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DAC5670-SP
SGLS386F – JANUARY 2009 – REVISED OCTOBER 2014
DAC5670-SP 14-Bit 2.4-GSPS Digital-to-Analog Converter (DAC)
1 Features
3 Description
•
•
•
The DAC5670 is a 14-bit 2.4-GSPS DAC with dual
demultiplexed differential input ports. The DAC5670
is clocked at the DAC sample rate and the two input
ports run at a maximum of 1.2 GSPS. An additional
reference bit input sequence is used to adjust the
output clock delay to the data source, optimizing the
internal data latching clock relative to this reference
bit with a delay lock loop (DLL). Alternatively, the DLL
may be bypassed and the timing interface managed
by controlling DATA setup and hold timing to
DLYCLK.
The DAC5670 can also accept data up to 1.2 GSPS
using only the A input port. In the single port modes,
options include: repeating the input sample (A_ONLY
mode), 2× interpolation by zero stuff (A_ONLY_ZS
mode), or 2× interpolation by repeating and inverting
the input sample (A_ONLY_INV). These modes are
used to double the input sample rate up to 2.4 GSPS.
The DAC5670 operates with a single 3- to 3.6-V
supply voltage. Power dissipation is 2 W at maximum
operating conditions. The DAC5670 provides a
nominal full-scale differential current-output of 20 mA,
supporting both single-ended and differential
applications. An on-chip 1.2-V temperaturecompensated bandgap reference and control
amplifier allows the user to adjust the full-scale output
current from the nominal 20 mA to as low as 5 mA or
as high as 30 mA.
2 Applications
These units are intended for engineering evaluation only.
They are processed to a non-compliant flow (that is, no burnin, and so forth) and are tested to a temperature rating of
25°C only. These units are not suitable for qualification,
production, radiation testing, or flight use. Parts are not
warranted for performance over the full MIL specified
temperature range of –55°C to 125°C or operating life.
DAC5670-SP
PACKAGE
BODY SIZE (NOM)
CBGA (192)
19.00 mm × 19.00 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Simplified Schematic
A_ONLY_ZS
(1)
PART NUMBER
NORMAL
•
•
Test and Measurement: Arbitrary Waveform
Generator
Communications
Engineering evaluation (/EM) samples are
available
SLEEP
Mode Controls
CSBIAS
CSBIAS_IN
DA_P[13:0]
100
•
Device Information(1)
A_ONLY_INV
•
•
•
•
•
•
•
•
14-Bit Resolution
2.4-GSPS Max Update Rate DAC
Dual Differential Input Ports
– Even/Odd Demultiplexed Data
– Maximum 1.2 GSPS Each Port, 2.4 GSPS
Total
– Dual 14-Bit Inputs + 1 Reference Bit
– DDR Output Clock
– DLL Optimized Clock Timing Synchronized to
Reference Bit
– LVDS and HyperTransport™ Voltage Level
Compatible
– Internal 100-Ω Terminations for Data and
Reference Bit Inputs
Selectable 2× Interpolation With Fs / 2 Mixing
Differential Scalable Current Outputs: 5 to 30 mA
On-Chip 1.2-V Reference
3.3-V Analog Supply Operation
Power Dissipation: 2 W
192-Ball CBGA (GEM) Package
QML-V Qualified, SMD 5962-07247
Military Temperature Range (–55°C to 125°C
Tcase)
A_ONLY
1
DA_N[13:0]
Input
Registers
100
DB_P[13:0]
IOUT_P
14 bit
2.4Gsps
DAC
Demux
and
Format
IOUT_N
DB_N[13:0]
RBIASOUT
RBIASIN
100
DTCLK_P
DTCLK_N
Phase
Detector
Loop
Filter
REFIO_IN
Bandgap
Ref
LOCK
REFIO
RESTART
÷2
÷2
INV_CLK
DLYCLK_P
DACCLK_N
LVDS_HTB
DACCLK_P
Variable
Delay
DLYCLK_N
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
DAC5670-SP
SGLS386F – JANUARY 2009 – REVISED OCTOBER 2014
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Description (continued).........................................
Pin Configuration and Functions .........................
Specifications.........................................................
7.1
7.2
7.3
7.4
7.5
7.6
7.7
7.8
7.9
8
1
1
1
2
3
3
8
Absolute Maximum Ratings ..................................... 8
Handling Ratings....................................................... 8
Recommended Operating Conditions....................... 8
Thermal Information .................................................. 9
DC Electrical Characteristics .................................... 9
AC Electrical Characteristics................................... 10
Digital Electrical Characteristics.............................. 11
Timing Requirements .............................................. 11
Typical Characteristics ............................................ 13
Detailed Description ............................................ 15
8.1
8.2
8.3
8.4
9
Overview .................................................................
Functional Block Diagram .......................................
Feature Description.................................................
Device Functional Modes........................................
15
15
15
24
Application and Implementation ........................ 26
9.1 Application Information............................................ 26
9.2 Typical Application ................................................. 26
10 Power Supply Recommendations ..................... 28
11 Layout................................................................... 28
11.1 Layout Guidelines ................................................. 28
11.2 Layout Example .................................................... 28
12 Device and Documentation Support ................. 29
12.1
12.2
12.3
12.4
Device Support......................................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
29
29
29
29
13 Mechanical, Packaging, and Orderable
Information ........................................................... 30
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision E (December 2013) to Revision F
Page
•
Added Handling Ratings table, Feature Description section, Device Functional Modes, Application and
Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation
Support section, and Mechanical, Packaging, and Orderable Information section ............................................................... 1
•
Corrected Setup/Hold Data to DLYCLK values to be frequency independent ..................................................................... 11
•
Updated DLL Usage section................................................................................................................................................. 17
Changes from Revision D (May 2013) to Revision E
Page
•
Added /EM bullet to Applications section ............................................................................................................................... 1
•
Deleted Available Options table ............................................................................................................................................. 3
2
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Product Folder Links: DAC5670-SP
DAC5670-SP
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SGLS386F – JANUARY 2009 – REVISED OCTOBER 2014
5 Description (continued)
The output current can be directly fed to the load with no additional external output buffer required. The device
has been specifically designed for a differential transformer-coupled output with a 50-Ω doubly-terminated load.
The DAC5670 is available in a 192-ball CBGA package. The device is characterized for operation over the
military temperature range (–55°C to 125°C Tcase).
6 Pin Configuration and Functions
Ball Grid Array
192 Pins
A
1
B
C
D
E
F
G
H
J
K
L
M
N
DB9_P
DB9_N
DB7_N
DB7_P
DB3_N
DB3_P
DB4_N
DB4_P
DB1_P
DB1_N
DB0_P
DB0_N
P
2
DB10_N
GND
DB8_P
DB8_N
DB5_N
DB5_P
AVDD
AVDD
DB2_P
DB2_N
AVDD
GND
GND
CSCAP_IN
3
DB10_P
GND
AVDD
DB6_P
AVDD
GND
GND
GND
GND
AVDD
REFIO
AVDD
GND
CSCAP
4
DB12_P
DB11_P
AVDD
DB6_N
AVDD
AVDD
AVDD
AVDD
AVDD
AVDD
5
DB12_N
DB11_N
AVDD
AVDD
GND
GND
GND
GND
GND
GND
6
DLYCLK_N
DB13_N
GND
AVDD
GND
GND
GND
GND
GND
7
DLYCLK_P
DB13_P
GND
AVDD
GND
GND
AVDD
AVDD
8
DTCLK_N
DA0_P
GND
AVDD
GND
GND
AVDD
9
DTCLK_P
DA0_N
GND
AVDD
GND
GND
10
DA2_N
DA1_P
AVDD
AVDD
GND
11
DA2_P
DA1_N
DA7_N
DA6_N
12
DA3_N
GND
DA7_P
DA3_P
GND
DA4_P
13
14
REFIO_IN
AVDD
AVDD
AVDD
AVDD
GND
GND
AVDD
IOUT_N
GND
GND
GND
AVDD
IOUT_P
GND
GND
AVDD
GND
GND
AVDD
GND
GND
GND
GND
GND
GND
GND
AVDD
GND
GND
LVDS_HTB
GND
GND
GND
GND
GND
AVDD
AVDD
A_ONLY
AVDD
AVDD
AVDD
AVDD
AVDD
AVDD
AVDD
GND
GND
SLEEP
DA6_P
AVDD
GND
GND
GND
GND
AVDD
INV_CLK
RESTART
A_ONLY_INV
DA5_P
DA5_N
DA9_N
DA9_P
DA11_N
DA11_P
DA13_P
DA13_N
AVDD
GND
DA4_N
DA8_N
DA8_P
DA10_N
DA10_P
DA12_N
DA12_P
DACCLK_P
DACCLK_N
A_ONLY_Z
RBIAS_IN
RBIAS_OUT
M_NORMAL
GND
Pin Functions
PIN
NAME
NO.
DACCLK_P
K14
DACCLK_N
DLYCLK_P
TYPE
DESCRIPTION
I
External clock, sample clock for the DAC
L14
I
Complementary external clock, sample clock for the DAC
A7
O
DDR-type data clock to data source
DLYCLK_N
A6
O
DDR-type data clock to data source complementary signal
DTCLK_P
A9
I
Input data toggling reference bit
DTCLK_N
A8
I
Input data toggling reference bit, complementary signal
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SGLS386F – JANUARY 2009 – REVISED OCTOBER 2014
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Pin Functions (continued)
PIN
NAME
NO.
TYPE
DESCRIPTION
DA_P[13]
J13
I
Port A data bit 13 (MSB)
DA_N[13]
K13
I
Port A data bit 13 complement (MSB)
DA_P[12]
J14
I
Port A data bit 12
DA_N[12]
H14
I
Port A data bit 12 complement
DA_P[11]
H13
I
Port A data bit 11
DA_N[11]
G13
I
Port A data bit 11 complement
DA_P[10]
G14
I
Port A data bit 10
DA_N[10]
F14
I
Port A data bit 10 complement
DA_P[9]
F13
I
Port A data bit 9
DA_N[9]
E13
I
Port A data bit 9 complement
DA_P[8]
E14
I
Port A data bit 8
DA_N[8]
D14
I
Port A data bit 8 complement
DA_P[7]
C12
I
Port A data bit 7
DA_N[7]
C11
I
Port A data bit 7 complement
DA_P[6]
D12
I
Port A data bit 6
DA_N[6]
D11
I
Port A data bit 6 complement
DA_P[5]
C13
I
Port A data bit 5
DA_N[5]
D13
I
Port A data bit 5 complement
DA_P[4]
B14
I
Port A data bit 4
DA_N[4]
C14
I
Port A data bit 4 complement
DA_P[3]
A13
I
Port A data bit 3
DA_N[3]
A12
I
Port A data bit 3 complement
DA_P[2]
A11
I
Port A data bit 2
DA_N[2]
A10
I
Port A data bit 2 complement
DA_P[1]
B10
I
Port A data bit 1
DA_N[1]
B11
I
Port A data bit 1 complement
DA_P[0]
B8
I
Port A data bit 0 (LSB)
DA_N[0]
B9
I
Port A data bit 0 complement (LSB)
DB_P[13]
B7
DB_N[13]
B6
I
Port B data bit 13 complement (MSB)
DB_P[12]
A4
I
Port B data bit 12
DB_N[12]
A5
I
Port B data bit 12 complement
DB_P[11]
B4
I
Port B data bit 11
DB_N[11]
B5
I
Port B data bit 11 complement
DB_P[10]
A3
I
Port B data bit 10
DB_N[10]
A2
I
Port B data bit 10 complement
DB_P[9]
B1
I
Port B data bit 9
DB_N[9]
C1
I
Port B data bit 9 complement
DB_P[8]
C2
I
Port B data bit 8
DB_N[8]
D2
I
Port B data bit 8 complement
DB_P[7]
E1
I
Port B data bit 7
DB_N[7]
D1
I
Port B data bit 7 complement
DB_P[6]
D3
I
Port B data bit 6
DB_N[6]
D4
I
Port B data bit 6 complement
DB_P[5]
F2
I
Port B data bit 5
DB_N[5]
E2
I
Port B data bit 5 complement
4
Port B data bit 13 (MSB)
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SGLS386F – JANUARY 2009 – REVISED OCTOBER 2014
Pin Functions (continued)
PIN
NAME
NO.
TYPE
DESCRIPTION
DB_P[4]
J1
I
Port B data bit 4
DB_N[4]
H1
I
Port B data bit 4 complement
DB_P[3]
G1
I
Port B data bit 3
DB_N[3]
F1
I
Port B data bit 3 complement
DB_P[2]
J2
I
Port B data bit 2
DB_N[2]
K2
I
Port B data bit 2 complement
DB_P[1]
K1
I
Port B data bit 1
DB_N[1]
L1
I
Port B data bit 1 complement
DB_P[0]
M1
I
Port B data bit 0 (LSB)
DB_N[0]
N1
I
Port B data bit 0 complement (LSB)
IOUT_P
M7
O
DAC current output. Full scale when all input bits are set 1.
IOUT_N
M6
O
DAC complementary current output. Full scale when all input bits are 0.
RBIASOUT
P5
O
Rbias resistor current output
RBIASIN
P4
I
Rbias resistor sense input
CSCAP
P3
O
Current source bias voltage
CSCAP_IN
P2
I
Current source bias voltage sense input
REFIO
L3
O
Bandgap reference output
REFIO_IN
L4
I
Bandgap reference sense input
RESTART
M12
I
Resets DLL when high. Low for DLL operation. High for using external setup/hold timing.
LVDS_HTB
P9
I
DLYCLK_P/N control, LVDS mode when high, ht mode when low
INV_CLK
L12
I
Inverts the DLL target clocking relationship when high. Low for normal DLL operation. See DLL
Usage.
SLEEP
P11
I
Active-high sleep
NORMAL
P13
I
High for {a0,b0,a1,b1,a2,b2, …} normal mode
A_ONLY
N10
I
High for {a0,a0,a1,a1,a2,a2, …} A_only mode
A_ONLY_INV
P12
I
High for {a0,-a0, a1,-a1,a2,-a2, ...} A_only_inv mode
A_ONLY_ZS
N13
I
High for {a0,0,a1,0,a2,0, …} A_only_zs mode
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SGLS386F – JANUARY 2009 – REVISED OCTOBER 2014
www.ti.com
Pin Assignments (Top View)
1
A
3
4
5
6
7
8
9
10
11
12
13
DB10_N
DB10_P
DB12_P
DB12_N
DLYCLK _N
DLYCLK _P
DTCLK_N
DTCLK_P
DA2_N
DA2_P
DA3_N
DA3_P
14
B
DB9_P
GND
GND
DB11_P
DB11_N
DB13_N
DB13_P
DA0_P
DA0_N
DA1_P
DA1_N
GND
GND
DA4_P
C
DB9_N
DB8_P
AVDD
AVDD
AVDD
GND
GND
GND
GND
AVDD
DA7_N
DA7_P
DA5_P
DA4_N
D
DB7_N
DB8_N
DB6_P
DB6_N
AVDD
AVDD
AVDD
AVDD
AVDD
AVDD
DA6_N
DA6_P
DA5_N
DA8_N
E
DB7_P
DB5_N
AVDD
AVDD
GND
GND
GND
GND
GND
GND
AVDD
AVDD
DA9_N
DA8_P
F
DB3_N
DB5_P
GND
AVDD
GND
GND
GND
GND
GND
GND
AVDD
GND
DA9_P
DA10_N
G
DB3_P
AVDD
GND
AVDD
GND
GND
AVDD
AVDD
GND
GND
AVDD
GND
DA11_N
DA10_P
H
DB4_N
AVDD
GND
AVDD
GND
GND
AVDD
AVDD
GND
GND
AVDD
GND
DA11_P
DA12_N
J
DB4_P
DB2_P
GND
AVDD
GND
GND
GND
GND
GND
GND
AVDD
GND
DA13_P
DA12_P
K
DB1_P
DB2_N
AVDD
AVDD
GND
GND
GND
GND
GND
GND
AVDD
AVDD
DA13_N
Dacclk_P
Dacclk_N
L
DB1_N
AVDD
REFIO
REFIO _IN
AVDD
AVDD
AVDD
AVDD
AVDD
AVDD
GND
Inv_clk
AVDD
M
DB0_P
GND
AVDD
AVDD
AVDD
IOUT_N
IOUT_P
GND
GND
AVDD
GND
Restart
GND
N
DB0_N
GND
GND
GND
GND
A_only
GND
GND
LVDS _htb
AVDD
Sleep
A_only _inv
M _Normal
P
6
2
GND
GND
AVDD
GND
CSCap _IN
CSCap
RBIAS_IN
RBIAS _OUT
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A_only_z
GND
Copyright © 2009–2014, Texas Instruments Incorporated
Product Folder Links: DAC5670-SP
DAC5670-SP
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SGLS386F – JANUARY 2009 – REVISED OCTOBER 2014
Pin Assignments (Bottom View)
A
1
B
C
D
E
F
G
H
J
K
L
M
N
DB9_P
DB9_N
DB7_N
DB7_P
DB3_N
DB3_P
DB4_N
DB4_P
DB1_P
DB1_N
DB0_P
DB0_N
P
2
DB10_N
GND
DB8_P
DB8_N
DB5_N
DB5_P
AVDD
AVDD
DB2_P
DB2_N
AVDD
GND
GND
3
DB10_P
GND
AVDD
DB6_P
AVDD
GND
GND
GND
GND
AVDD
REFIO
AVDD
GND
CSCap
4
DB12_P
DB11_P
AVDD
DB6_N
AVDD
AVDD
AVDD
AVDD
AVDD
AVDD
REFIO _IN
AVDD
AVDD
RBIAS_IN
5
DB12_N
DB11_N
AVDD
AVDD
GND
GND
GND
GND
GND
GND
AVDD
AVDD
GND
RBIAS _OUT
6
DLYCLK _N
DB13_N
GND
AVDD
GND
GND
GND
GND
GND
GND
AVDD
IOUT_N
GND
7
DLYCLK _P
DB13_P
GND
AVDD
GND
GND
AVDD
AVDD
GND
GND
AVDD
IOUT_P
GND
8
DTCLK_N
DA0_P
GND
AVDD
GND
GND
AVDD
AVDD
GND
GND
AVDD
GND
GND
GND
9
DTCLK_P
DA0_N
GND
AVDD
GND
GND
GND
GND
GND
GND
AVDD
GND
GND
LVDS_htb
10
DA2_N
DA1_P
AVDD
AVDD
GND
GND
GND
GND
GND
GND
AVDD
AVDD
A_only
AVDD
11
DA2_P
DA1_N
DA7_N
DA6_N
AVDD
AVDD
AVDD
AVDD
AVDD
AVDD
GND
GND
Sleep
12
DA3_N
GND
DA7_P
DA6_P
AVDD
GND
GND
GND
GND
AVDD
Inv_clk
Restart
A_only _inv
13
DA3_P
GND
DA5_P
DA5_N
DA9_N
DA9_P
DA11_N
DA11_P
DA13_P
DA13_N
AVDD
GND
DA4_P
DA4_N
DA8_N
DA8_P
DA10_N
DA10_P
DA12_N
DA12_P
Dacclk_P
Dacclk_N
14
A_only_z
CSCap _IN
GND
M _Normal
GND
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www.ti.com
7 Specifications
7.1 Absolute Maximum Ratings (1)
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
5
V
–0.3
AVDD + 0.3
V
–0.3
AVDD + 0.3
V
–0.3
AVDD + 0.3
V
Measured with respect to GND
–0.3
AVDD + 0.3
V
Measured with respect to GND
AVDD – 0.5
AVDD + 1.5
V
Measured with respect to GND
–0.3
AVDD + 0.3
V
Peak input current (any input)
20
mA
Maximum junction temperature
150
°C
Lead temperature 1.6 mm (1/16 inch) from the case for 10 s
260
°C
Supply voltage
AVDD to GND
DA_P[13..0], DA_N[13..0], DB_P[13..0], DB_N[13..0]
Measured with respect to GND
NORMAL, A_ONLY, A_ONLY_INV, A_ONLY_ZS
Measured with respect to GND
DTCLK_P, DTCLK_N, DACCLK_P, DACCLK_N
Measured with respect to GND
LVDS_HTB, INV_CLK, RESTART
IOUT_P, IOUT_N
CSCAP_IN, REFIO_IN, RBIAS_IN
(1)
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the
device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
7.2 Handling Ratings
Tstg
Storage temperature range
Electrostatic
discharge
V(ESD)
(1)
(2)
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins
(1)
Charged device model (CDM), per JEDEC specification JESD22-C101, all pins (2)
MIN
MAX
UNIT
–65
150
°C
–250
250
–250
250
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
1.14
1.2
1.26
V
3
3.3
3.6
V
2.4
GSPS
GENERAL PARAMETERS
Full-scale output current
VREFIO
Input voltage range
AVDD
Analog supply voltage
ƒDAC
Output update rate
30
mA
CMOS INTERFACE (SLEEP, RESTART, INV_CLK, NORMAL, A_ONLY, A_ONLY_INV, A_ONLY_ZS)
VIH
High-level input voltage
2
3
VIL
Low-level input voltage
0
0
V
0.8
V
–100
100
mV
0.6
1.4
V
200
1000
40%
60%
1
1.4
DIFFERENTIAL DATA INTERFACE (DA_P[13:0], DA_N[13:0], DB_P[13:0], DB_N[13:0], DTCLK_P, DTCLK_N)
VITH
Differential input threshold
VICOM
Input common mode
CLOCK INPUTS (DACCLK_P, DACCLK_N)
|DACCLK_P
–
DACCLK_N|
Clock differential input voltage
Clock duty cycle
VCLKCM
8
Clock common mode
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7.4 Thermal Information
THERMAL METRIC
TEST CONDITIONS
TYP
RθJA
Junction-to-free-air thermal resistance
Non-thermally enhanced JEDEC standard PCB, per JESD-51, 51-3
41.3
RθJC
Junction-to-case thermal resistance
MIL-STD-883 test method 1012
3.8
UNIT
°C/W
7.5 DC Electrical Characteristics
TC,MIN = –55°C to TC,MAX = 125°C, typical values at 25°C, AVDD = 3 V to 3.6 V, IoutFS = 20 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
Resolution
TYP (1)
MAX
14
UNIT
bits
DC ACCURACY
INL
Integral nonlinearity
DNL
Differential nonlinearity
TC,MIN to TC,MAX , ƒDAC = 640 kHz,
ƒOUT = 10 kHz
Monotonocity
–7.5
±1.5
7.5
–0.98
±0.8
1.75
14
LSB
bits
ANALOG OUTPUT
Offset error
Mid-code offset
–0.45
±0.09
0.45
%FSR
Gain error
With external reference
–6.0
±1.6
6
%FSR
Gain error
With internal reference
–6.0
±1.6
6
%FSR
Output compliance range
IO(FS) = 20 mA, AVDD = 3.15 to 3.45
V
AVDD – 0.5
Output resistance
Output capacitance
IOUT_P and IOUT_N single ended
AVDD + 0.5
V
300
(2)
kΩ
13.7
(2)
pF
REFERENCE OUTPUT
Reference voltage
1.14
Reference output current
1.2
1.26
100
V
nA
REFERENCE INPUT
Input resistance
1 (2)
MΩ
Small-signal bandwidth
1.4
MHz
3.2 (2)
Input capacitance
pF
TEMPERATURE COEFFICIENTS
Offset drift
75
ppm of FSR/°C
Gain drift
With external reference
75
ppm of FSR/°C
Gain drift
With internal reference
75
ppm of FSR/°C
35
ppm/°C
Reference voltage drift
POWER SUPPLY
IAVDD
Analog supply current
ƒDAC = 2.4 GHz, NORMAL input
mode
560
650
mA
IAVDD
Sleep mode, AVDD supply
current
Sleep mode (SLEEP pin high)
150
180
mA
P
Power dissipation
ƒDAC = 2.4 GHz, NORMAL input
mode
1800
2350
mW
PSRR
Power-supply rejection ratio
AVDD = 3.15 to 3.45 V
0.4
1.3
(1)
(2)
%FSR/V
Typicals are characterization values at 25°C and AVDD = 3.3 V. These parameters are characterized, but not production tested.
Specified by design.
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7.6 AC Electrical Characteristics
TC,MIN = –55°C to TC,MAX = 125°C, typical values at 25°C, AVDD = 3 to 3.6 V, IoutFS = 20 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TYP (1)
MIN
MAX
UNIT
ANALOG OUTPUT
ts(DAC)
Output setting time to
0.1%
tpd
Output propagation delay
tr(IOUT)
Output rise time, 10% to
90%
280
ps
tf(IOUT)
Output fall time, 90% to
10%
280
ps
Mid-scale transition
3.5
ns
7 DACCLK
+ 1.5 ns
AC PERFORMANCE
ƒDAC = 2.4 GSPS, ƒOUT = 100 MHz, Dual-port
mode, 0 dBFS
46
ƒDAC = 2.4 GSPS, ƒOUT = 200 MHz, Dual-port
mode, 0 dBFS
SFDR
Spurious-free dynamic
range
51
ƒDAC = 2.4 GSPS, ƒOUT = 300 MHz, Dual-port
mode, 0 dBFS
31
36
ƒDAC = 2.4 GSPS, ƒOUT = 500 MHz, Dual-port
mode, 0 dBFS
35
43
ƒDAC = 2.4 GSPS, ƒOUT = 500 MHz, Dual-port
mode, –6 dBFS
ƒDAC = 2.4 GSPS, ƒOUT = 100 MHz, Dual-port
mode, 0 dBFS
Signal-to-noise ratio
58
60
56
62
ƒDAC = 2.4 GSPS, ƒOUT = 500 MHz, Dual-port
mode, 0 dBFS
51
58
ƒDAC = 2.4 GSPS, ƒOUT = 500 MHz, Dual-port
mode, –6 dBFS
IMD3
IMD
(1)
10
Total harmonic distortion
Third-order two-tone
intermodulation
dBc
52
45
ƒDAC = 2.4 GSPS, ƒOUT = 200 MHz, Dual-port
mode, 0 dBFS
THD
60
ƒDAC = 2.4 GSPS, ƒOUT = 300 MHz, Dual-port
mode, 0 dBFS
ƒDAC = 2.4 GSPS, ƒOUT = 100 MHz, Dual-port
mode, 0 dBFS
dBc
47
ƒDAC = 2.4 GSPS, ƒOUT = 200 MHz, Dual-port
mode, 0 dBFS
SNR
55
52
50
ƒDAC = 2.4 GSPS, ƒOUT = 300 MHz, Dual-port
mode, 0 dBFS
31
36
ƒDAC = 2.4 GSPS, ƒOUT = 500 MHz, Dual-port
mode, 0 dBFS
35
46
dBc
ƒDAC = 2.4 GSPS, ƒOUT = 500 MHz, Dual-port
mode, –6 dBFS
44
ƒDAC = 2.4 GSPS, ƒOUT = 99 MHz and 102 MHz,
Each tone at –6 dBFS, Dual-port mode.
70
dBc
ƒDAC = 2.4 GSPS, ƒOUT = 200 MHz and 202
MHz, Each tone at –6 dBFS, Dual-port mode.
68
dBc
ƒDAC = 2.4 GSPS, ƒOUT = 253 MHz and 257
MHz, Each tone at –6 dBFS, Dual-port mode.
47
57
dBc
ƒDAC = 2.4 GSPS, ƒOUT = 299 MHz and 302
MHz, Each tone at –6 dBFS, Dual-port mode.
35
55
dBc
47
62.5
dBc
ƒDAC = 2.4 GSPS, ƒOUT = 298 MHz, 299 MHz,
Four-tone intermodulation 300 MHz, and 301 MHz, Each tone at –12
dBFS, Dual-port mode.
Typicals are characterization values at 25°C and AVDD = 3.3 V. These parameters are characterized, but not production tested.
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7.7 Digital Electrical Characteristics
TC,MIN = –55°C to TC,MAX = 125°C, typical values at 25°C, AVDD = 3 to 3.6 V, IoutFS = 20 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP (1) MAX
UNIT
CMOS INTERFACE (SLEEP, RESTART, INV_CLK, NORMAL, A_ONLY, A_ONLY_INV, A_ONLY_ZS)
IIH
High-level input current
IIL
Low-level input current
0.2
–10
Input capacitance
10
μA
–0.2
μA
2.5 (2)
pF
DIFFERENTIAL DATA INTERFACE (DA_P[13:0], DA_N[13:0], DB_P[13:0], DB_N[13:0], DTCLK_P, DTCLK_N)
ZT
Internal termination impedance
Ci
Input capacitance
(1)
(2)
80
100
125
2.6 (2)
Ω
pF
Typicals are characterization values at 25°C and AVDD = 3.3 V. These parameters are characterized, but not production tested.
Specified by design.
7.8 Timing Requirements
MIN
TYP
MAX
UNIT
DIFFERENTIAL DATA INTERFACE (DA_P[13:0], DA_N[13:0], DB_P[13:0], DB_N[13:0] EXTERNAL TIMING WITH DLL IN RESTART)
(See Figure 2)
tsetup
Data setup to DLYCLK (1)
thold
Data hold to DLYCLK
(1)
RESTART = 1, DLYCLK 20-pF load
See Figure 2
4.75
nS
RESTART = 1, DLYCLK 20-pF load
See Figure 2
–3.5
nS
DLL (See Figure 15)
NegD
DLL min negative delay
RESTART = 0
150
ps
PosD
DLL min positive delay
RESTART = 0
600
ps
tvalid
CLK/4 internal setup + hold
width
160
Fdac
(1)
RESTART = 0
ps
1
2.4
GHz
Tested using SNR as pass/fail criteria.
DACLK_P/N
This internal DACCLK/2 is used to clock the input data DA and DB into theDAC5670
DACCLK/2 internal
toDAC5670
DLYCLK is DACCLK/4 delayed by the DAC5670 DLL to be used as the DDR clock for the data source digital chip
DLYCLK_P/N
DTCLK_P/N
DTCLK is a toggling bit, aligned with DA and DB data from chip, used by the DAC5670 DLL feedback path
DA_P/N[13:0]
a0
a1
a2
a3
DB_P/N[13:0]
b0
b1
b2
b3
internal data to
the DAC core in
NORMAL mode
a0
b0
a1
b1
7 DACCLKs
Pipeline Delay
Figure 1. DLL Input Loop Functional Timing
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DACCLK_P/N
DACCLK/2
(internal to DAC5670)
tsetup
thold
tsetup
DLYCLK_P/N
(setup/hold ref clock)
thold
DA_P/N[13:0]
DB_P/N[13:0]
a0
a1
b0
a2
b1
a3
b2
b3
~
~
Internal data to
DAC core in
Normal mode
a0
b0
a1
b1
~
~
7 DACCLKs
Pipeline Delay
Figure 2. External Interface Timing With DLL in Restart
Estimated Life (Years)
100
70
50
30
20
Electromigration Fail Mode
10
7
5
3
2
1
100
110
120
130
Continuous TJ (°C)
140
150
160
D001
A.
See data sheet for absolute maximum and minimum recommended operating conditions.
B.
Silicon operating life design goal is 10 years at 105°C junction temperature (does not include package interconnect
life).
Figure 3. DAC5670-SP – 192/GEM Package
Operating Life Derating Chart
12
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7.9 Typical Characteristics
Figure 4. Single-Tone Spectrum Power vs Frequency
Figure 5. Two-Tone IMD (Power) vs Frequency
Figure 6. W-CDMA TM1 Single Carrier Power vs Frequency
Figure 7. W-CDMA TM1 Single Carrier Power vs Frequency
Figure 8. W-CDMA TM1 Dual Carrier Power vs Frequency
Figure 9. W-CDMA TM1 Three Carrier Power vs Frequency
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Typical Characteristics (continued)
Figure 10. W-CDMA TM1 Four Carrier Power vs Frequency
14
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8 Detailed Description
8.1 Overview
Figure 26 shows a simplified block diagram of the current steering DAC5670. The DAC5670 consists of a
segmented array of NPN-transistor current sinks, capable of delivering a full-scale output current up to 30 mA.
Differential current switches direct the current of each current sink to either one of the complementary output
nodes IOUT_P or IOUT_N. The complementary current output enables differential operation, canceling out
common-mode noise sources (digital feed-through, on-chip, and PCB noise), dc offsets, even-order distortion
components, and doubling signal output power.
The full-scale output current is set using an external resistor (RBIAS) in combination with an on-chip bandgap
voltage reference source (1.2 V) and control amplifier. The current (IBIAS) through resistor RBIAS is mirrored
internally to provide a full-scale output current equal to 32× IBIAS. The full-scale current is adjustable from 30 mA
down to 5 mA by using the appropriate bias resistor value.
A_ONLY_ZS
A_ONLY_INV
A_ONLY
NORMAL
8.2 Functional Block Diagram
SLEEP
Mode Controls
CSBIAS
CSBIAS_IN
100
DA_P[13:0]
DA_N[13:0]
Input
Registers
100
DB_P[13:0]
IOUT_P
14 bit
2.4Gsps
DAC
Demux
and
Format
IOUT_N
DB_N[13:0]
RBIASOUT
RBIASIN
100
DTCLK_P
DTCLK_N
Phase
Detector
Loop
Filter
REFIO_IN
Bandgap
Ref
LOCK
REFIO
RESTART
÷2
÷2
INV_CLK
DLYCLK_P
DACCLK_N
LVDS_HTB
DACCLK_P
Variable
Delay
DLYCLK_N
8.3 Feature Description
8.3.1 Digital Inputs
The DAC5670 differential digital inputs are compatible with LVDS and HyperTransport voltage levels.
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Feature Description (continued)
Figure 11. Digital Input Voltage Options
The DAC5670 uses low-voltage differential signaling (LVDS and HyperTransport) for the bus input interface. The
LVDS and HyperTransport input modes feature a low differential voltage swing. The differential characteristic of
LVDS and HyperTransport modes allow for high-speed data transmission with low electromagnetic interference
(EMI) levels. Figure 12 shows the equivalent complementary digital input interface for the DAC5670, valid for
pins DA_P[13:0], DA_N[13:0], DB_P[13:0], and DB_N[13:0].
Figure 12.
Figure 13 shows a schematic of the equivalent CMOS/TTL-compatible digital inputs of the DAC5670, valid for the
following pins: RESTART, LVDS_HTB, INV_CLK, SLEEP, NORMAL, A_ONLY, A_ONLY_INV, and A_ONLY_ZS.
16
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Feature Description (continued)
Figure 13.
8.3.2 DLL Usage
The DAC5670 is clocked at the DAC sample rate. Each input port runs at a maximum of 1.2 GSPS. The
DAC5670 provides an output clock (DLYCLK) at one-half the input port data rate (DACCLK/4), and monitors an
additional reference bit (DTCLK). DTCLK is used as a feedback clock to adjust interface timing. To accomplish
this, the DAC5670 implements a DLL to help manage the timing interface from external data source. As with all
DLLs, there are limitations on the capability of the DLL with respect to the delay chain length, implementation of
the phase detector, and the bandwidth of the control loop. The DAC5670 implements a quadrature-based phase
detector. This scheme allows for the DLL to provide maximum setup or hold delay margins when quadrature can
be reached. Quadrature is reached when the internal CLK / 4 is 90° out of phase with DTCLK. Additionally, as
the frequency of operation decreases, the delay line's fixed length limits its ability to change the delay path
enough to reach quadrature (see Figure 15). Note that the delay line has asymmetric attributes. The NegD range
is smaller than the PosD range. From its nominal (restart) position, it can delay more than it can subtract.
Figure 15 represents the behavior of the phase detector and the delay line with respect to initial positions of the
rising edge of DTCLK. There are four distinct quadrants that define the behavior. Each quadrant represents the
period of the DDR clock rate (600 MHz in the 2.4 GSPS case) divided by 4. The ideal location has the initial
delays of DTCLK (and hence data bits) in quadrant 1. The stable lock point of DLL is at T / 4, between Q1 and
Q2. If DTCLK's initial delay is in quadrants 3 or 4, the INV_CLK pin can be asserted to improve the ability of DLL
to obtain quadrature. This assertion moves the stable quadrature point to the center of 3T / 4 vs T / 4 as shown
in Figure 15. Essentially, the zones that add delay become zones that subtract delay and vice-versa. The clock
phase of CLK / 4 would also invert.
In cases where it is not appropriate to use the DLL to manage the timing interface, it is possible to use fixed
setup and hold values for DA and DB signals relative to the generated DLYCLK output when the DLL is held in
restart. This is accomplished by asserting RESTART to logic high and using the timing input conditions for
external timing interface with DLL in restart in the DLL Usage . When using external setup and hold timing, the
user does not need to provide DTCLK. DTCLK should be biased to valid LVDS levels in that case (see Figure 2).
The setup/hold values are non-traditional, as they represent the setup/hold of an input to a generated clock
(DLYCLK). Additionally, the setup/hold numbers represent delays that may be longer than the DACCLK or
DACCLK/2 periods. To calculate the setup/hold values to the nearest adjacent DLYCLK transistion, the user
must subtract multiples of DACLCK/2 periods until the setup is less than a DACCLK/2 period. The same amount
can be subtracted from the hold time. These new setup/hold values will be frequency dependent.
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Feature Description (continued)
Data Source
DAC5670
DA_P[13:0]
DA_N[13:0]
Input
Registers
DB_P[13:0]
DB_N[13:0]
DTCLK_P
DTCLK_N
Delay
Locked
Loop
(DLL)
÷2
÷2
DLYCLK_P
DLYCLK_N
DACCLK_P
DACCLK_N
Figure 14. DLL Input Loop Simplified Block Diagram
Figure 15. DLL Phase Detector Behavior
8.3.3 Clock Input
The DAC5670 features differential, LVPECL-compatible clock inputs (DACCLK_P, DACCLK_N). Figure 16
shows the equivalent schematic of the clock input buffer. The internal biasing resistors set the input commonmode voltage to AVDD / 2, while the input resistance is typically 1 kΩ. A variety of clock sources can be accoupled to the device, including a sine wave source (see Figure 17).
18
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Feature Description (continued)
Figure 16. Clock Equivalent Input
Figure 17. Driving the DAC5670 With a Single-Ended Clock Source Using a Transformer
To obtain the best ac performance, the DAC5670 clock input should be driven with a differential LVPECL or sine
wave source as shown in Figure 18 and Figure 19. In this case, set the potential of VTT to the termination
voltage required by the driver along with the proper termination resistors (RT). The DAC5670 clock input can also
be driven single ended for slower clock rates using TTL/CMOS levels (see Figure 20).
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Feature Description (continued)
Figure 18. Driving the DAC5670 With a Single-Ended ECL/PECL Clock Source
Figure 19. Driving the DAC5670 With a Differential ECL/PECL Clock Source
Figure 20. Driving the DAC5670 With a Single-Ended TTL/CMOS Clock Source
8.3.4 DAC Transfer Function
The DAC5670 has a current sink output. The current flow through IOUT_P and IOUT_N is controlled by
Dx_P[13:0] and Dx_N[13:0]. For ease of use, this data sheet denotes D[13:0] as the logical bit equivalent of
Dx_P[13:0] and its complement Dx_N[13:0]. The DAC5670 supports straight binary coding with D13 as the MSB
and D0 as the LSB. Full-scale current flows through IOUTP when all D[13:0] inputs are set high and through
IOUTN when all D[13:0] inputs are set low. The relationship between IOUT_P and IOUT_N can be expressed as
Equation 1:
IOUT_N = IO(FS) – IOUT_P
(1)
IO(FS) is the full-scale output current sink (5 to 30 mA). Because the output stage is a current sink, the current
can only flow from AVDD through the load resistors RL into the IOUT_N and IOUT_P pins.
20
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Feature Description (continued)
The output current flow in each pin driving a resistive load can be expressed as shown in Figure 21, Equation 2,
and Equation 3.
Figure 21. Relationship Between D[13:0], Iout_n and Iout_p
IOUT_N = (IOUT(FS) × (16383 – CODE)) / 16384
IOUT_P = (IOUT(FS) × CODE) / 16384
(2)
where
•
CODE is the decimal representation of the DAC input word
(3)
This would translate into single-ended voltages at IOUT_N and IOUT_P, as shown in Equation 4 and Equation 5:
VOUTN = AVDD – IOUT_N x RL
VOUTP = AVDD – IOUT_P x RL
(4)
(5)
For example, assuming that D[13:0] = 1 and that RL is 50 Ω, the differential voltage between pins IOUT_N and
IOUT_P can be expressed as shown in Equation 6 through Equation 8 where IO(FS) = 20 mA:
VOUTN = 3.3 V – 0 mA × 50 Ω = 3.3 V
VOUTP = 3.3 V – 20 mA × 50 Ω = 2.3 V
VDIFF = VOUTN – VOUTP = 1 V
(6)
(7)
(8)
If D[13:0] = 0, then IOUT_P = 0 mA, IOUT_N = 20 mA, and the differential voltage VDIFF = –1 V.
The output currents and voltages in IOUT_N and IOUT_P are complementary. The voltage, when measured
differentially, is doubled compared to measuring each output individually. Take care not to exceed the
compliance voltages at the IOUT_N and IOUT_P pins in order to keep signal distortion low.
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Feature Description (continued)
8.3.5 Reference Operation
Bandgap
Reference
1.2 V Reference
REFIO
REFIO_IN
External
REFIO
Filter
Capacitor
+
RBIASOUT
RBIASIN
External
RBIAS
Resistor
Figure 22. Reference Circuit
The DAC5670 comprises a bandgap reference and control amplifier for biasing the full-scale output current. The
full-scale output current is set by applying an external resistor RBIAS to pins RBIASOUT and RBIASIN. The bias
current IBIAS through resistor RBIAS is defined by the on-chip bandgap reference voltage and control amplifier. The
full-scale output current equals 32× this bias current. The full-scale output current IOUTFS can thus be expressed
as:
IOUTFS = 32 × IBIAS = 32 × VREFIO / RBIAS
where
•
VREFIO voltage at terminals REFIO and REFIO_IN
(9)
The bandgap reference voltage delivers an accurate voltage of 1.2 V. Connect an external REFIO filter capacitor
of 0.1 μF externally to the terminals REFIO and REFIO_IN for compensation.
The full-scale output current can be adjusted from 30 to 5 mA by varying external resistor RBIAS.
8.3.6 Analog Current Outputs
Figure 23 is a simplified schematic of the current sink array output with corresponding switches. Differential NPN
switches direct the current of each individual NPN current sink to either the positive output node, IOUT_P, or its
complementary negative output node, IOUT_N. The input data presented at the DA_P[13:0], DA_N[13:0],
DB_P[13:0], and DB_N[13:0] is decoded to control the sw_p(N) and sw_n(N) current switches.
22
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Feature Description (continued)
AVDD (3.3 V)
RLOAD
RLOAD
IOUT_N
IOUT_P
sw_p(0)
sw_n(0)
sw_p(1)
sw_n(1)
sw_p(N)
sw_n(N)
Current Sink Array
CSBIAS
CSBIAS_IN
External
CSBIAS
Filter
Capacitor
Figure 23. Current Sink Array
The external output resistors, RLOAD, are connected to the positive supply, AVDD.
The DAC5670 can easily be configured to drive a doubly-terminated 50-Ω cable using a properly selected
transformer. Figure 24 and Figure 25 show the 1:1 and 4:1 impedance ratio configuration, respectively. These
configurations provide maximum rejection of common-mode noise sources and even-order distortion
components, thereby doubling the power of the DAC to the output. The center tap on the primary side of the
transformer is terminated to AVDD, enabling a dc current flow for both IOUT_N and IOUT_P.
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Feature Description (continued)
Figure 24. 1:1 Impedance Ratio
Figure 25. 4:1 Impedance Ratio
8.3.7 Sleep Mode
When the SLEEP pin is asserted (high), the DAC5670 enters a lower-power mode.
8.4 Device Functional Modes
8.4.1 Input Format
The DAC5670 has four input modes selected by the four mutually-exclusive configuration pins: NORMAL,
A_ONLY, A_ONLY_INV, and A_ONLY_ZS. Table 1 lists the input modes, input sample rates, maximum DAC
sample rate (CLK input), and resulting DAC output sequence for each configuration. For all configurations, the
DLYCLK_P/N outputs and DTCLK_P/N inputs are DACCLK_P/N frequency divided by four.
24
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Device Functional Modes (continued)
Table 1. DAC5670 Input Formats
NORMAL
A_ONLY
A_ONLY_INV
A_ONLY_ZS
FinA/Fdac
FinB/Fdac
ƒDAC MAX
(MHz)
DLYCLK_P/NAND,
DTCLK_P/N FREQ
(MHz)
1
0
0
0
1/2
1/2
2400
Fdac/4
A0, B0, A1, B1,
A2, B2, . . .
0
1
0
0
1/2
Off
2400
Fdac/4
A0, A0, A1, A1,
A2, A2, . . .
0
0
1
0
1/2
Off
2400
Fdac/4
A0, –A0, A1, –A1,
A2, –A2, . .
0
0
0
1
1/2
Off
2400
Fdac/4
A0, 0, A1, 0,
A2, 0, . . .
DAC OUTPUT
SEQUENCE
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The DAC5670 is a 14-bit DAC with max input rate of 2.4 GSPS. The DAC5670 is also suitable to operate at
lower sample rates without the use of the DLL for input interface timing.
A_ONLY_ZS
A_ONLY_INV
A_ONLY
NORMAL
9.2 Typical Application
CSCAP_IN
SLEEP
CSCAP
0.01 µF
Mode Controls
100
DA_P[13:0]
DA_N[13:0]
Input
Registers
100
DB_P[13:0]
14 bit
2.4Gsps
DAC
Demux
and
Format
3.3 V
(AVDD)
50 Ω
IOUT
100 Ω
IOUT
DB_N[13:0]
100
DTCLK_P
DTCLK_N
Phase
Detector
Output
1:1
RLOAD
X 50 Ω
3.3 V
(AVDD)
RBIASOUT
Loop
Filter
RBIAS
Rbias
RESTART
÷2
INV_CLK
3.3 V
(AVDD)
÷2
REFIO_IN
DLYCLK_P
Bandgap
Ref
100 pF
CLKIN
50 Ω
X
100 pF
REFIO
0.001 µF
DACCLK_N
LVDS_HTB
DLYCLK_N
DACCLK_P
Variable
Delay
Figure 26. Current Steering DAC5670
9.2.1 Design Requirements
This example uses DACCLK rate of 2 GHz with signal output at 300 MHz.
9.2.2 Detailed Design Procedure
This example is outputting a 300-MHz tone with 2-GHz sample rate. Data is applied to both A and B ports at 1GHz dual data rate. Full scale IOUT current set to 19.2 mA.
IOUTFS= 19.2 mA = 32 × IBIAS32 × VREFIO / RBIAS= 32 × 1.2 V / 2 kΩ
(10)
Device settings:
• RESTART low
• LVDS_HTB (pattern generator source dependent)
26
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Typical Application (continued)
•
•
•
•
•
•
•
•
INV_CLK as necessary for DLL lock
SLEEP low
NORMAL high
A_ONLY low
A_ONLY_INV low
A_ONLY_ZS low
DA_P[0:13], DA_N[0:13], DB_P[0:13],DB_N[0:13] sourced from pattern generator generating 300-MHz tone
with 65536 sample depth
RBIAS 2 kΩ to GND
9.2.3 Application Curves
2
0
-2
Power (dBm)
-4
-6
-8
-10
-12
-14
Power (dBm)
sinx/x (dBm)
Corrected
-16
-18
0
Figure 27. 2-GHz 300-MHz Tone
1E+8 2E+8 3E+8 4E+8 5E+8 6E+8 7E+8 8E+8 9E+8
Frequency
D002
Figure 28. DAC5670 Bandwidth 2 GSPS
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10 Power Supply Recommendations
The DAC5670 uses a single 3.3-V power supply simplifying design requirements. The power supply should be
filtered from any other system noise that may be present. The filtering should pay particular attention to
frequencies of interest for output.
11 Layout
11.1 Layout Guidelines
•
•
•
•
•
DAC output termination should be placed as close as possible to outputs.
Keep routing for RBIAS short.
Decoupling capacitors should be placed as close as possible to supply pins.
Digital differential inputs must be 50 Ω to ground loosely coupled, or 100-Ω differential tightly coupled.
Digital differential inputs must be length matched.
11.2 Layout Example
Differential pairs matched length 50-Ω impedance to ground.
28
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12 Device and Documentation Support
12.1 Device Support
12.1.1 Device Nomenclature
12.1.1.1 Definitions of Specifications and Terminology
Differential Nonlinearity (DNL) Defined as the variation in analog output associated with an ideal 1 LSB change
in the digital input code.
Gain Drift
Defined as the maximum change in gain, in terms of ppm of full-scale range (FSR) per °C, from the
value at 25°C to values over the full operating temperature range.
Gain Error
Defined as the percentage error in the ratio between the measured full-scale output current and the
value of the ideal full-scale output (32 x VREFIO / RBIAS). A VREFIO of 1.2 V is used to measure the
gain error with an external reference voltage applied. With an internal reference, this error includes
the deviation of VREFIO (internal bandgap reference voltage) from the typical value of 1.2 V.
Integral Nonlinearity (INL) Defined as the maximum deviation of the actual analog output from the ideal output,
determined by a straight line drawn from zero scale to full scale.
Intermodulation Distortion (IMD3, IMD) The two-tone IMD3 or four-tone IMD is defined as the ratio (in dBc) of
the worst third-order (or higher) intermodulation distortion product of either fundamental output tone.
Offset Drift Defined as the maximum change in dc offset, in terms of ppm of full-scale range (FSR) per °C, from
the value at 25°C to values over the full operating temperature range.
Offset Error Defined as the percentage error in the ratio of the differential output current (IOUT_P – IOUT_N) to
half of the full-scale output current for input code 8192.
Output Compliance Range Defined as the minimum and maximum allowable voltage at the output of the
current-output DAC. Exceeding this limit may result in reduced reliability of the device or adversely
affecting distortion performance.
Power Supply Rejection Ratio (PSSR) Defined as the percentage error in the ratio of the delta IOUT and delta
supply voltage normalized with respect to the ideal IOUT current.
Reference Voltage Drift Defined as the maximum change of the reference voltage in ppm per °C from the value
at ambient (25°C) to values over the full operating temperature range.
Spurious Free Dynamic Range (SFDR) Defined as the difference (in dBc) between the peak amplitude of the
output signal and the peak spurious signal.
Signal-to-Noise Ratio (SNR) Defined as the ratio of the RMS value of the fundamental output signal to the RMS
sum of all other spectral components below the Nyquist frequency, including noise, but excluding
the first six harmonics and dc.
Total Harmonic Distortion (THD) Defined as the ratio of the RMS sum of the first six harmonic components to
the RMS value of the fundamental output signal.
12.2 Trademarks
HyperTransport is a trademark of HyperTransport Technology Consortium.
All other trademarks are the property of their respective owners.
12.3 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
12.4 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
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13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
5962-0724701VXA
ACTIVE
CBGA
GEM
192
DAC5670MGEM/EM
ACTIVE
CBGA
GEM
192
1
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
TBD
SNPB
N / A for Pkg Type
-55 to 125
TBD
SNPB
N / A for Pkg Type
25 Only
Device Marking
(4/5)
59620724701VXA
DAC5670MGEM-V
DAC5670MGEM/EM
EVAL ONLY
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
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29-Aug-2015
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF DAC5670-SP :
• Catalog: DAC5670
NOTE: Qualified Version Definitions:
• Catalog - TI's standard catalog product
Addendum-Page 2
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