (Register 0x18)
Bits[7:5]—Reserved
Bits[4:0]—Voltage Reference
Bits[4:0] scale the internally generated voltage reference and,
consequently, the full scale of the analog input. Within this register,
the reference driver can be configured to be more easily driven
externally by reducing the capacitive loading.
The relationship between the VREF voltage and the input full scale
is described by Equation 1. See Table 13 for a complete list of
register settings.
Input_Full_Scale = VREF × 1.2
(1)
Rev. A | Page 21 of 24
VREF (V)
0.844
0.857
0.87
0.883
0.896
0.909
0.922
0.935
0.948
0.961
0.974
0.987
1
1.013
1.026
1.039
1.052
1.065
1.078
1.091
1.104
1.117
1.13
1.143
1.156
1.169
1.182
1.195
1.208
1.221
1.234
External
Full Scale (V)
1.013
1.028
1.044
1.060
1.075
1.091
1.106
1.122
1.138
1.153
1.169
1.184
1.200
1.216
1.231
1.247
1.262
1.278
1.294
1.309
1.325
1.340
1.356
1.372
1.387
1.403
1.418
1.434
1.450
1.465
1.481
External x 1.2
AD9284
Data Sheet
APPLICATIONS INFORMATION
DESIGN GUIDELINES
Before starting design and layout of the AD9284 as a system,
it is recommended that the designer become familiar with these
guidelines, which discuss the special circuit connections and
layout requirements that are needed for certain pins.
Power and Ground Recommendations
When connecting power to the AD9284, it is strongly recommended that two separate supplies be used. Use one 1.8 V
supply for analog (AVDD); use a separate 1.8 V supply for the
digital output supply (DRVDD). If a common 1.8 V AVDD and
DRVDD supply must be used, the AVDD and DRVDD domains
must be isolated with a ferrite bead or filter choke and separate
decoupling capacitors. Several different decoupling capacitors
can be used to cover both high and low frequencies. Locate these
capacitors close to the point of entry at the printed circuit board
(PCB) level and close to the pins of the part, with minimal
trace length.
A single PCB ground plane should be sufficient when using the
AD9284. With proper decoupling and smart partitioning of the
PCB analog, digital, and clock sections, optimum performance
is easily achieved.
Exposed Paddle Thermal Heat Sink Recommendations
The exposed paddle (Pin 0) is the only ground connection
for the AD9284; therefore, it must be connected to analog
ground (AGND) on the customer PCB. To achieve the best
electrical and thermal performance, mate an exposed (no
solder mask), continuous copper plane on the PCB to the
AD9284 exposed paddle, Pin 0.
The copper plane should have several vias to achieve the
lowest possible resistive thermal path for heat dissipation to
flow through the bottom of the PCB. Fill or plug these vias
with nonconductive epoxy.
To maximize the coverage and adhesion between the ADC and
the PCB, a silkscreen should be overlaid to partition the continuous
plane on the PCB into several uniform sections. This provides
several tie points between the ADC and the PCB during the reflow
process. Using one continuous plane with no partitions guarantees
only one tie point between the ADC and the PCB. For detailed
information about packaging and PCB layout of chip scale
packages, see the AN-772 Application Note, A Design and
Manufacturing Guide for the Lead Frame Chip Scale Package
(LFCSP), at www.analog.com.
VCM
The VCM pin should be decoupled to ground with a 0.1 μF
capacitor.
RBIAS
The AD9284 requires that a 10 kΩ resistor be placed between
the RBIAS pin and ground. This resistor, which sets the master
current reference of the ADC core, should have at least a 1%
tolerance.
Reference Decoupling
Decouple the VREF pin externally to ground with a low ESR,
1.0 μF capacitor in parallel with a low ESR, 0.1 μF ceramic
capacitor.
SPI Port
The SPI port should not be active during periods when the full
dynamic performance of the converter is required. Because the
SCLK, CSB, and SDIO signals are typically asynchronous to the
ADC clock, noise from these signals can degrade converter
performance. If the on-board SPI bus is used for other devices,
it may be necessary to provide buffers between this bus and the
AD9284 to prevent these signals from transitioning at the converter
inputs during critical sampling periods.
Rev. A | Page 22 of 24
Data Sheet
AD9284
OUTLINE DIMENSIONS
0.30
0.23
0.18
0.60 MAX
0.60 MAX
37
PIN 1
INDICATOR
6.85
6.75 SQ
6.65
1
0.50
REF
*4.70
4.60 SQ
4.50
EXPOSED
PAD
12
25
0.50
0.40
0.30
TOP VIEW
1.00
0.85
0.80
12° MAX
13
24
BOTTOMVIEW
0.25 MIN
5.50 REF
0.80 MAX
0.65 TYP
0.05 MAX
0.02 NOM
COPLANARITY
0.08
0.20 REF
SEATING
PLANE
PIN 1
INDICATOR
48
36
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
SECTION OF THIS DATA SHEET.
*COMPLIANT TO JEDEC STANDARDS MO-220-VKKD-2
WITH EXCEPTION TO EXPOSED PAD DIMENSION
06-07-2012-A
7.10
7.00 SQ
6.90
Figure 26. 48-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
7 mm × 7 mm Body, Very Thin Quad
(CP-48-12)
Dimensions shown in millimeters
ORDERING GUIDE
Model 1
AD9284BCPZ-250
AD9284BCPZRL7-250
AD9284-250EBZ
1
Temperature
Range
−40°C to +85°C
−40°C to +85°C
Package Description
48-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
48-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
Evaluation Board
Z = RoHS Compliant Part.
Rev. A | Page 23 of 24
Package
Option
CP-48-12
CP-48-12
AD9284
Data Sheet
NOTES
©2011–2013 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D09085-0-6/13(A)
Rev. A | Page 24 of 24
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